Proven in the Most Advanced Market · 1 Artiza LTE Tester DuoSIM Figure 2: E-UTRAN Architecture eNB...

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Artiza LTE Tester DuoSIM Proven in the Most Advanced Market Artiza Networks LTE Tester

Transcript of Proven in the Most Advanced Market · 1 Artiza LTE Tester DuoSIM Figure 2: E-UTRAN Architecture eNB...

Page 1: Proven in the Most Advanced Market · 1 Artiza LTE Tester DuoSIM Figure 2: E-UTRAN Architecture eNB System Performance 2000 2010 WCDMA R99 HSDPA HSUPA Long-Term Evolution Smooth Introduction

Artiza LTE Tester DuoSIMProven in the Most Advanced Market

Artiza Networks LTE Tester

Page 2: Proven in the Most Advanced Market · 1 Artiza LTE Tester DuoSIM Figure 2: E-UTRAN Architecture eNB System Performance 2000 2010 WCDMA R99 HSDPA HSUPA Long-Term Evolution Smooth Introduction

1 Artiza LTE Tester DuoSIM

Figure 2: E-UTRAN Architecture

eNB

SystemPerformance

2000 2010

WCDMA R99

HSDPA

HSUPA

Long-TermEvolution

SmoothIntroduction of 4G

Figure 1: Roadmap to LTE-Advanced (Real 4G)

Real 4G

X2X2

X2

S1S1 S1

S1

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MME/S-GW MME/S-GW

eNB

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LTE

Breakthrough to Real 4G

LTE-Advanced (LTE Rel.10 and beyond) standardization started to respond to rapidly growing traffic by the wide spread of smart phone devices. It has to achieve higher level of system performance than LTE Rel.8, while maintaining the backward compatibility. In response, the radio access interface specification for LTE-Advanced has been developed accordingly in the beginning of 2011. ITU-T has announced new requirements in terms of spectral efficiency, higher bandwidth, lower latency and so forth. To meet these competitive requirements, a series of new technologies have been discussed to introduce into LTE-Advanced, such as Carrier Aggregation, Enhanced Uplink Multi-antenna Transmission, CoMP Reception in Uplink and so forth.LTE-Advanced will enable 1Gbps downlink bandwidth on top of the existing LTE service and open a new era of true wireless broadband service in the near future.

Next Big Wave…

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2Artiza LTE Tester DuoSIM

Figure 3: DuoSIM-1000 x 3 Configuration in AZP-1400

(UE-SIM x 3) + S1/X2-SIM:

1,000 UEs/secotor x 3 = 3,000 UEs over 3 sectors

Figure 4: DuoSIM-1000 x 1 Configuration in AZP-600

Uu I/F(IQ/CPRI)

Uu I/F(IQ/CPRI)

Ethernet

Uu I/F(IQ/CPRI)

S1/X2-SIM(GbE/10GbE)

Figure 5: DuoSIM Wrap Around Test Configuration for 3,000 UEs over 3 sectors

RF UnitRF Unit

RF Unit

E-UTRAN Cell

1,000 UEs

1,000 UEs 1,000 UEs

Sector1Sector3

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Control PC(UE-SIM + S1/X2-SIM) x 1:

1,000 UEs/secotor x 1 = 1,000 UEs/sector

Artiza LTE Tester DuoSIM; All-in-One Solution for LTE Network

Artiza has been dominating the LTE R&D market with its LTE Testers since 2009. With the market proven quality, the most advanced LTE operators and vendors have been satisfied with the incomparable level of its performance, being way ahead of its competitors. Artiza has enabled numerous LTE vendors and service operators to bring their products and services to the higher level of quality standards. It helped LTE vendors ship their products with the highest functionalities, performance, and quality from the initial release, and Tier-1 service operators start new services smoothly.

Responding to emerging new technologies and second movement of LTE standards, Artiza is moving on to the next level with the release of new LTE Tester, DuoSIM. In addition to covering high capacity LTE nodes, DuoSIM offers better coverage including complementally nodes such as pico/femtocell eNBs, with more convenient all-in-one solution at higher cost performance than ever.

UE-SIM and S1/X2-SIM in Single ATCA Chassis

Artiza LTE Tester DuoSIM is a single hardware solution based on ATCA platform. UE-SIM and S1/X2-SIM functionalities required for LTE eNB Wrap-around testing are now integrated into a DuoSIM chassis, with even higher capacity up to 1,000 UEs/sector. DuoSIM’s four blades are equivalent to having both UE-SIM and S1/X2-SIM. DuoSIM is available on AZP-600 with a single instance (Figure 4) and on AZP-1400 with triple instances (Figure 3) enabling 3,000 UEs per chassis (Figure 5) for higher capacity requirements.

