A set of XControls to produce Six Sigma Style Charts in the LabVIEW development environmentUses the Microsoft MSChart as the underlying chart engineImplements all of the common data analysis chart types:

Control Chart Error Chart HistogramPareto Chart Probability DistributionMore…

Data conditioning and formatting is built into the data analysis XControls…You only have to wire in the raw data, the XControl functionality does the rest to render a plot You can also produce XY Graphs, Waveform Graphs, Pie Charts, Polar Plots, more…Built in chart templates to load in directly from the block diagram at run timeA chart designer application lets you customize chart styles to apply gradients, 3D effects, hatch styles and more

Metroltek Six Sigma Charts XControls

Axis string category data type

Example

XControl

Pareto

Chart

with

string

axis data

type

Metroltek Six Sigma Charts Overview

•The Six Sigma Charts XControls are used to develop and render six sigma style

charts in the LabVIEW development environment

•The underlying chart control is the Microsoft .NET MSChart control

•Includes the Six Sigma Charts Designer application to edit and save custom chart

styles for subsequent importing when using the Six Sigma Charts LabVIEW XControls

•You can optionally import pre-built chart templates directly in the LabVIEW development

environment without having to use the Six Sigma Charts Designer

•The chart templates and accompanying XControl functionality include the commonly

used charts in Six Sigma quality applications such as histogram, Pareto charts, control

charts, etc. Other common chart types without built-in functionality are XY Graph,

Waveform Graph, Pie, Polar, more…

•Adds productivity because it frees the developer from dealing with statistical

functionality and formatting

•Produces stunning chart styles by applying gradient fills, 3D effects and other attributes

not otherwise available with the standard LabVIEW chart control

•Can have a string category axis not otherwise available with the LabVIEW chart

controls

What is Six Sigma Charts

How can Six Sigma Charts improve your application development

Components of Six Sigma Charts

Six Sigma Charts Designer Application

Select chart template or open existing XML File

Edit appearanceSave chart as XML

file

Six Sigma Charts XControls

Wire in data RunAdd XControl of

selected chart type to user form

Supported development software: NI LabVIEW and Microsoft .NET languages such as C# and VB.NET, C++.NET

XControl includes built-in data conditioning and functionality for

the data analysis charts

Components of Six Sigma Charts include a library of XControls and a chart designer application

Optionally load in XML file created with

the chart designer

Implementing a Chart – Front Panel

Histogram XControl includes functionality to create the bins from raw data and output computed results

Implementing a Chart – Block Diagram

Optional properties can be set prior to wiring in the raw data. Results can be read after the plot is rendered

Six Sigma Charts Designer Application

Import templates, edit chart styles and save for later use in the development environment

Chart Editor for high level automated editing

Property Grid for low level editing

Turn

this

Into

this

Six Sigma Charts Designer Import Template Dialog

After selecting pre-built chart template, return to the main application to edit style and save

To load template hereMake selection here…

Six Sigma Charts Designer Chart Editor

Use the Chart Editor automate the creation of gradients based on a color scheme

Color scheme for selected palette Click here to

automatically create a

gradient based on color scheme

Standard Statistical Charts

Chart Type Thumbnail Purpose

Control Chart To monitor data and detect out-of-control conditions. Control chart types include Np Chart, P Chart, U Chart, C Chart, XbarR Chart and XbarS chart

Pareto Chart To rank order test failure counts. User specifies maximum categories to plot and plot VI plots to this maximum and outputs residuals that can be used in a drill down

Histogram To view the shape of the measured test distribution. Provides a selection of Histogram rules to provide the optimum number of bins

Box Plot To view the measured test distribution in terms of percentiles and view outliers.

Linear Approximation To determine relationships between testmeasurements. Regression analysis parameters are shown in a secondary chart title.

StandardXY Charts

Chart Type Thumbnail Purpose

Bar Chart Shown is clustered bar. Can also implement stacked bar. X axis can be numeric or string category.

