Memory Scaling and Its Potential Impact on Computing and...
Transcript of Memory Scaling and Its Potential Impact on Computing and...
September 22, 2011Components, Packaging and Manufacturing Technology Society, SCV Chapter
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©2010 Micron Technology, Inc. All rights reserved. Products are warranted only to meet Micron’s production data sheet specifications. Information, products, and/or specifications are subject to change without notice. All information is provided on an “AS IS” basis without warranties of any kind. Dates are estimates only. Drawings are not to scale. Micron and the Micron logo are trademarks of Micron Technology, Inc. All other trademarks are the property of their respective owners.
Micron Confidential | ©2010 Micron Technology, Inc. | 1
Edward DollerV.P. & Chief Memory Systems Architecture
IEEE SVC – September 2011
Memory Scaling and Its Potential Impact on Computing and Storage
October 11
2Micron Confidential | ©2010 Micron Technology, Inc. |
1. Environment
2. Technologies Scaling
3. Potential Impact on Computing & Storage
Agenda
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1. Environment
2. Technologies Scaling
3. Potential Impact on Computing & Storage
Agenda
Environmental TrendsRipe for Change
Cellular(Phones)
Mobile(Laptops / Tablets)
Compute(Desktop / Laptops)
Enterprise(Servers / Storage)
• Threatened by Smart Phone • Multiple names for different screen sizes• Processing battle ground
• Power, performance, reliability is the name of the game• SSD’s providing breakthrough performance improvement• Creates a battle ground for HDD providers
• H/W feature slow down Differentiation via S/W & FF• H/W & market consolidation beginning• Smart Phone challenging “mobile”
• Threatened by cloud computing• Processors throttled by storage • Promise of “instant on” has not emerged
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September 22, 2011Components, Packaging and Manufacturing Technology Society, SCV Chapter
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Characteristics Challenges are different
Cellular(Phones)
Mobile(Laptops / Tablets)
Compute(Desktops / Laptops)
Enterprise(Servers / Storage)
Consumption
Content• Performance driven (generally not CPU limited)
• “Green” focus bringing power into foreground
• Reliability vs. cost is the trade off
• Ease of use
• Instant On / Off
• Power vs. “good enough” performance trade off
Consumption TrendsConsumers are Memory Aware
When’s the last time consumers really cared about GHz?
September 22, 2011Components, Packaging and Manufacturing Technology Society, SCV Chapter
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Exponential Information Growth
10-10
10-5
10
105
1010
1015
1020
1025
1030
1035
1040
1045
1050
1055
1900 1920 1940 1960 1980 2000 2020 2040 2060
2009: 1.5 EB’s per year
2009: 50GB’s per second
2020: 500GB’s per u-second
Source: http://www.kurzweilai.net/articles/art0134.html?printable=1
Byt
es “if three of the major US networks were broadcasting 24 hours a day, 7 days a week, 365
days a year for the last 60 years, they still wouldn’t have broadcast as much content as is uploaded to
YouTube every 30 days.”
Content TrendsPower & Performance
CPU RAM DISK TAPE
ns / GB ms / TB s / PB
CPU RAM DISK TAPE
ns / GB ms / TB s / PB
SSD
us / GB
Bandwidth Improvement
Latency Improvement or
September 22, 2011Components, Packaging and Manufacturing Technology Society, SCV Chapter
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Content TrendsPower & TCO
Source: Sun
3X Reduction in Cost and Power
PerformanceRelatively Speaking
HDD Then… latency = 6 months
SSD Then… latency = 1 days
SSD’s can perform >193 database searches in the time it takes an HDD to do 1
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Content TrendsPerformance
Get low latency media onto low latency busses
PCIe SATA
What Else is Going on?
