High Stability Optical Coatings By Employing …High Stability Optical Coatings By Employing...
Transcript of High Stability Optical Coatings By Employing …High Stability Optical Coatings By Employing...
High Stability Optical CoatingsBy Employing Gradient Index Designs
Kai Starke, Cutting Edge Coatings GmbHDetlev Ristau, Laser Zentrum Hannover e.V.
2Confidential
Motivation
Coatings for High Performance Lasers
Few-cycle pulse duration laser, one-octave chirped mirror, MBI Berlin
Multi-kW disk laser
� High Damage Resistance
� Defined Group Delay Dispersion
� Highest Reflectivity
� Very Low Optical Losses
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Outline
1. IBS Coating Technology
– Co-Deposition Principle
– Advanced Optical Monitoring
2. Absorption Shift
3. LIDT Results on Gradient Index Coatings
– cw-Radiation at 1064nm
– fs-pulsed Radiation around 800nm
– ns-pulsed Radiation at 266, 355 and 1064nm
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Process Principle
vacuumchamber
P R E 0401 8
shutte rsubstrate rotation
ion source
zone target
linear motion
vacuumchamber
P R E 0401 8
shutte rsubstrate rotation
ion source
zone target
linear motion
M. Lappschies et al., Appl. Opt. 45 (2006).
IBS Process Variation
• Ion-beam sputtering (IBS)
coating system equipped
with zone target
• Mixtures of oxide materials
���� discrete layer stacks
���� gradient coatings (Rugate)
Alternating Layers Blended Materials
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Zone Target Calibration
100 80 60 40 20 01,4
1,6
1,8
2,0
2,2 400nm 600nm
Ref
ract
ive
inde
x
Target position, steps x 103
6500
2950
0
4400
048
252
5250
056
752
6100
0
7550
0
9850
0
250 200 150 100 50 0
Zr Si
ZrxSi1-xO2
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Broadband Monitoring System
• Spectrum of rotating substrate
• Spectrum range > 1 octave
• DUV Spectra down to 230nm
• Typical accuracy few nm
• Integration in system control
Process Control
Principle of in-situ broad-band optical monitoring
� Realization of complex designs
� Test coating runs obsolete
� Fully automated production
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Optical Monitoring
Front view of coating system
Rugate mirror @ 266nm
• ZrO2/SiO2-mixture
• >350 layers, ≈ 5nm
• design-loaded onto
coating system
• controlled by broad-
band optical monitoring
0 40 80 120 160 200 240 280 320 360
1.44
1.52
1.6
1.68
1.76
1.84
1.92
2
2.08
2.16 © LZH
Vilnius, Lithuania
In-situ broad-band optical monitoring
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Absorption Shift
„digital“ approximation
� 50 layers with 0,04 QWOT
� 4,6 nm TiO2/ 7,2 nm SiO2
300 400 500 600 700 800 900 1000 1100 12000,0
0,1
0,2
0,3
0,4
0,5
0,6
0,7
0,8
0,9
1,0
400 600 800 1000 1200
1,5
2,0
2,5
3,0
refr
activ
e in
dex
n
wavelength [nm]
TiO2
quasi mixture SiO
2
tran
smitt
ance
wavelength [nm]
measurement quasi single layer approximation stack design theory
co-deposited mixture (TixSi1-xO2)
� utilization of Ti/Si- zone target
� 40% content of TiO2 in mixture
300 400 500 600 700 800 900 1000 1100 12000,0
0,1
0,2
0,3
0,4
0,5
0,6
0,7
0,8
0,9
1,0
300 350 400 450 500
0,1
0,2
0,3
0,4
0,5
ext
inct
ion
k
wavelength [nm]
pur TiO2
deduction according to TiO
2 content
Ti0.4
Si0.6
O2
tran
smitt
ance
wavelength [nm]
measurement n&k data fit quasi single layer approximation
25nm
Band edge broadened Band edge shifted
Two representations of a mixed TiO2/SiO2-layer (2 [email protected])
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Example: Ta2O5 for DUV
Mixture Materials:
• Intermediate n
• blue-shift of
absorption band
• corresponding
results for TiO2,
HfO2, Al2O3, ZrO2,
Nb2O5, Y2O3 etc.
