Materials Characterization October 29, 2012 · 2019-02-01 · Advanced Materials Characterization...
Transcript of Materials Characterization October 29, 2012 · 2019-02-01 · Advanced Materials Characterization...
![Page 1: Materials Characterization October 29, 2012 · 2019-02-01 · Advanced Materials Characterization Lab . Helios Nanolab 600 Dual Beam FIB / HRSEM. Cross-sectional Analysis 5 µm As-deposited](https://reader034.fdocuments.in/reader034/viewer/2022050522/5fa62209c8c3a521d9741fce/html5/thumbnails/1.jpg)
Materials Characterization
October 29, 2012
![Page 2: Materials Characterization October 29, 2012 · 2019-02-01 · Advanced Materials Characterization Lab . Helios Nanolab 600 Dual Beam FIB / HRSEM. Cross-sectional Analysis 5 µm As-deposited](https://reader034.fdocuments.in/reader034/viewer/2022050522/5fa62209c8c3a521d9741fce/html5/thumbnails/2.jpg)
Graduate Center for Materials Research
$6.3M Renovation of Straumanis-James Hall Completed Spring 2012
![Page 3: Materials Characterization October 29, 2012 · 2019-02-01 · Advanced Materials Characterization Lab . Helios Nanolab 600 Dual Beam FIB / HRSEM. Cross-sectional Analysis 5 µm As-deposited](https://reader034.fdocuments.in/reader034/viewer/2022050522/5fa62209c8c3a521d9741fce/html5/thumbnails/3.jpg)
Director
(Matt O’Keefe)
Administrative
Associate
(Patty Smith)
Sr. Secretary
(Sissy Edgar)
Sr. Clerk
(Sarah Henne)
Director
AMCL Labs
(Scott Miller)
Sr. Resrch Engr. Techn.
(Ron Haas)
Mechanic
Sr. Research Spclst.
(Eric Bohannan)
XRD/AFM/TGA
Electron Micr. Spclst
(Clarissa Wisner)
SEM
Sr. Research Spclst.
(vacant)
FIB/TEM
Sr. Electronic Techn.
(Brian Porter)
XPS
MRC Background •Annually >$5M shared credit expenditures, ~30 faculty, ~75 grad students, ~2000 samples run, ~30 external users
Majority of campus patents and royalty income • Maintains materials analytical equipment (AMCL)
![Page 4: Materials Characterization October 29, 2012 · 2019-02-01 · Advanced Materials Characterization Lab . Helios Nanolab 600 Dual Beam FIB / HRSEM. Cross-sectional Analysis 5 µm As-deposited](https://reader034.fdocuments.in/reader034/viewer/2022050522/5fa62209c8c3a521d9741fce/html5/thumbnails/4.jpg)
Major Analytical Equipment
FIB SEM TEM
XRD XPS DTA/DSC
![Page 6: Materials Characterization October 29, 2012 · 2019-02-01 · Advanced Materials Characterization Lab . Helios Nanolab 600 Dual Beam FIB / HRSEM. Cross-sectional Analysis 5 µm As-deposited](https://reader034.fdocuments.in/reader034/viewer/2022050522/5fa62209c8c3a521d9741fce/html5/thumbnails/6.jpg)
Helios Nanolab 600 Dual Beam FIB / HRSEM
![Page 7: Materials Characterization October 29, 2012 · 2019-02-01 · Advanced Materials Characterization Lab . Helios Nanolab 600 Dual Beam FIB / HRSEM. Cross-sectional Analysis 5 µm As-deposited](https://reader034.fdocuments.in/reader034/viewer/2022050522/5fa62209c8c3a521d9741fce/html5/thumbnails/7.jpg)
Cross-sectional Analysis
5 µm
As-deposited Ce
O
Ga
Al
Cl
Pt
10 µm
![Page 8: Materials Characterization October 29, 2012 · 2019-02-01 · Advanced Materials Characterization Lab . Helios Nanolab 600 Dual Beam FIB / HRSEM. Cross-sectional Analysis 5 µm As-deposited](https://reader034.fdocuments.in/reader034/viewer/2022050522/5fa62209c8c3a521d9741fce/html5/thumbnails/8.jpg)
(A) (B) (C)
With computer-controlled automatic milling, slicing and imaging, 3D
microstructure reconstruction can be generated by using the Helios.
3-Dimension sub-micron structure of shale gas rock Courtesy of Dr Baojun Bai and Malek Elgmati
3D Structure Reconstruction
Grain Orientation Mapping by EBSD
![Page 9: Materials Characterization October 29, 2012 · 2019-02-01 · Advanced Materials Characterization Lab . Helios Nanolab 600 Dual Beam FIB / HRSEM. Cross-sectional Analysis 5 µm As-deposited](https://reader034.fdocuments.in/reader034/viewer/2022050522/5fa62209c8c3a521d9741fce/html5/thumbnails/9.jpg)
TEM Sample Preparation
![Page 10: Materials Characterization October 29, 2012 · 2019-02-01 · Advanced Materials Characterization Lab . Helios Nanolab 600 Dual Beam FIB / HRSEM. Cross-sectional Analysis 5 µm As-deposited](https://reader034.fdocuments.in/reader034/viewer/2022050522/5fa62209c8c3a521d9741fce/html5/thumbnails/10.jpg)
TEM Chemical Composition of Multiple Layers on Steel Surface
![Page 11: Materials Characterization October 29, 2012 · 2019-02-01 · Advanced Materials Characterization Lab . Helios Nanolab 600 Dual Beam FIB / HRSEM. Cross-sectional Analysis 5 µm As-deposited](https://reader034.fdocuments.in/reader034/viewer/2022050522/5fa62209c8c3a521d9741fce/html5/thumbnails/11.jpg)
Precipitates in Steel and Diffraction Analysis
![Page 12: Materials Characterization October 29, 2012 · 2019-02-01 · Advanced Materials Characterization Lab . Helios Nanolab 600 Dual Beam FIB / HRSEM. Cross-sectional Analysis 5 µm As-deposited](https://reader034.fdocuments.in/reader034/viewer/2022050522/5fa62209c8c3a521d9741fce/html5/thumbnails/12.jpg)
Diffraction Analysis
Photo by Dr Kai Song
MC
M23C6
M3B2
Selected area diffraction analysis identifies three types of precipitates in a nickel-based superalloy
![Page 13: Materials Characterization October 29, 2012 · 2019-02-01 · Advanced Materials Characterization Lab . Helios Nanolab 600 Dual Beam FIB / HRSEM. Cross-sectional Analysis 5 µm As-deposited](https://reader034.fdocuments.in/reader034/viewer/2022050522/5fa62209c8c3a521d9741fce/html5/thumbnails/13.jpg)
Thin Film Diffractometer Multi-Purpose Diffractometer (MPD)
X-Ray Diffraction