MICROCONTROLLER BASED.doc

31
MICROCONTROLLER BASED ALARM ANNUNCIATOR SYSTEM VII th SEMESTER, FINAL YEAR GUIDE : Ms. REEMA AGARWAL (FACULTY, Department of Electronics and Communication Engineering) SUBMITTED BY : AKANKSHA SHARMA – 03 ALPANA GUPTA – 05 PRIYANKA SHARMA – 45 SHWETA SABOO – 54 SONAL SHARDA – 57

Transcript of MICROCONTROLLER BASED.doc

Page 1: MICROCONTROLLER BASED.doc

MICROCONTROLLER BASED ALARM ANNUNCIATOR SYSTEM

VIIth SEMESTER, FINAL YEAR

GUIDE : Ms. REEMA AGARWAL (FACULTY, Department of Electronics and Communication Engineering)

SUBMITTED BY :

AKANKSHA SHARMA – 03ALPANA GUPTA – 05 PRIYANKA SHARMA – 45SHWETA SABOO – 54SONAL SHARDA – 57

Page 2: MICROCONTROLLER BASED.doc

SYNOPSIS

MICROCONTROLLER BASED ALARM ANUNCIATOR SYSTEM

Today, all instrumentation systems pertaining to industrial process control as well as domestic applications, involve some type of automatic fault - finding facility. This facility detects the faulty condition of the system and draws the attention of the operator towards it, enabling him to take suitable remedial action to ensure the proper operation of the system.

One such method is annunciation in which activation of a visual or a mechanical indicator (called annunciator) takes place when a remote switch or device has been activated as result of fault in certain part of the system. An audio alarm may also be associated with annunciators.

This microcontroller based annunciator system detects up to eight different faulty conditions and informs the operator about them. It is assumed that each faulty condition results in closing of one of the eight interlock links. Eight flashing Light Emitting Diodes (LEDs), corresponding to each of the eight links, have been used as annunciators.

Each annunciation also results in an audible alarm. Here only the faults persisting for more than 20 milliseconds are considered as critical and faults persisting for less than 20 milliseconds are rejected.

SOURCE from where the IDEA was taken:

The idea of the Project was proposed by Mr. S. N. Vijayvargiya, General Manager, Rajasthan Electronics and Instruments Ltd. (REIL), Kanakpura Industrial Area, Jaipur.

The design of the Block Diagram was suggested by Mr. Subhash Bansal, Engineer, R & D, REIL.

The next job was to construct the circuit diagram, which required an intense research from various fields like on the internet explorer and in various magazines.

After the concentrated study line, finally the circuit was found in the EFY issue December 2002.

DEPTT. of ELECTRONICS and COMMUNICATION ENGG.JAIPUR ENGG. COLLEGE and RESEARCH CENTER

2

Page 3: MICROCONTROLLER BASED.doc

FLOW CHART

DEPTT. of ELECTRONICS and COMMUNICATION ENGG.JAIPUR ENGG. COLLEGE and RESEARCH CENTER

Start

BLINK ALL LEDS WITH AUDIBLE SOUND

BLINK ALL LEDS EXCEPTTHOSE WHICH CORRESPOND

TO ALREADY DETECTED FAULTSLIT CONTINUOUSLY ALONG

WITH AUDIBLE SOUND

CONTINUOUSLY LIGHT THE CORRSPONDINGLED WITH NO SOUND

LED CORRESPONDINGTO THE NEW FAULT

WILLBLINK & CONTINUOUS

GLOW OF THE ALREADYACCEPTED FAULTS

LEDsALONG WITH AUDIBLE

SOUND

BLINK ALL LEDS EXCEPTTHE LEDS

CORRESPONDINGTO THE FAULTS ALREADYACCEPTED WHICH WILLCONTINUOUSLY GLOWWITH AUDIBLE SOUND

CLEAR ALL LEDS AND DISABLETHE AUDIBLE SOUND

GO TO START

RESET ALL THE OUTPUTS SCAN TEST BUTTON CLOSED?

SCAN LINK FOR FAULTS CLOSED?

