Networked Embedded Systems - eeeforum

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Transcript of Networked Embedded Systems - eeeforum

Page 1: Networked Embedded Systems - eeeforum

Department of Electrical & Electronics Engineering, Amrita School of Engineering

Semiconductors

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Department of Electrical & Electronics Engineering, Amrita School of Engineering

Atomic Structure Atom – smallest particle of matter that retains the physical

characteristics of an element Atomic Number of an Atom – number of protons Atoms contain an equal number of protons and electrons Bohr Model

Simplest model of an atom Central core (nucleus) – contains protons and neutrons Electrons revolve around nucleus

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Department of Electrical & Electronics Engineering, Amrita School of Engineering

Atomic Structure Electrons go around the nucleus in their orbits Each orbit has some energy level Group of orbits called shell Electrons on the same shell have similar energy level Number of electrons (N) on each shell (n)

– First shell has 2 electrons – Second shell has 8 electrons

N = 2n2

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Department of Electrical & Electronics Engineering, Amrita School of Engineering

Valence Shell Atoms are made of valence shell and core Valence shell is the outermost shell Valence shell has valence electrons ready to be freed This orbit controls the electrical properties of the atom. Core of an atom is the nucleus and all the inner orbits When an atom has more of one particle than the other the

atom acquires the charge of the greater. – + Ion, Has more Protons than Electrons, – - Ion, Has more Electrons than Protons.

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Department of Electrical & Electronics Engineering, Amrita School of Engineering

Solid-state electronic materials Electronic materials fall into three categories with respect

to resistivity – Insulators ρ > 105 Ω-cm (diamond ρ = 1016 ) – Semiconductors 10-3 < ρ < 105 Ω-cm – Conductors ρ < 10-3 Ω-cm (copper ρ = 10-6 )

In order of conductivity:

– Conductors – Semiconductors – Insulators

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Department of Electrical & Electronics Engineering, Amrita School of Engineering

Solid-state electronic materials Electronic materials fall into three categories with respect

to resistivity – Insulators ρ > 105 Ω-cm (diamond ρ = 1016 ) – Semiconductors 10-3 < ρ < 105 Ω-cm – Conductors ρ < 10-3 Ω-cm (copper ρ = 10-6 )

In order of conductivity:

– Conductors – Semiconductors – Insulators

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Department of Electrical & Electronics Engineering, Amrita School of Engineering

Solid-state electronic materials Bandgap is an energy range in a solid where no electron

states can exist. It refers to the energy difference between the top of the

valence band and the bottom of the conduction band

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Department of Electrical & Electronics Engineering, Amrita School of Engineering

Conductors Material capable of carrying electric current, i.e. material

which has “mobile charge carriers” (e.g. electrons, ions..) Has loosely bound electrons in its outer or Valence shell,

they are easily displaced Have a high concentration of electrons in conduction bands

e.g. metals, liquids with ions (water, molten ionic compounds) • Current is carried by a single type of mobile charge, the free

electron (current carrier). • There is relatively large density of mobile charge carriers.

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Department of Electrical & Electronics Engineering, Amrita School of Engineering

Insulators Materials with no or very few free charge carriers Has tightly bound electrons in its outer or Valence ring,

they are not easily displaced. have virtually zero electrons in bands conduction band energy is too high all the electrons are stuck in valance bands

Eg: quartz, most covalent and ionic solids, plastics

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Department of Electrical & Electronics Engineering, Amrita School of Engineering

Semiconductors Elemental semiconductors are formed from a single type of

atom of column IV, typically Silicon. Compound semiconductors are formed from combinations

of elements of column III and V or columns II and VI.

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Department of Electrical & Electronics Engineering, Amrita School of Engineering

Semiconductor Materials Semiconductor

Bandgap Energy EG (eV)

Carbon (diamond) 5.47

Silicon 1.12

Germanium 0.66

Tin 0.082

Gallium arsenide 1.42

Gallium nitride 3.49

Indium phosphide 1.35

Boron nitride 7.50

Silicon carbide 3.26

Cadmium selenide 1.70

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Department of Electrical & Electronics Engineering, Amrita School of Engineering

Intrinsic Silicon • Intrinsic refers to properties of pure materials.

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Intrinsic Silicon • Covalent Bonding

Covalent bond

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Department of Electrical & Electronics Engineering, Amrita School of Engineering

Covalent Bonding

Covalent bonding of Si crystal Covalent bonding of GaAs crystal

This bonding of atoms, strengthened by the sharing of electrons, is called covalent bonding

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Department of Electrical & Electronics Engineering, Amrita School of Engineering

Intrinsic Silicon

• Near absolute zero, all bonds are complete

• Each Si atom contributes one electron to each of the four bond pairs

• The outer shell is full, no free electrons, silicon crystal is an insulator

• What happens as the temperature increases?