High Cost Performance

Equipped with highly condensed ATCA full blades for UE-SIM and S1/X2-SIM in a single chassis, DuoSIM established a new record of cost performance for LTE Testers in the industry. LTE service operators and equipment vendors need to take great care of ROI (Return on Investment). To survive and dominate the today’s highly competitive LTE market, Artiza offers not only the high cost performance, but also the flexible payment options to optimize CAPEX and OPEX balance.

DuoSIM Test Applications

DuoSIM Test Applications take full advantage of having both UE-SIM and S1/X2-SIM in a single chassis. The new test suite enables detail parameter setting, simulation management and test results/stats logging on Uu and S1/X2 interfaces. Outperforming the legacy solution with independent UE-SIM and S1/X2-SIM chassis, DuoSIM allows users more comfortable test experiences. With its new functionalities,DuoSIM reshapes LTE evaluation methods and becomes a final solution for any LTE testing needs.

LTE-Advanced in Mind

3GPP has been working to standardize LTE-Advanced in the last few years, and radio access technology specification was almost finalized in the beginning of 2011. LTE-Advanced includes major enhancements such as Carrier Aggregation and new MIMO transmission scheme, but rest assured Artiza LTE Tester DuoSIM is developed with such new technologies in mind. After finalization of new standards, DuoSIM can be upgraded with additional blades and software based on user demands to support LTE-Advanced.

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3 Artiza LTE Tester DuoSIM

C-plane Protocol Stack on Uu (UE/eNB) and S1-C (eNB/MME)

C-plane Protocol Stack on X2-C (eNB/eNB)

White Paper

LTE eNB Evaluation

Methodology

eNB

X2-C

X2AP

SCTP

IP

MAC

Ethernet

X2AP

SCTP

IP

MAC

Ethernet

eNB

RRC

PDCP

PLC

MAC

PHY

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SCTP

IP

MAC

Ethernet

UE

Uu S1-C

RRC

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PLC

MAC

PHY

S1AP

SCTP

IP

MAC

Ethernet

eNB MME

Protocol Stack

LTE eNB

LTE eNB Evaluation Methodology

LTE’s radio interface testing methodology has been developed along with the specifications for LTE network implementation, yet a de facto way of evaluating the whole LTE eNB system does not exist as of today. There are testing standards in 3GPP that are focused on separated elements (layers) of User Equipment (UE) and eNB, as listed below. However, specification of integrated methodology for the system evaluation has not been established, so the NEMs and operators are evaluating their equipment as a system with their own methodology from the experiences in legacy mobile development.

• TS 36.101 User Equipment (UE) radio transmission and reception

• TS 36.104 Base Station (BS) radio transmission and reception

• TS 36.133 E-UTRA Requirements for support of radio resource management

• TS 36.141 Base Station (BS) conformance testing • TS 36.211 Physical channels and modulation• TS 36.212 Multiplexing and channel coding • TS 36.213 Physical layer procedures • TS 36.214 Physical layer - Measurements • TS 36.321 Medium Access Control (MAC) protocol

specification

In today’s advanced wireless technology, a single evaluation method for separate basic functionalities is inadequate. The industry needs a new approach to evaluate the comprehensive performances of the eNB, which carries out the most complicated functionality in E-UTRAN. As a matter of fact, eNB comprises the largest number of network nodes in the LTE system, and the biggest capital expenditure is invested to deploying the eNB. At Artiza Networks, we propose “LTE eNB Evaluation Methodology,” setting the new standard of system evaluation for the LTE eNB. Artiza LTE eNB Tester DuoSIM is a complete test suite including C-plane test to evaluate radio resource management, U-plane QoS test, C/U combined test, NAS test, and various types of system evaluation. As the first trial in the industry, Artiza has developed a comprehensive methodology for operators’ and manufacturers’ QA team to overcome a big challenge of effective evaluation of LTE eNB ever. Please access “LTE Tutorial” in Artiza website (http://www.artizanetworks.com) to learn more about the details.

