R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets...

146

Transcript of R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets...

Page 1: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets
Page 2: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 2 of 146

EMC TEST REPORT

For

TPV Electronics (FuJian) Co., Ltd.

Product:LCD Monitor

Brand Name Model No.

AG neovo PM-65

Prepared for : TPV Electronics (FuJian) Co., Ltd.

Rongqiao Economic and Technological Development Zone, Fuqing City, Fujian Province, P.R. China

Prepared By : Audix Technology (Shenzhen) Co., Ltd.

No. 6, Ke Feng Rd., 52 Block, Shenzhen Science & Industrial Park, Nantou, Shenzhen, Guangdong, China

Tel: (0755) 26639496 Fax: (0755) 26632877

Report Number : ACS-E15099 Date of Test : Sep. 19~Oct. 25, 2014 Date of Report : Mar. 23, 2015

Page 3: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 3 of 146

TABLE OF CONTENT Description Page TEST REPORT VERIFICATION ....................................................................................... 6 1. SUMMARY OF STANDARDS AND RESULTS .............................................................. 7

1.1. Description of Standards and Results ....................................................................................... 7 2. GENERAL INFORMATION .............................................................................................. 8

2.1. Description of Device (EUT) .................................................................................................... 8 2.2. Tested Supporting System Details ............................................................................................ 9 2.3. Block Diagram of connection between EUT and simulators .................................................. 11 2.4. Test Facility ............................................................................................................................ 12 2.5. Measurement Uncertainty(95% confidence levels, k=2) ................................................... 12

3. POWER LINE CONDUCTED EMISSION MEASUREMENT .................................... 13 3.1. Test Equipments ..................................................................................................................... 13 3.2. Block Diagram of Test Setup .................................................................................................. 13 3.3. Test Standard .......................................................................................................................... 13 3.4. Power Line Conducted Emission Limit .................................................................................. 13 3.5. EUT Configuration on Test .................................................................................................... 13 3.6. Operating Condition of EUT .................................................................................................. 14 3.7. Test Procedure ........................................................................................................................ 14 3.8. Power Line Conducted Emission Test Results ....................................................................... 15

4. CONDUCTED DISTURBANCE AT TELECOMMUNICATION PORTS MEASUREMENT ......................................................................................................................... 40

4.1. Test Equipments ..................................................................................................................... 40 4.2. Block Diagram of Test Setup .................................................................................................. 40 4.3. Test Standard .......................................................................................................................... 40 4.4. Conducted Emission at Telecommunication Ports Limit ........................................................ 40 4.5. EUT Configuration on Test .................................................................................................... 41 4.6. Operating Condition of EUT .................................................................................................. 41 4.7. Test Procedure ........................................................................................................................ 41 4.8. Conducted Emission at Telecommunication Ports Test Results ............................................. 41

5. RADIATED EMISSION MEASUREMENT ................................................................... 44 5.1. Test Equipments ..................................................................................................................... 44 5.2. Block Diagram of Test Setup .................................................................................................. 45 5.3. Test Standard .......................................................................................................................... 45 5.4. Radiated Emission Limit ......................................................................................................... 46 5.5. EUT Configuration on Test .................................................................................................... 46 5.6. Operating Condition of EUT .................................................................................................. 46 5.7. Test Procedure ........................................................................................................................ 47 5.8. Radiated Emission Test Results .............................................................................................. 47

6. HARMONIC CURRENT EMISSION TEST .................................................................. 85 6.1. Test Equipments ..................................................................................................................... 85 6.2. Block Diagram of Test Setup .................................................................................................. 85 6.3. Test Standard .......................................................................................................................... 85 6.4. Limits of Harmonic Current .................................................................................................... 85 6.5. EUT Configuration on Test .................................................................................................... 85 6.6. Operating Condition of EUT .................................................................................................. 85 6.7. Test Procedure ........................................................................................................................ 86 6.8. Test Results ............................................................................................................................. 86

7. VOLTAGE FLUCTUATIONS & FLICKER TEST ....................................................... 93 7.1. Test Equipments ..................................................................................................................... 93 7.2. Block Diagram of Test Setup .................................................................................................. 93 7.3. Test Standard .......................................................................................................................... 93

Page 4: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 4 of 146

7.4. Limits of Voltage Fluctuation and Flick ................................................................................. 93 7.5. EUT Configuration on Test .................................................................................................... 93 7.6. Operating Condition of EUT .................................................................................................. 93 7.7. Test Procedure ........................................................................................................................ 93 7.8. Test Results ............................................................................................................................. 93

8. IMMUNITY PERFORMANCE CRITERIA DESCRIPTION ...................................... 96 9. ELECTROSTATIC DISCHARGE IMMUNITY TEST ................................................ 98

9.1. Test Equipments ..................................................................................................................... 98 9.2. Block Diagram of Test Setup .................................................................................................. 98 9.3. Test Standard .......................................................................................................................... 98 9.4. Severity Levels and Performance Criterion ............................................................................ 98 9.5. EUT Configuration ................................................................................................................. 98 9.6. Operating Condition of EUT .................................................................................................. 98 9.7. Test Procedure ........................................................................................................................ 99 9.8. Test Results ............................................................................................................................. 99

10. RF FIELD STRENGTH SUSCEPTIBILITY TEST ..................................................... 101 10.1. Test Equipments ................................................................................................................... 101 10.2. Block Diagram of Test Setup ................................................................................................ 101 10.3. Test Standard ........................................................................................................................ 101 10.4. Severity Levels and Performance Criterion .......................................................................... 101 10.5. EUT Configuration ............................................................................................................... 101 10.6. Operating Condition of EUT ................................................................................................ 101 10.7. Test Procedure ...................................................................................................................... 102 10.8. Test Results ........................................................................................................................... 102

11. RF E.M. FIELD KEYED CARRIER TEST .................................................................. 104 11.1. Test Equipments ................................................................................................................... 104 11.2. Block Diagram of Test Setup ................................................................................................ 104 11.3. Test Standard ........................................................................................................................ 104 11.4. Severity Levels and Performance Criterion .......................................................................... 105 11.5. EUT Configuration ............................................................................................................... 105 11.6. Operating Condition of EUT ................................................................................................ 105 11.7. Test Procedure ...................................................................................................................... 105 11.8. Test Results ........................................................................................................................... 105

12. ELECTRICAL FAST TRANSIENT/BURST IMMUNITY TEST .............................. 107 12.1. Test Equipments ................................................................................................................... 107 12.2. Block Diagram of Test Setup ................................................................................................ 107 12.3. Test Standard ........................................................................................................................ 107 12.4. Severity Levels and Performance Criterion .......................................................................... 107 12.5. EUT Configuration ............................................................................................................... 107 12.6. Operating Condition of EUT ................................................................................................ 107 12.7. Test Procedure ...................................................................................................................... 108 12.8. Test Results ........................................................................................................................... 108

13. SURGE TEST ................................................................................................................... 110 13.1. Test Equipments ................................................................................................................... 110 13.2. Block Diagram of Test Setup ................................................................................................ 110 13.3. Test Standard ........................................................................................................................ 110 13.4. Severity Levels and Performance Criterion .......................................................................... 110 13.5. EUT Configuration ............................................................................................................... 110 13.6. Operating Condition of EUT ................................................................................................ 110 13.7. Test Procedure ...................................................................................................................... 110 13.8. Test Results ........................................................................................................................... 110

14. INJECTED CURRENTS SUSCEPTIBILITY TEST ................................................... 112 14.1. Test Equipments ................................................................................................................... 112 14.2. Block Diagram of Test Setup ................................................................................................ 112 14.3. Test Standard ........................................................................................................................ 112

Page 5: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 5 of 146

14.4. Severity Levels and Performance Criterion .......................................................................... 112 14.5. EUT Configuration ............................................................................................................... 112 14.6. Operating Condition of EUT ................................................................................................ 112 14.7. Test Procedure ...................................................................................................................... 113 14.8. Test Results ........................................................................................................................... 113

15. MAGNETIC FIELD IMMUNITY TEST ...................................................................... 115 15.1. Test Equipments ................................................................................................................... 115 15.2. Block Diagram of Test Setup ................................................................................................ 115 15.3. Test Standard ........................................................................................................................ 115 15.4. Severity Levels and Performance Criterion .......................................................................... 115 15.5. EUT Configuration on Test .................................................................................................. 115 15.6. Operating Condition of EUT ................................................................................................ 115 15.7. Test Procedure ...................................................................................................................... 115 15.8. Test Results ........................................................................................................................... 115

16. VOLTAGE DIPS AND INTERRUPTIONS IMMUNITY TEST ................................ 117 16.1. Test Equipment ..................................................................................................................... 117 16.2. Block Diagram of Test Setup ................................................................................................ 117 16.3. Test Standard ........................................................................................................................ 117 16.4. Severity Levels and Performance Criterion .......................................................................... 117 16.5. EUT Configuration ............................................................................................................... 117 16.6. Operating Condition of EUT ................................................................................................ 117 16.7. Test Procedure ...................................................................................................................... 117 16.8. Test Results ........................................................................................................................... 117

17. INPUT IMMUNITY TEST: S2A .................................................................................... 119 17.1. Test Equipment ..................................................................................................................... 119 17.2. Block Diagram of Test Setup ................................................................................................ 120 17.3. Measurement Procedure ........................................................................................................ 120 17.4. Test Result ............................................................................................................................ 120

18. AMBIENT ELECTROMAGNETIC FIELD: S3 .......................................................... 128 18.1. Test Equipments ................................................................................................................... 128 18.2. Block Diagram of Test Setup ................................................................................................ 128 18.3. Test Standard ........................................................................................................................ 128 18.4. Severity Levels and Performance Criterion .......................................................................... 128 18.5. Operating Condition of EUT ................................................................................................ 129 18.6. Test Procedure ...................................................................................................................... 129 18.7. Test Result ............................................................................................................................ 129

19. PHOTOGRAPH ............................................................................................................... 131 19.1. Photos of Power Line Conducted Emission Test .................................................................. 131 19.2. Conducted Disturbance At Telecommunication Ports Test .................................................. 133 19.3. Photos of Radiated Emission Test (In Anechoic Chamber).................................................. 134 19.4. Photos of Harmonic & Flicker Test ...................................................................................... 136 19.5. Photos of Electrostatic Discharge Immunity Test ................................................................. 137 19.6. Photos of RF Strength Susceptibility Test ............................................................................ 139 19.7. Photo of RF E.M. Field Keyed Carrier Test ......................................................................... 140 19.8. Photos of Electrical Fast Transient/Burst Immunity Test ..................................................... 140 19.9. Photo of Surge Test............................................................................................................... 142 19.10. Photo of Injected Currents Susceptibility Test ..................................................................... 143 19.11. Photo of Magnetic Field Test ................................................................................................ 144 19.12. Photo of Voltage Dips and interruptions test ........................................................................ 144 19.13. Photos of RF Voltages Input Interference (S2a) Test ........................................................... 145 19.14. Photo of Ambient Electromagnetic Field: S5 Test ............................................................... 146

Page 6: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets
Page 7: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 7 of 146

1. SUMMARY OF STANDARDS AND RESULTS

1.1. Description of Standards and Results The EUT have been tested according to the applicable standards as referenced below.

