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![Page 1: Joint Design-Time and Post-Silicon Optimization for Analog Circuits: A Case Study Using High-Speed Transmitter Yiyu Shi, Wei Yao, Lei He, and Sudhakar.](https://reader035.fdocuments.in/reader035/viewer/2022062511/551be1cb550346c3588b5e08/html5/thumbnails/1.jpg)
Joint Design-Time and Post-Silicon Optimization for Analog Circuits:
A Case Study Using High-Speed Transmitter
Joint Design-Time and Post-Silicon Optimization for Analog Circuits:
A Case Study Using High-Speed Transmitter
Yiyu Shi, Wei Yao, Lei He, and Sudhakar Pamarti
Electrical Engineering Dept., UCLA
Speakers: Edward Kao and Scott Fukushima
![Page 2: Joint Design-Time and Post-Silicon Optimization for Analog Circuits: A Case Study Using High-Speed Transmitter Yiyu Shi, Wei Yao, Lei He, and Sudhakar.](https://reader035.fdocuments.in/reader035/viewer/2022062511/551be1cb550346c3588b5e08/html5/thumbnails/2.jpg)
OutlineOutline
Introduction
Design-Time Optimization
Post-Silicon Tuning and Joint Optimization
Optimization Framework
Experimental Results
Conclusions
![Page 3: Joint Design-Time and Post-Silicon Optimization for Analog Circuits: A Case Study Using High-Speed Transmitter Yiyu Shi, Wei Yao, Lei He, and Sudhakar.](https://reader035.fdocuments.in/reader035/viewer/2022062511/551be1cb550346c3588b5e08/html5/thumbnails/3.jpg)
Problem StatementProblem Statement
Goal To maximize parametric yield for analog circuits
Reasons for Concern Analog circuits are highly sensitive to process variation Process variation causes problems for parametric yield and
becomes worse with technology scaling
Techniques for maximize parametric yield Design-time optimization Post-silicon tuning
![Page 4: Joint Design-Time and Post-Silicon Optimization for Analog Circuits: A Case Study Using High-Speed Transmitter Yiyu Shi, Wei Yao, Lei He, and Sudhakar.](https://reader035.fdocuments.in/reader035/viewer/2022062511/551be1cb550346c3588b5e08/html5/thumbnails/4.jpg)
Existing WorkExisting Work
Design-time optimization System-level [Stojanovic:CICC’03]
System-level and circuit-level co-design [Sredojevic:ICCAD’08]
Device-level Transistor sizing and layout optimization [Pelgrom:JSSC’89]
Post-silicon tuning Tunable amplifier [Kaya:TCASII’07]
Programmable capacitor array for filter, ADC [Huang:JSSC’01]
Transistor finger selection to reduce mismatch [Li:ICCAD’08] A lot more adaptive design for analog/mixed-signal circuit …
First yield-driven circuit design technique that considers both
post-silicon tuning along with design time optimization
![Page 5: Joint Design-Time and Post-Silicon Optimization for Analog Circuits: A Case Study Using High-Speed Transmitter Yiyu Shi, Wei Yao, Lei He, and Sudhakar.](https://reader035.fdocuments.in/reader035/viewer/2022062511/551be1cb550346c3588b5e08/html5/thumbnails/5.jpg)
Adaptive / Tunable CircuitsAdaptive / Tunable Circuits
Tunable circuits with negative feedback loop to compensate process variation
Traditional corner-based design methodology makes sure the circuit satisfies the design spec in all process corners
Circuit tunability does not comes for free Yield-driven optimization is required to prevent over-design
![Page 6: Joint Design-Time and Post-Silicon Optimization for Analog Circuits: A Case Study Using High-Speed Transmitter Yiyu Shi, Wei Yao, Lei He, and Sudhakar.](https://reader035.fdocuments.in/reader035/viewer/2022062511/551be1cb550346c3588b5e08/html5/thumbnails/6.jpg)
Joint Design-Time and Post-Silicon OptimizationJoint Design-Time and Post-Silicon Optimization
Use high speed link transmitter design as an example
Proposed goal Maximize yield