� UV-extension of
coating materials
� Novel design possibilities using
artificial materials with defined n Guiding mirror (266nm, 45°)AR 1ω and 2ω, Ta2O5/SiO2 mixture
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cw-Damage Resistance
ME ASU REM ENT FACI LITYSP ECIF ICAT IONS
Laser waveleng th 10 64 nmAngle of inciden ce ap prox. 0 radPolar isation sta te line arRepe tition rate up to 30 kHz
Max. pulse ener gy 4 m J @ 1 kH zBeam profile in target plan eTE M00, multi longitudina lSpot diameter ( 1/e2) 7.5 µmPulse duration ( FWHM) 17 0 ns @ 1 k HzSites per specim en 15 4, hexagon al close pa ckedSepa ration of te st sites 1.2 mm
Dama ge detecti on on line: transm ission of H R mirrorsoff line: Noma rski-micro scopyPulse number d eterminatio nco mputer ass isted pulse countingde vice
SP ECIM EN P REP ERAT IONType of specime n (e-beam )HR mirrors a t 1064 nm on BK7su bstrates, m iscellaneo us coatingma terials
Desig ns qu arter-wave stacksManu facturer La ser Zentru m Hannov er e.V. andLa ser Optik G mbHCoati ng process co nventional e-beam PV DType of specime n (IBS) HR mirrors a t 1064 and 532 nm o n
10
400 600 800 1000 12000,6
0,7
0,8
0,9
1,0
T measured
Tra
nsm
ittan
ce
Wavelength [nm]
ZrxSi1-xO2 AR coatings on lenses, high power NIR lasers
0 0.2 0.4 0.6 0.8 1 1.2
Optical Thickness [µm]
1.44
1.52
1.6
1.68
1.76
1.84
1.92
2
2.08
2.16
n
© LZH
Gradient-index Design
AR1030-1070, HT 532/633
Total thickness 0.75µm,
18lay., ZrO2 content 0..90%
Double-sided AR sample
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cw-Irradiation @ 1.070nm
10kW, 10min without changes
fs-Damage Effects
ME ASU REM ENT FACI LITYSP ECIF ICAT IONS
Laser waveleng th 10 64 nmAngle of inciden ce ap prox. 0 radPolar isation sta te line arRepe tition rate up to 30 kHz
Max. pulse ener gy 4 m J @ 1 kH zBeam profile in target plan eTE M00, multi longitudina lSpot diameter ( 1/e2) 7.5 µmPulse duration ( FWHM) 17 0 ns @ 1 k HzSites per specim en 15 4, hexagon al close pa ckedSepa ration of te st sites 1.2 mm
Dama ge detecti on on line: transm ission of H R mirrorsoff line: Noma rski-micro scopyPulse number d eterminatio nco mputer ass isted pulse countingde vice
SP ECIM EN P REP ERAT IONType of specime n (e-beam )HR mirrors a t 1064 nm on BK7su bstrates, m iscellaneo us coatingma terials
Desig ns qu arter-wave stacksManu facturer La ser Zentru m Hannov er e.V. andLa ser Optik G mbHCoati ng process co nventional e-beam PV DType of specime n (IBS) HR mirrors a t 1064 and 532 nm o n
( ) κτ⋅⋅+≈ gapEbaF
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Ti:Sapphire-Laser
Ø 100 µm, 10 Hz W. Rudolph et al. SPIE 4932, 2003
Damage threshold of IBS single layers of pure coating material
fs-Damage Effects
3,4 3,5 3,6 3,7 3,8 3,9 4,0 4,1 4,2 4,3
0,4
0,6
0,8
1,0
1,2
1,4
1,6
Dam
age
Thr
esho
ld [J
/cm
2 ]Band Gap Energy [eV]
Band Edge and Damage Threshold of IBS TixSi1-xO2 single layers
*D. Nguyen et al.:Appl. Phys. L. 93, 261903 (2008)
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Ti:Sa-Laser
λ 780nm Ø 200µmτ 230fs
( ) κτ⋅⋅+≈ gapEbaF
5,5 6,0 6,5 7,0 7,50,5
1,0
1,5
2,0
2,5
3,0
3,5
4,0
4,5
5,0
35fs 100fs 200fs 500fs 1.1ps
Ene
rgy
Den
sity
[J/c
m2 ]
Band Edge [eV]
fs-Damage Effects
L. Jensen et al.: Laser Damage Symposium (2010)
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Damage Threshold of IBS HfxSi1-xO2 single layers
HfO2/SiO2-mixtures
• HfO2 content from
0% to 100%
• Band edge energy
determined with
Tauc-plot
( ) κτ⋅⋅+≈ gapEbaF
Ti:Sa-Laser
λ 780nm Ø 200µm
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Microstructure Analysis
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Analysis of IBS HfxSi1-xO2 QWOT mirror coatings
TEM XRD
H: Hf0.7Si0.3O2
L: SiO2
fs-Damage of Mirrors
15
0,0
0,1
0,2
0,3
0,4
0,5
0,6
0,7
0,8
0,9
1,0
Calculated Damage Level
HR780TiO with 7% Si not annealedV060327_6
50%-LIDT 0%-LIDT
V060327_7 50%-LIDT 0% -LIDT
HR780V060327_3 TiO with 7%SiO (12h@240°C)
50%-LIDT 0%-LIDT
V060327_5 (12h@240°C))
50%-LIDT 0%-LIDT
Ene
rgy
dens
ity [J
/cm
2 ]0 1000 2000 3000 4000
0,01
0,1
1
10
100
Lowest LIDT-Value H=0.258 J/cm2
LID
T [J
/cm
2 ]
optical thickness of layers [nm]
Calculation and Optimization of LIDT
E.g. Standard QWOT Mirror TiO2/SiO2
*M. Jupé et al.:Laser Damage Symposium, Boulder (2009)
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Ti:Sa-Laser
λ 780nm τ 130fs( ) κτ⋅⋅+≈ gapEbaF
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ns-Damage Resistance
0 20 40 60 80 100
0,0
0,2
0,4
0,6
0,8
1,0
Dam
age
prob
abili
ty
Energy density [J/cm²]
Data Fit Damage freq.
