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Helium Ion Microscopy Workshop Announcement – September ... · Helium Microscopy – From...
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Helium Ion Microscopy Workshop Announcement September 10 th to 11 th 2009 Announcement – September 10 th to 11 th , 2009 Location: National University of Singapore Helium Ion Microscopy: a new tool in the bio/nanoscience toolkit The Helium Ion Microscope (HIM) has been described as an impact technology, opening new windows into nanoscale imaging. Combining a high brightness ion source with unique sample interaction dynamics, the HIM provides images offering unique contrast and complementary information to existing charged particle imaging instruments such as the SEM and TEM Formed by a single atom at the emitter tip the helium probe can be focused SEM and TEM. Formed by a single atom at the emitter tip, the helium probe can be focused to below 0.25nm offering the highest recorded resolution for secondary electron images. The small interaction volume between the helium beam and the sample also results in images with stunning surface detail. For the biologist, the helium probe offers high contrast from light elements (e.g. C, N, O, P) due to the large variation in secondary electron yield which minimizes the necessity of due to the large variation in secondary electron yield, which minimizes the necessity of specimen staining. A defining characteristic of HIM is its remarkable capability to neutralize charge, by the implementation of an electron flood gun. This eliminates the need for coating non-conductive specimens, for imaging at high resolution. A small convergence angle offers a large depth of field (~5x FE-SEM) giving the ability to keep tall structures in focus within a single image. These benefits of the helium beam are being used in both the material i d lif i t l li ti i f hi h t t ti i i sciences and life sciences to explore applications ranging from high-contrast tissue imaging to drug delivery and quantum dots. For the material scientist, this instrument offers similar advantages in terms of resolution, material contrast, and elemental analysis. In addition, it provides the opportunity to directly modify and pattern the substrate with extremely high resolution through direct material modification, ion beam induced deposition, or lithography. This workshop highlights the latest breakthroughs with this exciting technology.
Transcript of Helium Ion Microscopy Workshop Announcement – September ... · Helium Microscopy – From...
Helium Ion Microscopy Workshop Announcement September 10th to 11th 2009Announcement – September 10th to 11th , 2009Location: National University of Singapore
Helium Ion Microscopy: a new tool in the bio/nanoscience toolkitpy
The Helium Ion Microscope (HIM) has been described as an impact technology, opening new windows into nanoscale imaging. Combining a high brightness ion source with unique sample interaction dynamics, the HIM provides images offering unique contrast and complementary information to existing charged particle imaging instruments such as the SEM and TEM Formed by a single atom at the emitter tip the helium probe can be focusedSEM and TEM. Formed by a single atom at the emitter tip, the helium probe can be focused to below 0.25nm offering the highest recorded resolution for secondary electron images. The small interaction volume between the helium beam and the sample also results in images with stunning surface detail.
For the biologist, the helium probe offers high contrast from light elements (e.g. C, N, O, P) due to the large variation in secondary electron yield which minimizes the necessity ofdue to the large variation in secondary electron yield, which minimizes the necessity of specimen staining. A defining characteristic of HIM is its remarkable capability to neutralize charge, by the implementation of an electron flood gun. This eliminates the need for coating non-conductive specimens, for imaging at high resolution. A small convergence angle offers a large depth of field (~5x FE-SEM) giving the ability to keep tall structures in focus within a single image. These benefits of the helium beam are being used in both the material
i d lif i t l li ti i f hi h t t ti i isciences and life sciences to explore applications ranging from high-contrast tissue imaging to drug delivery and quantum dots.
For the material scientist, this instrument offers similar advantages in terms of resolution, material contrast, and elemental analysis. In addition, it provides the opportunity to directly modify and pattern the substrate with extremely high resolution through direct material modification, ion beam induced deposition, or lithography.
This workshop highlights the latest breakthroughs with this exciting technology.