NO

BLINK THE CORRESPONDING LEDALONG WITH AUDIBLE SOUND

1. CHECK LINKS FOR NEW FAULTS2. CHECK ACCEPT BUTTON 3. CHECK TEST BUTTON CLOSED?

NO

YES

YES

1. IF NEW FAULT IS FOUND

3. IF TEST BUTTON IS CLOSED

2. IF ACCEPT BUTTON IS CLOSED

1. IF ANOTHER FAULT IS FOUND 3. IF TEST BUTTON IS CLOSED

2. IF CLEAR BUTTON IS CLOSED

1. CHECK LINKS FOR ANOTHER FAULTS.2.CHECK FOR CLEAR BUTTON.3CHECK TESTBUTTON CLOSED

3

Page 4: MICROCONTROLLER BASED.doc

BLOCK DIAGRAM

DEPTT. of ELECTRONICS and COMMUNICATION ENGG.JAIPUR ENGG. COLLEGE and RESEARCH CENTER

4

Page 5: MICROCONTROLLER BASED.doc

PROGRAM CODE

Address Opcode LabelMnemonics comments

ORG 0000H ; initialize the reset vector 0000 020010 LJMP INT ; jump to the actual

; program ; address#30h 0003 22

RET at ORG 0010h ; define the actual program 0010 758130 INT: MOV SP, #30h ; preset the stack pointer 0013 D2B0 SETB P3.0 ; disable sound 0015 7B00 MOV R3, #00H ; clear register 0017 7C00 MOV R4, #00H ; clear register 0019 E4 CLR A ; clear accumulator001A 908000 START: MOV DPTR, ; data pointer is assigned with

#8000H ; led port add001D F0 MOVX @ DPTR, A ; disable all leds001E D2B3 SETB P3.3 ; set the i/p to read0020 A2B3 MOV C, P3.3 ; read the test i/p0022 400A JC TEST ; check for test i/p0024 7590FF MOV P1, #0FFH ; set port1 to read the i/p fault0027 E590 MOV A, P1 ; read the i/p fault0029 B40013 CJNE A, #00H, SCAN ; check for fault002C 80E2 SJMP INT ; jump to initial002E 74FF TEST: MOV A, #0FFH ; load the data to light all

; these0030 F0 MOVX @DPTR, A ; o/p at led port0031 C2B0 CLR P3.0 ; enable sound0033 1200E5 LCALL DELAY ; delay for blink and beep0036 E4 CLR A ; load the data to put off

; leds0037 F0 MOVX @DPTR, A ; o/p at led port0038 D2B0 SETB P3.0 ; disable sound003A 1200E5 LCALL DELAY ; delay for blink and beep003D 80DB SJMP START ; jump to start 003F 7590FF SCAN: MOV P1, #0FFH ; set port to read fault0042 E590 MOV A, P1 ; read the fault0044 FB MOV R3, A ; save for future use0045 60C9 JZ INT ; check for fault0047 EB SHOW: MOV A, R3 ; load detected fault

DEPTT. of ELECTRONICS and COMMUNICATION ENGG.JAIPUR ENGG. COLLEGE and RESEARCH CENTER

5

Page 6: MICROCONTROLLER BASED.doc

0048 F0 MOVX @DPTR, A ; o/p at led port0049 C2B0 CLR P3.0 ; enable sound004B 1200E5 LCALL DELAY ; delay for blink and beep004E E4 CLR A ; data for led off004F F0 MOVX @DPTR, A ; o/p at led port0050 D2B0 SETB P3.0 ; disable sound0052 1200E5 LCALL DELAY ; delay for blink and beep0055 D2B4 CHKACP: SETB P3.4 ; set to read accept i/p0057 A2B4 MOV C, P3.4 ; read accept i/p0059 401A JC ACCEPT ; check for accept i/p005B D2B3 CT1: SETB P3.3 ; set to read test i/p005D A2B3 MOV C, P3.3 ; read test i/p005F 4002 JC TEST1 ; check for test i/p0061 80DC SJMP SCAN ; jump for scan routine0063 74FF TEST1: MOV A, #00FFH; data for led lit0065 F0 MOVX @DPTR, A ; o/p at led port0066 C2B0 CLR P3.0 ; enable sound0068 1200E5 LCALL DELAY ; delay for blink and beep006B E4 CLR A ; data for led off006C 4B ORL A, R3 ; combine with already found

