LED TESTERTurnkey System for Production

One Complete Solution.Two Global Leaders.

Our story

Konica Minolta Sensing Americas provides advanced optical technology that precisely measures the elements of color and light. Their products have become a staple in research and manufacturing environments, helping organizations to meet product quality and operational goals with less waste, time, and effort. This commitment to creating value for customers is the core principle behind the Konica Minolta brand, and has led them to develop the world’s first portable spectrophotometer and the first light meter used on board a spacecraft (Apollo 8). It’s also the driving force behind the high level of quality and precision built into each of their products. These are some of the reasons why Konica Minolta is regarded as the technological leader in color and light measurement solutions today.

One Complete Solution.Two Global Leaders.

Based in Germany, Instrument Systems develops and produces high-quality optical test and measurement instruments for a broad spectrum of applications. Their extensive product range includes spectrometers, imaging photometers and colorimeters, goniophotometers, integrating spheres, and turnkey system solutions. Instrument Systems is dedicated to working with standardization committees and associations such as ICDM and CIE. They also cooperate with leading national metrology institutes.

Now, these two experts have combined their knowledge and tools together to offer the complete solution for the most accurate measurement of light and color available in the market today.

Your total light and display sensing solution.

Product Highlights Optical measurements with high-performance CCD Spectrometer CAS140CT Measurement adapters (in conformity with CIE-127) for luminous intensity and luminous flux

Electrical measurements with Keithley 2400/2600 Sourcemeter

User-configurable testing of all optical and electrical parameters of LEDs

Simple connection to handler systems and wafer probers

New: fast LED wafer inspection with MultiDie Testing

High-Accuracy LED Measurements:Now Even Faster! The proven LED Tester from Instrument Systems has been completely re-engineered. To meet the enhanced requirements for measuring accuracy and speed in LED production the new CAS140CT CCD array spectrometer from Instrument Systems and the fast Keithley 2600 series current/voltage source have beenintegrated. At the same time Instrument Systems is continuing to supply the proven Keithley 2400 Sourcemeter. The LED Tester canbe used to test all relevant optical parameters of LEDs:

Measuring LED parameters in production presents particular challenges for metrology equipment, because CIE-compliant measuring adapters have a very low light throughput. At the same time, short measuring times are necessary to ensure that equipment can operate profitably. There is also a wide diversityof LEDs to be tested, ranging from small SMT designs to high-power LEDs.

The CAS140CT, the successor to the industry proven CAS140B, guarantees maximum accuracy and reproducibility, even for critical measuring parameters, e.g. dominant wavelength and color coordinates of white LEDs. The Keithley 2400/2600 facilitates much faster measurements than has been possible to date. The diagram shows that customers are benefiting from substantial reductions in testing times for electrical measurements, particularly in the case of longer test sequences.

The software was also fully updated in line with the hardware enhancements. A new flexibly configurable user interface has been combined with a considerably expanded array of functions to meet all requirements. New features are provided by statistical analyses and overviews, as well as a dedicated module for wafer probing.

Luminous intensity [cd] and radiant intensity (W/sr)

Luminous flux [lm] and radiant power [W]

Dominant, centroid and peakwavelength [nm]

Color coordinates, color temperature andcolor rendering index

Forward voltage and reverse current

Test sequence 1 includes one optical and one electrical test, whereas sequence 2 includes one optical and five electrical tests.

Your total light and display sensing solution.

The MultiDie Testing procedure allows up to 16 dies to be tested at once using a specially developed probe card. Since the electrical switching times are significantly shorter than the traverse times of the probers, this significantly increases throughput. Based on the fast probers in the BlueRayTM Series and the LED Tester from Instrument Systems, MultiDie Testing increases the throughput by a factor of four compared with conventional systems.

LED Wafer Inspection: MaximumFront-End Requirements In LED production, the finished LED chip presents the first opportunity to determine the properties of what will become an LED. The LED chip is a key component, representing 40% of the value of an LED. Accurate measurements of optical and electrical parameters exhibited by the dies on the wafers are essentialfor ensuring high quality of the finished LEDs.

MultiDie Testing: 70,000 Dies an Hour Instrument Systems joined forces with Süss Microtec AG to develop the fastest wafer probing system on the market.