Yield is defined by BER Satisfy power and area constraints
Optimization framework Build model for analog building blocks from SPICE Include Vt variation and consider tuning circuit cost Use SPICE-characterized cells as building units Combine branch-and-bound and gradient-ascent algorithm
Effectively find the global optimum solution
![Page 7: Joint Design-Time and Post-Silicon Optimization for Analog Circuits: A Case Study Using High-Speed Transmitter Yiyu Shi, Wei Yao, Lei He, and Sudhakar.](https://reader035.fdocuments.in/reader035/viewer/2022062511/551be1cb550346c3588b5e08/html5/thumbnails/7.jpg)
OutlineOutline
Introduction
Design-Time Optimization
Post-Silicon Tuning and Joint Optimization
Optimization Framework
Experimental Results
Conclusions
![Page 8: Joint Design-Time and Post-Silicon Optimization for Analog Circuits: A Case Study Using High-Speed Transmitter Yiyu Shi, Wei Yao, Lei He, and Sudhakar.](https://reader035.fdocuments.in/reader035/viewer/2022062511/551be1cb550346c3588b5e08/html5/thumbnails/8.jpg)
High-Speed Serial Link ExampleHigh-Speed Serial Link Example
Consider the transmitter pre-emphasis filter Combats inter-symbol interference (ISI) Plays an important role in system performance Consumes most power at transmitter
data out
ChannelPre-driver
Pre-amplifier
Slicer
CDRFIR pre-emphasis filter/driver
IC0 IC1 ICn
N-tap FIR filter
Filter coefficients
Transmitter Receiver
RD
RD
a0 a1 an
![Page 9: Joint Design-Time and Post-Silicon Optimization for Analog Circuits: A Case Study Using High-Speed Transmitter Yiyu Shi, Wei Yao, Lei He, and Sudhakar.](https://reader035.fdocuments.in/reader035/viewer/2022062511/551be1cb550346c3588b5e08/html5/thumbnails/9.jpg)
Transmission EnvironmentTransmission Environment
Channel Attenuation Dispersion
Reflection Impedance mismatch
Inter-symbol interference Band-limited channel
Crosstalk Capacitive or Inductive coupling
Other random noises ex: circuit thermal noise
TX RXdata
outchannel
![Page 10: Joint Design-Time and Post-Silicon Optimization for Analog Circuits: A Case Study Using High-Speed Transmitter Yiyu Shi, Wei Yao, Lei He, and Sudhakar.](https://reader035.fdocuments.in/reader035/viewer/2022062511/551be1cb550346c3588b5e08/html5/thumbnails/10.jpg)
Transmitter DesignTransmitter Design
Pre-emphasis filter Last stage of the pre-driver Pre-filter the pulse with the
inverse of the channel
ai: input symbol bi: transmitter output Wj: filter coefficient
Other stages of the pre-driver
Sizing is according to logic effort
RS
IW0
Pre-emphasis Filter
IW1 IWM
VNEAR
VX2 VXM
TX RXFIRdata
outchannel
i j i jj
b Wa
Pre-driver
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Transmitter Design (cont’d)Transmitter Design (cont’d)
LMS algorithm is used for optimal filter coefficients given the number of taps n
Large transistor parasitic capacitance exists Considered as part of the channel
Transistor sizing is done through parallel connected unit cells Unit cells α are pre-characterized through simulation Output swing constraint is applied to make sure correct operation
region Get rid of SPICE simulation during optimization
![Page 12: Joint Design-Time and Post-Silicon Optimization for Analog Circuits: A Case Study Using High-Speed Transmitter Yiyu Shi, Wei Yao, Lei He, and Sudhakar.](https://reader035.fdocuments.in/reader035/viewer/2022062511/551be1cb550346c3588b5e08/html5/thumbnails/12.jpg)
Performance MetricPerformance Metric
010010 010010
Transmission ReceptionChannel
Modulation Demodulation
BER =tR
Ne
Ne = Number of errorsR = Data ratet = Test time
Bit Error Rate (BER)
Error Vector Magnitude (EVM)
1
2 eI
Q
Error in thereceived symbolV2
V1 e = V1- V2
R×t > 1015 !!
