Plato Probe

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PLATO | PROBE “It is now possible for a Langmuir probe to measure the uniformity of plasma characterisations in plasmas with high deposition rates, such as plasma enhanced chemical deposition (PECVD)”

description

The Plato Probe is a process compatible plasma measurement system, designed to work in deposition plasmas when an insulating film is deposited on the probe surface. This probe can remain inside a plasma reactor while highly reactive insulating gasses are in use. The Plato Probe measures plasma parameters such as plasma density, ion current density and electron temperature in plasmas with high deposition rates, like plasma enhanced chemical vapour deposition (PECVD). The Plato Probe has the most advanced patented technology on the market using ultra-fast biasing to penetrate the deposited film to obtain accurate measurements of the real plasma parameters in a wide range of plasma applications. The Plato Probe is used to establish plasma process repeatability, even in reactive gas plasma. It is the perfect instrument to understand plasma changes and the impact on surface treatment. The Plato Probe is an essential plasma process diagnostic to understand the correlation between plasma inputs and the plasma state in environments with a high rate of deposition.

Transcript of Plato Probe

Page 1: Plato Probe

PLATO | PROBE

“It is now possible for a Langmuir probe to measure the uniformity of plasma

characterisations in plasmas with high deposition rates, such as plasma enhanced

chemical deposition (PECVD)”

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PLATO | PROBE

The Plato Probe is a planar Langmuir Probe for deposition

plasma when an insulating film is deposited on the probe surface. The probe can remain inside a

plasma reactor while aggressive insulating gasses are in use.

The Plato Spatial Probe scans across the bulk of a plasma

using an automated linear drive and measures the parameters at

different locations even when depositing an insulating layer up

to 100 microns thick on the probe surface.

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Plasma Diagnostics MeasuredPlasma Density • Ion Current Density

Electron Temperature

Measurement FunctionalityTime Averaged • Time Resolved • Time Trend

HardwareElectronics and Software

Voltage Scan Range: -40V to +40VCurrent Range: 10µA to 100mA

Time Resolution: 1µS

Probes300mm as standard (Custom available)

Chemically cleaned and replaceable

Spatial MovementAutomated linear drive with a 0.025mm step resolution

Vacuum FeedthroughAvailable with KF, CF or custom vacuum connectors

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Installation Setup

Generator Match Plato Electronics

Plasma Reactor

Plato Probe Computer

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How It Works

The probe is biased with an AC potential rather than the standard

DC potential

The AC bias couples through any deposited layer

When the potential is negative it collects ion current and when

positive it collects electron current

The AC current and voltage waveforms are measured and used

to calculate the standard IV characteristic

The IV characteristic is analysed in the normal way

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Typical Results

CCP Argon / 2PaNe= 1.2x1015 m-3

Te= 2.3eVAs layer capacitance decreases,

RF voltage drop increases

-35 -30 -25 -20 -15 -10 -5 0 5 10 15

-0.00004

-0.00002

0

0.00002

0.00004

0.00006

0.00008

0.0001

0.00012

0.00014

0.00016

10 Micron Layer Solid Line 200kHz; Dashed Line

400kHz

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Applications

As a probe for deposition plasmas, the Plato System assesses plasma characterisations such as plasma enhanced chemical vapour deposition

(PECVD), plasma density, ion current density, & electron temperature in the bulk of the plasma.

The Plato System can be used in the following applications:Dusty Plasma

Plasma EtchingHiPIMS Plasma

PECVD Space Plasma

Plasma Sputtering

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For further information on the Plato Probe System visitimpedans.com/plato-spatial-probe

To request a quote visitwww.impedans.com/contact

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Chase HouseCity Junction Business Park

Northern CrossMalahide Road

Dublin 17Ireland

Ph: +353 1 842 8826Fax: +353 1 891 6519

Web: www.impedans.comEmail: [email protected]