Implementation of Optical Response of Thin Film Transistor ...

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1 Mobile Display Division Implementation of Optical Response of Thin Film Transistor with Verilog-A for Mobile LCD Applications Keiichiro Ishihara , Yasuhiko Iguchi, Makoto Watanabe, Takeyuki Tsuruma, Takeshi Sawada, Yasuhito Maki Product Design Dept. Mobile Display Div. Electronic Devices Business Group Sony Corporation, Japan

Transcript of Implementation of Optical Response of Thin Film Transistor ...

Page 1: Implementation of Optical Response of Thin Film Transistor ...

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Implementation of Optical Response of

Thin Film Transistor with Verilog-A

for Mobile LCD Applications

Keiichiro Ishihara, Yasuhiko Iguchi, Makoto Watanabe,

Takeyuki Tsuruma, Takeshi Sawada, Yasuhito Maki

Product Design Dept. Mobile Display Div.

Electronic Devices Business Group

Sony Corporation, Japan

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OutlineOutline

�Background

�Model

�Model Evaluation

�Application

�Conclusion

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Background

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Portable

Music Player

BackgroundBackground

Digital Video

Camera (DVC)

Digital Still

Camera (DSC)

Mobile Phone (MBL)Personal Digital

Assistance (PDA)

Portable Game

T V

Portable

DVD Player

Liquid Crystal Displays (LCDs) have become

widely used in our daily life

Personal Computer (PC)

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BackgroundBackground

More accurate and fast simulation

is in demand

�Expectations for LCDs

� High Image Quality� High contrast

� Fast response

� Low power consumption

� Image uniformity, etc…

� Compact in Design� Narrow Frame

� Thinner profile, etc…

� Inexpensive in Price

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BackgroundBackground

�Operation of general LCDs

Block diagram of typical LCD

Equivalent circuit of a pixel

Cross sectional view of LC cell

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BackgroundBackground

�Operation of general LCDs

Block diagram of typical LCD

Equivalent circuit of a pixel

Cross sectional view of LC cell

VERY IMPORTANT!!

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BackgroundBackground

Possible defects of display quality

�Issues for the display quality in LCDs (1)

Cause of the malfunctions

“Photo-Leakage Current”

Frame1

Frame2

Frame1’

Frame2’

time

Flicker Vertical Cross-talk Un-uniformity

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BackgroundBackground

Circuit analysis considering the effect of the light is strongly in demand.

� TFTs are constantly

under the influence of

the light.

� They are required to

maintain voltage for a

long time.

� The effect of photo-

leakage is significant.

�Issues for the display quality in LCDs (2)

Cross sectional view of a pixel

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BackgroundBackground

� Popular TFT device model

� Accurately expresses TFT

device characteristics

An equivalent circuit for RPI model

B. Iniguez et al. Unied model for short-channel poly-si tfts. Solid-StateElectronics, 43:1821-1831, 1999.

�Device model for TFT

Rensselaer Polytechnic Institute (RPI) model

Ways to include an optical response

� Modify a proven device model

models provided by EDA venders are not opened for

modification

� Develop an original device model

takes too much time!!

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BackgroundBackground

� Popular TFT device model

� Accurately expresses TFT

device characteristics

An equivalent circuit for RPI model

B. Iniguez et al. Unied model for short-channel poly-si tfts. Solid-StateElectronics, 43:1821-1831, 1999.

�Device model for TFT

Rensselaer Polytechnic Institute (RPI) model

Ways to include an optical response

� Modify a proven device model

models provided by EDA venders are not opened for

modification

� Develop an original device model

takes too much time!!

Use Verilog-A to model ONLY

an optical response of TFT

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Model

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ModelModel

�Proposed method

Photo-leakage current needs to be modeled as independent of characteristics calculated by the RPI model

Connect photo-current module as

an EXTERNAL instance of the RPI model

Transistor model and

Photo-Current Module are

connected in parallel.

Condition to be met

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ModelModel

① Inside the depletion

region.

� Carriers separated by

the field.

Drift component.

� Not in the RPI model.

� Empirically known to

be dominant.

