Nanocure 3 Ultraviolet Light Curing System · 2011-07-12 · Novel UV assisted Ozone clean...

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External Use SILICON SYSTEMS GROUP External Use SILICON SYSTEMS GROUP Nanocure 3 Ultraviolet Light Curing System Silicon Systems Group July 12 th , 2011

Transcript of Nanocure 3 Ultraviolet Light Curing System · 2011-07-12 · Novel UV assisted Ozone clean...

Page 1: Nanocure 3 Ultraviolet Light Curing System · 2011-07-12 · Novel UV assisted Ozone clean technology Leading edge solution for lower defects at small device nodes Number of wafers

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SILICON SYSTEMS GROUP External Use SILICON SYSTEMS GROUP

Nanocure™ 3 Ultraviolet Light

Curing System

Silicon Systems Group

July 12th, 2011

Page 2: Nanocure 3 Ultraviolet Light Curing System · 2011-07-12 · Novel UV assisted Ozone clean technology Leading edge solution for lower defects at small device nodes Number of wafers

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SILICON SYSTEMS GROUP External Use

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SILICON SYSTEMS GROUP SILICON SYSTEMS GROUP

These presentations contain forward-looking statements, including those regarding

market outlooks; technology roadmaps; the proposed Varian merger; and Applied’s

market positions, products, growth opportunities, strategies and business outlooks.

These statements are subject to known and unknown risks and uncertainties that could

cause actual results to differ materially from those expressed or implied by such

statements, including but not limited to: the level of demand for Applied’s products, which

is subject to many factors, such as uncertain global economic and industry conditions,

demand for electronic products and semiconductors, government renewable energy

policies and incentives, and customers’ new technology and capacity requirements; the

satisfaction of conditions precedent to the proposed merger with Varian, including the

ability to secure regulatory approvals in a timely manner or at all; Applied’s ability to (i)

develop, deliver and support a broad range of products and expand its markets, (ii) align

its cost structure with business conditions, (iii) successfully execute its acquisition

strategy and realize synergies, (iv) obtain and protect intellectual property rights, and (v)

attract, motivate and retain key employees; and other risks described in Applied’s SEC

filings. All forward-looking statements are based on management’s estimates, projections

and assumptions as of July 12, 2011, and Applied undertakes no obligation to update any

forward-looking statements.

Safe Harbor

Page 3: Nanocure 3 Ultraviolet Light Curing System · 2011-07-12 · Novel UV assisted Ozone clean technology Leading edge solution for lower defects at small device nodes Number of wafers

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SILICON SYSTEMS GROUP

Reflexion GT™ for Tungsten

New Products Released At 2011 Semicon West

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Vantage® Vulcan™ RTP

Centura® DPN HD

Endura® Versa™ XLR W PVD

Endura® HAR Cobalt PVD

Centura® Integrated Gate Stack

Producer® Black Diamond™ 3

Producer® Nanocure™ 3

TRANSISTOR-ENABLING PRODUCTS

INTERCONNECT-ENABLING PRODUCTS

Page 4: Nanocure 3 Ultraviolet Light Curing System · 2011-07-12 · Novel UV assisted Ozone clean technology Leading edge solution for lower defects at small device nodes Number of wafers

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SILICON SYSTEMS GROUP

Nanoscale Engineering With UV Light

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Ultraviolet (UV) light energy treatment introduces porosity and

strengthens bond structures inside the film

Black Diamond 3

Nanocure 3

Page 5: Nanocure 3 Ultraviolet Light Curing System · 2011-07-12 · Novel UV assisted Ozone clean technology Leading edge solution for lower defects at small device nodes Number of wafers

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SILICON SYSTEMS GROUP External Use

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SILICON SYSTEMS GROUP SILICON SYSTEMS GROUP 5

Deliver lower k value of film for lower

power consumption

Maximize mechanical strength of the

film for higher packaging yield

Provide uniform film curing to lower

variability in device performance

Multilevel low-k layers formed with Nanocure system

Unlock Full Potential Of Porous Low-k Films

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Page 6: Nanocure 3 Ultraviolet Light Curing System · 2011-07-12 · Novel UV assisted Ozone clean technology Leading edge solution for lower defects at small device nodes Number of wafers