Column Chart Shown is clustered column. Can also implement stacked column. X axis can be numeric or string category.

Line Chart Can also implement point chart. X axis can be numeric or string category.

Spline Chart Spline charts smooth values between discrete points. X axis can be numeric or string category.

StepLine Chart StepLine charts are useful to plot square waves or for any case where adjacent points should not be connected as line segments. X axis can be numeric or string category.

Specialty Charts

Chart Type Thumbnail Purpose

Error Chart Error charts are typically used to display error bands around nominal or average values.

Limit Chart The limit chart is used to display a run chart of continuous data and display four limit lines and a centerline

Operating Characteristic An Operating Characteristic curve is used in quality assurance acceptance plans to determine the probability of acceptance for average fraction defective based on a sample size and allowed failures.

Discrete Probability Distribution

Used to display various discrete probabilitydistributions. A special case is a uniform distribution which has a step line shape.

Continuous Probability Distribution

Used to display various continuous probability distributions

Cursors and Zooming

Cursors can be on zoom or not. Cursor is set to zoom mode in above example.

Cursor set to zoom mode

After zoom action

Mouse Events

Based on mouse position over strategic chart elements and clicking, the programmer could take action

Readouts from mouse move event

Mouse position

Histogram Rules Available with Six Sigma Charts

Where h is bin width and k is number of bins. Brackets indicate ceiling.

Relationship between bin (bar) width and number of bins, k

Name Formula Comments

Sturges formula Can perform poorly if n < 30. May lead to over-smoothed histograms. Widely used.

Scott’s choice Where σ is sample standard deviation. Uses data to determine h.

Square root choice Used by Excel histograms

Freedman-Diaconis choice Where IQR is Inner Quartile Range (75% -25%). Uses data to determine h.

Fixed bin size Start with k = n/10 Trial and error. Increase or decrease k to provide a smooth envelope

Box Plot Calculations Used in Six Sigma Charts

Mean

Median

Inner Quartile Range(IQR)

Lower Whisker (2 percentile *)

Upper Whisker (98th

percentile*)

* Whisker percentile can vary according to what the user wants to indicate where outliers begin

Outliers beyond whiskers are indicated by dots

Upper Box (75th percentile)

Lower Box (25th percentile)

Box Plot used to show data distribution in terms of percentiles and to indicate outliers

Offline Analysis Versus Real Time Monitoring

Offline Analysis Real Time Monitoring

•Test Sequencer stands alone and saves data to database or other media•Engineer monitors data and performs analysis in an offline computer, remote from the test station•Response to out-of-control conditions and immediate action may not be possible•By the time a special cause condition is observed, the process or component mix may have reverted and the questionable product may have been moved to subsequent operations

•Test Sequencer has the ability to perform real time SPC on the data•Both detection of out-of-control conditions and analysis can be performed synchronously with testing at the test station•Actions such as containment and feedback to the process is more immediate•Actions can be more timely and effective•Can detect and set aside outliers for subsequent analysis

Use for historical review, process capabilitystudies, and continuous improvement analysis

Build real time SPC into test sequencer to detect and act upon special cause problems

Metroltek Six Sigma Charts Enables Real Time SPC Monitoring in Manufacturing Test

Manufacturing Test Application of Six Sigma Charts

Assembly and FabricationProcesses

Test Sequencer

Built-in Real Time SPC Monitor and Analysis Tools Powered by Metroltek Six

Sigma Charts

Offline Analysis Powered by Metroltek Six Sigma

Charts

Tested Acceptable Product

Quarantined Suspect Product

Defective Product

Feedback to Process

Database or other Media

Individual Outlier Product

Raw Data

Real time manufacturing test SPC can be implemented with the Six Sigma Charts Toolkit

Contact Information

Six Sigma Charts is certified by National Instruments as Compatible with LabVIEW

Contact Jim Dougherty at jim-dougherty@metroltek.com or call 214.679.9811 for

information on how to obtain a demo or purchase the product