(QA Reliability Technician, ASEM) REVIEWED BY: KC...
Transcript of (QA Reliability Technician, ASEM) REVIEWED BY: KC...
PREPARED BY: Anbu Malar.S.
(QA Reliability Technician, ASEM)
REVIEWED BY: KC CHEN
(QA Lab Engineer, ASEM)
APPROVED BY: SK LEE
(QA Lab Manager, ASEM)
4TH QUARTER RELIABILITY REPORT FOR 2016
ASEM RELIABILITY LAB
1.0 INTRODUCTION 1
2.0 EXECUTIVE SUMMARY 2 2.1 MOISTURE SOAKING FOR PACKAGE BUILT IN ASEM……………………..…… 2 2.2 TEMPERATURE CYCLE (@1000CYCLES)………………………………………… 3 2.3 PRESSURE COOKER TEST (121°C/100%/15PSI @168HRS………………………… 4 2.4 HIGHLY ACCELERATED STRESS TEST – UHAST (130°C/85%RH/33.3, PSIA) 4
2.5 HIGHLY ACCELERATED STRESS TEST – UHAST (110°C/85%RH/17.7psia,) 5 2.6 HIGHLY ACCELERATED STRESS TEST - (BHAST) - 110°C/85%RH/17.7psia.…5
2.7 HIGH TEMPERATURE STORAGE – HTS(150°C)………………………………… 5
3.0 PACKAGE QUALIFICATIONS AND EVALUATIONS 6 3.1 GOLD WIRE (AU) RELIABILITY MONITORING……………………..…… 6 3.2 COPPER WIRE (CU) RELIABILITY MONITORING ...……………………… 6
4.0 RELIABILITY MONITOR PROGRAM (RMP) 7 4.1 DESCRIPTION & PURPOSE OF TEST……………………………………… 7
4.2 FIT MATHEMATICAL CALCULATION…………………………………… 8 4.3 RELIABILITY MONITOR PROGRAM FLOW CHART……………………….8
5.0 FIT VALUE FOR AU WIRE PRODUCTS 9 5.1 TEST DATA FOR MOISTURE SOAKING 9
5.1.1 MOISTURE SOAKING LEVEL 3 (MSL-3)………………………………9 5.1.2 MOISTURE SOAKING LEVEL 1 (MSL-1)………………………………13
5.2 TEST DATA FOR TEMPERATURE CYCLING (TC) 14 5.2.1 CONDITION B…………………………………………………………….14 5.2.2 CONDITION C…………………………………………………………….18
5.3 TEST DATA FOR PRESSURE COOKER TEST (PCT) 23
5.4 HIGHLY ACCELERATED STRESS TEST (UHAST) 130°C/85%RH 28
5.5 HIGH TEMPERATURE STORAGE (HTS) 33
6.0 FIT VALUE FOR CU WIRE PRODUCTS 38 6.1 TEST DATA FOR MOISTURE SOAKING 38
6.1.1 MOISTURE SOAKING LEVEL 3 (MSL-3)……………………………….38 6.1.2 MOISTURE SOAKING LEVEL 1 (MSL-1)……………………………….41
4TH QUARTER RELIABILITY REPORT FOR 2016
ASEM RELIABILITY LAB
6.2 TEST DATA FOR TEMPERATURE CYCLING (TC) 41 6.2.1 CONDITION C…………………………………………………………………41 6.2.2 CONDITION B…………………………………………………………………44
6.3 TEST DATA FOR PRESSURE COOKER TEST (PCT) 45
6.4 TEST DATA FOR HIGHLY ACCELERATED STRESS TEST (UHAST) 48 CONDITION ( 130°C / 85%RH – CU ) ……………………………………………48
6.5 TEST DATA FOR HIGHLY ACCELERATED STRESS TEST (UHAST) 52
CONDITION ( 110°C / 85%RH – CU ) ……………………………………………52 6.6 TEST DATA FOR HIGHLY ACCELERATED STRESS TEST- BIAS (BHAST) 53
CONDITION ( 110°C / 85%RH – CU ) ……………………………………………53
6.7 HIGH TEMPERATURE STORAGE (HTS) 53
7.0 SCANNING ACOUSTIC MICROSCOPE (SAM) ANALYSIS DATA 57
8.0 SOLDERABILITY TEST DATA 60
9.0 MARK PERMANANCY DATA 63
10.0 ATTACHMENT 65 10.1 ACOUSTIC TOPOGRAPHY ANALYSIS…………………………………………………65
4TH QUARTER RELIABILITY REPORT FOR 2016
ASEM RELIABILITY LAB
1.0 INTRODUCTION This Reliability Report is expected to provide cus tomers with an overview of ASEM’s product quality which we are committed to achieve a high level of confidence & respect from our customers resulting from highly reliable & quality product. Product qualit y an d reliab ility have always b een sig nificant fa ctors at ASEM, and t hey are built i nto th e product right from the initial set-up of the product. These 4th quarter reports summarize the reliability test data from the reliability evaluation, qualification and reliability monitoring prog ram (R MP). The data w ill be i n a series o f continuing upd ates and i s present ed by environ mental stress test which to sh ow enhancements in product quality and reli ability. It is als o aimed to highlight the reliability failure for improvement. The RMP test samples are taken from production lots on a generic basis to represent ASEM standard process flow for that given package type. For qualification or evaluation of pr ocess/material chan ge of package, e ngineering o r originator will prepare the sample and submit to reliability for testing. In general, Q uality is a characteristic which makes a de vice good or ba d, irr espective to meet the manufacturers / customers specifications at time of delivery. The failure are generally measured in DPM or PPM (Defects per million or Parts per million). Reliab ility is defined as a req uired f unction over ti me in response to varied (s pecified) stat e condition. It i s generally measured in Fa ilure in ti me (FIT). One FIT represents ONE FAILURE IN ONE BILL ION DEVICE HOURS. "Pre-conditioning" test that intent to identify those devices that are sensitive to moisture induced stress is performed. This test is closely simulate the environmental conditions of a device exposed to when mounted onto a PCB (customer premises). The defects such as delamination, cracks and “popcorn” caused by expanding moisture inside may not be visible with naked eye. Delamination, cracks and “popcorn” can cause short-term reliability failure, even though the chip initially passes an electrical test. The Scanning Acoustics Micrography (SAM) technique is used to monitor for these types of defects. This non-destructive and " real time" test met hod is also used to mo nitor t hrough ass embly processing t hat can cause die surf ace delamination. All Surface Mount Devices (SMD) are now being subjected t o "Preconditioning" prior to reliability stress test. If a device f ailure w ere encountered, they are s ubjected t o failure analysis f or r oot-cause ide ntification. An improvement action plan will b e then be re quested from respective department(s) as part of our con tinuous improvement. The new competitive environment in the packaging industry and other semiconductor sectors, present ASEM with the challenge of maintaining product quality and reliability while producing products at competitive prices. To achieve the goal, ASEM has focused strictly adherence to quality and reliability standards and practices.
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ASEM RELIABILITY LAB
2.0 EXECUTIVE SUMMARY
2.1 MOISTURE SOAKING FOR PACKAGE BUILT IN ASEM
2.1 ( a ) MOISTURE SENSITIVITY LEVEL 3 ( MSL-3 )
Current packages built in ASEM qualified to MSL "3" of JOINT IPC/JEDEC STD 020 spec which able to withstand preconditioning at 30ºC/60%RH moisture soak for 192hrs.
PRODUCT FAMILY
FIT VALUES ( Au )
FIT VALUES ( Cu )
CUM Q4 '16 CUM Q4 '16
PLCC 684 1811
LQFP 348 1563
PQFP 1570 N.A
PBGA 575 1286
QFP 607 1334
QFN 487 1380
TQFP 1137 1424
LBGA 464 1000
PQFN 9942 N.A
HSBGA 1521 2841
SOPW 3984 N.A
TSSOP 1711 N.A
SBGA N/A 1591
CSBGA 2360 N.A
2.1 ( b ) MOISTURE SENSITIVITY LEVEL 1 ( MSL-1 ) Current packages built in ASEM qualified to MSL "1" of JOINT IPC/JEDEC STD 020 spec which able to withstand preconditioning at 85ºC / 85%RH moisture soak for 168hrs.
PRODUCT FAMILY
FIT VALUES CUM Q4’16 ( Au )
FIT VALUES CUM Q4’16 ( Cu )
QFN 5405 21210
PLCC 15150 N/A
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ASEM RELIABILITY LAB
2.2 TEMPERATURE CYCLE ( TC ) @ 1000cycles
All packages were submitted for preconditioning test except for PDIP as per moisture sensitivity level Table 1 and passed with zero failures by testing through 1000 cycle at condition "B" or condition "C" as requested.
PRODUCT FAMILY
FIT VALUES ( Au ) FIT VALUES ( Cu )
Condition 'B' Condition 'C' Condition 'B' Condition 'C'
CUM Q4'16 CUM Q4'16 CUM Q4'16 CUM Q4'16
PQFP 326 276 N/A N/A
PQFN 323 15272 N/A N/A
LQFP 220 101 2545 1859
PBGA 402 192 1553 1742
CSBGA 736 1870 N/A N/A
SBGA N/A N/A 1222 N/A
LBGA 2257 476 1222 1315
PLCC 797 206 N/A 1388
QFN 176 309 N/A 931
TQFP 2405 382 4581 1178
QFP 747 1782 N/A 5091
SOPW N/A 3054 N/A N/A
HSBGA 1150 667 N/A 2182
TSSOP 390 542 N/A N/A
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ASEM RELIABILITY LAB
2.3 PRESSURE COOKER TEST (PCT) - 121°C/100%/15psig @ 168hrs
PRODUCT FAMILY
FIT VALUES ( Au )
FIT VALUES ( Cu )
CUM Q4'16 CUM Q4'16
PLCC 1844 8671
LQFP 793 12312
PBGA 1460 22725
QFP 1781 25972
QFN 516 5717
TQFP 1741 7836
PQFP 66514 N/A
LBGA 2281 12120
PQFN 60601 N/A
HSBGA 5141 12986
SBGA N/A 7272
CSBGA 9774 N/A
SOPW 20200 N/A
TSSOP 8589 N/A
2.4 HIGHLY ACCELERATED STRESS TEST (UHAST) - 130°C/85%RH/33.3psia.
PRODUCT FAMILY
FIT VALUES ( Au )
FIT VALUES ( Cu )
CUM Q4'16 CUM Q4'16
LQFP 962 7047
PBGA 1068 8941
QFP 2031 17044
QFN 1605 5487
TQFP 2589 5588
PQFP 65715 N/A
LBGA 3733 6284
PQFN 60601 N/A
HSBGA 6532 12986
PLCC 1886 8276
CSBGA 15628 N/A
SBGA N/A 7272
TSSOP 30301 N/A
SOPW 18241 N/A
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ASEM RELIABILITY LAB
2.5 HIGHLY ACCELERATED STRESS TEST (UHAST) - 110°C/85%RH/17.7psia.
PRODUCT FAMILY FIT VALUES
( Cu ) CUM Q4’16
PBGA 6345
LBGA 5785
2.6 HIGHLY ACCELERATED STRESS TEST – BIAS (BHAST) - 110°C/85%RH/17.7psia.
PRODUCT FAMILY FIT VALUES
( Cu ) CUM Q4’16
PBGA 115693
2.7 HIGH TEMPERATURE STORAGE (HTS) - 150°C
PRODUCT FAMILY
FIT VALUES ( Au ) FIT VALUES ( Cu )
CUM Q4 '16 CUM Q4 ‘16
PLCC 409 1393
LQFP 204 1126
PBGA 503 792
QFP 435 4363
QFN 103 921
TQFP 476 5024
PQFN 10181 N/A
PQFP 11454 N/A
LBGA 400 633
SBGA N/A 1478
CSBGA 2386 N/A
HSBGA 1198 2182
SOPW 3065 N/A
TSSOP 1636 N/A
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ASEM RELIABILITY LAB
3.0 PACKAGE BOM INFORMATION
Refer to the BOM information on the selected packages for Q3’ 16 REL MON.
