Man-22060-Us003 c00 Ssmtt-27m1 Jitter Mmd

8/14/2019 Man-22060-Us003 c00 Ssmtt-27m1 Jitter Mmd

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SSMTT-27M1 1

MAN-22060-US003 Rev C00

302 Enzo Drive San Jose, CA 95138

Tel: 1-408-363-8000 Fax: 1-408-363-8313

Jitter/Wander Option

for the E1 ModulePart of the MTT and xDSL

Family of Products

Users Manual

SSMTT-27M1


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2 Jitter/Wander for the E1 Module

WarningUsing the supplied equipment in a manner not specified by Sunrise

Telecom may impair the protection provided by the equipment.

CAUTIONS! Do not remove or insert the module while the test set is on. Inserting or re-

moving a module with the power on may damage the module. Do not remove or insert the software cartridge while the test set is on. Oth-

erwise, damage could occur to the cartridge.

End of Life Recycling and Disposal InformationDO NOT dispose of Waste Electrical and Electronic Equipment(WEEE) as unsorted municipal waste. For proper disposal returnthe product to Sunrise Telecom. Please contact our local offices

or service centers for information on how to arrange the returnand recycling of any of our products.

EC Directive on Waste Electrical and Electronic Equip-

ment (WEEE)The Waste Electrical and Electronic Equipment Directive aims tominimize the impact of the disposal of electrical and electronic

equipment on the environment. It encourages and sets criteriafor the collection, treatment, recycling, recovery, and disposal of

waste electrical and electronic equipment.

2010 Sunrise Telecom Incorporated. All rights reserved.

Disclaimer: Contents subject to change without notice and arenot guaranteed for accuracy.


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SSMTT-27M1 3

Jitter/Wander for the E1 Module

1 Menu ...................................................................5

1.1 Jitter ...................................................................................5

1.1.1 Jitter Measurement .........................................................61.1.1.1 Configuration ...............................................................61.1.1.2 Output Jitter Measurement Result ...............................8

1.1.2 Jitter Generation ...........................................................101.1.3 Jitter Tolerance .............................................................11

1.1.4 Jitter Transfer ................................................................131.1.5 View Test Records ........................................................15

1.2 Wander ............................................................................17

1.2.1 TIE/MTIE Measurement................................................171.2.1.1 TIE Measurement Setup............................................171.2.1.2 Wander Results .........................................................18

1.2.2 View Test Records ........................................................19

2 PC Based MTIE/TDEV Analyzer ......................21

2.1 Introduction ......................................................................21

2.2 Analysis Procedure..........................................................212.2.1 Masks ...........................................................................23

2.3 Analysis Screen Feature Description ..............................33

3 Applications .....................................................37

3.1 Jitter Measurement ..........................................................37

3.2 Jitter Tolerance ................................................................38

3.3 Wander/TIE/MTIE Measurement .....................................40

4 Reference .........................................................41

4.1 Jitter .................................................................................41

4.2 Wander ............................................................................43

4.2.1 Time Interval Error (TIE) ..............................................44

4.3 Express Limited Warranty ................................................46

Index ......................................................................47


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SSMTT-27M1 5

1 Menu

This Users Manual covers the optional Jitter/Wander feature of the

E1 Module that is found in the OTHER MEASUREMENT menu: JITTER (SWMTT-27JM and SWMTT-27JG) WANDER (SWMTT-27WM)

1.1 Jitter

ITU denes Jitter as Short-term variations of the signicant in -

stances of a digital signal from their ideal positions in time (whereshort-term implies these variations are of frequency greater than

or equal to 10 Hz).

Jitter is a natural and inevitable occurrence in telecommunicationsnetworks. However, excessive jitter can lead to transmission errorsand deterioration in network quality.

The Jitter feature quickly and accurately determines if a 2M signal

has excessive jitter.

From the E1 MODULE main menu, select OTHER MEASURE-MENT > JITTER. A Downloading... message will be displayed

as the feature loads. The test set must be in a E1 SINGLE TESTMODE to perform jitter measurements. After the feature loads,

the following items are available:

JITTER MEASUREMENT JITTER GENERATION JITTER TOLERANCE

JITTER TRANSFER VIEW TEST RECORDS

Note: The test set will require a second memory card installed in

the test sets outer slot to perform a jitter histogram. See the testsets Users Manual for more information.


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1.1.1 Jitter MeasurementAfter selecting JITTER MEASUREMENT from the JITTER menu,

the following conguration screen is displayed:

1.1.1.1 Configuration

11:50:45

JITTER TEST SETUP

FILTER : 20-100K HZ HzRX RATE : 2.048 MbpsTHRESHOLD : G.823B1 LIMIT : 1.5 UIppREF CLOCK : INTERNTEST DURATION: 000:01:00 H:M:S+P LIMIT : 0.50 UIp

-P LIMIT : 0.50 UIp

WIDEBND HIGHBND START

Figure 1 Jitter Test Setup Screen

Configure as required:

FILTEROptions: WIDEBND (F1), HIGHBND (F2)

Choose the band to filter.

WIDEBND: This is a wideband 20Hz100kHz lter and uses

the B1 (1.5 UIpp per ITU-T) Maximum Permissible Jitter speci-cation; B1 will appear in the THRESHOLD line.

HIGHBND: This is for a highband 18kHz100kHz lter anduses the B2 (0.2 UIpp per ITU-T) Maximum Permissible Jitter

specication; B2 will appear in the THRESHOLD item.

Note: ITU G.823 requires both a wideband, and then a highband

measurement be performed, in order to qualify the E1 link. SeeSection 4.1for information on the bands.

RX RATEThe signal receive rate is fixed at 2.048 Mbit/s.

THRESHOLDOptions: G.823 (F1), USER (F2)

Choose the band to filter.

G.823: This uses the jitter limit specied by ITU-T G.823.


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SSMTT-27M1 7

USER: Use this to manually determine the jitter limit. If used,

select the B1/B2 line, and enter the allowable peak-to-peakvalue, in unit intervals.

B1/B2 LIMITOptions: B1 (0 to 1.5), B2 (0 to 0.2)

Set the threshold, if using a USER configuration.

REF CLOCK

The reference clock is xed at INTERN.

TEST DURATION

Options: TIMED (F1), CONTINU (F2)

Determine the measurement duration.

