ICP Test Report Certification Packet/media/files/littelfuse/technical... · 25/07/2011 · 1 ICP...
Transcript of ICP Test Report Certification Packet/media/files/littelfuse/technical... · 25/07/2011 · 1 ICP...
1
ICP Test Report Certification Packet
Company name : Littelfuse, Inc.
Product Series: TVS Diode – Low Capacitance
Product #: SP03-3.3 Series
Issue Date: July 25, 2011
It is hereby certified by Littelfuse, Inc. that there is neither RoHS (EU Directive
2002/95/EC)-restricted substance nor such use, for materials to be used for unit parts, for
packing/packaging materials, and for additives and the like in the manufacturing processes.
In addition, it is hereby reported to you that the parts and sub-materials, the materials to be used
for unit parts, the packing/packaging materials, and the additives and the like in the manufacturing
processes, are all composed of the following components.
Issued by:
<Global EHS Engineer>
(1) Parts, sub-materials and unit parts
This document covers the TVS Diode Low Capacitance RoHS-Compliant series products
manufactured by Littelfuse, Inc.
< Raw Materials Used
Please see Table 1
(2) The ICP data on all measurable substances
Please see appropriate pages as identifed in Table 1
Remarks:.
Form 585-047 Rev. A 2/21/06
2
Table 1: List of Raw Materials covered by this report
Total Parts Raw Material Part Number Raw Material Description Page(s)
1 NA Wafer 3-9
2 A194 Leadframe 10-20
3 NA Gold Wire 21-25
4 2815A Adhesive 26-30
5 GE-1030 Epoxy Molding Compound 31-36
6 NA Tin Plating 37-42
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: ; l ' ! *E l / D i b ronod i ph . .y l e th€ . 5
:r*Si tEI / Tr ib .oqodiphely l € th€r 5
q; l t : r f i / Tetrabronodiphenyl 5
nt t#*Et / Penlabrohodipncnyr 5
iAdXS / Hexabromod i phenyl 5
*A#XS / lep tab .onod ipheny l 5
, \ .4f l t t$ / ocrabrosodiphenyl
ntt#+Et / Nonabronodi phenyl
+*t*S / Decabronodi phenyl
iii. i;.fi.;' i: ::iA bi_d;d.t;t;r;,:;io iii d;i{ t;id,;: d i;i. i'd.d;*i";i :'*' "d"
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3 . MDL = Method Detecr iod L iE i t ( r i i l l x i in&. la )
4 . ' - , - Not R€su lared (d&{ , * i i )
5 . S p o t - t e s t :
t i€aarive : Absen.e of cr(vr) coat ins / surfa." taye.(r{ .r+dx, lTr{^frs),P o s i r i v e = P r € s e n c e o f c r ( v r ) c o a t i n s / s u r f a " € l a y € r ( & , r + d 4 n l f t * ) rT h e ! € s t e d s a n p t € s h o ! 1 d b e f u r t n e . v e r j f i e d b y b o i l i n g , r a t e r - e x r . a c r i o n n e r h o d i i t h es p o t t e s t r e s u l t c a n n o t b e c o n f i r n e d .(* l* i4 'F*t i4l&r+,, ! tA4sqr*Aboi I i "s, .ater-exr.a.t ionait7 ' j t i t - f * t t )
B o i I i n s - w a r € r - e r ! . a c t i o n :r i e a a r i v e : A b s e n c e o f c . ( v r ) . o a t i n c /
" , . f " " . 1 . y . . ( l { a f . d , t , l T t ! ^ 1 l s ) ,
Posi r ive : Presencc of cr (vr) coat ins / sur fa.e I ay" . ( r t ,? t . ta , ! l t , l ̂ l lJ* ) Ii h e d c t e c r € d c . n . . n t r , t i o n i n b o i l i n s - w a t e r - e x r r a c t i o n s o l u t i o n i s e q t r a 1 o .gr€ater than 0.02 ns lks wi tn 50 cn ' sample srr face area.t i8) tx , {>0.02 ns lks v i rh 50 cn? (sa,p l " sur fa.e area)
6 . # - P o s i t i r e i n d j c a t e s t h e p r € s e n . e o l C . ( V l ) o n r h e t e s t e d a r e a s a r d r e s ! l r 6 e . e s a r d € das not conply r i th RoHs req! i fenenr. (Pos i t j v€ i+ j t l i { E}4.a i , f lJ*2. {+.*RoHs**. )
Negat ive indicates t le absence of cr (Vl ) on th€ test€d a. .as and resul t be r€sardedas .onply v i rh RoHs req! i renenr. (Negzr iv€ i iX, l g ,E&anf i rar+6Ross** . )
PFCS+r l t iL(R.r . r .n . . In lorpat ion) : J l+ 2006/122lEC (Di f€. t i r€ 2006/r22lpc)( r ) lr#f 4T,Eiif i'rs-L{.{in ;+4+*rl{{.Iei'&r}tt:1,{+,i!d.^,i!0.005%.
(Vay no t be p l aced on t he ma .k€ t o . used as a subs tance o f cons t i t uen t o r p repa ra t rons i n a
. o n c e n t r a t i o n e q u a l r o o r h i g h e . r h a n 0 . 0 0 5 % b y f r a s s , )(2) tt#,F 4q l l^fi 4-L."+&&{Ssn *4r4 r f i#e&}0ifi}t 4apFosJ.49{l**}a.frr€*&}i+S
PFosi*,lE+;+d,ntao. r%, rorr{"ci.*.E,llL&f , t! RProsatll4tfr f +i++*"^,ttlug/.'.( M a y n o t b e p l a . e d o n t h € f r a r k e t i n s e n i - f i n i s h € d p r o d u c t s o r a r t i . l e s . o r p a r t s t h e r e o l , i f t h e
c o n c e n r . a t i o . o l P F O S i s e q u a l t o o r h i g L e r t h a n 0 . 1 % b y n a s s . a l . u l a t e d { i t h r e f € r e ! c e t o t h e
n a s s o f s t . u c t u . a l l y o . n i c r o s t . u c t u r a l l y d i s r i n c t p a . t s t h a t c o . r a i . P F o s o r . f o r i e x r i l e s o . o t h e .
