MOSIS Chip Test Report · All of the received chips passed visual inspection, no flaws detected....

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MOSIS Chip Test Report TA and K. Choi File: 'ReportV57XBW.doc' CMPEN 411, Spring 2015, Homework Project 9 chip, 'Tiny Chip' fabricated through MOSIS program Technology: 0.5um CMOS, ON Semiconductor Project: 8bit RISC microcontroller, 32 word program, 8 data registers, 6 instructions, one 8 bit input port, one 8 bit output port, low power ring oscillator, 32X16 RAM program memory - reprogrammable MOSIS V57X-BW CHIP Die size: 1584 X 1685 um Package: Ceramic DIP40

Transcript of MOSIS Chip Test Report · All of the received chips passed visual inspection, no flaws detected....

Page 1: MOSIS Chip Test Report · All of the received chips passed visual inspection, no flaws detected. Power Up Test Apply power to the power supply pins, gradually increase the supply

MOSIS Chip Test Report

TA and K. Choi File: 'ReportV57XBW.doc'

CMPEN 411, Spring 2015, Homework Project 9 chip, 'Tiny Chip' fabricated through MOSIS program

Technology: 0.5um CMOS, ON Semiconductor

Project: 8bit RISC microcontroller, 32 word program, 8 data registers, 6 instructions, one 8 bit input port, one 8 bit output port, low power ring oscillator, 32X16 RAM program memory - reprogrammable

MOSIS V57X-BW CHIP

Die size: 1584 X 1685 um

Package: Ceramic DIP40

Page 2: MOSIS Chip Test Report · All of the received chips passed visual inspection, no flaws detected. Power Up Test Apply power to the power supply pins, gradually increase the supply

HOMEWORK 9 CMPEN 411 Due: 4/23/2015 11:30pm

This chip is different from the class Homework 9 chip as follow: 0. Low power oscillator – 31 inverter stage ring oscillator is implemented, along with standard oscillator for comparison. 1. The signal addrW and dat0 in Homework 7 is replaced with internal shift register having SI, SO, and ck-sh signals. 2. The input port pins In7 to In0 are not multiplexed. 3. Voltage comparator with acp1ni, acp1pi, acp1ot signal pins are added to the chip. 4. Operation amplifier with aop1ni, aop1pi, aop1ot signal pins are added to the chip. 5. Analog power with aVDD and aGND pins are added to the chip, in addition to the digital power pins dVDD and dGND. 6. Three clock circuits with '*ck*' signal pins are added.

Out7

Out6

Out5

Out4

Out3

Out2 Out1 Out0 In7 In6 In5 In4 In3

In2

In1

In0

SO

SI

wr

dVDD

ck-sh

ck-in

ckb-out

Resetb

dGND

Sel

N.C.

acp1ni

ck2ss

acp1pi

acp1ot

aop1ot

aop1pi aop1ni aCKbot aVDD aGND aCKin ck2ot ck2dv

Page 3: MOSIS Chip Test Report · All of the received chips passed visual inspection, no flaws detected. Power Up Test Apply power to the power supply pins, gradually increase the supply

The cmpen411 class Homework 9 chip's original signal pin diagram is shown below in contrast to the KC chip's diagram above:

CMPEN 411 Spring 2015 Homework 9 Microcontroller chip, 8-bit MOSIS V57X - BW

Page 4: MOSIS Chip Test Report · All of the received chips passed visual inspection, no flaws detected. Power Up Test Apply power to the power supply pins, gradually increase the supply

Chip Internal Digital Signal Names

Chip Pad Connection

Page 5: MOSIS Chip Test Report · All of the received chips passed visual inspection, no flaws detected. Power Up Test Apply power to the power supply pins, gradually increase the supply

Microcontroller Chip Architecture http://www.cse.psu.edu/~kyusun/class/cmpen471/11f/hw/pj7/pj7.html

Page 6: MOSIS Chip Test Report · All of the received chips passed visual inspection, no flaws detected. Power Up Test Apply power to the power supply pins, gradually increase the supply
Page 7: MOSIS Chip Test Report · All of the received chips passed visual inspection, no flaws detected. Power Up Test Apply power to the power supply pins, gradually increase the supply
Page 8: MOSIS Chip Test Report · All of the received chips passed visual inspection, no flaws detected. Power Up Test Apply power to the power supply pins, gradually increase the supply
Page 9: MOSIS Chip Test Report · All of the received chips passed visual inspection, no flaws detected. Power Up Test Apply power to the power supply pins, gradually increase the supply

Chip Testing Visual Inspection All of the received chips passed visual inspection, no flaws detected. Power Up Test Apply power to the power supply pins, gradually increase the supply voltage to 5V, watch the current flow. The chip fully powered at 5V and the power supply current less than 5mA is normal, supply current more than 300mA is not normal - short circuit is suspected. If the power supply current limit is set for the testing, the supply voltage may not be able to be raised to full 5V. All of the received chip passed the power up test.

