Overview of Free & Commercial Patent Databases › tisc › en › ppt › Philippines ›...

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Overview of Free & Commercial Patent Databases Cebu and Manila March 7 to 11 2011 Andrew Czajkowski Head, Innovation and Technology Support Section

Transcript of Overview of Free & Commercial Patent Databases › tisc › en › ppt › Philippines ›...

Page 1: Overview of Free & Commercial Patent Databases › tisc › en › ppt › Philippines › overview_of_DBs.pdf · Overview of Free & Commercial Patent Databases Cebu and Manila March

Overview of Free & Commercial

Patent DatabasesCebu and Manila

March 7 to 11

2011

Andrew Czajkowski

Head, Innovation and Technology Support Section

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Overview

Free Patent Databases – focus on WO, EP, JP and US

Coverage

Search tools and functions

Interfaces (layout and languages)

Search operators (e.g. Boolean)

Language tools (e.g. translation)

Analysis tools (statistical and graphical)

Commercial Patent Databases

Coverage and main features

[ASPI]

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Databases : Differences

Patents

Free of charge

Commercial

Scientific & Technical Journals

Open Access

Subscription

Search Strategy

Keywords

Patent Classification, indexing, etc.

Search tools

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Finding free-of-charge patent information

PATENTSCOPE® search service

esp@cenet

JPO IPDL

USPTO PatFT/AppFT

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Coverage : Differences

Patent collectionsWhich countries or regions?

Document typesPatent applications? Granted patents? More?

Document elementsBibliographic data? Descriptions? Claims?

Time period

LanguagesMultiple language versions? Translations?

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Patent databases : Collections

PATENTSCOPE® search service :

PCT � First publication worldwide

ARIPO, Argentina, Brazil, Cuba, Korea, Israel, Mexico, Morocco, Singapore, South Africa, Spain, and Viet Nam

esp@cenet :

European (EP)

PCT

EPC member states and others (> 80 countries)

JPO IPDL :

Japan only

USPTO PatFT/AppFT :

United States only

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PATENTSCOPE® search service : Coverage

All PCT applications from 1978

Titles (EN and FR) : from 1978

Abstracts (EN and FR) : from 1978

Int. Cl. : from 1978

Full-text : from 1978

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Coverage: Details

xxxArgentina(2003-2010)

xxxARIPO(1984-2008)

Title Abstract Full text IPC

PCT(1978-2011)

x x ~90% x

EPO(1984-2008)

x ~95% ~50% x

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Coverage: Details

~75%~75%xxCuba(1968-2009)

IPCFull textAbstractTitle

Brazil(1972-2010)

x ~30% ~30% ~90%

Colombia(1995-2010)

x x x

Costa Rica(2009-2010)

x x X

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Coverage: Details

x~70%xxMexico(1991-2010)

x~70%~20%xMorocco(1977-2010)

xxGuatemala(1961-2010)

~50%~60%~5%xIsrael

(1940-2010)

Title Abstract Full text IPC

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Coverage: Details

xxxRepublic of

Korea(1973-2010)

~80%xSingapore(1995-2010)

xxxPanama(2003-2010)

xxxPeru(1989-2010)

Title Abstract Full text IPC

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Coverage: Details

x~50%~70%xSpain(1930-2010)

x~75%~75%xSouth

Africa(1984-2008)

~85%~90%xUruguay(1990-2010)

x~70%xViet Nam(1997-2010)

Title Abstract Full text IPC

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esp@cenet : Coverage

All EP applications from 1978

Titles (EN and original) : from 1978

Abstracts (EN and original) : from 1978

Int. Cl. : from 1978

EP Cl. (ECLA) : from 1978

Full-text : from 1978

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esp@cenet : Coverage

Other collections vary in availability

Titles (EN and original) : various

Abstracts (EN and original) : various

Int. Cl. : various

EP Cl. (ECLA) : various

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esp@cenet : Coverage

CN coverage

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esp@cenet : Coverage

GB coverage (☺)

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esp@cenet : Coverage

IT coverage (�)

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USPTO PatFT/AppFT : Coverage

Granted US patents from 1790 (PatFT)

Published US applications from 2001 (AppFT)

Titles (EN) : from 1976

Abstracts (EN) : from 1976

Int. Cl. : from 1976

US Cl. : from 1790

Full-text : from 1976

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USPTO PatFT/AppFT Search

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JPO IPDL : Coverage

JP patent specifications from 1885

Examined JP applications from 1922

Published JP applications from 1975

Granted JP patents from 1996

Titles (EN) : from 1976

Abstracts (EN) : from 1976 � Patent Abstracts of Japan (PAJ)

JP Cl. (FI/F-terms) : from 1885

Full-text : from 1993

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Search tools and functions: Differences

Interfaces (layout and languages)