3.1 GOLD WIRE ( Au ) REL MONITORING :
3.2 COPPER WIRE (Cu) REL MONITORING:
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ASEM RELIABILITY LAB
4.0 RELIABILITY MONITOR PROGRAM ( RMP )
4.1 DESCRIPTION & PURPOSE OF TESTS
STRESS TEST PURPOSE
PRE-CONDITIONING To simulate the thermal & mechanical stresses imposed on a device when mounted on PCB. (J-STD-020)
TEMP CYCLE (TC)
To evaluate the package & die interface mechanical resistance to alternate exposures of high & low temperature changes. Evaluate stress integrity of die attach to lead frame & wire bond to die and lead. (JESD22-A104)
AUTOCLAVE / PRESSURE COOKER
UNBIASED HAST
HIGH TEMPERATURE STORAGE(HTS)
To evaluate the stress integrity of mold compound & lead frame interfaces. To evaluate the moisture resistance of package in moisture condensing or moisture saturated steam environment. (JESD22-A102) To evaluate the stress integrity of mold compound & lead frame interfaces. To evaluate the moisture resistance of package in non-condensing moisture or Humid environment. (JESD22-A118) To evaluate the package under storage condition with the effect of time and temperature. (JESD22-A103)
C-SAM
To non-destructively study the package delamination through the measure of acoustic signal. (J-STD-035 & J-STD-020)
SOLDERABILITY To examine the solderability of termination/external leadfinger. (J-STD-002)
MARK PERMANANCY TEST(MPT)
To examine the capabilities of marking process. (MIL-STD-883 METHOD 2015.11)
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ASEM RELIABILITY LAB
4.2 FIT MATHEMATICAL CALCULATION
1. 60% Confidence Level is utilized. 2. Chi Square Distribution Value, which approximates to the number of failures is used. 3. The Failure Rate (FR) is calculated by :
X2 = Chi Square Distribution CL = Confidence Level r = Total number of failures n = Total number of sample tested t = Total device hours applied
4.3 RELIABILITY MONITOR PROGRAM FLOW CHART
PROCESS FLOW
FR = X² (1 - CL², 2r + 2) 2nt
FIT = X² (1 - CL², 2r + 2) x10E + 9 2nt
STRESS TEST
FINAL REPORT
PRE-COND MSL
FINAL ATE(FROM ASSEMBLY)
RMP LOT FOR RELIABILITY TEST
FAILURE ANALYSIS
PASS?NO
YES
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ASEM RELIABILITY LAB
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5.0 FIT CHARTS FOR AU WIRE PRODUCTS. 5.1 TEST DATE FOR MOISTURE SOAKING - (Au ) 5.1.1 MOISTURE SOAK LEVEL 3 (MSL-3) 30°C / 60%RH, 192 HOURS
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10̂ 9 Device Cycles)
Cum Q3'16
8298 0 0 1593216 0.000058% 575.12
Oct'16 0 0 0 1593216 0.000058% 575.12
Nov'16 0 0 0 1593216 0.000058% 575.12
Dec'16 0 0 0 1593216 0.000058% 575.12
8298 0 0 1593216 0.000058% 575.12
PBGA Product Family
Total
FIT Chart
0
100
200
300
400
500
600
700
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
10157 0 0 1950144 0.000047% 469.86
Oct'16 120 0 0 1973184 0.000046% 464.37
Nov'16 0 0 0 1973184 0.000046% 464.37
Dec'16 0 0 0 1973184 0.000046% 464.37
10277 0 0 1973184 0.000046% 464.37Total
LBGA Product Family
FIT Chart
461
462
463
464
465
466
467
468
469
470
471
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
13726 0 0 2635392 0.000035% 347.69
Oct'16 0 0 0 2635392 0.000035% 347.69
Nov'16 0 0 0 2635392 0.000035% 347.69
Dec'16 0 0 0 2635392 0.000035% 347.69
13726 0 0 2635392 0.000035% 347.69Total
LQFP Product Family
FIT Chart
0
50
100
150
200
250
300
350
400
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
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ASEM RELIABILITY LAB
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Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10̂ 9 Device Cycles)
Cum Q3'16
3040 0 0 583680 0.000157% 1569.85
Oct'16 0 0 0 583680 0.000157% 1569.85
Nov'16 0 0 0 583680 0.000157% 1569.85
Dec'16 0 0 0 583680 0.000157% 1569.85
3040 0 0 583680 0.000157% 1569.85
PQFP Product Family
Total
FIT Chart
0
200
400
600
800
1000
1200
1400
1600
1800
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10̂ 9 Device Cycles)
Cum Q3'16
480 0 0 92160 0.000994% 9942.39
Oct'16 0 0 0 92160 0.000994% 9942.39
Nov'16 0 0 0 92160 0.000994% 9942.39
Dec'16 0 0 0 92160 0.000994% 9942.39
480 0 0 92160 0.000994% 9942.39
PQFN Product Family
Total
FIT Chart
0
2000
4000
6000
8000
10000
12000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure Rate (%)
Cum FIT (10^9
Device Cycles)
Cum Q3'16
7857 0 0 1508544 0.000061% 607.40
Oct'16 0 0 0 1508544 0.000061% 607.40
Nov'16 0 0 0 1508544 0.000061% 607.40
Dec'16 0 0 0 1508544 0.000061% 607.40
7857 0 0 1508544 0.000061% 607.40
QFP Product Family
Total
FIT Chart
0
100
200
300
400
500
600
700
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
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Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
6861 0 0 1317312 0.000070% 695.58
Oct'16 120 0 0 1340352 0.000068% 683.62
Nov'16 0 0 0 1340352 0.000068% 683.62
Dec'16 0 0 0 1340352 0.000068% 683.62
6981 0 0 1340352 0.000068% 683.62
PLCC Product Family
Total
FIT Chart
676
678
680
682
684
686
688
690
692
694
696
698
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
4198 0 0 806016 0.000114% 1136.81
Oct'16 0 0 0 806016 0.000114% 1136.81
Nov'16 0 0 0 806016 0.000114% 1136.81
Dec'16 0 0 0 806016 0.000114% 1136.81
4198 0 0 806016 0.000114% 1136.81
TQFP Product Family
Total
FIT Chart
0
200
400
600
800
1000
1200
Cum Q3'16 Oct'16 Nov'16 Dec'16MonthF
IT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
2022 0 0 388224 0.000236% 2360.21
Oct'16 0 0 0 388224 0.000236% 2360.21
Nov'16 0 0 0 388224 0.000236% 2360.21
Dec'16 0 0 0 388224 0.000236% 2360.21
2022 0 0 388224 0.000236% 2360.21
CSBGA Product Family
Total
FIT Chart
0
500
1000
1500
2000
2500
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
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ASEM RELIABILITY LAB
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Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
9688 0 0 1860096 0.000049% 492.60
Oct'16 120 0 0 1883136 0.000049% 486.58
Nov'16 0 0 0 1883136 0.000049% 486.58
Dec'16 0 0 0 1883136 0.000049% 486.58
9808 0 0 1883136 0.000049% 486.58
QFN Product Family
Total
FIT Chart
483
484
485
486
487
488
489
490
491
492
493
494
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
3138 0 0 602496 0.000152% 1520.82
Oct'16 0 0 0 602496 0.000152% 1520.82
Nov'16 0 0 0 602496 0.000152% 1520.82
Dec'16 0 0 0 602496 0.000152% 1520.82
3138 0 0 602496 0.000152% 1520.82
HSBGA Product Family
Total
FIT Chart
0
200
400
600
800
1000
1200
1400
1600
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
2790 0 0 535680 0.000171% 1710.52
Oct'16 0 0 0 535680 0.000171% 1710.52
Nov'16 0 0 0 535680 0.000171% 1710.52
Dec'16 0 0 0 535680 0.000171% 1710.52
2790 0 0 535680 0.000171% 1710.52
TSSOP Product Family
Total
FIT Chart
0
200
400
600
800
1000
1200
1400
1600
1800
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
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Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