Page 10: MOSIS Chip Test Report · All of the received chips passed visual inspection, no flaws detected. Power Up Test Apply power to the power supply pins, gradually increase the supply

Clock In-Out Test We made the provision for a quick and simple signal test. Simply apply a square wave signal to the 'clock-in' pin and observe the same signal coming out to the 'ck-out' pin. This test will indicate the proper pad circuit operations. Also the pad circuit delay can be measured through this test. All of the received chip passed the clock in-out test. On-chip Clock Generator (Oscillator) We made the 140MHz on-chip oscillator circuit for the self-clocked microcontroller. They are tested and all five chips' on-chip oscillators are working. The low power ring oscillator was functioning fully, up to 140MHz at 5V, drawing 5.7mA of current. The previous standard ring oscillator was functioning up to 140MHz at 5V, drawing 10.3mA. On-chip voltage comparator and operation amplifier (Op Amp) We designed one voltage comparator and one operation amplifier circuit, placed them on the chip. They are tested and all five chips' on-chip voltage comparator and operation amplifier are working, up to 900KHz bandwidth. Full Microcontroller Operation Test Sample program 1: mv 0,0 ; NOP - no operation, always put this first for the safe RESET operation mv #0,0 ; fill first 4 memory locations with data: 0,1,2,3 mv #1,1 mv #2,2 mv #3,3 out 0 ; test proper data storing operation and 'out' operation out 1 out 2 out 3 mv #5,5 ; setting up an unconditional branch mv #6,6 sub 6,5 ; subtract a larger number from a smaller number, result saved in 5, and carry bit set bc -13 ; this will branch always, back 12 instructions - back to the 'mv 0,0' instruction mv 0,0 ; fill remaining program memory with NOP instructions mv 0,0 mv 0,0 mv 0,0 mv 0,0 mv 0,0 Sample program 2: mv 0,0 ; NOP - no operation, always put this first for the safe RESET operation in 3 ; sample the input port, save the data into memory location 3 out 3 ; take data from memory location 3 and send it to the output port mv #5,5 ; setting up an unconditional branch mv #6,6 sub 6,5 ; subtract a larger number from a smaller number, result saved in 5, and carry bit set bc -6 ; this will branch always, back 5 instructions - back to the 'in 3' instruction mv 0,0 ; fill remaining program memory with NOP instructions mv 0,0 mv 0,0 mv 0,0 mv 0,0 mv 0,0 Sample program 3:

Page 11: MOSIS Chip Test Report · All of the received chips passed visual inspection, no flaws detected. Power Up Test Apply power to the power supply pins, gradually increase the supply

mv 0,0 ; NOP - no operation, always put this first for the safe RESET operation out 5 ; take data from memory location 5 and send it to the output port in 3 ; sample the input port, save the data into memory location 3 out 3 ; take data from memory location 3 and send it to the output port mv #5,5 ; setting up an unconditional branch mv #6,6 sub 6,5 ; subtract a larger number from a smaller number, result saved in 5, and carry bit set bc -6 ; this will branch always, back 5 instructions - back to the 'in 3' instruction mv 0,0 ; fill remaining program memory with NOP instructions mv 0,0 mv 0,0 mv 0,0 mv 0,0 ; this program will show the memory location 5 data, when 5-6 is performed mv 0,0 Sample program 4: Pulse Width Modulation (PWM) output - 7 level LED light dimming Apply a binary number from 0 to 7 to the input port, any LED light connected to the output port will be dimmed to that level. The light dimming will be completely steady if the PWM program must cycle through more than 100 times per second, the clock frequency of the microcontroller must be sufficiently high. All five chips received passed the full microcontroller operation test with the above test programs, all with up to 140MHz clock. The PWM operations are fully verified. Maximum Speed Microcontroller Operation Test With full PWM program running, we plan to increase the clock frequency above 140MHz until the PWM program fails. We have not carried out this testing yet.

Conclusion This project was very successful, all of the received chips passed the test, fully functional. The maximum chip operation speed up to 140MHz clock frequency was tested. We express our gratitude to MOSIS for the course chip fabrication.