c o a t e d n a ! e . i a l s , i f t h € a n o u n t o f P F I S ' s e q u a l t o o r h i s h € r r h a n I U s / n ' z o f r h e c o a t e d n a ! e r i a l , )
Test Report * 4 ( N . . ) : K A l 2 o r r l r o r l 3E J q l ( D a r e ) , 2 o r 1 l 0 1 / 1 0F * . ( P a s e ) : 6 o t t t
ASM H( & ASN TECHNOLOGY SIN6IIOBE
,I/F, {ATSON CET'IRE, 16 (UNG IIP ST., (S.{I CIUNG. I{ONC rONG (ASM lfi), 2 YISHI,NAVE\]JE 7, SiNCAPORE (ASV TECIINOI-oCY SINGAMRE)
|l [tt]||lrrrtll
1) ilill4Tn ji,Ala&?t *.sae,+A*.( -flrrrlllrtlt*rt ) /Th€s€ samples Ere dksolwd roraly byp€ondittontng m6thod a@ding lo bdN nd chart. ( c.& 166r m.thod exdud€d )
2) jt{,Al : #&r+ / Nm6 otthe p€6on uho made me6uEmenrAtex chano
trAfiI / ssple M.r6ri.l tfiLl*trI / Diq6lin Acidf , . f , ,3 , 14 1 -*, gl rl ttl. trtr( /
{l / d"". El.lll / HNoTHFa, A, Q,, nA t
*|l, tir<, *t, tr /
l-\Efll=t+iltr /
; .h(bhhaoit t r""y r t"c*p
ch.rg. of mesu@dt Ray Chsng
tf.. !n*e / cunins .PBpa6ilon
,|i4&.Cil /s3mpl6MoeuMed
&l+ t Fl 1ls rti ( 6n {il trra4tittE (rsTitnt )/Aod diqGlion by.'i€blo aclddep.nded on dit Er{ smd. nabnal (53
d*/lrt/!.lt.jS&{11Mim@e dig*tid eith
6,Att"3.ttt+*#i,*t / tcP-AEs
n * , t \ , - T a . L h 1 l tt t l1sa*E' 540nm $4144 / l1E3u6lh6 .bedb.ne €t tto
Test Report l E € ( N o . ) , r A / 2 0 1 1 / r o r 1 3 A j h ( D a t . ) : 2 0 l l l o r / 1 0 F : k ( p a s e )
ll[rl|t[]ttttlASM H( & ASV TECI{NOLOCY SI\GAPORE
1/F, WATSON CENTRE. T6 (WG YIP ST.. I{IAI CHUNG, IIONC (OIiG (ASM H(), 2 YISqUNAVEI'UE 7, SINGAPORE (AS]V TECHNOLOCY SINGAPORE)
t *d*rt **tS +{fi,8f I PBB/PBDE anatyticat FLOW CHART1)tlrq^t : f,*4 / Name ofthe person who made measurcment Anson Tsao2), & fr l,/. : 4,1€+ / Name of the person in charge of measurement Ray Chang
jin )NA.l',34- / Firsl iesting process -------)
4f Jt4 &tr + / Oplionar screen process .--..-.-
&i1fl,S / Confimalion process -.->
Sample / tle
Screen anallsis / ?, g rIfi
Sample extraction *"9 +tFJSoxhlet method * *,+R.i4
Concenlrate/Dilutre Extracted solution+eFxB/{itr
iFilter +qx,*ia&
Analysis by GC/MSfti€,ttr{*d.}ff
t
Sample prelreatment / ll&itEI!
s 4 ( N o . ) : K A / 2 0 r 1 l r 0 1 1 3 e S ( D a t e ) : 2 t ) 7 r / o r / r o F j h . ( p a s € ) : s o f l tTest ReportASM HI( & ASU TECHNOLOGY SIN6.{PORE
1/F, INTSON CENTIO, 16 I{UNC YIP ST., (q'AI CIIUNG, HONC I(O\G (ASM H(), ? YISHIJNAVENIJE 7, SINGAPORE (ASII TECIINOLOCY SINGTPORE)
1) ,E{ t rT6l* ,Ana{*++ ' * .J ,gU 444. / rh€se sanples 'e .e d issoLved rota yby p re - cond i t i on i na ne thod acco .d i ng 1o be low f t op cha r i .
2) jrlit^'l : ftl4lE / Nabe of the p€lson '!o nadc heasureneir: A1€x Chary3) l l l i { f i l , \ : t i . l6* / NaEe of the pc 'so ' in chafce ot E€asurenent : Ray chana
i,f r,( rcP-AEs +fi.6ifr{tfr,*n(F lox Char l o f d isest ion for the e le&eats ara lys is per fo i ied by I@-AXS)
f ; . f ; . r 8 , 4 € s r " e r , c o p p . r , a l u D i n u d , . o r d q , f- +., rA dt, { *, q. n&, ! 5,,1.- /Aquz regia, Hl:O,, ]{cl, ll!, UON
4&, i.fi.lt / lxio./Is6 , S , g , F i / c o l d . p r , , ' i u r . p a r r a d , u m . c e , d i .