TIMED: Measurements will run for a specied length of time.Enter the Hours, Minutes, and Seconds (H:M:S) the test will run.

The default is one minute, as recommended by the ITU-T. CONTINU: The measurement will run until STOP (F4) ispressed.

+P LIMITOptions: Depends on the THRESHOLD B1/B2 limit.

Determine the positive phase hit limit; a positive phase hit above

this entry will count in the Results screen.

-P LIMIT

Options: Depends on the THRESHOLD B1/B2 limit.

Determine the negative phase hit limit; a negative phase hit be-yond this entry will count in the Results screen.

When ready, press START (F4) and a NV Histogram Data

Would be Erased!!! message appears. Press ENTER to start themeasurements with a Conguring... message as the test set

recongures itself, then the result screen will appear.

Note: The Jitter histogram uses the same memory location on theinternal memory as the basic E1 histogram. Starting Jitter mea-

surements will erase the E1 histogram record. Save any recordsyou want to keep to an optional second memory card.


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1.1.1.2 Output Jitter Measurement ResultFigure 2 presents a sample Jitter Results screen.

11:50:45

ET- 000:02:30 RT- CONTINU

OUTPUT JITTER RESULT

FILTER : 20-100kHz

LIMIT : 1.50 UI PASS CURRENT MAXIMUM

JITTER : 0.002 0.004

RMS : 0.001 0.001

+PEAK : 0.002 0.000

-PEAK : 0.000 0.000

PHASE HIT: +0

PHASE HIT: -0

PRINT STOP

Figure 2 Output Jitter Results Screen

If the chassis is equipped with an extra memory card, this screen

will then feature a scroll bar on the right side of the screen. It indi-cates that there is additional information available, in this case a

Histogram screen. To access, press , to return to the first screenpress . The first screen contains:

ET: Elapsed Time since START (F4) was pressed.

RT: Remaining Time left to the test, CONTIN will be displayed if

continuous was selected in the previous setup screen.FILTER: Frequency band filter in use.

LIMIT: Jitter limit used.

Banner: The overall result is displayed: PASS (jitter maximum islower than G.823) or FAILED (jitter maximum exceeds G.823).

Below the banner, Jitter measurements are given for the CUR-RENT and MAXIMUM values for the following:

JITTER: This is Jitter peak-to-peak in unit intervals.

RMS: This is Jitter Route Mean Squared in unit intervals.

PEAK +/-: Positive and negative jitter peak values.

PHASE HIT +/-: Number of occasions the jitter peak-to-peak valuewas above/below the THRESHOLD value.

The following F-keys are available:

PRINT(F1): Press to send the results to the serial port.


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SSMTT-27M1 9

STOP/START(F4): Press to stop the test, press again to start

the measurement and reset all counters.

Press to access the screen shown in Figure 3. Histogram analy-

sis automatically starts when a jitter measurement is started. Thehistogram presents data for each measurement over time.

PRINT STOPZOOMTYPE

11:50:45ET- 000:02:30 RT- CONTINU JITTER HISTOGRAMTYPE:PEAK-PEAKCURSOR:0.939 03/04/03 11:30:40

2.0

UI 1.0

0.0 0 15 30 45 60 SEC

Cursor

Threshold

Measurement

Zoom levelSeconds,Minutes,or Hours

Figure 3 Jitter Histogram Screen

This screen contains the following:

Threshold: Indicates the ITU jitter threshold.

Cursor: Move the vertical cursor by pressing to select aparticular area and get results for that area. The CURSOR line

indicates the jitter value at that area with its date and time.

Measurement: Value of the jitter measurement being performed.

The X axis (seconds, minutes, or hours) indicates the duration/progress of the test. The Y axis indicates the jitter value in UI

(Unit Intervals).

The following additional F-keys are now available:

TYPE(F2): Press to choose a measurement type as indicatedat TYPE. They are:

PEAK-PEAK: Peak-to-Peak PEAK-BASE Peak positive

BASE-PEAK: Peak negative RMS: With RMS results, the threshold line is not displayed, as

jitter limit is determined by the peak-to-peak value.

ZOOM (F3): Press to change the resolution in seconds, minutes,or hours centered at the cursor.


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1.1.2 Jitter GenerationUse the following screen to setup and generate jitter.

START

11:50:45

JITTER GENERATION SETUP

FREQUENCY(Hz): 10PP UI : 00.00

Figure 4 Jitter Generation Setup Screen

FREQUENCY

Options: 1099999 kHz

Enter the frequency of the transmitted jitter.

PP UIEnter the amplitude at which peak-to-peak jitter generation will

begin.

See O.172 for the ITU recommendation on minimum jittergeneration.

Press F4 to start generating jitter. Press again to stop generat-

ing jitter.


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SSMTT-27M1 11

1.1.3 Jitter ToleranceJitter Tolerance (accommodation) is defined in terms of the si-

nusoidal jitter amplitude which causes a designated error, when

applied to the input of digital equipment. Jitter tolerance is a func-tion of amplitude and frequency of the applied jitter. Equipmentmust pass the lower limit of maximum jitter tolerance, which is

specified in G.823. This jitter tolerance template is used to qualifythe performance of digital network equipment.

Select JITTER TOLERANCE from the JITTER menu to have thetest set generate jitter, and then measure the looped back signal

from the EUT (equipment under test).

The test set will transmit jitter from point-to-point, from low fre-quency to high frequency, at different amplitudes, to determine

where errors occur (maximum jitter tolerance).

STOPTABLE PRINT SAVE

Tolerance

Indicators

: at least

+: maximum

tolerated

Y: Tx Jitter

Peak-to-Peak

amplitude

X: Tx Jitter

Frequency

11:50:45 Meas

JITTER TOLERANCE TESTUIpp IN PROGRESS

2010

1.0

0.1 kHz .01 .1 1 10 100

Figure 5 Jitter Tolerance Test, In Progress Screen

The following is reported:

kHz: The X axis shows the frequency of the generated jitter.

UIpp: The Y axis shows the generated jitters peak-to-peak am-plitude (UI).

:Indicates the lowest value of the maximum tolerable jitter ateach frequency point.

+: Indicates the maximum jitter value tolerated at the frequency

(not shown).



