Noise Simulation on RPCs
description
Transcript of Noise Simulation on RPCs
Noise Simulation on RPCs
Andrés Leonardo Cabrera MoraHigh Energy Physics GroupUniversidad de los Andes
¿What we are simulating?
Resistive Plate Chambers
Geometry
• Polyethylene (0.2 mm)• Graphite (0.2 mm)• Bakelite (2 mm)• Gas C2H2F4 (2 mm)• Aluminum (strips)(0.04
mm)• Air• Localized Electric Field
(4.5 kV/mm)
FIRST APROXIMATION
Implementation
• Particles: photons, electrons, positrons, muons and antimuons.
• Processes: Compton Scattering, Photo Electric Effect, Gamma Conversion, Multiple Scattering, Ionization, Bremsstrahlung, Positron Annihilation and Pair Production.
• Results: Histograms, Scatter Plots, Angles Distribution and Distance Distribution.
Conditions on the Simulation
• Incidence of ten millions of muons through a Double RPC (perpendicular, fixed point)
• Localized field in the region of the gas-4.5 kV/mm in the z axis (negative)
• The results show electrons that come from photons in the gas region
RESULTS
Counts
Distance Distribution X (cm)
Electron Distance Distribution
Counts
Energy Distribution (MeV)
Electron Energy Distribution
Angular Distribution
Z (positive)
Cos (Ѳ) = 1 Cos (Ѳ) = -1
Counts
Cos (Ѳ) Distribution
Electron Cos (Ѳ) Distribution
Counts
Φ Distribution (Deg)
Electron Φ Angular Distribution
X (mm)
Y (mm)
Scatter Plot Y vs X
OTHER RESULTS
Positive Electric Field
(4.5 kV/mm en la dirección positiva del eje z)
Negative Electric Field
(4.5 kV/mm en la dirección negativa del eje z)
RPC with Iron
RPC with aluminium
Change in the incidence of particles
• Distribution of energies • Incidence from different angles and points.
Manage of Information• Twiki in english/spanish
http://twiki.org/cgi-bin/view/Sandbox/AndresCabreraSandbox
Conclusions• The incidence of ten millions of muons
produce a 0.09% (9242) of electrons that come from photons.
• Only 0.09% (9) of electrons are produced to more than 10 cm of the point of incidence.
Conclusions
• Only 2.7% (257) electrons are produced to more than 2.4 cm (1.2 cm) of the point of incidence.
Counts
Distance Distribution X (cm)
Electron Distance Distribution