EMISSION Description of Test Item Standard Results Remark

Conducted disturbance at mains terminals

EN 55022: 2010+AC: 2011PASS Minimum passing margin is

16.45dB at 3.2069MHz EN 55013: 2013

Conducted disturbance at telecommunication port

EN 55022: 2010+AC: 2011 PASS Minimum passing margin is 15.57dB at 19.7397MHz

Radiated disturbance (30-1000MHz)

EN 55022: 2010+AC: 2011PASS Minimum passing margin is

4.14dB at 125.060MHz EN 55013: 2013 Radiated disturbance

(1-6GHz) EN 55022: 2010+AC: 2011 PASS Minimum passing margin is 8.09dB at 2524.500MHz

Harmonic current emissions EN 61000-3-2: 2006+ A1: 2009+A2: 2009 PASS Meets the Class D

requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets the requirement

IMMUNITY (EN 55024: 2010, EN 55020: 2007+A11: 2011)

Description of Test Item Basic Standard Results Performance Criteria

Observation Criteria

Electrostatic discharge (ESD) IEC 61000-4-2: 2008 PASS B A&B

Radio-frequency,Continuous radiated disturbance IEC 61000-4-3: 2010 PASS A A

Electrical fast transient (EFT) IEC 61000-4-4: 2012 PASS B A&B Surge (Input a.c. power port) IEC 61000-4-5: 2005 PASS B A&B

Surge(Telecommunication port) PASS C B Radio-frequency,Continuous

conducted disturbance IEC 61000-4-6: 2013 PASS A A

Power frequency magnetic field IEC 61000-4-8: 2009 PASS A A Voltage dips, >95% reduction

IEC 61000-4-11: 2004 PASS B A

Voltage dips, 30% reduction PASS C A Voltage interruptions PASS C C

S2A: RF Voltage Input Interference EN 55020: 2007+A11: 2011 PASS A A S3: Ambient Electromagnetic

Field EN 55020: 2007+A11: 2011 PASS A A

S5: RF Field Strength Susceptibility Test EN 55020: 2007+A11: 2011 PASS A A

N/A is an abbreviation for Not Applicable.

Page 8: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 8 of 146

2. GENERAL INFORMATION

2.1. Description of Device (EUT) Description : LCD Monitor Model No. & Brand Name

: Brand Name Model No.

AG neovo PM-65

Applicant : TPV Electronics (FuJian) Co., Ltd. Rongqiao Economic and Technological Development Zone,

Fuqing City, Fujian Province, P.R. China Max. Resolution : 1920*1080@60Hz Max.Work Frequency : 148MHz Remote : Manufacturer: AG neovo; M/N: N/A Power Cord : Unshielded, Detachable, 1.8m/1.5m (3 pins) D-Sub Cable : Shielded, Detachable, 1.8m/1.5m (Bonded two ferrite cores) DVI Cable : Shielded, Detachable, 1.8m/1.5m (Bonded two ferrite cores) USB Cable : Shielded, Detachable, 1.8m/1.5m (Bonded two ferrite cores) Audio Cable : Unshielded, Detachable, 1.8m/1.5m HDMI Cable : Shielded, Detachable, 1.8m /1.5m Display Cable : Shielded, Detachable, 1.8m/1.5m Date of Test : Sep. 19~Oct. 25, 2014 Date of Receipt : Sep. 17, 2014 Sample Type : Prototype production

Page 9: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 9 of 146

2.2. Tested Supporting System Details

No. Description ACS No. Manufacturer Model Serial Number Approved type

1. Personal Computer

Test PC GQ1 DELL Dptiplex 9020MT

18MW91 A00DC2,Z248779

FCC DoC BSMI ID:R33002

Power Cord: Unshielded, Detachable, 1.8m Display Card: (Display+DVI+HDMI)

2. USB Keyboard

ACS-EMC- K03R DELL SK-8115 CN-ODJ313-71616-711-04WJ

FCC DoC BSMI ID: T3A002

Power Cord: shielded, Undetachable, 2.0m

3. Monitor

ACS-EMC-LM07R DELL 3008WFPt CN-0RW915-71618-846-397L

FCC DoC BSMI ID: R3A002

Power Cord: Unshielded, Detachable, 1.8m Display Cable: Shielded, Detachable, 1.8m DVI Cable: Shielded, Detachable, 1.8m (with two cores)

4. Printer

ACS-EMC-PT04 HP C9079A - FCC ID BSMI ID

USB Cable: shielded, Detachable, 1.5m Power Cord: Unshielded, Detachabled, 1.8m Power Adaptor: HP, 0957-2119, DC Cable: Unshielded, Detachabled, 1.5m

5. HDD ACS-EMC-HDD01 Terasys F12-UF A0100215-5390018 FCC DoC

BSMI ID USB Cable: shielded, Detachable, 1.0m

6. DVD

ACS-EMC-DVD01 DENON DVD-3910 4098400342E FCC ID BSMI ID

Audio In Cable: Shielded, Detachabled, 1.8m Component In Cable: Shielded, Detachabled, 1.8m Power Cord: Unshielded, Detachabled , 1.8m

7. USB Mouse ACS-EMC-M03R DELL M0C5UO 512023253 FCC DoC

BSMI ID: R41108 Power Cord: shielded, Undetachable, 1.8m

8. iPod ACS-EMC-IP01 APPLE A1199 YM706MLDVQ5 FCC DoC

BSMI ID: R33057 Data Cable: shielded, Undetachable, 1.0m

9. Power Amplifier

ACS-EMC-AMP01 SANGU AV-805 N/A FCC ID BSMI ID

Data Cable: Unshielded, Undetachable 1.2m Audio Out Cable: Shielded, Detachabled, 1.8m Speaker :Manufacturer: Shark M/N: HTW-615

External Speaker: 8Ω,15W

10. Speaker N/A NEC SP-TF1 3X0LTP223W FCC ID BSMI ID

Page 10: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 10 of 146

【PC system which transmitting 】

No. Description ACS No. Manufacturer Model Serial Number Approved type

1. Personal Computer

Test PC N DELL Studio 540 J14XK2X FCC DoC BSMI ID:R33002

Power Cord: Unshielded, Detachable, 1.8m LAN Cable: Unshielded, Detachable, 10m Display Card: HD3650 (DVI+Display+HDMI)

2. USB Keyboard ACS-EMC- K02R DELL SK-8115 CN-ORH656-658

90-686-007J FCC DoC

BSMI ID: T3A002

Power Cord: shielded, Undetachable, 2.0m

3. USB Mouse ACS-EMC-M02R DELL M056UO 512024264 FCC DoC

BSMI ID: R41108

Power Cord: shielded, Undetachable, 1.8m

4. Monitor ACS-EMC-LM04R DELL 1907FPt CN-009759-71618

-6AP-ACPP FCC DoC

BSMI ID: R3A002Power Cord: Unshielded, Detachable, 1.8m DVI Cable: Shielded, Detachable, 1.8m

5. HUB ACS-EMC-DL01 D-Link DGS-1008D B2C6468500621 FCC DoC

BSMI ID Data Cable: Shielded, Detachabled, 1.8m Adapter: M/N: RL48-07V51000, DC Cable: Unshielded, Detachabled , 1.0m

Page 11: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 11 of 146

2.3. Block Diagram of connection between EUT and simulators

For EMI Tests

For EMS Tests

(EUT: LCD Monitor)

PC AC Mains USB Keyboard

AC Mains

DVD

a: VGA Cable b: Audio Cable c: Display In Cable d: DVI In Cable e: HDMI Cable f: YPbPr In Cable g : Audio In Cable(L/R) h : Audio Out Cable i : DVI Out Cable j : LAN Cable k: Display Out Cable l: AC Out Cable m: USB Cable

: Core

USB Mouse

EUT

HDD

abc

Printer

Remote

d

AMP

iPod

Speaker*2

i

e

PC (EUT Partner)AC Mains

Monitor AC Mains

USB Mouse USB Keyboard

HUB

j

Monitor

k l

Speaker*2

f g e h

PC AC Mains USB Keyboard

AC Mains

USB Mouse EUT b

c

Remote

de

Speaker#2*2

a

m

m

Page 12: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 12 of 146

2.4. Test Facility

Site Description Name of Firm : Audix Technology (Shenzhen) Co., Ltd.

No. 6, Ke Feng Rd., 52 Block, Shenzhen Science & Industrial Park,Nantou, Shenzhen, Guangdong, China

3m Anechoic Chamber : Certificated by FCC, USA

Registration Number: 90454 Valid Date: Dec. 30, 2017

3m & 10m Anechoic Chamber : Certificated by FCC, USA

Registration Number: 794232 Valid Date: Oct.31, 2015

EMC Lab. : Certificated by DAkkS, Germany

Registration No: D-PL-12151-01-00 Valid Date: Dec.15, 2016

Accredited by NVLAP, USA

NVLAP Code: 200372-0 Valid Date: Mar.31, 2015

2.5. Measurement Uncertainty(95% confidence levels, k=2) Test Item Uncertainty

Uncertainty for Conduction emission testin No. 2 Conduction 3.08dB(150kHz~30MHz)

Uncertainty for ISN test in No.2 Conduction 3.50dB(150kHz~30MHz)

Uncertainty for Radiation Emission testin 10m chamber (Distance: 10m)

3.45dB (30~200MHz, Polarize: H) 3.47dB (30~200MHz, Polarize: V) 3.62dB (200M~1GHz, Polarize: H) 3.52dB (200M~1GHz, Polarize: V)

Uncertainty for Radiation Emission test in 10m chamber (1GHz-18GHz)

5.10dB (Distance: 3m Polarize: V) 5.26dB (Distance: 3m Polarize: H)

Uncertainty for SVSWR in 10m Chamber

5.33dB (Distance: 3m Polarize: V) 5.48Db (Distance: 3m Polarize: H)

Uncertainty for Flicker test 5.18% Uncertainty for Harmonic test 9.4%

Uncertainty for C/S Test 1.36dB (Using CDN test) 3.20dB (Using EM clamp test)

Uncertainty for R/S Test 1.73dB (80MHz~200MHz) 1.76dB(200MHz~1000MHz)

Uncertainty for test site temperature and humidity and pressure

0.6 3%

1kPa

Page 13: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 13 of 146

3. POWER LINE CONDUCTED EMISSION MEASUREMENT 3.1. Test Equipments

Item Equipment Manufacturer Model No. Serial No. Last Cal. Cal. Interval1 Test Receiver Rohde & Schwarz ESCI 100843 Nov. 08, 13 1 Year 2 L.I.S.N.#1 Rohde & Schwarz ENV4200 100041 Apr. 28,14 1 Year 3 L.I.S.N.#2 Kyoritsu KNW-407 8-1628-5 Apr. 28,14 1 Year 4 Terminator Hubersuhner 50Ω No. 1 Apr. 28,14 1 Year 5 Terminator Hubersuhner 50Ω No. 2 Apr. 28,14 1 Year 6 RF Cable Fujikura 3D-2W No.2 Apr. 28,14 1 Year 7 Coaxial Switch Anritsu MP59B 6200298346 Apr. 28,14 1 Year 8 Pulse Limiter Rohde & Schwarz ESH3-Z2 100340 Apr. 28,14 1 Year

3.2. Block Diagram of Test Setup

3.3. Test Standard EN 55022: 2010+AC: 2011 (Class B) and EN 55013: 2013

3.4. Power Line Conducted Emission Limit

Frequency

MHz

Limits dB(μV) Quasi-peak Level Average Level

0.15 ~ 0.50 66 ~ 56* 56 ~ 46* 0.50 ~ 5.00 56 46 5.00 ~ 30.00 60 50

Notes: 1. *Decreasing linearly with logarithm of frequency. 2. The lower limit shall apply at the transition frequencies.