; fault006D F0 MOVX @DPTR, A ; o/p at led port006E D2B0 SETB P3.0 ; disable sound0070 1200E5 LCALL DELAY ; delay for blink and beep0073 80CA SJMP SCAN ; jump to scan routine0075 7590FF ACCEPT: MOV PI,

#0FFH ; set to read i/p fault0078 E590 MOV A, PI ; read the fault007A 4B ORL A, R3 ; combine with already found

; fault007B 6B XRL A, R3 ; set flag to find new faults007C 603B JZ CHKCLR2 ; there is no few fault, check

; for clear i/p007E 7590FF MOV PI, #0FFH ; set to read i/p0081 E590 MOV A, PI ; read i/p0083 FC MOV R4, A ; save for future use0084 4B ORL A, R3 ; combine with already found

; fault0085 EB MOVA, R3 ; load already found fault0086 4C ORL A, R4 ; combine with new fault0087 F0 MOVX @ DPTR, A ; o/p at led port0088 C2B0 CLR P3.0 ; enable sound008A 1200E5 LCALL DELAY ; delay for blink and beep

DEPTT. of ELECTRONICS and COMMUNICATION ENGG.JAIPUR ENGG. COLLEGE and RESEARCH CENTER

6

Page 7: MICROCONTROLLER BASED.doc

008D E4 CLR A ; data for led off008E 4B ORL A, R3 ; combine with already found

; fault008F F0 MOVX @ DPTR, A ; o/p at led port0090 D2B0 SETB P3.0 ; disable sound0092 1200E5 LCALL DELAY ; delay for blink and beep0095 D2B4 CHKACP1: SETB P3.4 ; set to read accept i/p0097 A2B4 MOV C, P3.4 ; read accept i/p0099 401B JC CHKCLR1 ; check for accept i/p009B D2B3 CT2: SETB P3.3 ; set to read accept i/p009D A2B3 MOV C, P3.3 ; read test i/p009F 4002 JC TEST2 ; check the test i/p00A1 80D2 SJMP ACCEPT ; jump to accept routine00A3 74FF TEST2: MOV A, #0FFH ; data to lit leds00A5 F0 MOVX @ DPTR, A ; o/p at led port00A6 C2B0 CLR P3.0 ; enable sound00A8 1200E5 LCALL DELAY ; delay for blink and beep00AB E4 CLR A ; data to off led 00AC EB MOV A, R3 ; combine with already found

; fault00AD 4C ORL A, R4 ; combine with new fault00AE F0 MOVX @ DPTR, A ; o/p at led port 00AF D2B0 SETB P3.0 ; disable sound 00B1 1200EF LCALL DELAY ; delay for blink and beep00B4 80BF SJMP ACCEPT ; jump to accept routine00B6 EB CHKCLR1: MOV A, R3 ; load the already found fault00B7 4C ORL A, R4 ; combine with new fault00B8 FB MOV R3, A ; save for future use00B9 EB CHKCLR2: MOV A, R3 ; load already found fault00BA F0 MOVX @DPTR, A ; o/p at led port00BB D2B0 SETB P3.0 ; disable sound00BD D2B5 SETB P3.5 ; set to read clear i/p00BF A2B5 MOV C, P3.5 ; read clear i/p00C1 401B JC CLEAR ; check for clear i/p00C3 D2B3 CT3: SETB P3.3 ; set to read test i/p00C5 A2B3 MOV C, P3.3 ; read test i/p00C7 4002 JC TEST3 ; check for test i/p00C9 80AA SJMP ACCEPT ; jump to accept routine00CB 74FF TEST3: MOV A, #00FFH; data to lit leds00CD F0 MOVX @DPTR, A ; o/p at led port00CE C2B0 CLR P3.0 ; enable sound00D0 1200EF LCALL DELAY ; delay for blink and beep

DEPTT. of ELECTRONICS and COMMUNICATION ENGG.JAIPUR ENGG. COLLEGE and RESEARCH CENTER

7

Page 8: MICROCONTROLLER BASED.doc

00D3 E4 CLR A ; data led off00D4 4B ORL A, R3 ; combine with fault found00D5 F0 MOVX @DPTR, A ; o/p at led port00D6 D2B0 SETB P3.0 ; disable sound00D8 1200E5 LCALL DELAY ; delay for blink and beep00DB 020075 LJMP ACCEPT ; jump to accept routine00DE E4 CLEAR: CLR A ; data to led off00DF F0 MOVX @DPTR, A ; o/p at led port00E0 D2B0 SETB P3.0 ; disable sound00E2 020010 LJMP INT ; jump to initial routine00E5 7DFF DELAY: MOV R5,