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4Artiza LTE Tester DuoSIM

Figure 8: DSP Array Blade (AN1-PRM-01)

Macro 1,000 UEs/sectorDuoSIM-1000

Macro 840 UEs/sectorDuoSIM-840

Macro/Omni 420 UEs/sectorDuoSIM-420

Pico/Femto

64 UEs/sectorDuoSIM-64

Artiza LTE Tester DuoSIM is available with different configurations to accommodate various user needs. Each configuration corresponds to a different model in DuoSIM series products, such as DuoSIM-1000, DuoSIM-840, DuoSIM-420, and DuoSIM-64, where the model number stands for the supported UE simulation capacity. DuoSIM-1000 and DuoSIM-840 are the first market-proven products in the industry for macrocell eNB development. DuoSIM-420 is best suited for omicell to macrocell eNB testing, and DuoSIM-64 provides a compact testing platform that meets pico/femtocell eNB testing. All of the resources, including hardware blades installed in the system and test data generated from Artiza LTE Testers DuoSIM, are compatible and portable across different platforms. DuoSIM capacity coverage is shown in Figure 6.

Powerful Hardware Blades in ATCA platform: AZP-600/1400

Artiza’s LTE eNB Tester hardware comprises a series of powerful hardware, baseband blade, sRIO (serial Rapid I/O) switching blade, and DSP processing blades/submodules in ATCA platform. One DuoSIM consists of four blades, each responsible for UL-baseband, DL-baseband, UE protocol processing (UE-DSP), and S1/X2 protocol processing (S1/X2-DSP). The blade-oriented hardware architecture enables flexible testbed configuration to meet various vendor’s requirements, such as capacity, performance, and number of sectors.

Baseband Blade

The outstanding testing capacity of 1,000 UEs/sector is the first in the industry, made possible by high-performance baseband processing units with a number of FPGAs/DSPs on a blade. This original blade is entirely developed by Artiza’ s in-house engineering team from the PCB (20Kpins) design to FPGA logical circuit and DSP software implementation, well crafted to the level of artistic work (Figure 7). With the special blade hardware design, the product has the full control of baseband processing, especially for PHY/MAC layers testing, becoming one of the most important factors for LTE eNB performance. In addition to the legacy RF (with RF Unit) with I/Q interface, use of CPRI/OBSAI interface has tremendously improved the test efficiency.

DSP Array Blade

Another powerful ATCA blade becomes available for DuoSIM systems to generate higher traffic on C-plane and U-plane via Uu and S1/X2 interfaces. The new blade is an array of powerful DSP processors consisting of 8 DSP submodules with traffic engines and large scale FPGAs (Figure 8). The blade comes with two options (AN2-B-PRM-01/ AN2-B-PRM-02), which deal with Uu and S1/X2 interfaces respectively. For Uu interface, generated traffic is passed through the 10-Gbps sRIO interface on backplane into baseband blade. And for S1/X2 interface, traffic is through the 10GbE or 1GbE for S1/X2 interface on the front panel. This powerful architecture achieves simulation of various protocols and tremendously high capacity per chassis.

DuoSIM Hardware; The State-of-the-Art

Figure 6: DuoSIM Capacity Coverage for UE Simulation

Four System Models for Different Capacity Requirements

Figure 7: Baseband Blade (AN2-B-BB-02)

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5 Artiza LTE Tester DuoSIM

Figure 9: Sequence Association over eNB Subscriber Table

Sub ID

Seq 1

UE-SIM

SysconnID

1 0784 1987

2 5467 9987

3 0002 2587

eNB (DUT)

Subscriber 1

Subscriber 2

Subscriber 3

・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・

Sub ID

Seq 2

♯ SysconnID

1 3354 0206

2 9998 5555

3 2687 2988

Sub ID

Seq 60

♯ SysconnID

1 6654 6448

2 7922 7777

3 2210 0016

S1/X2-SIM

MME

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Sub ID

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♯1 0784 1987

2 5467 9987

3 0002 2587

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Sequence

♯1 3354 0206

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3 2687 2988

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1 6654 6448

2 7922 7777

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GbE

Simulated eNB

Test ApplicationsComplete Testing Solutions

Artiza’s DuoSIM test application has versatile functionalities to evaluate LTE nodes, covering from independent C-plane and U-plane testing to the comprehensive C/U combined testing. To support the array of functionalities and the parameter settings, series of software are provided, i.e., Parameter Composer, Chassis Configurator, SDL Editor, Message Editor and Load Scheduler. DuoSIM Manager is the main application, and it is responsible for configuring the simulator hardware, running simulation, and for retrieving results and statistics.