1198 0 0 230016 0.000398% 3983.60
Oct'16 0 0 0 230016 0.000398% 3983.60
Nov'16 0 0 0 230016 0.000398% 3983.60
Dec'16 0 0 0 230016 0.000398% 3983.60
1198 0 0 230016 0.000398% 3983.60
SOPW Product Family
Total
FIT Chart
0
500
1000
1500
2000
2500
3000
3500
4000
4500
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
5.1.2 MOISTURE SOAK LEVEL 1 (MSL-1) 85°C/85%RH, 168HOURS.
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
1009 0 0 169512 0.000541% 5405.46
Oct'16 0 0 0 169512 0.000541% 5405.46
Nov'16 0 0 0 169512 0.000541% 5405.46
Dec'16 0 0 0 169512 0.000541% 5405.46
1009 0 0 169512 0.000541% 5405.46Total
QFN Product Family
FIT Chart
0
1000
2000
3000
4000
5000
6000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
360 0 0 60480 0.001515% 15150.31
Oct'16 0 0 0 60480 0.001515% 15150.31
Nov'16 0 0 0 60480 0.001515% 15150.31
Dec'16 0 0 0 60480 0.001515% 15150.31
360 0 0 60480 0.001515% 15150.31Total
PLCC Product Family
FIT Chart
0
2000
4000
6000
8000
10000
12000
14000
16000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
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ASEM RELIABILITY LAB
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5.2 TEST DATA FOR TEMPERATURE CYCLE - (Au)
5.2.1 CONDITION B (-55°C / 125°C )
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Cycles
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
797 0 0 797000 0.000115% 1149.67
Oct'16 0 0 0 797000 0.000115% 1149.67
Nov'16 0 0 0 797000 0.000115% 1149.67
Dec'16 0 0 0 797000 0.000115% 1149.67
797 0 0 797000 0.000115% 1149.67Total
HSBGA Product Family
FIT Chart
0
200
400
600
800
1000
1200
1400
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Cycles
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
2277 0 0 2277000 0.000040% 402.41
Oct'16 0 0 0 2277000 0.000040% 402.41
Nov'16 0 0 0 2277000 0.000040% 402.41
Dec'16 0 0 0 2277000 0.000040% 402.41
2277 0 0 2277000 0.000040% 402.41Total
PBGA Product Family
FIT Chart
0
50
100
150
200
250
300
350
400
450
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
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Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Cycles
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
1245 0 0 1245000 0.000074% 735.98
Oct'16 0 0 0 1245000 0.000074% 735.98
Nov'16 0 0 0 1245000 0.000074% 735.98
Dec'16 0 0 0 1245000 0.000074% 735.98
1245 0 0 1245000 0.000074% 735.98Total
CSBGA Product Family
FIT Chart
0
100
200
300
400
500
600
700
800
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Cycles
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
2351 0 0 2351000 0.000039% 389.75
Oct'16 0 0 0 2351000 0.000039% 389.75
Nov'16 0 0 0 2351000 0.000039% 389.75
Dec'16 0 0 0 2351000 0.000039% 389.75
2351 0 0 2351000 0.000039% 389.75Total
TSSOP Product Family
FIT Chart
0
50
100
150
200
250
300
350
400
450
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Cycles
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
406 0 0 406000 0.000226% 2256.87
Oct'16 0 0 0 406000 0.000226% 2256.87
Nov'16 0 0 0 406000 0.000226% 2256.87
Dec'16 0 0 0 406000 0.000226% 2256.87
406 0 0 406000 0.000226% 2256.87Total
LBGA Product Family
FIT Chart
0
500
1000
1500
2000
2500
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
3RD QUARTER RELIABILITY REPORT FOR 2016
ASEM RELIABILITY LAB
- 16 -
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Cycles
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
5199 0 0 5199000 0.000018% 176.24
Oct'16 0 0 0 5199000 0.000018% 176.24
Nov'16 0 0 0 5199000 0.000018% 176.24
Dec'16 0 0 0 5199000 0.000018% 176.24
5199 0 0 5199000 0.000018% 176.24Total
QFN Product Family
FIT Chart
0
20
40
60
80
100
120
140
160
180
200
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Cycles
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
1150 0 0 1150000 0.000080% 796.77
Oct'16 0 0 0 1150000 0.000080% 796.77
Nov'16 0 0 0 1150000 0.000080% 796.77
Dec'16 0 0 0 1150000 0.000080% 796.77
1150 0 0 1150000 0.000080% 796.77Total
PLCC Product Family
FIT Chart
0
100
200
300
400
500
600
700
800
900
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Cycles
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
1226 0 0 1226000 0.000075% 747.38
Oct'16 0 0 0 1226000 0.000075% 747.38
Nov'16 0 0 0 1226000 0.000075% 747.38
Dec'16 0 0 0 1226000 0.000075% 747.38
1226 0 0 1226000 0.000075% 747.38Total
QFP Product Family
FIT Chart
0
100
200
300
400
500
600
700
800
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
3RD QUARTER RELIABILITY REPORT FOR 2016
ASEM RELIABILITY LAB
- 17 -
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Cycles
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
381 0 0 381000 0.000240% 2404.96
Oct'16 0 0 0 381000 0.000240% 2404.96
Nov'16 0 0 0 381000 0.000240% 2404.96
Dec'16 0 0 0 381000 0.000240% 2404.96
381 0 0 381000 0.000240% 2404.96Total
TQFP Product Family
FIT Chart
0
500
1000
1500
2000
2500
3000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Cycles
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
2810 0 0 2810000 0.000033% 326.08
Oct'16 0 0 0 2810000 0.000033% 326.08
Nov'16 0 0 0 2810000 0.000033% 326.08
Dec'16 0 0 0 2810000 0.000033% 326.08
2810 0 0 2810000 0.000033% 326.08Total
PQFP Product Family
FIT Chart
0
50
100
150
200
250
300
350
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Cycles
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
2840 0 0 2840000 0.000032% 322.64
Oct'16 0 0 0 2840000 0.000032% 322.64
Nov'16 0 0 0 2840000 0.000032% 322.64
Dec'16 0 0 0 2840000 0.000032% 322.64
2840 0 0 2840000 0.000032% 322.64n
PQFN Product Family
FIT Chart
0
50
100
150
200
250
300
350
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
3RD QUARTER RELIABILITY REPORT FOR 2016
ASEM RELIABILITY LAB
- 18 -
5.2.2 CONDITION C ( -65°C / 150°C )
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Cycles
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
1893 0 0 1893000 0.000048% 484.04
Oct'16 30 0 0 1923000 0.000048% 476.49
Nov'16 0 0 0 1923000 0.000048% 476.49
Dec'16 0 0 0 1923000 0.000048% 476.49
1923 0 0 1923000 0.000048% 476.49Total
LBGA Product Family
FIT Chart
472
474
476
478
480
482
484
486
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Cycles
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
4774 0 0 4774000 0.000019% 191.93
Oct'16 0 0 0 4774000 0.000019% 191.93
Nov'16 0 0 0 4774000 0.000019% 191.93
Dec'16 0 0 0 4774000 0.000019% 191.93
4774 0 0 4774000 0.000019% 191.93Total
PBGA Product Family
FIT Chart
0
50
100
150
200
250
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Cycles
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
9039 0 0 9039000 0.000010% 101.37
Oct'16 0 0 0 9039000 0.000010% 101.37
Nov'16 0 0 0 9039000 0.000010% 101.37
Dec'16 0 0 0 9039000 0.000010% 101.37
9039 0 0 9039000 0.000010% 101.37Total
LQFP Product Family
FIT Chart
0
20
40
60
80
100
120
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
3RD QUARTER RELIABILITY REPORT FOR 2016
ASEM RELIABILITY LAB
- 19 -
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Cycles
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
4425 0 0 4425000 0.000021% 207.07
Oct'16 30 0 0 4455000 0.000021% 205.68
Nov'16 0 0 0 4455000 0.000021% 205.68
Dec'16 0 0 0 4455000 0.000021% 205.68
4455 0 0 4455000 0.000021% 205.68Total
PLCC Product Family
FIT Chart
205
205
206
206
207
207
208
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Cycles
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
3320 0 0 3320000 0.000028% 275.99
Oct'16 0 0 0 3320000 0.000028% 275.99
Nov'16 0 0 0 3320000 0.000028% 275.99
Dec'16 0 0 0 3320000 0.000028% 275.99
3320 0 0 3320000 0.000028% 275.99Total
PQFP Product Family
FIT Chart
0
50
100
150
200
250
300
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Cycles
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
60 0 0 60000 0.001527% 15271.51
Oct'16 0 0 0 60000 0.001527% 15271.51
Nov'16 0 0 0 60000 0.001527% 15271.51
Dec'16 0 0 0 60000 0.001527% 15271.51
60 0 0 60000 0.001527% 15271.51Total
PQFN Product Family
FIT Chart
0
2000
4000
6000
8000
10000
12000
14000
16000
18000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
3RD QUARTER RELIABILITY REPORT FOR 2016
ASEM RELIABILITY LAB
- 20 -
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Cycles
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
4103 0 0 4103000 0.000022% 223.32
Oct'16 0 0 0 4103000 0.000022% 223.32
Nov'16 0 0 0 4103000 0.000022% 223.32
Dec'16 0 0 0 4103000 0.000022% 223.32
