Latest RF Capabilities - Force InGaP HBT – BiCMOS – Silicon Bipolar ... • 50Ghz RF...

Latest RF Capabilities

Jan 2015

Value Proposition

Item Comments / Current Status Refer to Slide #

RF Test Engineering Capabilities

Multiple Highly Experienced Test Engineers Engaged in Various RF Projects

16

RF Hardware Engineer Dedicated to RF Hardware Design and Implementation 16

Projects Completed in 2012/2013/2013

50+ Engagement since 2012 6

Highest RF Frequencies Being Tested

50GHz Packaged Level40GHz+ Wafer Probe

5,6,7,8

Test Coverage – Extensive RF Parameters Tested– Testing of Jitters / BER Testing in Sub-Pico Seconds

7,8

Extensive Experience with Membrane Probes

Design Support / Calibration Standards 12,13,14,15

Added Equipment Capabilities

Now Testing 50GHz Packaged Level and 40GHz+ Wafer Probe

9,10

Technologies Support – SiGe– GaAs– InGaP HBT– BiCMOS– Silicon Bipolar

5,6,7,8

2 Ashley Court, Henley, Marlborough, Wiltshire SN8 3RH | +44 (0)1264 731200 |

www.forcetechnologies.co.uk | [email protected]

RF Capabilities

• RF Testing to 50GHz Packaged Level• RF Testing to 50GHz Wafer Probe• RF Engagements in 2011/2012/2013• RF Testing Conducted On Devices• Current RF Tester Capabilities• Some of The RF Test Fixtures• Our RF Engineering Know-How• Next Generation RF Work



• RF devices up to 40GHz – Using Customer Designed Inter-Continental fixtures capable of testing up to 50GHz. These custom fixtures provide a means of de-

embedding all losses to the DUT

• Technologies supported• RF Filters• RF Switches

• RF Transceivers• Serial Devices and I/O components (10 Ghz)• VCOs, Amplifiers, Modulators, Demodulators, Log Detectors, Dividers, Combiners, Couplers etc.

• Wafer probed RF and high speed analog die– Using Membrane wafer probes that are capable of testing to 40GHz

– RF die testing has included transceivers for military communication systems requiring full parametric testing for a flip chip application– Using Cascade and Giga Test RF probes up to 20Ghz doing manual and automated wafer level testing.– High speed analog tests involving RF to digital output of I and Q vectors

• RF Testing capabilities– Electrical Testing

• Commercial ATE based (ASL3K)• Custom Test Systems (RFTs) using Signal Generators, Spectrum Analyzers, Network Analyzers, RF Power Sources Solutions

• 50Ghz RF – Agilent N5225A Network Analyzer 50Ghz

• 40Ghz RF – Agilent E8363 Network Analyzer 40Ghz• Agilent PSG signal Generator – 50Ghz • Agilent PXA Signal Analyzer 50Ghz – N9030A

– Both at packaged device and wafer level (up to 12”)– Both systems can be augmented with additional test equipment to meet the needs of complex devices which require testing beyond the

capabilities of the current testers. – Test of individual singulated die offered

• RF burn-in at full RF power– Full power and temperature at bench level

– Device-by-device temperature control– Oscillation prevention hardware design

RF Testing to 50GHz



• Number of Engagements• Total: 80+

• Both Packaged and Wafer Level

• RF Range Tested• RF Testing to 50GHz Packaged Level

• RF Testing to 40GHz+ Wafer Probe

• Product Types Tested• ADC, ASIC Transceiver, DDS, Clock Generator with Fanout Buffers, T/R Switch, RF Isolator, Direct Digital Synthesizer,

Quadrature Modulator, Logarithmic Amplifier, Dual Differential Mu, RF Amplifier, Frequency Divider, ASIC, Receiver, Direct Conversion Tuner, Mixer, Voltage Variable Attenuator, Frequency Synthesizer, SPDT Switch, RF Amplifier, Differential 1:4 LVPECL Fanout buffer, ASIC VCO, WiFi Transceiver, Clock Driver, LVPECL Fanout Buffer, RF Mixer, 1:16 Deserializer, 1.5W RF Amplifier, SPDT Switch SMT

• Technologies Supported• SiGe

• GaAs

• InGaP HBT

• BiCMOS

• Silicon Bipolar (25 GHz)

• Packages Tested• TQFP-64, CPGA-84, TSSOP-20, SOIC-8, Custom, TQFP-100, PQFP-16, CLCC-20, SO-20WB, AF190, SOIC-8, SO-8,

SOT6, SOT908-1, AF190, QFN-56, MMIC-4, MICROX-4, QFN-28, QFN-16, QFN-68, DISCRETE

RF Engagements



• IP3 • All RF Testers used are capable with multiple

sources..

• No limitations or issues have been found when performing the measurement.

• Other Tests• Adjacent Channel Power (ACPR) can be

performed by all the RF testers used.

• VTune, Frequency Range

• High frequency production testing to 50GHz

• Jitter at 10Ghz

• Propagation Delay for 10-25Ghz devices

• Other specialized measurements based on measuring and capturing narrow pulse widths.

