Matery training ICT ( IN Circuit Test Machine)
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Measurement Theory of ICT
ININ--CIRCUIT TESTER TRAININGCIRCUIT TESTER TRAININGININ--CIRCUIT TESTER TRAININGCIRCUIT TESTER TRAINING
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(2048)
(1921)1921
1922
1923
2048
(H)
(L)
(H)
(G)
(G)
(L)
#16
(H) (L) (G)
Structure of 3-wire System
2
Relay B/D (DYM-1100)
(128)
(1)1
2
3
128
(H)
(H)
(L)
(G)
(G)
(L)
#1
Back planeAnalog line
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• Constant Voltage set-up with Seven different current range by using D/A Converter
1 – 0 : 50mA ; 7 Ω ~ 26.1 Ω
1 – 1 : 5mA ; 26 Ω ~ 261 Ω
1 – 2 : 500uA ; 260 Ω ~ 2.61
1 – 3 : 50uA ; 2.6 ~ 26.1
Rx
A
H L
1-1. Applying constant Voltage => Resistor testing by Current measurement [MODE – 1]
Basic Drawing
3
1 – 3 : 50uA ; 2.6 ~ 26.1
1 – 4 : 5uA ; 26 ~ 261
1 – 5 : 500nA ; 260 ~ 2.61
1 – 6 : 50nA ; 2.6 ~ 26.1
DC Constant Voltage
0.3V 250mA max.
ADC Current Meter
50nA F.S -> 50mA F.S
Rx = 0.3V / I(Meas)Measure Range : 7 ohm ~ 26.1Mohm
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1-2. Applying constant Voltage => Resistor testing by Current measurement [MODE – 1]
Basic Circuit Drawing
4
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• Limit Voltage of constant current is fixed to 0.4V
• Six kinds of ranges according to consisting method of constant current circuit
2 – 0 : 100mA ; 0.1 Ω ~ 4.3 Ω
2 – 1 : 10mA ; 4.2 Ω ~ 43 Ω
DC Constant Current
I = 1uA ~ 100mA Rx
H
L
(6 Range) max 0.4VV
Volt Meter
2-1. Applying constant Current => Resistor testing by Voltage measurement [MODE – 2]
Basic Circuit Drawing
5
2 – 1 : 10mA ; 4.2 Ω ~ 43 Ω
2 – 2 : 1mA ; 42 Ω ~ 430 Ω
2 – 3 : 100uA ; 420 Ω ~ 4.3
2 – 4 : 10uA ; 4.2 ~ 43
2 – 5 : 1uA ; 42 ~ 430
Rx = V(Meas) / I (Range)Measure Range : 0.1 ohm ~ 430kohm
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2-2. Applying constant current => Resistor testing by Voltage measurement [MODE – 2]
Basic Circuit Drawing
6
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VC
VR R
C
tm T
V
(Measuring time)
DC Constant Current1
I = 1uA ~ 100mA
H
L
(6 Range) max 0.4VV
Volt Meter
Cx
100uF
3-1. Applying Constant Current => Capacitor testing by Voltage and Time measurement [MODE – 4]
Basic Drawing
7
(Measuring time)
• Good for testing Capacitor over 1uF
• High Capacitance is measured by high current range
• Capacitance can be measured by measuring charged voltage and time by applying constant current to Capacitor like Mode-2
Cx = I * tm / Vc(Meas)Measure Range : 2.99nF ~ 1F
4 - 0 : 2.99nF ~ 30nF (1uA)4 - 1 : 29.9nF ~ 300nF (10uA)4 - 2 : 299nF ~ 3uF (100uA)4 - 3 : 2.99uF ~ 30uF (1mA)4 - 4 : 29.9uF ~ 300uF (1mA)4 - 5 : 299uF ~ 3mF (10mA)4 - 6 : 2.99mF ~ 30mF (100mA)4 – 7 : 29.9mF ~ 1 F (100mA)
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3-2. Applying Constant Current => Capacitor testing by Voltage and Time measure [MODE – 4]
Basic Circuit Drawing
8
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DC Constant Current
I = 1uA ~ 100mA
H
(6 Range) max 40V
L
V
Volt Meter
D10.7V
4-1. Applying Constant Current => Diode testing by Voltage measure [MODE – 10]
Basic Drawing
9
• Six kinds of ranges according to consisting method of constant current circuit
10 – 1:1uA, 2:10uA, 3:100uA,4:1mA, 5:10mA, 6:100mA Diode Characteristic Curve
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• Applying reverse bias to measure breakdown voltage of Zener diode
• “Act value” should be adjusted properly
DC Constant Current
I = 1uA ~ 100mA
H
(6 Range) max 40V
L
V
Volt Meter
ZD120V
4-2. Applying Constant Current => Diode Testing by Voltage measure [MODE – 10]
Zener Diode test
10
• High voltage not to be applied to prevent damaging other components, Limit Voltage must be decided when measuring without diode. Calculating Hi-Limit
Act x 1.2 x (1.Hi-limit)
Example) Generally, when measuring 0.7 V drop voltage , if “Act value” is 1V and Hi-limit is 20%, Limit Voltage is 1 x 1.2 x 1.2 = 1.4V.