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SILICON SYSTEMS GROUP

Advancing UV Curing To 2X nm Node

Uniform Revolutionary optics delivers uniform cure

Robust Optimized UV intensity wafer to wafer

Clean Unique ozone process for low defectivity

Fast 40% faster cure times than competition

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Nanocure 3 System

Page 7: Nanocure 3 Ultraviolet Light Curing System · 2011-07-12 · Novel UV assisted Ozone clean technology Leading edge solution for lower defects at small device nodes Number of wafers

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SILICON SYSTEMS GROUP SILICON SYSTEMS GROUP

Parameter Conventional UV Cure Nanocure 3

Shrinkage Uniformity Map

Shrinkage Uniformity (%,1s)

Shrinkage Range (%) (Max-Min)

E&H Uniformity (GPa) (Max-Min)

3.0

1.8

0.8 / 0.1

1.6

1.0

0.3 / 0.04

New Chamber Provides Uniform Cure

50% more uniform UV cure Tighter modulus and hardness metrics

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Page 8: Nanocure 3 Ultraviolet Light Curing System · 2011-07-12 · Novel UV assisted Ozone clean technology Leading edge solution for lower defects at small device nodes Number of wafers

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SILICON SYSTEMS GROUP SILICON SYSTEMS GROUP

Ozone Technology Offers Clean Cure

Novel UV assisted Ozone clean technology

Leading edge solution for lower defects at small device nodes

Number of wafers

Part

icle

ad

ders

Particle data collected over an extended run

0 200 400 600 800 1000

20

40

60

80

Average = 3 adders

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Page 9: Nanocure 3 Ultraviolet Light Curing System · 2011-07-12 · Novel UV assisted Ozone clean technology Leading edge solution for lower defects at small device nodes Number of wafers

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SILICON SYSTEMS GROUP 9

Process Innovations Enable Fast Cure

Up To 40% faster curing times over conventional cure approach

Market leading cure speed

1 Step Cure

S1.0

S1.3

S0.7

1-Step Cure (Nanocure 3)

2-Step Cure

S0.3

t1.0 t1.4

Norm

. F

ilm S

hri

nkag

e (

%)

Normalized Cure Time

S1.1

t1.4

S0.8

S1.0

t1.0

Low Pressure Cure

Norm

. F

ilm S

hri

nkag

e (

%)

Normalized Cure Time

Low Pressure (Nanocure 3)

High Pressure

Page 10: Nanocure 3 Ultraviolet Light Curing System · 2011-07-12 · Novel UV assisted Ozone clean technology Leading edge solution for lower defects at small device nodes Number of wafers

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SILICON SYSTEMS GROUP

Revolutionary optics provides

uniform light distribution on wafer

Innovative chamber design offers

uniform gas flow

Leading on-wafer uniformity

Metal Contour

polishing head

Novel UV-assisted Ozone clean

Most Efficient clean with low defects

Radical UV cleaning solution

Uniformity Defectivity

Technology Leadership in Nanocure

Temperature

Light

Gas Flow

Closed loop monitoring and power

adjustment for consistent curing

Low variability wafer to wafer

Only provider of real time control

Dynamic Control

Reference

Measured

error

System

input

System

output

Measured

output

Controller System

Sensor

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Page 11: Nanocure 3 Ultraviolet Light Curing System · 2011-07-12 · Novel UV assisted Ozone clean technology Leading edge solution for lower defects at small device nodes Number of wafers

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SILICON SYSTEMS GROUP

Nanocure 3 UV Curing Expanding Applied Leadership in Low k Dielectrics

Advanced UV curing technology unlocks

full potential of porous low-k films

Delivers lower k value and maximizes

mechanical strength

Uniform and robust process offers lower

variability in device performance

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Page 12: Nanocure 3 Ultraviolet Light Curing System · 2011-07-12 · Novel UV assisted Ozone clean technology Leading edge solution for lower defects at small device nodes Number of wafers

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SILICON SYSTEMS GROUP