Search operators

Search tools

Analysis tools

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Interfaces

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Interfaces : Simple

Search in front page or all fields

Search in all fields, full text, ID/Number, classification, names, or date

Select collections to be searched

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Interfaces : Field Combination

Search a full range of fields (and add additional fields)

Combine fields using Boolean operators (AND, OR)

Exclude (or require) empty fields

Stem search terms automatically

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Interfaces : Advanced

Search a range of fields (using field codes)

Combine search terms using a powerful set of Boolean, proximity, and range operators

Stem search terms automatically

Select collections to be searched

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Interfaces : Cross-lingual (CLIR)

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PATENTSCOPE® : Advanced search – field codes

Serial numbers

Titles

Abstract

Patent classification

Dates

Applicant data

Inventor data

Legal data

Language

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esp@cenet : Quick search

Search in full-text (EP and WO applications only)

Search in title/abstract or applicant/inventor (all other collections)

Select collections to be searched (WO or EP or all)

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esp@cenet : Advanced search

Search in multiple fields simultaneously

Note: Full-text search for EP and WO applications only

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esp@cenet : Smart search

Search a range of fields (using field codes)

Combine search criteria using Boolean operators

Feature: If fields are not defined, the system attempts to identify the correct field for each given search term (e.g., “Smith”automatically searched in inventor name)

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JPO IPDL : Advanced search

Search in a range of fields (in Japanese only)

Combine search criteria with Boolean operators

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JPO IPDL : Patent Abstracts of Japan (PAJ)

Search English-language applicant names, titles and abstracts and by publication date and IPC

Combine up to three text search terms with Boolean operators

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JPO IPDL : PAJ Records

(Machine assisted) human translations into English of some but not all Japanese applications filed since 1976

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USPTO PatFT/AppFT : Quick Search

Search a range of fields

Combine up to two fields using Boolean operators

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USPTO PatFT/AppFT : Advanced Search

Search in numerous fields (using field codes)

Combine search criteria using Boolean operators

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USPTO PatFT/AppFT : Number Search

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Operators

Boolean (or logical)

Proximity

Wildcard

Special

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Flexibilities : Operators

Boolean operators : AND, OR, ANDNOT

Proximity operators : NEAR, "term1 term2"~n

Range operators : [term1 TO term2], ->

Wildcard operators : ? , *, $

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Boolean & Proximity operators

PATENTSCOPE® search service

AND : both terms

OR : either term

ANDNOT : not term after operator

NEAR : 5 characters default separation (metal NEAR tool)

esp@cenet : AND, OR

JPO IPDL : AND, OR

USPTO : AND, OR, ANDNOT

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Patent databases : Wildcard operators

Between zero and infinite characters

PATENTSCOPE® : *

esp@cenet : *

JPO IPDL : automatic

USPTO : $

Exactly one character

PATENTSCOPE® : ?

esp@cenet : #

Zero or one character

esp@cenet : ?

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Patent databases : Special operators

PATENTSCOPE® search service

Date and number ranges : ->

Date and number ranges : [xxx TO yyy]

Search term weighting : ^

USPTO

Date ranges : ->

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PATENTSCOPE® : Relevance weighting

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Relevance weighting

“air condition” vehicle solar “air condition” vehicle^5 solar

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CLIR – Cross-Lingual Information Retrieval

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Interfaces : Cross-lingual (CLIR)

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Interfaces : Cross-lingual (CLIR)

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Interfaces : Cross-lingual (CLIR)

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CLIR – Cross-Lingual Information Retrieval

Page 49: Overview of Free & Commercial Patent Databases › tisc › en › ppt › Philippines › overview_of_DBs.pdf · Overview of Free & Commercial Patent Databases Cebu and Manila March

CLIR – Cross-Lingual Information Retrieval

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Google Translation . Abstracts

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Google Translation . Abstracts

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Google Translation : Description and claims

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Google Translation : Description and claims

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esp@cenet : Machine translation

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esp@cenet : Machine translation

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JPO IPDL : Machine Translation

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JPO IPDL : Machine Translation

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PATENTSCOPE® : Results analysis

Analyze search results (nearly) instantaneously

By office, IPC, applicant, inventor, and publication date

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PATENTSCOPE® : Results analysis

By office

By IPC

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PATENTSCOPE® : Results analysis

By main applicant (and publication year)

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PATENTSCOPE® : Results analysis

By applicant (bar)

By applicant (pie)

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PATENTSCOPE® : Related documents

For all collectionsPublished documents

For PCTSearch reports (prior art)Written opinions and preliminary examination reports (patentability)Most documents from the PCT international phase

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PATENTSCOPE® : National phase entry data

3.5 million notifications from 36+ offices

Legal status (where available)

Internet hyperlinks to certain offices (further status information, translations, etc)

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esp@cenet : INPADOC legal status

Notifications from around 70 offices worldwide

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JPO IPDL : Legal status search

