IMEKO XI

INSTRUMENTATION FOR THE 21ST CENTURY

Proceedings of the 11th Triennial World Congress of the International Measurementation Confederation (IMEKO)

Houston, Texas, USA 16-21 October, 1988

METROLOGY

Other IMEKO XI volumes available:

PLENARIES, INVITED PAPERS, COMPUTERS, AND INTELLIGENT SYSTEMS

SENSORS APPLICATIONS THEORY, SIMULATIONS, CALIBRATION, TESTING, EDUCATION

TABLE OF CONTENTS

Metrology

SESSION: OPTICAL METROLOGY Chairman: R. A. Belz (UNITED STATES)

88-C1 TO ESTABLISH A LAMBDA/100 OPTICAL FLATNESS STANDARD Yao Hang Chen, Lin Xiang Zho, Wei Gui Cao, and Chen Ye Li, National Institute of Metrology (CHINA) 1

88-C2 INVESTIGATIONS ON THE QUALITY OF OPTICAL GLASSES, PHOTO-ELASTIC MODULATORS, OPTICAL FIBERS, AND INTEGRATED OPTICS BY AN AUTOMATIC TRANSMISSION ELLIPSOMETER W. Holzapfel and U. Riss, Universität Kassel (WEST GERMANY) 7

88-C3 PARTICLE SIZE DETERMINATION THROUGH SMALL ANGLE LIGHT SCATTERING MEASUREMENT Janusz Mroczka, Technical University (POLAND) 33

88-C4 DIRECT MEASUREMENT OF AIR REFRACTIVE INDEX USING INTER-FEROMETRIC PHASE MEASURING TECHNIQUES WITH ZEEMAN-LASER Qui Huifu and Hou Wenmei, Beijing Management Institute of Machine Building Industry (CHINA) 43

88-C5 MICROINTERFEROMETER SYSTEM FOR MEASURING THE PRO­FILES OF FINE STRUCTURE Zhao-Fei Zhou, Chengdu University of Science and Technology, (PEOPLE'S REPUBLIC OF CHINA) 49

SESSION: ELECTROMAGNETIC METROLOGY Chairman: J. Weiler (SWITZERLAND) Co-Chairman: J. Век (POLAND)

88-C7 ELECTRONICALLY COMPENSATED VOLTAGE TRANSFORMERS M. D'Apuzzo, University of L'Aquila (ITALY), A. M. Luciano, Department of Electronic Engineering, Napoli (ITALY), and M. Savastano, Hybrid Computer Research Center (ITALY) 59

88-C8 MEASUREMENT OF THE PARAMETERS OF OBJECTS HAVING MULTIELEMENT EQUIVALENT CIRCUIT Vladimir Yu. Kneller and Leonid P. Borovskikh, USSR Academy of Sciences (SOVIET UNION) 67

88-C9 NEW TREND OF MEASUREMENTS FOR CHARACTERIZATION AND CONTROL OF ELECTRICAL MACHINES Gregorio Andria, Luigi Salvatore, Mario Savino, and Amerigo Trotta, University of Bari (ITALY) 75

88-C10 COMPUTER-AIDED LOCATION TECHNIQUE WITH ELECTRO­MAGNETIC SIGNALS FOR UNDERGROUND APPLICATIONS Norbert H. Nessler. University of Innsbruck (AUSTRIA) 95

SESSION: MANUFACTURING METROLOGY Chairman: T. Pfeifer (FEDERAL REPUBLIC OF GERMANY) Co-Chalrman: A. Blass (BRAZIL)

88-C11 NEW THREAD GEOMETRY MEASUREMENT SYSTEM WITH OPTO­ELECTRONIC SENSOR Hisatsugu Ishizu and Yoichi Tamura, Sumitomo Metal Industries, Ltd. (JAPAN) 105

88-C13 ULTRA-FAST HIGH-DEFINITION OPTOELECTRONIC GEOMETRY CHECKING Tilo Pfeifer and Martin Molitor, Technical University Aachen (FEDERAL REPUBLIC OF GERMANY) 119

88-C14 METROLOGY OF ROBOTS AND LARGE COORDINATE MEASURING MACHINES BY MEANS OF AXIAL AND OBLIQUE LASER INTERFERO­METER MEASUREMENTS Hans-H. Schussler, Daimler-Benz AG (FEDERAL REPUBLIC OF GERMANY) 131