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TABLE/GRAPH(F1): Press to see the results in the table formatshown in Figure 6, press again to return to the graph view.


SAVE(F3): Press to save the results. A second memory card mustbe installed in the chassis to save results. See Section 1.1.5.

STOP/START(F4): Press to stop the test, press again to startthe measurement resetting all counters.

The message will change from IN PROGRESS to COMPLET-ED when the test is done.

Jitter Tolerance Table ResultsThis screen features a scroll bar on the right side of the screen. It

indicates that there is additional information available. To accessthis information, press , to return to the first screen press .

STOPGRAPH PRINT SAVE

11:50:45 Meas JITTER TOLERANCE TEST IN PROGRESS

FREQ(kHz) MTJ(UI-pp) MASK(UI-pp) 0.020 >20.00(PASS) 1.50 0.036 >20.00(PASS) 1.50 0.066 >20.00(PASS) 1.50 0.120 >20.00(PASS) 1.50 0.220 >20.00(PASS) 1.50 0.400 >20.00(PASS) 1.50 0.730 >20.00(PASS) 1.50 1.300 >20.00(PASS) 1.50 2.400 >20.00(PASS) 1.50

3.400 XXXXXXXXXXXX 1.06

Figure 6 Jitter Tolerance Test-Table Screen

Table view lets you see all of the specic frequencies and ampli-

tudes at which jitter was tested. The following is reported:

FREQ (kHz): Frequency tested.

MTJ (UI-pp): Maximum Tolerable Jitter (Unit Interval) and PASS/FAIL status.

MASK (UI-pp): Unit Interval Peak-to-peak jitter limit as dened

by the ITU standard. To pass, the jitter tolerance must exceedthe mask.


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SSMTT-27M1 13

1.1.4 Jitter TransferThis is the ratio of output jitter to input jitter amplitude versus jitter

frequency for a given bit rate. Often, a portion of received jitter is

transmitted at a piece of equipments output.To perform the test, the rst step is to perform a calibration. You willsee a CONNECT LINE 1 TX TO RX PRESS ENTER TO STARTCALIBRATE message to remind you to loop the unit. The test

set must be calibrated before conducting jitter transfer in order tocompensate for jitter, other than from the equipment under test.

The message will change to COMPLETED when the calibrationprocess is done. A Before Starting The Test Connect Equipment

Under Test message will appear as a reminder.Connect the test set to a looped back EUT and press START(F4) to begin the test. The test set starts transmitting jitter at a

low frequency, then increases it. Results are displayed in dB.Results allow you to calculate how much jitter was added by the

EUT. The test set transmits jitter, then receives the signal backfrom the EUT, and compares the measurements to see the gain

or loss in jitter from the EUT.


ITU Jitter

Mask

Jitter

Transfer

Values

Green: OK

Red: not OK

11:50:45

JITTER TRANSFER TEST

dB IN PROGRESS

10

0

-10

-20 kHz

.01 .1 1 10 100

x x x x x xx x xx xx x x

Figure 7 Jitter Transfer Test, In Progress Screen


kHz: The X axis shows the frequency of the generated jitter ateach sampling point.

10 -20:The Y axis shows the ratio of jitter in to jitter out in dB.Progress bar: The bar at the is a representation of the testsprogress.

X: These represent the jitter transfer value. indicates that the

transfer value was below the ITU maximum limit (exceeds stan-


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dards). Values below the mask pass, values above it fail. The line

above the Xs represent the ITU jitter mask.

The following F-keys are available:TABLE/GRAPH(F1): Press to see the results in a table format

(Figure 8), press again to return to the graph view.


SAVE(F3): Press to save the results. A second memory card mustbe installed in the chassis to save results. See Section 1.1.5.

STOP/START(F4): Press to stop the test, press again to startthe measurement (this will reset the test).

Jitter Transfer Table Results

This screen features a scroll bar on the right side of the screen. Itindicates that there is additional information available. To access

this information, press . To return to the first screen press .

STOPGRAPH PRINT SAVE

11:50:45JITTER TRANSFER TEST

IN PROGRESS

FREQ(kHz) TRANSFER(dB) MASK(dB) 0.020 0.001(PASS) 0.500 0.036 -0.000(PASS) 0.500 0.066 -0.000(PASS) 0.500 0.120 -0.011(PASS) 0.500 0.220 0.012(PASS) 0.500 0.400 0.000(PASS) 0.500 0.730 -0.004(PASS) 0.500

1.300 -0.020(PASS) 0.500 2.400 -0.005(PASS) 0.500 3.400 -0.005(PASS) 0.500

Figure 8 Jitter Transfer Test-Table Screen

In Table view you can easily see all of the specic frequenciesand amplitudes at which jitter was tested, and the correspondingPASS or FAIL status. Jitter out (transmitted by the test set) is

divided by the jitter in (from the EUT), and the results shown indB. The following is reported:

FREQ (kHz): Measured Frequency.

TRANSFER (dB): Jitter in divided by jitter out value, in dB, andthe PASS/FAIL status.

MASK (dB): Maximum jitter transfer limit dened by the ITU.


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SSMTT-27M1 15

1.1.5 View Test RecordsA total of ten records may be stored via this menu (an additional

memory card is required), including the current results (record 01;

stored in the test sets memory). Records are stored by pressingSAVE in any jitter results screen or by pressing STOP from anywander results screen. The test set rewrites record 01 each time

a test is run. The record numbers are shown in accordance withthe jitter/wander results that are in memory.

For wander measurement there are two types of records in eachmeasurement. The rst wander measurement and histogram is

stored in the SRAM card and is mentioned in the previous para-graph. In the second the raw data is stored in the MMC card.

This data is used by the MTIE/TDEV analyzer for post analysisas discussed in Section 2.

MOREEDIT PAGE-UP PAGE-DN

11:50:45

VIEW TEST RECORDS

REC NAME TYPE STATUS

1. WAN-00 TIE UNLOCKED

CARD START 2004-11-24 22:46:58

STOP 2004-11-24 22:47:09

2. JITRES01 TRANS. UNLOCKED

CARD START 2004-11-24 22:47:16

STOP 2004-11-24 22:59:37

MOREVIEW LOCK UNLOCK

MORECLR CLR-ALL

Figure 9 View Test Records Screen


EDIT(F1): Relabel and save a record. See Editing a Label.

