Product Change Notice...NTC DRAM Product Discontinuance Information Contact Window ： MKT Consumer...
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Product Change Notice Product Change Information: The internal DDR of SQFlash 820 (-S) Series SATA III products will have lithography upgrade from current 42nm to 30nm. The new DDR will be implemented from 1 st July, 2014 (running change). Affected Parts SQFlash part numbers end up with –S8C, –S8E, –A8C, –A8E, with capacities are equal to or less than 128GB, and any of the customized products based on above parts. Description of Change: 1. Nanya has discontinued DDR3 42nm 2Gb X16 H-die product support from 07/01/2014, which is applied to SQFlash 820 series products with capacities are equal to or less than 128GB. (Appendix Nanya PCN) 2. New DDR has been fully tested and proved to function identically with old one, there’s no effect on reliability, performance, and compatibility. (Appendix reliability test report) Initiated by Precyan.Lee Job Title Emb’Core PM Release Date 2014-05-02 Reviewed by Job Title Revision #1.0 Approved by Ethan.Chen Job Title Emb’Core PM Release Status Formal Release
Transcript of Product Change Notice...NTC DRAM Product Discontinuance Information Contact Window ： MKT Consumer...
Product Change Notice
Product Change Information:
The internal DDR of SQFlash 820 (-S) Series SATA III products will have lithography upgrade from
current 42nm to 30nm. The new DDR will be implemented from 1st
July, 2014 (running change).
Affected Parts
SQFlash part numbers end up with –S8C, –S8E, –A8C, –A8E, with capacities are equal to or less
than 128GB, and any of the customized products based on above parts.
Description of Change:
1. Nanya has discontinued DDR3 42nm 2Gb X16 H-die product support from 07/01/2014,
which is applied to SQFlash 820 series products with capacities are equal to or less than
128GB. (Appendix Nanya PCN)
2. New DDR has been fully tested and proved to function identically with old one, there’s no
effect on reliability, performance, and compatibility. (Appendix reliability test report)
Initiated by Precyan.Lee Job Title Emb’Core PM Release
Date 2014-05-02
Reviewed by Job Title Revision #1.0
Approved by Ethan.Chen Job Title Emb’Core PM Release
Status Formal Release
Product / ProcessChange Notification
PCN # DN13601
Dear Customer, Please find the following PCN notification from Nanya Technology Corp.(NTC) Important information for your attention: Please feedback NTC your concern in writing. Lack of response by you after these 30 daysconstitutes acceptance of the change. After acceptance, Nanya Technology Corp. will consider that our customer agrees with the changes or additions and is willing to help NTC with a smooth transition. Your attention and response to this matter is greatly appreciated.
NTC DRAM Product Discontinuance Information Contact Window：
MKT Consumer Product promotion Dept.- Cindy Chen Tel： 886-3-3281688 ext : 6010 e-mail：Cindy Chen <[email protected]>
® NANYA TECHNOLOGY HWA-YA TECHNOLOGY PARK 669, FUHSING 3 RD. KYEISHAN, TAOYUAN TAIWAN R.O.C 1 / 2
Product / ProcessChange Notification
PCN # DN13601
Subject of change : DDR3 42nm 2Gb X16 H-die product EOL. PCN Category : Product Discontinuance Change Purpose : Nanya will discontinue DDR3 42nm 2Gb X16 H-die product support from 07/01/2014. Change Description: DDR3 42nm 2Gb X16 H-die product EOL. Successor product is DDR3 30nm 2Gb F-die product. Change Evaluation Result : Please customer feedback supporting demand forecast. Products Affected :
Implementation/ Effective Schedule :(MM/DD/YYYY) Last buy date：03/31/2014 Last ship date：06/30/2014
® NANYA TECHNOLOGY HWA-YA TECHNOLOGY PARK 669, FUHSING 3 RD. KYEISHAN, TAOYUAN TAIWAN R.O.C 2 / 2
Customer : Approval :
Technology Config. Voltage Part Number Successor of Nanya PN
NT5CB128M16HP-CG -
NT5CB128M16HP-DI NT5CB128M16FP-DI
NT5CB128M16HP-EK NT5CB128M16FP-EK
NT5CB128M16HP-CGI -
NT5CB128M16HP-DII NT5CB128M16FP-DII
NT5CC128M16HP-CG -
NT5CC128M16HP-DI NT5CC128M16FP-DI
42 nm, H die X16
1.5V
1.35V
Drawings and specifications herein are property of Advantech and shall not be reproduced or copied or used without prior written permission.
