Logarithmic Amplifier2

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    DESIGN MASTER

    Laboratory #2 Homework 441G

    Marica Rzvan-Mihai

    Toader Mihai-Silviu

    Vlaic Iuliana-Maria

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    A log amplifier (logarithmic converter) is one for which the output voltage Vout is K

    times the natural log of the input voltage Vin

    This circuit outputs the negative log of the input. The first op-amp attempts to keep its

    input at ground, which means the current across the 1k resistor must be proportional to the

    input voltage. This current goes across a transistor, so the op-amp must keep its output

    voltage at a level which satisfies the Ebers-Moll equations, which means that eV

    out is

    proportional to the input current. This means that output voltage must be proportional to the

    log of the input current (and thus the input voltage).

    We consider the following circuit:

    =>

    =>

    Where: - base-emittor voltage

    - thermal voltage

    - input voltage

    - output voltage

    - collectors current

    - leakage current

    We know the following terms:

    = 25 mV

    = 5 V

    = 48 nA

    R= 1k

    http://en.wikipedia.org/wiki/Logarithmhttp://en.wikipedia.org/wiki/Amplifierhttp://en.wikipedia.org/wiki/Natural_loghttp://en.wikipedia.org/wiki/Logarithmhttp://en.wikipedia.org/wiki/Bipolar_junction_transistor#Ebers.E2.80.93Moll_modelhttp://en.wikipedia.org/wiki/Bipolar_junction_transistor#Ebers.E2.80.93Moll_modelhttp://en.wikipedia.org/wiki/Logarithmhttp://en.wikipedia.org/wiki/Natural_loghttp://en.wikipedia.org/wiki/Amplifierhttp://en.wikipedia.org/wiki/Logarithm
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    Inserting them into the output voltage equation we will obtain = -0.288 V (in the

    ideal case).

    If we want to be sure that our circuit performance is high and the failures that occur

    during operation are minimum, we must implement a worst case situation scenario.

    Worst-case circuit analysis (WCCA or WCA) is a cost-effective means of screening

    a design to ensure with a high degree of confidence that potential defects and deficiencies are

    identified and eliminated PRIOR TO and DURING test, production, and delivery. It is a

    quantitative assessment of the equipment performance, accounting for manufacturing,

    environmental and aging effects. In addition to a circuit analysis, a WCCA often includes

    stress and derating analysis, Failure Modes and Effects Criticality (FMECA) and Reliability

    Prediction (MTBF).

    The specific objective is to verify that the design is robust enough to provide operation

    which meets the system performance specification over design life under worst-caseconditions and tolerances (initial, aging, radiation, temperature, etc.).

    Stress and De rating Analysis is intended to increase reliability by providing sufficient

    margin compared to the allowable stress limits. This reduces overstress conditions that may

    induce failure, and reduces the rate of stress-induced parameter change over life. It determines

    the maximum applied stress to each component in the system.

    A worst case circuit analysis should be performed on all circuitry that is safety and

    financially critical. Worst case circuit analysis is an analysis technique which, by accounting

    for component variability, determines the circuit performance under a worst case scenario

    (under extreme environmental or operating conditions). Environmental conditions are definedas external stresses applied to each circuit component. It includes temperature, humidity or

    radiation. Operating conditions include external electrical inputs. Component quality level,

    interaction between parts, and drift due to component aging.

    In order to perform this analysis, we must implement our circuit in a program called

    Design Master and we will obtain the results for this situation.

    DESIGN MASTER features

    Based upon the Worst Case Analysis Plus (WCA+) methodology developed by

    Design/Analysis Consultants, Inc., Design Master (DM) is used for design validation, risk

    assessment, and optimization. Design Master:

    Solves design equations, including the combined effects of all variables:

    o Output includes minimum, average, typical, maximum, standard deviation, and

    Cpk (capability index) values.

    o Accounts for the effects of dependent variables to ensure that unrealistically

    pessimistic results are eliminated.

    o Accounts for the effects of dynamic (application) variables to avoid unrealistically

    optimistic results.

    http://en.wikipedia.org/wiki/Deratinghttp://en.wikipedia.org/wiki/FMECAhttp://en.wikipedia.org/wiki/MTBFhttp://en.wikipedia.org/wiki/MTBFhttp://en.wikipedia.org/wiki/FMECAhttp://en.wikipedia.org/wiki/Derating
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    Generates the estimated probability distribution of the equation's range of results, and

    provides an estimate of the probability of occurrence for any out-of-specification

    results.

    Tabulates the normalized sensitivity of the equation to each of its variables.

    Calculates the optimum value for each variable. Generates graphs of the equation for each variable.

    Min/Average/Typical/Max

    Solutions

    WORST CASE

    RISK

    ASSESSMEN

    DESIGN

    OPTIMIZATIO

    Probability of

    Exceeding

    Specification

    Interactive

    Probability

    Sensitivity

    of Each

    Optimum

    Value for

    Each

    Graphs

    for Each

    Automatic Generation ofWorst Case Formulas

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    In the WorkSheet screen we will intorduce the parameters that are deduced using certain

    formulas: , and .

    Output voltage:

    Base-emitter voltage:

    Collectors current:

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    In the Variables screen we introduce the parameters that are known:R, , , .

    Resistance:R

    Input voltage:

    Thermal voltage:

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    Leakage current:

    After we compile the program we will obtain the analysis results for: , and .

    Analysis for the output voltage:

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    Analysis for the base-emitter voltage:

    Analysis for the collectors current:

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    Graph (Is, Vo)

    Graph (R, Vo)

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    Graph (Vi,Vo)

    Graph (Vth,Vo)

    To conclude, after succesive parameter adjustments we have been able to obtain the

    individual sensitivities for each component so that the overall circuit sensitivitie fits within the

    acceptance limits.