3.5. EUT Configuration on Test The following equipments are installed on conducted emission test to meet EN 55013 and EN 55022 requirement and operating in a manner which tends to maximize its emission characteristics in a normal application. 3.5.1. LCD Monitor

Model Number : PM-65 Serial Number : N/A

3.5.2. Support Equipment : As Tested Supporting System Detail, in Section 2.2.

EUT Peripheral

LISN LISN

PC System

80cm

Receiver

:50Ω Terminator

0.8m

Page 14: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 14 of 146

3.6. Operating Condition of EUT

3.6.1. Setup the EUT and simulator as shown as Section 3.2.

3.6.2. Turned on the power of all equipment.

3.6.3. PC system ran the Self-test program “EMC TEST. exe” by windows XP and sent “H” Character to LCD Monitor (EUT) through DVI / VGA / HDMI / Display card, the Screen of EUT displayed and filled with “H” pattern.

3.6.4. The PC system was running the program “1kHz signal playing” and sending sound to EUT.

3.6.5. The PC system was reading / writing data from / into iPod during testing.

3.6.6. DVD Mode: The DVD player played DVD Disk and sent “DVD 1kHz Signal Playing” image to the LCD Monitor (EUT).

3.6.7. The other peripheral devices were driven and operated in turn during all testing.

3.7. Test Procedure The EUT was placed on a non-metallic table, 80cm above the ground plane. The EUT Power connected to the power mains through a line impedance stabilization network (L.I.S.N. 1#).The other peripheral devices power cord connected to the power mains through a line impedance stabilization network (L.I.S.N.#2). This provided a 50ohm coupling impedance for the tested equipments. Both sides of AC line are checked to find out the maximum conducted emission levels according to the EN 55013 and EN 55022 regulations during conducted emission test. The bandwidth of the test receiver (R&S Test Receiver ESCI) is set at 9kHz. The frequency range from 150kHz to 30MHz is checked. The test result are reported on Section 3.8.

Page 15: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 15 of 146

3.8. Power Line Conducted Emission Test Results PASS. (All emissions not reported below are too low against the prescribed limits.) The EUT with the following test modes were tested and selected (No. 3~13) to read Q.P values, all the test results are listed in next pages. EUT: LCD Monitor Model No. : PM-65 Test Date: Sep. 19, 2014 Temperature: 21.2 Humidity: 49.5% Pressure: 101.8kPa The details of test modes are as follows:

NO. Test Mode Input Port Cable Resolution & Frequency

Reference Test Data No.LINE NEUTRAL

1.

PC Mode

VGA

1.8m

640*480/60Hz # 31 # 322. 1280*1024/60Hz # 33 # 343. ※ 1920*1080/60Hz # 35 # 364. DVI 1920*1080/60Hz # 41 # 425. Display 1920*1080/60Hz # 43 # 446. HDMI 1 1920*1080/60Hz # 45 # 467. HDMI 2 1920*1080/60Hz # 47 # 48

8. VGA (Panel is vertical) 1080*1920/60Hz # 39 # 40

9. VGA 1.5m 1920*1080/60Hz # 37 # 3810.

DVD Mode

HDMI 1

1.8m

1080P # 49 # 5011. HDMI 2 1080P # 51 # 5212. AV In Ypbpr In # 55 # 5613. Ypbpr In AV In # 53 # 54

(※ Worst test mode)

Page 16: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 16 of 146

Page 17: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 17 of 146

Page 18: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 18 of 146

Page 19: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 19 of 146

Page 20: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 20 of 146

Page 21: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 21 of 146

Page 22: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 22 of 146

Page 23: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 23 of 146

Page 24: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 24 of 146

Page 25: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 25 of 146

Page 26: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 26 of 146

Page 27: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 27 of 146

Page 28: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 28 of 146

Page 29: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 29 of 146

Page 30: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 30 of 146

Page 31: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 31 of 146

Page 32: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 32 of 146

Page 33: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 33 of 146

Page 34: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 34 of 146

Page 35: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 35 of 146

Page 36: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 36 of 146

Page 37: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 37 of 146

Page 38: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 38 of 146

Page 39: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 39 of 146

Page 40: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 40 of 146

4. CONDUCTED DISTURBANCE AT TELECOMMUNICATION

PORTS MEASUREMENT 4.1. Test Equipments

Item Equipment Manufacturer Model No. Serial No. Last Cal. Cal. Interval1. 2# Shielding Room AUDIX N/A N/A Apr. 17,14 1 Year 2. Test Receiver Rohde & Schwarz ESCI 100843 Nov. 08,13 1 Year 3. L.I.S.N. #1 Rohde & Schwarz ENV4200 100041 Apr. 28,14 1 Year 4. L.I.S.N. #2 Kyoritsu KNW-407 8-1628-5 Apr. 28,14 1 Year 5. Terminator Hubersuhner 50Ω No. 1 Apr. 28,14 1 Year 6. Terminator Hubersuhner 50Ω No. 2 Apr. 28,14 1 Year 7. RF Cable Fujikura 3D-2W No. 2 Apr. 28,14 1Year 8. Current Probe Rohde & Schwarz EZ-17 833335/009 Nov. 28,13 1 Year

9. Single Balanced Telecom Pair ISN FCC FCC-TLISN-

T2-02 20534 Oct. 31,13 1 Year

10. Two Balanced Telecom Pairs ISN FCC FCC-TLISN-

T4-02 20535 Oct. 31,13 1Year

11. Four Balanced Telecom Pairs ISN FCC FCC-TLISN-

T8-02 20412 Apr. 28,14 1Year

12. Coaxial Switch Anritsu MP59B 6201397223 May. 16,14 1 Year 13. Pulse Limiter Rohde & Schwarz ESH3-Z2 100341 Apr. 28,14 1Year 14. I.S.N. TESEQ ISN T800 30858 Oct. 31,13 1 Year

4.2. Block Diagram of Test Setup

4.3. Test Standard

EN 55022: 2010+AC: 2011

4.4. Conducted Emission at Telecommunication Ports Limit

Frequency Maximum RF Line Voltage

Quasi-Peak Level dB(μV)

Average Level dB(μV)

150kHz ~ 500kHz 84~74 74~64 500kHz ~ 30MHz 74 64

Notes: 1. * Decreasing linearly with logarithm of frequency. 2. The lower limit shall apply at the transition frequencies.

EUT

LISN

PC System

LISN

0.8m80cm

Receiver

ISN

AE

:50Ω Terminator; a: Signal Line

a a

Page 41: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 41 of 146

4.5. EUT Configuration on Test The configurations of EUT are listed in Section 3.5

4.6. Operating Condition of EUT Same as Conducted Emission test that is listed in Section 3.6. except the test set up replaced by Section 4.2.

4.7. Test Procedure The EUT was placed on a non-metallic table, 80cm above the ground plane. The EUT Power connected to the power mains through a line impedance stabilization network (L.I.S.N. #1). This provided a 50-ohm coupling impedance for the EUT (Please refer to the block diagram of the test setup and photographs). The other peripheral devices power cord connected to the power mains through a line impedance stabilization network (L.I.S.N.#2). Both sides of power line were checked for maximum conducted interference. In order to find the maximum emission, the relative positions of equipments and all of the interface cables were changed according to EN 55022: 2010+AC: 2011 on Conducted Disturbance test. And connected to the telecommunication ports through ISN. Both sides of telecommunication line are investigated to find out the maximum conducted emission according to EN 55022: 2010+AC: 2011 regulations during conducted disturbance test. The bandwidth of the test receiver (R&S Test Receiver ESCI) is set at 9kHz. The frequency range from 150kHz to 30MHz is checked. The test result are reported on Section 4.8.

4.8. Conducted Emission at Telecommunication Ports Test Results PASS.

The EUT with the following test modes were tested and to read Q.P values, all the test results are listed in next pages. EUT: LCD Monitor Model Number: PM-65 Test Date: Sep. 19, 2014 Temperature: 21.2 Humidity: 49.5% Pressure: 101.8kPa The details of test modes are as follows:

No. Test Mode Reference Test Data No.

1. LAN:10Mbps # 60

2. ※ LAN:100Mbps # 59 (※ Worst test mode)

Page 42: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 42 of 146

Page 43: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 43 of 146

Page 44: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 44 of 146

5. RADIATED EMISSION MEASUREMENT

5.1. Test Equipments The following test equipments are used during the radiated emission measurement: 5.1.1. For frequency range 30MHz~1000MHz (At Anechoic Chamber)

Item Equipment Manufacturer Model No. Serial No. Last Cal. Cal. Interval1. 10m Chamber AUDIX N/A N/A Nov.25, 13 1 Year 2. EMC Analyzer Agilent E7405A MY42000131 Oct.31, 13 1 Year 3. EMC Analyzer Agilent E7405A MY45116588 Oct.31, 13 1 Year 4. Test Receiver Rohde & Schwarz ESCI 100842 Apr.28, 14 1 Year 5. Amplifier Agilent 8447D 2944A10684 Apr.28, 14 1Year 6. Amplifier Agilent 8447D 2944A11140 Apr.28, 14 1 Year

7. Trilog-Broadband Antenna SCHWARZBECK VULB 9168 9168-493 Apr. 08, 14 1 Year

8. Trilog-Broadband Antenna SCHWARZBECK VULB 9168 9168-429 Dec.03, 13 1 Year

9. RF Cable MIYAZAKI CFD400-NL 10m Chamber No.1 Apr.28, 14 1 Year

10. RF Cable MIYAZAKI CFD400-NL 10m Chamber No.2 Apr.28, 14 1 Year

11. Coaxial Switch Anritsu MP59B 6201397220 May.16, 14 1 Year 12. Coaxial Switch Anritsu MP59B 6201397221 May.16, 14 1 Year 13. Coaxial Switch Anritsu MP59B 6201397222 May.16, 14 1 Year

5.1.2. For frequency range 1GHz~6GHz (At Anechoic Chamber)

Item Equipment Manufacturer Model No. Serial No. Last Cal. Cal. Interval1. EMC Analyzer Agilent N9030A MY51380221 Oct.31, 13 1 Year 2. Horn Antenna ETS 3115 9607-4877 Sep.20, 14 1 Year 3. Amplifier Agilent 8449B 3008A00863 Apr.28, 14 1 Year 4. RF Cable Hubersuhner SUCOFLEX106 77977/6 Apr.28, 14 1 Year 5. RF Cable Hubersuhner SUCOFLEX106 28616/2 Apr.28, 14 1 Year 6. 10m Chamber AUDIX N/A N/A Mar.31, 14 1 Year

Page 45: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 45 of 146

5.2. Block Diagram of Test Setup

5.2.1. In 10m Anechoic Chamber Test Setup Diagram for 30-1000MHz

5.2.2. In Anechoic (10m) Chamber Test Setup Diagram for 1-6GHz

5.3. Test Standard EN 55022: 2010+AC: 2011 (Class B) and EN 55013: 2013

ANTENNA ELEVATION VARIES FROM 1 TO 4 METERS Remark: If necessary, The antenna rise and fall from 1 to 4 meters.