#00FFH ; count for delay00E7 7EFF D1: MOV R6, #00FFH ; count for delay00E9 DEFE D2: DJNZ R6, D2 ; decrement count00EB DDFA DJNZ R5, D1 ; decrement count00ED 22 RET ; return from delay routine

DEPTT. of ELECTRONICS and COMMUNICATION ENGG.JAIPUR ENGG. COLLEGE and RESEARCH CENTER

8

Page 9: MICROCONTROLLER BASED.doc

WORKING OF ALARM ANNUNCIATOR SYSTEM

Basic requirements of an annunciator system: -

I. A set of inputs (16 or 8 depending upon the requirement) to be scanned and controlled. The inputs may 9include contact switches, relays etc.

II. Input buffers and/or isolating devices to interface the actual inputs to the microcontroller.

III. A microprocessor/microcontroller to look after the entire fault-finding process, such as reading the inputs, interpreting the faults, outputting the corresponding fault condition with audible alarm, and self-testing of the system itself to ensure the overall functioning of the system.

IV. Output indication devices such as LEDs, relays and audible alarm along with their interfacing devices (like latches).

Circuit description

Figure shows the circuit diagram of the annunciator built around an 80C31 microcontroller. Since the 80C31 doesn’t have a program memory; an EPROM is used to store the firmware of the system. Octal 3-state latch IC 74373 is used for low order address (A0-A7) decoding. We may use any one of 2764, 27128 and 27256 EPROMs by setting jumpers J1 and J2. The combination of R13 and capacitor C1 provides the necessary slow-rising power-on-reset signal to the microcontroller’s reset input pin 9. The eight inputs to be scanned are connected to the eight input pins (P1.0 through P1.7) of port1 of the microcontroller via eight CMOS inverters (CD40106). Three additional inputs (P3.3 through P3.5) of port3, which are controlled by the switches marked TEST (S1), ACCEPT (S2), and CLEAR (S3), are interfaced to the controller’s input pins 13, 14 and 15 respectively, through three inverter buffer gates (CD40106).

Each output of the system is connected to the respective LED through latch 74373 and Darlington transistor driver ULN2803. The address decoding logic for the output is performed by two OR gates (7402) using address signal A15 and write signal WR of the 80C31. Here the address assigned to the LED output port is 8XXXh, where X means ‘don’t care’. The buzzer for generating the audible alarm is connected to P3.0 (pin 10) of IC1 through inverter gate N14 and NPN transistor driver CL100. The system clock is generated using the 12 MHz crystal connected across oscillator pins 18 and 19 of the microcontroller.

DEPTT. of ELECTRONICS and COMMUNICATION ENGG.JAIPUR ENGG. COLLEGE and RESEARCH CENTER

9

Page 10: MICROCONTROLLER BASED.doc

In this design the four ports available in the 8031 microcontroller are configured as below:

PORT 0: For outputting the 8-bit low order address and data to the program memory and outputting the input conditions read by the microcontroller.

PORT 1: For reading the status of eight input links.

PORT 2: For outputting the 8-bit higher order addresses.

PORT 3: Pin 3.0 is used to enable the audio output. Pins P3.3, P3.4 and P3.5 are used to read inputs TEST, ACCEPT and CLEAR respectively and P3.6 (WR signal) is used for address decoding of the output port (LEDs). The remaining pins in this remain unused.

PSEN is used for reading the external program memory, while ALE is used for latching the low-order address bits in IC2.

One terminal of the eight input links is connected to GND pin of connector CON2 and the other terminals of the links is connected to the respective input pin of connector CON2. Similarly, one terminal of control pushbuttons TEST, ACCEPT and CLEAR is connected to the respective input pin of the connector and the other terminals of these pushbuttons are shorted and connected to GND. The 5V power supply input (via 4.7 – kilo - ohm pull-up resistors) and GND are connected to respective pins of connectors.

To interface this circuit with the actual control circuit of systems like elevator control or centralized air-conditioned control, GND and signal inputs of the eight links are removed and substituted with corresponding relay contacts of the actual system. The relays operate off the power supply of the actual system that requires detection/indication of faults.

Firmware

The firmware of the system is developed using the 8031 cross assembler .it comprises the following routines:

i. SELF-TEST ROUTINE: To check the reliable working of the system. Whenever TEST button is pressed, all the LEDs must blink with a beep sound.

ii. SCANNING ROUTINE: To check the faulty conditions. In case a fault is found (link closed), the corresponding output LED blinks with an audible sound.

iii. ACCEPT ROUTINE: To accept the faulty conditions. Whenever a fault is found, this routine checks and accepts the faulty condition. The continuous glowing of the LED corresponding to the fault found but no corresponding sound from the buzzer indicates that the given fault has been noted for action.

DEPTT. of ELECTRONICS and COMMUNICATION ENGG.JAIPUR ENGG. COLLEGE and RESEARCH CENTER

10

Page 11: MICROCONTROLLER BASED.doc

iv. CLEAR ROUTINE: To clear/reset the accepted fault conditions after rectifying the faults. Whenever the clear button is pressed, the controller resets all the fault conditions accepted earlier, and once again goes back to the scanning mode.

The entire program is written in Assembly language and its corresponding Hex code is dumped in the EPROM.

Figure shows flow-chart of the program. After resetting the system, the firmware clears all the outputs including the audible alarm sound. Then it scans for the faulty inputs as well as the TEST input. If the program finds the TEST input pressed, all the eight fault indicating LEDs blink with audible sound. Otherwise, the program continues looping in the scanning routine.

If some fault occurs (resulting in closing of a link) during the scanning mode, the corresponding LED in the output port (8000h) blinks with an audible sound.

Now the program in a loop looks for another fault or ACCEPT input or TEST input. If another fault occurs, the same routine is repeated. If TEST input button is pressed, all LEDs in the output port blink, except those corresponding to the fault found earlier. The LEDs corresponding to the fault found earlier glow continuously with the audible sound. However if ACCEPT input is pressed, the output LEDs corresponding to the faulty (accepted) inputs continuously glow with no sound.

Now the program enters the final phase, where it checks for CLEAR, TEST and FAULT input button depressions. If another fault comes at this stage, the corresponding LED blinks with audible sound and the LEDs corresponding to the already accepted faults glow continuously. If TEST input comes at this phase, all the LEDs blink with audible sound and the LEDs corresponding to the already accepted faults glow continuously. If CLEAR input button is pressed, it clears all the output LEDs and disables the audible sound. The program once again enters the START mode, where it looks for fresh faults and TEST inputs.

In this circuit, as faulty conditions are simulated by closing of the eight links, the links for the accepted faults must be removed before pressing the CLEAR push button. Otherwise the program will once again detect the same fault because the links are still simulating the same faulty conditions.

DEPTT. of ELECTRONICS and COMMUNICATION ENGG.JAIPUR ENGG. COLLEGE and RESEARCH CENTER

11

Page 12: MICROCONTROLLER BASED.doc

DESCRIPTION OF ICs

1) 80C31 MICROCONTROLLER

The Philips 80C31 is a high-performance static 80C51 design fabricated with Philips high-density CMOS technology with operation from 2.7 V to 5.5 V.

The 80C31 ROMless devices contain a 128 × 8 RAM, 32 I/O lines, three 16-bit counter/timers, a six-source, four-priority level nested interrupt structure, a serial I/O port for either multi-processor communications, I/O expansion or full duplex UART, and on-chip oscillator and clock circuits.

In addition, the device is a low power static design which offers a wide range of operating frequencies down to zero. Two software selectable modes of power reduction-idle mode and power-down mode are available. The idle mode freezes the CPU while allowing the RAM, timers, serial port, and interrupt system to continue functioning. The power-down mode saves the RAM contents but freezes the oscillator, causing all other chip functions to be inoperative. Since the design is static, the clock can be stopped without loss of user data and then the execution resumed from the point the clock was stopped.

Features   of 80C31 microcontroller

8051 Central Processing Unit:o 128 × 8 RAM (80C31) o Three 16-bit counter/timers o Boolean processor o Full static operation o Low voltage (2.7 V to 5.5 V@ 16 MHz) operation

Memory addressing capability:o 64k ROM and 64k RAM

Power control modes: o Clock can be stopped and resumed o Idle mode o Power-down mode

CMOS and TTL compatible TWO speed ranges at VCC = 5 V:

o 0 to 16 MHz o 0 to 33 MHz

Three package styles Extended temperature ranges

DEPTT. of ELECTRONICS and COMMUNICATION ENGG.JAIPUR ENGG. COLLEGE and RESEARCH CENTER

12

Page 13: MICROCONTROLLER BASED.doc

Dual Data Pointers 4 level priority interrupt 6 interrupt sources Four 8-bit I/O ports Full-duplex enhanced UART:

o Framing error detection o Automatic address recognition

Programmable clock out Asynchronous port reset Low EMI (inhibit ALE) Wake-up from Power Down by an external interrupt

DEPTT. of ELECTRONICS and COMMUNICATION ENGG.JAIPUR ENGG. COLLEGE and RESEARCH CENTER

13

Page 14: MICROCONTROLLER BASED.doc

6 interrupt sources Four 8-bit I/O ports Full-duplex enhanced UART:

o Framing error detection o Automatic address recognition

Programmable clock out Asynchronous port reset Low EMI (inhibit ALE)

Wake-up from Power Down by an external interrupt

DEPTT. of ELECTRONICS and COMMUNICATION ENGG.JAIPUR ENGG. COLLEGE and RESEARCH CENTER

14

Page 15: MICROCONTROLLER BASED.doc

2) 74373 OCTAL LATCH

8-bit 3-state transparent latch

+---+--+---+ +---+---+---*---+/OE |1 +--+ 20| VCC |/OE| LE| D | Q | Q1 |2 19| Q8 +===+===+===*===+ D1 |3 18| D8 | 1 | X | X | Z | D2 |4 17| D7 | 0 | 0 | X | - | Q2 |5 74 16| Q7 | 0 | 1 | 0 | 0 | Q3 |6 373 15| Q6 | 0 | 1 | 1 | 1 | D3 |7 14| D6 +---+---+---*---+ D4 |8 13| D5 Q4 |9 12| Q5GND |10 11| LE +----------+

The 8031 architecture allows for external program and data access through the use of Port 0 and Port 2 as an external memory interface. The 8031 architecture multiplexes the data and LSB of address on Port 0, requiring a 74373 latch for demultiplexing. This means that Port 0 will be directly connected to at least two devices. More devices may be placed on the bus if an external data SRAM or memory-mapped peripherals are used.

DEPTT. of ELECTRONICS and COMMUNICATION ENGG.JAIPUR ENGG. COLLEGE and RESEARCH CENTER

15

Page 16: MICROCONTROLLER BASED.doc

3) ULN 2803

8-bit 50V 500mA TTL-input NPN Darlington driver

The drivers need no power supply; the VDD pin is the common cathode of the eight integrated protection diodes.

The output section is controlled by an eight-line "Darlington Driver" integrated circuit (IC) called a ULN2803. The digital state of each of the eight lines from the printer port is used to control the IC's internal "drivers" which in turn control the Relays and LEDs. Power for the Relays and LEDs is provided by the 12 volt regulator (LM 7812) via a plug pack power supply of at least 15 volts and capable of supplying at least 1 amp. In this interface, each of the eight output lines at the printer port is connected via a 560ohm to a LED. Four of the output lines also have relays attached.

DEPTT. of ELECTRONICS and COMMUNICATION ENGG.JAIPUR ENGG. COLLEGE and RESEARCH CENTER

16

Page 17: MICROCONTROLLER BASED.doc

4) IC 7402 Quad 2- Input NOR gate

This device contains 4 independent 2-input NOR gate.

INPUTS OUTPUT

A B Y

L L H

L H L

H L L

H H L

All four NOR gates may be used independently.On any one gate if either input is high the output is low.Propagation delay – 10 nanoseconds.Typical current per package – 12mA.

DEPTT. of ELECTRONICS and COMMUNICATION ENGG.JAIPUR ENGG. COLLEGE and RESEARCH CENTER

17

Page 18: MICROCONTROLLER BASED.doc

5) EPROM 25276

EPROM (Erasable Programmable Read Only Memory) can be programmed and erased enabling them to be re-used. Erasure is accomplished using an UV (Ultra Violet) light source that shines through a quartz erasing window in the EPROM package.

