LBT672 ADAPTIVE SECONDARYLBT AO Review Firenze - 10 11 November, 2005 LBT672 ADAPTIVE SECONDARY...

LBT AO ReviewFirenze - 1011 November, 2005

LBT672 ADAPTIVE SECONDARY

LBT672 ADAPTIVE SECONDARY UNITS

Current status, acceptance test plan and specifications

A. Riccardi, M.Xompero, D. Zanotti, L. BusoniINAF – Osservatorio Astrofisico di Arcetri

D. GallieniADS International srl

R. BiasiMicrogate srl



MECHANICS

• WHERE WE ARE

• BACKPLATE COATING ISSUE

• PALNNED STEPS

• MECHANICS AT

ELECTRONICS• WHERE WE ARE

• OPEN ISSUES

• ELECTRONICS TESTING

• P45 TESTS

FUNCTIONALITY AND OPTICAL TESTS• REQUIREMENTS

• ELECTRO-MECHANICAL ACCEPTANCE

• ARCETRI TEST TOWER (ATT) FACILITY

• ADSEC OPTICAL LAYOUT AND ALIGNEMNT IN ATT

• OPTICAL ACCEPTANCE (SHELL FIGURE QUALITY, FLATTENING STABILITY)

PRESENTATION OUTLINE


LBT672 ADAPTIVE SECONDARY MECHANICS: WHERE WE ARE


LBT672 ADAPTIVE SECONDARY BACKPLATE COATING

Silver layer by chemical coating adhesion

Gold layer by galvanic deposition mechanical strength, age stability

Galvanic bath problem repeated two times

Thermal stability problem on ring #7


LBT672 ADAPTIVE SECONDARY MECHANICAL ALIGNMENT


LBT672 ADAPTIVE SECONDARY INTEGRATION ROOM


LBT672 ADAPTIVE SECONDARY NEXT STEPS

BP finishing (ongoing, TBC by this week)


LBT672 ADAPTIVE SECONDARY NEXT STEPS

Dummy Shell installation test (by Nov.05) - pre-test next week w. G.

Engineering Shell installation and dummy magnets gluing (by Dec.05)

Engineering Shell installation and dummy magnets gluing (by Dec.05)

TS2 installation and magnets gluing (by Jan.06)


LBT672 ADAPTIVE SECONDARY HAZARDS

BP repair (local)

Procedure assessment on BP(P1) - Dec.05Jan.06

2w allocated in schedule after TS2 is removed

Shells handling

Procedure and tools assessment w. Guido B. on-site assistance

[…]


LBT672 ADAPTIVE SECONDARYMECHANNICAL SHOP PROOF

TEST

640a012, Is.A, 3.11.05

3 days allocated before crating and shipping Unit#1 to Microgate

HP#2 (1st ready) will be installed into the solar tower at this time

Test with HP#2 (TBC)

3w DELAY on AIT management schedule (8 Sept. 2005)