3m

TURN TABLE (FIBRE GLASS)

2.0m(L)*1.0m(W)*0.8m(H)

Semi-anechoic 10m Chamber

EUT

AMP Spectrum Analyzer PC System

(Reference Point)

0.8mABSORBER (30cm maximum)

(30cm)

1m

ANTENNA ELEVATION VARIES FROM 1 or 2 TO 4 METERS

10m/3m

TURN TABLE (FIBRE GLASS) 2.0m(L)*1.0m(W)*0.8m(H)

Receiver

Semi-anechoic 10m Chamber

EUT

Combining Network AMP Spectrum Analyzer PC System

Page 46: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 46 of 146

5.4. Radiated Emission Limit All emanations from a devices or system, including any network of conductors and apparatus connected thereto, shall not exceed the level of field strengths specified below: Test Standard: EN 55013: 2013

Source DISTANCE FREQUENCY (MHz)

Limits(dBμV/m) Quasi-Peak (Meters)

Local Oscillator 3 ≦1000 Fundamental 57 3 30~300 Harmonics 52 3 300~1000 Harmonics 56

Other 3 30~230 40 3 230~1000 47

Note: (1) Emission level = Antenna Factor + Cable Loss + Reading (2) The tighter limit shall apply at the edge between two frequency bands. (3) Distance refers to the distance in meters between the test antenna and

the closed point of any part of the EUT.

Test Standard: EN 55022: 2010+AC: 2011 FREQUENCY

(MHz) DISTANCE

(Meters) FIELD STRENGTHS LIMITS

(dBμV/m) 30 ~ 230 10 30

230 ~ 1000 10 37 1000~3000 3 70(Peak) 50(Average) 3000~6000 3 74(Peak) 54(Average)

Note: (1) Emission level = Antenna Factor + Cable Loss + Reading Emission level = Antenna Factor -Amp Factor +Cable Loss + Reading (above 1000MHz)

(2) The lower limit shall apply at the transition frequencies. (3) Distance refers to the distance in meters between the test antenna and the

closed point of any part of the EUT.

5.5. EUT Configuration on Test The configurations of EUT are listed in Section 3.5.

5.6. Operating Condition of EUT Same as Conducted Emission test that is listed in Section 3.6. except the test set up replaced by Section 5.2.

Page 47: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 47 of 146

5.7. Test Procedure The EUT was placed on a non-metallic table, 80 cm above the ground plane inside a semi-anechoic chamber. An antenna was located 3&10 meters from the EUT on an adjustable mast. A pre-scan was first performed in order to find prominent radiated emissions. For final emissions measurements at each frequency of interest, the EUT were rotated and the antenna height was varied between 1m and 4m in order to maximize the emission for EN 55022. 2m and 4m on vertical for EN 55013. Measurements in both horizontal and vertical polarities were made and the data was recorded. In order to find the maximum emission, the relative positions of equipments and all of the interface cables were changed according to EN 55013 and EN 55022 Class B on Radiated Disturbance test.

The bandwidth setting on the test receiver (R&S TEST RECEIVER ESCI) is 120 kHz.

The resolution bandwidth of the EMC Analyzer N9030A was set at 1MHz. (For above 1GHz) The frequency range from 30MHz to 1000MHz was pre-scanned with a peak detector and all final readings of measurement from Test Receiver are Quasi-Peak values. The frequency range from 1GHz to 6GHz was checked and all final readings of measurement were with Peak and Average detector, measurement distance was 3m at semi-anechoic chamber. The portion of the test volume that was obstructed by absorber placed on the floor (30cm maximum). Finally, selected operating situations at Anechoic Chamber measurement, all the test results are listed in section 5.8.

5.8. Radiated Emission Test Results PASS. (All emissions not reported below are too low against the prescribed limits.)

Page 48: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 48 of 146

EUT: LCD Monitor Model No. : PM-65 For frequency range 30MHz~1000MHz The EUT with the following test modes were tested and selected (No. 3 ~13) to read Q.P values, all the test results listed in next pages. Test Date: Oct.14, 2014 Temperature: 24.1 Humidity: 50.2% Pressure: 101.9kPa

The details of test modes are as follows:

No. Test Mode Input Port Cable Resolution & Frequency

Reference Test Data No.

Horizontal Vertical1.

PC Mode

HDMI 2

1.8m

640*480/60Hz # 30 # 29 2. 1280*1024/60Hz # 32 # 31

3.※ 1920*1080/60Hz # 34 # 33 4. HDMI 1 1920*1080/60Hz # 46 # 45 5. VGA 1920*1080/60Hz # 40 # 39 6. DVI 1920*1080/60Hz # 42 # 41 7. Display 1920*1080/60Hz # 44 # 43

8. HDMI 2 (Panel is vertical)

1080*1920/60Hz # 38 # 37

9. HDMI 2 1.5m 1920*1080/60Hz # 36 # 35 10.

DVD Mode

HDMI 1 1.8m 1080P # 50 # 49 11. HDMI 2 1080P # 48 # 47 12. Ypbpr In

----Ypbpr In # 52 # 51

13. AV In AV In # 54 # 53 (※ Worst test mode)

For frequency range 1GHz~6GHz The EUT with below test No. 1~5 were measured within Anechoic Chamber and the test results listed in next pages Test Date: Oce.07, 2014 Temperature: 21.6 Humidity: 49.5% Pressure: 101.7kPa

No. Cable Input Port Resolution & Frequency Reference Test Data No.Horizontal Vertical

1.

1.8m

HDMI 1 1280*1024/60Hz # 22 # 21

2. ※ 1920*1080/60Hz # 24 # 23

3. HDMI 2 1920*1080/60Hz # 26 # 25

4. VGA 1920*1080/60Hz # 32 # 31

5. DVI 1920*1080/60Hz # 28 # 27

6. Display 1920*1080/60Hz # 30 # 29

(※ Worst test mode)

Page 49: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 49 of 146

Page 50: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 50 of 146

Page 51: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 51 of 146

3. The worst emission was detected at 311.300 MHz with corrected

signal level of 30.80 dBμV/m (Limit is 37.00 dBμV/m) when the antenna was at horizontal polarization and at 2.3m high and the turntable was at 145°.

4. 0° was the table front facing the antenna. Degree is calculated from 0° clockwise facing the antenna.

Page 52: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 52 of 146

3.The worst emission was detected at 311.300 MHz with corrected

signal level of 30.80 dBμV/m (Limit is 37.00 dBμV/m) when the antenna was at horizontal polarization and at 2.3m high and the turntable was at 145°.

4. 0° was the table front facing the antenna. Degree is calculated from 0° clockwise facing the antenna.

Page 53: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 53 of 146

Page 54: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 54 of 146

Page 55: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 55 of 146

Page 56: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 56 of 146

Page 57: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 57 of 146

Page 58: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 58 of 146

Page 59: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 59 of 146

Page 60: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 60 of 146

Page 61: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 61 of 146

Page 62: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 62 of 146

Page 63: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 63 of 146

Page 64: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 64 of 146

Page 65: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 65 of 146

Page 66: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 66 of 146

Page 67: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 67 of 146

Page 68: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 68 of 146

Page 69: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 69 of 146

Page 70: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 70 of 146

Page 71: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 71 of 146

Page 72: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 72 of 146

Page 73: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 73 of 146

Page 74: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 74 of 146

Page 75: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 75 of 146

Page 76: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 76 of 146

Page 77: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 77 of 146

Page 78: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 78 of 146

Page 79: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 79 of 146

Page 80: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 80 of 146

Page 81: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 81 of 146

Page 82: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 82 of 146

Page 83: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 83 of 146

Page 84: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 84 of 146

Page 85: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 85 of 146

6. HARMONIC CURRENT EMISSION TEST

6.1. Test Equipments Item Equipment Manufacturer Model No. Serial No. Last Cal. Cal. Interval1. AC Source California Instruments 5001ix 58481 Oct.31, 13 1 Year 2. Power Analyzer California Instruments PACS-1 72627 Oct.31, 13 1 Year

6.2. Block Diagram of Test Setup

6.3. Test Standard

EN 61000-3-2: 2006+A1: 2009+A2: 2009; Class D

6.4. Limits of Harmonic Current

Limits for Class D Equipment

Harmonic order (n) Maximum permissible

harmonic current per watt (mA/W)

Maximum permissible harmonic

current (A) 3 3.4 0.23 5 1.9 1.14 7 1.0 0.77 9 0.5 0.40 11 0.35 0.33 13 0.30 0.21

15≤n≤39 (odd harmonic only) 3.85/n 0.15×15/n

Remark: if the EUT Power level is below 75 Watts and therefore has no defined limits.

6.5. EUT Configuration on Test The configurations of EUT are listed in Section 3.5.

6.6. Operating Condition of EUT Same as Conducted Emission test that is listed in Section 3.6. except the test set up replaced by Section 6.2.

EUT

0.8m

AC Mains

Power Analyzer

AC Source

Page 86: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 86 of 146

6.7. Test Procedure The EUT was placed on the top of a wooden table 0.8 meters above the ground and operated to produce the maximum harmonic components under normal operating conditions for each successive harmonic component in turn. The correspondent test program of test instrument to measure the current harmonics emanated from EUT is chosen. The measure time shall be not less than the necessary for the EUT to be exercised.

6.8. Test Results PASS. Please refer to the following pages.

Page 87: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 87 of 146

Page 88: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 88 of 146

Page 89: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 89 of 146

Page 90: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 90 of 146

Page 91: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 91 of 146

Page 92: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 92 of 146

Page 93: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 93 of 146

7. VOLTAGE FLUCTUATIONS & FLICKER TEST

7.1. Test Equipments Same as Section 6.1.

7.2. Block Diagram of Test Setup Same as Section 6.2.

7.3. Test Standard EN 61000-3-3: 2013

7.4. Limits of Voltage Fluctuation and Flick Test Item Limit Note

Pst 1.0 Pst means Short-term flicker indicator Plt 0.65 Plt means long-term flicker indicator

Tmax 500ms Tmax means maximum time that d(t) exceeds 3.3% dmax(%) 4% dmax means maximum relative voltage change. dc(%) 3.3% dc means relative steady-state voltage change.

