Lowering the Cost of Test while Improving Time-To …600 $800 $1,000 $1,200 $1,400 4 7 8 9 0 1 2 3 4...
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Transcript of Lowering the Cost of Test while Improving Time-To …600 $800 $1,000 $1,200 $1,400 4 7 8 9 0 1 2 3 4...
Lowering the Cost of Test while Improving Time-To-Market with a Platform-based ApproachA Smarter Approach to Meet Test Needs in the Era of Smart Devices
Ma Lisi
Technical Marketing Engineer
ni.com/semiconductor
Long-Term Track Record of Growth
7,500+
EMPLOYEES
50+ COUNTRIES
$1.23BILLION
IN 2015
OVER 18%
INVESTMENT IN R&D
35,000+
CUSTOMERS WORLDWIDE
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ni.com
NI equips engineers and scientists with systems that
accelerate productivity, innovation, and discovery.
Mission Statement
Accelerating Engineering For More Than Four Decades
2020
1986LabVIEW starts
the computer-based
measurement revolution
1991Creates the Alliance
Partner Network to
strengthen ecosystem
1998Creates PXI and
expands opportunities
with complete
system solutions
2004Makes FPGAs
accessible to engineers
and scientists
2006Announces
CompactDAQ
to increase
measurement accuracy
2013Introduces
software-designed
instrumentation
2014Leads prototyping
of 5G systems
1976NI founded
1977Introduces GPIB to
connect instruments
to mini computers
1983Introduces first GPIB board
to connect instruments
to IBM PCs
1987Releases data acquisition
solutions to provide
accurate measurements
ni.com
NI PXI Serves a Broad Range of Applications
mmWave Channel
Sounding5G Research
Automotive Radar
Prototyping
RFIC
Characterization
Electronic Warfare &
Spectrum Monitoring
Hardware-in-the-Loop
(HIL) SimulationDepot Testing
RF Record and
Playback
Semiconductor
Production
Military Radio Test
Global Service and Support, Locally Delivered
Austin
Debrecen
Penang
Shanghai
Incheon
Hyogo
Taipei City
Shenzhen
Tokyo
Seoul Munich
São Paulo
Guadalajara
Arboga
Chennai
Dallas
Bangkok
Hsinchu City
Ho Chi Minh City
Icheon
*Provides NI Repair, Calibration, and Inventory Services
NI Certified Calibration Centers
NI Inventory Services Sites
NI Service Center* and Manufacturing
NI Service Center* Only
PCs
Smartphones
IoT Devices
Tablets
Connected TVs
Connected Cars
2017E2011 20142005 2008
20B
15B
10B
05B
Source: BI Intelligence Estimates
The Big Bang of Smart Devices
ni.com
A smart phone is much more than a simple radio.
GPSWatch
Bagpipe TunerSeismograph
And More…
Computer Televis ionCalcu lator
Music Player
phone
E-ReadersCamera
ni.com
Powerful software platform
A smart phone contains much more than a simple radio.
sources: ifixit.comFusion Applications Processor SoC with LPDDR4 RAM
LTE Modem with multiple Celluar standard
support (from LTE FDD to GSM/EDGE)
Muti mode, multi band RF Front end modules
ni.com
Increasing Complexity of Wireless Standards
802.11g802.11b
GSM 850GSM 900
GSM 1800GSM 1900
Bluetooth 2802.11g802.11b
GSM 850GSM 900
GSM 1800GSM 1900
Bluetooth 2.1 + EDR
802.11n
UMTS 2100
UMTS 850
UMTS 900
UMTS 1900
GPS
GSM 850GSM 900
GSM 1800GSM 1900
Bluetooth 4.0 (LE)
UMTS 2100
UMTS 850
UMTS 900
UMTS 1900
GPS
LTE 800
LTE 850
LTE 900
LTE 1800
LTE 2100
LTE 2600
802.11g802.11b
802.11n
802.11ac
Glonass
NFC
20102005 2015 2020
Pro
toco
l C
om
ple
xity
2000
GSM 900GSM 1800
802.11
NFC
Bluetooth
Cellular
GNSS
5G
GSM 850GSM 900
GSM 1800GSM 1900
Bluetooth 5
UMTS 2100
UMTS 850
UMTS 900
UMTS 1900
GPS
LTE 800
LTE 850
LTE 900
LTE 1800
LTE 2100
LTE 2600
802.11g802.11b
802.11n
802.11ad
Glonass
NFC
802.11ac
Galileo
5G
802.11ax
Beidou
ni.com
“Multiple versions of the same LTE device are required to accommodate the worldwide proliferation of
cellular bands — 40 already and counting. The problem gets even worse when you consider the different
band combinations required to support LTE-Advanced carrier aggregation.”