The LED Tester from Instrument Systems is ideal for meeting the special front-end measuring challenges and now includes a dedicated wafer mapping software module. The CAS140B/CT CCD array spectrometer and fast series 2600 current sources from Keithley guarantee maximum accuracy and very short measuring times.

The EKT-10x fiber-optic measuring adapter was specially developed for taking measurements on wafers. It features particularly high light throughput and permits very short measuring times, even for wafers where light levels are low due to the missing optical packaging. The compact design enables it to be positioned between the measuring microscope and wafer without compromising visual inspection of the contacts.

Your total light and display sensing solution.

The CAS140B and CAS140CT array spectrometers are used for optical measurements, guaranteeing maximum accuracy for all LED wavelengths including white. Optical probes meeting the recommendations of CIE127 are used in conformity with the measuring task at hand. The system is connected via flexible fiberoptic cables and allows users to position the LED Tester as necessary.

The industry proven Keithley current units provide electrical measurements. The new series 2600 Sourcemeter permits fast and accurate recording of current and voltage values. Additional channels of the Keithley 2600 can be used optionally to measure LEDs with several chips. A scanner (e.g. Keithley 7001) facilitates the particularly fast MultiDie testing of LED wafers.

The supplied software permits users to define a dedicated configurable sequence of optical and electrical measurements of LEDs with up to eight chips. All the results of these measurements can be used individually or together for the purpose of classifying LEDs.

A reliable interface using an optocoupler allows the tester to be easily connected to LED sorting machines and wafer probers from a wide range of manufacturers. Up to 256 bins can be addressed.

It is also possible to exchange data between the LED handler and wafer prober via an RS232 interface, e.g. batch or article numbers, or wafer coordinates required to generate a wafer map. Specified software functions can also be remotely controlled.

The LED Tester is available in two configurations: as a turnkey system installed in a robust 19-inch rack or as individual components with a standard PC.

The Turnkey System for Industrial ApplicationsThe LED Tester comprises the following components:

CCD Array Spectrometer CAS140B/CT LED Measurement Adapters Keithley 2400/2600 Sourcemeter Scanner (optional) I/O Card Connection Box for Handler Industrial PC LED Tester Software

CAS140CT Array Spectrometer:The Core of the LED Tester The CAS140CT Array Spectrometer is the successor to the proven CAS140B model. It was developed to meet special requirementsfor taking measurements at LEDs.

No moving parts are required in the entire measuring sequence thanks to simultaneous measurement over the entire spectral range. This enables very short measuring times and yields a particularly robust and compact setup that can be used in all production environments. By contrast, filter-based measuring systems such as photometers and radiometers are limited to determining only a single measured value (photometric or radiometric). These systems are unable to record spectral data, such as peak wavelengths.

This is the big advantage of spectrometers: within milliseconds all parameters for the LED can be calculated from a single measurement: i.e. spectral characteristics (peak wavelength, full width at half maximum, etc.) as well as all photometric characteristics (luminous intensity or luminous flux), radiometric characteristics (radiant intensity or radiant power), and colorimetric characteristics (dominant wavelength, color coordinates, color temperature, etc.).

Most of these optical parameters are determined by integration of the measuring signal over the entire spectral range. Particularly in the case of narrowband LEDs, the result of analysis can be negatively affected by an unwanted background signal (stray light, detector noise, etc.). Thus, the CAS140CT has an even further improved signal dynamic range compared with the CAS140B. This guarantees the same high level of measuring accuracy over the entire spectral range, unlike with typical low-cost spectrometers. The lower dynamic range of the latter and the high level of stray-light cause substantial measuring errors with red, blue, and in particular white LEDs.

Cooled, back-illuminated CCD sensors are therefore exclusively used as detectors in the CAS140B/CT. By contrast, with conventional CCDs these are characterized by a much higher signal sensitivity and very low signal noise.

Your total light and display sensing solution.

Integrating spheres with different diameters (75 mm and 150 mm) are supplied for luminous flux measurements and are available with a protective glass cover to prevent contamination with dirt. Instrument Systems also has extensive know-how in the design of integrating spheres for a wide range of applications.

The CAS140B/CT is supplied with a motorized shutter that permits automatic darkcurrent measurement without interrupting the test process. A filter wheel is also installed as standard. It features four neutral-density filters (OD1 to OD4) and is controlled by the software. All the filters are calibrated so that it is a simple matter to switch from low light levels to high-power LEDs using the software.

