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  • A set of XControls to produce Six Sigma Style Charts in the LabVIEW development environmentUses the Microsoft MSChart as the underlying chart engineImplements all of the common data analysis chart types:

    Control Chart Error Chart HistogramPareto Chart Probability DistributionMore

    Data conditioning and formatting is built into the data analysis XControlsYou only have to wire in the raw data, the XControl functionality does the rest to render a plot You can also produce XY Graphs, Waveform Graphs, Pie Charts, Polar Plots, moreBuilt in chart templates to load in directly from the block diagram at run timeA chart designer application lets you customize chart styles to apply gradients, 3D effects, hatch styles and more

    Metroltek Six Sigma Charts XControls

    Axis string category data type







    axis data


  • Metroltek Six Sigma Charts Overview

    The Six Sigma Charts XControls are used to develop and render six sigma style

    charts in the LabVIEW development environment

    The underlying chart control is the Microsoft .NET MSChart control

    Includes the Six Sigma Charts Designer application to edit and save custom chart

    styles for subsequent importing when using the Six Sigma Charts LabVIEW XControls

    You can optionally import pre-built chart templates directly in the LabVIEW development

    environment without having to use the Six Sigma Charts Designer

    The chart templates and accompanying XControl functionality include the commonly

    used charts in Six Sigma quality applications such as histogram, Pareto charts, control

    charts, etc. Other common chart types without built-in functionality are XY Graph,

    Waveform Graph, Pie, Polar, more

    Adds productivity because it frees the developer from dealing with statistical

    functionality and formatting

    Produces stunning chart styles by applying gradient fills, 3D effects and other attributes

    not otherwise available with the standard LabVIEW chart control

    Can have a string category axis not otherwise available with the LabVIEW chart


    What is Six Sigma Charts

    How can Six Sigma Charts improve your application development

  • Components of Six Sigma Charts

    Six Sigma Charts Designer Application

    Select chart template or open existing XML File

    Edit appearanceSave chart as XML


    Six Sigma Charts XControls

    Wire in data RunAdd XControl of

    selected chart type to user form

    Supported development software: NI LabVIEW and Microsoft .NET languages such as C# and VB.NET, C++.NET

    XControl includes built-in data conditioning and functionality for

    the data analysis charts

    Components of Six Sigma Charts include a library of XControls and a chart designer application

    Optionally load in XML file created with

    the chart designer

  • Implementing a Chart Front Panel

    Histogram XControl includes functionality to create the bins from raw data and output computed results

  • Implementing a Chart Block Diagram

    Optional properties can be set prior to wiring in the raw data. Results can be read after the plot is rendered

  • Six Sigma Charts Designer Application

    Import templates, edit chart styles and save for later use in the development environment

    Chart Editor for high level automated editing

    Property Grid for low level editing





  • Six Sigma Charts Designer Import Template Dialog

    After selecting pre-built chart template, return to the main application to edit style and save

    To load template hereMake selection here

  • Six Sigma Charts Designer Chart Editor

    Use the Chart Editor automate the creation of gradients based on a color scheme

    Color scheme for selected palette Click here to

    automatically create a

    gradient based on color scheme

  • Standard Statistical Charts

    Chart Type Thumbnail Purpose

    Control Chart To monitor data and detect out-of-control conditions. Control chart types include Np Chart, P Chart, U Chart, C Chart, XbarR Chart and XbarS chart

    Pareto Chart To rank order test failure counts. User specifies maximum categories to plot and plot VI plots to this maximum and outputs residuals that can be used in a drill down

    Histogram To view the shape of the measured test distribution. Provides a selection of Histogram rules to provide the optimum number of bins

    Box Plot To view the measured test distribution in terms of percentiles and view outliers.

    Linear Approximation To determine relationships between testmeasurements. Regression analysis parameters are shown in a secondary chart title.

  • StandardXY Charts

    Chart Type Thumbnail Purpose

    Bar Chart Shown is clustered bar. Can also implement stacked bar. X axis can be numeric or string category.

    Column Chart Shown is clustered column. Can also implement stacked column. X axis can be numeric or string category.