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SQFlash 820 Series
New DDR Qualification Report
Initiated by Precyan.Lee Job Title Emb’Core PM Release
Date 2014-04-28
Reviewed by Job Title Revision #1.0
Approved by Ethan.Chen Job Title Emb’Core PM Release
Status Formal Release
Drawings and specifications herein are property of Advantech and shall not be reproduced or copied or used without prior written permission.
Page 2 of 11
Revision History:
Revision
Date Revision Description
2014/04/28 1.0 First version released
Drawings and specifications herein are property of Advantech and shall not be reproduced or copied or used without prior written permission.
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TABLE OF CONTENTS
1. Product Information ........................................................................... 4
2. Result Overview ................................................................................. 4
3. Test Items vs. Conditions .................................................................. 5
3.1 High Temperature Storage Test ......................................................................................... 5
3.2 High Temperature Operation Test ...................................................................................... 6
3.3 Low Temperature Storage Test .......................................................................................... 7
3.4 Low Temperature Operation Test ....................................................................................... 8
3.5 Temperature & Humidity Storage Test ............................................................................... 9
3.6 Temperature & Humidity Operation Test .......................................................................... 10
3.7 Temperature Cycling Operation Test ................................................................................ 11
Drawings and specifications herein are property of Advantech and shall not be reproduced or copied or used without prior written permission.
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1. Product Information
Product Name SQF-S25M8-128G-S8E
DDR Type DDR3, NT5CB128M16FP-DII, I-grade, 30nm
2. Result Overview
Test Item Sample Size Test Result
1 High Temperature Storage Test 3 Pass
2 High Temperature Operation Test 3 Pass
3 Low Temperature Storage Test 3 Pass
4 Low Temperature Operation Test 3 Pass
5 Temperature & Humidity Storage Test 3 Pass
6 Temperature & Humidity Operation Test 3 Pass
7 Temperature Cycling Operation Test 3 Pass
Drawings and specifications herein are property of Advantech and shall not be reproduced or copied or used without prior written permission.
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3. Test Items vs. Conditions
3.1 High Temperature Storage Test
Purpose:
To verify the storage ability of SQF-S25 820 SSD at high temperature environment
Test Condition(s):
Temperature: 85℃
Duration: 168HRS
DUT State: Storage
Quantity: 3 PCS
Temperature & Humidity Equipment: KSON-THS-A4T
Laboratory Ambience: 23±3℃, 50%±3%(RH)
Pass/Fail Criteria:
1. To ensure that no abnormalities with physical appearance are found or any electrical function
failures are detected
Test Result:
Sample No. Sample 1 Sample 2 Sample 3
Appearance Pass Pass Pass
Function Pass Pass Pass
Test Setup:
Drawings and specifications herein are property of Advantech and shall not be reproduced or copied or used without prior written permission.
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3.2 High Temperature Operation Test
Purpose:
To verify the operation ability of SQF-S25 820 SSD at high temperature environment.
Test Condition(s):
Temperature: 85℃
Duration: 72 HRS
DUT State: Operation
Quantity: 3 PCS
Temperature & Humidity Equipment: KSON-THS-A4T
Laboratory Ambience: 23±3℃, 50%±3%(RH)
Pass/Fail Criteria:
1. To ensure that no abnormalities with physical appearance are found or any electrical function
failures are detected
Test Result:
Sample No. Sample 1 Sample 2 Sample 3
Appearance Pass Pass Pass
Function Pass Pass Pass
Test Setup:
Drawings and specifications herein are property of Advantech and shall not be reproduced or copied or used without prior written permission.