Four CAS140CT models are available forvarious spectral ranges:

CAS140CT-151 360nm – 830nm

CAS140CT-152 200nm – 800nm

CAS140CT-153 380nm – 1040nm

CAS140CT-154 250nm – 1050nm

Measurement Adapters:CIE compatible Special adapters are available for use in production for luminous-intensity (ILED,B) measurements in conformity with CIE127.

The measuring adapters for taking measurements of luminous intensity (ILED,B) are positioned at a defined distance from the LED tip. Shortened versions for mountingabove the test specimen are available for use in production scenarios.

150 mm integrating sphere for measuring luminous flux in production settings. A protective glass cover prevents ingress of dirt and contaminants.

A special EKT series fiber-bundle adapter has been developed for wafer probing applications. It permits a particularly high light throughput, and the compact design facilitates observation using the inspection microscope.

All measuring adapters are connected to the spectrometer using flexible optical fiber bundles. This allows adapters to be changedquickly and gives users flexibility when assembling the adapters and setting up the tester.

Your total light and display sensing solution.

Calibration: the Basis for AccurateOptical Measurements Each spectrometer is carefully calibrated at Instrument Systems together with the associated measuring adapters. All calibrations are directly traceable to PTB and NIST national standards. This is the only way to guarantee uniform quality and reproducible measurements.

Reliable Current Sources:Keithley 2400/2600 and Scanner The proven Keithley 2400/2600 sourcemeters are used to power LEDs and to take all electrical measurements. The LED Tester can perform any number of electrical measurementsin the forward and reverse direction, independently of any optical measurements taken.

If the connected handler fails to ensure the correct orientation of the LED, the polarity of the LED can be tested and the electrical connection can be reversed as necessary.

The Flexible Interface:Simple Connection to All Handlers The LED Tester places minimal requirements on the LED Handler. This means it can be easily connected to most handler systems.

Keithley 2600 Sourcemeter und 7001 Scanner

Several channels of the Keithley 2400/2600 can be used to take measurements at multichip LEDs. This setup means that power can be supplied independently to as many as eight chips at the same time. No limits are imposed on the setup of the LEDs. The LED chips can be individually wired or wired with a common cathode or anode.

A fast scanner is required for MultiDie testing. This permits serial tests to be carried out on up to 16 dies. Since the switching times of the scanner are only a few milliseconds, throughput is ramped up significantly compared with conventional wafer probing.

It is also possible to perform all measurements in four-wire configuration in order to enhance measuring accuracy and eliminate line effects.

LED Handler Waferprober

Ismeca (Switzerland)Suss Microtec AG (Germany)(MultiDie Testing)Nihon Garter (Japan)

MBL (Germany)

ASM (Hong Kong) Wentworth (UK)

Dong Wu (Korea)

All communication is carried out via a digital I/O card. The handler specifies a Start Of Test signal (SOT) once the LED has been positioned and contacted. The computer of the LED Tester then takes control, carrying out the defined measurements and classifying the LED accordingly. The sorting result is output as a function of the handler bin number at five to eight digital outputs (32 to 256 bins). At the same time, an End Of Test Signal (EOT) prompts the handler to position the next LED. This means a complete test cycle can be performed in less than 50 ms.

Your total light and display sensing solution.

Hardware setup allocates a dedicated page to each unit for configuring parameters and settings.

The results can be sorted to users’ requirements on the basis of a decision tree. A software wizard assists in setting up the decision tree quickly.

A dedicated module is available for wafer probing which includes a versatile display for the wafer map. Distribution over the wafer canbe displayed for all the selected results.

Tester Software: The tester software was developed from scratch in order to provide operators with a flexible but easy-to-use interface, delivering a wide range of functions. All settings can be accessed from a user-friendly menu. Depending on the application, users can select various results and determine how they are displayed on the monitor.

One of many options for displaying results, e.g. with bin frequencies, failure statistics, spectrum and CIE diagram.

Settings for the Connector Box of the LED Tester: Stored configurations can be called up for various handler and wafer prober types so that installation expenditure is minimized.

Menu for configuring the sorting criteria in the form of a decision tree. The previously defined measurement and the desired test result are selected on the right-hand side and assigned limit values. The flow chart generated in this way is shown on the left-hand side. The table below gives a quick overview on the sorting criteria.