Helium Ion Microscopy Workshop September 10th, 2009 (Afternoon)Location: National University of Singapore
Time
LocationTopic Presenter
11:30(T-LAB Level 10)
Arrival and Registration, Lunch Buffet Lunch will be served at the 10th floor of Temasek Laboratory
Location: National University of SingaporeT-LAB Level 10 & E3-06-09
(T LAB, Level 10)12:30 (Move to E3-06-09 for Workshop)
Temasek Laboratory
12:40(E3-06-09)
Welcome from Carl Zeiss SMT
Welcome from NUS
Manfred Hanke, Managing Director, Carl Zeiss SMT, SingaporeProf. Seeram Ramakrishna, Vice President (Research Strategy), NUS
13:00(E3 06 09)
Helium Microscopy – From Technology Idea to C i l P d t
Dr. Nick Economou, President Carl Zeiss SMT Inc USA(E3-06-09) Commercial Product Zeiss SMT Inc, USA
13:30(E3-06-09)
Direct Patterning of Graphene with the Helium Ion Microscope
Prof. Dan Pickard, Director of Plasmonics and Advanced Imaging Technology Laboratory, NUS
14:00(E3-06-09)
Sub-10-nm Nanolithography with a Scanning Helium Beam
Dr. Diederik Maas, TNO, Science & Industry, Amsterdan
FOV 50 μm
5nm
10nm
20nm
14:45(E3-06 Corridor)
Tea Break
15:00(E3-06-09)
Application of Helium Ion Microscope to Biological Sciences(An Introduction to Charge Neutralization Techniques)
Prof. Dan Pickard, Director of Plasmonics and Advanced Imaging Technology Laboratory, NUS
15:15(E3 06 09)
Probing and Imaging Complexity of Cyto-skeleton Network
Prof. Low Boon Chuan, PI, Cell Signaling and Developmental Biology
5nm
VerticalFOV 700nm (E3-06-09) Network-
A future promise?Signaling and Developmental Biology Laboratory, NUS
15:30(E3-06-09)
Understanding the cell surface-associated events during bacterial infection processes
Ayshwarya Ravichandran, PhD Student, Dept. of Biological Sciences, NUS
15:45(E3-06-09)
HIM Technology – Applications Overview and Roadmap Dr. Mohan Anhanth, Product Manager HIM, Carl Zeiss SMT Inc, USA
FOV 700nm
( )
16:15(E3-06-09)
16:30
Wrap-up and closing
(Move back to T-LAB, Level 10 for Inauguration)
Manfred Hanke, Managing Director, Carl Zeiss SMT, Singapore
FOV 2 μm
Inauguration and Lab Opening September 10th, 2009 (Evening)Location: National University of Singapore
Temasek Laboratory, Level 10
10nm
Time Topic Presenter Location
17:00 Arrival and cocktail reception NUS(T-LAB, Level 10)
17:45 Welcome Note Prof Venky Venkatesan NUS
10nm
17:45 Welcome Note Prof. Venky Venkatesan, Director Nanocore, NUS
NUS(T-LAB, Level 10)
18:00 Address by President of Carl Zeiss SMT Inc, USA; CEO and Co-Founder of ALIS
Dr. Nick Economou,President Carl Zeiss, SMT Inc, USA
NUS(T-LAB, Level 10)
18:30 Address by Deputy President (Research & Prof. Barry Halliwell, Deputy NUS
FOV 400 nm
18:30 Address by Deputy President (Research & Technology), NUS
Prof. Barry Halliwell, Deputy President (Research & Technology), NUS
NUS(T-LAB, Level 10)
18:45 Opening Ceremony for the Plasmonics and Advanced Imaging Technology Laboratory & Signing of Joint Development Agreement
Dr. Nick EconomouProf. Barry HalliwellManfred HankeProf. Dan PickardProf. Venky Venkatesan
NUS(T-LAB, Level 10)
FOV 6.5 μm
y
19:00 Buffet NUS(T-LAB, Level 10)
Seite
FOV 500 nm
Helium Ion Microscopy Hands-On DemonstrationSeptember 11th , 2009
Time Topic Presenter Location
Location: National University of SingaporePlasmonics and Advanced Imaging LaboratoryE4-02-04
p
09:00 Hands-on Workshop SESSION 1 (max pax 8) Prof. Dan Pickard NUS(E4-02-04)
11:00 Hands-on Workshop SESSION 2 (max pax 8) Prof. Dan Pickard NUS(E4-02-04)
14:00 Hands-on Workshop SESSION 3 (max pax 8) Prof. Dan Pickard NUS
FOV 1.2 μm 5nm
(E4-02-04)
16:00 EndFOV 100 nm
10nm ribbon3.5 microns long
20nm ribbon3 microns long
FOV 4 μm
Helium Ion Microscopy Workshop Location and Directions
Direction to Temasek LaboratoriesBy Car/Taxi:From City:1. Drive along Ayer Rajah Expressway (AYE) towards1. Drive along Ayer Rajah Expressway (AYE) towards Jurong.2. Exit at Clementi Road (AYE Exit 9).From Jurong:1. Drive along Ayer Rajah Expressway (AYE) towards city.2. Exit at Clementi Road (AYE Exit 9).3. Turn Left and enter to Kent Ridge Crescent by NUS Entrance A.t a ce4. Drive along this road and you will see University Cultural Centre on your left.5. Turn Right into Engineering Drive 1 and go straight up the slope.6. Turn Left at the roundabout (see in map) and go straight, you will see our new building appears on your right hand side.From NUH:1. Drive along Lower Kent Ridge Road towards west.2. Turn Right at the roundabout and go straight.3. Drive along this road until you see a bus stop on the left and turn Left into Engineering Drive 1 and go straight up the slope.4. Turn Left again at the roundabout and go straight, you will see our new building appears on your right hand side.Car Parks:CP2A, CP2, CP4, CP4A and car park at the University Cultural CentreBy Train (MRT):1. Take East-West LineAlight at Clementi MRT:2. Take bus service no. 96 at Clementi Bus Interchange
Seite
g3. Alight at Kent Ridge Crescent - NUS Raffles Hall. (Stop Number: 16169)By Bus:Bus no. 95 & 151 also runs into campus.
Helium Ion Microscopy Workshop Registration Information – September 10th & 11th
Registration:.Registration:
Please contact us before 8st September for registration as seats are limited.g
Contact Details:
Contact Number: +65 6567 3011
Coco: [email protected]
Linus: [email protected]
