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www.irf.com 103/03/06
IRFB4020PbF
Notesthrough are on page 2
DescriptionThis Digital Audio MOSFET is specifically designed for Class-D audio amplifier applications. This MOSFET utilizesthe latest processing techniques to achieve low on-resistance per silicon area. Furthermore, Gate charge, body-diodereverse recovery and internal Gate resistance are optimized to improve key Class-D audio amplifier performancefactors such as efficiency, THD and EMI. Additional features of this MOSFET are 175°C operating junctiontemperature and repetitive avalanche capability. These features combine to make this MOSFET a highly efficient,robust and reliable device for ClassD audio amplifier applications.
S
D
G
TO-220AB
Features• Key parameters optimized for Class-D audio
amplifier applications
• Low RDSON for improved efficiency
• Low QG and QSW for better THD and improved
efficiency
• Low QRR for better THD and lower EMI
• 175°C operating junction temperature for
ruggedness
• Can deliver up to 300W per channel into8Ωload in
half-bridge configuration amplifier
VDS 200 VRDS(ON) typ. @ 10V 80 m
Qg typ. 18 nCQsw typ. 6.7 nCRG(int) typ. 3.2 ΩTJ max 175 °C
Key Parameters
Absolute Maximum RatingsParameter Units
VDS Drain-to-Source Voltage VVGS Gate-to-Source VoltageID @ TC = 25°C Continuous Drain Current, VGS @ 10V AID @ TC = 100°C Continuous Drain Current, VGS @ 10V
IDM Pulsed Drain Current
PD @TC = 25°C Power Dissipation WPD @TC = 100°C Power Dissipation
Linear Derating Factor W/°CTJ Operating Junction and °CTSTG Storage Temperature Range
Soldering Temperature, for 10 seconds
(1.6mm from case)
Mounting torque, 6-32 or M3 screw
Thermal ResistanceParameter Typ. Max. Units
RθJC Junction-to-Case ––– 1.43RθCS Case-to-Sink, Flat, Greased Surface 0.50 ––– °C/WRθJA Junction-to-Ambient ––– 62
Max.
13
52
±20
200
18
100
52
0.70
10lbin (1.1Nm)
-55 to + 175
300
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S
D
G
Repetitive rating; pulse width limited by max. junction temperature. Starting TJ = 25°C, L = 1.62mH, RG = 25Ω, IAS = 11A. Pulse width ≤ 400µs; duty cycle ≤ 2%.
Rθ is measured at Limited by Tjmax. See Figs. 14, 15, 17a, 17b for repetitive avalanche information.
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)Parameter Min. Typ. Max. Units
BVDSS Drain-to-Source Breakdown Voltage 200 ––– ––– V
∆ΒVDSS/∆TJ Breakdown Voltage Temp. Coefficient ––– 0.23 ––– V/°CRDS(on) Static Drain-to-Source On-Resistance ––– 80 100 mΩVGS(th) Gate Threshold Voltage 3.0 ––– 4.9 V∆VGS(th)/∆TJ Gate Threshold Voltage Coefficient ––– -13 ––– mV/°CIDSS Drain-to-Source Leakage Current ––– ––– 20 µA
––– ––– 250IGSS Gate-to-Source Forward Leakage ––– ––– 100 nA
Gate-to-Source Reverse Leakage ––– ––– -100gfs Forward Transconductance 24 ––– ––– SQg Total Gate Charge ––– 18 29
Qgs1 Pre-Vth Gate-to-Source Charge ––– 4.5 –––Qgs2 Post-Vth Gate-to-Source Charge ––– 1.4 ––– nCQgd Gate-to-Drain Charge ––– 5.3 –––Qgodr Gate Charge Overdrive ––– 6.8 ––– See Fig. 6 and 18
Qsw Switch Charge (Qgs2 + Qgd) ––– 6.7 –––RG(int) Internal Gate Resistance ––– 3.2 ––– Ωtd(on) Turn-On Delay Time ––– 7.8 –––tr Rise Time ––– 12 –––td(off) Turn-Off Delay Time ––– 16 ––– nstf Fall Time ––– 6.3 –––Ciss Input Capacitance ––– 1200 –––Coss Output Capacitance ––– 91 ––– pFCrss Reverse Transfer Capacitance ––– 20 –––Coss eff. Effective Output Capacitance ––– 110 –––LD Internal Drain Inductance ––– 4.5 ––– Between lead,
nH 6mm (0.25in.)LS Internal Source Inductance ––– 7.5 ––– from package
Avalanche CharacteristicsParameter Units
EAS Single Pulse Avalanche Energy mJ
IAR Avalanche Current A
EAR Repetitive Avalanche Energy mJ
Diode Characteristics Parameter Min. Typ. Max. Units
IS @ TC = 25°C Continuous Source Current ––– ––– 18
(Body Diode) AISM Pulsed Source Current ––– ––– 52
(Body Diode)VSD Diode Forward Voltage ––– ––– 1.3 V
trr Reverse Recovery Time ––– 82 120 nsQrr Reverse Recovery Charge ––– 280 420 nC
––– 94
See Fig. 14, 15, 16a, 16b
ID = 11A
Typ. Max.