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USPTO : Patent Application Information Retrieval (PAIR)

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esp@cenet : Patent families

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esp@cenet : Citations

Backward citations (to earlier documents)

Forward citations (from later documents)

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Major Providers & Patent Databases

TotalPatent

Patbase

Dialog

Orbit

STN, CAS

Thomson Innovation

WIPS Global

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Advantages of commercial databases

“Value-added” data

Corrected bibliographic data

Enhanced title and abstract

Improved classification/indexing

Sophisticated search and analysis tools

Chemical formula / sequence search tools

Patent topographical maps

Citation analysis

Semantic search

Provide integrated access to multiple sources of patent and non-patent literature (NPL)

Page 71: Overview of Free & Commercial Patent Databases › tisc › en › ppt › Philippines › overview_of_DBs.pdf · Overview of Free & Commercial Patent Databases Cebu and Manila March

Example of value-added features : Thomson Reuters - DWPI

Derwent World Patents Index® (DWPI)

Bibliography for 43 patent issuing authorities

Detailed information from 10 authorities

Enhanced abstracts and titles

Derwent classification and subject indexing

Classification codes include reformed IPC, ECLA, ICO, NCL, and F-terms

Patent Assignee Codes (PACO)

Dates back to 1963

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Example of Value-added features: STN

Cross-content search of patent and non-patent data

Additional classification and abstracts (DerwentWorld Patent Index)

Additional chemistry metadata (MARPAT, CAPlus)

Chemical structure import and search

Search index viewer

Customized search term highlighting in results

Patent family grouping

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Example of semantic search: LexisNexis TotalPatent

Semantic Searching: Identifies key concepts from entered text

Proposes related terms, weighted by relevance

Users choose or remove suggested terms

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74

Links to:

• Citation tree

• Family status

• Full text

• Classification

• Esp@cenet

• Register

• Click to order

• PDF

Example of visualization/analysis tools: Minesoft PatBase

Hit View provides additional links

Page 75: Overview of Free & Commercial Patent Databases › tisc › en › ppt › Philippines › overview_of_DBs.pdf · Overview of Free & Commercial Patent Databases Cebu and Manila March

Example of visualization/analysis tools: Questel Orbit.com

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Examples of Chemical Search Databases

STN

CA/CAplus

CASREACT

CAS REGISTRYSM

MARPAT

Derwent World Patents Index® (DWPISM)

Questel, Merged Markush Service

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Examples of Sequence Search Databases

GenomeQuest - "The first intranet sequence search engine with percent identity and biological searching. GenomeQuest works similar to premier web search engines, rapidly bubbling relevant records to the top. The software automates the reporting of the most important and relevant matches, minimizing tedious research, while providing advanced search algorithms so no relevant sequences are ever missed.”

STNDGENE(Thomson Reuters GENESEQTM):USGENE® (The USPTO Genetic Sequence Database)PCTGEN (WIPO/PCT Patent Application Biosequences, the complete collection of e-published sequences from WIPO)CAS REGISTRYSM (Chemical Abstracts Service REGISTRY, worldwide value-added patent and non-patent sequence data)

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Access to Specialized Patent Information (ASPI)

Public-private partnership with 6 commercial patent database providers: LexisNexis, Minesoft, ProQuest, Questel, Thomson Reuters and WIPS

IPO/institution to choose which database suits its needs best

[Negotiations for preferential access costs for non-ASPI eligible countries]

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Access to Specialized Patent Information (ASPI)

http://www.wipo.int/patentscope/en/programs/aspi/index.html

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ASPI Databases

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Summary : Key points

No search service or database exists that comprehensively covers all patent information (yet)

Search services and databases differ in the search and analysis features they offer

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Thank you for your attention!

[email protected]

Page 83: Overview of Free & Commercial Patent Databases › tisc › en › ppt › Philippines › overview_of_DBs.pdf · Overview of Free & Commercial Patent Databases Cebu and Manila March

Websites : Free-of-charge patent databases

WIPO (PATENTSCOPE® search service)http://www.wipo.int/patentscope/search/en/search.jsfEPO (esp@cenet)http://ep.espacenet.com/JPO IPDLhttp://www.ipdl.inpit.go.jp/USPTOhttp://patft.uspto.gov/And many morehttp://www.wipo.int/patentscope/en/search/national_databases.html

Page 84: Overview of Free & Commercial Patent Databases › tisc › en › ppt › Philippines › overview_of_DBs.pdf · Overview of Free & Commercial Patent Databases Cebu and Manila March

Websites: Commercial patent databases

Dialog http://www.dialog.com/

PatBase http://minesoft.com/patbase.asp

Questal http://www.questel.orbit.com/

STN http://www.cas.org/support/stngen/index.html

Thomson Innovation www.thomsoninnovation.com

Total Patent http://lexisnexis.com/ip/totalpatent/

WIPS http://wipsglobal.com