2005
PA
2015
Multi-band FEM
2020
Integrated Radio
2010
FEM
AD
C
DA
C
PMI
C
AD
C
DA
C
Higher Level Integration in RF Front Ends
ni.com
Time
20152013 2017 2019
UnitsAvg
Price
Higher Integration with Cost Reduction
2011
16 Billion
12 Billion
8 Billion
4 Billion
$1.00
$0.50
Wireless IC
Average Selling Price
Units
Source: Databeans, Inc.
ni.com
Unique Attributes of Smart Devices - Common Test Needs
More functionality
Ensure high reliability
Lowest cost
Fast time to market
CONVERGENCE LOWER PRICE RAPID CHANGE
Vendor Strategies for Test and Measurement
C L O S E D
• “Vendor knows best”
• Fixed-functionality
• Closed ecosystem
• Customer pays
Closed Approach in Labs
▪ Fixed functionality
▪ Hard to keep up with change
▪ Not optimized to work together
Box InstrumentationATE
Closed Approach in Production
▪ Does not economically scale to Mixed Signal/RF ICs
▪ Expansive, large footprint
• Disconnect
• Long test cycles
• Increasing cost
Becoming a Business Risk
Vendor Strategies for Test and Measurement
C L O S E D
• “Vendor knows best”
• Fixed-functionality
• Closed ecosystem
• Customer pays
P L A T F O R M
• “Customer knows best”
• Customizable solution
• Open, vibrant ecosystem
• Customer designs
ni.com
A Smarter ApproachLabs
▪ Designed for automation
▪ Optimized for measurement quality
▪ Fast test cycles
Production Floor
▪ Designed for test cell
▪ Optimized for throughput
▪ Cost effective
Same Platform
▪ Maximize Leverage
▪ Code, setup, training
▪ Simpler correlation
▪ Faster test cycles
▪ Lower cost
ni.com
Common Platform: Lab to Production
NI STS T1NI PXI
CHARACTERIZATION
NI STS T4NI STS T2
PRODUCTION
PXI Chassis and Controller
PXI Instrumentation and Measurement Software
LabVIEW (Code Module Development) and TestStand (Test Management)
STS Standardized Docking and Cabling Interface
ni.com
NI Semiconductor Test System
NI SERVICES AND SUPPORT
NI MODULAR HARDWARE
ONE-PLATFORM APPROACH
Support 700+ Field Engineers
700+ Support Engineers
50+ Worldwide Offices
Open Connectivity10,000+ Instrument and Device Drivers
1,000+ Sensor and Motor Drivers
Add-Ons400+ Software Add-Ons
5M+ Tools Network Downloads
Community300,000+ Online Members
450+ User Groups
9,000+ Code Examples
Partners1,000+ Alliance Partners
Industry-Leading Technology Partners
Academia8,000+ Classrooms Worldwide
TH
IRD
-PA
RT
Y S
OF
TW
AR
ET
HIR
D-P
AR
TY
HA
RD
WA
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NI PRODUCTIVE
DEVELOPMENT SOFTWARE
NI E
CO
SY
ST
EM
NI
EC
OS
YS
TE
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NI as a System Supplier
2,000 PXI integrated systems shipped monthly
200,000 PXI chassis shipped since 1997
50,000 PXI systems deployed globally into high volume manufacturing
15,000 PXI systems deployed in Semiconductor Labs (Design, V&V, Char)
1,000 PXI systems deployed in Semiconductor production
250 STS Semiconductor production systems deployed (2016)
Diverse Industries Including
Semiconductor Mobile devices Electronics
Aerospace and defense Automotive Energy; Oil and gas
Education
Diverse Global Conditions
Oil Fields to Clean Rooms
ni.com
• FPGA-based servoing for
measurement acceleration
• Up to 1 GHz instantaneous bandwidth
for wide range of wireless technologies
• R&D-grade measurement performance
with up to -50 dB EVM for 802.11ax
Key Innovations for Semiconductor Test
NI Vector Signal Transceiver
(VST)
• Broad IV range: 200V(20W), 3A
• (10A pulse)
• Current resolution to 10fA
• Max sampling to 1.8MS/s
• SourceAdaptTM Technology for fast
settling in presence of capacitive loads
• Best in class channel density
NI Source Measure Units (SMUs)
• ATE-class digital (with PPMU) in PXI
• Out of the box Digital Pattern
Editor software
• Time sets, drive formats, opcodes,
HRAM, Source and capture,
history RAM, Shmoo
NI Digital Pattern Instrument
ni.com
—Doug Johnson, Qualcomm Atheros
Qualcomm Creates A Customized, Flexible WLAN Test System
Using The NI PXI Platform
"we improved test speeds by more than 200 times compared to traditional rack-and-stack instruments
while significantly improving test coverage.”
ni.com
Qualcomm Reduces Characterization Test Times
T E S T T I M E
1 0 X F A S T E R
2 0 0 X F A S T E R
TRADITIONAL RACK AND STACKTesting 802.11 a/b/g
NI PXI RF AND LABVIEWTesting 802.11 a/b/g and n
NI VST, LABVIEW, AND LabVIEW FPGATesting 802.11 a/b/g, n, and ac
ni.com
“We were able to reduce manufacturing test time of Power Amp (PA) by 5 times compared to existing
test system by using NI VST to implement power servoing on FPGA level.”
—New Product Introduction (NPI) Team, Broadcom
Power Amplifier (PA) Testing with Real-Time DPD
ni.com
—Woody Beckford, Analog Devices Inc.
Analog Devices Reduces MEMS Production Test Cost
“Using PXI and LabVIEW, we were able to test our MEMS devices at a fraction of the cost, weight,
power consumption, and footprint of our previous ATE system.”
卓胜微电子使用NI PXI平台大幅提升RFIC量产测试速度和灵活性“NI第二代矢量信号收发仪(VST 2.0)，将 RF 信号发生器和 RF 信号分析仪集成到单个模块中，提供业内顶尖的RF测量性能，1GHz高带宽，更提供高性能的可编程FPGA，帮助客户实现灵活的高频性能测试。我们在和NI合作的过程中体会到了开放平台的好处，稍作改动就能够为下一批次的芯片做测试。”
——唐壮，卓胜微电子CTO