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Department of Electrical & Electronics Engineering, Amrita School of Engineering

Intrinsic Silicon

• Increasing temperature adds energy to the system and breaks bonds in the lattice, generating electron-hole pairs.

• The departure of the electron creates a vacancy in the valence orbit called a hole

• Some of the electrons can fall into the holes – recombination.

• Recombination is the merging of a free electron and a hole.

When temperature increases

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Department of Electrical & Electronics Engineering, Amrita School of Engineering

Intrinsic Semiconductors • intrinsic semiconductor – is one which is not doped

– One example is pure silicon. • generation – is the process of free electrons and holes

being created. – generation rate – is speed with which this occurs.

• recombination – is the process of free electrons and holes disappearing. – recombination rate – is speed with which this occurs.

Generation may be effected by thermal energy. As such, both generation and recombination rates will be a function

of temperature.

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Department of Electrical & Electronics Engineering, Amrita School of Engineering

Intrinsic Semiconductors

• thermal generation – effects a equal concentration of free electrons and holes. – Therefore, electrons move randomly throughout the

material. • In thermal equilibrium, generation and recombination rates

are equal. • Concentration of free electrons is equal to the

concentration of holes

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Department of Electrical & Electronics Engineering, Amrita School of Engineering

Intrinsic carrier concentration • Concentration of free electrons is equal to the

concentration of holes n = p = ni

• ni = number of free electrons and holes in a unit volume

for intrinsic semiconductor • B = parameter which is 7.3 x 1015 cm-3K-3/2 for silicon • T = temperature (K) • Eg = bandgap energy which is 1.12 eV for silicon • k = Boltzman constant (8.62 x 10-5 eV/K)

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Department of Electrical & Electronics Engineering, Amrita School of Engineering

Electron-Hole Concentration The electron density is n Hole density is represented by p. For intrinsic silicon, n = ni = p. The product of electron and hole concentrations is pn = ni

2 The pn product above holds when a semiconductor is in

thermal equilibrium (not with an external voltage applied).

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Department of Electrical & Electronics Engineering, Amrita School of Engineering

Semiconductor doping Doping is the process of adding very small well controlled

amounts of impurities into a semiconductor.

Doping enables the control of the resistivity and other properties over a wide range of values.

Increase conductivity of a semiconductor

For silicon, impurities are from columns III and V of the periodic table.

Extrinsic - Impure semiconductors obtained by adding impurities

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Donor Impurities in Silicon Pentavalent Doping – Donor Material Pentavalent material have five outer shell electrons, there is

now an ‘extra’ electron in the structure Increases concentration of electrons Group V elements - Phosphorous, Arsenic, and Antimony

SI

SI

SI

SI

SI

SI

SI

SI

SI

N

N

q+

q−

e

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Department of Electrical & Electronics Engineering, Amrita School of Engineering

N-type Semiconductor Free electrons outnumber the holes in an n-type

semiconductor Free electrons are called majority carriers Holes are called minority carriers Negative charge

SI

SI

SI

SI

SI

SI

SI

SI

SI

SI

SI

SI

SI

SI

SI

SI

SI

SI

N N

N

N

N

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Department of Electrical & Electronics Engineering, Amrita School of Engineering

Acceptor Impurities in Silicon Trivalent Doping - Acceptor Material. Trivalent atoms have only three valence electrons – there is

one ‘hole’ in the structure Increases concentration of holes Group III elements - Boron, Aluminum, and Gallium

P

SI

SI

SI

SI

SI

SI

SI

SI

SI

P

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Department of Electrical & Electronics Engineering, Amrita School of Engineering

P-type Semiconductor Holes outnumber free electrons Holes are referred to as the majority carriers Free electrons are known as the minority carriers Positive charge

SI

SI

SI

SI

SI

SI

SI

SI

SI

SI

SI

SI

SI

SI

SI

SI

SI

SI P

P

P

P

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Department of Electrical & Electronics Engineering, Amrita School of Engineering

Summary In doped material, the electron and hole concentrations

are no longer equal. If n > p, the material is n-type. If p > n, the material is p-type. Carrier with largest concentration is majority carrier Carrier with smallest concentration is minority carrier

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Department of Electrical & Electronics Engineering, Amrita School of Engineering