7.5. EUT Configuration on Test The configurations of EUT are listed in Section 3.5.

7.6. Operating Condition of EUT Same as Section 6.6.

7.7. Test Procedure The EUT was placed on the top of a wooden table 0.8 meters above the ground and operated to produce the most unfavorable sequence of voltage changes under normal conditions During the flick measurement, the measure time shall include that part of whole operation changes. The observation period for short-term flicker indicator is 10 minutes and the observation period for long-term flicker indicator is 2 hours.

7.8. Test Results PASS. The EUT was tested and all the test results are listed in next pages.

Page 94: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 94 of 146

Page 95: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 95 of 146

Page 96: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 96 of 146

8. IMMUNITY PERFORMANCE CRITERIA DESCRIPTION Performance Level

The test results shall be classified in terms of the loss of function or degradation of performance of the equipment under test, relative to a performance level by its manufacturer or the requestor of the test, or the agreed between the manufacturer and the purchaser of the product. Definition related to the performance level: 1. Based on the used product standard 2. Based on the declaration of the manufacturer, requestor or purchaser

For EN 55024 Criterion A: Definition: normal performance within limits specified by the manufacturer, requestor and purchaser. The equipment shall continue to operate as intended without operator intervention. No degradation of performance or loss of function is allowed below a performance level specified by the manufacturer when the equipment is used as intended. The performance level may be replaced by a permissible loss of performance. If the minimum performance level or the permissible performance loss is not specified by the manufacturer, then either of these may be derived from the product description and documentation, and by what the user may reasonably expect from the equipment if used as intended. Criterion B: Definition: temporary loss of function or degradation of performance which ceases after the disturbance ceases, and from which the equipment under test recovers its normal performance, without operator intervention. After the test, the equipment shall continue to operate as intended without operator intervention. No degradation of performance or loss of function is allowed, after the application of the phenomena below a performance level specified by the manufacturer, when the equipment is used as intended. The performance level may be replaced by a permissible loss of performance. During the test, degradation of performance is allowed. However, no change of operating state or stored data is allowed to persist after the test. If the minimum performance level (or the permissible performance loss) is not specified by the manufacturer, then either of these may be derived from the product description and documentation, and by what the user may reasonably expect form the equipment if used as intended. Criterion C: Definition: temporary loss of function or degradation of performance, the correction of which requires operator intervention. Loss of function is allowed, provided the function is self-recoverable, or can be restored by the operation of the controls by the user in accordance with the manufacturer’s instructions. Functions, and/or information stored in non-volatile memory, or protected by a battery backup, shall not be lost. Criterion D: Definition: loss of function or degradation of performance, which is not recoverable, owing to damage to hardware or software, or loss of data.

Page 97: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 97 of 146

For EN 55020 Criterion A: Definition: normal performance within limits specified by the manufacturer, requestor and purchaser. The equipment shall continue to operate as intended during the test. No change of actual operating state (for example change of channel) is allowed as a result of the application of the test. The criterion of compliance with the requirement is a wanted to unwanted audio signal ratio of > 40dB at a wanted audio signal level of 50mW (or for AM sound receivers the criterion is >26dB at 50mW, or For AM and FM car radios and for broadcast receiver cards for computers the criterion is >26dB at 500mW), or at another audio signal level specified by the manufacturer. No degradation of test picture is allowed. Criterion B: Definition: temporary loss of function or degradation of performance which ceases after the disturbance ceases, and from which the equipment under test recovers its normal performance, without operator intervention. After the test, the equipment shall continue to operate as intended without operator intervention. No loss of function is allowed after the test when the apparatus is used as intended, but failures which are recovered automatically but which cause temporary delay in processing are permissible. No change of actual operating state is allowed as a result of the application of the test. During the test, degradation of performance is allowed. Criterion C: Definition: temporary loss of function or degradation of performance, the correction of which requires operator intervention. Criterion D: Definition: loss of function or degradation of performance, which is not recoverable, owing to damage to hardware or software, or loss of data.

Page 98: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 98 of 146

9. ELECTROSTATIC DISCHARGE IMMUNITY TEST

9.1. Test Equipments

Item Equipment Manufacturer Model No. Serial No. Last Cal. Cal. Interval1 ESD Tester EM Test Dito P1349126669 Jun. 05,14 1 Year

9.2. Block Diagram of Test Setup

9.3. Test Standard EN 55024: 2010, EN 55020: 2007+A11: 2011, (IEC 61000-4-2: 2008) Severity Level 1&2&3 for Air Discharge at 2kV&4kV&8kV Severity Level 1&2 for Contact Discharge at 2kV&4kV

9.4. Severity Levels and Performance Criterion

Severity Level Test Voltage Contact Discharge (kV)

Test Voltage Air Discharge (kV)

Performance criterion

1. 2 2

B 2. 4 4 3. 6 8 4. 8 15

X Special Special

9.5. EUT Configuration The configuration of EUT are listed in Section 3.5.

9.6. Operating Condition of EUT Same as Conducted test which is listed in Section 3.6. except the test set up replaced by Section 9.2.

EUT

Horizontal Coupling PlaneESD Generator

470kΩx2

0.8m

Vertical Coupling Plane 0.1m>1.0m

470kΩx2 Insulating Support (0.5mm)

Wall

Page 99: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 99 of 146

9.7. Test Procedure

9.7.1. Air Discharge: This test is done on a non-conductive surfaces. The round discharge tip of the discharge electrode shall be approached as fast as possible to touch the EUT. After each discharge, the discharge electrode shall be removed from the EUT. The generator is then re-triggered for a new single discharge and repeated 20 times for each pre-selected test point. This procedure shall be repeated until all the air discharge completed.

9.7.2. Contact Discharge: For PC mode, all the procedure shall be same as Section 9.7.1. except that the generator is then re-triggered for a new single discharge and repeated 50 times for each pre-selected test point. the tip of the discharge electrode shall touch the EUT before the discharge switch is operated. For TV mode, the generator was re-triggered for a new single discharge and repeated 20 times for each pre-selected test point. This procedure was repeated until all the air discharge completed.

9.7.3. Indirect discharge for horizontal coupling plane At least 20 single discharges shall be applied to the horizontal coupling plane, at points on each side of the EUT. The discharge electrode positions vertically at a distance of 0.1m from the EUT and with the discharge electrode touching the coupling plane.

9.7.4. Indirect discharge for vertical coupling plane At least 20 single discharge shall be applied to the center of one vertical edge of the coupling plane. The coupling plane, of dimensions 0.5m X 0.5m, is placed parallel to, and positioned at a distance of 0.1m from the EUT. Discharges shall be applied to the coupling plane, with this plane in sufficient different positions that the four faces of the EUT are completely illuminated.

9.8. Test Results

PASS. The EUT was tested and all the test results are listed in next pages.

Page 100: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 100 of 146

Electrostatic Discharge Test Results Audix Technology (Shenzhen) Co., Ltd.

Applicant :TPV Electronics (FuJian) Co., Ltd. Test Date : Oct. 18, 2014 EUT : LCD Monitor Temperature : 23.6±0.6

M/N : PM-65 Humidity : 46±3% Test Voltage : AC 230V/50Hz Test Mode : As Section 3.6 Test Engineer : Sun Pressure : 101±1kPa Required Performance : B

Actual Performance : A&B

Air Discharge: ±2kV ±4kV ±8kV # For Air Discharge each Point Positive 10 times and negative 10 times discharge. Contact Discharge: ±2kV ±4kV # For Contact Discharge each point positive 25times and negative

25 times discharge For the time interval between successive single discharges an initial value of one second.

Discharge Voltage (kV)

Type of discharge Dischargeable Points Performance Result

Requir Observation (Pass/Fail)±2 Contact 2,5,7,8,9,13 B A Pass±4 Contact 2,5,7,8,9,13 B B Pass±2 Air 1,3,4,6,7,8,9,10,11,12,14,15 B A Pass±4 Air 1,3,4,6,7,8,9,10,11,12,14,15 B A Pass±8 Air 1,3,4,6,7,8,9,10,11,12 B B Pass±2 HCP-Bottom Edge of the HCP B A Pass±2 VCP-Front Center of the VCP B A Pass±2 VCP-Left Center of the VCP B A Pass±2 VCP-Back Center of the VCP B A Pass±2 VCP-Right Center of the VCP B A Pass±4 HCP-Bottom Edge of the HCP B A Pass±4 VCP-Front Center of the VCP B A Pass±4 VCP-Left Center of the VCP B A Pass±4 VCP-Back Center of the VCP B A Pass±4 VCP-Right Center of the VCP B A Pass

Discharge Points Description 1 Slots 6 Buttons 11 Audio In / out Ports 2 Screws 7 USB Port 12 Audio In(L/R) Port 3 LED 8 LAN Port 13 YPbPr Port 4 Screen 9 HDMI /Display /DVI / VGA Port 14 Switch 5 Metal 10 AC In/Out Ports 15 Speaker Port

Remark:1.After discharge to the ungrounded part of EUT, it needs the bleeder resistor to remove the charge prior to next ESD pulse.

2.The Class “B” means the Screen of EUT has little flicker , the speakers has little noise, and data transmitting from the LAN Port was delayed, but can recovery by itself after test.

Discharge should be considered on Contact and Air and Horizontal Coupling Plane (HCP) and Vertical Coupling Plane (VCP).

Page 101: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 101 of 146

10. RF FIELD STRENGTH SUSCEPTIBILITY TEST

10.1.Test Equipments

Item Equipment Manufacturer Model No. Serial No. Last Cal. Cal. Interval

1. 2#Chamber AUDIX N/A N/A Apr. 28,14 1Year 2. Signal Generator Agilent N5181A MY49061013 Oct.31, 13 1Year 3 Amplifier A&R 100W/1000M1 17028 NCR NCR 4. Power Meter Anritsu ML2487A 6K00002472 Aug. 20,14 1Year 5. Power Sensor Anritsu MA2491A 032516 Aug. 20,14 1Year 6. Log-periodic Antenna A&R AT1080 16512 NCR NCR

Note: NCR: No calibration required(calibrated with system)

10.2.Block Diagram of Test Setup

10.3.Test Standard EN 55024: 2010 (IEC 61000-4-3: 2010), Severity Level 2 at 3V / m

10.4.Severity Levels and Performance Criterion

Severity Level Test Field Strength V/m Performance Criteria

1. 1

A 2. 3

3. 10

X. Special

10.5.EUT Configuration The configuration of EUT are listed in Section 3.5.

10.6.Operating Condition of EUT Same as Conducted Emission test that is listed in Section 3.6. except the test set up replaced by Section 10.2.