* dtl / I$lo,
! 6 / P l a d t i c Ilaf ,!i.,j<.,4*, t* / H,so,. Il'o. llltD,. Irl, " ^ { . *11&EZts , * / any a . id ro to ta l d ig .s t ion
g $ ' g t i & e / c u t t i n g ' p r e p a r a t i o n
tr {&#gt / sarDr e Meas!rene. t
Xh{4l3l l*.S,titf frtria*itdigtir{rL (t'T i,t + ) / Acid disesr ion bys u i l . b l e a c i d d € p e n d e d o n d i l f e r e n r s a n p L € n a t € r i a l ( a s b e l o ' t a b l e )
i&* / F i l t ra t ion
* iA / Res id .e
1) a i * t l i ! / a lkar i Fus ion
2) t&88 / i {c l ro d isso lve
6&ri+€{,4 +*41 Jbr}.* / IcP-AEs
Test Report
,l/F, WATSON CENTT!,AVENUE ?, SINGAPORE
I t4(N". ) , K,1/2otr l rort3S J q ( D , t e ) , 2 0 l t / 0 r l 1 0 F j k ( p a s € ) : e o r r r
llfllt tlrtllltASM HI( & ASV TECINOT,OGY SI\GAMRE
]6 (UNG YIP ST., {CJAI CI&NC, IIONG I{ONG (ASM II(), 2 YISL]TJN(ASII TECHNOLOCI SINGAPORE)
an+*(*y +t *841466g1 7Analytical flor!, chart of PFOA/PFOS content
1)i4li{,,\ q : * +4 / Nam€ of the person who made moasurement Anson Tsao
2)iii it A *,\ : #.16* / NamE of the p€rson in charge of measurement: Ray Chang
*n +a;!+F{t+tt} us EPA 3s40) /
Sample exLaclion by Soxhlot extraction(Reference method US EPA 3540)
+*rtfsr*i;t* /Concentrate/Dilute Extr€cted 6otution
,^ ;L+e & ft f *6.+ )fr 4 wi*. IAnal)6is was performed by LC/MS
iFTest Report ! t 4 ( N o . ) ' ( A / 2 0 1 1 / r 0 r t 3 E S ( D a t e ) : 2 0 r l l o r / r o F : k ( p a s e )
ASii H( L ASV TECHNOI-oCY SINGAPORE
1/F, WATSON CENTR!, 16 KUNG YIP ST., KIAI CHUNG, ITONC lior{c (ASM t{r(), 2 yIsLrr,NNVENIJE 7, SINGAPOTE (ASII TFCINiOLOCY SINGAFOTT)
i *+ff'*,*f / Analt'ticalflow chart of hatogen cont€nt
1) tl a{,,\ q : t* t i/ Name of the person who made measurement Jean Hung2) ;ri S,A l' , : ft .16*/ Name of the person in char,ge of measurement Ray Chang
lll ltl| ltttI|
fr+tffi$hffi |Analysis was performed by lC
&Rfiffi&**-fi /Sample picture and report numb€r
&fl;ftE/t& /Sample prslrealrnenuseparalion
*rEr6&ff&^tfffl+ /WEighting and putting sample in cetl
nt *4lt/&r&Oxyg€n Bomb Combustion / Absorption
ftlcEEit /Dilulion to fixed volume
I t * (No.) : I ( .4 /20rr l10r13 E&(Dare) : ? 0 1 1 / 0 r / r 0 F I R ( P a s e ) : r r o f 1 1Test ReportASM HI( & ASV TECI{NOINCY SIIiGAMRE
tlItl|aIltttll
4/F. X'ATSON CENTR! 6 (UNG YIP ST.. (SAI CK'NG. HONC RONG (ASM lfi). 2 YISHUNA!TI\rIJE ?, SINCAmRE (ASM TECHNOLOGI SINc,{mR!)
. - * t+JE.€,(End of ieporr) 1.
i | ' e 5 d o , r r
nown
ith scs
Test Report No. : C92010/83213 Dale:2010111h9 Page :1o f 5
HENKEL CORPORATTON ||l ||t||l||tttttlHENKEL ADHESIVE€-ELECTRONICS lrAlN OFFICE: 14000 JAMBOREE ROAD, lRVINE,CALTFORNTA, 92606 U.S.A
The following sample(s) was/were submitted and identified by/on behalfofthe client as :
Sample DescriptionStyldltem No.Sample Receivjng DateTesting Period
ADHESIVE2815A20lU11t162010t 1 1 t16 rO 2010t 1 1 t19
In accordance with the RoHS Directive 2002/95/Ec, and its amendmentdirectives.
With referenc€ to IEC 62321 : 2008Proc€dures forthe Determination of Levels of Regulated Substances inElectrotechnical Products.
(1) Determination of Cadmium by ICP-AES.(2) Determination of Lead by ICP-AES.(3) Determination of lrercury by ICP-AES.(4) Detednination of Hexavalent Chromium by UV y'is Spectrometry.(5) Detemination of PBB and PBDE by Gc/Ms.
Please refer to next page(s).
Tegt Requ€sted
Test Method
Test Result(s)
comoa i v r i , , r j r , l . , r , r ' 1 l ! r + l r ! ; ] ' i j r i t j ^ . 1 1 . , ! 11 r r : j i i l : ' i : : r j l t 4 ! 'ThsdOfumslsss6by1h€company!bjedb]b6e.alcod!oisolseMe''nt.dov.le't6!a|ableoneq
L l { i i i r t : I + * , ; ' } e6 {d : ) r !
For QuesliPlease Co
ggn d far and
ch.||tlcd lrboi.b.y - TdFl
$sbs dh ! r c c o l p ( t c t sA )
Test Report No. : CE2010/83213Date'.201U11119 Page r2o fs
HENKEL CORPORATIONHENKEL ADHESIVES-ELECTRONICS lrAlN OFFICET 14000 JAMBOREE ROAO, tRVtNE,CALIFORNIA, 92606 U.S.A
||l lltlll||lttllt
Test results bv chemical method {Unit
T.at ltem (s): lrothod(Refe. to)
ResultI/|DL
No.1Cadmium (Cd) (1 ) n.o. 2Lead (Pb) l2l n.d. 2Mercury (Hg) (3) n.o, 2Hexavalent Chromium Cr(Vl) by alkalineel:traction
l4') n.d. 2
Sum of PBB6
(5)
n.o,Monobromobiphenyl n_o. 5Dibromobiphenyl n_o.fribrcmobiphenyl n.d. 5Tetrabromobiph€nyt n.d.Pentabromobiphenyl n.d.Hexabromobiphenyl n.d.Heptebromobiphenyl n.d.Octabromobiphenyl n.d. 5Nonabromobiphenyl n.d.Decabromobiohenvl n.d.Sum of PBDEa n.d.Monobromodiphenyl ether n.d. 5Dibromodiphenyl ether n.d. 5Tribromodiphenyl ether n.o.Tetrabromodiphenyl ether n_0.Pentabromodiphenyl ether n,o,Hexabromodiphenyl ether n.d.Heptabromodiphenyl ether n.d. 5Octabromodiphenyl ethgr n.d.Nonabrcmodiphenyl ether n.d- 5Decabromodiohenvl ether n.d.