4103 0 0 4103000 0.000022% 223.32Total
QFP Product Family
FIT Chart
0
50
100
150
200
250
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Cycles
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
2399 0 0 2399000 0.000038% 381.95
Oct'16 0 0 0 2399000 0.000038% 381.95
Nov'16 0 0 0 2399000 0.000038% 381.95
Dec'16 0 0 0 2399000 0.000038% 381.95
2399 0 0 2399000 0.000038% 381.95Total
TQFP Product Family
FIT Chart
0
50
100
150
200
250
300
350
400
450
Cum Q3'16 Oct'16 Nov'16 Dec'16MonthF
IT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Cycles
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
490 0 0 490000 0.000187% 1869.98
Oct'16 0 0 0 490000 0.000187% 1869.98
Nov'16 0 0 0 490000 0.000187% 1869.98
Dec'16 0 0 0 490000 0.000187% 1869.98
490 0 0 490000 0.000187% 1869.98Total
CSBGA Product Family
FIT Chart
0
200
400
600
800
1000
1200
1400
1600
1800
2000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
3RD QUARTER RELIABILITY REPORT FOR 2016
ASEM RELIABILITY LAB
- 21 -
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Cycles
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
2940 0 0 2940000 0.000031% 311.66
Oct'16 30 0 0 2970000 0.000031% 308.52
Nov'16 0 0 0 2970000 0.000031% 308.52
Dec'16 0 0 0 2970000 0.000031% 308.52
2970 0 0 2970000 0.000031% 308.52Total
QFN Product Family
FIT Chart
307
307
308
308
309
309
310
310
311
311
312
312
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Cycles
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
1373 0 0 1373000 0.000067% 667.36
Oct'16 0 0 0 1373000 0.000067% 667.36
Nov'16 0 0 0 1373000 0.000067% 667.36
Dec'16 0 0 0 1373000 0.000067% 667.36
1373 0 0 1373000 0.000067% 667.36Total
HSBGA Product Family
FIT Chart
0
100
200
300
400
500
600
700
800
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Cycles
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
1690 0 0 1690000 0.000054% 542.18
Oct'16 0 0 0 1690000 0.000054% 542.18
Nov'16 0 0 0 1690000 0.000054% 542.18
Dec'16 0 0 0 1690000 0.000054% 542.18
1690 0 0 1690000 0.000054% 542.18Total
TSSOP Product Family
FIT Chart
0
100
200
300
400
500
600
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
3RD QUARTER RELIABILITY REPORT FOR 2016
ASEM RELIABILITY LAB
- 22 -
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Cycles
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
300 0 0 300000 0.000305% 3054.30
Oct'16 0 0 0 300000 0.000305% 3054.30
Nov'16 0 0 0 300000 0.000305% 3054.30
Dec'16 0 0 0 300000 0.000305% 3054.30
300 0 0 300000 0.000305% 3054.30Total
SOPW Product Family
FIT Chart
0
500
1000
1500
2000
2500
3000
3500
300 0 0 0
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
3RD QUARTER RELIABILITY REPORT FOR 2016
ASEM RELIABILITY LAB
- 23 -
5.2 TEST DATA FOR PRESSURE COOKER TEST (PCT) - 121°C / 100% / 15PSIG, 168HRS - ( Au )
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
82 0 0 13776 0.006651% 66513.56
Oct'16 0 0 0 13776 0.006651% 66513.56
Nov'16 0 0 0 13776 0.006651% 66513.56
Dec'16 0 0 0 13776 0.006651% 66513.56
82 0 0 13776 0.006651% 66513.56Total
PQFP Product Family
FIT Chart
0
10000
20000
30000
40000
50000
60000
70000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
90 0 0 15120 0.006060% 60601.24
Oct'16 0 0 0 15120 0.006060% 60601.24
Nov'16 0 0 0 15120 0.006060% 60601.24
Dec'16 0 0 0 15120 0.006060% 60601.24
90 0 0 15120 0.006060% 60601.24Total
PQFN Product Family
FIT Chart
0
10000
20000
30000
40000
50000
60000
70000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
6847 0 0 1150296 0.000080% 796.57
Oct'16 30 0 0 1155336 0.000079% 793.09
Nov'16 0 0 0 1155336 0.000079% 793.09
Dec'16 0 0 0 1155336 0.000079% 793.09
6877 0 0 1155336 0.000079% 793.09Total
LQFP Product Family
FIT Chart
791
792
793
794
795
796
797
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
3RD QUARTER RELIABILITY REPORT FOR 2016
ASEM RELIABILITY LAB
- 24 -
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
3736 0 0 627648 0.000146% 1459.88
Oct'16 0 0 0 627648 0.000146% 1459.88
Nov'16 0 0 0 627648 0.000146% 1459.88
Dec'16 0 0 0 627648 0.000146% 1459.88
3736 0 0 627648 0.000146% 1459.88Total
PBGA Product Family
FIT Chart
0
200
400
600
800
1000
1200
1400
1600
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
10530 0 0 1769040 0.000052% 517.96
Oct'16 30 0 0 1774080 0.000052% 516.49
Nov'16 0 0 0 1774080 0.000052% 516.49
Dec'16 0 0 0 1774080 0.000052% 516.49
10560 0 0 1774080 0.000052% 516.49Total
QFN Product Family
FIT Chart
516
516
517
517
518
518
519
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
2927 0 0 491736 0.000186% 1863.38
Oct'16 30 0 0 496776 0.000184% 1844.47
Nov'16 0 0 0 496776 0.000184% 1844.47
Dec'16 0 0 0 496776 0.000184% 1844.47
2957 0 0 496776 0.000184% 1844.47Total
PLCC Product Family
FIT Chart
1835
1840
1845
1850
1855
1860
1865
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
3RD QUARTER RELIABILITY REPORT FOR 2016
ASEM RELIABILITY LAB
- 25 -
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
3133 0 0 526344 0.000174% 1740.86
Oct'16 0 0 0 526344 0.000174% 1740.86
Nov'16 0 0 0 526344 0.000174% 1740.86
Dec'16 0 0 0 526344 0.000174% 1740.86
3133 0 0 526344 0.000174% 1740.86Total
TQFP Product Family
FIT Chart
0
200
400
600
800
1000
1200
1400
1600
1800
2000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
3060 0 0 514080 0.000178% 1782.39
Oct'16 0 0 0 514080 0.000178% 1782.39
Nov'16 0 0 0 514080 0.000178% 1782.39
Dec'16 0 0 0 514080 0.000178% 1782.39
3060 0 0 514080 0.000178% 1782.39Total
QFP Product Family
FIT Chart
0
200
400
600
800
1000
1200
1400
1600
1800
2000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
2361 0 0 396648 0.000231% 2310.09
Oct'16 30 0 0 401688 0.000228% 2281.10
Nov'16 0 0 0 401688 0.000228% 2281.10
Dec'16 0 0 0 401688 0.000228% 2281.10
2391 0 0 401688 0.000228% 2281.10Total
LBGA Product Family
FIT Chart
2265
2270
2275
2280
2285
2290
2295
2300
2305
2310
2315
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
3RD QUARTER RELIABILITY REPORT FOR 2016
ASEM RELIABILITY LAB
- 26 -
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
1061 0 0 178248 0.000514% 5140.54
Oct'16 0 0 0 178248 0.000514% 5140.54
Nov'16 0 0 0 178248 0.000514% 5140.54
Dec'16 0 0 0 178248 0.000514% 5140.54
1061 0 0 178248 0.000514% 5140.54Total
HSBGA Product Family
FIT Chart
0
1000
2000
3000
4000
5000
6000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
635 0 0 106680 0.000859% 8589.15
Oct'16 0 0 0 106680 0.000859% 8589.15
Nov'16 0 0 0 106680 0.000859% 8589.15
Dec'16 0 0 0 106680 0.000859% 8589.15
635 0 0 106680 0.000859% 8589.15Total
TSSOP Product Family
FIT Chart
0
1000
2000
3000
4000
5000
6000
7000
8000
9000
10000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
558 0 0 93744 0.000977% 9774.39
Oct'16 0 0 0 93744 0.000977% 9774.39
Nov'16 0 0 0 93744 0.000977% 9774.39
Dec'16 0 0 0 93744 0.000977% 9774.39
558 0 0 93744 0.000977% 9774.39Total
CSBGA Product Family
FIT Chart
0
2000
4000
6000
8000
10000
12000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
3RD QUARTER RELIABILITY REPORT FOR 2016
ASEM RELIABILITY LAB
- 27 -
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
270 0 0 45360 0.002020% 20200.41
Oct'16 0 0 0 45360 0.002020% 20200.41
Nov'16 0 0 0 45360 0.002020% 20200.41
Dec'16 0 0 0 45360 0.002020% 20200.41
270 0 0 45360 0.002020% 20200.41Total
SOPW Product Family
FIT Chart
0
5000
10000
15000
20000
25000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
3RD QUARTER RELIABILITY REPORT FOR 2016
ASEM RELIABILITY LAB
- 28 -
5.4 TEST DATA FOR HIGHLY ACCELERATED STRESS TEST (UHAST) 130°C / 85%RH / 33.3 psia, 168hrs - ( Au ).
Package Type
DateSample
Size# of
FailuresCum # of Failures
Cum Device Hours
Cum Failure Rate (%)
Cum FIT (10^9 Device hrs)
Cum Q3'16
5670 0 0 952560 0.000096% 961.92
Oct'16 0 0 0 952560 0.000096% 961.92
Nov'16 0 0 0 952560 0.000096% 961.92
Dec'16 0 0 0 952560 0.000096% 961.92
5670 0 0 952560 0.000096% 961.92Total
LQFP Product Family
FIT Chart
0
200
400
600
800
1000
1200
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device hrs)
Cum Q3'16
5107 0 0 857976 0.000107% 1067.97
Oct'16 0 0 0 857976 0.000107% 1067.97
Nov'16 0 0 0 857976 0.000107% 1067.97
Dec'16 0 0 0 857976 0.000107% 1067.97
5107 0 0 857976 0.000107% 1067.97Total
PBGA Product Family
FIT Chart
0
200
400
600
800
1000
1200
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure Rate (%)
Cum FIT (10^9 Device hrs)
Cum Q3'16
1431 0 0 240408 0.000381% 3811.40
Oct'16 30 0 0 245448 0.000373% 3733.14
Nov'16 0 0 0 245448 0.000373% 3733.14
