RUSSIA, Saint Petersburg

Saint Petersburg Electrotechnical University «LETI»

THE 11th INTERNATIONAL WORKSHOP ON THE ELECTROMAGNETIC COMPATIBILITY OF INTEGRATED CIRCUITS

PROGRAMME4-8

July, 2017

EMC Compo 2017

WWW.EMCCOMPO2017.ELTECH.RU

Contact Us: IRVC.eltech@mail.ru

Celebrating 120th anniversary of the world first radiogram being sent

Tue. 4 July

5 building, conference hall 10:00 - 11:00 Participant Registration

11:00 - 11:10 Welcome speech by EMC Compo TPC (Etienne Sicard)11:10 - 11:20 Welcome speech by ETU (Mikhail Shestopalov)11:20 - 12:20 Keynote Speech by Prof. Etienne Sicard (in cooperation with Massiva Zouaoui, Henri Braquet)Impact of NFSI on the clock circuit of a Gigabit Ethernet switch12:20 - 13:20 Keynote Speech by Prof. Alex Yakovlev (in cooperation with Milos Krstic, Xin Fan, Milan Babic, Eckhard Grass, Tobias Bjerregaard)Reducing Switching Noise Effects by Advanced Clock Management

13:20 - 14:20 Lunch

14:20 - 15:00 Special talk by Jose CarracosaSEAMCAT - Spectrum Engineering Advanced Monte Carlo Analysis Tool

15:00 - 16:00 Technical section «EMC-aware Design and Guidelines»15:00 - 15:20 Lammert Duipmans, Dusan Milosevic, Arnoud van der Wel, Peter BaltusIdentifying EMC-critical devices by monitoring and classifying operating region transitions15:20 - 15:40 Volha Subotskaya, Emanuele Bodano, Bernd DeutschmannAdaptive Current Source Driver for High-Frequency Boost Converter15:40 - 16:00 Martorell Alexandre, Raoult Jeremy, Marijon Robin, Chusseau LaurentEMI functional vulnerability identification in RF Front-Ends

16:00 - 16:20 Coffee-break

16:20 - 17:40 Technical section «EMC of Digital ICs»16:20 - 16:40 Chaimae Ghfiri, Alexandre Boyer, Andre Durier, Sonia Ben DhiaMethodology of modeling of the internal activity of a FPGA for conducted emission prediction purpose16:40 - 17:00 Paulo R. C. Villa, Roger C. Goerl, Fabian Vargas, Nilberto Heder Medina, Nemitala Added, Vitor A. P. De Aguiar, Eduardo L. A. Macchione, Fernando Aguirre, Marcilei A. G. Da Silveira, Eduardo BezerraAnalysis of ProASIC3 FPGA SEU-Sensitivity to Combined Effects of Conducted-EMI and TID

17:00 - 17:20 Mario Auer and Timucin KaracaDigitally Assisted EMI-Reduction Techniques for Class-D Amplifiers with Digital Control17:20 - 17:40 Bernd Deutschmann, Bernhard Auinger, Gunter WinklerSpread Spectrum Parameter Optimization to Suppress Certain Frequency Spectral Components

17:40 - 18:40 Visit to the A. Popov's Laboratory & Appartment Museum

18:40 - 20:00 Welcome reception

5 building, conference hall 10:00 - 11:20 Technical section «EMC of Transceiver ICs»10:00 - 10:20 Matthieu Deloge, Jaume Tornila Oliver, Hans Brekelmans, Peter Vermeeren, Gert Jan Bollen, Arnoud van der Wel, Gerald Kwakernaat, Adrien Schoof A Time-Continuous Bus-Feedback LIN Transceiver in 0.14 ìm High-Voltage SOI CMOS10:20 - 10:40 Kohki Taniguchi, Makoto Nagata, Akihiro Tsukioka, Daisuke Fujimoto, Noriyuki Miura, Takao Egami, Rieko Akimoto, Kenji Niinomi, Terumitsu Komatsu, Yoshinori Fukuba, Atsushi TomishimaSusceptibility Evaluation of CAN Transceiver Circuits with In-Place Waveform Capturing under RF DPI10:40 - 11:00 Kamel Abouda, Adrien Doridant, Bertrand Vrignon, Nicolas Baptistat, Matthieu AribaudImproving Electro-Magnetic Susceptibility performances of high side switches Case of High Side of LIN Physical Layers11:00 - 11:20 M. Burak Baran, Hugo Pues, Kristof Stijnen, Wim DehaeneEMI Resisting Low-EME SENT Drivers in 0.18ìm CMOS