LBT672 ADAPTIVE SECONDARY ELECTRONICS:WHERE WE ARE

ID Nome attività Inizio Fine

1 Unit #1 MEC production lun 24/01/05 gio 26/01/06

9 Unit #1 MEC integration lun 21/03/05 sab 25/02/06

47 Unit #1 ready for EL integration lun 27/02/06 sab 11/03/06

53 Unit #1 EL production lun 21/02/05 lun 05/12/05

78 Unit #1 EL comp. ready for integration mar 06/12/05 mar 06/12/05

79 Unit #1 EL integration mer 07/12/05 mar 11/04/06

89 Unit #1 ready for electromechanical tests mer 12/04/06 mer 12/04/06

90 Unit #1 electromechanical test @ MG gio 13/04/06 mer 05/07/06

97 Unit #1 shipment to OA (with TS1 and TS2) gio 06/07/06 gio 06/07/06

98 Unit #2 MEC production lun 16/01/06 sab 18/03/06

103 Unit #2 MEC integration lun 20/03/06 ven 28/07/06

119 HP2 refurbishment lun 17/10/05 sab 21/01/06

126 Unit #2 Mechanical I/F/ test @ ADS lun 31/07/06 ven 04/08/06

127 Unit #2 ready for EL integration lun 07/08/06 ven 11/08/06

131 Unit #2 EL production lun 22/08/05 lun 05/06/06

152 Unit #1 EL comp. ready for integration mar 06/06/06 mar 06/06/06

153 Unit #2 EL integration mer 07/06/06 mar 12/09/06

160 Unit #2 ready for electromechanical tests mer 13/09/06 mer 13/09/06

161 Unit #2 electromechanical test @ MG (TS1) gio 14/09/06 mer 18/10/06

06/12

12/04

06/06

13/09

D G F M A M G L A S O N D G F M A M G L A S O N D G2005 2006 20



ID Nome attività Durata Inizio Fine

1 Unit #1 MEC production 255 g lun 24/01/05 gio 26/01/06

9 Unit #1 MEC integration 241 g lun 21/03/05 sab 25/02/06

47 Unit #1 ready for EL integration 12 g lun 27/02/06 sab 11/03/06

53 Unit #1 EL production 195 g lun 21/02/05 lun 05/12/05

54 Actuators & capsens 170 g lun 28/02/05 ven 11/11/05

58 DSP boards 185 g lun 21/02/05 mer 23/11/05

61 BCU comm boards 100 g lun 28/02/05 ven 15/07/05

64 SigGen boards 165 g lun 28/02/05 sab 05/11/05

67 Backplanes 65 g lun 28/03/05 ven 24/06/05

70 Power backplanes 175 g lun 14/03/05 mar 29/11/05

71 Power backplanes refurbishment 95 g lun 14/03/05 ven 22/07/05

72 Power backplanes assembly 55 g lun 25/07/05 ven 28/10/05

73 Power backplanes test 25 g mar 01/11/05 mar 29/11/05

74 Distribution boards 80 g lun 22/08/05 lun 05/12/05

75 Distribution boards final routing 40 g lun 22/08/05 ven 14/10/05

76 Distribution boards production 25 g lun 17/10/05 gio 17/11/05

77 Distribution boards test 15 g ven 18/11/05 lun 05/12/05

78 Unit #1 EL comp. ready for integration 1 g mar 06/12/05 mar 06/12/05

79 Unit #1 EL integration 101 g mer 07/12/05 mar 11/04/06

80 Crates integration 10 g mer 07/12/05 sab 17/12/05

81 Crates burn-in 10 g lun 19/12/05 lun 02/01/06

82 Swing arm rack procurement and integration 50 g mar 20/12/05 mar 21/02/06

83 Components procurement 29 g mar 20/12/05 ven 27/01/06

84 Integration 20 g lun 30/01/06 mar 21/02/06

85 Crates integration into optomech.system 5 g lun 13/03/06 ven 17/03/06

86 EL 'white' tests (including shell safety) 12 g sab 18/03/06 ven 31/03/06

87 Funct.test of whole unit (w.out shell) at low temp. 5 g lun 03/04/06 ven 07/04/06

88 support to shell installation 2 g lun 10/04/06 mar 11/04/06

89 Unit #1 ready for electromechanical tests 1 g mer 12/04/06 mer 12/04/06

90 Unit #1 electromechanical test @ MG 60 g gio 13/04/06 mer 05/07/06

97 Unit #1 shipment to OA (with TS1 and TS2) 1 g gio 06/07/06 gio 06/07/06

06/12

12/04

mar apr mag giu lug ago set ott nov dic gen feb mar apr mag2006

ELECTRONICS:WHERE WE ARE


LBT672 ADAPTIVE SECONDARY NEW POWER BACKPLANE

Complete testing and calibration at Microgate

Verification on P45 (W47)

Complete integration of other units (components in house !)


LBT672 ADAPTIVE SECONDARY DISTRIBUTION BOARDS

Distribution board type ‘A’ currently being integrated at Microgate

After functional tests, repeat mechanical check at ADS

Proceed with integration of other boards

Mechanical matching tested on dummy boards at ADS


LBT672 ADAPTIVE SECONDARY ELECTRONICS TEST & CALIBRATION

Pre-screening (before integration w. mechanics). E.g. capsens board/actuator

Full functional test and calibration

Calibration data storage System components can be replaced with no need to recalibrate the entire system

Burn-in test: full power, high thermal load on single backplanes (half-crate). Moderate overload on fully integrated unit without thin shell


LBT672 ADAPTIVE SECONDARY FUNCTIONAL TEST AT LOW TEMPERATURE

Will be conducted on a cooled truck trailer, connected to a docking station (shipping company based at walking distance from Microgate – easy and safe transport of integrated unit)

Temperature range: -20°C - +20°C

Purpose: functional test (not performance). Includes verification of capacitive sensors calibration using ‘mechanical’ reference pad

Verification with test thin shell mounted as an option


LBT672 ADAPTIVE SECONDARY P45 NEXT STEPS

Installation and verification of new power backplane

Replace all boards and actuators with LBT672 spares (Capsens board V3.0, DSP board V3.2). Minimal differences w.r.t. currently installed electronics, but 1:1 test always useful!

Tracing of P45 operation to verify system reliability

New: system operation with two backplanes (2x BCU, real-time communication daisy chain, 2x reference signal generator)

Repeat thermal stability tests on new electronics



Strong inconsistency between P45 and test-stand measurements.