Dec'16 0 0 0 245448 0.000373% 3733.14
1461 0 0 245448 0.000373% 3733.14Total
LBGA Product Family
FIT Chart
3680
3700
3720
3740
3760
3780
3800
3820
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
3RD QUARTER RELIABILITY REPORT FOR 2016
ASEM RELIABILITY LAB
- 29 -
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device hrs)
Cum Q3'16
835 0 0 140280 0.000653% 6531.87
Oct'16 0 0 0 140280 0.000653% 6531.87
Nov'16 0 0 0 140280 0.000653% 6531.87
Dec'16 0 0 0 140280 0.000653% 6531.87
835 0 0 140280 0.000653% 6531.87Total
HSBGA Product Family
FIT Chart
0
1000
2000
3000
4000
5000
6000
7000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure Rate (%)
Cum FIT (10^9 Device hrs)
Cum Q3'16
3368 0 0 565824 0.000162% 1619.39
Oct'16 30 0 0 570864 0.000161% 1605.09
Nov'16 0 0 0 570864 0.000161% 1605.09
Dec'16 0 0 0 570864 0.000161% 1605.09
3398 0 0 570864 0.000161% 1605.09Total
QFN Product Family
FIT Chart
1595
1600
1605
1610
1615
1620
1625
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device hrs)
Cum Q3'16
2107 0 0 353976 0.000259% 2588.57
Oct'16 0 0 0 353976 0.000259% 2588.57
Nov'16 0 0 0 353976 0.000259% 2588.57
Dec'16 0 0 0 353976 0.000259% 2588.57
2107 0 0 353976 0.000259% 2588.57Total
TQFP Product Family
FIT Chart
0
500
1000
1500
2000
2500
3000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
3RD QUARTER RELIABILITY REPORT FOR 2016
ASEM RELIABILITY LAB
- 30 -
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device hrs)
Cum Q3'16
2686 0 0 451248 0.000203% 2030.57
Oct'16 0 0 0 451248 0.000203% 2030.57
Nov'16 0 0 0 451248 0.000203% 2030.57
Dec'16 0 0 0 451248 0.000203% 2030.57
2686 0 0 451248 0.000203% 2030.57Total
QFP Product Family
FIT Chart
0
500
1000
1500
2000
2500
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
180 0 0 30240 0.003030% 30300.62
Oct'16 0 0 0 30240 0.003030% 30300.62
Nov'16 0 0 0 30240 0.003030% 30300.62
Dec'16 0 0 0 30240 0.003030% 30300.62
180 0 0 30240 0.003030% 30300.62Total
TSSOP Product Family
FIT Chart
0
5000
10000
15000
20000
25000
30000
35000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
83 0 0 13944 0.006571% 65712.19
Oct'16 0 0 0 13944 0.006571% 65712.19
Nov'16 0 0 0 13944 0.006571% 65712.19
Dec'16 0 0 0 13944 0.006571% 65712.19
83 0 0 13944 0.006571% 65712.19Total
PQFP Product Family
FIT Chart
0
10000
20000
30000
40000
50000
60000
70000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
3RD QUARTER RELIABILITY REPORT FOR 2016
ASEM RELIABILITY LAB
- 31 -
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
90 0 0 15120 0.006060% 60601.24
Oct'16 0 0 0 15120 0.006060% 60601.24
Nov'16 0 0 0 15120 0.006060% 60601.24
Dec'16 0 0 0 15120 0.006060% 60601.24
90 0 0 15120 0.006060% 60601.24Total
PQFN Product Family
FIT Chart
0
10000
20000
30000
40000
50000
60000
70000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
2862 0 0 480816 0.000191% 1905.70
Oct'16 30 0 0 485856 0.000189% 1885.93
Nov'16 0 0 0 485856 0.000189% 1885.93
Dec'16 0 0 0 485856 0.000189% 1885.93
2892 0 0 485856 0.000189% 1885.93Total
PLCC Product Family
FIT Chart
1875
1880
1885
1890
1895
1900
1905
1910
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
349 0 0 58632 0.001563% 15627.83
Oct'16 0 0 0 58632 0.001563% 15627.83
Nov'16 0 0 0 58632 0.001563% 15627.83
Dec'16 0 0 0 58632 0.001563% 15627.83
349 0 0 58632 0.001563% 15627.83Total
CSBGA Product Family
FIT Chart
0
2000
4000
6000
8000
10000
12000
14000
16000
18000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
3RD QUARTER RELIABILITY REPORT FOR 2016
ASEM RELIABILITY LAB
- 32 -
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
299 0 0 50232 0.001824% 18241.18
Oct'16 0 0 0 50232 0.001824% 18241.18
Nov'16 0 0 0 50232 0.001824% 18241.18
Dec'16 0 0 0 50232 0.001824% 18241.18
299 0 0 50232 0.001824% 18241.18Total
SOPW Product Family
FIT Chart
0
2000
4000
6000
8000
10000
12000
14000
16000
18000
20000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
3RD QUARTER RELIABILITY REPORT FOR 2016
ASEM RELIABILITY LAB
- 33 -
5.5 TEST DATA FOR HIGH TEMPERATURE STORAGE (HTS) - 150°C – ( Au )
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
1925 0 0 1925000 0.000048% 476.00
Oct'16 0 0 0 1925000 0.000048% 476.00
Nov'16 0 0 0 1925000 0.000048% 476.00
Dec'16 0 0 0 1925000 0.000048% 476.00
1925 0 0 1925000 0.000048% 476.00Total
TQFP Product Family
FIT Chart
0
50
100
150
200
250
300
350
400
450
500
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
4498 0 0 4498000 0.000020% 203.71
Oct'16 0 0 0 4498000 0.000020% 203.71
Nov'16 0 0 0 4498000 0.000020% 203.71
Dec'16 0 0 0 4498000 0.000020% 203.71
4498 0 0 4498000 0.000020% 203.71Total
LQFP Product Family
FIT Chart
0
50
100
150
200
250
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
384 0 0 384000 0.000239% 2386.17
Oct'16 0 0 0 384000 0.000239% 2386.17
Nov'16 0 0 0 384000 0.000239% 2386.17
Dec'16 0 0 0 384000 0.000239% 2386.17
384 0 0 384000 0.000239% 2386.17Total
CSBGA Product Family
FIT Chart
0
500
1000
1500
2000
2500
3000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
3RD QUARTER RELIABILITY REPORT FOR 2016
ASEM RELIABILITY LAB
- 34 -
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
2108 0 0 2108000 0.000043% 434.67
Oct'16 0 0 0 2108000 0.000043% 434.67
Nov'16 0 0 0 2108000 0.000043% 434.67
Dec'16 0 0 0 2108000 0.000043% 434.67
2108 0 0 2108000 0.000043% 434.67Total
QFP Product Family
FIT Chart
0
50
100
150
200
250
300
350
400
450
500
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
2212 0 0 2212000 0.000041% 414.24
Oct'16 30 0 0 2242000 0.000041% 408.69
Nov'16 0 0 0 2242000 0.000041% 408.69
Dec'16 0 0 0 2242000 0.000041% 408.69
2242 0 0 2242000 0.000041% 408.69Total
PLCC Product Family
FIT Chart
405
406
407
408
409
410
411
412
413
414
415
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
8898 0 0 8898000 0.000010% 102.98
Oct'16 30 0 0 8928000 0.000010% 102.63
Nov'16 0 0 0 8928000 0.000010% 102.63
Dec'16 0 0 0 8928000 0.000010% 102.63
8928 0 0 8928000 0.000010% 102.63Total
QFN Product Family
FIT Chart
102
103
103
103
103
103
103
103
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
3RD QUARTER RELIABILITY REPORT FOR 2016
ASEM RELIABILITY LAB
- 35 -
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
1852 0 0 1852000 0.000049% 494.76
Oct'16 0 0 0 1852000 0.000049% 494.76
Nov'16 0 0 0 1852000 0.000049% 494.76
Dec'16 0 0 0 1852000 0.000049% 494.76
1852 0 0 1852000 0.000049% 494.76Total
PBGA Product Family
FIT Chart
0
100
200
300
400
500
600
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
765 0 0 765000 0.000120% 1197.77
Oct'16 0 0 0 765000 0.000120% 1197.77
Nov'16 0 0 0 765000 0.000120% 1197.77
Dec'16 0 0 0 765000 0.000120% 1197.77
765 0 0 765000 0.000120% 1197.77Total
HSBGA Product Family
FIT Chart
0
200
400
600
800
1000
1200
1400
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
2260 0 0 2260000 0.000041% 405.44
Oct'16 30 0 0 2290000 0.000040% 400.13
Nov'16 0 0 0 2290000 0.000040% 400.13
Dec'16 0 0 0 2290000 0.000040% 400.13
2290 0 0 2290000 0.000040% 400.13Total
LBGA Product Family
FIT Chart
397
398
399
400
401
402
403
404
405
406
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
3RD QUARTER RELIABILITY REPORT FOR 2016
ASEM RELIABILITY LAB
- 36 -
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
80 0 0 80000 0.001145% 11453.63
Oct'16 0 0 0 80000 0.001145% 11453.63
Nov'16 0 0 0 80000 0.001145% 11453.63
Dec'16 0 0 0 80000 0.001145% 11453.63
80 0 0 80000 0.001145% 11453.63Total
PQFP Product Family
FIT Chart
0
2000
4000
6000
8000
10000
12000
14000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
560 0 0 560000 0.000164% 1636.23
Oct'16 0 0 0 560000 0.000164% 1636.23
Nov'16 0 0 0 560000 0.000164% 1636.23
Dec'16 0 0 0 560000 0.000164% 1636.23
560 0 0 560000 0.000164% 1636.23Total
TSSOP Product Family
FIT Chart
0
200
400
600
800
1000
1200
1400
1600
1800
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
299 0 0 299000 0.000306% 3064.52
Oct'16 0 0 0 299000 0.000306% 3064.52
Nov'16 0 0 0 299000 0.000306% 3064.52
Dec'16 0 0 0 299000 0.000306% 3064.52
299 0 0 299000 0.000306% 3064.52Total
SOPW Product Family
FIT Chart
0
500
1000
1500
2000
2500
3000
3500
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
3RD QUARTER RELIABILITY REPORT FOR 2016
ASEM RELIABILITY LAB
- 37 -
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
90 0 0 90000 0.001018% 10181.01
Oct'16 0 0 0 90000 0.001018% 10181.01
Nov'16 0 0 0 90000 0.001018% 10181.01
Dec'16 0 0 0 90000 0.001018% 10181.01
90 0 0 90000 0.001018% 10181.01Total
