Jentek API Beijing2013

8/13/2019 Jentek API Beijing2013

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Inspection of Refinery Piping and Vesselsfrom the Outside for External

and Internal Corrosion

Neil Goldfine, Todd Dunford, Scott Denenberg, Yanko Sheiretov, Andrew Washabaugh, Shayan Haque

JENTEK Sensors, Inc., 110-1 Clematis Avenue, Waltham, MA 02453-7013

Tel: 781-642-9666; Email: [email protected]

web: jenteksensors.com

APIBeijing,

China

913September2013

PrimarySession:Downstream


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NDT & SHM Applications for MWM-Arrays,

a flexible eddy current sensor technology

Deepwater

Pipelines(CUI)

DeepwaterRisers

(CUI)

InDitch

Pipeline(Mechanical

Damage)

InDitch

Pipeline

(SCC) PipelineILI

(Corrosion,

Cracks,&Stress)

AeroTurbine

Blade(Cracks)

RefineryPiping

(CUI)

LandBased

Turbine

Blades

(Cracks)

CommonBox

Common

Electronics

FullScaleTest

Stress&Damage

Monitoring

Smart

Washersfor

Cracks

BuriedPipe

Stress&

Damage

Monitoring

NDT SHMNondestructive

TestingStructural Health

Monitoring

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Decay rate determined by skin depth at

high frequency and sensor dimensions

at low frequency

Large dimensions needed for thick

coatings/insulation Low frequencies needed to penetrate

through steel pipe wall

MWM-Array Sensor Selection

VWA001MWMArray*

Depth of Penetration = 1/Re(n)

*Note:OtherMWMwindingdesignsprovidebetterperformance

Stainless

Steel

Aluminum

Carbon Steel

1

inch

=

25.4

mm

Skin depth: 1f

22n /2j/n2

Low Frequency Limit =

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Corrosion Under Insulation (CUI) Inspection

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MWM-Array Inspection for CUIProblem Definition

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Wall loss imaging for internaland external corrosion

through insulation and

weather jacket


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MWM-Array Inspection for CUIPre-Alpha System Performance

(Wall Thickness Image)

Improved Resolution with Alpha System

(Wall Thickness Image)

(in.)

(in.)

(in.)

(in.)

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Problem Definition


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Low cost ILI Cleaning Tool

PIG-IT: Pipeline Inspection

Gage, with integrated IT

Internal and external corros ion

imaging from inside the pipe

Corrosion Under Insulation

Oil & Gas Application Examples

In-Line Inspection

Stress Corrosion Cracking Mechanical DamageMD

Mapping of SCC clusters

Developing depth

screening capability

MPI replacement

SCC

Riser Inspection

ILICUI

Magnetic profilometry

Crack Detection in Dents

Developing residual stress

mapping

MWM-Array

Sensor

NDT without coating/insulationremoval

CUI detection th rough ~2 in.insulation and weather jacket

Phased Array UT replacement

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Permeability

Lift-off

Defect

Permeab

ility

L

ift-off

Defect

0.5 in. coating 1.0 in. coating

Previous MWM-Array Results

Distance Measured From

Weld at Flange NeckGround Supports

Limited Access

Inlet

Riser section of interest

0.5 in. 1 in.

Defect

Defect

Using VWA001 MWM-Array

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In-Line Inspection (ILI) Tools

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JENTEK ILI Development and Demonstrations

Generation 1 2010 (Completed)

Preliminary capabili ty demonstration, December 2010 Small MWM-Array mounted on a tool and pulled through s traight sections

High freq. test to help understand issues for integrating sensors in to an ILI tool

Enhanced capability demonstration, September 2011 Large MWM-Arrays to accommodate larger lift -offs (e.g., 0.25-1.00 in.)

Integrated electronics with on ly power supply tether (24v)

Generation 2 - 2011 (Completed)

Generation 3 2012/2013 (Ongoing PRCI Program)

Increase channel count and data rate Q3 2013

Increased number of channels to provide complete coverage Higher data throughput per channel to increase the maximum speed of the tool

through the pipe

Include on-board power onto tool

Improved durability and hardening of the instrument, including isolation from

the environment.