88-C15 A COMPUTER BASED HOLOGRAPHIC INTERFEROMETRY TO ANALYZE 3-D SURFACES Cesar A. Sciammarella and M. A. Amadshahi, illinois Institute of Tech­nology (UNITED STATES) 149

88-C16 LINEWIDTH MEASURING INSTRUMENT FOR MICROPATTERNS LIKE VLSI Yoshihisa Tanimura and Kouji Toyoda, National Research Laboratory of Metrology (JAPAN) 159

SESSION: FORCE STANDARDS AND CALIBRATION Chairman: M. Peters (FEDERAL REPUBLIC OF GERMANY) Co-Chalrman: R. A. Mitchell (UNITED STATES)

88-C17 THE MEASUREMENT OF PARASITIC COMPONENTS TO IMPROVE NATIONAL FORCE STANDARDS С Ferrero, С Marinari, and E. Martino, Instituto di Metrologie "G. Colonnetti" (ITALY) 173

88-C18 COMPARATOR FOR MASSES UP TO 5 METRIC TONS Andre Gösset, Laboratoire National D'Essais (FRANCE) 191

88-C19 AN ADVANCED METHOD FOR THE CALIBRATION OF WEIGHBRIDGE AND RELATED SYSTEMS T. Preusser, Carl Schenck AG (FEDERAL REPUBLIC OF GERMANY) and W. Weiler, Physikalisch-Technische Bundesanstalt (FEDERAL REPUBLIC OF GERMANY) 199

88-C20 A NEW DIRECT CURRENT PHOTOELECTRIC COMPARATOR AT NIM Zhao Qi and Yuan Zundong, National Institute of Metrology (CHINA) 209

88-C21 REAL-TIME DEFECTS CLASSIFIERS IN EDDY CURRENT NDT SYSTEMS Tadeusz Stepinski, Uppsala University (SWEDEN) 217

SESSION: STANDARDS AND CALIBRATION Chairman: K. Izuka (JAPAN) Co-Chalrman: A. F. Rashed (EGYPT)

88-C22 APPLICATION OF THE LEAST SQUARES METHOD TO THE INTER-FEROMETRIC MEASUREMENTS OF GAUGE BLOCKS Jose Catalan, Sistema de Calibracion Industrial (SPAIN) 225

88-C23 DIGITAL EQUIPMENT FOR THE CALIBRATION OF CURRENT AND VOLTAGE TRANSFORMERS F. Cennamo, A. Baccigalupi, and С Landi. University of Naples (ITALY).. 239

88-C24 A NEW PRIMARY STANDARD MANOMETER Sheng Yi-tang, Han Hui-wen, Guo Chun-shan, Duan Ming-bo, and Xu Ying-zu, National Institute of Metrology (CHINA) 247

88-C25 DEFINITION OF A NEW HARDNESS VALUE W. Weiler, Physikalisch-Technische Bundesanstalt (FEDERAL REPUBLIC OF GERMANY) 253

88-C26 THE NBS ULTRASONIC INTERFEROMETER MANOMETER AND STUDIES OF GAS-OPERATED PISTON GAGES С R. Tilford and R. W. Hyland, National Bureau of Standards (UNITED STATES) 259 [U.S. Government - All Rights Reserved]

METROLOGY

SESSION: OPTICAL METROLOGY

88-C30 A SIMPLIFIED LASER GAUGE INTERFEROMETER FOR ON-LINE USE Tomohiko Akuta, Masamitsu Naito, Keiji Yamauchi, and Shinichi Okamoto, Toyota Technological Institute (JAPAN) 273

88-C31 THE USE OF SELF-CALIBRATION METHOD TO INCREASE ACCU­RACY IN 3-D HOLOGRAPHIC INTERFEROMETRY MEASUREMENT Armando Albertazzi G. Jr. and Carlos A. Schneider, Federal University of Santa Catarina (BRAZIL) 281

88-C32 DIFFERENCE HOLOGRAPHIC INTERFEROMETRY (DHI) FOR COM­PARISON Zoltan Fuzessy and Ferenc Gyimesi, Technical University Budapest (HUNGARY) 291

