March 15 - 18, 2015 Hilton Phoenix / Mesa Hotel Mesa ...€¦ · Adaptive Cruise Control 200 meters...
Transcript of March 15 - 18, 2015 Hilton Phoenix / Mesa Hotel Mesa ...€¦ · Adaptive Cruise Control 200 meters...
BiTS 2015
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
Proceedings
Archive – Session 8
March 15 - 18, 2015
Hilton Phoenix / Mesa Hotel
Mesa, Arizona
© 2015 BiTS Workshop – Image: BCFC/iStock
BiTS 2015
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
ProceedingsBiTS Workshop 2015 Schedule
Session
Session Chair
Solutions DayWednesday March 18 10:30 am
Looking For That Four Leaf Clover
"A Test-Cell-Solution for 81GHz Automotive Radar ICs"Jason Mroczkowski, Peter Cockburn, & John Shelley - Xcerra Corporation
"Universal Device Interface DUT Solutions for ATE Test"Bob Bartlett- Advantest Corporation
"Where No Tester Has Gone Before"Roger Sinsheimer -Teradyne Inc.
8Morten Jensen
BiTS 2015
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
Proceedings
Copyright Notice
The presentation(s)/paper(s) in this publication comprise the Proceedings of the 2015 BiTS Workshop. The content reflects the opinion of the authors and their respective companies. They are reproduced here as they were presented at the 2015 BiTS Workshop. This version of the papers may differ from the version that was distributed in hardcopy & softcopy form at the 2015 BiTS Workshop. The inclusion of the presentations/papers in this publication does not constitute an endorsement by BiTS Workshop or the workshop’s sponsors.
There is NO copyright protection claimed on the presentation content by BiTS Workshop. However, each presentation is the work of the authors and their respective companies: as such, it is strongly encouraged that any use reflect proper acknowledgement to the appropriate source. Any questions regarding the use of any materials presented should be directed to the author(s) or their companies.
The BiTS logo and ‘Burn-in & Test Strategies Workshop’ are trademarks of BiTS Workshop. All rights reserved.
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 1
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
A Test-Cell-Solution for
81GHz Automotive Radar ICs
Jason Mroczkowski
Peter Cockburn
John Shelley
Xcerra Corporation
2015 BiTS Workshop
March 15 - 18, 2015
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 1
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
Agenda
• Automotive Radar Introduction
• Evolution of Radar Test
• 81GHz Test Cell
• 81GHz Contactor
• Test Results
• Roadmap
• Summary
A Test-Cell-Solution for 81GHz Automotive Radar ICs2
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 1
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
Why do we need Automotive Radar?
• Inattentive
Driving
• Blind Spot
Detection
• Preemptive
Braking
A Test-Cell-Solution for 81GHz Automotive Radar ICs 3http://floridabicycle.org/
http://www.motortrend.com
Drive Toward Autonomous Vehicles
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 1
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
Why do we need Automotive Radar?
• General trend towards safer, more autonomous vehicles
• Legislation to reduce car injuries is causing four-fold
growth in ADAS (Advanced Driver Assistance Systems)
chip revenue from 2010 - 2020
4A Test-Cell-Solution for 81GHz Automotive Radar ICs
ADAS Offers A Safer Future
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 1
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
Automotive Radar Applications
• ADAS uses multiple
technologies including Radar
• Radar systems are
moving from 24GHz to 81GHz
– Improved range
– More bandwidth
– Higher resolution
Application Range Safety Aspect Technology
Adaptive Cruise Control 200 meters accident avoidance 81 GHz
Pre-Crash 30 meters impact mitigation 81 / 24 GHz
Blind Spot Detection 20 meters accident avoidance 24 GHz / Vision
Lane Departure Warning 60 meters accident avoidance Vision
Stop and Go 30 meters accident avoidance 81 / 24 GHz
5A Test-Cell-Solution for 81GHz Automotive Radar ICs
ADAS Systems Are Moving To 81GHz
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 1
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
Push to Higher Bandwidth – 81 GHz
A Test-Cell-Solution for 81GHz Automotive Radar ICs6
5 GHz200 MHz
Source: ITU News
More Range, More Bandwidth, More Resolution
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 1
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