PAGE-UP(F2), PAGE-DN(F3): Scroll through the records.

VIEW(more, F1): Press to view the saved Results screens (thesecontain a PRINT F-key). Press ESC when nished.

LOCK(more, F2): Press to lock the record, so it cannot be deleted.Press UNLOCK(more, F3) so it can be deleted.


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CLR(more, F1): Press to delete a selected unlocked record. If

10 records are already stored, a record will need to be deletedbefore storing a new one.

CLR-ALL(more, F2): Deletes all unlocked records, except thecurrent record.

Editing a Label

1. Select a record in the VIEW TEST RECORDS screen andpress EDIT (F1) and a character entry screen is displayed.

2. At this point the cursor is on the first character of the label,and three F-keys are available:- INSERT (F1): Use to insert characters.

- DELETE (F2): Use to remove characters.- TOGGLE (F3): Use to access characters.

- : Use to position the cursor in the LABEL line.

3. Once nished with step 2, press TOGGLE (F3) to access thecharacter grid and the A will be selected.

4. Use to select a desired character. Press SELECT(F4) and the character is inserted into the LABEL line at thecursor point. Repeat until the label is finished.

If a mistake in the label is made, press TOGGLE (F3) andmove the cursor to the incorrect character, then press

either:- DELETE (F2): Use to remove characters.

- INSERT (F1): Use to insert characters.

Press TOGGLE (F3) to reenter the character grid and continuewith your label.

5. When finished, press TOGGLE (F3), then ENTER and yourrecord is saved with a new name in the VIEW TEST RECORDSscreen.


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SSMTT-27M1 17

1.2 Wander

From the E1 module main menu, select OTHER MEASUREMENT> WANDER. You will see a Downloading... message while the

feature loads. You must be in a E1 SINGLE TEST MODE to per -form wander measurements. After the feature loads, the following

items are available:

TIE/MTIE MEASUREMENT VIEW TEST RECORDS

1.2.1 TIE/MTIE MeasurementThe long-term variation (less than 10 Hz) of a digital signal is

called Wander. To measure select TIE MEASUREMENT and theWander Test Setup screen is displayed as shown in Figure 10.

1.2.1.1 TIE Measurement Setup

11:50:45

WANDER TEST SETUP

FILTER :


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TEST DURATION

Options: TIMED (F1) CONTINU (F2)

Select whether to perform a timed or continuous test. If TIMED

is selected, press SHIFT and use the numeric keypad to enterfrom 1 second up to 999 hours, 59 minutes, 59 seconds (Oneminute is recommended by the ITU-T). If CONTINU is selected,

press F4 to stop the test.

When finished, press START (F4) and refer to Figure 11.

1.2.1.2 Wander Results

11:50:45

ET-000:02:36 RT- 003:17:04

WANDER RESULTS

TIE : -0.971 ns

MTIE : 11.228 ns

+TIE Max : 0.981 ns

-TIE Max : -6.617 ns

PRINT STOP

Figure 11 Wander Result Screen


TIE: Time Interval Error, dened as: The difference between the

measure of a time interval as provided by a clock and the measureof the same interval as provided by a reference clock (per ITU-TG.810) in nanoseconds measured in a one-second interval.

MTIE: Maximum time interval error, maximum TIE during a speci-fied observation period of time.

+TIE Max: Maximum TIE peak during a measurement period.

-TIE Max: Lowest TIE peak during a measurement period.



STOP/START (F4): Press to stop taking measurements, pressagain to restart your measurement. Pressing STOP automatically

saves your test measurement in VIEW TEST RECORDS.

Press to view the next screen:


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SSMTT-27M1 19

PRINT STOP

11:50:45ET-000:02:36 RT- 003:17:04 WANDER HISTOGRAM

TYPE: TIE: 0.9/-6.9 nsDATE: 11/24/04 11:50:45 10

5

ns 0

- 5 -10 0 15 30 45 60 SEC

JUMP ZOOM

Figure 12 Wander Histogram Screen

Note: The test set will require a second memory card installed in

the test sets outer card slot in the inner slot to perform a wanderhistogram. See the test sets Users Manual for more informa-

tion.

This screen presents a visual representation of the wander re -ceived. It contains the following:


JUMP(F2): Moves the cursor in 15 unit intervals, press to

move the cursor in 1 unit intervals.

ZOOM (F3) Change the time view of the display; seconds, min-utes, or hours.

STOP/START (F4): Press to stop taking measurements, pressagain to restart your measurement. Pressing STOP automatically

saves your test measurement in VIEW TEST RECORDS.

: Press to switch between the WANDER HISTOGRAM andthe WANDER RESULT screens.

: Press to move the cursor to the previous /next point and the

TIE value will be updated accordingly at the point.

ESC: Press to return to the WANDER TEST SETUP screen.

1.2.2 View Test RecordsSee Section 1.1.5.


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SSMTT-27M1 21

2 PC Based MTIE/TDEV Analyzer

2.1 Introduction

The MTIE/TDEV Analysis option for the SSMTT-27 moduleextends the wander analysis capabilities of the test set to a PC

environment where the MTIE/TDEV calculation can be donequickly and efficiently.

This clear diagnostic tool helps you determine whether the

collected measurements meet ITU-T requirements. It retrievesstandard TIE measurements and displays them graphically. Once

they are stored on your PC, the software will calculate MTIE/TDEV conforming to ITU-T recommendations O.171 and O.172.The pass/fail report will be based on predened masks dened

by ITU-T recommendations G.811, G.812, G.813, and G.823.

2.2 Analysis Procedure

MTIE/TDEV analysis is based on TIE measurements which havealready been collected and stored in the chassis MMC card under

RESULTS > WANDER folder. The TIE data must be transferredto a PC. Once transferred, the MTIE TDEV Analyzer software will

calculate MTIE and TDEV per ITU-T, and display them graphi-cally; for up to 100,000 seconds. Finally, ITU-T masks for MTIEand TDEV may be displayed, to determine if the device under

tests meets ITU-T requirements. Follow this procedure to performMTIE/TDEV analysis:

1. If not done previously, install the MTIE TDEV Analyzer software

on your PC. Open the MTIE_xx.xxx.exe le, and follow theon screen instructions.2. Perform Jitter/Wander measurements with the SunSet MTT

test set, according to the procedures in Section 3.3and savethe measurement results.

