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Recent trends in the Particle Size Analysing Techniques

Suk-Ho KangDepartment of Chemical Engineering,

Yeungnam University, Gyongsan 632, Korea?IH

10 , 4-

ABSTRACT

Recent advances and developments in the particle-sizing technologies were briefly reviewedin accordance with three operating principles including particle size and shape descriptions.Significant trends of the particle size analysing equipments recently developed show thatcompact electronic circuitry and rapid data-processing system were mainly adopted in theinstrument designs. Some newly developed techniques characterizing the paniculate systemwere also introduced.

1. A1

4-1-

7], ** =L -Sr

] -§-.£.*]•

-i-a--

Si 4. ^- CD

C2) -T-^-ft- ^«1

fe-7>?

? (4)A.

-I-

$14.

jfl20a HI 1 S. 118213 2

o| oicr 1=1 TI~"~l t^ — *— i_ '

^ 4.

(2)

-7>«fl *3 Sife- 7] 5-TT ;i] 7>

4°^°J^i -n-71-.3.2..3. ^J^

-lr ^-f^ ^v^(4) -^n>^.]I]

le /)

"

Si

(1)

^>&1 3.7] ^

A5. ?j 44-v o , it Stokes'^

-r SI4.V^ ^-f^l-

Stokes'^

Olds

Re>'n-

(2)

Si

^ «fl t Martin °J 5. ; Feret °J 5. -f-«l

Fig. 1-a. Various descriptions of a mean particlesize for a given sample powder

> 10 15 JJ

FA?TiCLE SIZE. * n44-^

°J 4 .71Fig. 1-b. Difference between various particle size

descriptions.

^*^1 44^ s^l-] Jp- -»-S.-?T--\ •&

H1VAHAK K O N G H A K Vol. 20, N'o I, February 1932

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^K 'SJSJ-t*!** fc^*

7] <£ji 100

= 0,1,2,

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xknr(x)dx

tr-e ,c ^^^

-H-Fj) <5l 6] 0] _U_ sc -xl^ ^ pj]

A = 1, r = 0 6]

= 2, r = 0 o] ^ 7] -

(1)

(2)

Sli

(3)

, A = 3.

314.

4-

it0,! 4.

-t- i-f-4-3-

unting methods)

444. 3" <H i TJ -f of) 4

l 3-7] -^ ^-

fli2oa xii i a in

4. 6J4

=d-f 4-§-4 ^.^ «0v^ o] 4.-I- xf^

mputer^] i-f-A-S. countig jj- s i z i n g -mcroco-

Quantimet3"-^- o]^ Si 4.

photoscan,35' Spectrophotometer4. o]-!- } (Table 2)t

Table 2. Manufacturers of Particle Image Analyser

Name

TGZ 3Quant imetClassimatTAS-SystemMikro-VideomatEpiquantMagi scanMOPOmniconImagelyzer

Manufac turer

ZeissI manco

Leitz

Carl ZeissVEB Carl ZeissJoyce Loebl LtdKontronBausch & LombHamatsu

o - o|^

sl-

44.

lul, °J

-1-*H

S14.

4.

Coulter Counter 4] ^e] , -f-^ij, ;£44.£|

. 7J -fo] 4. *-4«l -r7

3-Hl «H1 1 3*1-7] .3. 4

t Coulter counters]

4.

43 T"3 -i- -f-^MH] 3.7] cfl ,l)5H

Fig. 2. Principle of the Coulter Counter

1 7V

Si 4.

ait!-

4^4. 4, ^^l -"--,} =H 22 -fe- -Sr^i^l ^^--^-JL-^ --r'j "^•f'H h> d r a u d y n a m i c par t ic le size

aerodynamic particle

U -ir-8: 3 4 'ELo] ^^

4-

S14-46'

Sit field,

7} t ' #45.

•I: °l-§-^r^ ^1

Stokes

Si 4-

"V- (4)

0 2

7}

200 mesh 3) .3.

H "J-lr'

HWAHAK KONGHAK Vol. 20, No. 1, February 1982

•;- -•*- 'rt~Tt A^r

sJ

.;i>sj &<*^•.J.k-jc.1?-\ r-^V*"

-,>-:*'-:-'.- <ff'-:-"- /t;-'

IK

Table 3. Vbrious forces acting on a particle in the measuring system

hydramdyamic particle diam- 7-il tj-t 4^ data£] A} B.]

1 4.-& Bostock (oj

ShimadzuCt! -£.-), Satonus(-^-cj! ) -f-o] 4. o] -f--cr digiial rccuing o] 7\-^-e\-SL. microprocessor

4^1 7^1Jl^r-fe- tf-g. <

Si^lHr -

-LH l "J-S I -3HM.5.-1: Jf-<

two-layer '^

1-^ 41'ir^-c-

IS, I n - -

(.'Js — ij

-I- 7]ti) 7|

^ o] .