cha06038
1000 Pulses
0 100 200 300 400 500
0,0
0,2
0,4
0,6
0,8
1,0
cha06040
1000 Pulses
Dam
age
prob
abili
ty
Energy density [J/cm²]
Data Fit Damage freq.
TiO2/SiO2 (total thickn. 2,46 µm) TiO2/SiO2 (total thickn. 4,42 µm)
Measurement of laser-induced damage threshold (LIDT)acc. ISO 11254, 1.064nm, pulse duration 8ns
� Strongly increased LIDT with ns-pulses
Class. QWOT mirror (TiO2/SiO2)
first damagedsites at 10J/cm²
first damagedsites at 167 J/cm²
Rugate-mirror (TixSi1-xO2)
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Damage Resistance ns-Pulses
Long-term photograph of ns-pulsed laser beam guided by Rugate-mirror (discharge at dust particles)
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200 220 240 260 2800,0
0,2
0,4
0,6
0,8
1,0
256 260 264 268 2720,90
0,92
0,94
0,96
0,98
1,00
Ref
lect
ivity
Wavelength [nm]
Standard RISED 1 RISED 2 Rugate
ns-Damage Resistance
ZrxSi1-xO2: HR 266 using different designs
Standard
QW-Design (HL)20 H
~50% ZrO2 in H-layers
1.7µm
Refractive Index StEp
Down
1: 29l, 1.1µm
2: 39l, 1.5µm
Rugate Design
352l, 2.0µm
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1 10 100 10000
2
4
6
8
10
12
14
16
18
20
0% L
IDT
[J/c
m2 ]
Number of pulses
QW-Stack RISED 1 RISED 2 Rugate Al
2O
3/SiO
2
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ns-Damage Resistance
Damage threshold of 266nm mirrors with ZrxSi1-xO2 mixturesComparison with Al2O3/SiO2 QWOT mirror
LIDT @ 266nm
• 1.000-on-1
• fp10 Hz
• τ 3,5 ns
• Ø 273 µm
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Vilnius, Lithuania
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ns-Damage Resistance
0 200 400 600 800 1000 1200 1400 1600 1800
3,0
3,5
4,0
4,5
5,0
5,5
6,0
6,5
7,0
2,0
2,0
2,5
2,0
2,0
2,0
1,5
1,5
1,5
1,5
100%
95%
70%
80%
RISED
AtmosphereSubstrate
Ref
ract
ive
Inde
x
Phys. Thickness [nm]
1,5
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HfxSi1-xO2: HR 355 using different designs approaches
Refractive Index StEp
Down and Standard
QWOT-Design
diff. HfO2 contents
in H-layers,
same level of
reflectivity
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ns-Damage Resistance
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L. Jensen et al.:Laser Damage Symposium (2010)
LIDT @ 355nm
• 100 Hz
• 6 ns
• ≈200 µm
Damage threshold of 355nm mirrors with HfxSi1-xO2 mixtures
RISED Stand. 100% Stand. 95% Stand. 80% Stand. 70%0
2
4
6
8
10
12
14
Ene
rgy
Den
sity
[J/c
m²]
LIDT 1-on-1 LIDT 10.000-on-1
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Summary
� Oxide mixtures with tailored dispersion
from NIR to DUV by genuine co-sputtering
� Gradient index designs possible with
advanced broad-band optical monitoring
� Usable spectral range extended due to
absorption band shift (Ti, Ta, Nb, Hf, Al)
� Stability of AR and HR with mixture
materials and gradient index coatings
demonstrated
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Acknowledgements
German Ministry of Commerce and Technology (BMWi)
Project HoLeBo, ProInno 2, KF0096204DA6
German Ministry of Education and Research (BMBF)
Project OMEX, 13N9102
Innonet, Project TAILOR, 16IN0665 and16IN0667
Regional Government of Lower Saxonia, Innovation Support Action,
Project IBS-PRO, W3-80030147
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