TEST PART DESCRIPTION:No.1 : SILVER COLORED PASTENote I
1. mg/kg = PPm; 0.1w{% = 1000PPm2. n.d. = Not Detected3. MDL = Method Deiection Limit4. "-" = Not Regulated
pe(s) 6bd rh s Gd €pod oi^d sc o n p . n y n i , j l r j t ' i , L n l + l , + 1 J t r ! n l r t i . 4 . . r l ] l i r r t l j t : : + . i { . d 1 ! .
HENKEL CORPOMTTON tl|l[[] [[tttnHENKEL ADHESIVES-ELECTRONICS MAIN OFFICE: 14000 JAMBOREE ROAD. lRVlNE.CALIFORNIA, 92606 U.S,A
1 )
2)3)
Test Report
Sample Material Digestion Acid
Sleel, copper, aluminum, solder Aqua regia, HNO3, HCl, HF, HrO,
Glass HNOJHF
Gold, platinum, palladium, ceramic Aqua regia
Silver HNO3
Plastic HrSO4 HrOr, HNq, HCI
Others Any acid to tolal digestion
No. : CEl201 0/832 1 3 Date : 2010/11/19 P a g e : 3 o f 5
These samples wsre dissolved totally by preronditioning method according to below flow chart( Cr& test method excluded )
Name of the person who made measurement: Climbgreat YangName of the pecon in charge of measurementr Troy Chang
conpayb , - : : 1 r : r ' u . - r i ' . i I r . , r ! r : r r " , i . ! j : . n rL l t i ! - l r ; ' r - + . r i i ; : i , l r ! ! !nyJ'adb]66eralcodiolso,seMepnn€dovg3ata!..b|oo^oq
L IL i , : t l i : * i r . i | ' r so l o7 ) re
Acid digestion by suiiable aciddeoended on different samolematerial {as below table)
Micro.rave digestion with
HNO3iHCtiFtFAdd appropriate amount of
dige6tion reagent
Heat to appropriate
temperature to extract
Cool, filter digestate
through filterAlkali FusionHClto dissolve
Add diphenyl-carbazide for
color development
measure the absorb€nce
at 540 nm by uV-VlS
HENKEL CORPORATIONHENKEL ADHESIVES-ELECTRONICS lrAlN OFFICE: 14000 JAMBOREE ROAD, tRVtNE,CALIFORNIA, 92606 U.S.A
Test Report
1) l.larE ofthe2) t{are ofthe
First testing process ----->
Optioml screen process ---.
Confirr€tion process - .>
No. : CE/2010/83213 Date : 2010/11/19 P a g e : 4 o f 5
PBB/PBDE analytical FLOW CHART
rllu |l][t ]t
person who fiEde reasurenEnt: RorEn Wongperson in cha€e of nEasurenEnt: Trcy Chang
Scr€on analysi6
Analysis by GC/MS
c o m r a i y ; i i r l : i ' r r ' r : i i ' ! : , r r i : " r ; , r , i L i r i . 1 1 1 l . r r r : l i i j . I . ! i : n r r , ' L
3 p o . $ b i | y 6 l d l s c e i l , n d l h A d r !
Sarple extraction/Soxhlet method
ConcentratdoiluteExtracted solution
' r r t i ! j 1 : 1 . !
TeSt RepOft No. : cE/2010/83213 Date: 2o1o/11/19P a g e : 5 o f 5
HENKEL CORPORATIONHENKEL ADHESIVES-ELECTRONICE MAIN OFFICE: 14000 JAMBOREE ROAD, lRVlNE,cALtFORNtA, 92606 U.S.A
lm[ttu]||itt]t
" End of Report "
i m s 3 1*r epd Gre, d.ry b @ enprec) ras€d rh 3 En .epdd 6iidr becompan r n r f r l l l l t L r i ' 1 . ^ l : l : i j i , r r * t i . l . 4 l t i r r l r i : r : r : r . i : r ! r ! r i ; l
I ; i i r . I i i :4 . l r ' ' s6 (or re
Men&dme<s6f@pi56s5Al
SGS Taiwan Ltd.台灣檢驗科技股份有限公司
No. 61, Kai-Fa Road, Nanzih Export Processing Zone , Kaohsiung, Taiwan / 高雄市楠梓加工出口區開發路61號
t + 886 (07)301 2121 f + 886 (07)3010867 www.tw.sgs.com
Member of the SGS Group
Unless otherwise stated the results shown in this test report refer only to the sample(s) tested. This test report cannot be reproduced, except in full, without prior written permission of the Company.除非另有說明,此報告結果僅對測試之樣品負責。本報告未經本公司書面許可,不可部分複製。This document is issued by the Company subject to its General Conditions of Service printed overleaf, available on request or accessible at www.sgs.com/terms_and_conditions.htm and, for electronic format documents, subject to Terms and Conditions for Electronic Documents at www.sgs.com/terms_e-document.htm. Attention is drawn to the limitation of liability, indemnification and jurisdiction issues defined therein. Any holder of this document is advised that information contained hereon reflects the Company’s findings at the time of its intervention only and within the limits of Client’s instructions, if any. The Company’s sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents. This document cannot be reproduced except in full, without prior written approval of the Company. Any unauthorized alteration, forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law.
Sample Description :
Style/Item No. :
Sample Receiving Date :
Testing Period :
============================================================================================
Test Requested :
Test Method :
(1)(2)(3)(4)
(5)
Test Result(s) :
Determination of Lead by ICP-AES.Determination of Mercury by ICP-AES.Determination of Hexavalent Chromium by UV/Vis Spectrometry.
Determination of PBB and PBDE by GC/MS.
Test Report
2010/11/02
*KA/2010/B0127*
No. : KA/2010/B0127 Date : 2010/11/05 Page : 1 of 6
NITTO DENKO (TAIWAN) CORPORATIONROOM N-712, NO. 96, CHUNG SHAN N. ROAD, SEC. 2, TAIPEI, TAIWAN
EPOXY MOLDING COMPOUNDGE-1030 SERIES
The following sample(s) was/were submitted and identified by/on behalf of the client as :
2010/11/02 TO 2010/11/05
In accordance with the RoHS Directive 2002/95/EC, and itsamendment directives.