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core
4-3. Applying Constant Current => Diode testing by Voltage Measure [MODE – 10]Measure of IC lead’s Open
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1345678
V
GND
H
2
L • IC-lead’s open can be checked by measuring diode inside of IC
• Must be fully reviewed and used not to damage IC core.
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Back planeAnalog line
Fixture
(H)
(H)
(L)
(G)
(G)(L)(H)
(2)
(1)
(128)
(L)
(G)
I = 1[mA] *FixLimit voltage = 1.4V
Diode V = 0.7[V] *Measure
H
1
L
2
D1
0.7V
4-4. Applying Constant Current => Diode Testing by Voltage Measure [MODE – 10]Basic Circuit Drawing
12
Act:1V Std:0.7V Hpin: 1 Lpin: 2
H-limit: 20% L-limit:-20%
Mode 10-4 (1mA)
Relay B/D (DYM-1100)
I=1[mA]
DC 정전류
(G)
V
Volt Meter
RY12A
RY19A
DC Measure B/D (DYM-5100E)
RY7A DC Constant
Current
I=1[mA]
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NPN PNP
1mA 15 – 1 15 – 4
10mA 15 – 2 15 – 5
100mA 15 – 3 15 – 6
H pin Collector Emitter
DC Constant Current
I = 1mA ~ 100mA
V
Volt MeterDC CV
3.15V
470H
L
G
5-1. Applying Constant Current => TR On Test by Voltage Measure [MODE – 15]
Basic Drawing
13
• Mode-10 of Constant current and bias constant voltage is used for ON TEST of TR.
• Calculation of Limit Voltage is same as Mode-10
• 470Ω is used to 3.15V of constant voltage source to limit bias current.
• Bias Voltage applying to base is set to guard pin(G0).
L pin Emitter Collector
G pin Base Base
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(H)
(L)
(G)
Back planeAnalog lineFixture
(H)
(H)
(L)
(G)
(G)(L)(H)
(2)
(1)
(128)
(L)
G
1
2
3
Q
L
(3)H
5-2. Applying Constant current => TR On Test by Voltage measure [MODE – 15]
Basic Circuit Drawing
14
Act:2V Std:0.1V H-limit: 0.5V L-limit:-0.5V
H: 3, L: 2, G0: 1
Mode 15-4 (1mA)
Relay B/D (DYM-1100)
I=1[mA]
DC-CC
(L)
(G)
V
Volt Meter
RY12A
DC Measure B/D (DYM-5100E)
RY19A
RY7A
DC-CV
3.15V
470RY1A
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• Resistor can be checked by measuring current as same as applied voltage phase.
• Applying voltage frequency is fixed to 1.6.
• Good for inductors and resistors around resistors.
• Measuring range is somewhat limited comparing to other modes.
Rx
A AC Current Meter1
2mA F.S -> 20mA F.S
LH
AC Constant Voltage1
0.3V 250mA max.
1.6kHz
Phase Separation
6-1. Applying AC Constant Voltage => Resistor Testing by AC Measure [MODE – 3]
Basic Drawing
15
• Guarding pin is grounded.
3 – 0 : 5.1Ω ~ 62Ω3 – 1 : 51Ω ~ 620Ω3 – 2 : 510Ω ~ 6.2
Rx = 0.3V / I(Meas)Measure Range : 5.1 ohm ~ 6.2 Kohm
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• Capacitance of Capacitor is measured by measuring current 90 degree phase ahead than Voltage..
• Used testing low capacitance of capacitor.
• Guard pin is grounded.
7 – 0 : 0.16nF ~ 1.9nF (160kHz)
LH
AC Constant Voltage1Phase Separation
1.6kHz, 16kHz, 160kHz
0.3V 250mA max.