ƒ = 1.0MHz, See Fig.5
TJ = 25°C, IF = 11Adi/dt = 100A/µs
TJ = 25°C, IS = 11A, VGS = 0V
showing theintegral reverse
p-n junction diode.
ConditionsVGS = 0V, ID = 250µA
Reference to 25°C, ID = 1mA
VGS = 10V, ID = 11A
VDS = VGS, ID = 100µA
VDS = 200V, VGS = 0V
VGS = 0V, VDS = 0V to 160V
VDS = 200V, VGS = 0V, TJ = 125°C
VGS = 20V
VGS = -20V
VGS = 10V
ID = 11A
VGS = 0V
MOSFET symbol
RG = 2.4Ω
VDS = 50V, ID = 11A
Conditions
and center of die contact
VDD = 100V, VGS = 10V
VDS = 100V
VDS = 50V
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Fig 2. Typical Output CharacteristicsFig 1. Typical Output Characteristics
Fig 3. Typical Transfer Characteristics Fig 4. Normalized On-Resistance vs. Temperature
Fig 6. Typical Gate Charge vs.Gate-to-Source VoltageFig 5. Typical Capacitance vs.Drain-to-Source Voltage
0.1 1 10 100
VDS, Drain-to-Source Voltage (V)
0.01
0.1
1
10
100I D
, Dra
in-t
o-S
ourc
e C
urre
nt (
A)
VGSTOP 15V
12V10V8.0V7.0V6.0V5.5V
BOTTOM 5.0V
≤60µs PULSE WIDTHTj = 25°C
5.0V
0.1 1 10 100
VDS, Drain-to-Source Voltage (V)
0.1
1
10
100
I D, D
rain
-to-
Sou
rce
Cur
rent
(A
)
5.0V
≤60µs PULSE WIDTHTj = 175°C
VGSTOP 15V
12V10V8.0V7.0V6.0V5.5V
BOTTOM 5.0V
-60 -40 -20 0 20 40 60 80 100120140160180
TJ , Junction Temperature (°C)
0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
RD
S(o
n) ,
Dra
in-t
o-S
ourc
e O
n R
esis
tanc
e
(
Nor
mal
ized
)
ID = 11A
VGS = 10V
1 10 100 1000
VDS, Drain-to-Source Voltage (V)
10
100
1000
10000
C, C
apac
itanc
e (p
F)
VGS = 0V, f = 1 MHZCiss = Cgs + Cgd, C ds SHORTED
Crss = Cgd Coss = Cds + Cgd
Coss
Crss
Ciss
0 5 10 15 20
QG, Total Gate Charge (nC)
0.0
2.0
4.0
6.0
8.0
10.0
12.0
VG
S, G
ate-
to-S
ourc
e V
olta
ge (
V)
VDS= 160V
VDS= 100V
VDS= 40V
ID= 11A
2 3 4 5 6 7 8
VGS, Gate-to-Source Voltage (V)
0.1
1
10
100
I D, D
rain
-to-
Sou
rce
Cur
rent
(A
)
TJ = 25°C
TJ = 175°C
VDS = 25V
≤60µs PULSE WIDTH
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4 www.irf.comFig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
Fig 9. Maximum Drain Current vs. Junction Temperature
Fig 7. Typical Source-Drain Diode Forward Voltage Fig 8. Maximum Safe Operating Area
Fig 10. Threshold Voltage vs. Temperature
0.2 0.4 0.6 0.8 1.0 1.2
VSD, Source-to-Drain Voltage (V)
0.1
1
10
100I S
D, R
ever
se D
rain
Cur
rent
(A
)
TJ = 25°C
TJ = 175°C
VGS = 0V
25 50 75 100 125 150 175
TJ , Junction Temperature (°C)
0
2
4
6
8
10
12
14
16
18
20
I D,
Dra
in C
urre
nt (
A)
-75 -50 -25 0 25 50 75 100 125 150 175 200
TJ , Temperature ( °C )
1.0
2.0
3.0
4.0
5.0
VG
S(t
h), G
ate
Thr
esho
ld V
olta
ge (
V)
ID = 100µA
1E-006 1E-005 0.0001 0.001 0.01 0.1 1 10 100
t1 , Rectangular Pulse Duration (sec)
0.001
0.01
0.1
1
10
The
rmal
Res
pons
e (
Z th
JC )
0.20
0.10
D = 0.50
0.020.01
0.05
SINGLE PULSE( THERMAL RESPONSE )
Notes:1. Duty Factor D = t1/t22. Peak Tj = P dm x Zthjc + Tc
τJ
τJ
τ1
τ1τ2
τ2 τ3
τ3
R1
R1 R2
R2 R3
R3
Ci i/RiCi= τi/Ri
ττC
τ4
τ4
R4
R4 Ri (°C/W) τi (sec)0.0283 0.000007
0.3659 0.000140
0.7264 0.001376
0.3093 0.007391
1 10 100 1000
VDS, Drain-to-Source Voltage (V)
0.001
0.01
0.1
1
10
100
1000
I D,
Dra
in-t
o-S
ourc
e C
urre
nt (
A)