DuoSIM Parameter Composer

DuoSIM Parameter Composer allows users to set parameters for UE and S1/X2 simulation. UE-side parameters include E-UTRAN/Cell/UE/Subscriber/Logical Channel/Sequence, and S1/X2-side configurations include Physical Setup, Port Settings, IP addresses, nodes (MME/S-GW/Neighbor eNB) and Sequence Settings.

As a UE-SIM, its unique architecture to manage subscriber tables, UE tables, and the subscriber table maintained in eNB enables to simulate a very large number of independent UEs. On the S1/X2-side, multiple core network nodes and radio access network can be simulated, and it has the capability of handling up to 6,000 UE connections simultaneously.

The relationship between the sequences on both UE and S1/X2-sides can be looked up with a system-wide unique identifier, SysConnID, as shown in Figure 9. This feature is especially useful when tracking how sequences generated on one side (e.g., UE-SIM) are handled on the other side (e.g., S1/X2-SIM).

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6Artiza LTE Tester DuoSIM

Figure 10: SDL Editor Figure 11: RRC ASN.1 Message Editor

Figure 13: Load SchedulerFigure 12: RACH Preamble Generation

UE-SIM

Preamble <RACH>

Preamble <RACH>

Preamble <RACH>

Preamble <RACH>

Preamble <RACH>

Up to 64 Preambles

1 subframe=1 msec

eNB

SDL Engine with Auto IE Response Functionality

One of the most powerful functionalities of our test software is the SDL (Subscription Description Language) Engine. For easy configuration with the SDL engine, our test software comes with the state machine oriented SDL Editor (Figure 10) and RRC ASN.1 Message Editor (Figure 11). The powerful Message Editor can generate ASN.1 IE (Information Element) in RRC message with easy to use graphical user interface. In an RRC testing, the auto IE response function is a very effective evaluation tool for the internal protocol procedure. This tool enables intelligent IE substitution (from received packet, parameter table, or auto generation) on outgoing packets and automates the time-consuming protocol evaluation. n the SDL engine, user definable variables and timers are also useful to make complicated test sequence. Furthermore, the U-plane test capability enables QoS measurement on BER (Bit Error Rate)/PER (Packet Error Rate) and on latency.

Traffic Generation from Micro to Macro

DuoSIM Manger offers a series of procedure oriented testing tools for C/U-plane performance evaluation. One of the most critical procedures for LTE eNB evaluation is RACH preamble. There are 64 possible preamble sequences in one radio subframe, and UE-SIM is capable of generating any types of the sequences to provide a complete RACH preamble testing (Figure 12). DuoSIM can also generate critical conditions with micro busty traffic on most, if not all, of important procedures on Uu and S1/X2 interfaces.

In terms of macro traffic stand point, Load Scheduler (Figure 13) is a powerful tool to discover unexpected problems that arise only in real traffic conditions, caused by resource (memory/radio resource table/connection table) leaking and changes in task priorities in protocol software processing. Statistic information is most important to understand the network performance. All the counts on C-plane and U-plane can be saved for long duration (i.e., 72 hours) and U-plane counts can be displayed per Cell, UE and Logical Channel.

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Ethernet

Spectra2

7 Artiza LTE Tester DuoSIM

Figure 14: NAS in C-plane Protocol Stack

Figure 17: 3GPP Protocol and IP Stack on Uu Interface

Figure 15: EMM/ECM (NAS) and RRC states

RRC

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UE

Uu S1-C

PDCP

PDCP

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PHY PHY

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ECM

RRC IDLE IDLECONNECTED CONNECTED

IDLE

Off Attachin ActiveIdle orRegistered

ConnectingTo EPC

EMM DEREGISTERD DEREGISTERD

CONNECTED

Figure 16: NAS/Application Layer Testing Configuration

RF Unit RF Unit

MME

P-GWEPCs

E-UTRAN

S5/S8

S1-C

UL RF

UL IQDL IQ

DL RF UL RFDL RF

eNB eNB

S1-U

X2

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Other Nodes Other Nodes Other Nodes

DuoSIM

AZP-600/1400

UL IQDL IQ

ApplicationLayerTester

UE-SIM

DuoSIM can be connected with legacy IP testers by Ethernet interface for Application Layer Testing as shown in Figure 16. It has great flexibility to control the external testers in precise timings. Scripting to control the IP tester can be embedded into any C-plane state in test sequences. In this way, existing resources can be fully utilized to extend the functionalities of DuoSIM.