RF Testing Conducted On Devices

• S Parameters • All RF Testers used are capable of performing S parameter

measurements.

• Vector Calibration is essential in getting good data.

• ASL3K allows for calibration to the DUT using calibration sources.

• RFT allows Vector Calibration thru the Network Analyzer.

• Specialized Calibration Coupons designed to provide open/short/load/thru calibration at the DUT when using membrane probe.

• Gain and P1dB• Measured on all RF testers

• Additional accuracy via added amplifiers and attenuators circuits on load boards.

• Mitigation of issues associated with impedance mismatches between DUT and Tester.

• Phase Noise and Noise Figure Measurements

• Both of these measurements can be accomplished on all RF testers.

• Measurements for both Phase Noise and Noise Figure are performed in a production environment

• NF measurements which are outside the range of existing equipment specs, either too low of NF or values greater than 15dB.



• Integrated testing with digital pins

• The ASL3K can offer up to 64 bits of digital control which run up to 50Mhz. Additionally, FPGAs have been added to the load board designs to enable running digital control and capture to 1Ghz. The ASL3K is also capable of generating 2ns pulses for testing digital devices with a resolution of 312psec.

• The Agilent 93K can also be used to test mixed signal devices and can be augmented with an array of test equipment thru the GPIB interface. This tester provides up to 1000 pin counts with a timing resolution of 125psec.

• Multi-source RFs

• Multiple RF sources available on both the ASL3K and RFT for testing up to 50GHz testing

• Analog to Digital Conversion (ADC), Digital to Analog Conversion (DAC) and Digital Signal Processing (DSP) functions

• The ASL3K offers a full set of DSP functions available for processing data from the ADC. The system is capable of processing data from the ADC up to 23 bits.

• Additionally, the Verigy93K and Quartet are both available for ADC and DAC testing.

• Jitter/Bit Error Rate (BER) testing has been performed on a number of devices.

• The DSA8200 Oscilloscope is for testing jitter and has been able to test jitter in the sub pico-second range at frequencies up to 6Ghz. Both the RFT and ASL3K can both be used to test jitter with the scope.

• BER testing is also available with additional test equipment added to the system The Verigy 93K can perform this BER testing to speeds of 600Mhz

RF Testing Conducted On Devices



• RFT• 1 Network Analyzer 50Ghz

• 1 Network Analyzer 40Ghz

• 2 Spectrum Analyzers – 7GHz

• 2 RF Signal Sources – 3GHz

• Two RF Power Meters – 10GHz

• 2 HP34970A – Mux

• 4 HP33120A – 15Mhz Waveform Generator

• 4 Keithley 2420 Power Supplies – 60V 3A Source Meter

• 4 Keithley 2400 DC Meter

• ASL3K • 6Ghz Max

• 3 Rhode RF Sources

• 4 Receiver Measurement

• 2 Baseband Inputs

• 2 Baseband Sources

• 8 AWG Sources

• 32 Digital/expandable to 64

• 6 High Current Supplies

• 24 Low Voltage and Current Sources for measurement

• Agilent N5225A 10MHz to 50GHz PNA Network Analyzer• Option 010 Time Domain

• Option 028 Noise Figure Measurements

• Option 080 Frequency Offset Measurements

• Option 083 Vector Scalar Calibrated Converter Measurements

• Option 086 Gain Compression Application

• Option 087 Intermodulation Distortion Measurements

• Agilent N1913A Power Meter

• Agilent N8487A Power Sensor 50GHz

Current RF Tester Capabilities



• Additional test equipment which is routinely added to all of our testers to meet specific needs not covered by the tester.

• Waveform Generator –

• Tektronix AWG5002

• Agilent 33120A, Qty 4

• Spectrum Analyzer – R&S FSP 7Ghz

• Pulse Generator – Agilent 8110A

• Digital Scope –

• Tektronix DSA8200,

• Agilent 54750A 20Ghz

• Lecory LT344 500Mhz, Qty 2

• Network Analyzer – E5070-9000 4 port, 8Ghz

• RF Amplifier –

• Agilent 8349B, 2 – 20Ghz

• Several other amplifiers <2Ghz are also routinely used to augment the testers when needed.

• High Voltage/Current Source – Agilent 6032A, 1000W

• Precision 16 Bit Calibrator – Martel Model 2000

• Impedance Analyzer – Agilent 4192A, Qty 2

• Multimeter –

• Agilent 3458A, 8 ½ digits

• Agilent 4338B Milliohms

• Maverick II Digital Test System with the RFT

– Used to provide additional digital testing capabilities.

– The Maverick II can provide 64-512 pins of digital resources with 100MHz of digital speed.

.