Current Flow in Semiconductors

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Drift Current when an electrical field (E) is applied to a semiconductor

crystal, holes are accelerated in the direction of E, free electrons are accelerated in the direction opposite to that of E

the velocity of holes and electrons defined by

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Department of Electrical & Electronics Engineering, Amrita School of Engineering

Drift Current

constant of proportionality is the mobility, µ vn and vp - electron and hole velocity (cm/s) µn and µp - electron and hole mobility (cm2/V⋅s) µn ≈ 1350 (cm2/V⋅s), µp ≈ 500 (cm2/V⋅s)

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Department of Electrical & Electronics Engineering, Amrita School of Engineering

Drift Current

Assume single-crystal silicon bar, the concentration of holes is defined as p and electrons as n.

current component attributed to the flow of holes

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Department of Electrical & Electronics Engineering, Amrita School of Engineering

Drift Current • Substitute in µpE

current density as current per unit cross-sectional area Jp = Ip / A.

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Department of Electrical & Electronics Engineering, Amrita School of Engineering

Drift Current • current component attributed to the flow of

electrons

• total drift current defined

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Department of Electrical & Electronics Engineering, Amrita School of Engineering

Drift Current

• conductivity (σ.) – relates current density (J) and electrical field (E)

• resistivity (ρ.) – relates current density (J) and electrical field (E)

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Department of Electrical & Electronics Engineering, Amrita School of Engineering

Diffusion Current

carrier diffusion – is the flow of charge carriers from area of high concentration to low concentration. It requires non-uniform distribution of carriers.

diffusion current – is the current flow that results from diffusion.

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Department of Electrical & Electronics Engineering, Amrita School of Engineering

Diffusion Current – inject holes – By some

unspecified process, one injects holes in to the left side of a silicon bar.

– concentration profile arises – Because of this continuous hole inject, a concentration profile arises.

– diffusion occurs – Because of this concentration gradient, holes will flow from left to right.

inject holes

concentration profile arises

diffusion occurs

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Department of Electrical & Electronics Engineering, Amrita School of Engineering

Diffusion Current

• diffusion current defined by

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Diffusion Current

• the relationship between diffusion constant (D) and mobility (µ) – thermal voltage (VT) – at T = 300K, VT = 25.9mV

known as Einstein Relationship

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Department of Electrical & Electronics Engineering, Amrita School of Engineering

Current in Semiconductors drift current density (Jdrift) effected by – an electric field (E).

diffusion current density (Jdiff) effected by – concentration gradient in free electrons and

holes.

Total current is the sum of drift and diffusion current:

Tn n n

Tp p p

j q n qD

j

E

E

nx

qx

q pp D

∂µ

∂µ

= +

= −

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Department of Electrical & Electronics Engineering, Amrita School of Engineering

PN junction

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Department of Electrical & Electronics Engineering, Amrita School of Engineering

PN Junction pn junction structure p-type semiconductor n-type semiconductor metal contact for connection

pn junction implements the junction diode - terminals are labeled anode and cathode

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Unbiased PN junction

n-type semiconductor filled with free electrons

p-type semiconductor filled with holes junction

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Department of Electrical & Electronics Engineering, Amrita School of Engineering

Unbiased PN junction

Small circled plus represent the

pentavalent atom

Small circled minus represent the trivalent

atom

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Diffusion begins - Those free electrons and holes which are closest to the junction will recombine and, essentially, eliminate one another.

Unbiased PN junction

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The depletion region is filled with immobile charge carriers

The depletion region begins to form – as diffusion occurs and free electrons recombine with holes.

Unbiased PN junction

The electric field between the ions is equivalent to a difference of potential called the barrier potential.

At 25°C, the barrier potential equals approximately 0.3 V for germanium diodes and 0.7 V for silicon diodes.

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Department of Electrical & Electronics Engineering, Amrita School of Engineering

Forward biased Diode When the applied voltage is greater than 0.7 V, the free

electron has enough energy to get across the depletion layer. Soon after the free electron has entered the p region, it

recombines with a hole. Current flows in a forward-biased diode. As long as the applied voltage is greater than the barrier

potential, there will be a large continuous current in the circuit

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Department of Electrical & Electronics Engineering, Amrita School of Engineering

Reverse biased Diode Negative terminal attracts the holes, and the positive terminal

attracts the free electrons. Holes and free electrons flow away from the junction Depletion layer gets wider. The reverse current caused by the thermally produced

minority carriers is called the saturation current.

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Department of Electrical & Electronics Engineering, Amrita School of Engineering

Effect of biasing in PN junction diode