Packaging Technology
7
• Current Generation Packaging
− fBGA
− 3 package chipset
− 0.5mm pitch
− Package thickness 1mm
− Single Ended Routing
• Next Generation Packaging
− WLCSP
− 0.5mm Pitch
− Package thickness 0.25mm
− Differential Routing
Source: Freescale
Source: Fujitsu
A Test-Cell-Solution for 81GHz Automotive Radar ICs
Thinner More Integrated Packaging
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 1
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
Test Challenge for Automotive Radar
• Parts per billion allowable failure rates
– Full functional test required at extreme frequencies
• Multi-temp testing for automotive temperature
range (-45 to +125°C)
• Reliable and cost-effective HVM solution
– Maximize re-use of test cell investment
8A Test-Cell-Solution for 81GHz Automotive Radar ICs
Extreme Frequency, Extreme Temperature, Extreme Quality
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 1
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
ADAS Integrated Test Cell
9
• High volume production “at speed“ testing solution for
ADAS Radar enabled devices
− Commercial ATE with option for 24GHz or 81GHz
− Automotive compliant Tri-temp handling solution
− Fully-matched contactor and interfacing assembly
− Integrated test cell communication
Tri-Temp HandlerGeneral Purpose ATEIntegrated test and
contactor assembly
A Test-Cell-Solution for 81GHz Automotive Radar ICs
Extreme Frequency, Extreme Temperature, Extreme Quality
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 1
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
Existing ADAS Test Cell – 24GHz
• Multiple 24GHz full
functional test cells
in HVM today
• Uses flexible test cell
base that can be
adapted for other
requirements
• Same test cell base
extended with new
instrumentation and
interface for 81GHz
10A Test-Cell-Solution for 81GHz Automotive Radar ICs
Production Proven Test Cell Base
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 1
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
24GHz Test Cell Signal Optimization• Complete signal path from ATE to DUT
optimized through simulation
– Less than 8dB of loss
– Less than 2dB of ripple
• Custom insulation results in stable
multi-temp performance
• Die temp. accuracy of ±2°C
•
11 11A Test-Cell-Solution for 81GHz Automotive Radar ICs
Insulation on
back of
Loadboard
Needs Met With Traditional Interface Technology
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 1
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
Going from 24 GHz to 81 Ghz
• Handler remains same
• Tester upgraded with new
instrumentation
• Interface requires radical departure
from existing design
12
Radical Advancement in Interface Technology Required
A Test-Cell-Solution for 81GHz Automotive Radar ICs
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 1
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
81GHz Complete Test Cell Solution• Only fully integrated solution in the Industry
– All components from one supplier (tester,
loadboard, contactor and handler)
• Tester option for ADAS test (Kestrel)
– Upgrade on scalable X-Series platform to
balance flexibility and cost
– 8 channel transmit /receive @ 81 GHz
– Calibration up to the device pin
• Tri-temp handler integration
– MT9510 pick and place handler with
standard conversion kit
• Proprietary contacting solution (mmWave)
Page 13A Test-Cell-Solution for 81GHz Automotive Radar ICs
Fully Integrated Production Solution
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 1
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
Contactor Component for 81G Radar
Test Cell• Revolutionary mmWave Contactor
– Impedance controlled Coplanar Waveguide
for high speed signals
– PCB and pogos for low speed and power
– Fewer transitions than alternatives for best
signal integrity
• PCB and contactor
– Designed
– Manufactured
– Assembled
– Tested
14A Test-Cell-Solution for 81GHz Automotive Radar ICs
Reliable, Production-Ready Solution
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 1
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
Signal Path Optimization for 81GHz
• mmWave contactor Minimizes connection interfaces and
maintains required 81GHz signal quality and robustness
for production RF Instrument <-> Loadboard <-> Contactor <-> DUT
Interface and Contactor Design
Reduces Signal Transitions15A Test-Cell-Solution for 81GHz Automotive Radar ICs
