Qualitative Derivation

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President University Erwin Sitompul SDP 6/1 Dr.-Ing. Erwin Sitompul President University Lecture 6 Semiconductor Device Physics http://zitompul.wordpress.com

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Chapter 6. pn Junction Diodes: I - V Characteristics. M ajority carriers. M ajority carriers. Qualitative Derivation. Chapter 6. pn Junction Diodes: I - V Characteristics. Current Flow in a pn Junction Diode. - PowerPoint PPT Presentation

Transcript of Qualitative Derivation

Page 1: Qualitative Derivation

President University Erwin Sitompul SDP 6/1

Dr.-Ing. Erwin SitompulPresident University

Lecture 6Semiconductor Device Physics

http://zitompul.wordpress.com

Page 2: Qualitative Derivation

President University Erwin Sitompul SDP 6/2

Majoritycarriers

Majoritycarriers

Qualitative DerivationChapter 6 pn Junction Diodes: I-V Characteristics

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President University Erwin Sitompul SDP 6/3

Current Flow in a pn Junction DiodeChapter 6 pn Junction Diodes: I-V Characteristics

When a forward bias (VA > 0) is applied, the potential barrier to diffusion across the junction is reduced.

Minority carriers are “injected” into the quasi-neutral regions Δnp > 0, Δpn > 0.

Minority carriers diffuse in the quasi-neutral regions, recombining with majority carriers.

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President University Erwin Sitompul SDP 6/4

Ideal Diode: AssumptionsChapter 6 pn Junction Diodes: I-V Characteristics

Steady-state conditions.Non-degenerately doped step junction.One-dimensional diode.Low-level injection conditions prevail in the quasi-neutral

regions.No processes other than drift, diffusion, and thermal R–G take

place inside the diode.

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President University Erwin Sitompul SDP 6/5

N n N n N( )( ) dn d nx q n qD q n qD

dx dx

J E E

P p P p P( )( ) dp d px q p qD q p qD

dx dx

J E E

Current Flow in a pn Junction DiodeChapter 6 pn Junction Diodes: I-V Characteristics

Current density J = JN(x) + JP(x)

JN(x) and JP(x) may vary with position, but J is constant throughout the diode.

Yet an additional assumption is now made, that thermal recombination-generation is negligible throughout the depletion region JN and JP are therefore determined to be constants independent of position inside the depletion region.

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President University Erwin Sitompul SDP 6/6

n-sidep-side

p0 p A

2i

p0 pA

( )

( )

p x N

nn xN

n0 n D

2i

n0 nD

( )

( )

n x N

np xN

p p A( )p x N n n D( )n x N

Carrier Concentrations at –xp, +xn

Chapter 6 pn Junction Diodes: I-V Characteristics

Consider the equilibrium carrier concentrations at VA = 0:

If low-level injection conditions prevail in the quasi-neutral regions when VA 0, then:

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President University Erwin Sitompul SDP 6/7

i P

N i

( )i

( )i

E F kT

F E kTp n en n e

A2i qV kTnp n e

N ii P

N P

( )( )2i

( )2i

F E kTE F kT

F F kT

np n e e

n e

p nfor x x x

“Law of the Junction”Chapter 6 pn Junction Diodes: I-V Characteristics

The voltage VA applied to a pn junction falls mostly across the depletion region (assuming that low-level injection conditions prevail in the quasi-neutral regions).

Two quasi-Fermi levels is drawn in the depletion region:

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President University Erwin Sitompul SDP 6/8

p p A( )p x N

n-sidep-side

n n D( )n x N

A

2i

p pA

( ) ( 1)qV kTnn x eN

A

2i

n nD

( ) ( 1)qV kTnp x eN

Excess Carrier Concentrations at –xp, xn

Chapter 6 pn Junction Diodes: I-V Characteristics

A

A

2i

p pA

p0

( )

qV kT

qV kT

n en xN

n e

A

A

2i

n nD

n0

( )

qV kT

qV kT

n ep xN

p e

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President University Erwin Sitompul SDP 6/9

A 0.6 0.02586 12 3p p p0( ) 100 1.192 10 cmqV kTn x n e e

12 12 3p p p p p0( ) ( ) 1.192 10 100 1.192 10 cmn x n x n

Example: Carrier InjectionChapter 6 pn Junction Diodes: I-V Characteristics

A pn junction has NA=1018 cm–3 and ND=1016 cm–3. The applied voltage is 0.6 V.

a) What are the minority carrier concentrations at the depletion-region edges?

b) What are the excess minority carrier concentrations?