OPERATION IN THIS AREA LIMITED BY R DS(on)
Tc = 25°CTj = 175°CSingle Pulse
100µsec
1msec
10msecDC
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Fig 13. Maximum Avalanche Energy vs. Drain CurrentFig 12. On-Resistance vs. Gate Voltage
Fig 14. Typical Avalanche Current Vs.Pulsewidth
Fig 15. Maximum Avalanche Energy vs. Temperature
Notes on Repetitive Avalanche Curves , Figures 14, 15:(For further info, see AN-1005 at www.irf.com)1. Avalanche failures assumption: Purely a thermal phenomenon and failure occurs at a
temperature far in excess of Tjmax. This is validated for every part type.2. Safe operation in Avalanche is allowed as long asTjmax is not exceeded.
3. Equation below based on circuit and waveforms shown in Figures 17a, 17b.
4. PD (ave) = Average power dissipation per single avalanche pulse.5. BV = Rated breakdown voltage (1.3 factor accounts for voltage increase during avalanche).6. Iav = Allowable avalanche current.7. ∆T = Allowable rise in junction temperature, not to exceed Tjmax (assumed as 25°C in Figure 14, 15). tav = Average time in avalanche. D = Duty cycle in avalanche = tav ·f ZthJC(D, tav) = Transient thermal resistance, see figure 11)
PD (ave) = 1/2 ( 1.3·BV·Iav) =T/ ZthJC
Iav = 2T/ [1.3·BV·Zth]EAS (AR) = PD (ave)·tav
5 6 7 8 9 10 11 12 13 14 15 16
VGS, Gate -to -Source Voltage (V)
50
75
100
125
150
175
200
225
250
275
300R
DS
(on)
, D
rain
-to
-Sou
rce
On
Res
ista
nce
(mΩ
)ID = 11A
TJ = 25°C
TJ = 125°C
25 50 75 100 125 150 175
Starting TJ , Junction Temperature (°C)
0
100
200
300
400
EA
S ,
Sin
gle
Pul
se A
vala
nche
Ene
rgy
(mJ) ID
TOP 1.6A2.4A
BOTTOM 11A
1.0E-06 1.0E-05 1.0E-04 1.0E-03 1.0E-02 1.0E-01
tav (sec)
0.01
0.1
1
10
100
1000
Ava
lanc
he C
urre
nt (
A)
0.05
Duty Cycle = Single Pulse
0.10
Allowed avalanche Current vs avalanche pulsewidth, tav assuming ∆ Tj = 25°C due to avalanche losses
0.01
25 50 75 100 125 150 175
Starting TJ , Junction Temperature (°C)
0
20
40
60
80
100
EA
R ,
Ava
lanc
he E
nerg
y (m
J)
TOP Single Pulse BOTTOM 1.0% Duty CycleID = 11A
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Fig 16b. Unclamped Inductive WaveformsFig 16a. Unclamped Inductive Test Circuit
tp
V(BR)DSS
IAS
RG
IAS
0.01Ωtp
D.U.T
LVDS
+- VDD
DRIVER
A
15V
20VVGS
Fig 17a. Switching Time Test Circuit Fig 17b. Switching Time Waveforms
VGS
VDS90%
10%
td(on) td(off)tr tf
VGS
Pulse Width < 1µsDuty Factor < 0.1%
VDD
VDS
LD
D.U.T
+
-
Fig 18a. Gate Charge Test Circuit Fig 18b Gate Charge Waveform
Vds
Vgs
Id
Vgs(th)
Qgs1 Qgs2 Qgd Qgodr
1K
VCCDUT
0
L
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Data and specifications subject to change without notice. This product has been designed and qualified for the Consumer market.
Qualification Standards can be found on IR’s Web site.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information. 03/06
TO-220AB packages are not recommended for Surface Mount Application.
Note: "P" in assembly lineposition indicates "Lead-Free"
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Note: For the most current drawings please refer to the IR website at: http://www.irf.com/package/