88-C36 HIGH ACCURACY FORCE MEASURING LASER TRANSDUCER W. Holzapfel and W. Settgast, Universität Kassel (WEST GERMANY) 299

88-C37 HIGH-ACCURACY DETERMINATION OF VERTEX POWER Ernst W. Sutter, Physikalisch-Technische Bundesanstalt (GERMANY) 315

88-C38 ANALYSIS OF THE ACCURACY OF PHOTOELECTRIC TRACING REFRACTOMETERS BASED ON TOTAL INTERNAL REFLECTION Jan Szukalski, COBRABiD (POLAND) 329

88-C39 SOME POSSIBILITIES OF DEVELOPMENT OF DIFFRACTION MEAS­UREMENTS OF SMALL SLOTS Warsza Z. L., Warszawa and Higher Technical School of Engineering (POLAND), and Wiecek Т., University of Technology (POLAND) 343

88-C41 THE RESEARCH OF AN ON-LINE MEASURING METHOD BY LASER FOR TWO-DIMENSIONAL REGULAR SIZES Ye Shenghua and Wang Xiangjun, Tianjin University (CHINA) 355

SESSION: ELECTRICAL MEASUREMENTS

88-C43 RESULTS OF THE USE OF AN AUTOMATED ELECTRICAL MEAS­URING INSTRUMENT CALIBRATION SYSTEM Pierre Barbier, Aerospatiale (FRANCE) 365

88-C45 CALIBRATION OF FIBRE OPTICAL POWER METERS AT THE SWEDISH NATIONAL LABORATORY FOR OPTICAL RADIOMETRY Leif Liedquist, Swedish National Testing Institute (SWEDEN) 371

88-C46 INCREASING THE ACCURACY OF ELECTRONIC SCALES WITH HEAT PIPES Mesko Arpad, Metripond Scale Factory (HUNGARY) 381

88-C47 A NEW TYPE OF HIGH-PRECISION LOAD-CARRYING TWO-STAGE VOLTAGE TRANSFORMER AND INDUCTIVE DIVIDER Shi-Xiong Peng, Beijing Electric Power Research Institute (PEOPLE'S REPUBLIC OF CHINA) 399

88-C49 MODERN TIME DIVISION MULTIPLIERS WITH CONSTANT AND VARIABLE COMPARATOR LEVEL Marek M. Stabrowski, Warsaw University of Technology (POLAND) 413

88-C50 MEASURING A SATURATING SYSTEM USING A RATIONAL VOLTERRA REPRESENTATION Eli Van den Eijinde, Johan Schoukens, and Jean Renneboog, Free University Brussels (BELGIUM) 427

88-C51 DESIGN CRITERIA FOR SIGNATURE REGISTERS WITH HIGH ERROR DETECTING CAPABILITIES Bernhard G. Zagar and Harald Weiss, Technical University Graz (AUSTRIA) 435

88-C55 ELECTRONIC BURDEN FOR CURRENT TRANSFORMER CALIBRATION Istvan Zoltan, Technical University of Budapest (HUNGARY) 441

SESSION: SURFACE METROLOGY

88-C57 QUALITY CONTROL OF METALLIC SURFACES BY MEANS OF DIGI­TAL IMAGE PROCESSING Hans Braun, Universität (TH) Karslruhe (FEDERAL REPUBLIC OF GERMANY) 445

88-C58 A PROPOSAL OF A METHOD FOR GAUGING OF CALIBRATION SPECIMENS FOR USE WITH STYLUS INSTRUMENTS APPLIED IN THE MEASUREMENT OF SURFACE TEXTURE Federico F. Dusman and Sanjin F. Mahovic, University of Zagreb (YUGOSLAVIA) 455

88-C59 QUALITY OF HEMISPHERICAL SURFACES PRODUCED BY ЕСТ S. M. El-Fayoumi, Alexandria University (EGYPT) 461

88-C60 THREE-DIMENSIONAL STUDY OF SURFACE TEXTURE A. F. Rashed and H. M. N. Falemban, King Abdulaziz University (SAUDI ARABIA), and M. G. El-Sherbiny, University of Egypt (EGYPT) 473

Author Index 491