PQFN Product Family
FIT Chart
0
2000
4000
6000
8000
10000
12000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
4th QUARTER RELIABILITY REPORT FOR 2016
- 38 -
6.0 FITS CHARTS FOR CU WIRE PRODUCTS.
6.1 TEST DATA FOR MOISTURE SOAKING - ( Cu ) 6.1.1 MOISTURE SOAK LEVEL 3 (MSL-3) 30°C / 60%RH, 192 HOURS
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
2934 0 0 563328 0.000163% 1626.57
Oct'16 120 0 0 586368 0.000156% 1562.65
Nov'16 0 0 0 586368 0.000156% 1562.65
Dec'16 0 0 0 586368 0.000156% 1562.65
3054 0 0 586368 0.000156% 1562.65Total
LQFP Product Family
FIT Chart
1520
1540
1560
1580
1600
1620
1640
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
2635 0 0 505920 0.000181% 1811.14
Oct'16 0 0 0 505920 0.000181% 1811.14
Nov'16 0 0 0 505920 0.000181% 1811.14
Dec'16 0 0 0 505920 0.000181% 1811.14
2635 0 0 505920 0.000181% 1811.14
PLCC Product Family
Total
FIT Chart
0
200
400
600
800
1000
1200
1400
1600
1800
2000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
4th QUARTER RELIABILITY REPORT FOR 2016
- 39 -
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
3231 4 4 620352 0.000844% 8441.37
Oct'16 120 0 4 643392 0.000814% 8139.08
Nov'16 0 0 4 643392 0.000814% 8139.08
Dec'16 0 0 4 643392 0.000814% 8139.08
3351 4 4 643392 0.000814% 8139.08
TQFP Product Family
Total
FIT Chart
7950
8000
8050
8100
8150
8200
8250
8300
8350
8400
8450
8500
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
3457 0 0 663744 0.000138% 1380.49
Oct'16 120 0 0 686784 0.000133% 1334.18
Nov'16 0 0 0 686784 0.000133% 1334.18
Dec'16 0 0 0 686784 0.000133% 1334.18
3577 0 0 686784 0.000133% 1334.18
QFN Product Family
Total
FIT Chart
1310
1320
1330
1340
1350
1360
1370
1380
1390
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
3000 0 0 576000 0.000159% 1590.78
Oct'16 0 0 0 576000 0.000159% 1590.78
Nov'16 0 0 0 576000 0.000159% 1590.78
Dec'16 0 0 0 576000 0.000159% 1590.78
3000 0 0 576000 0.000159% 1590.78
SBGA Product Family
Total
FIT Chart
0
200
400
600
800
1000
1200
1400
1600
1800
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
4th QUARTER RELIABILITY REPORT FOR 2016
- 40 -
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
4654 0 0 893568 0.000103% 1025.43
Oct'16 120 0 0 916608 0.000100% 999.65
Nov'16 0 0 0 916608 0.000100% 999.65
Dec'16 0 0 0 916608 0.000100% 999.65
4774 0 0 916608 0.000100% 999.65
LBGA Product Family
Total
FIT Chart
985
990
995
1000
1005
1010
1015
1020
1025
1030
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
920 0 0 176640 0.000519% 5187.33
Oct'16 0 0 0 176640 0.000519% 5187.33
Nov'16 0 0 0 176640 0.000519% 5187.33
Dec'16 0 0 0 176640 0.000519% 5187.33
920 0 0 176640 0.000519% 5187.33
QFP Product Family
Total
FIT Chart
0
1000
2000
3000
4000
5000
6000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
3590 0 0 689280 0.000133% 1329.34
Oct'16 120 0 0 712320 0.000129% 1286.35
Nov'16 0 0 0 712320 0.000129% 1286.35
Dec'16 0 0 0 712320 0.000129% 1286.35
3710 0 0 712320 0.000129% 1286.35
PBGA Product Family
Total
FIT Chart
1260
1270
1280
1290
1300
1310
1320
1330
1340
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
4th QUARTER RELIABILITY REPORT FOR 2016
- 41 -
6.1.2 MOISTURE SOAK LEVEL 1 (MSL-1) 85°C / 85%RH , 168 HOURS (Cu)
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
240 0 0 40320 0.002273% 22725.46
Oct'16 0 0 0 40320 0.002273% 22725.46
Nov'16 0 0 0 40320 0.002273% 22725.46
Dec'16 0 0 0 40320 0.002273% 22725.46
240 0 0 40320 0.002273% 22725.46Total
QFN Product Family
FIT Chart
0
5000
10000
15000
20000
25000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
6.2 TEST DATA FOR TEMPERATURE CYCLE - (Cu ) 6.2.1 CONDITION C (-65°C / 150°C)
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Cycles
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
453 0 0 453000 0.000202% 2022.72
Oct'16 40 0 0 493000 0.000186% 1858.60
Nov'16 0 0 0 493000 0.000186% 1858.60
Dec'16 0 0 0 493000 0.000186% 1858.60
493 0 0 493000 0.000186% 1858.60Total
LQFP Product Family
FIT Chart
1750
1800
1850
1900
1950
2000
2050
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
4th QUARTER RELIABILITY REPORT FOR 2016
- 42 -
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Cycles
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
660 0 0 660000 0.000139% 1388.32
Oct'16 0 0 0 660000 0.000139% 1388.32
Nov'16 0 0 0 660000 0.000139% 1388.32
Dec'16 0 0 0 660000 0.000139% 1388.32
660 0 0 660000 0.000139% 1388.32Total
PLCC Product Family
FIT Chart
0
200
400
600
800
1000
1200
1400
1600
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Cycles
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
748 0 0 748000 0.000122% 1224.99
Oct'16 30 0 0 778000 0.000118% 1177.75
Nov'16 0 0 0 778000 0.000118% 1177.75
Dec'16 0 0 0 778000 0.000118% 1177.75
778 0 0 778000 0.000118% 1177.75Total
TQFP Product Family
FIT Chart
1150
1160
1170
1180
1190
1200
1210
1220
1230
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Cycles
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
954 0 0 954000 0.000096% 960.47
Oct'16 30 0 0 984000 0.000093% 931.19
Nov'16 0 0 0 984000 0.000093% 931.19
Dec'16 0 0 0 984000 0.000093% 931.19
984 0 0 984000 0.000093% 931.19Total
QFN Product Family
FIT Chart
915
920
925
930
935
940
945
950
955
960
965
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
4th QUARTER RELIABILITY REPORT FOR 2016
- 43 -
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Cycles
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
667 0 0 667000 0.000137% 1373.75
Oct'16 0 0 0 667000 0.000137% 1373.75
Nov'16 0 0 0 667000 0.000137% 1373.75
Dec'16 0 0 0 667000 0.000137% 1373.75
667 0 0 667000 0.000137% 1373.75Total
LBGA Product Family
FIT Chart
0
200
400
600
800
1000
1200
1400
1600
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Cycles
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
180 0 0 180000 0.000509% 5090.50
Oct'16 0 0 0 180000 0.000509% 5090.50
Nov'16 0 0 0 180000 0.000509% 5090.50
Dec'16 0 0 0 180000 0.000509% 5090.50
180 0 0 180000 0.000509% 5090.50Total
QFP Product Family
FIT Chart
0
1000
2000
3000
4000
5000
6000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Cycles
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
526 0 0 526000 0.000174% 1742.00
Oct'16 0 0 0 526000 0.000174% 1742.00
Nov'16 0 0 0 526000 0.000174% 1742.00
Dec'16 0 0 0 526000 0.000174% 1742.00
526 0 0 526000 0.000174% 1742.00Total
PBGA Product Family
FIT Chart
0
200
400
600
800
1000
1200
1400
1600
1800
2000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
4th QUARTER RELIABILITY REPORT FOR 2016
- 44 -
6.2.2 CONDITION B ( -55°C / 125°C ) Package
TypeDate
Sample Size
# of Failures
Cum # of
Failures
Cum Device Cycles
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
750 0 0 750000 0.000122% 1221.72
Oct'16 0 0 0 750000 0.000122% 1221.72
Nov'16 0 0 0 750000 0.000122% 1221.72
Dec'16 0 0 0 750000 0.000122% 1221.72
750 0 0 750000 0.000122% 1221.72Total
SBGA Product Family
FIT Chart
0
200
400
600
800
1000
1200
1400
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package
TypeDate
Sample Size
# of Failures
Cum # of
Failures
Cum Device Cycles
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
360 0 0 360000 0.000255% 2545.25
Oct'16 0 0 0 360000 0.000255% 2545.25
Nov'16 0 0 0 360000 0.000255% 2545.25
Dec'16 0 0 0 360000 0.000255% 2545.25
360 0 0 360000 0.000255% 2545.25Total
LQFP Product Family
FIT Chart
0
500
1000
1500
2000
2500
3000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package
TypeDate
Sample Size
# of Failures
Cum # of
Failures
Cum Device Cycles
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
550 0 0 550000 0.000167% 1665.98
Oct'16 40 0 0 590000 0.000155% 1553.04
Nov'16 0 0 0 590000 0.000155% 1553.04
Dec'16 0 0 0 590000 0.000155% 1553.04
590 0 0 590000 0.000155% 1553.04Total
PBGA Product Family
FIT Chart
1480
1500
1520
1540
1560
1580
1600
1620
1640
1660
1680
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
4th QUARTER RELIABILITY REPORT FOR 2016
- 45 -
Package
TypeDate
Sample Size
# of Failures
Cum # of
Failures
Cum Device Cycles
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
750 0 0 750000 0.000122% 1221.72
Oct'16 40 0 0 790000 0.000116% 1159.86
Nov'16 0 0 0 790000 0.000116% 1159.86
Dec'16 0 0 0 790000 0.000116% 1159.86
790 0 0 790000 0.000116% 1159.86Total
LBGA Product Family
FIT Chart
1120
1130
1140
1150
1160
1170
1180
1190
1200
1210
1220
1230
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Cycles
Cum Failure
Rate (%)
Cum FIT (10^9 Device Cycles)
