Recent Advances in Particle Analysis Paul Kester Micromeritics Instrument Corporation.
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Transcript of Recent Advances in Particle Analysis Paul Kester Micromeritics Instrument Corporation.
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Recent Advances in Particle Analysis
Paul Kester
Micromeritics Instrument Corporation
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Areas of Interest for Ceramics
DensitySkeletal
• New uses of old technique
Particle SizeComparison of TechniquesNew technique for nanoparticles
Surface AreaHigh Pressure Studies
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Measure Skeletal Density at Various Stages
Molded Debound Sintered
Fully dense• Check for theoretical Density
Indicator for occluded pores• Excessive sintering
Indicator for removal of binder
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Future ASTM Method for Density
Committee B09 on Powdered Metals and Powdered Metal ProductsSub-Committee B09.05 Structural Parts
Work to start in 6-8 months Applies to parts after sintering Standard Method for Gas
Pycnometry
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Density – Equilibration Rate
Measure Rate of Equilibration for a material to determine proper analysis parameters
Study Rate of Equilibration for various gases on a materialMay give information about tortuosity of
pores
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Particle Size Techniques
Laser Light Scattering
X-ray Sedimentation
Electrical Sensing Zone
Particle Size by Surface Area
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Laser Light Scattering
Widely used fast technique that can be applied to various particulate systems
Easily automated in a variety of commercially available instruments
Requires knowledge of Refractive Index of the material
Data presented as Equivalent Spherical Diameter
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Laser Light Scattering
Historically laser scattering was performed at small angles only, typically up to 14 °, called Fraunhofer diffraction Forward light scattering Low-angle laser light scattering (LALLS)
Gave results down to 1 µm Now broadened to include wider angles
with Mie Theory optical modeling Expanded range down to 0.1 µm
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Types of Scattered Light
Diffraction Reflection Refraction Absorption
Laser Scattering
Transmitted ray
No interaction- undeviated ray
Diffracted ray
Refracted ray
Reflected ray
Transmitted after
internal reflectionTransmitted ray
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Laser Light Scattering Groups of particles scatter light essentially equal to the
sum of light scattered by the individual particles. Optical models for selected particle sizes, and
mathematical deconvolution, allow computation of the particle size distribution.
It is difficult to differentiate between single particles and agglomerates or aggregates.
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X-ray Sedimentation
Based Upon a Classical Particle Sizing Method - Stokes’ Law.
Same Sizing Principle as Andreasen Pipette and Long-Arm Centrifuge.
Direct Mass Concentration Detection. X-Ray Attenuation is Proportional to Mass in
Beam. Material Density must be Known Widely used in the Ceramic Industry
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X-Ray Sedimentation
Stoke’s Law for Sedimentation, 1891.
Mature, well understood and widely practiced technique.
Now fully automated
X-ray Sedimentation
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Stoke’s equation
D = particle diameter
η = liquid viscosity
v = sedimentation velocity
ρ = particle density
ρo = liquid density
g = acceleration due to gravity
gρρ
v*η*18D
o
X-ray Sedimentation
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Accounts for Particle Mass Outside Analysis Range.
Analyzes Higher Concentrated Slurries than Most Other Techniques.
Provides Reliable Analyses of Wide Size Range: 300 µm to 0.1 µm.
Requires Only Readily-Available Physical Constants as Parameters.
X-ray Sedimentation
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Particle Size Distribution Analysis of Fine Calcium Carbonate Sample.
X-ray Sedimentation
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Electrical Sensing Zone
Same principle as Elzone 5380/5382 and Coulter Multisizer 3
Described by ISO 13319 Particle suspended in a conductive
liquid, passing through a narrow orifice, increases resistance through the orifice
Voltage must increase to keep constant current through orifice, same as Elzone 5380 and Multisizer 3
Voltage change proportional to particle volume
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Elzone II Principle of Operation
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Elzone II Advantages
Counts and sizes organic and inorganic particles
Analyzes materials with mixed optical properties, densities and shapes
Higher resolution than other sizing methods
Lower quantity of sample needed for accurate, easy analysis
Compact size takes up little lab space Automatic orifice blockage detection
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Particle Size from Surface Area
Increasing interest in nanomaterialsParticle sizes < 100 nm are of interestMost techniques in this range
questionable• Dynamic Light Scattering
– Provides Mean Size– Difficult if bimodal
Agglomerates make sizing difficult Obtain average size of primary
particles from the surface area and density of the material
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Tantalum – TEM Image
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TiSi2 – TEM Image
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Nickel – TEM Image
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Carbon – TEM Image
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Particle Size from Surface Area
1 Volume (4/3)πr3)
---------------------- = -------------------
BET x Density Area (4πr2)
Reduces to:
6D (nm) = ---------------------- x 1000
BET x Density
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Comparison of Techniques
Sample BET SA
(m2/g)
Avg. PS from SA
Mean PS (TEM)
DLS PS(Sympatec)
Tantalum 89.73 8 nm 6.8 nm 316 nm
TiSi2 97.25 19 nm 12.6 nm 157 nm
Nickel 26.3 35 nm 23.6 nm 1.3 μm
Carbon 62.05 45 nm 31 nm N/A
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High Pressure Adsorption
Increasing interest in measurement of adsorption capacity of materials above atmospheric pressureAdsorbent materials
• Gas purification• Hydrogen Storage
Catalysts• Operate above atmospheric pressure
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Static Adsorption
Van der Waals forces Pressures to 150 psi Measure uptake of gases at various
real life pressures
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High Pressure Isotherm
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Dynamic Adsorption
Chemical bondingPressures to 1,000 psiPulse Chemisorption Temperature Programmed:
• Oxidation• Reduction• Desorption
BET SA
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High Pressure Chemisorption
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Conclusions
Our research is letting us use old techniques in new ways to meet the needs of today’s materials and applications
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Acknowledgments
Jeff Kenvin - Micromeritics Greg Thiele - Micromeritics Tony Thornton - Micromeritics Rick Brown – MVA Scientific
Consultants