11:20 - 11:40 Coffee break

11:40 - 13:20 Technical section «Measurement and Modelling of IC EMC»11:40 - 12:00 Sebastien Serpaud, Alexandre Boyer, Chaimae GhfiriProposal for combined conducted and radiated emission modeling for Integrated Circuit12:00 - 12:20 Matteo Vincenzo Quitadamo, Franco FioriA New Approach to Characterize Complex ICs in Terms of Scattering Parameters

Wed. 5 July

12:20 - 12:40 Anna Richelli, Luigi Colalongo, Lorenzo Toninelli, Ion Rusu, Jean-Michel RedouteMeasurements of EMI Susceptibility of Precision Voltage References12:40 - 13:00 Pierre Payet, Jeremy Raoult, Laurent Chusseau Disruption of a RF Front-End Subject to a Out-of-Band Signal13:00 - 13:20 Sergey Miropolsky, Stefan JahnEM Field Solver Modelling of the Floating EUT Module Boards in Automotive EMC Test Setups

13:20 - 14:20 Lunch

14:00 - 15:00 Keynote Speech by Prof. Victor Luchinin (in cooperation with Alexey Afanasjev, Anatoly Petrov and Vladimir Ilyin)Family of micro key based on SiC for extreme conditions and duty

15:00 - 15:40 Technical section «Materials for Improved EMC of ICs»15:00 - 15:20 Masahiro Yamaguchi, Yasushi Endo, Peng Fan, Jingyan Ma, Satoshi Tanaka, Yasunori Miyazawa, Makoto Nagata Analysis of Patterned Magnetic Thin-film Noise Suppressor for RF IC Chip15:20 - 15:40 Bumhee Bae, Sukjin Kim, Youngkun Kwon, Hyunggeun Kim, Sunkyu Kong, Joungho Kim, Harkbyeong ParkShielding Effectiveness of Noise Coupling on Analog-to-Digital Converter in Magnetic Field Wireless Power Transfer System

15:40 - 16:00 Coffee break

16:00 - 17:40 Technical section «Semiconductor Device Modelling for EMC of ICs»16:00 - 16:20 Vitaliy Vitko, Andrey Nikitin, Alexey Ustinov, Boris KalinikosTheory of optoelectronic oscillators based on serially coupled multiple micro-ring resonators16:20 - 16:40 Irina Ustinova, Andrey Nikitin, Alexey Ustinov, Erkki LahderantaLogic Gates Based on Multiferroic Microwave Interferometers16:40 - 17:00 Anatoly Dudin, Ilya Kogan, Georgiy Yakovlev, Maria Mironova, Igor Schukov, Dmitriy Frolov, Vasiliy Zubkov, Gennadii GlinskiiSimulation and characterization of AlGaAs/InGaAs/GaAs pHEMT structures with quantum wells for SHF integrated circuits17:00 - 17:20 Nikita Permiakov, Anton Evseenkov, Sergey Tarasov, Alexander Solomonov, Vyacheslav MoshnikovDetection methods of intense areas and identification of the reasons of HEMT transistors failure

17:20 - 17:40 Vladimir Tikhomirov, Aleksandr Gudkov, Victor Petrov, Svetlana Agasieva, Yakov Parnes, Andrei Zybin, Anton EvseenkovSimulation of electric field distribution in GaN HEMTs for the onset of structure degradation

17:40 - 19:00 Visit to ETU CMID Research Center Laboratories

5 building, conference hall 10:00 - 11:20 Technical section «EMC of ICs in Power Devices and Systems»10:00 - 10:20 Alexandre Boyer, Manuel Gonzalez Sentis, Chaimae Ghfiri, Andre DurierModeling methodology of the conducted emission of a DC-DC converter board10:20 - 10:40 Alexandre Boyer, Manuel Gonzalez Sentis, Chaimae Ghfiri, Andre DurierStudy of the thermal aging effect on the conducted emission of a synchronous buck converter10:40 - 11:00 Raul Blecic, Josip Bacmaga, Renaud Gillon, Bart Nauwelaers, Adrijan BaricEMC-Oriented Design of Output Stage of Synchronous Buck Converter11:00 - 11:20 Bogdan Vasiliev, Viacheslav Zyrin Analysis of Electromagnetic Compatibility for Two-Level Frequency Converter with the Electric Motor and Power Quality at the Inverter Output