NAS Simulation Features

Non Access Stratum (NAS) Simulation feature is a critical functionality of LTE UE Simulator. NAS is the signaling protocol terminates at the MME, and it is responsible for the generation and allocation of temporary identities of the UEs. NAS protocol is part of the RRC protocol of C-plane shown in Figure 14. This feature allows simulation of an environment that resembles the real-life operating conditions of the MME, S-GW and P-GW. NAS Testing Configurations with DuoSIM are shown in Figure 16.

Application Layer Testing Features

User’s IP traffic over U-plane is transmitted over PDCP layer in Uu Interface as shown in Figure 17. Real user data traffic can be very complex and unpredictable, but it is crucial to test these conditions before starting the services. An optional Application Layer Testing feature allows generation of application traffic (voice/data/video) from UE-SIM through the entire network nodes to application server at the end. This powerful feature can be used as one of the final acceptance test.

Massive UE Simulation

Once an eNB product has passed the functional and performance testing in the wrap-around configuration, the last step is the system performance testing. This is an effective tool to determine the final quality, and it has been used as an acceptance test by many LTE service operators. Artiza offers by far the highest level of LTE network system testing with Massive UE Simulation achieving the phenomenal capacity, 1,000 UEs per sector (6,000 UEs over 6 sectors) as shown in Figure 12. In order to perform LTE network system testing, Artiza Massive UE simulator supports not only simple NAS layer simulation but also with more complex handover scenarios. In addition, Application Layer Testing features are also supported. Artiza Massive UE simulator allows scripting to communicate with legacy IP testers to perform evaluation with voice, data, and video.

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8Artiza LTE Tester DuoSIM

DuoSIM-1000 Specification

Parameter Specification DescriptionChassis AZP-1400/600 Single ChassisNo. of sectors per chassis 3 sectors/chassis (AZP-1400) 1 sector/chassis (AZP-600) No. of sectors 6 sectors/system No. of UEs to simulate 1,000 UEs/sector Maximum 6,000 UEs/systemNo. of MMEs to simulate 8 One association/MMENo. of S-GWs to simulate 8 One IP/S-GWNo. of eNB to simulate 8 One association/eNBNo. of bearers to simulate 6 bearers/UE 36,000 bearers/systemNo. of GbE I/Fs 2 Including external I/FDL Throughput 150 Mbps/UE 900 Mbps/system UL Throughput 50 Mbps/UE 300 Mbps/system

DuoSIM-840 Specification

Parameter Specification DescriptionChassis AZP-1400/600 Single ChassisNo. of sectors per chassis 3 sectors/chassis (AZP-1400) 1 sector/chassis (AZP-600) No. of sectors 6 sectors/system No. of UEs to simulate 840 UEs/sector Maximum 5,040 UEs/systemNo. of MMEs to simulate 8 One association/MMENo. of S-GWs to simulate 8 One IP/S-GWNo. of eNB to simulate 8 One association/eNBNo. of bearers to simulate 6 bearers/UE 30,240 bearers/systemNo. of GbE I/Fs 2 Including external I/FDL Throughput 150 Mbps/UE 900 Mbps/system UL Throughput 50 Mbps/UE 300 Mbps/system

AZP Blades/Modules

Blade DescriptionAN2-B-CPU-01 CPU blade for system controlAN2-B-SW-01 Switching blade for sRIO (Serial Rapid I/O)AN2-M-PPC-01 GbE interface for data logging outAN2-B-BB-01 Baseband blade for Uu PHY processing of up to 400 UEsAN2-B-BB-02 Baseband blade for Uu PHY processing of up to 840 UEs – 1,000UEsAN2-B-PRM-01 S1/X2-SIM DSP bladeAN2-B-PRM-02 UE-SIM DSP bladeAN2-R-IQ-01 I/Q interface rear moduleAN2-R-CPRI-01 CPRI/OBSAI interface rear moduleDuoSIM-420 Specification

Parameter Specification DescriptionChassis AZP-1400/600 Single ChassisNo. of sectors per chassis 3 sectors/chassis (AZP-1400) 1 sector/chassis (AZP-600) No. of sectors 6 sectors/system No. of UEs to simulate 420 UEs/sector Maximum 2,520 UEs/systemNo. of MMEs to simulate 8 One association/MMENo. of S-GWs to simulate 8 One IP/S-GWNo. of eNB to simulate 8 One association/eNBNo. of bearers to simulate 6 bearers/UE 15,120 bearers/systemNo. of GbE I/Fs 2 Including external I/FDL Throughput 150 Mbps/UE 900 Mbps/system UL Throughput 50 Mbps/UE 300 Mbps/system

