Lecture7 MOS Tp AndP

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    EE141

    Propagation Delay

    Power Dissipation

    EE141- Sp rin g 2003Lecture 7

    EE141

    CMOS Inv erter Prop agation Delay

    VDD

    Vout

    Vin = V DD

    Ron

    CL

    tpHL = f(Ron.CL)

    = 0.69 RonCL

    t

    Vout

    VDD

    RonCL

    1

    0.5

    ln(0.5)

    0.36

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    EE141

    0 0.5 1 1.5 2 2.5

    x 10-10

    -0.5

    0

    0.5

    1

    1.5

    2

    2.5

    3

    t (sec)

    Vout(

    V)

    Transient Response

    tp = 0.69 CL (Req n+Req p)/2

    ?

    tpLHtpH L

    EE141

    Design for Performance

    Keep capacitances small

    Increase transistor sizes

    watch out for self-loading!

    Increase VDD (?)

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    EE141

    Delay as a function of VDD

    0.8 1 1.2 1.4 1.6 1.8 2 2.2 2.41

    1.5

    2

    2.5

    3

    3.5

    4

    4.5

    5

    5.5

    VDD

    (V)

    t p(normalized)

    EE141

    2 4 6 8 10 12 142

    2.2

    2.4

    2.6

    2.8

    3

    3.2

    3.4

    3.6

    3.8x 1 0

    -11

    S

    t p(sec)

    Device Sizing

    (for fixed load)

    Self-loading effect:

    Intrinsic capacitances

    dominate

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    EE141

    1 1.5 2 2.5 3 3.5 4 4.5 53

    3.5

    4

    4.5

    5x 1 0

    -11

    t p(sec)

    N MOS/ PMOS ratio

    tpLH tpHL

    tp = Wp/ Wn

    EE141

    Impact of Rise Time on Delay

    tpHL(nsec)

    0.35

    0.3

    0.25

    0.2

    0.15

    trise (nsec)10.80.60.40.20

    tp = tstep(i) + tstep(i-1)

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    EE141

    The Sub-Micron MOS Transistor

    Threshold Variations

    Subthreshold Conduction

    Parasitic Resistances

    EE141

    Threshold Variations

    VT

    L

    Long-channel threshold Low VDS threshold

    Threshold as a function of

    the length (for lowVDS)

    Drain-induced barrier lowering (DIBL)

    (for low L)

    VDS

    VT

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    EE141

    Sub-Threshold Conduction

    0 0.5 1 1.5 2 2.510

    -12

    10-10

    10-8

    10-6

    10-4

    10-2

    VGS(V)

    ID(A)

    VT

    Linear

    Exponential

    Quadratic

    Typical values for S:

    60 .. 100 mV/ decade

    The Slope Factor

    ox

    DnkT

    qV

    DC

    CneII

    GS

    += 1,~ 0

    S is VGS for ID2/ ID1 =10

    EE141

    Sub-Threshold ID vs VGS

    VDS from 0 to 0.5V

    =

    kT

    qV

    nkT

    qV

    D

    DSGS

    eeII 10

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    EE141

    Sub-Threshold ID

    vs VDS

    ( )DSkTqV

    nkT

    qV

    D VeeIIDSGS

    +

    =

    110

    VGS from 0 to 0.3V

    EE141

    Power Dissipation

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    EE141

    Where Does Power Go in CMOS?

    Dynamic Power Consumption

    Short Circuit Currents

    Leakage

    Charging and Discharging Capacitors

    Short Circuit Path between Supply Rails during Switching

    Leaking diodes and transistors

    EE141

    Dynam ic Power Dissip ation

    Energy/transition = CL * Vdd2

    Power = Energy/transition *f = CL * Vdd2

    * f

    Need to reduce CL, Vdd, andf to reduce power.

    Vin Vout

    CL

    Vdd

    Not a function of transistor sizes!

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    EE141

    Modification for Circuits with Reduced Swing

    CL

    Vdd

    Vdd

    Vdd-Vt

    E0 1

    CL

    Vdd

    Vdd

    Vt( )=

    Can exploit reduced swin g to low er pow er

    (e.g., reduced bit-line swing in memory)

    EE141

    Adiabatic Charging

    22

    2

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    EE141

    Adiabatic Charging

    EE141

    Node Transition Activity and PowerNode Transition Activity and PowerConsider switching a CMOS gate for N clock cycles

    EN

    CL

    Vd d

    2 n N( )=

    n(N): the number of 0->1 transition in N clock cycles

    EN : the en ergy consumed for Nclock cycles

    Pa vg

    N lim

    EN

    N-------- f

    cl k=

    n N( )N

    ------------N

    lim

    CL

    Vdd

    2

    fclk

    =

    0 1n N

    ( )N------------N lim=

    Pav g

    = 0 1

    CL

    Vdd

    2 fclk

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    EE141

    Short Circuit Currents

    Vin Vout

    CL

    Vdd

    IVDD(mA)

    0.15

    0.10

    0.05

    Vin (V)5.04.03.02.01.00.0

    EE141

    How to keep Short-Circuit Currents Down?

    Short circuit current goes to zero if t fall >> trise,

    but cant do this for cascade logic, so ...

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    EE141

    Minimizing Short-Circuit Power

    0 1 2 3 4 50

    1

    2

    3

    4

    5

    6

    7

    8

    tsin

    /tsout

    Pnorm

    Vdd =1.5

    Vdd =2.5

    Vdd =3.3

    EE141

    Leakage

    Vout

    Vdd

    Sub-ThresholdCurrent

    Drain JunctionLeakage

    Sub-threshold current one of most compelling issues

    in low-energy circuit design!

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    EE141

    Reverse-Biased Diode Leakage

    Np+ p

    +

    Reverse Leakage Current

    +

    -Vdd

    GATE

    IDL = JS A

    JS = 10-100 pA/m2 at 25 deg C for 0.25 m CMOSJS doubles for every 9 deg C!

    EE141

    Subthreshold Leakage Component

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    EE141

    Static Power Consumption

    Vin =5V

    Vo ut

    CL

    Vd d

    Istat

    Pstat = P(In=1).Vdd . Istat

    Wasted energy

    Should be avoided in most cases,

    but could help reducing energy in others (e.g. sense amps)

    EE141

    Principles for Power Reduction

    Prime choice: Reduce voltage!

    Recent years have seen an acceleration in

    supply voltage reduction

    Design at very low voltages still open

    question (0.6 0.9 V by 2010!)

    Reduce switching activity

    Reduce physical capacitance

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    EE141

    N ext Lectu re

    Optimizing for Performance and Power