May 17, 2000 2

At Speed Production Testing of USB2.0

480+Mb/s Transceivers

At Speed Production Testing of USB2.0

480+Mb/s TransceiversDave ThompsonDave Thompson

Lucent TechnologiesLucent Technologies

May 17, 2000 3

OutlineOutline

Signal CharacteristicsSignal Characteristics Characterization & Production TestsCharacterization & Production Tests Test System CapabilitiesTest System Capabilities Special Test modes & hardwareSpecial Test modes & hardware SummarySummary

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Signal CharacteristicsSignal Characteristics

Very low differential signal swingsVery low differential signal swings– 400-800mV400-800mV

High speed serial data rateHigh speed serial data rate– 480Mb/s480Mb/s

Speed signalingSpeed signaling– Detection of FS; LS; HS(CHIRP)Detection of FS; LS; HS(CHIRP)

Other ChallengesOther Challenges– Jitter; Termination; Suspend/resumeJitter; Termination; Suspend/resume

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USB2.0 HS Signal Example480Mb/sec At-Speed Package TestUSB2.0 HS Signal Example480Mb/sec At-Speed Package Test

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Characterization TestsCharacterization Tests

Jitter testingJitter testing At speed signal integrityAt speed signal integrity Rise/fall time measurementsRise/fall time measurements Suspend current measurementSuspend current measurement Dynamic current measurementDynamic current measurement Squelch level measurementSquelch level measurement

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Characterization Test:USB2.0 Data EyeCharacterization Test:USB2.0 Data Eye

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Typical Production TestsTypical Production Tests

Fault coverage testingFault coverage testing At speed functional testingAt speed functional testing DC parametric testingDC parametric testing Speed detection testingSpeed detection testing Suspend/resume testingSuspend/resume testing IDDQ testingIDDQ testing

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Test System CapabilitiesTest System Capabilities

Test system concerns:Test system concerns:– Generate accurate waveforms < 800mVGenerate accurate waveforms < 800mV– Accurately receive signals < 800mVAccurately receive signals < 800mV– Measure the “z” stateMeasure the “z” state– 480Mb/s data rates480Mb/s data rates– Detection of FS; LS; HS(CHIRP)Detection of FS; LS; HS(CHIRP)– Jitter; Termination; Suspend/resumeJitter; Termination; Suspend/resume

HP F330 jitter test not adequateHP F330 jitter test not adequate

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Special Test:Modes & HardwareSpecial Test:Modes & Hardware

Several on-chip test modesSeveral on-chip test modes– IDDQIDDQ– PLL bypassPLL bypass– Suspend/Resume test modeSuspend/Resume test mode– DFT reduces USB2 test complexitiesDFT reduces USB2 test complexities

For example, speed signalingFor example, speed signaling

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Special Test:PLL Bypass ModeSpecial Test:PLL Bypass Mode

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Special Test:Modes & HardwareSpecial Test:Modes & Hardware

Utilize an HP F330Utilize an HP F330 Test system modifications:Test system modifications:

– Used paired drivers/comparatorsUsed paired drivers/comparators– Implemented fly-by; vt-dividerImplemented fly-by; vt-divider– 4X mode for 400MB/s(Joergware)4X mode for 400MB/s(Joergware)

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Special Test:Clock/Data Recovery Special Test:Clock/Data Recovery

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Test Complexity Comparison: USB2.0 & 1394Test Complexity Comparison: USB2.0 & 1394

Test TypeTest Type EasierEasier SameSame HarderHarder

At-Speed-BypassAt-Speed-Bypass XX

At-Speed-Non BypassAt-Speed-Non Bypass XX

DC ParametricDC Parametric XX

Suspend/Resume Suspend/Resume XX

IDDQIDDQ XX

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At Speed Production Testing of USB2.0 480+Mb/s TransceiversAt Speed Production Testing of USB2.0 480+Mb/s Transceivers

Standard Digital Test SystemStandard Digital Test System Custom Daughter Card not RequiredCustom Daughter Card not Required Typical production test equipmentTypical production test equipment

can test 480Mb/s components, for example:can test 480Mb/s components, for example:– Lucent’s USB2 Transceiver Test ChipLucent’s USB2 Transceiver Test Chip

SummarySummary