Jaroslav Adam - Katedra Fyziky FJFI ČVUT v Praze · Jaroslav Adam (CTU, Prague) DPD_06,...

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06 - Photomultiplier tubes and photodiodes Jaroslav Adam Czech Technical University in Prague Version 2 Jaroslav Adam (CTU, Prague) DPD_06, Photomultiplier tubes and photodiodes Version 2 1 / 38

Transcript of Jaroslav Adam - Katedra Fyziky FJFI ČVUT v Praze · Jaroslav Adam (CTU, Prague) DPD_06,...

Page 1: Jaroslav Adam - Katedra Fyziky FJFI ČVUT v Praze · Jaroslav Adam (CTU, Prague) DPD_06, Photomultiplier tubes and photodiodes Version 2 10 / 38 Secondary electron emission At one

06 - Photomultiplier tubes and photodiodes

Jaroslav Adam

Czech Technical University in Prague

Version 2

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The Photomultiplier (PM) tube

Detection of very weak scintillation light

Provide electrical signal

Can be also done with silicon photodiodes, but PM are most widely used

Characterized by spectral sensitivity

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Structure of PM tube

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Photoemission process

Conversion of incident light to photelectron in sequence of processes

(1) photon absorbed, it’s energy transfered to electron in material

(2) Migration of electron to the surface of material

(3) Escape of electron from the surface of photocathode

Must overcome potential barrier (work function) of the material

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Spontaneous electron emission

Thermionic noise by the surface barrier

Thermal kinetic energy of conduction electrons may be sufficient to overcome the barrier

Average of thermal energy is 0.025 eV, but the tail of the distribution reaches higher energies

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Fabrication of photocathodes

Opaque - thickness > maximal escape depth

Semitransparent - deposited on transparent backing

Important uniformity of thickness

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Quantum efficiency and spectral response

Measures sensitivity of photocathode

QE = (number of photoelectrons emitted) / (number of incident photons)

Depends on photon wavelength

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Quantum efficiency and spectral response

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Focusing the electrons from photocathode towards the first dynode

RCA Photomultiplier Manual. Technical Series PT-61, 1970

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Electron multiplication

Secondary electron emission

Electron from photocathode accelerated towards the dynode

Deposited energy cause re-emission of more secondary electrons

Excited electrons within dynode, only some escape the surface

Yield of secondary electrons is function of incident energy

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Secondary electron emission

At one dynode δ = (number of secondary electrons emitted) / (primary incident electrons)

Depends on incident electron energy

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Negative electron affinity

Used to increase of secondary emission yield

Achieved by ionized acceptors by electrons from thin electropositive surface layer

Band structure bent at the surface, electron at the bottom of conduction band may escapewithout further energy loss

Secondary emission yield shows monotonic increase with incident electron energy

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Multiple stage multiplication

Needed to achieve gain about 106

Second dynode attact secondary electrons emitted at low energy by first dynode

Can be repeated many times

gain = αδN (1)

Overall gain is function of voltage

Statistical broadening of response by fluctuations in multiplication

Variance dominated by multiplication factor at first dynode

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Structural differences of PM tubesSeveral configurations of photocathode and multiplier section

Continuous channel electron multiplier (channeltron)

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Microchannel plate

Many individual tubes with small diameter

Short electron transit time

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Microchannel plate (MCP) in image intensifier

Hamamatsu, Image intensifiers, TII 0004E02, SEPT. 2009 IP

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Pulse timing properties

Time characteristics of PM given by electron trajectories

Electron transit time is average time difference between arrival of photon at photocathode andcollection of the pulse of electrons at anode

Width of pulse given by spread in transit time

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Pulse timing properties

Difference in electron paths dominant in spread of transit time

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Spread of transit time

Measured spread as a function of average number of photoelectrons per pulse

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Maximum ratings

Maximal voltage and current ratings

Voltage between anode and cathode + photocathode and first dynode, between dynodes andlast dynode and anode

Current limits for photocathode and anode, of no concern in scintillator pulse counting

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Photomultiplier tube specifications

Overall luminous sensitivity

Cathode luminous sensitivity

Overall radiant sensitivity

Cathode radiant sensitivity

Dark current

Anode pulse rise time

Anode pulse width

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Linearity

Electron multiplication factor independent of number of original photoelectrons

Output pulse amplitude linearly proportional to intensity of scintillation light

Nonlinearity can be caused by space charge between last dynode and anode

Demands on PM by high light yield at fast decay time of new scintillators

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Noise and spurious pulses

Spontaneous termionic emission of electrons from photocathode

Dark spectrum of pulses from single electron:

Afterpulses from ionized residual gas drifting to photocathode

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Non-ideality of PM

Photocathode nonuniformities

Change of gain during measurement

Space charge and thermal effects

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High voltage supply and voltage divider

Positive polarity (a), negative polarity (b)

Current through divider larger than internal current of PM

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Photomultiplier summary

Figure : Typical structureFigure : Region between photocathode and 1st dynode(up) and negative electron affinity (down)

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Photodiodes

Higher quantum efficiency, compact size

Insensitive to magnetic field

Conventional photodiode or avalanche photodiode

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Conventional photodiodes

High quantum efficiency over large range of incident wavelength

No internal amplification, weak output pulses

Design as PIN detector

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Spectral response of conventional photodiode

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Avalanche photodiodesCharge multiplication in semiconductor

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Silicon photomultiplier

Geiger mode of avalanche photodiode

Single photon sensitivity

Constructed as array of small cells

Number of fired cells proportional to number of scintillation photons

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Scintillation pulse shape analysis

Given by time constant of anode circuit:

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Effect of time constant

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Fluctuations in pulse shape

Short time constant sensitive to fluctuations

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Hybrid photomultiplier tube

Electrons emitted by photocathode detected by silicon detector

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Position sensing photomultiplier tubes

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Metal channel dynode structure

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Anode wire readout

Reduction of readout channels by charge division

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