    Line Chart Can also implement point chart. X axis can be numeric or string category.

    Spline Chart Spline charts smooth values between discrete points. X axis can be numeric or string category.

    StepLine Chart StepLine charts are useful to plot square waves or for any case where adjacent points should not be connected as line segments. X axis can be numeric or string category.

  • Specialty Charts

    Chart Type Thumbnail Purpose

    Error Chart Error charts are typically used to display error bands around nominal or average values.

    Limit Chart The limit chart is used to display a run chart of continuous data and display four limit lines and a centerline

    Operating Characteristic An Operating Characteristic curve is used in quality assurance acceptance plans to determine the probability of acceptance for average fraction defective based on a sample size and allowed failures.

    Discrete Probability Distribution

    Used to display various discrete probabilitydistributions. A special case is a uniform distribution which has a step line shape.

    Continuous Probability Distribution

    Used to display various continuous probability distributions

  • Cursors and Zooming

    Cursors can be on zoom or not. Cursor is set to zoom mode in above example.

    Cursor set to zoom mode

    After zoom action

  • Mouse Events

    Based on mouse position over strategic chart elements and clicking, the programmer could take action

    Readouts from mouse move event

    Mouse position

  • Histogram Rules Available with Six Sigma Charts

    Where h is bin width and k is number of bins. Brackets indicate ceiling.

    Relationship between bin (bar) width and number of bins, k

    Name Formula Comments

    Sturges formula Can perform poorly if n < 30. May lead to over-smoothed histograms. Widely used.

    Scotts choice Where is sample standard deviation. Uses data to determine h.

    Square root choice Used by Excel histograms

    Freedman-Diaconis choice Where IQR is Inner Quartile Range (75% -25%). Uses data to determine h.

    Fixed bin size Start with k = n/10 Trial and error. Increase or decrease k to provide a smooth envelope

  • Box Plot Calculations Used in Six Sigma Charts



    Inner Quartile Range(IQR)

    Lower Whisker (2 percentile *)

    Upper Whisker (98th


    * Whisker percentile can vary according to what the user wants to indicate where outliers begin

    Outliers beyond whiskers are indicated by dots

    Upper Box (75th percentile)

    Lower Box (25th percentile)

    Box Plot used to show data distribution in terms of percentiles and to indicate outliers

  • Offline Analysis Versus Real Time Monitoring

    Offline Analysis Real Time Monitoring

    Test Sequencer stands alone and saves data to database or other mediaEngineer monitors data and performs analysis in an offline computer, remote from the test stationResponse to out-of-control conditions and immediate action may not be possibleBy the time a special cause condition is observed, the process or component mix may have reverted and the questionable product may have been moved to subsequent operations

    Test Sequencer has the ability to perform real time SPC on the dataBoth detection of out-of-control conditions and analysis can be performed synchronously with testing at the test stationActions such as containment and feedback to the process is more immediateActions can be more timely and effectiveCan detect and set aside outliers for subsequent analysis

    Use for historical review, process capabilitystudies, and continuous improvement analysis

    Build real time SPC into test sequencer to detect and act upon special cause problems

    Metroltek Six Sigma Charts Enables Real Time SPC Monitoring in Manufacturing Test

  • Manufacturing Test Application of Six Sigma Charts

    Assembly and FabricationProcesses

    Test Sequencer

    Built-in Real Time SPC Monitor and Analysis Tools Powered by Metroltek Six

    Sigma Charts

    Offline Analysis Powered by Metroltek Six Sigma


    Tested Acceptable Product

    Quarantined Suspect Product

    Defective Product

    Feedback to Process

    Database or other Media

    Individual Outlier Product

    Raw Data

    Real time manufacturing test SPC can be implemented with the Six Sigma Charts Toolkit

  • Contact Information

    Six Sigma Charts is certified by National Instruments as Compatible with LabVIEW

    Contact Jim Dougherty at [email protected] or call 214.679.9811 for

    information on how to obtain a demo or purchase the product

    mailto:[email protected]:[email protected]:[email protected]