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3.3 Low Temperature Storage Test
Purpose:
To verify the storage ability of SQF-S25 820 SSD at low temperature environment.
Test Condition(s):
Temperature: -40℃
Duration: 168 HRS
DUT State: Storage
Quantity: 3 PCS
Temperature & Humidity Equipment: KSON-THS-A4T
Laboratory Ambience: 23±3℃, 50%±3%(RH)
Pass/Fail Criteria:
1. To ensure that no abnormalities with physical appearance are found or any electrical function
failures are detected
Test Result:
Sample No. Sample 1 Sample 2 Sample 3
Appearance Pass Pass Pass
Function Pass Pass Pass
Test Setup:
Drawings and specifications herein are property of Advantech and shall not be reproduced or copied or used without prior written permission.
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3.4 Low Temperature Operation Test
Purpose:
To verify the operation ability of SQF-S25 820 SSD at low temperature environment.
Test Condition(s) :
Temperature: -40℃
Duration: 72 HRS
DUT State: Operation
Quantity: 3 PCS
Temperature & Humidity Equipment: KSON-THS-A4T
Laboratory Ambience: 23±3℃, 50%±3%(RH)
Pass/Fail Criteria:
1. To ensure that no abnormalities with physical appearance are found or any electrical function
failures are detected
Test Result:
Sample No. Sample 1 Sample 2 Sample 3
Appearance Pass Pass Pass
Function Pass Pass Pass
Test Setup:
Drawings and specifications herein are property of Advantech and shall not be reproduced or copied or used without prior written permission.
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3.5 Temperature & Humidity Storage Test
Purpose:
To verify the storage ability of SQF-S25 820 SSD at both high temperature and humidity environment.
Test Condition(s):
Temperature: 55℃
Humidity: 95%
Duration: 96 HRS
DUT State: Storage
Quantity: 3 PCS
Temperature & Humidity Equipment: KSON-THS-A4T
Laboratory Ambience: 23±3℃, 50%±3%(RH)
Pass/Fail Criteria :
1. To ensure that no abnormalities with physical appearance are found or any
Test Result:
Sample No. Sample 1 Sample 2 Sample 3
Appearance Pass Pass Pass
Function Pass Pass Pass
Test Setup:
Drawings and specifications herein are property of Advantech and shall not be reproduced or copied or used without prior written permission.
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3.6 Temperature & Humidity Operation Test
Purpose:
To verify the operation ability of SQF-S25 820 SSD at both high temperature and humidity environment.
Test Condition(s):
Temperature: 55℃
Humidity: 95%
Duration: 72 HRS
DUT State: Operation
Quantity: 3 PCS
Temperature & Humidity Equipment: KSON-THS-A4T
Laboratory Ambience: 23±3℃, 50%±3%(RH)
Pass/Fail Criteria:
1. To ensure that no abnormalities with physical appearance are found or any electrical function
failures are detected
Test Result:
Sample No. Sample 1 Sample 2 Sample 3
Appearance Pass Pass Pass
Function Pass Pass Pass
Test Setup:
Drawings and specifications herein are property of Advantech and shall not be reproduced or copied or used without prior written permission.
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3.7 Temperature Cycling Operation Test
Purpose:
To verify whether a constant thermal change environment affects the physical appearance and functions of
a device or not.
Test Condition(s):
Temperature: -40℃ ~ 85℃
Rise/Drop Rate: 1℃/Min.
Duration:
-40℃ for 30 minutes
85℃ for 30 minutes
No. of Cycles: 20
DUT Status: Operation
Quantity: 3 PCS
Temperature & Humidity Equipment: KSON-THS-A4T
Laboratory Ambience: 23±3℃, 50%±3%(RH)
Pass/Fail Criteria:
1. To ensure that no abnormalities with physical appearance are found or any electrical function
failures are detected
Test Result :
Sample No. Sample 1 Sample 2 Sample 3
Appearance Pass Pass Pass
Function Pass Pass Pass
Test Setup:
