MILITARY’ STANDARDnot measurement mvf mil-sto-1d5e 10 may 1989 superseding mil-std-1d5d 29 april...

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NOT MEASUREMENT MVF MIL-STO-1D5E 10 MAY 1989 SUPERSEDING MIL-STD-1D5D 29 APRIL 1963 MILITARY’ STANDARD SAMPLING PROCEDURES AND TABLES FOR INSPECTION BY AITRIBUTES I AMSC N/A AREA QCIC ~~. Approved for public releese; dlstrlbutlon is unlimited. Source: http://www.assistdocs.com -- Downloaded: 2008-06-18T06:26Z Check the source to verify that this is the current version before use.

Transcript of MILITARY’ STANDARDnot measurement mvf mil-sto-1d5e 10 may 1989 superseding mil-std-1d5d 29 april...

  • NOT MEASUREMENT

    MVFMIL-STO-1D5E

    10 MAY 1989

    SUPERSEDINGMIL-STD-1D5D

    29 APRIL 1963

    MILITARY’ STANDARD

    SAMPLING PROCEDURES AND TABLES

    FOR INSPECTION BY AITRIBUTES

    I

    AMSC N/A AREA QCIC

    ~~. Approved for public releese; dlstrlbutlon is unlimited.

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  • MIL-STO-1O5E

    DEP~ OF DEFENSEWashington,EC 20301

    SN-lPL13KPRKEDUWS AND TABLESFOR INSPECTIONBY ~

    1. ‘hismilitarystaxiardis approvedfor use by all Ceprwmts and Agenciesof * ~t of Mf==e.

    2. Ikneficial~ts (recmmmdations,additions,deletims) and anyprtinent data whiti may be of use in inprovingthis documnt shouldbeaddressedto:

    CcmmnderUs. Army Armment Researdn,Develop-rentandEnginerinq Center

    ATIN: SKAR-BAC-S/BldcJ. 6PicatinnyArsenal,NJ 07806-5000

    by using&“ self-addressedStandardization~t -r ovww.ntProposal(ODForm 1426)am=ring at the md of thisdommnt or letter.

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  • MII-S’ID-105E

    ‘ItLisp.blitationprovidez.sampliqproceduresand referene tablesfor use inplanningand conductinginspectionby attributes.‘Thesamplingconceptis basedon the prokbilistic reaxrente of eventshhena seriesof lots or Mxhes areprtducedin a stableenvimrmmt.

    ‘Mispublicationshouldix usedto guidethe user in the rk?velqzwntof an~ion strategythatprmides a cost effectiveq+math to attwamfidmm in prcchxtanpliance with con-~actualtechn.iralrquimmnts. Tneuser is wrned of the asmmxl risksrelativeco * rhozensanplesizeadMK-

    Mili@ ~ifications should~t ~t~ r .”equmrents for use of wficssIIQlingplans,nor shouldtheyprovideAQL’sor Ll?D’sas a requimmnt.

    Sal@ing plans for continuous,ratherthan lot ~ion, are containedinMllAIV-1235, “’Singleand Mlci-Level ContinuousSanplingPmcedxes and Tablesfor I .nscectionby Attrihxes”.

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  • MIL-STC-105E

    Paragraph1.

    1.11.2

    2.

    2.1

    3.

    3.13.23.33.43.53.63.73.83.93.103.113.123.133.143.153.163.173.183.193.203.213.223.23

    4.

    4.14.24.34.4

    ——..

    SCOPE...............................................

    -se ....................................-.”.”-”A@ication .......................................

    REmwKED lxKuMmrs.................................

    Non applicable....................................

    DEFIMTICMS................... ......................

    _t*leCmlity-1 (ML)[email protected](~) ....................AverageGutgoingQualityLimit (=L) .............Classificationof Defects.........................CriticalDefect...................................CriticalDefective...........:....................Cefect............................................Defective..........................................DefectsPer Hul@redun.its.........................Inspection........................................Inspectionby Attributes..........................I_ctor Bat* ......................................I.mor EatchSize.................................MajorDefect......................................MajorDefective...................................MinorDefect......................................MinorEefective...................................PercentDefective..................................P-ss Average...................................Sanpl e............................................Sa@e SizeCede Letter...........................san@ing Plan.....................................Unit of Prcdmt...................................

    GmJ=m~s --------------------------------

    WrittenProcedures................................Noncunformnm ....................................Formtirm and Identificationof lots or Batches...ML ...............................................

    4.4.1 AQL Use...........................................4.4.2 Limitation........................................4.4.3 Chasing ins.................. ...................

    1

    1

    1

    1

    1

    222222 .,2333333333344.4444

    4

    4455555

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  • mL?S’m-lo5s

    C@m2?l’s - CQntinued.

    Pa.ragra@4.54.5.14.5.24.5.34.64.74.7.14.7.24.7.34.7.44.84.94.9.14.9.24.9.34.9.44.104.10.14.10.1.14.10.1.24.10.1.34.10.1.44.10.24.114.124.12.14.12.2

    sa71Qlhg.........................................RepresentativeSanding..........................Tim20f S.a@@ .................................~&irrP&tiple Saupling......................

    .............................SwitchiqP~ .............................Mxm.lcoTightened............. .................Ti@tened to Norml ..............................Noz-mlto Famed ................................Reducedtot+xm.l................ ................DkxmtinuationofInspection. ...................San@ing Plans...................................~ion==l.. ................... ............Clxk?l.ettera.....................................Maining sanplin Golan.........................TYF=of*l%l Plens..........................Determinationofkxeptabi.lity....................PercentDefectiveInspection.....................SingleSa@ingP lab........... ..................CoubleSamplingPlan.............................tiltipleSa@ingP lab.......... .................Sp2CialProce&re forRdweclIrsection. ....... .D!2fectsPer [email protected] Protectkn... ...................

    ...........................................-t%-=-i=ic ~ ..................AverageSa@e SizeCurvea.:.....................

    5. TABLES...............................................

    TableI.II-A.

    II-B.

    11

  • CcNIENrs - Cclnthuled.

    TableIV-A.

    IV-B.

    Iv-c.

    V-A.

    V-B.

    \T-A.

    VI-B.

    VII-A.

    VII-B.

    VIII.Ix.

    MTL-S’IC-105E

    M.dtipleSapling Plans for Nornksl~im (~ert~le) ................... ...

    MiltipleSamplingPlans for TightenedInspection(Msstertable)......................

    [email protected]@ingPlans for Reduced~im (Msstertable)......................

    AveragzDutgoingQualityLimitFacLorsforNormal~ion (Stiglesampling)............

    Average@tgoing @ality LimitFactorsforTightenedIn-ion (SingleSan@ng) .........

    Limittig(Xality (inPercentDefective)forwhicha Pa = 10% (forNormal ~ion,Singlesanplti g).............................

    LimitingQuality (inCefectsper HundredUnits)forwhich the Pa = 10% (forNormal~im, StigleSa@ing) ...................

    limiting@it y (inPercentDefective)forwhichthe Pa = 5% (forNormsl I.nsp?ction,Singlesanplin g).............................

    Ltitk.g CMality (inDefectsper Hundred’Wits) forwhiti the Pa = 5% (forNormsl~ction, Si.ngle*ling) ....................

    LimitNun&rsfor P&ducaiInspection.............AverageSa@e Size Cumes for DoubleandtWltipleSampling...............................

    Sa@ing Plans and ~rating CharacteristicCurves (andData) for:

    X-A. Sa@e SizeCc& I.etterA........................X-B. San@e SizeCode b?tterB........................x-c. SanpleSizeCa5e LetterC...:....................X-D. San’pleSizeCcxieLetterD........................X-E. Sa@e SizeCede LetterE........................X-F. San@e SizeCede LetterF........................x-G. Sa@e SizeCo& LetterG........................X-H. San@e SizeCode I.etterH........................X-J. San@e SizeCock LetterJ........................X-K. SanpleSizeCcrZeI.etterK........................X-L. San@e SizeCo& LetterL........................x-M. Sa@e SizeCcck LetterM........................X-N. San@e SizeCode Lectern........................x-P. SanpleSizeCode LetterP........................x-Q. San@e S$zeCmie IetterQ........................X-R. San@e SizeCock LetterR........................

    20

    22

    24

    26

    27

    28

    29

    30

    3132

    33

    34363840424446485052545658606264

    /

    /’

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  • MR-.5TD-1OSE

    )

    x-s.

    PanCJraph6.

    6.16.26.3

    CmnENrs - amnued.

    ~

    Sa@e Size Cc@e Letters........................ 66

    twnzs............................................ 61

    IntendedUse................................... 67,SubjectTezm (keywozd)Listing................_fmp=viousIs sue.,................ ... :

    aNmlDIrK tamRIAL .............................. 68

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  • W*1OSE

    ,,

    sJueLIK P~ AND TAEESFCR lNSP~ICM BY ATmmlm2S,

    1. -DE

    1.1 Purpose. ~s publicationestablisheslot or batchsanplingplans adprcesiuresfor inspectionby attributes.‘mis @limtion shallnot be “interpretedco ~ or am flictwith any contractualm@xwmtS. me Wrds‘Bae”’, “~”, “~tile”, etct refer~y to ~ ~tr~o~s use oftheqling plarscontainedin thisstandard~donotitrplym agre9mntbythe @vernmm to Saept anyprcduct.GOVS17X~ Shallk as

    Eeterndnationof acceptabilityby the&scri&d in amtrectual doam-ems. me San@ing plans

    describsdin this standsd are S@iable to A(2L’sof .01~rcent or higherandare thereforenot suitablefora@i~tions wherequalitylemls in the &fectivepartsp millioprangecanbe realized.

    1.2 lwl:~$. San@ing plans&signat.e3in this publi=tion are eppli~le,ML not lmt , to impection of Ule follcwing:

    a. Fml itens.

    c. *rations or services.

    d. Materialsin pmmss.

    e. Su@ies in storage.

    f. Maintenanceqerstions.

    9. Dataor remrds.

    h. Adniniszrativeprocecbres.

    lWse plans are intendsd primsrilyto M used for a continuingseriesof 10CSor bat-. l?h2plans my alsobe used for the inspectionof isolatedlotsorbacchss,but, in this lattercase,the user is cautionedto consultthe qx3rStingcharacteristiccumes to finda plan wh.itiwill yieldthe &sired protection(Sse4.11).

    2.

    2.1

    3.

    PEm@Km IxnMNcs ‘Not ~licable.

    DEFINITI@JS

    1

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  • mL-s’Imlo5E

    3.1 AcceptableCualityLevel (ML). m a continuousseriesof lots isconsidered,the AQL is the qualitylevelwhich,for the purpses of sanplinginspection,is the ltit of a satisfactoryprocessaverage (See3.19).

    Nc7rE:A sanplingplan and an AQL are tisen in accordaro?with the riskassunsd.Use of a valueof AQL for a ~ain defector groupof defectsindicatesthatthes~ling Pl~ till a- the -t ~joritY of @ lots or bat- P*- *processaveragelevelof percat &fective (ordefectspar hundredunits)in theselotsor batchesbe no greaterthanthe designatedvalue of AQL. Tnus,the AQL isa desiqaatedvalueof p2rcentdsfective(ordefects~ hurdredunits)for whichlotswill be acceptedITOStof the tfi by the sapling prcedure beingused. Theaanplingplansprovidedhereinare so arrangedthat the prdability of acceptanceat the designatedAQL valuedeps!ndsupon the sanplesize,~ing 9enerallYhi~erfor larges.snplesthan for smallones,for a givenAQL. The AQL done does notidentifythe chancesof accqZing or rejectingindividuallots or batchesM nuredirectlyrelatesto what mightte exp+ctedfran a seriesof lots or batches,providedthe stepsindicatedin thispublicationare taken. It is necessarYtoreferto the ~ating &aracteristiccurveof the plan to deterndnethe relativerisks.

    3.2 AverageGutgoingGuality (AD2). For a particularprocessaverage,the 7@ isthe averagequalityof o~tgoingprcductincludingall acceptedlots or batches,plus all reject+ lots or bat&es aftertinerejected’lots or batcheshavekeeneffectively100 ~rcent irqxcted and all defective replacedby non-rkfectives.

    3.3 Average cXIt90ingC?JdityLimit (ACQL). TheJKX)Lis the n-axhrnAD2 foragivena~ptance Sa@ing plan.Factorsfor -t ing AD2L VS1= ~ 9iven inTableV-A for each of the singlesapling plans for normalinspectionand inTableV-B for earh of the singlesanplingplans for tightenedinqection.

    3.4 Classificationof Defects. A classificationof defectsis the emnerationOfPssible defecLsof the unit of prcductclassifiedaccordingto theirseriousness.

    3.5 Criti& Eefect. A criticaldefectis a defectthat jud-t and experienceindicatewouldresultin hazardousor unsafeconditionsfor indivitialsusing,maintaining,or ciqendingupon the product,or a defectthat judgmt ard~rien= indimte is likelyto prevent~rformsne of the tacticalfunctionof amajorend itemsuch as a ship,aircraft,tank,missile,or spacevehicle.

    3.6 CriticalDefective. A critid defectiveis a unit of productwhichcontainsone or mre criticsldefectsand nay also concainIMjor and/or&ordefects.

    3.7 ,~fe. A defectis any nonconformanceof the unit of productwithef~d requirements.

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  • MIL-mlosE

    3.8 Cefectiw. A defectiveis a unit of procbctwhid containsone or nuredefects.

    3.9 Defectspr Hundr@5Units. Ibe nurberof defectsper hundredunitsof anygivenquantityof unitsof productis one hundrd tires .ttienu-&erof tkfectsanltainedtherein (oneor nuredefems bsing~ssible in any unit of product)dividedby the totalnunbsrof tics of product,i.e.:

    Defectsper . Nun&r of defects x 100lmldredunits Nun&r of unitsimpe@sd

    3.10 -ion. Inspectionis the protessof mssuring, testing,or ~se ~in9 the tit of prtckm with the requirsfmts.

    ,

    3.11 ~on by Attributes. ~ion by atcri.butesis “~on Whersbyeitherthe uruc of prcduct1s classifiedsinplyas defectiveor non-defective,orthe rnm&r of defectsin theunit of prcductis wunted, with respct to a givz2n~~t or set or rqi~ts.

    3.12 LOK or Batd. The termlot or batch shallnean “inspectionlot”or“’-Lion batch-,i.e.,a collectionof unitsof productfromwhicha sapieis to be drawn and irspsctedad ray differfrana collectionof unitsdesignatd

    .. —..—. ... . . .. ..as a La or oacm ror ouer pupses (e.g., prooucuon, snqnent, etc.).

    3.13 E or Bst~ Size. The lot or batch size is the nunberof unitsof prcductin a lot or batch.

    3.14 Msjor Defect. A mjor defectis a &fect, otherthan critical,thatislikelyto resultin failure,or to A= mterially the usabilityof the unitof prcductfor its intendedprpose.

    3.15 N!ajorCefective. A mjor defectiveis a unit of prtductwhichcontainsoneor mre msjor *fects, and ray also containminordefectsbut containsno criticaldefect.

    3.16 minor Defect. A minordefectis a defectthat is not likelyto reducemateriallythe usabilityof the unit of praiuctfor its intendedpupose, or is a-= frm establiah05stmhrds - littlebearingon the effectiveuse orqeration of the unit.

    3.17 Minor Defective. A minordefectiveis a unitof productwhi& containsoneor nxxe minor defectsbut mains no critid or m jordefect.

    3

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  • MIL-STD-105E

    3.18 PercentDefective: The percent&fective of any given quantityof unitsof productis one hundredtk the nun-herof defectiveunitsof prcductcontainedthereindividsdby the totalrnnnkerof unitsof product,i.e.:

    PercentDefective = Nwber of defective x 100Nun&r of unitsinspected

    3.19 Pnxess Average. The p-ss averageis the averageprcent defectiveoraveragenu&er of defectsper hundredunits (whitieveris .s@icable) of produ~subnittedby the sqplier for originalinspection.Original~ion is thefirstinspectionof a particularquantityof prcductas distinguishedfrcanthe-tiion of PrOdUCttiti has keen resuhn.ittedafterprior rejection.

    3.20 Sanple. A .sa@e consistsof one or !mreunitsof prduct drawn fra a lotor batti,the units of the sanplebeing selectedat rancbnwithoutregardto theirquality. The ntnrberof unitsof productin the sa@e is the sa.nplesize.

    3.21 SanPle Size Cede Letter. The sanplesizecode letteris a deviceusedalongwith the AQL for locating’a sanplingplanon a table of san’plingplans.

    3.22 SanplingPlan. A sanplingplan indicatesthe nunberof unitsof prcductfraneach lot or battiwhi& are to be inspscted(sanplesize or seriesofsa@e sizes)and the criteriafor*tennining the acceptabilityof the lot orbatti (arreptanmand rejectionn-rs) .

    3.23 Unit of Product. The unitof productis the thing inspsctedin ordertodetermineits classificationas defedive or non-defectiveor to countthe nunberof defects. It nBy be a stiglearticle,a pair,a set, a length,an ~, anopsratia, a volm, a ccsrponentof an end product,or the end prcductitself.The unit of prcductIMY or nBy not k the sam as the unit of pur&ase, aqply,production,or shipt.

    4.1 WrittenProcedures. Writtenproceduresare o~ily develo@ and mdeavailablefor the ~t representative’sreview,upon request. Wnen thewrittenp~ indicateuse of this stadard, they Shall DYl@y with the~S of this standardand referenceappropriateparts as necY2s.SaZy.

    4.2 Nonconfonnanm. The extentof noncnnfonranceof productshallbe exprersedeitherin termsof percentdefective‘orin termsof defectsper hundredunits.

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  • FKL+TW105S

    4.3 Forrnatianad Ick!ntifirationof &s or Batches. The prcductshallbasssn’bledinto icknt.ifiablelots,sublets,batches,oriniuti othermrun2rasmay b? prescribed. Each lotor Mtch shall,as far as is practicable,consistof units of productof a singlet~, grack,class,size,and crqosition,manufactureduncisressentiallyt.& saneainditians,and at essentiallyt& sauetim . Tis310tsor bstchesshallbei&ntified bytheamtractor andshall be keptintactin i@quate and suitablestoragespace.

    4.4 AQL.—

    4.4.1.AQL use. ‘Me AQL,tqsther with the Sa@e SizeCo& b?tter,is LEA for~ - -1* Plm provi&d hareixl.

    4.4.2 Limitation. The sele&n or use of an AQL shallnot iK@y that thecontractorhas t& rightto sqply any &fective.unit of produa.

    Ziis%%%%%iy, or for indivicha.1&fects. An AQL for a groupof &f_DifferentAQ1.sray be chosenforgruupsof &fects

    my Ix chosenin ackiitionto AQIa for individualdefects,or s@roups, withinthat gfoup. AQL valussof 10.0or lessway be eqxassed titherin prcentdefectiveor in defectspsr llundrqdt5; thoseover lo.o shallbeeqress@kdefectsper hundredunitsonly.

    4.5 San@inq.

    4.’5.1@xesentative C3tratified)SallQlinq. When ~ropriate, the nunterofunits in the sanpleshallEe selectedin ~rtim to the sizeof subletsorSu&bStCkS, or partsof the lot or hat*, identifiedby m rationalcriterion.When reprasentatives.a@irq ia used,the units frm eati -lot, s&-batdl orpart of the lot or batd shall& sel~”.edat randan.

    4.5.2 Tine of SamJ inq1 A .sanplemy be drati afterall the unitsculprisiirqtk lot or batchhave &en assmlsd, or aanpleunitsmay be drawnduringassenblyof the lot or batch,in whiticasethe sizeof the 10C or battiwill be determined&fore any ample unitsaredrawn.If tl-e.5an@eunitsare drawnduring~lyof the lot or htti, and if ths rejectionnun&r is reachedbeforethe lot *Cnl@eta that pxtian of the lot alreadyclxlpletedshallbe rejected. m causeof the defectiveprcductal be determinedand wrrective actiontaken,afterwhich anewlotorbatch~h begun.

    4.5.3 Lhubleor FldtipleSaq3Ml-qUssd, Sa

    hhendoubleor multiplesanplingis to bech sarpleshallbe selecttioverthe entirelot or batch.

    5

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  • MIL-S’ID-1O5E

    4.6 Inspection P~. Normal~ion willke used at the startof~ion. Normal,tightenedor reducedimpction shallcontinueunchangedforeach classof defectsor defective on succf2ssivelotsor batchesexceptwheretheswitdd.ngpmcedums givenbelowrequire&ange. The tit-9 P~ s~lbe a@ied to each classof defectsor defective independently.

    4.7 switdimq Procedures.

    4.7.1 Normalto Tightened. When normalinspction is in effect,tightened~ion shallbe institutedwhen 2 out of 2, 3, 4, or 5 consecutivelots orbat&es have been rejettedon originalinspction (i.e., ignoringresutxnittedlotsor batchesfor this procdure)-

    4.7.2 Tigirtemdto Normal. When tightenedin-ion is .tieffeet,normal~ion shallEe institutedwhen5 consecutivelots or batcheshave beenconsideredaceptable on origti inqection.

    4.7.3 Nod to Reduced. t?nennormalinspectionis in effect,reducedinspectionshallke institutedprovidedthat all of the followingconditionsare satisfied:

    a. T’FISpreceding10 lotsor bazches“(ormore, as indicated by the notetoTableVIII) have been on norrnslinspectionand all have been acepted on origha.1~ion; and

    The totalnumberof *f ectives(ordefects)in * samles frm thepm&” 10 lots or batde.s (orsutio- nmber as - used for conditim “a”amve) is qua.1to or.less thanthe appliwble n-r gi- in Table~11. Ifdoubleor mltiple san@ing is in use, all sanplesinspectedshouldte ticluded,not “first”sanplesonly; and

    c. Productionis at a stezdyrate;and

    d.’ Reducedinspectionis consickreddesirable.

    4.7.4 RducA to Nor&l. men reducedinspectionis in effect,norml inspectionshallbe institutedif any of the followingoccuron originalinspction:

    a. A lot or batch is rejected;or

    b. A lot or batch is cmsidered acceptableunder the proceduresOf4.10:1.4,or

    c. Productionkecmes irregularor delayed;or

    d. Other conditionswarranttit normalin~~~ion shallbe instituted.

    6

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  • ~-S’ID-105E

    4.8 Discontinuationof Inspection. If the cumnul.atimrnnrberof lotsmta~~ in a sequenceof mnsecutivelots on originaltightened~ionreachesfive,the acqxanoe pmcedums~ion w e p~sions of this

    of this sllamlardshallbe dismntilnled.stmdard shallnot be resumeduntil

    correctiveactionhas teentaken. TigthenedinspecU“onshall thenteusdasif4.7.1had keen invciked.

    4.9 ~.mg Plans. .

    4.9.1 Inspectionlevel: me “inspectionlevel&termines the relationshipketu=enthe lot or t.atchsize and the ssnplesize. mehsp2ction levelto be usedfor

    . -Y Particuk Ze@mnent tillbe as prescribedby the mmractor’s writtenprceddres. l?ireeirqection levels:I, II, and III,are given in TableI forgenemiluse (s&4.1). Normally,InspectionEvel II is used. However,Inspectionml I my & usedwhen lessdiscriminationis needsd,or I.@_dIIImy * used for greauerdiscrimination.Four additionalsfeciallevels:S-1, S-2, S-3, and S-4,aregiven in the dam tableand my ~ used khrerelativelysm.11sanplesizesare ~sary and largesanplingrisks~ or rustbe tolerated.

    ~

    NYIE: In the selectionof inspectionlevelsS-1,co S-4,~ rust be ex-~ised toavoidAQ1.sincnnsist4ntwith+ase impection levels.of the special “

    In”othsrwords,thepurpsa~ion levelsis to keep sanplessmll wtiennem.ssary.For

    ~=, tb5 CO& letterSun&r S-1 go no furtherthanD, equivalentto a Si.@esampleof size 8, but it is of no use to -Se S-1 if tha AQL is 0.10peromr forwfi~ the mininnmsampleis 125.

    4.9.2 ~ ~ters. Ssnplesizesare &signatej by-tzxb?letters. TableI shallbe used to findthe applicablecode letterfor the ~icu.lar lot or batdlsizead the prescrikeslirqection level.

    4.9.3 Cbta.Wq SanplingPlan. ‘lk AQLandthe cods lettershallbe usedtoobtainthe sartplingplan .&m TablesII, 111, or IV. Wnenno smpling planiSam.ilablefor a givencombinationof AQL and co& letter,the tablesciinxZtheuser to a differentletter. Tne San@esize tokusd is givenbythenewadeletter,not by the originalletter. If thisp~ leadsto differentsanplesizesfor differentclassesof defems, the cede letteraimespmdq to *_ ~le size-ie my ke used for all CI.SSSCSof ckfeci.s.k analternativeto a singlesanplingplanwith an a~ nurr&rofo, theplanwiti m ~ nm&r of 1 with its cor~ ly largersanplesizefor a-igqated AQL (whereavailable),may be used.

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  • MIL-S’ID-1OSE

    4.9.4 Typ2Sof SalIplingPlans. Threet~s of sanpltigplans: Single,Eooble,and mltiple, are given in TablesII, III,and IV, respectively.When severaltypesof plansam2 availablefora givenAQL and code letter,any one my ke used.A decisionas to type of plan,eithersingle,double,or nultiple,when amilablefor a givenAQL and ccxieletter,willusyallyhe based upon the cmparison bet-the administrativediffim.ltyandthe averagesanplesizesof the availableplans.Tne averageaanplesize of mltiple plans is less than for double (exceptiri.thecase correqmndingto singleacce@nce nmber 1) and both of theseare alwayslessthm a singlesanplesize (seeTableIX). Usuallythe ~Stiatimdifficultyfor singlesanplingandthe met per unit of the .san@eare lessthanfordoubleor multiple.

    4.10 Determinationof ~ ability.

    4.10.1 PercentDefectiveInspection.To determineacceptabilityof a lot orbatchunderperrsmtdef=hive inspection,the a@icable sanplingplan ehallbeused in accordancewith 4.1O.1.1,4.10.1.2,4.10.1.3,and 4.10.1.4.

    4.10.1.1 SingleSaq3ltig Plan. Thenunbarof sampleunits inspectedshallbeequalto the ~le size givenby theplan. If the numberof defective foundinthe sanpleis equalto or lessthanthe acceptancenumber,the lot or bst@ Shallbe considereda-ptable. If thenunkerof defective is equalto or greatertithe rejectionnunbr, the lot or battishallbe rejected.

    4.10.1.2 DoubleSap q1’ Plan. A n-r of sanpleunits equalto the firstsanplesize givenby the plan shallk ~ed. If the numberof defectivefoundin the firsteanpleis equalto or lessthan the firstaccqtanm number,the lot or bat~ shallbe mnsideredacceptable. If the nuntxrof defectivefoundin the first.san@eis equalto or greaterthan the firstrejectionrmbertthe lot or batti shallbe rejected.If the nmber of defective foundh the~irstsmple is ketweenthe firstaccqtane and rejectionnumbers;a secondsmple of the same size shallbe insp3cted.The nurberof defective foundinthe firstand secondsanplesshallM acnnmlated. If the cumlative nmber of.defective is equalto or lessthanthe secondaqane number,the lot or batdshall* mnsidered acceptable. If the emulative nunterof defective is Wto or greaterthan the ae.mndrej-ion nunber,the lot or batch shall&rejetted.

    4.10.1.3 ~tiple Sanple Plan. Undermltiple sapling, the proedure shallmsimilarto that specifiedin 4.10.1.2,exceptthat the nmber of suassivesanplesrequiredto reach a ckcisionmy be as many as seven.

    4.10.1.4 ~al Procedurefor-cd Irqectim. Under tied insp52tion,theSwim P~ ~Y terminatewithouteitheracceptanceor rejectioncriteriahatig teen mt. In these circmstantes,the lot or batch will k considereda~able, but normal impsctionwill k reinstatedstartingwith the nx lot orbatch (See4.7.4.b).

    8

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  • MIL+3IW1OSE

    4.10.2 Oefectsp HundredUnitsInspection. To determinet+? a “ ityof alotorbatch un&r*fectspsr hundredunits inspection,the promdum~~fidforpermnt defective inSpettiM aiwve shall& used,exceptthat the word“defects”shallk substitutesfor “Ck!fectives”.

    4.11 Limiting wity Protection.IIY2~hg plansW ~a~ P~-s publimtion = &signed for use wherethe unitsof productare

    ~XG in a continuingseriesof lotsor batchesover a periodof tim2.‘Mouemr,if the lot or batcA is of an isolatedrbstum,it is cksirableto limitthese.kcdon of sanplingplansto those,associatedwith a dsal~t~ _ ~~1 ~tprcmt& not less than a specifiedlimitingqualityprotection. SsnplingplansforthisPUZFOSScm * seksed by -sing a Limiting~ity (UD - a ~’sriskto te associatedwithit. TablesVI antiVII give valuesof LQ for thethe Cxmnnly used comumr’s risksof 10 percentand 5 ~t respectively.If adifferentvalueof comunT#s risk is rquired, tk O.C. curvesardtkirti-latedvaluesmy be use5. Tmmncept ofmmlyalsobe usem inspacify+lgtheAOL and I~im” Levelsfora seriesof lotsor bat-s, thus fixingndsumnn.sanplesizewherethereis Sam reasonfor avoiding(~fi mm ~ a 9i=mnsmer’s risk)ITCIrethana limitingproportionof &fecti- (orc@f~s) in -Ysinglelot or batti.

    4.12 Curves.

    4.12.1 @crating maramsristic cumes. ‘me oparating~eristic ~ fornorml irqection, shownin TableX, mte the percentageoflots or batdeswhichmay be enp2rtedto be arceptedunderthe variousSS@ing plansfor a givenproa?ssquality. T& mrves ahcnmare for singleSa@ing; cumes for dmble andmlciple ssa@ing are retchedas closelyas practicable.The O.C. ~ -forAOLs greaterthan 10.0am based on the Poissondistributionad are a#i-cablefor defectsper hundredunits inspe&cion;those for AQLs of 10.0or lessand~le SiZeSof 80 or 1=s are based on the binonialdistrilmtim ad areqlirable for permnt defectiveinspection;those for~ of 10.0or less @sample sizes largerthan 80 are based the Poissondistributionand are S@icableeitherfor defectsp3r hurdredunits ~ion, or for parent defective-on (* poissm -him being an adequateapproximationto thebinmual distributionunderthesemnd.itiona). Tabulatedvalues,~ to4-4 VS-hIasor pmbabiliciesof ~anm (pa,in percent)are givenforeatiOfthealrvee shown,m in addition,for tighten@ inspection,h for~f~p2r lnmiredunits forAQIsof 10.0or less and San@e sizesof 80 or 1-.

    4.12.2 Awsraqe~le SizeCumes. AverageSan@e Size C@FSS for=le andmultipleaa!plingare in TableIX. Theseshow the averagesamplesizesuhirhmybe ~ed to ocmr underthe variousaanplingplans for given levelsof prcKJ2SSquality. lhe curvesassureno curtailrmntof insertion arslare ~roximte tothe extentthat they are baseclupon tttePoissondistribution,and that the Sa@esizesfor doubleand mltiple aanplingare assuredto be O.631nand O.25n~itiY, tie n is the equim.km qle size.

    9,

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  • MIL-STD-105E

    =ICN 5

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  • M3A3ID-105E

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