• Verigy 9300 to provide additional digital testing capabilities

– 1024 Channels; 1 GHz Digital

Additional RF Equipment



RF Fixtures



• Test Fixture by Inter-Continental Microwave• Each fixture designed around part being tested

• Frequency of the fixture is limited to <50GHz

• Calibration coupons are required to de-embed the losses from test setup

• Cascade Microtech Membrane Wafer Probe• Provides the capability to test up to 80GHz

• Design allows components to be close to the DUT

• The design of membrane is multi-layer circuit capable of providing impedance control signal paths to the DUT

• Cascade Microtech RF Probe• Provides the capability to test up to 80GHz using various manual probing solutions.

• Provides ability to duplicate bench level setups using the same equipment as the validation team.

• The design provides flexibility in being able to configure a solution quickly.

RF Fixtures



• Dedicated team for • Assembly Package Design• Test Hardware• Qualification Hardware

• Understanding of probes, substrate and test board design consideration• Impedance• Proper layout and termination at the end of the signal traces • Reflections• Terminations

• Testability mitigation due to

• Poor signal quality

• Signal loss

• Signal timing skew

Our RF Engineering Know-How



• Extensive Experience with Membrane Probes• We understand total probe configuration needs a proper setup:

• Controlled impedance interface• Custom DUT board and probe card design

• Minimizing crosstalk and reflections• Proper RF calibration • Custom ATE:

• Multiple Projects successfully delivered with Maximum Frequency at 50Ghz.

• Accurate and repeatable touch-downs / Minimal pad damage• Low contact resistance and trace inductances in nH fractions• Optimal matching and decoupling components next to DUT• Use of localized mini-clean room during probing and maintenance process

Our RF Engineering Know-How (Continued)



Next Generation RF Work



• Over 200 man-years of

combined experience

• Low Turnover

• >5000 test programs

developed

• Over 25 other degreed

technical personnel

Engineer Years Area of Expertise 93

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Engineer 1 25 Digital/Mixed Signal X X X X X X

Engineer 2 26 Digital/Mixed Signal X X

Engineer 3 30 Memory/Digital X X X X X X

Engineer 4 19 Memory/Digital X X X X

Engineer 5 19 Digital X X X X

Engineer 6 22 Digital/Mixed Signal X X X

Engineer 7 17 Digital/Memory X X X X X

Engineer 8 3 Mixed Signal X X




Engineer 12 6 Digital/Mixed Signal X X

Engineer 13 12 Mixed Signal X X X X

Engineer 14 28 RF/Mixed Signal X X X X X X

Engineer 15 5 RF/Mixed Signal X X X

Engineer 16 17 Digital/Mixed Signal X

Engineer 17 4 Digital/Mixed Signal X

Engineer 18 3 Digital/Memory X

Engineer 19 3 Digital/Mixed Signal X X X X

Engineer 20 11 Digital/Mixed Signal X X X X

Engineer 21 10 RF/Mixed Signal X X X X


Engineer 23 3 Mixed Signal X X X

Engineer 24 3 RF/Mixed Signal X X X

Engineer 25 2 Mixed Signal X

Engineer 26 1 Digital/Memory X

Total: 26 4 3 3 7 8 4 8 2 3 3 8 3 14 8 3

Largest Engineering Test Development Organization



• RF Membrane Probe for testing to 50Ghz– Multiple projects – Typically taking 12-14 weeks of development for probe.– Worked with Cascade design team to defined a membrane probe for testing wafers components from 1Ghz to 40Ghz for AC, DC

and RF parameters.– RF parameters tested where S11, S12, S21 and S22. – AC/DC parameters tested are for ADC and DAC, as well as, all digital scan and standard DC functions. – Worked with customer to develop calibration standards for open/short and load on ceramic substrates for calibrating the different

skews defined on the wafer.– For S parameters on the device from 1Ghz to 40Ghz. Used external network analyzer E8363B with the ASL3K to test the devices on

the wafer.

• RF Amplifiers and RF Switches– Frequency 500MHz to 6Ghz –– Integra worked with an RF Silicon vendor to help specify the production level test requirements for their family of RF switches and

RF Amplifiers to keep cost low and still provide complete coverage for the product.– Designed the hardware and software taking into account all product skews fitting all designs into two separate boards for 12

different product skews with a design gear towards testing on the handler as x2 configuration for all devices. – The hardware and software was designed with multi-site to reduce cost further down the road when volume increases.– Test included S-parameters across the band, Gain, BW, P1dB, and Isolation. – ASL3K used in testing of devices.

• 10Ghz Digital Device Testing– Integra developed hardware and software used to test and qualify two 10Ghz components for space flight applications. – All DC and AC parametric parameters defined in the manufactures data sheet were tested even though the manufacture in this

case doesn’t test AC parameters in production due to cost and time. – AC testing involved, standard functional tests across all supply voltages and loads, propagation delays in sub pico-seconds and jitter

under 1 nano-second. – Special attention was given in the design of the hardware in order to accomplish jitter, rise and fall time and propagation delays on

the devices. – ASL3000 and High speed 20Ghz sample scope used for testing.

Latest Projects



Latest RF Capabilities - Force InGaP HBT – BiCMOS – Silicon Bipolar ... • 50Ghz RF...

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