PhID Efficiency Measurementusing Rad-Z (Z-mass) method

Kunlin Ran2, Shuo Han2, Jingyi Liu2, Yanping Huang2, Shan Jin1, Zihang Jia1,2 1Nanjing University, China

2Institute of High Energy Physics, Chinese Academy of Science

7/5/19 phID efficeincy_Radiative Z_Z mass !1

!2

Sample Status

Powheg Zee Powheg Zmumu

SherpaCT10 eegamma SherpaCT10 mumugamma

Sherpa221 Zee Sherpa221 Zmumu

SherpaCT10 tautaugamma Powheg Ztautau

Powheg WZ MadGraph ttgamma Sherpa221 Ztautau

List of reco.AOD (Full Mc16a-Mc16e, Only Mc16a-Mc16d)

Need to ask: Why are there no mc16e for ll+gamma?

EGAM3 unskimmed: https://prodtask-dev.cern.ch/prodtask/inputlist_with_request/25575/EGAM4 unskimmed: https://prodtask-dev.cern.ch/prodtask/inputlist_with_request/25576/EGAM3 skimmed: https://prodtask-dev.cern.ch/prodtask/inputlist_with_request/25577/EGAM4 skimmed: https://prodtask-dev.cern.ch/prodtask/inputlist_with_request/25578/

• data15: https://prodtask-dev.cern.ch/prodtask/inputlist_with_request/25354/• data16: https://prodtask-dev.cern.ch/prodtask/inputlist_with_request/25355/• data17: https://prodtask-dev.cern.ch/prodtask/inputlist_with_request/25356/• data18: https://prodtask-dev.cern.ch/prodtask/inputlist_with_request/25357/

!3

Eta bin 1-4 Pt bin 1 Unconverted

Upper: Muon Lower: Electron

CR

Data, MC signal, additional bkgs are from CR, Z+jets is from SR.

!4

Z+jets vs. CR

The CR definition needs improvement.

additionally, Z+jets shapes in SR and NR are similar. So we can use the same CR to replace this component before/after ID cut.

!5

CR

CR: fail tight identification & fail tight isolation

CR_loose: fail tight identification & fail tight isolation & loose isolation CR_lT: fail tight identification & tight isolation & fail loose isolation CR_LT: fail tight identification & tight isolation & loose isolation

SR

CR

T_iso !T_iso

T_ID

!T_ID

T_iso !T_iso

L_iso

!L_iso

3701

9209361

981

CR_lT

CR_loose

CR_LT

!6

CR_loose

!7

CR_lT

The peak is still not obvious, especially when statistics are low. — over subtraction?

CR data = data - MC signal - additional bkgs

!8

Summary

TO DO • Check CR definition. • Run DAOD samples when they are ready.

• Add tautaugamma samples when they are ready.

• Use finer eta binning, when full samples are ready.

!9

Back-up

!10

Old method

!11

New method

MC16d in SR. Fixed fractions from numbers of events.

Data - (MC signal) - (additional bkgs) in CR.

Model = Signal + CR + Bkgs Floating fractions.

!12

pT bin 1 Eta bin 1

Upper: Electron Lower: Muon

Better agreement than before.

Before ID After ID

!13

Efficiency (%) Eta 1 Eta 2 Eta 3 Eta 4

ConvertedpT bin1 45.0 1.1 37.8 1.0 46.9 1.7 47.5 1.6pT bin2 60.6 1.5 54.9 1.3 63.6 2.1 73.5 2.1pT bin3 74.9 2.1 65.2 2.1 67.1 3.3 70.2 3.2

UnconvertedpT bin1 49.9 0.5 47.9 0.5 52.3 1.3 56.0 1.1pT bin2 66.2 0.7 68.4 0.7 66.2 1.7 61.5 1.6pT bin3 75.4 1.0 73.7 1.0 73.1 2.7 78.1 2.3

ConvertedpT bin1 47.0 0.7 41.1 0.6 45.8 0.9 48.9 0.8pT bin2 60.3 0.8 57.5 0.6 61.3 1.0 70.4 0.9pT bin3 72.9 0.9 62.9 0.8 74.5 1.1 76.7 1.0

UnconvertedpT bin1 50.5 0.3 47.7 0.3 49.1 0.7 57.1 0.5pT bin2 66.1 0.4 64.2 0.3 65.5 0.8 58.8 0.7pT bin3 76.7 0.4 75.5 0.4 74.6 0.9 79.8 0.7

!14

DAOD DAOD empty DAOD AOD

DAOD AOD

Mc16aCT10 EGAM3 tautaugamma Additional bkg

EGAM4 tautaugammaAdditional bkg

EGAM4 tautaugamma

Mc16d CT10 EGAM3 tautaugamma EGAM4 tautaugamma EGAM4 tautaugamma

Mc16e

222 sig CT10 sig

222 tautaugamma bkg

Additional bkg

CT10 tautaugamma (mc16e)

SolutionThere’re no EGAM4 tautaugamma samples?

Availability