1.5m

EUT 3.0m

Log-Periodic Antenna Full Anechoic Chamber

Absorbing Material

Signal Generator

Power Amplifier

0.8m

Page 102: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 102 of 146

10.7.Test Procedure Testing was performed in a Fully anechoic chamber as recommended by IEC 61000-4-3. The EUT was placed on an 80 cm high non-conductive table located in the area of field uniformity. The radiating antenna was placed 3m in front of the EUT and Support system, and dwell time of the radiated interference was controlled by an automated, computer-controlled system. The signal source was stepped through the applicable frequency range at a rate no faster than 1% of the fundamental. The signal was amplitude modulated 80% over the frequency range 80 MHz to 1GHz at a level of 3 V/m. The dwell time was set at 3.0s. Field presence was monitored during testing via a field probe placed in close proximity to the EUT. Throughout testing, the EUT was closely monitored for signs of susceptibility. The test was performed with the antennae oriented in both a horizontal and vertical polarization. All the scanning conditions are as follows :

Test conditions Frequency 80MHz-1GHz

Frequency increments step 1% of momentary used Test level 3V/m (unmodulated)

Dwell time 3s

Test signal 80% amplitude modulated by 1kHz sinusoidal audio signal

10.8.Test Results PASS. The EUT was tested and all the test results are listed in next page.

Page 103: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 103 of 146

RF Field Strength Susceptibility Test Results Audix Technology(Shenzhen) Co.,Ltd.

Applicant : TPV Electronics (FuJian) Co., Ltd. Test Date : Oct. 17, 2014

EUT : LCD Monitor Temperature : 21.2±0.6

M/N : PM-65 Humidity : 46±3%

Test Voltage : AC 230V/50Hz Pressure : 101.5±1kPa

Test Engineer : Mark Test Mode : As Section 3.6

Required Performance : A

Actual Performance : A

Modulation: AM Pulse none 1 kHz 80%

Frequency Rang :80 MHz -1000MHz

Horizontal Vertical Result Required Observation Required Observation (Pass / Fail)

Front A A A A Pass Right A A A A Pass Rear A A A A Pass Left A A A A Pass

Remark:

Page 104: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 104 of 146

11. RF E.M. FIELD KEYED CARRIER TEST 11.1.Test Equipments

Item Equipment Manufacturer Model No. Serial No. Last Cal. Cal. Interval

1. 2#Chamber AUDIX N/A N/A Apr. 28,14 1Year 2. Signal Generator R&S SML02 100822 Apr. 28,14 1 Year 3. Audio Analyzer HP 8903B 3514A16369 Apr. 28,14 1 Year 4. Pattern Generator Philiphs PM5418 LO625020 Apr. 28,14 1 Year 5. Log-periodic Antenna A&R AT1080 16512 NCR NCR 6. RF Cable JINGCHENG KLMR400 No.1/2/3 NCR NCR 7. Amplifier A&R 100W/1000M1 17028 NCR NCR

8. Band-stop filter Erika Fiedler Messtechnik 8 ohm N/A Mar.25, 14 0.5Year

9. Band-stop filter Erika Fiedler Messtechnik 300 ohm N/A Mar.25, 14 0.5Year

10. Band-stop filter Erika Fiedler Messtechnik ∞ ohm N/A Mar.25, 14 0.5Year

11. MPEG2 Measurement Generator

ROHDE&SCHWARZ DVG 100319 Oct.29, 13 1 Year

12. TV Transmitter ROHDE&SCHWARZ SFQ 100521 Apr. 28,14 1 Year

13. Signal Generator HP 8648A 3625U00573 Apr. 28,14 1 Year Note: NCR: No calibration required(calibrated with system)

11.2.Block Diagram of Test Setup

11.3.Test Standard

EN 55020: 2007+A11: 2011 (IEC 61000-4-3: 2010) Severity Level 2 at 3V/m

1.5m

EUT 3.0m

Log-Periodic Antenna Full Anechoic Chamber

Absorbing Material

Signal Generator

Power Amplifier

0.8m

Page 105: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 105 of 146

11.4.Severity Levels and Performance Criterion

Severity Level Test Field Strength V/m Performance Criteria

1. 1

A 2. 3

3. 10

X. Special

11.5.EUT Configuration The configuration of EUT are listed in Section 3.5.

11.6.Operating Condition of EUT Same as conducted test which is listed in Section 3.6. except the test set up replaced by Section 11.2.

11.7.Test Procedure The test was carried out on one Fully Anechoic Chamber, the EUT and its simulators are placed on a wood table which is 0.8 meter above ground. EUT is set 3 meter away from the transmitting antenna which is mounted on an antenna tower. All ports were terminated with shielded resistors exclud the ports which related to non-broadcast functions, video ports were terminated by 75 ohm, audio ports were terminated by 10Kohm. An audio analyzer will be used to monitor s/n from EUT’s speaker/audio out/earphone. Picture quality will be monitored from EUT’s screen through a CCD camera or from EUT’s video out through a test TV set. Vertical polarization of the antenna is setting on test. Right side of EUT must be faced this transmitting antenna. All the scanning conditions are as follows :

Test Level Performance CriteriaFrequency 900MHz

A Test level 3V/m (unmodulated)

Dwell time 3s

Test signal duty cycle 1/8 217 Hz repetition frequency

11.8.Test Results PASS. The EUT was tested and all the test results are listed in next page.

Page 106: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 106 of 146

RF E.M. Field Keyed Carrier Test Results Audix Technology(Shenzhen) Co.,Ltd.

Applicant : TPV Electronics (FuJian) Co., Ltd. Test Date : Oct. 16, 2014

EUT : LCD Monitor Temperature : 22±0.6

M/N : PM-65 Humidity : 50±3%

Test Voltage : AC 230V/50Hz Pressure : 100.6±1kPa

Test Engineer : Mark Test Mode : AV Mode

Scanning Frequency : 900MHz Field

Strength : 3V/m

Required Performance : A

Actual Performance : A

Test signal:

900MHz ,3V/m , duty cycle 1/8 217 Hz repetition frequency

Remark:

Page 107: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 107 of 146

12. ELECTRICAL FAST TRANSIENT/BURST IMMUNITY TEST

12.1.Test Equipments Item Equipment Manufacturer Model No. Serial No. Last Cal. Cal. Interval1. Burst Tester TESEQ NSG3025 28017 Apr. 28,14 1 Year 2. CDN TESEQ CDN8014 29638 Apr. 28,14 1 Year

12.2.Block Diagram of Test Setup

12.3.Test Standard EN 55024: 2010, EN 55020: 2007+A11: 2011, (IEC 61000-4-4: 2012, Severity Level 1 at 0.5kV,Severity Level 2 at 1kV)

12.4.Severity Levels and Performance Criterion Open Circuit Output Test Voltage ±10%

Severity Level On Power Supply Lines On I/O (Input/Output) Signal data and control lines

Performance criterion

1. 0.5 kV 0.25 kV

B 2. 1 kV 0.5 kV 3. 2 kV 1 kV 4. 4 kV 2 kV X Special Special

12.5.EUT Configuration The configuration of EUT are listed in Section 3.5.

12.6.Operating Condition of EUT Same as Conducted Emission test which is listed in Section 3.6. except the test set up replaced by Section 12.2.

EUT EFT/B Tester 0.1m wood

0.8m

AC Mains AC Mains

Wall

>0.5m

Ground reference plane

Page 108: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 108 of 146

12.7.Test Procedure The EUT and its simulators were placed on a ground reference plane and were insulated from it by a wood support 0.1m + 0.01m thick. The ground reference plane was 1m*1m metallic sheet with 0.65mm minimum thickness. This reference ground plane was project beyond the EUT by at least 0.1m on all sides and the minimum distance between EUT and all other conductive structure, except the ground plane was more than 0.5m. All cables to the EUT was placed on the wood support, cables not subject to EFT/B was routed as far as possible from the cable under test to minimize the coupling between the cables.

12.7.1.For input and output AC power ports: The EUT was connected to the power mains by using a coupling device that couples the EFT interference signal to AC power lines. Both positive transients and negative transients of test voltage was applied during compliance test and the duration of the test can’t less than 1min.

12.7.2.For signal lines and control lines ports: It’s unnecessary to test.

12.7.3.For DC output line ports: It’s unnecessary to test.

12.8.Test Results PASS. The EUT was tested and all the test results are listed in next page.

Page 109: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 109 of 146

Electrical Fast Transient/Burst Test Results Audix Technology (Shenzhen)Co., Ltd.

Applicant : TPV Electronics (FuJian) Co., Ltd. Test Date : Oct. 18, 2014

EUT : LCD Monitor Temperature : 23.6±0.6

M/N : PM-65 Humidity : 46±3%

Test Voltage : AC 230V/50Hz Test Mode : As Section 3.6

Test Engineer : Sun Pressure : 100.1±1kPa

Required Performance : B

Actual Performance : A&B

Repetition Frequency : 5 kHz Burst Duration : 15ms Burst Period: 300ms

Inject Time(s): 120s Inject Method: Direct Inject Line: AC Mains DC Supply Signal

Line Test Voltage Performance Result

Required Observation(+ ) Observation( - ) (Pass/Fail)

L 0.5 kV B A A Pass 1kV B B B Pass

N 0.5 kV B A A Pass 1kV B B B Pass

PE 0.5 kV B A A Pass 1kV B B B Pass

L.N 0.5 kV B A A Pass 1kV B B B Pass

L.PE 0.5 kV B A A Pass 1kV B B B Pass

N.PE 0.5 kV B A A Pass 1kV B B B Pass

L.N.PE 0.5 kV B A A Pass 1kV B B B Pass

Signal Line 0.5 kV B B B Pass Remark: The Class “B” means the Screen of EUT has little flicker , the speakers has little noise, and

data transmitting from the LAN port was delaied, but can recovery by itself after test.

Page 110: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 110 of 146

13. SURGE TEST

13.1.Test Equipments Item Equipment Manufacturer Model No. Serial No. Last Cal. Cal. Interval

1 Transient Test System EMC PARTNER TRANSIENT

2000 TRA2006 F-S-T-D-R

-1500 Oct.26, 14 1 Year

2 CDN EMC PARTNER CDN-UTP8 CDN-UTP8-1508 Oct.26, 14 1 Year 3 CDN EMC PARTNER CDN2000-06-25 CDN2000-06-25 0111 Oct.26, 14 1 Year

13.2.Block Diagram of Test Setup

13.3.Test Standard EN 55024: 2010, (IEC 61000-4-5: 2005) Severity Level : Line to Line: Level 1&2 at 0.5kV&1kV

Line to Ground: Level 1&2&3 at 0.5kV&1kV&2kV Signal Line: Level 1 at 0.5kV; Level 2 at 1kV.

13.4.Severity Levels and Performance Criterion

Severity Level Open-Circuit Test Voltage kV Performance criterion

1 2 3 4 *

0.5 1.0 2.0 4.0

Special

B

13.5.EUT Configuration The configuration of EUT are listed in Section 3.5.