A 4 0.6 0.02586 14 3n n n0( ) 10 1.192 10 cmqV kTp x p e e

14 4 14 3n n n n n0( ) ( ) 1.192 10 10 1.192 10 cmp x p x p

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President University Erwin Sitompul SDP 6/10

An n n0( ) ( 1)qV kTp x p e

2n n

P 2p

0 , 0d p pD xdx

P Pn 1 2( ) x L x Lp x A e A e

0x 0 x

P P pL D for 0x

Excess Carrier DistributionChapter 6 pn Junction Diodes: I-V Characteristics

From the minority carrier diffusion equation,

We have the following boundary conditions:

n ( ) 0p

For simplicity, we develop a new coordinate system:

Then, the solution is given by:

• LP : hole minority carrier diffusion length

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President University Erwin Sitompul SDP 6/11

An n0( 0) ( 1)qV kTp x p e

A Pn n0( ) ( 1) , 0qV kT x Lp x p e e x

P P'/ '/n 1 2( ) x L x Lp x A e A e

NAp p0( ) ( 1) , 0x LqV kTn x n e e x

A /1 n0 ( 1)qV kTA p e 2 0A

Excess Carrier DistributionChapter 6 pn Junction Diodes: I-V Characteristics

New boundary conditions

n ( ) 0p x

From the x’ → ∞,

From the x’ → 0,

Therefore

Similarly,

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President University Erwin Sitompul SDP 6/12

A Pn PP P n0

P

( )( ) ( 1)qV kT x Ld p x Dx qD q p e edx L

J

NAp NN N p0

N

( )( ) ( 1) x LqV kTd n x Dx qD q n e e

dx L

J

n-side

p-side

p nN P N P0 0x x x x x x

J J J J J

A2 N Pi

N A P D

( 1)qV kTD Dqn eL N L N

J

pn Diode I–V CharacteristicChapter 6 pn Junction Diodes: I-V Characteristics

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A0

2 N P0 i

N A P D

( 1)qV kTI I eD DI Aqn

L N L N

I A J

pn Diode I–V CharacteristicChapter 6 pn Junction Diodes: I-V Characteristics

A2 N Pi

N A P D

( 1)qV kTD DAqn eL N L N

• Shockley Equation,for ideal diode

• I0 can be viewed as the drift current due to minority carriers generated within the diffusion lengths of the depletion region

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I0 can vary by orders of magnitude, depending on the semiconductor material, due to ni

2 factor. In an asymmetrically doped pn junction, the term associated

with the more heavily doped side is negligible. If the p side is much more heavily doped,

If the n side is much more heavily doped,

2 NP0 i

P D N A

DDI AqnL N L N

2 P0 i

P D

DI AqnL N

2 N0 i

N A

DI AqnL N

Diode Saturation Current I0

Chapter 6 pn Junction Diodes: I-V Characteristics

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N P J J J

N p n N p

P p n P n

( ) ( )

( ) ( )

x x x x

x x x x

J J

J J

Diode Carrier CurrentsChapter 6 pn Junction Diodes: I-V Characteristics

• Total current density is constant inside the diode

• Negligible thermal R-G throughout depletion region dJN/dx = dJP/dx = 0

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President University Erwin Sitompul SDP 6/16

n0p

p0p

p0n

n0n

A2i qV kTnp n e

p A

n D

p Nn N

Excess minoritycarriers

Excess minoritycarriersA P

n n0( ) ( 1)qV kT x Lp x p e e NAp p0( ) ( 1) x LqV kTn x n e e

Carrier Concentration: Forward BiasChapter 6 pn Junction Diodes: I-V Characteristics

Law of the Junction

Low level injection conditions

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Carrier Concentration: Reverse BiasChapter 6 pn Junction Diodes: I-V Characteristics

Deficit of minority carriers near the depletion region.Depletion region acts like a “sink”, draining carriers from the

adjacent quasineutral regions

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President University Erwin Sitompul SDP 6/18

Forward-bias current Reverse-bias current

“Breakdown”

“Slope over” No saturation

Smaller slope

Deviations from the Ideal I-V BehaviorChapter 6 pn Junction Diodes: I-V Characteristics

Si pn-junction Diode, 300 K.

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This time no homework.Prepare well for midterm examination.

HomeworkChapter 6 pn Junction Diodes: I-V Characteristics