-»J= (cross! -

ZL ^

^ ^]]&] oJi-Sr^el] <<]-§.s] -fe.

Spnnal Clastif jcr v}- Analysette 9

oj 5.4^-8:

Sll-

Bahco-

-. 3-a.s\-

7 '

I -.. U) • fp. ;>..•;„_ ',i

t i ' \r'A viX/K\'xl -.-.A^^u.-.,.

/ x » '. v ^ \\^/^//' '''A\'t'F-\ - - -'\

^ 'l;-'.'1', "^ ^ ^s^^&$$ .r- x., *x

C-=.-:ICLE si:;

Fig. 3-a Actual separation of the f ine and thecoarse fraction out of the feed throughthe cut size, xt.

9 n ,- ! »J

Fig. 3-b. Separation curve showing the gradeefficiency, ^(x), and a separation func-tion, A'25/75

-v-v. __ _/"

^^•' // '• ' - ,//// f / / 'Jf' i • ! I

_

3' ( / : / i •-

! i

Fig. 3-c. Various grade efficiencies can be obtainedwith different PSA instruments for thesamples; 1,2,3 and 4

HWAHAK KONGHAK Vol. 20, No. 1, February 1982

:,"'•'>':*- i

'fi^ ,fc "4

^*^L-43S^

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^ It -Sr

Si 4-

-frail -f-4

=H 21 1

5. ^t[

l -U-H471

. 44^

21 JL

&l7

L 21 -

Table 4 Commercial Ins t ruments classified a f t e rmajor working principles

principle ; name of intsrument ref

scattering

diffraction

extinction

Optical particle counter |(7J)Tjpton particle analyserCoulter NanosizerRoyco Particle AnalyserLaser InterferomelersLaser Doppler

Anemometers

Talbot-Disa

(73)(74, 75)(76)(77, 78)(79-83)

(84)C1LAS granulometer 1(85,86)Malvern Analyser 1(87.88)Microtrac (89-93)

HIAC-counter ,(94)

4-1-4.

il^ o jc- j

-g-o} $14.

s)H 21 JL,

^ja. laser ^-

C.].. 98,99,1001 ^

odispersed)^.5-7\ J£_ (m0n.

SiA^Cpolydispersed)

44-

optical particle counter

-f-

4. a. °1 «l

*>4. Coulter Nanosizcr7 ' '75 '-Si 4

(fluctuation)-S: 4^ *H °J 4s)sit!: Einsticn ^ o] -3-10I>A.5.-f ^

i*}^ ^-^1 61 4. Royco T}| 7] Si 4-. 5

(chopped) ^-

*, 2J-L J Hi-l\fe LASER

ETTlMCTON »COLLECTION

3p«cR^-\K}€SS)—Ir\! CELL B / \/ \

SCATTER M!RRORE/ CALIBRfiTtOH/ FIBRE

RETURNMIRROR

Laser doppler anemometer^

Si (optical sieve) eV^^-tll °J4£1 3.7] ^-f-r--! imaginary fringepattern 4 n]5L^A5.'«l ^^44-

Fraunhofcr s] S-t f a r - f i e l d il^102'-^ o|

4*1 7> Si 7}

mask-disc35)7r

71-1- 4^ 0Ji>'lmatrix T 44.68,103.

Ta-

4-1--5.71-

... /.L;.!pcrl.cle 5=nple I

Fig. 4. Schematic diagram of the Royco submicron Fig 5 Far-field diffraction analysis of the 2-dim-particle analyser ensional model particles

HWAHAK KONGHAK Vol. 20, No. 1. February 1982 m

10

xtinction

coefficient, K)-|- -S-*H

*)— — (5)

6. ^

7] -^o,

Table 5. physical principles employed to sense andsize particles

1. Image replication2. .Electrical resistance change

3. Light scattering4. Radiation attenuation,

light, ultrasonic, ^-ray, x-ray5. Classification;

sieve, elutriation, hydrocyclone, sedimentation6. Fluid flow,

permeametry, nozzles, rheology7. Hot v. ire anemometry

8. Electrostatic ion capture

(sieve)-fe-

Til 31^1-fc- 7j-f

-c- ^ ^ -i: -^2. *1 7r-5-1>

. 106,107)

)_£_.£. Schonert s\

Orr

$1544:

. IOD '"01 50

]-3- 7]

Coulter Courier-1: <£D3^1; Small-fir11" =.

\151-1: -§~§- ]: hydrodynamic chr-

'^.'o'-ir 'a^^H 0J-£-7> 0.234

0. ll^m'Hl latex -g- ^r&l""tl vl "r Si $14.

7.)-

fs]

«1203 fll 1 S. 1982a

Refercncces

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•'Vs,.'

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^ ?<;»,••?'

'5:te:

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T ; ^••• •

"v*5"' '

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H\VAH-\K K O X G I I A K Vol 20, No. 1, February

Sprt£& ~ J^i >.