Test stand: ~10 ppm/°C – P45: up to 200 ppm/°C (???)

To be understood!

THERMAL STABILITY


LBT672 ADAPTIVE SECONDARYELECTRO MECHANICAL TESTS AT MICROGATE

• Elevation angles: 90°, 70°, 45°, 20°• AO configuration (~70um gap)

– Noise < 10nm rms– Modal settling time < 1.5ms (0.7 goal)– Tracking of turbulence (0.65asec seeing,

20m/s speed) < 50nm rms WF (goal 28nm) from capsens reading (diagnostic buffers)

• Chopping config (~100um gap)– ±4asec (80um PtV) 5Hz 90% duty cycle

(goal ±7asec, 140um PtV)– On-source tilt reproducibility 10mas rms

(goal 3mas)

Milestone: Adsec Unit Ready for Optical Tests


LBT672 ADAPTIVE SECONDARY OPTICAL TESTS IN ARCETRI


LBT672 ADAPTIVE SECONDARYREQUIREMENTS FOR STARTING OPTICAL

TESTS

• Opto-mechanical accept. tests passed(Adsec ready for Optical test milestone)

• W acceptance test passed(W sensor ready for System Test milest)

• Stands and trolleys• Hexapod accepted• Hexapod TCS software working

– Absolute and relative positioning– Rotation around a point

• Arcetri Test Tower facility working. 0.1°C stability= /10 focus error, per 15min (goal 1hour)

• Adsec procedure mounting on ATT tested w dummy• Retro-reflecting optics and holder tested (/10 PtV)• Shell silver spraying successfully tested on dummy

shells


LBT672 ADAPTIVE SECONDARY ATT SCHEDULE


LBT672 ADAPTIVE SECONDARYARCETRI TEST TOWER FACILITY

F2

F1

F/15.0

F/1.221

37

13

mm

10

64

.7m

m

911mm

Lab

Winch


LBT672 ADAPTIVE SECONDARYRETRO-REFLECTOR AND HOLDER

3cm

2cm

Parabola+flatOnly mirrors

Telescope-likecarbon fiber structure


LBT672 ADAPTIVE SECONDARYAlignment procedure

Interferom.: F/14Mirror: F/15

1. Hex to move the spot on F12. Hex to move the spot on F2 keeping the spot on F13. Interf. Stage to set the focus4. Hex+Interf. Stage to compensate spherical ab.

Reference Optics mechanical pre-alignment:+/-3mm x-y (WFS +/-0.1 pix)+/-5mm z (WFS z+ stage clearance)+/-2deg (F/1.1 instead of F/1.2)

WFS

BS


LBT672 ADAPTIVE SECONDARY THERMAL FUNCTIONALITY TESTS

• In Arcetri Test Tower• Temperature: 20°C, 10°C, 0°C, -

5°C (goal -10°C)• Pressure 700hPa (mountain

pressure)• Same electro-mechanical tests

with same specifications

We are considering the possibility to move this test in MG:• no need of optical feedback• Cooled container down to -20°C• Conceptually part of electro-mechanical test• But… extra cost (rent of container)


LBT672 ADAPTIVE SECONDARYMIRROR FLATTENING

• Low order flattening using electrical signals (gap uniformity, refplate figure)

• Identification of capsens areas on interferometer frame (fiducials, min 6)

• Delta-commands = -WF/2 on capsens• Iterate until no improvement or f>0.2N• Local (given gap) calibration of capsens

signals– 3-5Hz sinusoidal Tip&tilt: 4D-interferometer

(30fps) and capsens reading. FFT (demodulation) for calibration constants

• Iterate flattening after local calibration until no improvement or f>0.2


LBT672 ADAPTIVE SECONDARYMIRROR FLATTENING SPECIFICATIONS

• T=ambient, ambient+10°C, ambient-10°C• Flattening residual:

– Min: < 65nm rms WF, peak force < 0.2N– Goal: < 30 nm rms WF, peak force < 0.07N

• Chopping flattening:– 200nm rms (1/3 rms 0.2asec seeing,L0=20m)– 100nm rms (Goal)

Milestone: Flattened secondary, ready for AO test


LBT672 ADAPTIVE SECONDARYFLATTENING UNKNOWNS

• Environmental disturbances (vibrations)

• Shape of shell after de-blocking• Control effectiveness of chipped

actuators (non-linearities)


LBT672 ADAPTIVE SECONDARY THE END

LBT672 ADAPTIVE SECONDARYLBT AO Review Firenze - 10 11 November, 2005 LBT672 ADAPTIVE SECONDARY...

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