Cx
A AC Current Meter
2mA F.S -> 20mA F.S
6-2. Applying AC Constant Voltage => Capacitor Testing by AC Measure [MODE – 7]
Basic Drawing
16
7 – 0 : 0.16nF ~ 1.9nF (160kHz)7 – 1 : 1.6nF ~ 19nF (160kHz)7 – 2 : 16nF ~ 190nF ( 16kHz)7 – 3 : 160nF ~ 1.9uF (1.6kHz)7 – 4 : 1.6uF ~ 19uF (1.6kHz)
Cx = e / i(Meas)Measure Range : 0.16nF ~ 19uF
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• Coil is tested by measuring current 90 degree phase behind than Voltage.
• Most of Coil is tested in mode-9 because of wide measuring range
• Guard pin is grounded
LH
AC Constant Voltage1
0.3V 250mA max.
Phase Separation
1.6kHz, 16kHz, 160kHz
A AC Current Meter
2mA F.S -> 20mA F.S
Lx
6-3. Applying Constant AC voltage => Coil Testing by AC current Measure [MODE – 9]
Basic Drawing
17
9 – 0 : 5.4uH ~ 62uH (160kHz)9 – 1 : 54uH ~ 620uH (160kHz)9 – 2 : 540uH ~ 6.2mH ( 16kHz)9 – 3 : 5.4mH ~ 62mH ( 16kHz)9 – 4 : 54mH ~ 620mH (1.6kHz)9 – 5 : 540mH ~ 6.2 H (1.6kHz)
Lx = e / i(Meas)Measure Range : 5.4uH ~ 6.2H
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6-4. Applying Constant AC Voltage => Resistor Testing by AC Current Measure [MODE – 3]
Basic Circuit Drawing
18
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6-5. Guarding Pin Setting in constant voltage mode and constant voltage mode
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ININ--CIRCUIT TESTER TRAININGCIRCUIT TESTER TRAININGININ--CIRCUIT TESTER TRAININGCIRCUIT TESTER TRAINING
BASIC BASIC TRAININGTRAINING
BASIC BASIC TRAININGTRAINING
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1. Equipment 1. Equipment DescriptionDescription
1. Equipment 1. Equipment DescriptionDescription
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Analog Meter of Tester is equal to Monitor of I.C.T
1-1. Display
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1-2-1. Mode-Range
Component Selection Switch of Tester is equal to Mode-Range of I.C.T
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Test Point Mode NoteMeasuring
Method
Resistor1
2
1 : High value Resistor (over 100Ω)
2 : Low value Resistor ( less 100Ω)
CV
CC
Electrolytic Capacitor
4 In CC
Polarity 6 3-PIN Wire Method CC
Ceramic & 7 AC/LC
1-2-2. Measuring Components in different modes
24
Ceramic & Polyester Film
7 AC/LC
Coil 9 AC/LC
Diode,TR,IC 10,11 CC
Voltage 12 Separate Voltage apply is required
Short 14 CV
Open 13 CV
SCR,FET 15 CV
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Leads of Tester are equal to pins of fixture
1-3-1. Fixture & Test pin
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1-3-2. Fixture & Test pin
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Leads of Tester are displayed as H-pin and L-pin of Data program
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3 2
1
4
L-pinH-pinComponentsStep
1-3-3. How to assign Test Pin Points
27
21R115
43R74
43R63
31R42
23C41
L-pinH-pinComponentsStep
A pin is assigned basically in a pattern
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Tester measures R1
R2R1 R2R1
Tester measures R2
1-4-1. Use of Relay board
28
To measure R2 after R1, Leads must be moved.