3. Shut down the test set and remove its MMC card. Insert it intoany commercially available MMC card adaptor connected to

a PC, then copy the WANDER folder on the card to the PC.

128MB

SUNRISE TELECOM

SA728

Model

S/N

Folders X

MMC Card

PROFILE

RESULT

BIN

WANDER

Figure 13 WANDER Folder in the MMC Card


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4. Open the MTIE TDEV Analysis software by going to the Win-dows Start button, and select Programs > Sunrise Telecom >

MTIE Analysis. After the program starts up, the MTIE TDEV

Analysis window will appear.5. Click File > Open and in the File Open dialog box navigate to thele that was copied to the PC. The following gure is a sample:

Figure 14 Sample TIE Plot Screen

6. Click MTIE/TDEV > Start MTIE/TDEV Analysis to perform bothanalyses on the le. It will take some time for the process to

complete. When it has, you will see the results at the bottomof the window. Basic analysis is complete.

7. To perform further analysis, click Mask to display a list of specifica-tion masks, as shown in Figure 15, which may be imposed. The

active mask is marked by a check mark. Click a mask to selectit; the analysis will be performed. The name of the mask in use

is shown in the title bar near the bottom of the plot/graph.

Figure 15 ITU-T Mask Selection


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SSMTT-27M1 23

2.2.1 MasksFor MTIE and TDEV related masks, see G.811, G.812, G.813,

and G.823 for details. Here is a series of mask analysis on the

same original data file.

ObservationIntervalinSeconds

G823NetworkInterfacePrimaryReferenceClock

10000

1000

100 10 1 0.1

MTIEMask

TDEVMask

MTIEAnalysisData

TDEVAnalysisData

nsec

0.1

1

10

100

1000

10000

100000

Figure 16 G.823 Primary Reference Clock Mask


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G823PDHSynchronizationInterface

1000

0

100

0

10

0

1

0 1

0.

1 0.1

1

10

100

1000

10000

100000

MTIEMas

k

TDEVMas

k

MTIEAnalysisData

TDEVAnalysisData

nsec

Figure 17 G.823 Synchronization Supply Unit Mask


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SSMTT-27M1 25


G.82

3SDHNetworkInterfaceEquipment

SlaveClock

1000

0

100

0

10

0

1

0 1

0.

1 0.1

1

10

100

1000

10000

100000

MTIEMas

k

TDEVMas

k

MTIEAnalysisData

TDEVAnalysisData

nsec

Figure 18 NI Equipment Slave Clock Mask


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G823PDHSynchronizationInterface

1000

0

100

0

10

0

1

0 1

0.

1 0.1

1

10

100

1000

10000

100000

MTIEMas

k

TDEVMas

k

MTIEAnalysisData

TDEVAnalysisData

nsec

Figure 19 PDH Synchronous Interface Mask


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SSMTT-27M1 27


G.8

11PrimaryReferenceClock

1000000

100000

10000

1000

100

10 1 0

.1

1

10

100

1000

10000

MTIEMas

k

TDEVMas

k

nsec

MTIEAnalysisData

TDEVAnalysisData

Figure 20 G.811 Primary Interface Clock


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G.8

12SynchronizationSupplyUnitTypeI

100000

10000

1000

100

10 1

0.1

1

10

100

1000

10000

MTIEMask

TDEVMask

nsec

MTIEAnalysisData

TDEVAnalysisData

Figure 21 G.812 Synchronization Supply Unit I Mask


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SSMTT-27M1 29


G.8

12SynchronizationSupplyUnitT

ypeII

100000

10000

1000

100

10 1 0

.1

1

10

100

1000

10000

MTIEMask

TDEVMask

nsec

MTIEAnalysisData

TDEVAnalysisData

Figure 22 G.812 Synchronization Supply Unit II Mask


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G.8

12SynchronizationSupplyUnitT

ypeIII

100000

10000

1000

100

10 1

0.1

1

10

100

1000

10000

MTIEMask

TDEVMask

nsec

MTIEAnalysisData

TDEVAnalysisData

Figure 23 G.812 Synchronization Supply Unit III Mask


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SSMTT-27M1 31


G

.813SDHSynchronizationSlaveCloc

k1Mask

1000

100

10 1

0

.1

0.01

0.0

010

.1

1

10

100

1000

MTIEMas

k

TDEVMask

nsec

MTIEAnalysisData

TDEVAnalysisData

Figure 24 G.813 SDH Synchronization Slave Clock 1 Mask


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G.8

13SDHEquipmentSlaveClockO

ptionII

100

10 1

MTIEMask

TDEVMask

nsec

MTIEAnalysisData

TDEVAnalysisData

0.1

1

10

100

1000

10000

Figure 25 G.813 Synchronization Slave Clock 2 Mask


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SSMTT-27M1 33

2.3 Analysis Screen Feature Description

FileO

penS

ave

StartM

TIEAnaly

sis

StartT

DEVAnalys

is

StartB

othMTIE

andTD

EVAnalys

is

Stop

Any

Analys

is

ViewTIEPl

otDataOn

ly

ViewMTIE

Plot

DataO

nly

View

MTIEM

askO

nly

ViewBo

thMTIE

Plot

and

Mask

ViewTD

EVPlot

DataO

nly

View

TDE

VM

askO

nly

ViewBo

thTDE

VPl

otandM

ask

View

AllM

TIE

andTD

EVPlot

and

Mask

View

Serie

sData

...

About

ToolBarDetails

ToolBar

MenuBar

MaskInUse

PlotKey

PlotArea

StatusBar

Figure 26 MTIE/TDEV Screen with Tool Bar Details


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The features are:Menu Bar: Access the programs features, including starting andstopping analysis, applying different ITU-T masks, and savingresults.

File- Open: Select a file to open from the Open dialog box.

- Save: Store the analysis as a .plt (plot), .txt (text) or .jpeg(graphic) file.

- Save As: Save an analysis under a new name.- Download Wizard: Not applicable to this application.- Print: Print the window through a windows printer.

- Exit: Close the program.