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 1
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
Background – Patented Multitest
Contactor Solution
• High Speed Differential Coplanar
Waveguide Leadframe Contactor
• Compliant Cantilever Design
16
Patent #
7173442 B2
SEMICONDUCTOR DEVICE -PLUNGED INTO CONTACTS
ALIGNMENT HOUSING
NON-CONDUCTIVE TIE-BARCONTACT FINGER-DEFLECTED
NONCONDUCTIVEELASTOMER -COMPRESSED
PC BOARD MATERIAL
PC BOARD TRACE - CPW
GROUND FINGER-DEFLECTED
A Test-Cell-Solution for 81GHz Automotive Radar ICs
Patented Cantilever Design
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 1
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
81GHz mmWave Contactor
17A Test-Cell-Solution for 81GHz Automotive Radar ICs
Additional
Patent Pending
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 1
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
Simulation Model
3D EM Simulations include
full path from 1mm
connector to device pin
• Optimized Coplanar
Waveguide geometries
• Optimized connector to
leadframe interface
18A Test-Cell-Solution for 81GHz Automotive Radar ICs
Optimized Through Simulation
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 1
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
RF Simulation Results
• Goal
– Better than 8dB insertion loss @ 80GHz
– Better than -10dB return loss @ 80GHz
• Simulated
– -7dB insertion loss @ 80GHz
– -10dB return loss @ 80GHz
A Test-Cell-Solution for 81GHz Automotive Radar ICs 19
Broadband Performance From 0-80GHz
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 1
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
Test Results - RF to 90GHz
Measurements taken on
RX, TX and LO Paths
– Agilent 50GHz PNA-X
with WR12 Waveguides
(60-90GHz)
– 1mm coaxial to 0.4mm
GSG CPW Picoprobe
measurement (adapter
removal)
– Insertion loss, return
loss, impedance
20A Test-Cell-Solution for 81GHz Automotive Radar ICs
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 1
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
RF Measurement Results
• Broadband performance from 0-81GHz
• Impedance and phase matched
• -4.5dB insertion loss @ 80GHz
• -10dB return loss @ 80GHz
21A Test-Cell-Solution for 81GHz Automotive Radar ICs
Measurement Correlates to Simulation
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 1
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
mmWave Life Cycle Test Summary
• Average resistance after 500K Cycles
− 77 mΩ, 3 mΩ Standard Deviation
• Average Force after 500K Cycles
− 32.3 g, 6.1 g Standard Deviation
0
5
10
15
20
25
30
35
40
45
50
0
50
100
150
200
250
300
350
400
450
500
0.000
0.009
0.019
0.028
0.037
0.047
0.056
0.065
0.074
0.084
0.093
0.102
0.112
0.121
0.130
0.140
0.149
0.158
0.168
0.177
0.174
0.164
0.155
0.146
0.137
0.127
0.118
0.109
0.099
0.090
0.081
0.071
0.062
0.053
0.043
0.034
0.025
0.016
0.006
Forc
e (g
)
Re
sist
ance
(m
Oh
m)
Deflection (mm)
FReD 1k cycles
R1 R2 R3 R4 R5 R6 R7 R8 R9 F1 F2 F3 F4 F5 F6 F7 F8 F9
A Test-Cell-Solution for 81GHz Automotive Radar ICs
Stable Mechanical Performance22
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 1
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
Roadmap: WLCSP
Solution for multisite WLCSP Automotive
Radar Testing
A Test-Cell-Solution for 81GHz Automotive Radar ICs 23
Multisite WLCSP contactor
(Concept Drawing)
Increased Throughput
Without Compromising Test Coverage
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 1
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
Roadmap: Calibration Substrates
• Simplified recalibration after fixture modifications/replacement of
hardware, etc.
• Open, Short, Load , Through (OSLT)
• Simple two-layer PCB with coplanar waveguide traces
• PCB bumped with solder balls to replicate device
A Test-Cell-Solution for 81GHz Automotive Radar ICs 24
Efficient, In-Situ Calibration
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 1
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
Conclusions • Test cell approach used in production since 2011 for
full-speed 24GHz Automotive Radar testing.
• Same integrated approach is used for 81GHz
automotive radar
• Radically advanced interface solution allows at speed
multi-temperature production test
• Result: Automotive radar devices are tested with full
coverage to guarantee premium quality to the
Automotive OEMs.
25A Test-Cell-Solution for 81GHz Automotive Radar ICs
A Fully Integrated Solution for 81 GHz Production Test