11:20 - 11:40 Coffee break

11:40 - 13:20 Technical section «ESD Modelling and Analysis for EMC of ICs»11:40 - 12:00 Thomas Ungru, Wolfgang Wilkening, Renato NegraInfluence of ESD on an integrated shift register in operation12:00 - 12:20 Niels Lambrecht, Hugo Pues, Daniël De Zutter, Dries Vande GinsteCircuit Modeling of the ISO 10605 Field Coupled Electrostatic Discharge Test to Design Robust Automotive Integrated Circuits12:00 - 12:20 Friedrich Zur Nieden, Lena Zeitlhofler, Kai Esmark, Reinhold GartnerCharacterization of a 1-Pin Stress ESD Testing Method for the Analysis of Nanosecond-Range Charging Effects12:20 - 13:00 Tohlu Matsushima, Mayumi Aoki, Takashi Hisakado, Osami Wada Equivalent Circuit Model with Nonlinear Characteristics of Zener Diode Extracted from SPICE Model for ESD Simulation

Thu. 6 July

13:00 - 13:20 Mario Rotigni, Mauro Merlo, Martina Cordoni, Paolo Colombo, Valentino LiberaliConducted Emissions in a 40 nm CMOS Test Chip: The Role of ESD Protections

13:20 - 14:20 Lunch

14:20 - 15:00 Poster Session Valerio M. Salles, Luiz C. KretlyGuidelines to Establish Design and Simulation of AC-Clocked Power Supply in Digital CVSL Circuits: The Base to Implement Complex Sequential CircuitsShih-Yi Yuan, Jia-Wei Chen, Ming-Shan Lin, Jian-Li DongApplication-specific Near Field EMI Estimation on Time-Sharing Operating SystemLeslie BaiTest Methods For 2.4GHz ISM Data Transmission Equipment Compliant with EU RegulationsHyun Ho Park, Keonyoung Seo, Young-Kun Kwon, Hark-Byeong ParkNumerical Analysis of Conformal Shields for Chip and Package ShieldingBinhong Li, Jiantou Gao, Bo Li, Zhengsheng Han, Jiajun Luo, Jianfei Wu, Wei ZhuImpact of DSOI back-gate biasing on circuit conducted emissionJianfei Wu, Binhong Li, Hongli ZhangDPI Immunity of Bandgap in SI and SOI TechnologiesTvrtko Mandic, Renaud Gillon, Adrijan BaricAn Experimental Investigation of Four-Port IC-StriplineBogdan Vasiliev, Viacheslav ZyrinPower Flow Research and Electromagnetic Compatibility Between Frequency Converter and Electric MotorTaras Kustov, Semen GrinEfficiency improvement means for operation of linear photo detector controller based on CCD array

15:00 - 15:40 Technical section «Near Field Scan Methods for IC EMC»15:00 - 15:20 Bertrand Vrignon, Kamel Abouda, Adrien Doridant, Nicolas BaptistatTime-domain measurements using near field scanning method15:20 - 15:40 Nicolas Lacrampe, Sebastien Serpaud, Alexandre Boyer, Sereirath TranRadiated Suceptibility Investigation of Electronic Board from Near Field Scan Method

15:40 - 16:00 Coffee break

16:00 - 16:40 Technical section «Signal Integrity at IC and PCB level»16:00 - 16:20 Andrea Lavarda, Bernd Deutschmann, Haerle DieterEnhancement of the DPI Method for IC Immunity Characterization16:20 - 16:40 Michael FuchsDesign of an EMC Test Board for Analog-to-Digital Converters

17:00 Departure to the social event17:00 - 22:00 Conference social event (boat trip)

5 building, conference hall 11:00 - 12:00 Keynote Speech by Prof. Alexander Chupakhin (in cooperation with Volodymyr Pilinsky and Oleg Petrischev)Determination the level of low-frequency interference induced by ferromagnetic component on the PCB

12:00 - 12:20 Coffee break

12:20 - 13:20 Technical section «Computational Electromagnetics for IC level EMC»12:20 - 12:40 Vadim Goncharov, Eugene Fiskin, Rostislav Yashkardin, Konstantin SorokinMethod of calculating of random shaped electromagnetic impulse flowing through conducting structures.12:40 - 13:00 Zhifei Xu, Yang Liu, Blaise Ravelo, Olivier MauriceModified Kron's TAN Modeling of 3D Multilayer PCB13:00 - 13:10 Closing speech by Etienne Sicard13:10 - 13:20 Closing speech by Mikhail Shestopalov

Fri. 7 July