With reference to IEC 62321: 2008Procedures for the Determination of Levels of Regulated Substances inElectrotechnical Products.
Determination of Cadmium by ICP-AES.
Please refer to next page(s).
SGS Taiwan Ltd.台灣檢驗科技股份有限公司
No. 61, Kai-Fa Road, Nanzih Export Processing Zone , Kaohsiung, Taiwan / 高雄市楠梓加工出口區開發路61號
t + 886 (07)301 2121 f + 886 (07)3010867 www.tw.sgs.com
Member of the SGS Group
Unless otherwise stated the results shown in this test report refer only to the sample(s) tested. This test report cannot be reproduced, except in full, without prior written permission of the Company.除非另有說明,此報告結果僅對測試之樣品負責。本報告未經本公司書面許可,不可部分複製。This document is issued by the Company subject to its General Conditions of Service printed overleaf, available on request or accessible at www.sgs.com/terms_and_conditions.htm and, for electronic format documents, subject to Terms and Conditions for Electronic Documents at www.sgs.com/terms_e-document.htm. Attention is drawn to the limitation of liability, indemnification and jurisdiction issues defined therein. Any holder of this document is advised that information contained hereon reflects the Company’s findings at the time of its intervention only and within the limits of Client’s instructions, if any. The Company’s sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents. This document cannot be reproduced except in full, without prior written approval of the Company. Any unauthorized alteration, forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law.
Result
No.1
n.d. 2n.d. 2n.d. 2n.d. 2
n.d. -n.d. 5n.d. 5n.d. 5n.d. 5n.d. 5n.d. 5n.d. 5n.d. 5n.d. 5n.d. 5n.d. -n.d. 5n.d. 5n.d. 5n.d. 5n.d. 5n.d. 5n.d. 5n.d. 5n.d. 5n.d. 5
Heptabromodiphenyl ether
Test Report No. : KA/2010/B0127 Date : 2010/11/05 Page : 2 of 6
NITTO DENKO (TAIWAN) CORPORATION *KA/2010/B0127*
ROOM N-712, NO. 96, CHUNG SHAN N. ROAD, SEC. 2, TAIPEI, TAIWAN
(5)
Test results by chemical method (Unit: mg/kg)
OctabromobiphenylNonabromobiphenyl
Sum of PBDEs
Octabromodiphenyl ether
NO.1 : BLACK EPOXY MOLDING COMPOUND
Mercury (Hg)Lead (Pb)
Heptabromobiphenyl
(3)(2)
(4)Hexavalent Chromium Cr(VI) by alkalineextractionSum of PBBs
Hexabromobiphenyl
Monobromobiphenyl
Monobromodiphenyl ether
Tetrabromobiphenyl
Dibromodiphenyl etherTribromodiphenyl ether
Method
(Refer to)MDL
(1)
Test Item (s):
Cadmium (Cd)
Hexabromodiphenyl ether
Dibromobiphenyl
Decabromobiphenyl
Pentabromobiphenyl
Pentabromodiphenyl ether
Tribromobiphenyl
Tetrabromodiphenyl ether
Nonabromodiphenyl etherDecabromodiphenyl ether
TEST PART DESCRIPTION:
SGS Taiwan Ltd.台灣檢驗科技股份有限公司
No. 61, Kai-Fa Road, Nanzih Export Processing Zone , Kaohsiung, Taiwan / 高雄市楠梓加工出口區開發路61號
t + 886 (07)301 2121 f + 886 (07)3010867 www.tw.sgs.com
Member of the SGS Group
Unless otherwise stated the results shown in this test report refer only to the sample(s) tested. This test report cannot be reproduced, except in full, without prior written permission of the Company.除非另有說明,此報告結果僅對測試之樣品負責。本報告未經本公司書面許可,不可部分複製。This document is issued by the Company subject to its General Conditions of Service printed overleaf, available on request or accessible at www.sgs.com/terms_and_conditions.htm and, for electronic format documents, subject to Terms and Conditions for Electronic Documents at www.sgs.com/terms_e-document.htm. Attention is drawn to the limitation of liability, indemnification and jurisdiction issues defined therein. Any holder of this document is advised that information contained hereon reflects the Company’s findings at the time of its intervention only and within the limits of Client’s instructions, if any. The Company’s sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents. This document cannot be reproduced except in full, without prior written approval of the Company. Any unauthorized alteration, forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law.
4. "-" = Not Regulated
Test Report No. : KA/2010/B0127 Date : 2010/11/05 Page : 3 of 6
7. This report supersedes all pervious documents bearing the test report number KA/200X/XXXXX.8. This is the additional test report of KA/200X/XXXXX which was issued on yyyy/mm/dd.
Please refer to KA/200X/XXXXX for original information.
Note: 1. mg/kg = ppm;0.1wt% = 1000ppm2. n.d. = Not Detected3. MDL = Method Detection Limit
NITTO DENKO (TAIWAN) CORPORATION *KA/2010/B0127*
ROOM N-712, NO. 96, CHUNG SHAN N. ROAD, SEC. 2, TAIPEI, TAIWAN
SGS Taiwan Ltd.台灣檢驗科技股份有限公司
No. 61, Kai-Fa Road, Nanzih Export Processing Zone , Kaohsiung, Taiwan / 高雄市楠梓加工出口區開發路61號
t + 886 (07)301 2121 f + 886 (07)3010867 www.tw.sgs.com
Member of the SGS Group
Unless otherwise stated the results shown in this test report refer only to the sample(s) tested. This test report cannot be reproduced, except in full, without prior written permission of the Company.除非另有說明,此報告結果僅對測試之樣品負責。本報告未經本公司書面許可,不可部分複製。This document is issued by the Company subject to its General Conditions of Service printed overleaf, available on request or accessible at www.sgs.com/terms_and_conditions.htm and, for electronic format documents, subject to Terms and Conditions for Electronic Documents at www.sgs.com/terms_e-document.htm. Attention is drawn to the limitation of liability, indemnification and jurisdiction issues defined therein. Any holder of this document is advised that information contained hereon reflects the Company’s findings at the time of its intervention only and within the limits of Client’s instructions, if any. The Company’s sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents. This document cannot be reproduced except in full, without prior written approval of the Company. Any unauthorized alteration, forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law.
