M. Hücker

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M. Hücker Manipulating Competing Order with High Pressure Neutron Scattering Group (CMPMS) Correlated Electron Systems (Superconductivity, Magnetism, Electronic Order) High Temperature Superconductors Transition Metal Oxides Ferroelectrics Heavy Fermion Systems Multiferroics La 2-x Ba x CuO 4 Charge & Spin Stripes

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Manipulating Competing Order with High Pressure. M. Hücker. Neutron Scattering Group (CMPMS). La 2-x Ba x CuO 4 Charge & Spin Stripes. Correlated Electron Systems ( Superconductivity, Magnetism, Electronic Order) High Temperature Superconductors Transition Metal Oxides Ferroelectrics - PowerPoint PPT Presentation

Transcript of M. Hücker

Page 1: M. Hücker

M. Hücker

Manipulating Competing Order with High Pressure

Neutron Scattering Group (CMPMS)

Correlated Electron Systems(Superconductivity, Magnetism, Electronic Order)

High Temperature Superconductors Transition Metal Oxides Ferroelectrics Heavy Fermion Systems Multiferroics

La2-xBaxCuO4Charge & Spin

Stripes

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LBCO

CGO

1 mm

Single-Crystal XRD at Low Temperature

360° X-ray window

Intensity ~10-6 off strongest Bragg Peak Powder XRD not possible E=100keV, 2•1011 photons/sec/mm2

BW5-HASYLAB

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High Pressure Beamline at NSLS-II

Single Crystal XRD 4-Circle Diffractometer Point Detector (2D Detector optional) Low Temperature Flux >1011–1012 photons/sec on Sample DAC (MAC,Toroid) Sample Centering

M. v. Zimmermann, HASYLAB J. M. Tranquada, G. Xu, Neutron Scattering Group Y. J. Kim, University of Toronto B. Wells, University of Connecticut D. J. Buttrey, University of Delaware C. C. Kao, Z. Zhong, NSLS

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NSLS II Paris Edinburgh Cell

100 mm3

30 GPa 25 kglow T not so easy

Diamond Anvil Cell 0.0001 mm3

100 GPasmall beamsample positionpressure inhomogeneous

ISIS

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Yamada et al. JSSC 1989

Bozovic et al. PRL 2002

LSCO thin filmLSCO bulk

Gao et al. PRB 1994

Hg-1223 bulk

Pressure and Superconductivity

Pressure: affects crystal structure and electronic band structure

buckled

flat

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Competing order in LBCO

150

200

250

300

350La2-xBaxCuO4

LTOHTT

Tem

pera

ture

(K

)

0.100 0.125 0.1500

10

20

30

40

50

60

70LTO

++ LTTPccn

TCO

Tc

TSO

TLT

LTO

PccnLTT

Tem

pera

ture

(K

)

hole doping (x)

single-crystalHXRD

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Charge Stripes under Pressure

LTT structure

Charge Stripes

Do stripes survive in flat planes when x=1/8?

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Hole Crystallization in 2-Leg Ladder

Blumberg et al. Science 2002Rusydi et al.

Sr14Cu24O41 Abbamonte et al.

RSXSoxygen-K edge

XRD: Zimmermann et al. PRB 2006

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3 GPa 4 GPa

7 GPa

NSLS/HASYLAB/NSLSII100keV

Large Volume Pressure Cells for Single-Crystal X-ray Diffraction

100keV

Mini Toroid Cell1 cm

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pressure cell: scattering/absorption

pressure cell absorption: factor 10

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pressure sensor: CuGeO3

structural distortion at the spin Peierls transition at 14 K

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100 keV beamline BW5 at HASYLAB, Hamburg

E-range:60-200 keV

Crystal type:Si/TaSi2 (100”)Si1-xGex (15”–70”)Our Exp: 35”

E-resolution:600eV at 100keV

Flux(photons/s):2e11/mm2 @ 100keV(100mA, 4.5GeV)

Spot size:0.5mm x 0.5mm to6mm x 6mm

Detector:N2 cooled Ge det.

Wiggler:2Tesla, 17 periods

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Competing Order

Lattice density (pressure)Charge density (doping)

CePd2Si2