Wafer mapping: All results – intensity distribution across the wafer is shown here – can be displayed as a colorcoded overview card.

Your total light and display sensing solution.

Functions in DetailHardware settings

CAS140CT/CAS140B

Keithley 2400/2600 Sourcemeters

Scanner

Handler interface

Default selection for known handlers and wafer probers

Polarity test

User-configurable data communication via RS232

Multi chip LEDs (optional)

MultiDie probing (optional, together with wafer probers from Süss Microtec)

Measurement parameters

Optical and/or electrical measurements

Current/voltage mode

Current/voltage limits for protecting the LED

Current flow times for thermal stabilization of the LED

Density filter

Range for spectral evaluations

Noise suppression

Sorting criteria

Setting upper and lower limits for sorting each measured value

Formula editor for calculations that can also be used for sorting

Sorting by color ranges in the CIE chromaticity space

User definition of color ranges as polygone lines

Any AND/OR links for all sorting criteria

Optional assignment of sorting bins

Allocation of colors and names to each bin

Grouping several bins in a bin group

Selection of statistical samples

User-friendly editor with copy & paste functions

Reporting results

List of measuring results

LED spectra

Bar chart of bin sorting

Sorting criteria with frequencies

Failure statistics as histogram or pareto diagram

Display of all results in a wafer map

User selection and configuration of all displays

Other functions

Superuser mode for protection against unauthorized changes

Storage of jobs with all settings, sorting criteria, etc.

Report builder with company logo

Your total light and display sensing solution.

Ordering InformationOrder Number Description

LED-Tester basic system (without CAS140B/CT spectrometer) *1

LEDTEST-100LED-Tester with rugged 19“ enclosure; incl. industry-grade Windows 2000 PC, Keithley 2400 Sourcemeter, tester software with CAS-DLL, and complete wiring

LEDTEST-110 LED-Tester; including desktop Windows 2000 PC; Keithley 2400 Sourcemeter, tester software with CAS-DLL, and complete set of cables

LEDTEST-300 Scanner Option for testing LEDs with up to 5 chips in one packaging; includes Keithley2700 scanner and software extensions

CAS140CT Spectrometer

Model Spectral range Spectral resolution Data point interval

CAS140CT-151 360 to 830 nm 2.2 nm 0.4 nm

CAS140CT-152 200 to 800 nm 2.7 nm 0.6 nm

CAS140CT-153 380 to 1040 nm 2.8 nm 0.8 nm

CAS140CT-154 250 to 1050 nm 3.7 nm 0.8 nm

Measurement adapter

LED-433-15 ILEDB measurement adapter for luminous intensity; incl. fiber bundle; shortened version for handler; (380 to 1050 nm)

LED-434-15 ILEDB measurement adapter for luminous intensity; incl. fiber bundle; shortened version for handler; (190 to 1050 nm)

ISP75-250 *2 Integrating sphere for luminous flux measurement, incl. fiber bundle; (380 to 1050 nm)

ISP75-251 *2 Integrating sphere for luminous flux measurement, incl. fiber bundle; (240 to 1050 nm)

Calibrations

CAL-120 Calibration of radiant and luminous intensity; 360 to 1050 nm

CAL-121 Calibration of radiant and luminous intensity; 200 to 780 nm

CAL-140 Calibration of radiant and luminous flux; 360 to 1050 nm

CAL-141 Calibration of radiant and luminous flux; 240 to 780 nm

Remarks: 1) For optional configurations for testing at Multi Chip LEDs or MultiDie Testing of wafers please contact Instrument Systems or your local representative. 2) For implementation on a handler system customized changes of the integrating sphere may be necessary

Instrument Systems is continually working to develop and improve products. Any technical changes, errors or misprints do not form grounds for compensation. The company`s Terms of Delivery and Payment apply in all other respects.

Contact information

Neumarkter Str. 83D-81673 München, Germany

Phone: +49 (089) 45 49 43 - 0Fax: +49 (089) 45 49 43 - 11webinfo@instrumentsystems.comwww.instrumentsystems.com

Instrument Systems - Operating Globally, Acting LocallyInstrument Systems is the premier company for light measurement. As a subsidiary company of Konica Minolta we have access to resources over the long term and to a global network – our mission is your solution, anytime and anywhere.