Cum Q3'16
200 0 0 200000 0.000458% 4581.45
Oct'16 0 0 0 200000 0.000458% 4581.45
Nov'16 0 0 0 200000 0.000458% 4581.45
Dec'16 0 0 0 200000 0.000458% 4581.45
200 0 0 200000 0.000458% 4581.45Total
TQFP Product Family
FIT Chart
0
500
1000
1500
2000
2500
3000
3500
4000
4500
5000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
6.3 TEST DATA FOR PRESSURE COOKER TEST (PCT) - 121°C / 100% / 15PSIG, 168HRS – ( Cu )
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
443 0 0 74424 0.001231% 12311.76
Oct'16 0 0 0 74424 0.001231% 12311.76
Nov'16 0 0 0 74424 0.001231% 12311.76
Dec'16 0 0 0 74424 0.001231% 12311.76
443 0 0 74424 0.001231% 12311.76Total
LQFP Product Family
FIT Chart
0
2000
4000
6000
8000
10000
12000
14000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
4th QUARTER RELIABILITY REPORT FOR 2016
- 46 -
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
924 0 0 155232 0.000590% 5902.72
Oct'16 30 0 0 160272 0.000572% 5717.10
Nov'16 0 0 0 160272 0.000572% 5717.10
Dec'16 0 0 0 160272 0.000572% 5717.10
954 0 0 160272 0.000572% 5717.10Total
QFN Product Family
FIT Chart
5600
5650
5700
5750
5800
5850
5900
5950
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
659 0 0 110712 0.000828% 8276.35
Oct'16 0 0 0 110712 0.000828% 8276.35
Nov'16 0 0 0 110712 0.000828% 8276.35
Dec'16 0 0 0 110712 0.000828% 8276.35
659 0 0 110712 0.000828% 8276.35Total
PLCC Product Family
FIT Chart
0
1000
2000
3000
4000
5000
6000
7000
8000
9000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
666 1 1 111888 0.001807% 18074.44
Oct'16 30 0 1 116928 0.001730% 17295.37
Nov'16 0 0 1 116928 0.001730% 17295.37
Dec'16 0 0 1 116928 0.001730% 17295.37
696 1 1 116928 0.001730% 17295.37Total
TQFP Product Family
FIT Chart
16800
17000
17200
17400
17600
17800
18000
18200
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
4th QUARTER RELIABILITY REPORT FOR 2016
- 47 -
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
750 0 0 126000 0.000727% 7272.15
Oct'16 0 0 0 126000 0.000727% 7272.15
Nov'16 0 0 0 126000 0.000727% 7272.15
Dec'16 0 0 0 126000 0.000727% 7272.15
750 0 0 126000 0.000727% 7272.15Total
SBGA Product Family
FIT Chart
0
1000
2000
3000
4000
5000
6000
7000
8000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
420 0 0 70560 0.001299% 12985.98
Oct'16 0 0 0 70560 0.001299% 12985.98
Nov'16 0 0 0 70560 0.001299% 12985.98
Dec'16 0 0 0 70560 0.001299% 12985.98
420 0 0 70560 0.001299% 12985.98Total
LBGAProduct Family
FIT Chart
0
2000
4000
6000
8000
10000
12000
14000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
210 0 0 35280 0.002597% 25971.96
Oct'16 0 0 0 35280 0.002597% 25971.96
Nov'16 0 0 0 35280 0.002597% 25971.96
Dec'16 0 0 0 35280 0.002597% 25971.96
210 0 0 35280 0.002597% 25971.96Total
QFP Product Family
FIT Chart
0
5000
10000
15000
20000
25000
30000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
4th QUARTER RELIABILITY REPORT FOR 2016
- 48-
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
240 0 0 40320 0.002273% 22725.46
Oct'16 0 0 0 40320 0.002273% 22725.46
Nov'16 0 0 0 40320 0.002273% 22725.46
Dec'16 0 0 0 40320 0.002273% 22725.46
240 0 0 40320 0.002273% 22725.46Total
PBGA Product Family
FIT Chart
0
5000
10000
15000
20000
25000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
6.4 TEST DATA FOR HIGHLY ACCELERATED STRESS TEST (UHAST) 130°C / 85%RH /33.3 psia, 168hrs – ( Cu ).
Package Type
DateSample
Size# of
FailuresCum # of Failures
Cum Device Hours
Cum Failure Rate (%)
Cum FIT (10̂ 9 Device hrs)
Cum Q3'16
734 0 0 123312 0.000743% 7430.67
Oct'16 40 0 0 130032 0.000705% 7046.66
Nov'16 0 0 0 130032 0.000705% 7046.66
Dec'16 0 0 0 130032 0.000705% 7046.66
774 0 0 130032 0.000705% 7046.66Total
LQFP Product Family
FIT Chart
6800
6900
7000
7100
7200
7300
7400
7500
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
4th QUARTER RELIABILITY REPORT FOR 2016
- 49 -
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device hrs)
Cum Q3'16
750 0 0 126000 0.000727% 7272.15
Oct'16 0 0 0 126000 0.000727% 7272.15
Nov'16 0 0 0 126000 0.000727% 7272.15
Dec'16 0 0 0 126000 0.000727% 7272.15
750 0 0 126000 0.000727% 7272.15Total
SBGA Product Family
FIT Chart
0
1000
2000
3000
4000
5000
6000
7000
8000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device hrs)
Cum Q3'16
964 0 0 161952 0.000566% 5657.79
Oct'16 30 0 0 166992 0.000549% 5487.03
Nov'16 0 0 0 166992 0.000549% 5487.03
Dec'16 0 0 0 166992 0.000549% 5487.03
994 0 0 166992 0.000549% 5487.03Total
QFN Product Family
FIT Chart
5400
5450
5500
5550
5600
5650
5700
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device hrs)
Cum Q3'16
946 0 0 158928 0.000577% 5765.45
Oct'16 30 0 0 163968 0.000559% 5588.23
Nov'16 0 0 0 163968 0.000559% 5588.23
Dec'16 0 0 0 163968 0.000559% 5588.23
976 0 0 163968 0.000559% 5588.23Total
TQFP Product Family
FIT Chart
5450
5500
5550
5600
5650
5700
5750
5800
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
4th QUARTER RELIABILITY REPORT FOR 2016
- 50 -
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
659 0 0 110712 0.000828% 8276.35
Oct'16 0 0 0 110712 0.000828% 8276.35
Nov'16 0 0 0 110712 0.000828% 8276.35
Dec'16 0 0 0 110712 0.000828% 8276.35
659 0 0 110712 0.000828% 8276.35Total
PLCC Product Family
FIT Chart
0
1000
2000
3000
4000
5000
6000
7000
8000
9000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
838 0 0 140784 0.000651% 6508.49
Oct'16 0 0 0 140784 0.000651% 6508.49
Nov'16 0 0 0 140784 0.000651% 6508.49
Dec'16 0 0 0 140784 0.000651% 6508.49
838 0 0 140784 0.000651% 6508.49Total
LBGA Product Family
FIT Chart
0
1000
2000
3000
4000
5000
6000
7000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
320 0 0 53760 0.001704% 17044.10
Oct'16 0 0 0 53760 0.001704% 17044.10
Nov'16 0 0 0 53760 0.001704% 17044.10
Dec'16 0 0 0 53760 0.001704% 17044.10
320 0 0 53760 0.001704% 17044.10Total
QFP Product Family
FIT Chart
0
2000
4000
6000
8000
10000
12000
14000
16000
18000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
4th QUARTER RELIABILITY REPORT FOR 2016
- 51 -
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
610 0 0 102480 0.000894% 8941.17
Oct'16 0 0 0 102480 0.000894% 8941.17
Nov'16 0 0 0 102480 0.000894% 8941.17
Dec'16 0 0 0 102480 0.000894% 8941.17
610 0 0 102480 0.000894% 8941.17Total
PBGA Product Family
FIT Chart
0
1000
2000
3000
4000
5000
6000
7000
8000
9000
10000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
4th QUARTER RELIABILITY REPORT FOR 2016
- 52 -
6.5 TEST DATA FOR HIGHLY ACCELERATED STRESS TEST (UHAST) 110°C / 85%RH /17.7 psia, 264hrs – ( Cu ).
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
640 0 0 168960 0.000542% 5423.12
Oct'16 40 0 0 179520 0.000510% 5104.12
Nov'16 0 0 0 179520 0.000510% 5104.12
Dec'16 0 0 0 179520 0.000510% 5104.12
680 0 0 179520 0.000510% 5104.12Total
LBGA Product Family
FIT Chart
4900
5000
5100
5200
5300
5400
5500
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
507 0 0 133848 0.000685% 6845.76
Oct'16 40 0 0 144408 0.000635% 6345.15
Nov'16 0 0 0 144408 0.000635% 6345.15
Dec'16 0 0 0 144408 0.000635% 6345.15
547 0 0 144408 0.000635% 6345.15Total
PBGA Product Family
FIT Chart
6000
6100
6200
6300
6400
6500
6600
6700
6800
6900
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
4th QUARTER RELIABILITY REPORT FOR 2016
- 53 -
6.6 TEST DATA FOR HIGHLY ACCELERATED STRESS TEST (BHAST) - 110°C / 85%RH/17.7 psia, 264hrs - (Cu ).
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
30 0 0 7920 0.011569% 115693.28
Oct'16 0 0 0 7920 0.011569% 115693.28
Nov'16 0 0 0 7920 0.011569% 115693.28
Dec'16 0 0 0 7920 0.011569% 115693.28
30 0 0 7920 0.011569% 115693.28Total
PBGA Product Family
FIT Chart
0
20000
40000
60000
80000
100000
120000
140000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
6.7 TEST DATA FOR HIGH TEMPERATURE STORAGE (HTS) - 150°C (Cu ).
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device hrs)
Cum Q3'16
907 1 1 152376 0.001327% 13271.86
Oct'16 30 0 1 182376 0.001109% 11088.70
Nov'16 0 0 1 182376 0.001109% 11088.70
Dec'16 0 0 1 182376 0.001109% 11088.70
937 1 1 182376 0.001109% 11088.70Total
TQFP Product Family
FIT Chart
9500
10000
10500
11000
11500
12000
12500
13000
13500
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
4th QUARTER RELIABILITY REPORT FOR 2016
- 54 -
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
774 0 0 774000 0.000118% 1183.84
Oct'16 40 0 0 814000 0.000113% 1125.66
Nov'16 0 0 0 814000 0.000113% 1125.66
Dec'16 0 0 0 814000 0.000113% 1125.66
814 0 0 814000 0.000113% 1125.66Total
LQFP Product Family
FIT Chart
1090
1100
1110
1120
1130
1140
1150
1160
1170
1180
1190
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
658 0 0 658000 0.000139% 1392.54
Oct'16 0 0 0 658000 0.000139% 1392.54
Nov'16 0 0 0 658000 0.000139% 1392.54
Dec'16 0 0 0 658000 0.000139% 1392.54
658 0 0 658000 0.000139% 1392.54Total
PLCC Product Family
FIT Chart
0
200
400
600
800
1000
1200
1400
1600
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
965 0 0 965000 0.000095% 949.52
Oct'16 30 0 0 995000 0.000092% 920.90
Nov'16 0 0 0 995000 0.000092% 920.90
Dec'16 0 0 0 995000 0.000092% 920.90
995 0 0 995000 0.000092% 920.90Total
QFN Product Family
FIT Chart
905
910
915
920
925
930
935
940
945
950
955
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
4th QUARTER RELIABILITY REPORT FOR 2016
- 55 -
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
620 0 0 620000 0.000148% 1477.89
Oct'16 0 0 0 620000 0.000148% 1477.89
Nov'16 0 0 0 620000 0.000148% 1477.89
Dec'16 0 0 0 620000 0.000148% 1477.89
620 0 0 620000 0.000148% 1477.89Total
SBGA Product Family
FIT Chart
0
200
400
600
800
1000
1200
1400
1600
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
1417 0 0 1417000 0.000065% 646.64
Oct'16 40 0 0 1457000 0.000063% 628.89
Nov'16 0 0 0 1457000 0.000063% 628.89
Dec'16 0 0 0 1457000 0.000063% 628.89
1457 0 0 1457000 0.000063% 628.89Total
LBGA Product Family
FIT Chart
620
625
630
635
640
645
650
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
210 0 0 210000 0.000436% 4363.29
Oct'16 0 0 0 210000 0.000436% 4363.29
Nov'16 0 0 0 210000 0.000436% 4363.29
Dec'16 0 0 0 210000 0.000436% 4363.29
210 0 0 210000 0.000436% 4363.29Total
QFP Product Family
FIT Chart
0
500
1000
1500
2000
2500
3000
3500
4000
4500
5000
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
4th QUARTER RELIABILITY REPORT FOR 2016
- 56 -
Package Type
DateSample
Size# of
Failures
Cum # of
Failures
Cum Device Hours
Cum Failure
Rate (%)
Cum FIT (10^9 Device Hours)
Cum Q3'16
1117 0 0 1117000 0.000082% 820.31
Oct'16 40 0 0 1157000 0.000079% 791.95
Nov'16 0 0 0 1157000 0.000079% 791.95
Dec'16 0 0 0 1157000 0.000079% 791.95
1157 0 0 1157000 0.000079% 791.95Total
PBGA Product Family
FIT Chart
775
780
785
790
795
800
805
810
815
820
825
Cum Q3'16 Oct'16 Nov'16 Dec'16Month
FIT
4th QUARTER RELIABILITY REPORT FOR 2016
-57- ASEM RELIABILITY LAB
7.0 SCANNING ACOUSTIC MICROSCOPE (SAM) ANALYSIS DATA Delamination Criteria (Ref:Joint IPC/JEDEC Standard J-STD-020) The delamination changes are measured from premoisture soak to post reflow. A measurable delamination change is defined as a 10% absolute change between pre- and post- reflow. The absolute percentage (%) of delamination change is calculated in relation to the total area being evaluated.