�Two generation paths of photo-carriers

② Outside edge of the

depletion region.

� Originated from the

diffusion.

Diffusion component.

� Empirically known to

be less dominant.

Ec

EvEf

Ec

EvEf

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ModelModel

① Inside the depletion

region.

� Carriers separated by

the field.

Drift component.

� Not in the RPI model.

� Empirically known to

be dominant.

② Outside edge of the

depletion region.

� Originated from

diffusion.

Diffusion component.

� Empirically known to

be less dominant.

Can be ignoredNeed to be considered

Photo-leakage current is assumed as

an independent current of the RPI

�Two generation paths of photo-carriers

IGNORED

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ModelModel

� Photo-generation rate G (s-1cm-3)

� Photo-leakage current in the

depletion region Iphoto (A)

ναh

PG in=

GwlqtI depSiphoto =

( )( )da

dsbidaSidep

NqN

VNNl

++=

φε2

�Generation inside the depletion region

( ) ( ) ( ) ( )

∫ ∫Φ=−max

min

0,

,,λ

λ

λαλλλα dexxxG

x

dxx

assumptions…

P N

ldep

Ec

EvEf

C. Amano et al., Fabrication and numerical analysis of algaas/gaas tandem solar

cells with tunnel interconnections. IEEE Trans. Electron Devices, 36:1026-1035, 1989.

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ModelModel

( )dsphotophoto VII mod

2tanh

modα=

Convergence is greatly improved by introducing tanh

�Convergence issues

tanh2(αmod x Vds)

When Vds is 0 V,

Ids should be 0 A.

SPICE is based on Ohm’s Law

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Coding in Coding in VerilogVerilog--AA

�Excerption of the code

Iphotos d

iphoto

V(d,s)

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Model Evaluation

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Model EvaluationModel Evaluation

4.40 %3.11 %9.43 %Intensity 2

5.33 %5.68 %1.23 %Intensity 1

Avg. ErrorTFT 2TFT 1Intensity

Good agreement with the experiment data

�Validity

(1) TFT 1 (2) TFT 2

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Simulation runtime comparison

Model EvaluationModel Evaluation

�Simulation runtime� 1001 pixels in series.

� Tran. analysis of 40 msec.

Only 1.06 times more simulation runtime is consumed

Built-in Model w/ photo-current module

Built-in Model

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Application

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ApplicationApplication

M. Watanabe et al. Macro-modeling of liquid crystal cell with veriloga. Proceedings of the 2007 IEEE International Behavioral Modeling and Simulation Workshop, pages 132-137, 2007.

Schematic diagram of LCD panel A typical pixel circuit of LCD

Photo-leakage current model and liquid crystal model described in Verilog-A are used

�Application to the LCD design

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ApplicationApplication

M. Watanabe et al. Macro-modeling of liquid crystal cell with veriloga. Proceedings of the 2007 IEEE International Behavioral Modeling and Simulation Workshop, pages 132-137, 2007.

Schematic diagram of LCD panel A typical pixel circuit of LCD

Photo-leakage current model and liquid crystal model described in Verilog-A are used

�Application to the LCD design

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Transient characteristics of Vpix Transmittance curve

ApplicationApplication

Following optimizations should be applied

during LCD design processes

1. Vcom optimization 2. Csc optimization

positive

frame time

negative

frame time

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ApplicationApplication

�Optimization 1: Vcom

Designers can estimate the optimal Vcom for

supposed light intensities

Vcom should be ~-0.35 V

� Flicker level increases with

light exposure.

� Optimal Vcom shifts with light

intensities.

� Failure to optimize Vcom may

lead to flicker image.

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ApplicationApplication

�Optimization 2: Csc

Designers can estimate the optimal Csc for

supposed light intensities with given specification

� As Csc is increased

flicker level is

decreased

BUT…

less aperture ratio

hard to accumulate

the charge during switch-

on timeChoose max Csc that fulfills customer's specification

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Conclusion

�Realized accurate and fast simulation

considering optical illumination.

�Enabled detection of possible

malfunctioning in the LCD property during

designing process.

�Verilog-A is suitable for this plug-in

approach modeling.

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Thank you

for your attention