![Page 13: Joint Design-Time and Post-Silicon Optimization for Analog Circuits: A Case Study Using High-Speed Transmitter Yiyu Shi, Wei Yao, Lei He, and Sudhakar.](https://reader035.fdocuments.in/reader035/viewer/2022062511/551be1cb550346c3588b5e08/html5/thumbnails/13.jpg)
Performance Metric (cont’d)Performance Metric (cont’d)
The relation between EVM and BER can be obtained through simulation Monotonic Highly correlated EVM can be measured efficiently with far less data
2
max
1
2
1
r
ar
MEVM
M
ii
ai: input symbol bj: transmitter output pj:: channel response ri: received data M: total number of data < 104
jijiji npbr
![Page 14: Joint Design-Time and Post-Silicon Optimization for Analog Circuits: A Case Study Using High-Speed Transmitter Yiyu Shi, Wei Yao, Lei He, and Sudhakar.](https://reader035.fdocuments.in/reader035/viewer/2022062511/551be1cb550346c3588b5e08/html5/thumbnails/14.jpg)
OutlineOutline
Introduction
Design-Time Optimization
Post-Silicon Tuning and Joint Optimization
Optimization Framework
Experimental Results
Conclusions
![Page 15: Joint Design-Time and Post-Silicon Optimization for Analog Circuits: A Case Study Using High-Speed Transmitter Yiyu Shi, Wei Yao, Lei He, and Sudhakar.](https://reader035.fdocuments.in/reader035/viewer/2022062511/551be1cb550346c3588b5e08/html5/thumbnails/15.jpg)
Process VariationProcess Variation
Threshold voltage variation Doping fluctuations Short channel device
Channel length variation also causes Vth variation
Becomes dominant in the next few technology generations
Pre-emphasis filter coefficients Implemented as CMOS current
sources Vth Variation induces drain
current mismatch
Assume 10% variation in Vth 30% variation in power BER varies in several order of
magnitude
-100 -50 0 50 100-50u
-40u
-30u
-20u
-10u
0
Vt variation (mV)
Cu
rren
ts (
A)
Vt
IREF
Vt+ Vt
I+ I
I↔Vt
3σ=50mV
![Page 16: Joint Design-Time and Post-Silicon Optimization for Analog Circuits: A Case Study Using High-Speed Transmitter Yiyu Shi, Wei Yao, Lei He, and Sudhakar.](https://reader035.fdocuments.in/reader035/viewer/2022062511/551be1cb550346c3588b5e08/html5/thumbnails/16.jpg)
Post-Silicon Tuning through DAC Post-Silicon Tuning through DAC
Current-division DAC is commonly used to combat process variation
Two design parameters LSB size ( ): minimum step during digital-to-analog conversion Resolution (β): number of bits used
Digital Input
Analog output
LSB size
w/o variation
with variation
DD’
A
A+ A
A’=A- A’
A
A’
D[1]D[0] D[2]
![Page 17: Joint Design-Time and Post-Silicon Optimization for Analog Circuits: A Case Study Using High-Speed Transmitter Yiyu Shi, Wei Yao, Lei He, and Sudhakar.](https://reader035.fdocuments.in/reader035/viewer/2022062511/551be1cb550346c3588b5e08/html5/thumbnails/17.jpg)
Power and Performance VariationPower and Performance Variation
(a) Without Tuning (b) With Tuning
Both power and performance variations are reduced significantly Given the same design
Tuning circuits actually bring extra costs Area Larger parasitic → performance downgrade
![Page 18: Joint Design-Time and Post-Silicon Optimization for Analog Circuits: A Case Study Using High-Speed Transmitter Yiyu Shi, Wei Yao, Lei He, and Sudhakar.](https://reader035.fdocuments.in/reader035/viewer/2022062511/551be1cb550346c3588b5e08/html5/thumbnails/18.jpg)
Problem FormulationProblem Formulation
Where
,
random variable
e
![Page 19: Joint Design-Time and Post-Silicon Optimization for Analog Circuits: A Case Study Using High-Speed Transmitter Yiyu Shi, Wei Yao, Lei He, and Sudhakar.](https://reader035.fdocuments.in/reader035/viewer/2022062511/551be1cb550346c3588b5e08/html5/thumbnails/19.jpg)
OutlineOutline
Introduction
Design-Time Optimization
Post-Silicon Tuning and Joint Optimization
Optimization Framework
Experimental Results
Conclusions
![Page 20: Joint Design-Time and Post-Silicon Optimization for Analog Circuits: A Case Study Using High-Speed Transmitter Yiyu Shi, Wei Yao, Lei He, and Sudhakar.](https://reader035.fdocuments.in/reader035/viewer/2022062511/551be1cb550346c3588b5e08/html5/thumbnails/20.jpg)
Yield vs. Power and AreaYield vs. Power and Area
Significant improvement can be expected
Solution space surface is rough and many local maxima exists
Discrete problem with non-convex objective and constraints
3000 Monte Carlo runs over different unit cell design α, resolution β, and LSB size
![Page 21: Joint Design-Time and Post-Silicon Optimization for Analog Circuits: A Case Study Using High-Speed Transmitter Yiyu Shi, Wei Yao, Lei He, and Sudhakar.](https://reader035.fdocuments.in/reader035/viewer/2022062511/551be1cb550346c3588b5e08/html5/thumbnails/21.jpg)
Basic idea: Partition the solution space by LSB size ( ) and unit cell type (α) Develop a bound on the performance Discard (fathom) if bound worse than the current best solution
Branch and Bound with Gradient Ascent MethodBranch and Bound with Gradient Ascent Method
Use gradient ascent method to find the local maxima
Sequentially take steps in the direction proportional to the gradient.