View: Hide or display the Tool Bar and Status Bar. MTIE/TDEV: Perform or view MTIE and/or TDEV analysis and

view the data in a table as shown in Figure 27.- Start MTIE Analysis

- Start TDEV Analysis- Start MTIE/TDEV Analysis- Stop Any Analysis

- View TIE Plot- View MTIE Plot

View MTIE Plot Only View MTIE Mask Only

View MTIE Plot and Mask

- View TDEV Plot View TDEV Plot Only

View TDEV Mask Only View TDEV Plot and Mask

- View MTIE/TDEV Plot- View Data Grid, shown in the following gure.Data Display

sec MTIE Data (nsec) MTIE Mask (nsec) TDEV Data (nsec) TDEV

1

2

3

4

5

6

7

8

9

10

20

30

40

50

6070

80

17.04

17.83

17.83

17.83

17.83

17.88

17.88

17.88

18.47

18.47

18.47

18.47

18.98

18.98

18.9818.98

18.98

20.00

20.00

27.89

33.89

43.40

47.27

50.90

54.26

57.42

60.00

60.00

60.00

60.00

60.00

60.0060.00

60.00

0.79

0.70

0.40

0.31

0.31

0.34

0.29

0.25

0.24

0.25

0.20

0.22

0.23

0.25

0.260.28

0.29

OK Cancel

Figure 27 View Data Series

Mask: Impose an ITU-T standard mask by clicking on a mask


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SSMTT-27M1 35

from the drop down list. A check mark will appear next to the

active mask. Figure 15 shows the drop down list and Figures16 through 25 show a sample of each mask.

Help: View the About MTIE window.

Plot Area: As shown in Figure 26, this presents the actual analysis.As an analysis proceeds, watch the plot update in the Plot Area

and Status Bar.

Key shows the plot colors associated with each analysis andmask.

MTIE mask and data are displayed in red; TDEV mask anddata are displayed in blue.

The orange title bar shows the currently applied mask.

Status Bar presents the overall analysis results, including thecurrent activity state of the analysis, the Passed or Failed

result, and how long the analysis process took.

Tool Bar: Shortcuts to commonly used functions. Initially, onlythe analysis buttons are available (such as Start MTIE); after an

analysis has been performed, the remaining buttons becomeavailable, allowing you to view the data in the desired format andfor a particular analysis. Refer to Figure 26.


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SSMTT-27M1 37

3 Applications

3.1 Jitter Measurement

Jitter can be measured in two ways by using an undened quasi-random trafc signal, when the line is in use, or by using specic

test sequences when the line is not in use.

EUT

RX

TX

E1-TX1

E1-RX1

Intrinsic Jitter Measurement

EUT

RX

TX

E1-RX1

Network Jitter Measurement

EUT

TX

RX

Figure 28 Jitter Measurement Setup

1. Connect the equipment for intrinsic or network jitter measure-

ments, as shown in Figure 28.2. From the E1 module main menu, select OTHER MEASURE-

MENT > JITTER > JITTER MEASUREMENT and congure

as required.3. Press START (F4). Measure the filtered output jitter and record

the true peak-to-peak jitter amplitude. Perform a widebandmeasurement, followed by a highband measurement.

4. Look at the results and the Histogram for an overview of themeasurement. Press TYPE (F2) to see each result; peak-to-

peak, base-to-peak, peak-to-base, and RMS (a good averagingmeasurement). Use ZOOM (F3) to look at the values over time.Conrm that the measurement is within limits.

5. Repeat measurements for all desired settings.


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3.2 Jitter Tolerance

Equipment must be able to tolerate a certain level of jitter, asdened by ITU-T G.823. One way to test jitter tolerance is by

checking for the onset of errors. The onset of errors criterion isdefined as the maximum amplitude of jitter at a specified frequency

that causes more than two errored seconds during 30 secondmeasurement intervals.

To perform this test, connect the test set to the EUT and gener-ate a pseudorandom test sequence at a specific frequency. The

EUT should loop the signal and send it back to the test set, whichwill measure any errors that occur. The test set will increase and

decrease the jitter amplitude. Look at the results to determinewhere maximum jitter tolerance was reached.

EUT

RX

TX

E1-TX1

E1-RX1

Loop aTest Pattern

Figure 29 Jitter Tolerance Setup

1. Connect the test set to the equipment under test (EUT). TheEUT should be in a received clocking mode, and have a loop-back in place to loop back the test pattern.

2. From the E1 module main menu, select OTHER MEASURE-MENT > JITTER > JITTER TOLERANCE and the test will startimmediately. The test set will transmit jitter at each frequency,

at varying amplitudes.3. You may watch the test in progress or look at it when it has

completed. The bar at the top of the screen indicates the testsprogress. See Figure 30 for an explanation of the screen.

Confirm that the jitter measurement passes tolerances andor requirements.


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SSMTT-27M1 39


Tolerance

Indicators

: at least+: maximum

tolerated

Y: Tx Jitter

Peak-to-Peak

amplitude

X: Tx Jitter

Frequency

11:50:45 Meas JITTER TOLERANCE TESTUIpp IN PROGRESS

2010

1.0

0.1 kHz .01 .1 1 10 100

Figure 30 Tolerance Test in Progress Screen

An indicates the EUT has met (or exceeded) the ITU speci-

fication for that frequency. A + shows where the EUT hit its maximum jitter tolerance. A

+ above the ITU mask line indicates a pass for that frequency;a + below the mask line, indicates a fail for that frequency (not

shown). Press TABLE (F1) to see the results as a table (Figure 6).

- FREQ (kHz): Frequency tested.

- MTJ (UI-pp): Peak-to-peak Maximum Jitter Tolerance (inUnit Intervals), and PASS/FAIL status. PASS is declared

when the EUT added less than the maximum allowablejitter.

- MASK (UI-pp): Peak-to-peak jitter limit (in UI) as denedby the ITU standard. The mask values are for your informa-tion.

4. Repeat measurements for all desired settings.


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3.3 Wander/TIE/MTIE Measurement

1. Connect the equipment for wander measurements, as shownin Figure 31. Note the presence of an synchronization clock,

which is normally used to synchronize the network.

EUT

RX

TX

E1-RX1

EUT

TX

RX

Synchronization Clock

2.048 Mbit/s or 2 MHz

REF CLKE1

Terminal

Equip.

