R. Kass US LC Conference 1 Design and Fabrication of a Radiation-Hard 500-MHz Digitizer Using Deep...
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![Page 1: R. Kass US LC Conference 1 Design and Fabrication of a Radiation-Hard 500-MHz Digitizer Using Deep Submicron Technology R. Kass The Ohio State University.](https://reader036.fdocuments.in/reader036/viewer/2022062409/56649ea95503460f94bae23c/html5/thumbnails/1.jpg)
R. Kass US LC Conference1
Design and Fabrication of a Radiation-Hard 500-MHz DigitizerUsing Deep Submicron Technology
R. Kass
The Ohio State UniversityJuly 29, 2004
S. SmithSLAC
K.K. Gan, M.O. Johnson, R.D. Kass, A. Rahimi, C. Rush
The Ohio State University
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Presentation Outline
NLC Requirements
ADC (“digitizer”) Design
Progress Report
Plans
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NLC will collide 180-bunch trains of e- and e+:bunch spacing: 1.4 nsalignment of individual bunches in a train: < 1 mBPM determines bunch-to-bunch misalignmenthigh bandwidth kickers bring the traininto better alignment on next machine cycle multi-bunch BPM system with digitizers: 11-bit effective resolution 500 MHz bandwidth 2 G samples/s
Beam Position Monitor Requirements at NLC
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Requirements of NLC Digitizers
Function Qty. Resolution
(eff. bits)
Bandwidth
(MHz)
Comments
LLRF Control 13,000 11 100 Slightly beyond state-of-the-art
Structure BPM 22,000 8 5 Existing technology
“Quad” BPM 10,000 11 12 Existing technology
Multi-bunch BPM 1,200 11 500 Well beyond state-of-the-art
Total 46,200
important to demonstrate feasibility of high speed/resolution digitizersredesign of low level RF technology is needed without the digitizers
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Proposal Design a digitizer chip using deep-submicron technology (0.25 m)use enclosed layout transistors and guard rings☺radiation hard: > 60 Mrad☺no need for costly shielding and long cables☺easy access to electronics for testing and maintenance Extensive experience in chip design using Cadencedesigned radiation-hard chips for CLEO III, ATLAS, CMS
Why OSU is interested?help to solve a challenging NLC problempotential applications in HEP
Holtkamp Committee rankings: 2 on scale of 1 to 4 (lowest)funded for 2003-4 and 2004-5
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12-bit Pipelined Digitizer
input crudely digitized by 1st 3-bit cell digitized value subtracted from input
difference is amplified by 8 and sent to 2nd 3-bit cell…
13 bit: roundto 0 or 12 bit
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most challenging digitizer: 11 bit, 2 G samples/s, 500 MHz bandwidth input: sequence of doublets at 1.4 ns batch spacing
characterize with one parameter: pulse height
minimum sampling: 1/1.4 ns = 714 MHz
interleaving 3 digitizers for redundancy
2 G samples/s
Digitizer for Multi-bunch BPM
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submicron CMOS supply voltage: 2.5 V
differential signal: ~ 1.6 V full swing
LSB: 1.6 V/212 = 390 V
stability/accuracy of comparator thresholds,amplifier & S/H gains, charge injection:195 V = 0.5 LSB = 0.5/212 → 0.012%
Precision
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gain-bandwidth requirement:
assume 0.7 ns for sample and 0.7 ns for hold settling to 0.5 LSB for 12-bit digitizer requires 9: 0.5/212 ~ e-9
ns/9 78 psrise time 2.2 psgain x bandwidth 8 x 1/2GHz
IBM process SiGe BiCMOS 6HP/6DM via MOSIS: ☺40 GHz NPN bipolar transistors
Fabrication Process
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3-Bit Cell
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Simulate with Cadencesample/hold + flash ADC/flip-flop:designed/simulatedfrom schematic with parasitic capacitances
multiplexer: logic is fast but somewhat noisy
op-amp + encoder: use real devices in simulation
3-Bit Cell Status
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design and simulated from schematic with parasitic capacitancesswitch-on resistance small enough to allow 9 in 700 ps
switching offset (noise) largely cancelled with dummy switch:100 mV 1 mV
Sample/Hold Status
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Cadence Simulation of Sample/Hold Progress
switch chargeinjection
Amplifier: idealAmplifier: Jan. 04 design
Amplifier: July 04 design
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AMP Specsrise time goal: 171 ps achieve:186 psneed V=195V for 12-bit precision
Simulation of Amplifier
January 2004V=298V
July 2004V=194V
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Offsets differ by~2.8mV
Issues to be resolved:Offset from S/H not constant.Offset is a function of input signal slope.
Current S/H Simulation Issue
VT(“/vin”) ≡ input to 1st S/HVT(“/out2”) ≡ Output from 2nd S/H
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Year 2004-5: complete design of amplifier + 3-bit cell layout, submission, and testing of the building block circuitsYear 2005-7 layout, submission, and testing of the prototype digitizer radiation hardness tests continued system design of prototype 11-bit digitizer
Plans
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EXTRA SLIDES FOLLOWS
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