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  • The Institute of Electrical and Electronics Engineers, Inc.345 East 47th Street, New York, NY 10017-2394, USA

    Copyright 1998 by the Institute of Electrical and Electronics Engineers, Inc.All rights reserved. Published 1998. Printed in the United States of America.

    ISBN 1-55937-962-6

    No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher.

    IEEE Std 299-1997

    (Revision of IEEE Std 299-1991)

    IEEE Standard Method for Measuring the Effectiveness of Electromagnetic Shielding Enclosures

    Sponsor

    Standards Committeeof theIEEE Electromagnetic Compatibility Society

    Approved 9 December 1997

    IEEE Standards Board

    Abstract:

    Uniform measurement procedures and techniques are provided for determining the ef-fectiveness of electromagnetic shielding enclosures at frequencies from 9 kHz to 18 GHz (extend-able to 50 Hz and 100 GHz, respectively) for enclosures having no dimension less than 2.0 m. Thetypes of enclosures covered include, but are not limited to, single-shield or double-shield structuresof various construction, such as bolted demountable, welded, or integral with a building; and madeof materials such as steel plate, copper or aluminum sheet, screening, hardware cloth, metal foil,or shielding fabrics.

    Keywords:

    electromagnetic shielding, screened rooms, shielded enclosures, shielded rooms,shielding, shielding effectiveness

  • IEEE Standards

    documents are developed within the IEEE Societies and the Standards Coordinat-ing Committees of the IEEE Standards Board. Members of the committees serve voluntarily andwithout compensation. They are not necessarily members of the Institute. The standards developedwithin IEEE represent a consensus of the broad expertise on the subject within the Institute as wellas those activities outside of IEEE that have expressed an interest in participating in the develop-ment of the standard.

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    Note: Attention is called to the possibility that implementation of this standard mayrequire use of subject matter covered by patent rights. By publication of this standard,no position is taken with respect to the existence or validity of any patent rights inconnection therewith. The IEEE shall not be responsible for identifying patents forwhich a license may be required by an IEEE standard or for conducting inquiries intothe legal validity or scope of those patents that are brought to its attention.

  • Copyright 1998 IEEE. All rights reserved.

    iii

    Introduction

    (This introduction is not part of IEEE Std 299-1997, IEEE Standard Method for Measuring the Effectiveness of Electro-magnetic Shielding Enclosures.)

    This document provides a standard set of methods and procedures for determining the shielding effective-ness of shielding enclosures. The enclosures of concern include those used for testing groups of equipment,vehicles, computing systems, and smaller units whose electromagnetic emission and susceptibility requiredetermination without disturbance from other sources. MIL-STD 285 was the common reference for manyyears, but the applicability of that document lessened with the advent of technological changes. Further,restructuring within U.S. Government policies and procedures has resulted in an emphasis on the use ofcommercial standards and the

    discontinuance of documents such as MIL-STD 285.

    The basic premise ofMIL-STD 285 is still in positionthe shield effect is to provide an insertion loss to outside inuence. Thisstandard offers testing based upon the performance specications of the shield, rather than a xed set ofparameters that may not be applicable to the shield in question. Specic test procedures and frequencyranges are then selected as needed.

    The detailed concepts and efforts of the previous working groups

    must be recognized and acknowledged.Edwin Bronaugh, James Klouda, and Richard Schulz have served as unifying factors, in that they contrib-uted to the

    original document and subsequent revisions

    .

    Special mention must be made of the work done byNorman Wehling, William Croisant, Jr., and Frederick Eriksen in testing and evaluating key concepts in thelow and resonant ranges. Acknowledgment must also be made of the efforts of Dr. Eriksen, who served asboth Secretary and Technical Writer for most of the latter period of this working groups existence. All con-tributions by the members are gratefully acknowledged.

    The working group that developed this revision ofthe standard had the following membership:

    Dale G. Svetanoff,

    Chair

    (July, 1995, to present)

    Richard B. Schulz,

    Chair

    (1990 to July, 1995)

    The following persons were on the balloting committee:

    Robert BonsenEdwin BronaughPaul CookWilliam Croisant, Jr.Frederick Eriksen

    William GetsonRobert HarrimanMichael HateldD. Mark JohnsonJames Klouda

    Michael LahitaMichael McInerneyDennis WardNorman WehlingJohn Wyncott

    Stephen BergerJohn BlazeEdwin L. BronaughJoseph E. ButlerHugh W. DennyAndrew DrozdDiethard HansenDonald N. HeirmanLothar O. Hoeft

    Daniel D. HoolihanDavid InmanJohn G. KraemerFerdy MayerWilliam McGinnisHerbert MertelDheena MoongilianJohn D. OsburnJose PeriniJ. H. Pluck

    James PressT. J. RitenourFrank RoseRisaburo SatoRalph M. ShowersDale SvetanoffDonald L. SweeneyDavid L. TraverRobert Yff

  • iv

    Copyright 1998 IEEE. All rights reserved.

    When the IEEE Standards Board approved this standard on 9 December 1997, it had the followingmembership:

    Donald C. Loughry,

    Chair

    Richard J. Holleman,

    Vice Chair

    Andrew G. Salem,

    Secretary

    *Member Emeritus

    Also included are the following nonvoting IEEE Standards Board liaisons:

    Satish K. AggarwalAlan H. Cookson

    Kristin M. Dittmann

    IEEE Standards Project Editor

    Clyde R. CampStephen L. DiamondHarold E. EpsteinDonald C. FleckensteinJay Forster*Thomas F. GarrityDonald N. HeirmanJim IsaakBen C. Johnson

    Lowell JohnsonRobert KennellyE. G. Al KienerJoseph L. Koepnger*Stephen R. LambertLawrence V. McCallL. Bruce McClungMarco W. Migliaro

    Louis-Franois PauGerald H. PetersonJohn W. PopeJose R. RamosRonald H. ReimerIngo RschJohn S. RyanChee Kiow TanHoward L. Wolfman

  • Copyright 1998 IEEE. All rights reserved.

    v

    Contents

    1. Overview.............................................................................................................................................. 1

    1.1 Scope............................................................................................................................................ 11.2 Purpose......................................................................................................................................... 11.3 Application................................................................................................................................... 1

    2. References............................................................................................................................................ 2

    3. Definitions...........................................................................................