Package Type
Lead Count
Q1'16 Q2'16 Q3'16 Q4'16
LQFP
32 0/0 0/0 0/0 0/0
44 0/0 0/0 0/0 0/0
48 0/0 0/0 0/120 0/0
64 0/0 0/0 0/0 0/0
80 0/0 0/120 0/0 0/0
100 0/120 0/120 0/0 0/120
120 0/0 0/0 0/0 0/0
128 0/0 0/0 0/0 0/0
144 0/0 0/0 0/0 0/0
176 0/0 0/0 0/0 0/0
LBGA
36 0/0 0/0 0/0 0/0
49 0/0 0/0 0/0 0/0
56 0/0 0/0 0/0 0/0
64 0/0 0/0 0/0 0/0
100 0/0 0/0 0/0 0/0
132 0/0 0/0 0/0 0/120
144 0/0 0/0 0/0 0/0
160 0/0 0/0 0/0 0/0
176 0/0 0/0 0/0 0/0
184 0/0 0/0 0/0 0/0
196 0/0 0/0 0/0 0/0
256 0/120 0/0 0/120 0/120
277 0/0 0/0 0/0 0/0
324 0/0 0/0 0/0 0/0
400 0/0 0/0 0/0 0/0
484 0/0 0/0 0/0 0/0
564 0/0 0/0 0/0 0/0
SOPW
16 0/0 0/0 0/0 0/0
20 0/0 0/0 0/0 0/0
4th QUARTER RELIABILITY REPORT FOR 2016
-58- ASEM RELIABILITY LAB
28 0/0 0/0 0/0 0/0
EBGA 652 0/0 0/0 0/0 0/0
SBGA
233 0/0 0/0 0/0 0/0
256 0/0 0/0 0/0 0/0
564 0/120 0/120 0/0 0/0
729 0/120 0/120 0/0 0/0
PBGA
208 0/0 0/0 0/0 0/0
256 0/120 0/0 0/0 0/0
272 0/0 0/0 0/0 0/0
324 0/0 0/0 0/0 0/0
388 0/0 0/0 0/0 0/0
484 0/0 0/0 0/120 0/120
672 0/0 0/0 0/0 0/0
900 0/0 0/0 0/0 0/0
1156 0/120 0/0 0/0 0/0
PLCC
20 0/0 0/0 0/0 0/0
28 0/0 0/0 0/0 0/120
32 0/0 0/0 0/0 0/0
44 0/0 0/120 0/0 0/0
52 0/0 0/0 0/0 0/0
68 0/120 0/0 0/0 0/0
84 0/0 0/0 0/120 0/0
PQFP
100 0/0 0/0 0/0 0/0
132 0/0 0/0 0/0 0/0
PQFN 26 0/0 0/0 0/0 0/0
30 0/0 0/120 0/0 0/0
QFP
100 0/0 0/0 0/0 0/0
128 0/0 0/0 0/0 0/0
160 0/0 0/0 0/0 0/0
208 0/120 0/0 0/0 0/0
64 0/0 0/0 0/0 0/0
240 0/0 0/0 0/0 0/0
TQFP
44 0/0 0/0 0/0 0/0
48 0/120 0/240 0/240 0/0
64 0/0 0/0 0/0 0/120
80 0/0 0/0 0/0 0/0
100 0/0 0/0 0/0 0/0
128 0/0 0/0 0/0 0/0
144 0/0 0/0 0/0 0/0
176 0/0 0/0 0/0 0/0
4th QUARTER RELIABILITY REPORT FOR 2016
-59- ASEM RELIABILITY LAB
MCQFP
144 0/0 0/0 0/0 0/0
208 0/0 0/0 0/0 0/0
240 0/0 0/0 0/0 0/0
TSSOP 48 0/0 0/0 0/0 0/0
CSBGA
256 0/0 0/0 0/0 0/0
304 0/0 0/0 0/0 0/0
672 0/0 0/0 0/0 0/0
836 0/0 0/0 0/0 0/0
1140 0/0 0/0 0/0 0/0
HSBGA
312 0/0 0/0 0/0 0/0
380 0/0 0/0 0/0 0/0
564 0/0 0/0 0/0 0/0
680 0/0 0/0 0/0 0/0
729 0/0 0/0 0/0 0/0
LGA
6 0/0 0/0 0/0 0/0
8 0/0 0/0 0/0 0/0
10 0/0 0/0 0/0 0/0
QFN
16 0/0 0/0 0/0 0/0
24 0/0 0/0 0/0 0/0
28 0/0 0/0 0/0 0/0
32 0/120 0/0 0/0 0/120
44 0/0 0/0 0/0 0/0
48 0/0 0/120 0/120 0/120
56 0/0 0/0 0/0 0/0
64 0/0 0/0 0/0 0/0
84 0/120 0/0 0/0 0/0
132 0/120 0/0 0/120 0/0
164 0/0 0/0 0/0 0/0
TOTAL 0/1800 0/1080 0/960 0/960
4th QUARTER RELIABILITY REPORT FOR 2016
ASEM RELIABILITY LAB
- 60 -
8.0 SOLDERABILITY TEST DATA
Package type
Lead count
REJ / SS
CUM Q1’16
CUM Q2'16
CUM Q3'16
CUM Q4'16
LQFP 20 0/0 0/0 0/0 0/0
28 0/0 0/0 0/0 0/0
32 0/20 0/5 0/0 0/10
44 0/60 0/130 0/20 0/30
48 0/70 0/60 0/40 0/50
64 0/20 0/40 0/30 0/50
68 0/0 0/50 0/0 0/0
80 0/60 0/0 0/40 0/60
84 0/0 0/0 0/0 0/0
100 0/400 0/300 0/50 0/280
128 0/60 0/80 0/20 0/60
132 0/0 0/0 0/0 0/0
144 0/320 0/350 0/120 0/550
160 0/0 0/0 0/0 0/0
176 0/60 0/100 0/0 0/60
208 0/0 0/0 0/0 0/0
240 0/0 0/0 0/0 0/0
PDIP 8 0/0 0/0 0/0 0/0
16 0/0 0/0 0/0 0/0
PLCC 20 0/0 0/10 0/0 0/0
28 0/20 0/50 0/10 0/50
32 0/0 0/10 0/0 0/80
40 0/0 0/0 0/0 0/0
42 0/0 0/0 0/0 0/0
44 0/390 0/510 0/200 0/420
50 0/0 0/0 0/0 0/0
52 0/0 0/0 0/0 0/0
68 0/40 0/5 0/0 0/70
84 0/110 0/140 0/0 0/20
100 0/0 0/0 0/0 0/0
132 0/0 0/0 0/0 0/0
144 0/0 0/0 0/0 0/0
208 0/0 0/0 0/0 0/0
4th QUARTER RELIABILITY REPORT FOR 2016
ASEM RELIABILITY LAB
- 61 -
PQFN 8 0/220 0/20 0/280 0/790
25 0/5 0/0 0/0 0/175
26 0/0 0/0 0/0 0/0
28 0/90 0/0 0/0 0/0
30 0/675 0/0 0/85 0/1185
32 0/5 0/0 0/0 0/0
PQFP 30 0/0 0/0 0/0 0/0
32 0/0 0/0 0/0 0/0
44 0/0 0/0 0/0 0/0
100 0/0 0/0 0/0 0/0
132 0/0 0/0 0/0 0/0
QFP 20 0/0 0/0 0/0 0/0
24 0/0 0/0 0/0 0/0
30 0/0 0/0 0/0 0/0
44 0/0 0/0 0/0 0/0
64 0/0 0/0 0/0 0/0
84 0/0 0/0 0/0 0/0
100 0/0 0/0 0/0 0/0
120 0/0 0/0 0/0 0/0
128 0/15 0/30 0/0 0/60
132 0/0 0/0 0/0 0/0
144 0/0 0/0 0/0 0/0
160 0/10 0/10 0/10 0/30
208 0/245 0/160 0/20 0/290
240 0/0 0/0 0/0 0/0
256 0/0 0/0 0/0 0/0
304 0/0 0/0 0/0 0/0
MQFP 128 0/0 0/0 0/0 0/0
144 0/0 0/0 0/0 0/0
132 0/0 0/0 0/0 0/0
196 0/0 0/0 0/0 0/0
208 0/0 0/0 0/0 0/0
240 0/0 0/0 0/0 0/0
SOIC 28 0/0 0/0 0/0 0/0
TQFP 32 0/0 0/0 0/0 0/0
44 0/100 0/100 0/40 0/80
48 0/80 0/60 0/50 0/130
64 0/110 0/110 0/10 0/20
100 0/150 0/230 0/190 0/310
128 0/0 0/0 0/0 0/0
4th QUARTER RELIABILITY REPORT FOR 2016
ASEM RELIABILITY LAB
- 62 -
144 0/0 0/0 0/0 0/0
QFN 3 0/0 0/10 0/0 0/0
12 0/0 0/0 0/10 0/0
16 0/30 0/5 0/0 0/0
22 0/0 0/0 0/5 0/0
24 0/20 0/10 0/40 0/10
28 0/80 0/30 0/10 0/10
32 0/65 0/10 0/10 0/60
36 0/0 0/0 0/0 0/0
40 0/70 0/160 0/20 0/110
44 0/0 0/0 0/0 0/10
48 0/220 0/0 0/90 0/90
54 0/0 0/10 0/0 0/10
56 0/50 0/80 0/60 0/60
58 0/0 0/10 0/0 0/0
64 0/90 0/130 0/10 0/50
68 0/0 0/0 0/0 0/0
72 0/10 0/20 0/10 0/40
80 0/0 0/0 0/0 0/0
84 0/10 0/0 0/0 0/0
88 0/0 0/0 0/0 0/0
102 0/0 0/0 0/0 0/0
132 0/125 0/0 0/0 0/0
156 0/0 0/10 0/0 0/10
TSSOP 48 0/0 0/0 0/0 0/30
LBGA 256 0/0 0/0 0/0 0/0
MCLQFP 144 0/5 0/10 0/0 0/0
148 0/0 0/0 0/0 0/0
MCQFP 208 0/20 0/10 0/0 0/0
240 0/35 0/0 0/0 0/0
DFN 10 0/0 0/0 0/0 0/10
12 0/0 0/0 0/0 0/0
TOTAL 0/4165 0/3145 0/1470 0/5360
4TH QUARTER RELIABILITY REPORT FOR 2016
ASEM RELIABILITY LAB
- 63 -
9.0 MARK PERMANENCY TEST DATA
Package Type
Lead Count
REJ / SS
CUM Q1'16
CUM Q2'16
CUM Q3'16
CUM Q4'16
LBGA 100 0/0 0/0 0/0 0/0
144 0/0 0/0 0/0 0/0
256 0/0 0/0 0/0 0/0
324 0/0 0/0 0/0 0/0
LQFP 32 0/0 0/0 0/0 0/0
44 0/0 0/0 0/0 0/0
48 0/0 0/0 0/0 0/0
64 0/0 0/0 0/0 0/0
80 0/0 0/0 0/0 0/0
100 0/0 0/0 0/0 0/0
128 0/0 0/0 0/0 0/0
144 0/0 0/0 0/0 0/0
176 0/0 0/0 0/0 0/0
208 0/0 0/0 0/0 0/0
PBGA 208 0/0 0/0 0/0 0/0
256 0/0 0/0 0/0 0/0
272 0/0 0/0 0/0 0/0
304 0/0 0/0 0/0 0/0
388 0/0 0/0 0/0 0/0
324 0/0 0/0 0/0 0/0
365 0/0 0/0 0/0 0/0
484 0/0 0/0 0/0 0/0
PLCC 16 0/0 0/0 0/0 0/0
20 0/0 0/0 0/0 0/0
28 0/0 0/0 0/0 0/0
44 0/0 0/0 0/0 0/0
68 0/0 0/0 0/0 0/0
84 0/0 0/0 0/0 0/0
QFP 100 0/0 0/0 0/0 0/0
128 0/0 0/0 0/0 0/0
144 0/0 0/0 0/0 0/0
160 0/0 0/0 0/0 0/0
4TH QUARTER RELIABILITY REPORT FOR 2016
ASEM RELIABILITY LAB
- 64 -
208 0/0 0/0 0/0 0/0
240 0/0 0/0 0/0 0/0
SOPW 16 0/0 0/0 0/0 0/0
20 0/0 0/0 0/0 0/0
28 0/0 0/0 0/0 0/0
TQFP 44 0/0 0/0 0/0 0/0
48 0/0 0/0 0/0 0/0
64 0/0 0/0 0/0 0/0
100 0/0 0/0 0/0 0/0
126 0/0 0/0 0/0 0/0
144 0/0 0/0 0/0 0/0
SOIC 16 0/0 0/0 0/0 0/0
PQFP 48 0/0 0/0 0/0 0/0
CSBGA 232 0/0 0/0 0/0 0/0
380 0/0 0/0 0/0 0/0
564 0/0 0/0 0/0 0/0
680 0/0 0/0 0/0 0/0
HSBGA 380 0/0 0/0 0/0 0/0
564 0/0 0/0 0/0 0/0
680 0/0 0/0 0/0 0/0
MCLQ 128 0/0 0/0 0/0 0/0
144 0/0 0/0 0/0 0/0
MCLQF 128 0/0 0/0 0/0 0/0
144 0/0 0/0 0/0 0/0
MCQFP 208 0/0 0/0 0/0 0/0
240 0/0 0/0 0/0 0/0
TOTAL 0/0 0/0 0/0 0/0
Note: No Mark Permanency data for Q4 ’ 2016
4TH QUARTER RELIABILITY REPORT FOR 2016
ASEM RELIABILITY LAB - 65 -
10.0 ATTACHMENT. 10.1 ACOUSTIC TOPOGRAPHY ANALYSIS
Figure 2: Top Scanning on LQFP 100L, shows no delamination noted on Die and Substrate region.
Figure 3: Top Scanning on QFN 48L shows no delamination noted on Die and Die Attached Pad (DAP) region.
Figure 1: Top Scanning on PBGA 484L shows no delamination noted on Die and Substrate region.