Generation 4 2013/2014 Options

Integrated Capabili ty Development and Demonstration Improved durability and hardening of the instrument, including sealing for

environmental protection in oil and gas environments and shock protection

Reduce power consumption for battery operation of ins trumentation

Reduce the size of the electronics to consol idate the tool into one module

Team with an ILI tool vendor to support testing in a flow line

Perform first flow line test

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Generation 2 Technology: Pull Test Results

MWM-Array 2Pull Speed ~0.36 mph

Permeability

Lift-Off

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NDT

Cracks

SHM

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Representative

data on flat plate

specimen with

EDM notches

Crack Detection Multiple-Channel MWM-Array Crack

Depth Measurement

C-Scan Imaging on Flat and Curved

Surfaces, using Conformable MWM-

Arrays and MR-MWM-Arrays

Crack Imaging & Depth Measurement Capability

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36-in. long, 8-in. diameter pipes Axial EDM notches located at various positions around each pipe

Scanned with FA24 (medium size) MWM-Array

Wider array and sense elements compared to FA26

Schedule80

Sample

EDM Notch Pipe Samples

Schedule40Sample

0.250

0.160

0.080

0.020

0.040

11.0-in. 2.0-in. 2.0-in. 11.0-in.10.0-in.

0.200

0.120

1.0-in.

1.0-in.

0.25-in. gap

0.12-in. gap

0.06-in. gap1.0-in.

1.0-in. 0.12-in. gap

0.06-in. gap

0

-90

-180

180

-90

1.0-in.

0.200

0.160

0.120

0.080

0.040

11.0-in. 2.0-in. 12.0-in.10.0-in.

Depth of notch is indicated

0.160

0.120

Pairs of notches, either 0.5-in.

or 1.0-in. long, each notch

being 0.080 deep (sched. 80)or 0.040 deep (schedule 40).

The vertical spacing is

indicated.

1.0-in.

1.0-in.

0.25-in. gap

0.12-in. gap

0.06-in. gap1.0-in.

1.0-in. 0.12-in. gap

0.06-in. gap

0

-90

-180

180

-90

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FA24 MWM-Array Scan of EDM Notch Pipe SampleBaseline & Post-EDM Fabrication Data on Schedule 80 Sample

LiftOffPermeability

Baseline

PostED

M

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Representative FA24 data at 100 kHz

Notches clearly indicated as increase in permeabili ty

Pairs of notches show resolution capability

Schedule 80 Sample

Permeability

Post-EDM

1.0 in.

1.0 in.

1.0 in.

0.5 in.

0.5 in.

20 22 24


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Reasonable measurement correlation between depth and effectivepermeabili ty change

Pairs of notches show increased response as notches are closer together

Sensit ive to notch depth over this range

160

140

120

100

80

60

40

20

0

0.250.200.150.100.050.00

EDM Notch Depth ( in.)

Schedule 40 and 80, FA24, 100 kHzlength (in.):

2.0 [sing le] 1.0 [single]

fit: p = 627.2 d - 15.1, R2=0.950

160

140

120

100

80

60

40

20

0

0.250.200.150.100.050.00

EDM Notch Depth ( in.)

0.25

0.12

0.06

0.250.12

0.06

0.120.06

0.12

0.06

Schedule 40 and 80, FA24, 100 kHzlength (in.):

1.0 [pairs] 0.5 [pairs]

fit: p = 627.2 d - 15.1, R2=0.950

Increasing interaction.smaller spacing (in.)

Single Crack Crack Pairs

Resp

onseChangeatfla

wc

enter

Resp

onseChangeatfla

wc

enter


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FA28 MWM-Array Imaging of SCC

PipelineSample

Provided

by

Applus/RTD

Papertosimulatecoating

Conductivity Images Lif t-Off Images

FA28

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FA28 Imaging of Stress Corrosion Cracking

LiftOffScanThroughCoating

CloseUpofConductivityScanConductivityScan

CloseUpofLiftOffScan

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(RTDp/nNPS34#1)

MWMArrayThresholdImage

MWMArraySpectrumColorImage

MWM-Array Imaging of SCC in Pipeline Sample

Scans of Pipe Section with Identif ied SCC (FA28 sensor)

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Full-Scale Fatigue Test at Mechanical Damage Site

under DOT and PRCI funding with GDF Suez

4-pt static load testing of

coupon

Dynamic pipeline pressure testing

Damage Monitoring Stress Monitoring

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Weld Imaging

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MWM-Array Residual Stress Imaging

For Post-weld heat treatment (PWHT)

Effect of Thermal Stress Relief on Weld in

Witness Coupon, Pressure Vessel Steel

Permeability/stress

scanning across the weld

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Jentek API Beijing2013

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