13.6.Operating Condition of EUT Same as Conducted Emission test that is listed in Section 3.6. except the test set up replaced by Section 13.2

13.7.Test Procedure 1) Set up the EUT and test generator as shown on Section 13.2. 2) For line to line coupling mode, provide a 1kV 1.2/50us voltage surge (at

open-circuit condition) and 8/20us current surge to EUT selected points, and for active line / neutral line to ground are same except test level is 2kV.

3) At least 5 positive and 5 negative (polarity) tests with a maximum 1/min repetition rate are conducted during test.

4) Different phase angles are done individually. 5) Record the EUT operating situation during compliance test and decide the EUT

immunity criterion for above each test. 13.8.Test Results

PASS. Please refer to the following page.

EUT Test GeneratorAC Mains AC Mains

0.8m

Page 111: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 111 of 146

Surge Immunity Test Results Audix Technology (Shenzhen) Co., Ltd.

Applicant : TPV Electronics (FuJian) Co., Ltd. Test Date : Oct. 18, 2014

EUT : LCD Monitor Temperature : 23.6±0.6

M/N : PM-65 Humidity : 46±3%

Power Supply : AC 230V/50Hz Test Mode : As Section 3.6

Test Engineer : Sun Pressure : 100.2±1kPa Required Performance : B & C

Actual Performance : A & B

No.of pluse: ±5 Interval:60 Seconds

Line : AC Mains DC Supply Signal

Location

Volt 500V 1kV 2kV Result

Phase Performance Performance Performance

(Pass/Fail)Required + - Required + - Required + -

L-N

0° B A A B A A Pass 90° B A A B A A Pass 180° B A A B A A Pass 270° B A A B A A Pass

L-PE

0° B A A B A A B B B Pass 90° B A A B A A B B B Pass 180° B A A B A A B B B Pass 270° B A A B A A B B B Pass

N-PE

0° B A A B A A B B B Pass 90° B A A B A A B B B Pass 180° B A A B A A B B B Pass 270° B A A B A A B B B Pass

Signal Line LAN C B B C B B Pass Remark: The Class “B” means the Screen of EUT has little flicker, the data transmitting from LAN

port was interrupted daring test. but can recovery by itself after test.

Page 112: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 112 of 146

14. INJECTED CURRENTS SUSCEPTIBILITY TEST 14.1.Test Equipments

Item Equipment Manufacturer Model No. Serial No. Last Cal. Cal. Interval1. Signal Generator Agilent N5181A MY49061013 Oct.29, 13 1 Year2. Amplifier AR 25A250A 19152 NCR NCR3. Amplifier AR 100A250 19368 NCR NCR4. Power meter HP 436A 2016A07891 Apr. 28,14 1Year5. Power sensor Agilent 8482B MY41090514 Nov.23, 13 1Year 6. CDN FCC FCC-801-M2-25 47 Apr. 28,14 1 Year7. CDN FCC FCC-801-M3-25 107 Apr. 28,14 1 Year8. CDN FCC FCC-801-M2-25 07035 Apr. 28,14 1 Year9. CDN FCC FCC-801-M3-25 07045 Apr. 28,14 1 Year15. PC N/A N/A N/A N/A N/A16. Attenuator Weinschel 40-6-34 LJ092 Apr. 28,14 1 Year17. EM Injection Clamp FCC F-203I-23mm 403 Apr. 28,14 1 Year18. RF Cable MICABLE A04-07-07-2M 09111340 NCR NCR19. RF Cable STORM MFR-57500 90-195-2MTR NCR NCRNote: NCR: No calibration required(calibrated with system)

14.2.Block Diagram of Test Setup

14.3.Test Standard EN 55024: 2010 (IEC 61000-4-6: 2013), Severity Level 2 at 3V (rms) and frequency is from 0.15MHz to 80MHz

14.4.Severity Levels and Performance Criterion

Severity Level Voltage Level (e.m.f.) V Performance criterion 1 1

A 2 3 3 10 X Special

14.5.EUT Configuration

The configuration of EUT are listed in Section 3.5. 14.6.Operating Condition of EUT

Same as Conducted Emission test that is listed in Section 3.6. except the test set up replaced by Section 14.2.

EUT CDN

AC Mains

PowerAmplifier

0.1m

AE 50ΩTerminator

Signal Generator PC System

CDN

AC Mains

Page 113: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 113 of 146

14.7.Test Procedure

1) Set up the EUT, CDN and test generators as shown on Section 14.2. 2) Let the EUT work in test mode and measure it. 3) The EUT are placed on an insulating support 0.1m high above a ground reference

plane. CDN (coupling and decoupling device) is placed on the ground plane about 0.3m from EUT. Cables between CDN and EUT are as short as possible, and their height above the ground reference plane shall be between 30 and 50 mm (where possible).

4) The disturbance signal described below is injected to EUT through CDN. 5) The EUT operates within its operational mode(s) under intended climatic conditions

after power on. 6) The frequency range is swept from 150kHz to 80MHz using 3V signal level, and with

the disturbance signal 80% amplitude modulated with a 1kHz sine wave. 7) The rate of sweep shall not exceed 1.5*10-3decades/s. Where the frequency is swept

incrementally, the step size shall not exceed 1% of the start and thereafter 1% of the preceding frequency value.

8) Recording the EUT operating situation during compliance testing and decide the EUT immunity criterion.

14.8.Test Results PASS. The EUT was tested and all the test results are listed in next page.

Page 114: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 114 of 146

Injected Currents Susceptibility Test Results Audix Technology (Shenzhen)Co.,Ltd.

Applicant : TPV Electronics (FuJian) Co., Ltd. Test Date : Oct. 17, 2014

EUT : LCD Monitor Temperature : 21.2±0.6

M/N : PM-65 Humidity : 46±3%

Power Supply : AC 230V/50Hz Test Mode : As Section 3.6

Test Engineer : Mark Pressure : 101.5±1kPa

Required Performance : A

Actual Performance : A

Frequency Range (MHz)

Injected Position Voltage Level (e.m.f.) Required Observation

Result

(Pass / Fail)

0.15 ~ 20 AC Mains 3V A A PASS

20 ~ 80 AC Mains 3V A A PASS

0.15 ~ 20 Signal Line 3V A A PASS

20 ~ 80 Signal Line 3V A A PASS

Modulation Signal:1kHz 80% AM

Remark:

Page 115: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 115 of 146

15. MAGNETIC FIELD IMMUNITY TEST 15.1.Test Equipments

Item Equipment Manufacturer Model No. Serial No. Last Cal. Cal. Interval1. Magnetic Field Tester HEAFELY MAG100.1 083858-10 Apr. 28,14 1 Year

15.2.Block Diagram of Test Setup

15.3.Test Standard EN 55024: 2010 (IEC 61000-4-8: 2009) Severity Level 1 at 1A/m

15.4.Severity Levels and Performance Criterion Severity Level Magnetic Field Strength A/m Performance criterion

1. 1

A

2. 3 3. 10 4. 30 5. 100 X. Special

15.5.EUT Configuration on Test The configuration of EUT are listed in Section 3.5.

15.6.Operating Condition of EUT Same as Conducted Emission test that is listed in Section 3.6. except the test set up replaced by Section 15.2.

15.7.Test Procedure The EUT shall be subjected to the test magnetic field by using the induction coil of standard dimensions (1m*1m) and shown in Section 15.2. The induction coil shall then be rotated by 90 °in order to expose the EUT to the test field with different orientations.

15.8.Test Results PASS. The EUT was tested and all the test results are listed in next page.

Magnetic Field Tester

EUT

AC Source

0.8m

10cm wood

Size: 1*1m

Page 116: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 116 of 146

Magnetic Field Immunity Test Results

Audix Technology (Shenzhen) Co., Ltd.

Applicant : TPV Electronics (FuJian) Co., Ltd. Test Date : Oct. 17, 2014

EUT : LCD Monitor Temperature : 21.2±0.6

M/N : PM-65 Humidity : 46±3%

Test Voltage : AC 230V/50Hz Test Mode : As Section 3.6

Test Engineer : Mark Pressure : 101.5±1kPa

Required Performance : A

Actual Performance : A

Test Level Testing Duration Coil Orientation Required Observation Result(Pass/Fail)

1A/m 5 min / coil X A A PASS

1A/m 5 min / coil Y A A PASS

1A/m 5 min / coil Z A A PASS

Remark:

Page 117: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 117 of 146

16. VOLTAGE DIPS AND INTERRUPTIONS IMMUNITY TEST 16.1. Test Equipment

Item Equipment Manufacturer Model No. Serial No. Last Cal. Cal. Interval1. Main Interference Simulator HAEFELY PLINE 1610 083690-05 Apr. 28,14 1 Year

16.2. Block Diagram of Test Setup

16.3. Test Standard EN 55024: 2008 (IEC 61000-4-11: 2004)

16.4. Severity Levels and Performance Criterion

Test Level%UT

Voltage dip and short interruptions

%UT

Duration (in period)

Performance Criterion

0 100 250 C

0 100 0.5 B

70 30 25 C

16.5. EUT Configuration The configuration of EUT are listed in Section 3.5.

16.6. Operating Condition of EUT Same as Conducted Emission test which is listed in Section 3.6. except the test set up replaced by Section 16.2.

16.7. Test Procedure 1) The EUT and test generator were setup as shown on Section 16.2 2) The interruptions is introduced at selected phase angles with specified duration. 3) Record any degradation of performance.

16.8. Test Results PASS. The EUT was tested and all the test results are listed in next page.

EUT Main InterferenceSimulator

AC Mains AC Mains

0.8m

Page 118: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 118 of 146

Voltage Dips And Interruptions Test Results

Audix Technology (Shenzhen) Co., Ltd.

Applicant : TPV Electronics (FuJian) Co., Ltd. Test Date : Oct. 17, 2014

EUT : LCD Monitor Temperature : 21.2±0.6

M/N : PM-65 Humidity : 46±3%

Power Supply : AC 230V/50Hz Test Mode : As Section 3.6

Test Engineer : Mark Pressure : 101.5±1kPa

Required Performance : B & C

Actual Performance : A & C

Test Level

% UT

Voltage Dips & Short

Interruptions % UT

Duration (in period) Phase Angle Required Observation

Result

(Pass / Fail)

0 100 0.5P 0。-360。 B A PASS

70 30 25P 0。-360。 C A PASS

0 100 250P 0。-360。 C C PASS

Note 1: UT is the rated voltage for the equipment. Note 2:The frequency of the test voltage shall be within ±2% of the rated frequency, the output voltage shall be within ±5% of the rated voltage.

Remark: The class “C” means the data transmitting from USB Port will interrupt and need to recover by manual.