There also are OTP (One Time Programmable) EPROMs, sometimes called OTPROMs (One Time Programmable Read Only Memory) that are identical to an erasable EPROM but lack an erasing window to reduce costs.

In an EPROM, the cell at each intersection has two transistors. A thin oxide layer separates the two transistors from each other. One of the transistors is known as the floating gate and the other as the control gate. The floating gate's only link to the row (word line) is through the control gate. As long as this link is in place, the cell has a value of 1. To change the value to 0 requires a curious process called Fowler-Nordheim tunneling. Tunneling is used to alter the placement of electrons in the floating gate. An electrical charge, usually 10 to 13 volts, is applied to the floating gate. The charge comes from the column (bit line), enters the floating gate and drains to a ground.

This charge causes the floating-gate transistor to act like an electron gun. The excited electrons are pushed through and trapped on the other side of the thin

oxide layer, giving it a negative charge. These negatively charged electrons act as a barrier between the control gate and the floating gate. A device called a cell

sensor monitors the level of the charge passing through the floating gate. If the flow through the gate is greater than 50 percent of the charge, it has a value of 1. When the charge passing through drops below the 50-percent threshold, the value changes to 0. A blank EPROM has all of the gates fully open, giving each cell a

value of 1.

DEPTT. of ELECTRONICS and COMMUNICATION ENGG.JAIPUR ENGG. COLLEGE and RESEARCH CENTER

18

Page 19: MICROCONTROLLER BASED.doc

Testing Equipments1. INTELLIGENT UNIVERSAL PROGRAMMER (IUP)2. Bread Board4. Personal Computer5. Multimeter7. Power supply

DEPTT. of ELECTRONICS and COMMUNICATION ENGG.JAIPUR ENGG. COLLEGE and RESEARCH CENTER

19

Page 20: MICROCONTROLLER BASED.doc

Test Procedure and Results

The Procedure started with a detailed observation of the circuit then collecting details about the components and studying their specifications. Due attention to diodes and electrolytic capacitors as they are polarity dependent. The first step began by trying out the circuit on CAD software and visualizing the simulation results. Then begin the voyage of physically testing the circuit at small scale by testing independently minor parts of the circuit for example full wave rectifier or sample hold circuit on bread board and when output was found appropriate, the next step was to integrate all the minor independent units into a major unit and test the output of the final unit. In this whole process the basic step was to test the voltage and current at various pins of active and passive devices. All testing was done by using ICs with the IC base to prevent ICs against electrostatic damage.

DEPTT. of ELECTRONICS and COMMUNICATION ENGG.JAIPUR ENGG. COLLEGE and RESEARCH CENTER

20

Page 21: MICROCONTROLLER BASED.doc

DEPTT. of ELECTRONICS and COMMUNICATION ENGG.JAIPUR ENGG. COLLEGE and RESEARCH CENTER

21

Page 22: MICROCONTROLLER BASED.doc

List of the components and their cost:

ICs

Microcontroller IC 8031 01Octal Latch IC 74373 02EPROM IC 27256 01Octal Buffer Driver IC ULN2803 01Quad NOR Gate IC 7402 02Hex Schmidt Trigger Inverter IC CD40106 02NPN Transistor SL100 01

IC Base Socket DIL

40 pin 0120 pin 0228 pin 0118 pin 0114 pin 03

Capacitors

Ceramic Disk 22 pf 02Ceramic Disk 0.1 uf 08Electrolytic 10 uf, 25V 01

Resistors

1.8 K 086.8 K 0110 K 014.7 K 118.2 K 01

Diodes

IN 4007 04

Others

LEDs Red 08Switch Push to On 03

DEPTT. of ELECTRONICS and COMMUNICATION ENGG.JAIPUR ENGG. COLLEGE and RESEARCH CENTER

22

Page 23: MICROCONTROLLER BASED.doc

Crystal Oscillator 12MHz 01Peizo Buzzer 01General Purpose PCB 01

DEPTT. of ELECTRONICS and COMMUNICATION ENGG.JAIPUR ENGG. COLLEGE and RESEARCH CENTER

23