Bound estimation Remove the area and power
constraints Use LMS algorithm to find the optimal
coefficients Results in best possible performance
All
αi
αj
αk
γi
γj
γi
γj
γi
γj
Pruned by upper bound check
infeasible
![Page 22: Joint Design-Time and Post-Silicon Optimization for Analog Circuits: A Case Study Using High-Speed Transmitter Yiyu Shi, Wei Yao, Lei He, and Sudhakar.](https://reader035.fdocuments.in/reader035/viewer/2022062511/551be1cb550346c3588b5e08/html5/thumbnails/22.jpg)
OutlineOutline
Introduction
Design-Time Optimization
Post-Silicon Tuning and Joint Optimization
Optimization Framework
Experimental Results
Conclusions
![Page 23: Joint Design-Time and Post-Silicon Optimization for Analog Circuits: A Case Study Using High-Speed Transmitter Yiyu Shi, Wei Yao, Lei He, and Sudhakar.](https://reader035.fdocuments.in/reader035/viewer/2022062511/551be1cb550346c3588b5e08/html5/thumbnails/23.jpg)
BER Distribution ComparisonBER Distribution Comparison
Two extreme cases Without tuning circuit
All resources are used for filter design
Unavoidable large variation One tap filter
All resources are used for DAC
Has extreme small variance but suffers severe ISI
Manually design Assume LSB size is equal for
each tap Good balance between above
two extreme cases
Our algorithm Provides better solution
![Page 24: Joint Design-Time and Post-Silicon Optimization for Analog Circuits: A Case Study Using High-Speed Transmitter Yiyu Shi, Wei Yao, Lei He, and Sudhakar.](https://reader035.fdocuments.in/reader035/viewer/2022062511/551be1cb550346c3588b5e08/html5/thumbnails/24.jpg)
Experiment ResultsExperiment Results
Yield comparison for different constraints
area vt variation
power
Improve the yield by up to 47%
![Page 25: Joint Design-Time and Post-Silicon Optimization for Analog Circuits: A Case Study Using High-Speed Transmitter Yiyu Shi, Wei Yao, Lei He, and Sudhakar.](https://reader035.fdocuments.in/reader035/viewer/2022062511/551be1cb550346c3588b5e08/html5/thumbnails/25.jpg)
OutlineOutline
Introduction
Design-Time Optimization
Post-Silicon Tuning and Joint Optimization
Optimization Framework
Experimental Results
Conclusions
![Page 26: Joint Design-Time and Post-Silicon Optimization for Analog Circuits: A Case Study Using High-Speed Transmitter Yiyu Shi, Wei Yao, Lei He, and Sudhakar.](https://reader035.fdocuments.in/reader035/viewer/2022062511/551be1cb550346c3588b5e08/html5/thumbnails/26.jpg)
ConclusionsConclusions
Use high speed link transmitter design as an example propose to maximize BER yield subject to power and area
constraints.
Build model for analog building blocks from SPICE and Include Vt variation with the consideration of tuning circuit cost
Combine branch-and-bound and gradient-ascent algorithm Effectively find the global optimum
Experiments show that, compared to manual design, joint design-time and post-silicon optimization can improve the yield by up to 47%
Future work Consider the impact of clock Optimize for the whole system, including receiver and clock
circuitry
![Page 27: Joint Design-Time and Post-Silicon Optimization for Analog Circuits: A Case Study Using High-Speed Transmitter Yiyu Shi, Wei Yao, Lei He, and Sudhakar.](https://reader035.fdocuments.in/reader035/viewer/2022062511/551be1cb550346c3588b5e08/html5/thumbnails/27.jpg)
Thank you !Thank you !