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R2R1 R2R1
Tester measures R1 Tester measures R2
1-4-2. Use of Relay board
29
Tester has to move leads to measure R1/R2 however relay does same job in I.C.TWithout moving
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R2R1
1-4-3. Use of Relay board
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SDP-1100 : Relay Board
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1-4-4. Connecting 100pin Connector
SDP-1100 Relay board
1
2
3
4
31
8 7 6 5 4 3 2 1 1
1
2
3
4
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1-4-5. Connecting 100pin Connector to Relay board
32
SDP-1100 SUB Connector
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R2R1
1-4-6. Fixture
33
Leads of Tester are partially considered Fixture
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1-4-7. Connecting 100-pin Connector to Fixture
34
2
1
5
4
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3
III9
III
102
3
2
1-4-8. 100-pin Connector Pin Number Arrangement
35
1
97531
108642
2
1
1
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1 2 145 7 9 11
2 2 146 8 10 12
1-4-9. Relay board check(1)
37
2
Second Relay Board has a problem
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1 2 145 7 9 11
2 2 146 8 10 12
1-4-10. Relay board check(2)
38
Pin No. is Fixture’s Pin number
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1 2 145 7 9 11
2 2 146 8 10 12
1-4-11. Relay board check(3)
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Relay 7,9,11,8,10,12 of Relay Board have problem
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1-4-12. Relay Check(1)
1 2 145 7 9 11
2 2 146 8 10 12
40
OK
When both ends of leads of Relay are checked.If it is open, Relay is good
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1 2 145 7 9 11
2 2 146 8 10 12
1-4-13. Relay Check(2)
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NG
When both ends of leads of Relay are When both ends of leads of Relay are checked. If it is short, Relay is bad
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1-4-14. Check if all of Relay Board is bad((2)
43
Check DYM-7913(Relay Control Board)
Check the cable between DYM-7913 and DYM-9000
Check Measure Board(DYM-5100/DYM-4062)
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DYM-9916 : CPU Board
DYM-5100 : DC Measure Board
DYM-4062 : AC Measure Board
1-5. Measure board
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1-6. Test block
Components value
Fixture
Relay Board
46
⇒ ⇒ ⇒ ⇒⇒Components value ⇒ Fixture ⇒ Relay Board ⇒ Measure Board ⇒ PC⇒ Monitor / Printer / Press Control Board(DYM-6306)
Measure BoardPCMonitor / Printer / Press Control Board(DYM-6306)
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1-7. Power
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⇒ ⇒ ⇒ ⇒220V ⇒ SMPS ⇒ System Rack ⇒ Measure Board & Relay Board ⇒ Fixture
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1-8-1. Debugging Method ( over 100Ω resistor)
48
Component
ActStanda
rdMode Range H-lim L-lim H-pin L-pin Ws G-pin
R1 1kW 1kW 1 - 10 % -10 % 5 9 6
※ If pin # 6 is set up as G-pin, more stable measurement can be achieved.
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1-8-2. Debugging Method (less than100Ω Resistor)
49
Component
ActStanda
rdMode Range H-lim L-lim H-pin L-pin Ws G-pin
R2 82 W 82 W 2 - 10 % -10 % 6 5 1~3
※ Stable measurement can be done after assigning 1~3 of waiting time caused by C2
![Page 50: Matery training ICT ( IN Circuit Test Machine)](https://reader030.fdocuments.in/reader030/viewer/2022021420/58f1f03f1a28ab8c6a8b45cf/html5/thumbnails/50.jpg)
1-8-3. Debugging Method (VR)
50
Component
ActStanda
rdMode Range H-lim L-lim H-pin L-pin Ws G-pin
R31 kW
500W 1 - 50 % -50 % 6 7 5
※ If pin# 5 is set up as G-pin, more stable measurement can be achieved.
![Page 51: Matery training ICT ( IN Circuit Test Machine)](https://reader030.fdocuments.in/reader030/viewer/2022021420/58f1f03f1a28ab8c6a8b45cf/html5/thumbnails/51.jpg)
1-8-4. Debugging Method (Capacitor(c))
51
Component
ActStanda
rdMode Range H-lim L-lim H-pin L-pin Ws G-pin
C1 100nf 100nf 7 - 30 % -30 % 1 7
※ If pin# 5 is set up as G-pin, more stable measurement can be achieved.
![Page 52: Matery training ICT ( IN Circuit Test Machine)](https://reader030.fdocuments.in/reader030/viewer/2022021420/58f1f03f1a28ab8c6a8b45cf/html5/thumbnails/52.jpg)
1-8-5. Debugging Method (Capacitor(c))
52
Component
ActStanda
rdMode Range H-lim L-lim H-pin L-pin Ws G-pin
C2 10 uF 10 uF 4 - 30 % -30 % 1 6 100100
※ Caution : When measuring Electrolytic Capacitor, if waiting time (Ws) is set, can not achieved stable measurement .