Test Report No. : KA/2010/B0127 Date : 2010/11/05 Page : 4 of 6
NITTO DENKO (TAIWAN) CORPORATION *KA/2010/B0127*
ROOM N-712, NO. 96, CHUNG SHAN N. ROAD, SEC. 2, TAIPEI, TAIWAN
1) These samples were dissolved totally by pre-conditioning method according to below flow chart.(Cr6+ test
method excluded)
2) Name of the person who made measurement: Alex Chang
3) Name of the person in charge of measurement: Ray Chang
Cr6+
Sample Material Digestion Acid
Steel, copper, aluminum, solder Aqua regia, HNO3, HCl, HF, H2O2
Glass HNO3/HF
Gold, platinum, palladium, ceramic Aqua regia
Silver HNO3
Plastic H2SO4, H2O2, HNO3, HCl
Others Any acid to total digestion
Pb、Cd
Solution
ICP-AES
Acid digestion by suitable acid
depended on different sample
material (as below table)
Filtration
Residue
1) Alkali Fusion
2) HCl to dissolve
Sample Measurement
Cutting / Preparation
Microwave digestion with
HNO3/HCl/HF
Heat to appropriate
temperature to extract
Cool, filter digestate
through filter
Add diphenyl-carbazide
for color development
Measure the absorbance
at 540 nm by UV-VIS
Add appropriate amount
of digestion reagent
Hg
SGS Taiwan Ltd.台灣檢驗科技股份有限公司
No. 61, Kai-Fa Road, Nanzih Export Processing Zone , Kaohsiung, Taiwan / 高雄市楠梓加工出口區開發路61號
t + 886 (07)301 2121 f + 886 (07)3010867 www.tw.sgs.com
Member of the SGS Group
Unless otherwise stated the results shown in this test report refer only to the sample(s) tested. This test report cannot be reproduced, except in full, without prior written permission of the Company.除非另有說明,此報告結果僅對測試之樣品負責。本報告未經本公司書面許可,不可部分複製。This document is issued by the Company subject to its General Conditions of Service printed overleaf, available on request or accessible at www.sgs.com/terms_and_conditions.htm and, for electronic format documents, subject to Terms and Conditions for Electronic Documents at www.sgs.com/terms_e-document.htm. Attention is drawn to the limitation of liability, indemnification and jurisdiction issues defined therein. Any holder of this document is advised that information contained hereon reflects the Company’s findings at the time of its intervention only and within the limits of Client’s instructions, if any. The Company’s sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents. This document cannot be reproduced except in full, without prior written approval of the Company. Any unauthorized alteration, forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law.
Test Report No. : KA/2010/B0127 Date : 2010/11/05 Page : 5 of 6
NITTO DENKO (TAIWAN) CORPORATION *KA/2010/B0127*
ROOM N-712, NO. 96, CHUNG SHAN N. ROAD, SEC. 2, TAIPEI, TAIWAN
PBB/PBDE analytical FLOW CHART
1) Name of the person who made measurement: Anson Tsao
2) Name of the person in charge of measurement: Ray Chang
First testing process
Optional screen process
Confirmation process
Sample
Screen analysis
Issue Report
Sample pretreatment
Sample extraction/Soxhlet method
Concentrate/DiluteExtracted solution
Analysis by GC/MS
Filter
SGS Taiwan Ltd.台灣檢驗科技股份有限公司
No. 61, Kai-Fa Road, Nanzih Export Processing Zone , Kaohsiung, Taiwan / 高雄市楠梓加工出口區開發路61號
t + 886 (07)301 2121 f + 886 (07)3010867 www.tw.sgs.com
Member of the SGS Group
Unless otherwise stated the results shown in this test report refer only to the sample(s) tested. This test report cannot be reproduced, except in full, without prior written permission of the Company.除非另有說明,此報告結果僅對測試之樣品負責。本報告未經本公司書面許可,不可部分複製。This document is issued by the Company subject to its General Conditions of Service printed overleaf, available on request or accessible at www.sgs.com/terms_and_conditions.htm and, for electronic format documents, subject to Terms and Conditions for Electronic Documents at www.sgs.com/terms_e-document.htm. Attention is drawn to the limitation of liability, indemnification and jurisdiction issues defined therein. Any holder of this document is advised that information contained hereon reflects the Company’s findings at the time of its intervention only and within the limits of Client’s instructions, if any. The Company’s sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents. This document cannot be reproduced except in full, without prior written approval of the Company. Any unauthorized alteration, forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law.
** End of Report **
Test Report No. : KA/2010/B0127 Date : 2010/11/05 Page : 6 of 6
NITTO DENKO (TAIWAN) CORPORATION *KA/2010/B0127*
ROOM N-712, NO. 96, CHUNG SHAN N. ROAD, SEC. 2, TAIPEI, TAIWAN
Test Report o. LPCU00093rll OatG: Osrol/2ottCTS Rcf. CTS,I lritgg4Rcddng
REDRTNG SO|_DER (1{l SOlt. BHD.LOT iti|8o, JAAII DUA tAllAl{ SEI-AYANG AARU68I(x) BATU CAVES, SELANGOR OARUL EHSAN. IiIALAYSI,A
TI|c tollowing m..ch.ndi.c war (we]!l {bnincd and id.ntifiGd by thc client as:
Pag . :1o f?
Sample OescdptionSample ReceivcdT€stir€ D.t
PURETIN SOLDER03rc120110301201 1 to 05/01201 1
Teat Re+lated
Trst Melhod
T6.t R€ults
AnaDrst3
In accordance wih the RoHS Diredive 2002r'95/EC, and itsameidrnent dileclilr3-
Pl€ase Gfe.to next pagqs).
Pleas. rlGr lo ne)d pqqs).