World-class customer support is rewarded with customer loyalty - a top priority at Instrument Systems.

101 Williams Drive Ramsey, NJ 07446 USA Phone: 201-236-4300 Toll Free: 888-473-2656 Fax: 201-785-2480 marketing.sus@konicaminolta.com sensing.konicaminolta.us

Konica Minolta Sensing Americas Konica Minolta Sensing, Americas represents Instrument Systems in North America and Canada with a high level of expertise in marketing optical measuring instruments. High-quality customer support is based on a track record of close cooperation and constant exchange of information and know-how.

Your total light and display sensing solution.

LED-Tester

Measurement cycle

Shortest measurement with 1-Chip-LED 32 msec *1

Shortest measurement with 3-Chip-LED 140 msec *1

Interface to handler

Digital Inputs End of Test

Digital Outputs Start of Test, Busy, End of Sequence (MultiDie Testing), Bin-results (8x)

Connections Optical isolation of all In-/Outputs

General data

Size and weight 553 mm x 660 mm x 600 mm (W x H x D); 76kg

Operating conditions 15°C to 35°C; relative humidity max. 70%

Power consumption 200W at 230V; 175W at 115V

Electrical measurements with Keithley 2600 & Scanner

Keithley 2600 *2 Scanner (for Multidie Testing)

Current range 0 to ± 3.0 A Number of Chips Up to 16

Voltage range 0 to ± 40 V

connectionsCommon cathode/anodeor separate connections

Number of channels 1 to 8 optional

Max. output power 0 to 40W

2- or 4-wire measurement for all single chips; automatic test of polarity

Optical measurements with CAS140CT

Model CAS140CT-151 CAS140CT-152 CAS140CT-153 CAS140CT-154

Spectral range 360 to 830 nm 200 to 800 nm 380 to 1040 250 to 1050

Spectral resolution *3 2.2 nm 2,7 nm 2,8 nm 3.7 nm

Wavelength accuracy 0.3 nm

Detector Back-illuminated CCD, 1024 x 128 Pixel (binning mode)

Integration time 9 ms to 65 s

Photometric measurements

Luminous intensity Luminous flux

Measurement range 0.02 mcd to 500 cd *4 0.2 mlm to 3000 lm *5

Accuracy *6 ± 4% ± 5%

Reproducibility of single system ± 0.5%

Reproducibility system to system *7 ± 1.5%

Colorimetric measurements Accuracy Reproducibility

Single system System to system *7

Dominant wavelength *8 ± 0.5 nm ± 0.01 nm ± 0.1 nm

Color coordinates (x,y) *8 ± 0.002 ± 0.0001 ± 0.0013

Technical Specifications

SAFETY PRECAUTIONS

Always connect the instrument to the specified power supply voltage. Improper connection may cause a fire or electric shock.

For correct use and for your safety, be sure to read the instruction manual before using the instrument.

Certificate No : JQA-E-80027Registration Date : March 12, 1997

Certificate No : LRQ 09600941ARegistration Date : March 3, 1995

In the interest of the continuous development and improvement of our products, we reserve all rights to make technical changes to the information contained in our printed material.Such changes, errata and printing mistakes do not constitute grounds for claims for damages. The LumiCam series of measurement cameras may only be used for luminanceand chromaticity measurements of self-illuminating objects.

Notes:*1 SOT to EOT with Keithley 2600, integration time 9 ms without polarity test. The polarity test requires roughly an additional 60 ms.*2 Other ranges possible with the Keithley 261x models; for MultiChip LEDs up to 8 channels of the Keithley 260x can be used.*3 Applicable to 100 μm standard slit. Other values for optional 50 μm or 250 μm slit.*4 Applicable to a signal-to-noise ratio of 10:1, for yellow LED with 585 nm and with LED433 adapter.*5 Applicable to a signal-to-noise ratio of 10:1, for yellow LED with 585 nm and with ISP75 adapter.*6 Immediately after calibration, relative to the calibration standard, for diffuse LEDs and without density filter.*7 For the same combination of CAS140B/CT model and measurement adapter. The value applies to a single standard deviation.*8 For adequate signal dynamic range and after calibration. The values relate to twice the standard deviation.