![Page 53: Matery training ICT ( IN Circuit Test Machine)](https://reader030.fdocuments.in/reader030/viewer/2022021420/58f1f03f1a28ab8c6a8b45cf/html5/thumbnails/53.jpg)
1-8-6. Debugging Method (Capacitor (C))
53
Component
ActStand
ardMode Range H-lim L-lim H-pin L-pin Ws R0/C0
G-pin
C3 47 pF 47 pF 7 0 30 % -30 % 1 8 87
[R0/C0] button is clicked then internal machine resistance value is input in pF and exact 47pF can be measured
![Page 54: Matery training ICT ( IN Circuit Test Machine)](https://reader030.fdocuments.in/reader030/viewer/2022021420/58f1f03f1a28ab8c6a8b45cf/html5/thumbnails/54.jpg)
1-8-6. Debugging Method (Diode)
54
Component
ActStanda
rdMode Range H-lim L-lim H-pin L-pin Ws G-pin
D2 1V 0.75V 10 3~5 30 % -30 % 5 4
※ Caution : When H-pin and L-pin are changed each other, [OPEN-NG] should beappeared so that reversed mount is found.
![Page 55: Matery training ICT ( IN Circuit Test Machine)](https://reader030.fdocuments.in/reader030/viewer/2022021420/58f1f03f1a28ab8c6a8b45cf/html5/thumbnails/55.jpg)
1-8-7. Debugging Method (LED)
55
Component
ActStanda
rdMode Range H-lim L-lim H-pin L-pin Ws G-pin
LED1 2V 1.8V 10 5 30 % -30 % 9 1
![Page 56: Matery training ICT ( IN Circuit Test Machine)](https://reader030.fdocuments.in/reader030/viewer/2022021420/58f1f03f1a28ab8c6a8b45cf/html5/thumbnails/56.jpg)
1-8-8. Debugging Method (Zener Diode)
56
Component
ActStanda
rdMode Range H-lim L-lim H-pin L-pin Ws G-pin
ZD1 6V 5.6V 10 6 30 % -30 % 2 1
ZD1 1V 0.75V 10 3~5 30 % -30 % 1 2
1.Wrong Component Check 2. Reversed mount Check
12
![Page 57: Matery training ICT ( IN Circuit Test Machine)](https://reader030.fdocuments.in/reader030/viewer/2022021420/58f1f03f1a28ab8c6a8b45cf/html5/thumbnails/57.jpg)
1-8-9. Debugging Method (Coil)
57
Component
ActStanda
rdMode Range H-lim L-lim H-pin L-pin Ws G-pin
L1 10 uH 10 uH 9 0 40 % -40 % 4 3
![Page 58: Matery training ICT ( IN Circuit Test Machine)](https://reader030.fdocuments.in/reader030/viewer/2022021420/58f1f03f1a28ab8c6a8b45cf/html5/thumbnails/58.jpg)
1-8-10. Debugging Method (TR(NPN))
58
Component
ActStanda
rdMode Range H-lim L-lim H-pin L-pin Ws G-pin
Q2 B-E 1V 0.75V 10 3~5 30 % -30 % 6 8
Q2 B-C 1V 0.75V 10 3~5 30 % -30 % 6 5
![Page 59: Matery training ICT ( IN Circuit Test Machine)](https://reader030.fdocuments.in/reader030/viewer/2022021420/58f1f03f1a28ab8c6a8b45cf/html5/thumbnails/59.jpg)
1-8-11. Debugging Method (TR(PNP))
59
Component
ActStanda
rdMode Range H-lim L-lim H-pin L-pin Ws G-pin
Q3 E- B 1V 0.75V 10 3~5 30 % -30 % 2 9
Q3 C-B 1V 0.75V 10 3~5 30 % -30 % 3 9
![Page 60: Matery training ICT ( IN Circuit Test Machine)](https://reader030.fdocuments.in/reader030/viewer/2022021420/58f1f03f1a28ab8c6a8b45cf/html5/thumbnails/60.jpg)
1-8-12. Debugging Method (Digital TR(NPN))
60
Component
ActStanda
rdMode Range H-lim L-lim H-pin L-pin Ws G-pin
Q1 C-E 2V 0V 15 4~5 0.5V 0V 5 1 1~5 8
Q1 B-E 400Ω 400Ω 1 2 30 % -30 % 8 1
200Ω + 200Ω(R+R) = 400Ω
![Page 61: Matery training ICT ( IN Circuit Test Machine)](https://reader030.fdocuments.in/reader030/viewer/2022021420/58f1f03f1a28ab8c6a8b45cf/html5/thumbnails/61.jpg)
1-8-13. Debugging Method (Digital TR(PNP))
61
Component
ActStanda
rdMode Range H-lim L-lim H-pin L-pin Ws G-pin
Q4 E-C 2V 0V 15 2~3 0.5V 0V 1 6 1~5 7
Q4 E-B 400Ω 400Ω 1 2 30 % -30 % 1 7
200Ω + 200Ω(R+R) = 400Ω