NE Mei Kheng, Ld Woan Yec & Lim Meng Hoe
scs L,{BORATORY SERVTCES (M) SON. BHO.
gCS t.bq&y g..tia 00 8.h h.lcd'.r' Nd {3t72{
CHONG KIEN LENB.Sc.(HONSIAMICtAA I4ANAGER
rM.r.ri6E.rF
rbr6J.LrAtanl!* 31/616r Ndtui! {01e S&!fo.il EM, rby*tlr6(B)sl2t 2?O 116005121& M.{.m
Test Reportlelt rrlrrlb:
Tast Pan Oe$iotlon :
Stmde Dolcfiplion
RoH3 DiEctiw 20O2,'5/EC
o. LPCg00003,ll D.t!: O5OtnO11CtS Ret CTSrl lr4gg4rncd.ing
: PURE TIN SOLDER
f526 Jdr rq!:* V6 3lIB Xd rdui{ ao{e Sohr$.o.ii EE, MC.nar+q|B)5i2lZ3C0 r+6(}|)5t21 sB2 w..a.on
P'{'et2 oll
CHONG NEN LENB.Sc.(HONS)AMICLAA MANAGER
d--db^4*
SCA khodry g..ri... 00 S.h h-{CqF{ lb 6ol2ra
T.!t li.m(i): Unlt Ta.t iretiod Rasulb ldcLC.dmlum(Cd) fig/tg Wfifi ruf.ranc. to IEC 62321 :2008,
lncl rffbanad w lcPoEs N.D.
L.d (Pb) me/xg Wllh relbnnc. b IEC 62321 :2008,l|lc paafonnad w lcPoEs 7
i,hrc.r/ry (H9) mdxg wnh r.|lr.nc. b tEc 62321:2008,md p.tfotnl.d W ICP.oES N.D.
H.x.vdent Chrc.nlum (CM)by Spol Llt / boillng wrho(i..don (oplbnll),
Wflh reLrfica io tEC 62321 :2006,lnd partlorm.d by UV.V|S Spectrophotomotry
(bolllng v/lt r.xflctkft only)Nagatl'/e
0.o2n'gikgPar 50crn'almP|e In
50mL
t|rn ot PBa. Wnh rorr.nc. to IEC 62321 :2008,lnd o.tbrm.d bv GC-.tlrS N.D.
li&no6.omotiph.nyl mg/xg Wlth r!f.r.n6 to IEC 523:tl :2008,lrd tartbrm.d W GC-{US N_O. 5
Dlbrohoblph.nyi ntgkg Wnn r.f€Fnca lo IEC 623212008,dtd Pa.lbfihad W GC{t S N.D. 5
fdb.ornoblphsryi ncfts Wnh r€irFnca to IEC 623212@8,|x$ r*lb.nrd bv GdMS N.O.
T.t!b.ornoUph.ny{ mckg Wnh nbnn . b IEC 62321:2008,lnd !.rlb.n d bv GdtJfq N.D.
Harobro.noblph.nyl mcilg W|l|r ra|||rnc. b IEC 62321:a)08.and per{brnd by OC+,S N.O. 5
Pent$.ofioUpheny r g/kg wth rEhl|nc. io tEc €;2321:it0a..nd parfom.d bv Gc+ls N.O. 5
lbptrbrumOlptenY mdlq Wttr r$rtnca b IEC 623,i11 :2008,.nd 6.rlbm.d bv Gc.us N.O_ 5
Oci!brcntoblph.rryl itgkg wlll r.tlr.nca to IEC €4321 :2008,.nd o.rf6nn.d bv Gc-Ms N.O.
Nom&o.mblph.nY 'rlg/kC Wi$ rcf.nnc. io IEC 62321 :20Oa,.nd padomrd w Gc+/ts N.O. 5
D.c.brortoblph.|lY nvrg Wth ribrtnc. to IEC 52321 :2008,.nd D.rbrn <l W GC-lis N.D, 5
T.al lLm(!): Unn T.3t irehod R.3ultr uD!tum ot PIDEa mg/kg witl rctbr ca b tEc €2321:2008.
.nd p.ftrm.d by GOMS N.O.
iboobrorhodlphrryl .trar rakg Witr r€fronca to IEC 62321 :2008,and a.l|brm.d bv GlAirs N.D.
Dibromodlphant ethar r gftg Wnh reibEnca to IEC 623212006,&rd D.rlbrm.d bv GCMS N,D,
Tdb.lrnodtph.nY .nl.r ng/tc With tr{bt.ic. b tEC 623i,t1:2008.and oadbnrid W (|OMS N.D,
T.tabro.nodlph.ny at rr ms/kg W[h rei.rancr b IEC 62321 :2008..nd o.rbm.d bv GoMs N.D.
PantaDrofi odlphcnt ahar firg/l(g witl r.lb'loc. b IEC 62:,21 :2008..nd o.rlb.r.d bv 6dMs N.O.
tl.labmrnodlphanyl athar mg^s Wllh r.lbGnc€ b IEC 62:121 :2(b8.dtd D.rbm.d bv 6cMs N.D.
tbPtlbroriodlphenyl .trr m9fi9 Wfli rdlr.nc. b IEC 62i|21 :20Oa.tr|d mrb.h.d bv G(:-MS N.D.
Octabroilodlphany eth€r mgxg Wnh ra{aranca b IEC 62321 :2008,rm !6dormad bv GOMS N.D.
Nonabdriodlphanyl alhar rncxg wlth r.f8r.nc. b lEc 62321 :2008..nd EdL6.d bv ac-Ms N.D.
Dacabrofiodlphan9 af|.' nt rtltl€ wlih r€,'lr.nc| b tEc 62321 :2008.tnd E ilom.d bv GC.MS N.D.
Test Report o.LPCUooogJll Datc:osDlrz)ltCTS R.f. CTS,I lrilgo1,,Rcdring
P.g.: 3 of 7
Nole : (a) mg/kg = ppm i (0.1wt% = 100oppm)(b) N.D. t Not Det ct.d(c) MDL. M.thod D.lectlon Lttntt(d) * = Spot.?..r:
r. Nagdlva maan3 ttra lbrancc of C(Vt) on the talt€d ara$b. Politiv. maan3 fia praxnc. ot C(Vl) on th. t.rtad raaa3(Tha ta3tad rampla thould ba furthar vadned by boiflng-wttar-€xtrlcton mathod I th. apottd r.ault 13 na9{lva oa clnnol ba confiinad)lolllng watar anadbn:!. Nagaliva mean3 tia rbtance ol C(Vt) on tha taltad ara|!b. PoJtva maaB lha pot€nca of C(Vl) on tha ta3tad are$i
Tha drtacLd concanHbnln 50 mL bol ng watar axlrrclion 3otuflon t3 6qu!t or gleaterthan 0.02 mgl(g wlth 50 cm' !.mpt. .u.f.ca ar.a.