AZP-1400 Chassis Specification

Parameter DescriptionParameter DescriptionBase Design AdvancedTCA shelf 14 slotsPhysical Dimensions 483 mm (W) x 572 mm (H) x 507 mm (D) (with cable trays)Weight 30.6 kg (not including blades)Power Input voltage -40.5 VDC to -72 VDC Input power 25 A per power feed (total 4 + 4 power feeds) Overcurrent Protection 30 A Fuse on PEMEnvironmental Ambient temperature +10 C to +40 C Humidity +30 % to +80 %, no condensation

AZP-600 Chassis Specification

Parameter DescriptionParameter DescriptionBase Design AdvancedTCA shelf 6 slotsPhysical Dimensions 480 mm (W) x 222 mm (H) x 415 mm (D)Weight 14.7 kg (not including blades)Power Input voltage nominal 100 VAC to 240 VAC Input power max 20 A Overcurrent Protection 20 A Circuit breakerEnvironmental Ambient temperature +10 C to +40 C Humidity +30 % to +80 %, no condensation

UE-SIM PHY Specification

Parameter SpecificationDL/UL Duplex Mode FDD/TDD software selectableBaseband Implementation By FPGA/DSP with no ASSPFrequency Operation bands (FDD:1-14,17/TDD:33-40)System Bandwidth (DL/UL) 1.4/3/5/10/15/20 MHzModulation (DL/UL) QPSK/16QAM/64QAM (dynamically configurable)Multiple Access DL OFDMA UL SC-FDMA (DFT-Spread OFDM)Antenna DL Up to 2 x 2 UL 1 x 1Interface Analog IQ/RF (with RFunit)/CPRI (OBSAI in roadmap)Physical Channels DL Synchronization Signal/Reference Signal/ PBCH/PCFICH/PHICH/PDCCH/PDSCH UL Reference Signal(Demodulation)/ReferenceSignal(Sounding)/ PRACH/PUCCH/PUSCHDuoSIM-64 Specification

Parameter Specification DescriptionChassis AZP-600 Single ChassisNo. of sectors per chassis 1 sector/chassis No. of sectors 1 sector/system 1 sector/cellNo. of UEs to simulate 64 UEs/sector Maximum 64 UEs/systemNo. of MMEs to simulate 1 One association/MMENo. of S-GWs to simulate 1 One IP/S-GWNo. of eNB to simulate 1 One association/eNodeBNo. of bearers to simulate 8 bearers/UE 512 bearers/systemNo. of GbE I/Fs 1 Including external I/FDL Throughput 150 Mbps/UE 150 Mbps/system UL Throughput 50 Mbps/UE 50 Mbps/system

RF Unit (ANZ-S-RF-02) Specification

Parameter DescriptionPhysical Dimensions 430 mm (W) x 88 mm (H) x 430 mm (D)Weight 10 kg (2 Down Converters)Power 23.5 W (2 Down Converters)Environmental Ambient temperature +10 C to +40 C Humidity +30 % to +80 %, no condensationControl I/F Ethernet (IEEE802.3)Specification FDD/TDD SelectableUp Converter No. of Converters 1 Tx Frequency 700 MHz to 2700 MHz Channel Raster 100 kHz Occupied Bandwidth Maximum 20 MHz Max Average Tx Power 0 dBm Min Average Tx Power -74 dBm Input Interface Analog I/Q External Local Oscillator Input YesDown Converter No. of Converters 2 or 4 (for MIMO) Rx Frequency 700 MHz to 2700 MHz Channel Raster 100 kHz Occupied Freq Bandwidth Maximum 20 MHz Rx Sensitivity Less than -75 dBm Dynamic Range More than 75 dB Output Interface Analog I/Q External Local Oscillator Input Yes

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Revised July 1st 2011

Artiza Networks, Inc.

Global HeadquartersFaret Tachikawa Center Square, 2-36-2, Akebono-cho, Tachikawa-shi, Tokyo 190-0012, JapanE-mail: [email protected]: +81-42-529-3494

US Sales Office27034 Springcreek RoadRancho Palos Verdes, CA 90275E-mail: [email protected] Phone: +1 310-702-4608

Artiza is willing to providing the support to customer to optimize the effectiveness of your Artiza LTE eNB Load Tester. Please contact your sales representative for support details or e-mail your questions to [email protected]. We look forward to contact from you.

Customers can download software and technical support files by logging in to the secure section of our website.

Contact [email protected] for LTE eNB Evaluation Methodology.©2011 Artiza Networks Inc. Product Specification and descriptions in this document are subject to change without notice.

www.artizanetworks.com