Page 119: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 119 of 146

17. INPUT IMMUNITY TEST: S2A

17.1.Test Equipment Item Equipment Manufacturer Model No. Serial No. Last Cal Date Cal. Interval

1. Signal Generator ROHDE&SCHWARZ SML01 101754 Apr. 28,14 1 Year 2. Signal Generator ROHDE&SCHWARZ SML02 100822 Apr. 28,14 1 Year 3. Power Meter ROHDE&SCHWARZ NRVS 100735 Apr. 28,14 1 Year 4. Audio Analyzer ROHDE&SCHWARZ UPL 100687 Apr. 28,14 1 Year 5. RF-System Panel ROHDE&SCHWARZ TS-RSP 100052 N/A N/A 6. Power Amplifier BONN ELEKTRONIK BSA 1515-25 035338-05 N/A N/A 7 Power Amplifier BONN ELEKTRONIK BLWA 0310-1 035349 N/A N/A

8. Slide Bar Controller Inn-Co CO 1000 CO1000/025/6280303/LL N/A N/A

9. TV Test Transmitter ROHDE&SCHWARZ SFM 100092 Apr. 28,14 1 Year 10. TV Transmitter ROHDE&SCHWARZ SFQ 100521 Apr. 28,14 1 Year 11 TV Generator NTSC ROHDE&SCHWARZ SGMF 100019 Apr. 28,14 1 Year 12 TV Generator PAL ROHDE&SCHWARZ SGPF 100073 Apr. 28,14 1 Year 13. TV Generator SECAM ROHDE&SCHWARZ SGSF 100027 Apr. 28,14 1 Year

14 MPEG2 Measurement Generator ROHDE&SCHWARZ DVG 100319 Dec.11, 13 1 Year

15 Test Receiver ROHDE&SCHWARZ ESPI 100423 Apr. 28,14 1 Year 16. Absorbing Clamp ROHDE&SCHWARZ MDS-21 100395 Nov.22, 13 1 Year 17 Lever Meter ROHDE&SCHWARZ URV35 100170 Apr. 28,14 1Year 18. Fixed Coaxial Attenuator N/A 50FH-010-30 No.1 Apr. 28,14 1 Year 19 STRIP LINE TEM Erika Fiedler Messtechnik JACKY N/A Sep.25, 14 0.5Year 20 Band-stop filter Erika Fiedler Messtechnik 8 ohm N/A Sep.25, 14 0.5Year 21 Band-stop filter Erika Fiedler Messtechnik 300 ohm N/A Sep.25, 14 0.5Year 22 Band-stop filter Erika Fiedler Messtechnik ∞ ohm N/A Sep.25, 14 0.5Year 23 RCi network Erika Fiedler Messtechnik 22k ohm N/A Sep.25, 14 0.5Year 24 RCi network Erika Fiedler Messtechnik 1k ohm N/A Sep.25, 14 0.5Year 25 RCo network Erika Fiedler Messtechnik 8 ohm N/A Sep.25, 14 0.5Year 26 RCo network Erika Fiedler Messtechnik 300ohm N/A Sep.25, 14 0.5Year 27 RCo network Erika Fiedler Messtechnik ∞ ohm N/A Sep.25, 14 0.5Year 28 Impedence Erika Fiedler Messtechnik 10k ohm N/A Sep.25, 14 0.5Year 29 Impedence Erika Fiedler Messtechnik 300 ohm N/A Sep.25, 14 0.5Year 30 Impedence Erika Fiedler Messtechnik 8 ohm N/A Sep.25, 14 0.5Year 31 Coupling network Erika Fiedler Messtechnik LC N/A Sep.25, 14 0.5Year 32 Coupling network Erika Fiedler Messtechnik MC N/A Sep.25, 14 0.5Year 33 Coupling network Erika Fiedler Messtechnik AC N/A Sep.25, 14 0.5Year 34 Mains filter Erika Fiedler Messtechnik 230V/50Hz/16A N/A Sep.25, 14 0.5Year

Page 120: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 120 of 146

17.2.Block Diagram of Test Setup

17.3.Measurement Procedure

The EUT was placed 0.1m above a metallic ground plane of dimensions 2 X 1m. The ground connection of the mains filter (MSF) was directly connected to the metal table. All unused input/output connections on the EUT were terminated with the proper resistance. The power cable of the EUT was uniformly bundled together and as short as possible. The power supplied to the test system and to the mains filter (MSF) was attached to an isolation transformer. The 50ohm RF carrier signal was connected from the test system via a 50/75 ohm matching pad (RAM) to the EUT. This cable was used with ferrite rings as possible.

17.4.Test Result The equipment does comply with the requirements: A. For the measurement data, please see the follow pages. The details of test modes: Temperature: 22 Humidity: 52%

Interference Signal Inject to Operating Mode Measuring Type Result

1 YPbPr Audio Out L

AV Mode

Sound Picture Pass

2. Headphones L Sound Picture Pass

3. Headphones R Sound Picture Pass

4. Speaker L Sound Picture Pass

5. Speaker R Sound Picture Pass

6. Mains Sound Picture Pass

EUT

TS9980 75~50Ω

R(∞/8Ω/300Ω)

ANT

Audio Out/SP/HP

AC Mains

Page 121: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 121 of 146

Page 122: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 122 of 146

Page 123: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 123 of 146

Page 124: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 124 of 146

Page 125: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 125 of 146

Page 126: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 126 of 146

Page 127: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 127 of 146

Page 128: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 128 of 146

18. AMBIENT ELECTROMAGNETIC FIELD: S3

18.1.Test Equipments Item Equipment Manufacturer Model No. Serial No. Last Cal. Cal. Interval1. 2#Chamber AUDIX N/A N/A Apr. 28,14 1Year 2. Signal Generator R&S SML02 100822 Apr. 28,14 1 Year 3. Audio Analyzer HP 8903B 3514A16369 Apr. 28,14 1 Year 4. Pattern Generator Philiphs PM5418 LO625020 Apr. 28,14 1 Year 5. Log-periodic Antenna A&R AT1080 16512 NCR NCR 6. RF Cable JINGCHENG KLMR400 No.1/2/3 NCR NCR 7. Amplifier A&R 100W/1000M1 17028 NCR NCR

8. Band-stop filter Erika Fiedler Messtechnik 8 ohm N/A Mar.25, 14 0.5Year

9. Band-stop filter Erika Fiedler Messtechnik 300 ohm N/A Mar.25, 14 0.5Year

10. Band-stop filter Erika Fiedler Messtechnik ∞ ohm N/A Mar.25, 14 0.5Year

Note: NCR: No calibration required(calibrated with system)

18.2.Block Diagram of Test Setup

18.3.Test Standard

EN55020:2007+A11:2011(IEC61000-4-3:2010) Severity Level :3V/m

18.4.Severity Levels and Performance Criterion Test Level Performance Criteria

Frequency 80-150MHz

A Test level 3V/m

Dwell time 3s

Test signal 80% amplitude modulated by 1kHz sinusoidal signal

EUT

TS9980 75~50Ω

Network(∞/8Ω/300Ω)

ANT

Audio Out/SP/HP

Network INTF Signal

AC Mains

Reference GND

Page 129: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 129 of 146

18.5.Operating Condition of EUT Same as conducted test which is listed in Section 3.6. except the test set up replaced by Section 18.2.

18.6.Test Procedure Testing was performed in a Fully anechoic chamber as recommended by IEC 61000-4-3. The EUT was placed on an 80 cm high non-conductive table located in the area of field uniformity. The radiating antenna was placed 3m in front of the EUT and Support system, and dwell time of the radiated interference was controlled by an automated, computer-controlled system. The signal source was stepped through the applicable frequency range at a rate no faster than 1% of the fundamental. The signal was amplitude modulated 80% over the frequency range 80 MHz to 150MHz at a level of 3V/m. The dwell time was set at 3.0s. Field presence was monitored during testing via a field probe placed in close proximity to the EUT. An audio analyzer will be used to monitor s/n from EUT’s speaker/audio out/earphone. Picture quality will be monitored from EUT’s screen through a CCD camera or from EUT’s video out through a test TV set. Vertical polarization of the antenna is setting on test. Right side of EUT must be faced this transmitting antenna All ports were terminated with shielded resistors exclud the ports which related to non-broadcast functions, video ports were terminated by 75 ohm, audio ports were terminated by 10Kohm.. All the scanning conditions are as follows :

18.7.Test Result The equipment does comply with the requirements: A. For the measurement data, please see the follow pages.

Operating Mode Measuring Type Result

1 AV Mode Sound Picture Pass

Page 130: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 130 of 146

Immunity Radiation Immunity

Applicant: TPV Electronics (FuJian) Co., Ltd.

EUT: LCD Monitor

M/N: PM-65

Test Engineer: Sun Test date: Oct. 25, 2014

Ambient Condition: Temp: 22±0.6 Humi: 49±3% Input Voltage : AC 230V/50Hz Operation Mode : AV Mode

Criterin : A

Frequency Range Monitor Type Limit dB(μV/m) Result

80-150MHz Sound 125 Pass

Picture 125 Pass

Page 131: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 131 of 146

19. PHOTOGRAPH

19.1.Photos of Power Line Conducted Emission Test Test Mode: PC Mode

Page 132: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 132 of 146

Test Mode: DVD Mode

Page 133: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 133 of 146

19.2.Conducted Disturbance At Telecommunication Ports Test

Page 134: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 134 of 146

19.3.Photos of Radiated Emission Test (In Anechoic Chamber) Test Mode: PC Mode

Page 135: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 135 of 146

Test Mode: DVD Mode

Page 136: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 136 of 146

(At Anechoic 10m Chamber Test 1GHz –6GHz)

19.4.Photos of Harmonic & Flicker Test Test Mode: PC Mode

Page 137: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 137 of 146

Test Mode: DVD Mode

19.5.Photos of Electrostatic Discharge Immunity Test Test Mode: PC Mode

Page 138: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 138 of 146

Test Mode: DVD Mode

Page 139: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 139 of 146

19.6.Photos of RF Strength Susceptibility Test

Page 140: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 140 of 146

19.7.Photo of RF E.M. Field Keyed Carrier Test

19.8.Photos of Electrical Fast Transient/Burst Immunity Test

Test Mode: PC Mode

Page 141: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 141 of 146

Signal Line

Test Mode: DVD Mode

Page 142: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 142 of 146

19.9.Photo of Surge Test Test Mode: PC Mode

Signal Line

Page 143: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 143 of 146

19.10.Photo of Injected Currents Susceptibility Test Test Mode: PC Mode

Signal Line

Page 144: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 144 of 146

19.11.Photo of Magnetic Field Test

19.12.Photo of Voltage Dips and interruptions test

Page 145: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 145 of 146

19.13.Photos of RF Voltages Input Interference (S2a) Test

Page 146: R AUDIX Technology (Shenzhen) Co., Ltd. - ADI Global...2015/03/24  · A1: 2009+A2: 2009 PASS Meets the Class D requirement Voltage fluctuations & flicker EN 61000-3-3: 2013 PASS Meets

R

AUDIX Technology (Shenzhen) Co., Ltd.

Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E15099 page 146 of 146

19.14.Photo of Ambient Electromagnetic Field: S5 Test