For coroslon pFtacton coatngr on metabt Inionnaton on ltolrge condiflons and prcducton.ht of th. ta.lad aimpl.l. un.vrllabta and thw relutts otC(Vt) r.pf$ont !t tu3otth.l.mPla at th. llm. of Ldng.
(.)-=t|otregul.bd
SGS LABORATORY SERVICES (M) SDN. BHD.
CHONG KIEN LENB.Sc.(HONS) AMICtAB MANAGER
gCS L.ldby Sdir 00 S.h. Nid.Gz'F rbsFz{
llo-ra .Ir r,leri vriL 3lrs lob Kari! 4re 8ds!o. &nr EM. rkbt*lr t6(615r2r 2320 r.0(03)512tgt2 fr.a.m
Test Report
Tc!t| rclub ry dt.mical mettbd:
1{o, LPCUqXtOtll D.t!: ostolrzxlCT8 Rcf. Ct3rl1r49g/UR.ddng
P.gGi 4 ot 7
TG3t ltlm (r): Unit 1{cthod R€ult sertulimoiy (Sb) ppm With reterence b EPA Melhod 30514
.nd pefomed by ICP.OES N.D.
H.logcn
Halogen€hlorinc (Cl) mdks Wih refeErc€ b AS EN 1682. AnatFis wlsperbnned by lC melhod b Chlorine content. N.D.
H.logen-Fluorine (F) mdkg Wih rebrencr b 83 EN 14582. Analysis wrsp€.forn.d by lC mellbd tor Fluorhe conbr . N.D. 50
Halgg€n-Bromine (Br) msft9 Wilh rd.rence io BS EN 14582. Anrlysb wasperfo|rncd by lC mefiod for Brornine contenl. N.D.
Halogen-lodin. (l) mSr(SWilfi refcrenca !o BS EN 14582. Anatysis v/aspe.bmed by lC rnethod br lodine conient. N.D.
Tesl Pa.t De3caiolion :
S.mpl. Description : PURE TIN SOLOER
NOTE: (a) N.D- = Notd6t ded (<MDL)(b) pprn " ttrgftg(c) MDL= M.{hod gailction Limn
SGS LABORATORY SERVICES (M) SDN. 8HD.
CHONG KIEN LENB.Sc.fiONS) Al4lClAB MANAGER
SGg |.nqe.y S..ti... 00 &r. ti.{cdrF rb|3oztra
rb20J.brLitr*!* 3t/gl rorloEad a0{4 g.b{e.tb^t SB, t|c Fi.$qB)512r 290 rr8 ('13) 5121 dt2 m.d.d
Test Report
Iegt Part D.sc.iotion :
S.mplc D..cdption
No. LPcgdm3,llCTS R.t C?Sfi ll|g9,0Rcdrino
PURE TIN SOLOER
D.tc : osrolri'ol{ P.gc: 5 ol t
REDRTIG SOTDER (1{l SD .BHO.LFCU(X)O9EI'
SGS LABOMTORY SERVICES fi) SON. 8HD.
scs [email protected] s..vn- (b gft En.{ccrr.' h m72la
CHONG KIEN I.ENB.Sc.(HONSIAMICLAB MANAGER
rb25J.h.Ataril\d3l/CllobKdflhCat{eS.!{abuArl', l$yd.I|6{@)5121 23Q0 tr6 (@) 5121 P wl!.m
1.Offi ll|anol{ oF capt|rut| coi{fEr{t tytEc ezt2t 2m8
samds Rad*vt d R€{tstrgrin
Cd s.rd€ n srndl dscts
woisli sanpro (0.2{ f)
inio d*r6tid vsd
A.rd dir€srion (M(rsweve)
_roialiy Dis6dr€(f
FihmtionJ
Amtyses by lCP
Test Report 1{o. LFCU00093rl ICtS Ref. qTSrl 1/it90{R!dring
Ddc : 0tol/2011 P.g.: 0 of t
Clt samplo in snall pioc€6+
w€tti srmprs (0 1-0.59) ifito dg€6ton v6.€l+
Acrd dir€slin (Micrd6va)J'Tc{al9 Dis.oni€d'l
Fil'8lio|r'L
Matylas by tCP
5. DEIUIXAIOLO; ?ftiFgDE Wmr OC{StY EC 6,x}2l 200a
Cri srmDb in smsll liac€s+
W.!tn samd€ {0.5-1 0g) inlo sxrracrin himbt€J
Sorhl€t Enladbn wih Tdu€noJ
F||€. thrdgh 0 45 um m€rnbrans nltor+
Andys€s by Gcr'rs {wfln appro0i6la dMj6n)
2, OIIEEUI{A'|oI Ot LEAp Coit?ll{t !ytEc 6i2321 2008
SaBds R€cgivinq 8r|d R.gistration!
Cd samplo in smarr d€.ssJ
W€ig s6mpl€ (0.2-0.59) hio dgesian vsss€l.J.
Acjd diFlbn (MEb'.,!v€)+'Totafly ossotv€d'
rl#ri*+
amtys€s ty tcP
.. OEERTIITIAIK'X OF HE(AVAIIXT CHROflIUTtY tEc 6232t ZXt6
sand€ Recoivirtand R€gistation
Samdo PlopsmrionJ
spor-!8sr fu6r'tstiv.)
BoilirEF{,al€radraction
ar€ts€6 by w- rtoeholo|l'sror
T66t R€poi
SGS LABORATORY SERVICES (M) SDN. BHD.
CHONG KIEN LEN8.Sc.(HONS) AlrlCLAB MANAGER
gCgLeabyg..li8006.b.'id. ||0.26 Jdr rio-r vrih 5/A Xd XduiE aoldl3.b{.. D{r Es,{cdF tlo6o,,{. ;.r *g-L!111q. !,t q.,3)-.5'1,1-!9. *,r.9.