E1-RX1

GPS or Cesium

Reference Clock

REF CLKE1 Terminal

Equip.

Or

Figure 31 Wander Measurement Setups

2. From the E1 module main menu, select OTHER MEASURE-

MENT > WANDER > TIE MEASUREMENT and congure asrequired.

3. When ready, press START (F4) and the test set will startmeasuring TIE, MTIE, +TIE MAX and -TIE MAX.

4. Observe the results by pressing to switch between theWANDER HISTOGRAM and the WANDER RESULT screens.Press ZOOM (F3) to look at the values over time.

5. Press STOP (F4) and the results are stored.

Post-processing analysis of TIE measurements is availableas a PC software option. It calculates MTIE/TDEV per ITU-TO.171/O.172, and display the results graphically with a clear

pass/fail indication using your Windows based PC. Refer toSection 2for more information.


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SSMTT-27M1 41

4 Reference

4.1 Jitter

Jitter affects both digital (generation of bit errors, uncontrolledslips) and analog signals (unwanted phase modulation of thetransmitted signal). Essentially, jitter is an unwanted phase modu-

lation of the digital signal. Jitter may cause errors or bit slips in adigital circuit, and deteriorate the performance of a transmission

network (which is why you look for bit and other errors when test-ing jitter tolerance).

Jitter is classified as systematic and random jitter:

Systematic jitter is pattern-dependent. In lower-rate digitalsystems, systematic jitter is dominant.

Random jitter is independent of the transmitted pattern. Inhigher-rate systems, the random jitter may become more

important.Test environment parameters which affect jitter performance aretest sequences, bit rate, pulse shape, cable characteristics, tem-perature, cross-talk, and noise. Network equipment must be able

to operate in the presence of some jitter (tolerance).

Output jitter measurement can be classied into two categories:

Network output jitter (at hierarchical interface) Intrinsic jitter (generated by individual digital equipment)

Table 1 shows the maximum allowable jitter at 2.048 Mbit/s, as

dened by ITU-T G.823.

Bit Rate

Network Limit

Measurement Filter

Bandwidth

B1 UnitIntervalPeak-to-

B2 UnitIntervalPeak-to-

Cut-off Frequency

Lowerf1

Lowerf3

Higherf4

2.048

Mbit/s

1.5 0.2 20 Hz 18 kHz

700 Hz

100

kHz

Table 1 Maximum Jitter Allowed for 2.048 Mbit/s

Figure 32 shows how jitter should be measured per ITU G.823.


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Band

pass filtercut-off &

f1& f

4

Band

pass filtercut-off &

f3& f

4

Jitter Detector

HierarchicalInterface or

Equipment

Output Port

B1Unit Intervals B

2Unit Intervals

Measured Jitter Amplitude

Figure 32 Measuring Jitter

Note the Wideband and Highband lters. Each has a lower fre-quency cutoff value (f

1or f

3) and a higher frequency cutoff value

(f4). The B

1and B

2peak-to-peak unit intervals correspond to the

measurements. Refer to G.823 for details on jitter tolerances.


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SSMTT-27M1 43

4.2 Wander

Phase deviations with a frequency content of less than 10 Hz arereferred to as wander. If a signal with a lot of wander is examined

using an oscilloscope, you will perceive a sharp clock signal,which gradually moves back and forth, compared to the Exact

Clock as in Figure 33.

Exact

Clock

Clock

with

Wander

Figure 33 Clock Wander

ITU-T O.172 also species some requirements for wander mea-suring equipment. O.172 says that TIE can be interpreted as

the time difference between the signal being measured and thereference clock. It is typically measured in nanoseconds and set tozero at the start of the measurement period. Therefore, TIE gives

the timing change since the measurement began. The referenceclock can be 2.048 MHz or a 2.048 Mbit/s.

The test set currently measures real time TIE. It requires a refer-

ence clock connected to the REF CLK port (2.048 MHz) or a 2.048Mbit/s signal connected to the receiver of the second line (L2-RX).The test set wont run the measurements without external clock,

as opposed to jitter measurements which can be performed usingthe internal clock as reference.

Other wander measurements such as MTIE (Maximum Time

Interval Error) and TDEV (Time Deviations) are used to comparethe status of the network clock sources against standard ITU-T

masks and determine whether the signal passes or fails the limitsestablished by ITU.

ITU-T recommends performing real-time TIE measurements forat least 100,000 seconds to collect sufficient information about

the presence of wander in the network. MTIE/TDEV calculationis based on this data, and is normally done ofine with additional

software that processes the information according to ITU.


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4.2.1 Time Interval Error (TIE)TIE is dened by ITU-T G.810 as the time difference between the

measure if a time interval as provided by a clock (as recovered

from a data signal) and the measure of that same time as providedby a reference clock. This reference clock can be a 2.048 MHz ora 2.048 Mbit/s signal. TIE is normally measured in ns.

Maximum Time Interval Error (MTIE)MTIE is dened by ITU-T G.810 as the maximum peak-to-peakdelay variation of a given timing signal within an observation time,

for all observation times of that length within the measurementperiod (T).

This is a useful tool for identifying phase transients in the synchro-

nization network. MTIE is an ofine measurement that is normallyperformed by ofine software packages and high-speed proces-

sors, to calculate the value for all the time observation intervals

(from 1 second up to 100,000 seconds).The following procedure is used to calculate MTIE:

1. Examine all of the one-second intervals.2. Find the maximum time deviation within those intervals and

display it in a table as the one second MTIE value.3. Examine all of the two-second intervals.

4. Find the maximum time deviation within those intervals anddisplay it in a table as the two second MTIE value.

5. Repeat for all other intervals (3, 4, 5 to 9).6. From 10 to 100, the procedure is the same. The only difference

is that the intervals calculation will be made in steps of 10

seconds. Start with all 10 seconds intervals, and the maximum

value will be assigned to the 10-second value in the table. Thenext intervals to be evaluated will be 20 seconds, 30 seconds,and so forth.

7. Once it reaches 100 seconds, the intervals will be evaluated insteps of 100 up to 1,000, in steps of 1,000 up to 10,000 sec-onds, and in steps of 10,000 seconds up to 100,000 seconds

(as recommended by ITU-T O.172).