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Server vs. NAS & SANPCIe is Just the start…
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1. Environment
2. Technologies Scaling
3. Potential Impact on Computing & Storage
Agenda
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NAND Scaling Challenges
Reducing Cell Capacitance Results in Fewer Stored
Electrons with Scaling – Effect Magnified with MLC
Degrading Reliability Results in Increased Usage of Error Correction – More System
Management Required
NAND Electron Scaling
20122011
20102009
2008
2007
2006
2004
10
100
1000
10000
20406080100
Litho Node
# E
lec
tro
ns
SLC Erase
MLC Erase
SLC ECC
MLC ECC
©2010 Micron Technology, Inc. | 16
How Small is Small?
October 12, 2011
US One Dollar bill cross section (2.8 Billion Physical Bits)
2.61”(1.3Mc)
0.0043”(2.2Kc)
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©2010 Micron Technology, Inc. | 17
How Small is Small?
October 12, 2011
Every Led Zeppelin song & Beatles song ever produced…(and still have room left over)
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DRAM Scaling Challenges
Major Changes Required
New Periphery Transistor Every Gen
Frequent Capacitor Structure and Material Changes with Highest “known” HiK Material at ~32nm Generation
New Cell Transistor Every Generation
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What’s are Others Saying? Change is Coming… Source: ITRS 2010
©2010 Micron Technology, Inc. | 20
EM Areas of Research – A Better View
Kryder, IEEE Tran. Mag. Oct’09
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1. Environment
2. Technologies Scaling
3. Potential Impact on Computing & Storage
Agenda
Memory CharacteristicsPCM Offers Attributes of RAM & NAND
Bit
Alt
erab
le
Wri
te
En
du
ran
ce
Rea
dL
aten
cy
Wri
teL
aten
cy
No
n-
Vo
lati
lity
Th
eo
reti
cal
Co
st
Not
Good
Good
DRAM
PCM
NAND
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Bit AlterabilityRidiculously Simple
1. Read 4KB from NAND w/ECC
2. Write to RAM
3. Modify RAM
4. Locate new NAND page
5. Write new NAND page
6. Calculate & Write ECC
7. Mark old NAND page “dirty”
8. Eventually erase NAND block
1. Write 1 bit in PCM
“I have a new mobile number:(555) 555-5554”
Much less bus traffic
“Hidden” Power
Ridiculously Simple
NAND PCM
CPU RAM DISK TAPE
ns / GB ms / TB s / PB
SSD
us / GB
PCM
ns / GB
LatencyValue goes up with information growth
All logos or trademarks are the property of their respective owners
Source: http://highscalability.com
Source: http://royal.pingdom.com
Source: http://highscalability.com
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PerformanceRelatively Speaking
SCM PCM
PCM
SSD
HDD
Then… latency = 30 min
Then… latency = 9 years
If Random Latency = 1 day
Then… latency = 17 days
Storage Class PCM can perform >800 database searches in the time it takes an SSD to do 1
©2010 Micron Technology, Inc. | 26
Alternative Interconnects
JC64.1
5-8 Die Products60-75um Die
System In PackageNOR+RAM+Apps uC
NAND+ECC uC
Developing High Die Count Solutions
2 Die Products150um Die
3 Die Products125um Die
4 Die Products100um Die
Die Thinness vs.Wire Bond Die Overhang
Wafer Dicing vs.Moisture/Temp Reliability
Wafer Thinning vs. Memory Data Retention
Package Stress vs.MLC Bit Error Rate
Package Stress vs.Frequency Performance
Ultra-Thin Die Handling vs. Die Cracking
2nd Gen Wafer Dicing vs.Moisture/Temp Reliability
2nd Gen Materials vs.Package Stress
Ultra-Thin Substrates vs.Product Warpage & Frequency
Laser Dicing vs.Moisture/Temp Reliability
3rd Gen Materials vs.Package Stress
Interconnect Technology vs.XYZ and Cost
8+ Die Products≤50um Die Thinning
It’s More than Just Thinning Wafers…
TSV
10/12/2011
September 22, 2011Components, Packaging and Manufacturing Technology Society, SCV Chapter
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10/12/2011