MTIE analysis must meet ITU-T requirements by comparing theanalyzed data against predefined masks according to recommen-

dations ITU-T G.811, G.812, G.813, G.823, and G.825.


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SSMTT-27M1 45


G.8

23PDHSynchronizationInterf

ace

1000

0

100

0

10

0

1

0 1

0.

1 0.1

1

10

100

1000

10000

100000

MTIEMas

k

TDEVMas

k

MTIEAnalysisData

TDEVAnalysisData

nsec

Figure 34 MTIE/TDEV Plots by MTIE/TDEV Analyzer


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The following procedure is used to calculate off-line TDEV:

1. Examine all of the one second intervals.

2. Find the standard deviation within those intervals and display

it in a table as the one second TDEV value.3. Examine all of the two-second intervals.

4. Find the standard deviation within those intervals and displayit in a table as the two second TDEV value.

5. Repeat for other intervals (3, 4, 5 to 9).6. From 10 to 100, the procedure is the same. The only difference

is that the intervals calculation will be made in steps of 10seconds. Start with all 10 seconds intervals, and the maximumvalue will be assigned to the 10-second value in the table. The

next interval to be evaluated will be 20 seconds, 30 seconds,and so forth.

7. Once it reaches 100 seconds, the intervals will be evaluated insteps of 100 up to 1,000, in steps of 1,000 up to 10,000 sec-

onds, and in steps of 10,000 seconds up to 100,000 seconds(as recommended by ITU-T O.172).

MTIE measurement ranges also apply to TDEV analysis, andthe TDEV is dened by ITU-T G.811, G.812, G.813, G.823, and

G.825.

See Figure 34 for a MTIE and TDEV plot example.

4.3 Express Limited Warranty

This Sunrise Telecom product is warranted against defects in

materials and workmanship during its warranty period. The war-ranty period for this product is contained in the warranty page on

http://www.sunrisetelecom.com.

Sunrise Telecom agrees to repair or replace any assembly or

component found to be defective under normal use during thisperiod. The obligation under this warranty is limited solely to re-

pairing or replacing the product that proves to be defective withinthe scope of the warranty when returned to the factory. This war-ranty does not apply under certain conditions, as set forth on the

warranty page on http://www.sunrisetelecom.com.

Please refer to the website for specic details.THIS IS A LIMITED WARRANTY AND THE ONLY WARRANTY

MADE BY SUNRISE TELECOM. SUNRISE TELECOM MAKESNO OTHER WARRANTY, REPR SENTATION OR CONDITION,

EXPRESS OR IMPLIED, AND EXPRESSLY DISCLAIMS THEIMPLIED WARRANTIES OF MERCHANTABILITY, FITNESSFOR A PARTICULAR PURPOSE AND NON-INFRINGEMENT

OF THIRD PARTY RIGHTS.


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SSMTT-27M1 47

Index

A

ApplicationsJitter Measurement; 37

Jitter Tolerance; 38Wander/TIE/MTIE Measurement; 40

CCautions; 2

F

Figures01 Jitter Test Setup Screen; 6

02 Output Jitter Results Screen; 803 Jitter Histogram Screen; 9

04 Jitter Generation Setup Screen; 1005 Jitter Tolerance Test, In Progress Screen; 11

06 Jitter Tolerance Test-Table Screen; 1207 Jitter Transfer Test, In Progress Screen; 1308 Jitter Transfer Test-Table Screen; 14

09 View Test Records Screen; 1510 Wander Test Setup Screen; 17

11 Wander Result Screen; 1812 Wander Histogram Screen; 19

13 WANDER Folder in the MMC Card; 2114 Sample TIE Plot Screen; 2215 ITU-T Mask Selection; 22

16 G.823 Primary Reference Clock Mask; 23

17 G.823 Synchronization Supply Unit Mask; 2418 NI Equipment Slave Clock Mask; 2519 PDH Synchronous Interface Mask; 26

20 G.811 Primary Interface Clock; 2721 G.812 Synchronization Supply Unit I Mask; 2822 G.812 Synchronization Supply Unit II Mask; 29

23 G.812 Synchronization Supply Unit III Mask; 3024 G.813 SDH Synchronization Slave Clock 1 Mask; 31

25 G.813 Synchronization Slave Clock 2 Mask; 3226 MTIE/TDEV Screen with Tool Bar Details; 33

27 View Data Series; 3428 Jitter Measurement; 3729 Jitter Tolerance Testing; 38

30 Tolerance Test in Progress Screen; 3931 Wander Measurement Setups; 40

32 Measuring Jitter; 4233 Clock Wander; 43

34 MTIE/TDEV Plots by MTIE/TDEV Analyzer; 45


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J

Jitter; 41Jitter Generation; 10

Jitter Generation Setup ScreenFREQUENCY; 10PP UI; 10

Jitter Results ScreenBanner; 8

ET; 8FILTER; 8JITTER; 8

LIMIT; 8PEAK +/-; 8

PHASE HIT +/-; 8RMS; 8

RT; 8

Jitter Test Setup Screen+P LIMIT; 7-P LIMIT; 7B1/B2 LIMIT; 7

FILTERHIGHBND; 6

WIDEBND; 6REF CLOCK; 7

RX RATE; 6TEST DURATION; 7THRESHOLD

G.823; 6USER; 7

Jitter Tolerance; 11Jitter Tolerance Test-Table Screen

FREQ (kHz); 12MASK (UI-pp); 12MTJ (UI-pp); 12

Jitter Transfer; 13Jitter Transfer Test-Table Screen

FREQ (kHz); 14MASK (dB); 14

TRANSFER (dB); 14Jitter Transfer Test Screen

10 -20; 13

kHz; 13X; 13


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SSMTT-27M1 49

P

PC MTIE/TDEV AnalyzerAnalysis Procedure; 21

Masks; 23Screen Feature Description; 33

R

ResultsHistogram screen; 9

TTables

01 Maximum Jitter Allowed for 2.048 Mbit/s; 41

V

View Test Records Screen; 15Editing a Label; 16

WWander; 43Wander Result Screen

+TIE Max; 18-TIE Max; 18

MTIE; 18TIE; 18

Wander Test Setup Screen

FILTER; 17REF CLOCK

L2-RX & TTL-L2; 17RX RATE; 17

TEST DURATION; 18Warnings; 2


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