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FraunhoferTechnology CenterSemiconductor Materials
Institute for Experimental PhysicsTU Bergakademie Freiberg
Industrial aspects of silicon material research for photovoltaic
applications
Hans Joachim Möller
FraunhoferTechnology CenterSemiconductor Materials
Institute for Experimental PhysicsTU Bergakademie Freiberg
General development of photovoltaics
Crystalline silicon technology
Thin film technologies
Feedstock ressources
Summary
Outline
FraunhoferTechnology CenterSemiconductor Materials
Institute for Experimental PhysicsTU Bergakademie Freiberg
General development of photovoltaics
Crystalline silicon technology
Thin film technologies
Feedstock ressources
Summary
Outline
FraunhoferTechnology CenterSemiconductor Materials
Institute for Experimental PhysicsTU Bergakademie Freiberg
Market share of different solar cell technologies
EU - Prognosis for future development
2010 c - Si 80 - 90% multi, Cz, ribbons2020 c - Si 50% multi, ribbons, thin films
PV - market based on the silicon technology
FraunhoferTechnology CenterSemiconductor Materials
Institute for Experimental PhysicsTU Bergakademie Freiberg
System cost 1,0 - 1.5 €/WpModule cost 0.5 - 1.0 €/WpSystem lifetime 20 - 30 yearsSystem efficiency 15% - 30%Electricity cost 0.06 - 0.1 €/kWh
Source: Study of M. Green 2002
Goals of future developments
Grid parity for < 0.1 €/kWhPeak current parity for 0.3 - 0.5 €/kWh
PV goals for 2020 - 2030
3,50 €/Wp
1,00 €/Wp
0,50 €/Wp
2,00 €/Wp
0,20 €/Wp
c-Si
Thin film
PV - system cost depend on efficiency and cost per area
FraunhoferTechnology CenterSemiconductor Materials
Institute for Experimental PhysicsTU Bergakademie Freiberg
Cost and efficiency per area for different technologies
Source: I. Schwirtlich, Schott Solar 2006
100 - 200 200 - 500 500 - 1000Cost per m2
Cost per Wp
New concepts
Nanocryst. Dye
Efficiency
Technologies
EFGCIS
Newconcepts
Thin films
FraunhoferTechnology CenterSemiconductor Materials
Institute for Experimental PhysicsTU Bergakademie Freiberg
General development of photovoltaics
Crystalline silicon technology
Thin film technologies
Feedstock ressources
Summary
FraunhoferTechnology CenterSemiconductor Materials
Institute for Experimental PhysicsTU Bergakademie Freiberg
Formation of defects during crystal growth
DislocationsMelt
precipitation
Transition elements
Solid impurity precipitation
Carbon
Oxygen
New Donors
ThermalDonors
DislocationsOxygenNitrogenCarbonBoronMetals
Defect interactions
FraunhoferTechnology CenterSemiconductor Materials
Institute for Experimental PhysicsTU Bergakademie Freiberg
Internal quantum efficiency (IQE) - topogram Dislocation density - topogram
Correlation between dislocations and lifetime
Analysis of dislocation activity in solar cells requires a modified Donolato model
FraunhoferTechnology CenterSemiconductor Materials
Institute for Experimental PhysicsTU Bergakademie Freiberg
Theoretical description with modified Donolato's theory
Experimental results yield similar recombination strengths compared to wafers but higher volume - diffusion lengths L
FraunhoferTechnology CenterSemiconductor Materials
Institute for Experimental PhysicsTU Bergakademie Freiberg
Cost reduction through more efficient use of silicon
FraunhoferTechnology CenterSemiconductor Materials
Institute for Experimental PhysicsTU Bergakademie Freiberg
Cost distribution
Wafer
Solar cell
Ingot crystal
FraunhoferTechnology CenterSemiconductor Materials
Institute for Experimental PhysicsTU Bergakademie Freiberg
spec. Si-consumption [g/Wp] 8.2 7.5 6.5
Development of wafer thickness and silicon consumption
Wafers below 100 µm thickness become very flexible and fragile
60 µm wafer
FraunhoferTechnology CenterSemiconductor Materials
Institute for Experimental PhysicsTU Bergakademie Freiberg
Radial/median cracks
Lateral cracks
Subsurface microcracks from multi-wire sawing
SEM images of wafer cross sections
1 µm
3 µm
FraunhoferTechnology CenterSemiconductor Materials
Institute for Experimental PhysicsTU Bergakademie Freiberg
Etch removal [µm] 0 [MPa]
as-sawn 83etched 2 6.2 407etched 3 7.7 429etched 4 7.9 429etched 8 15.3 632etched 9 16.9 562
Surface damage by microcracks determines fracture toughness
Weibull distribution and fracture strength
Biaxial bending test
FraunhoferTechnology CenterSemiconductor Materials
Institute for Experimental PhysicsTU Bergakademie Freiberg
General development of photovoltaics
Crystalline silicon technology
Thin film technologies
Feedstock ressources
Summary
FraunhoferTechnology CenterSemiconductor Materials
Institute for Experimental PhysicsTU Bergakademie Freiberg
front cover
foil
substrate
active layera-Si or CIS
back side cover
foil
superstrate
active layera-Si or CdTe
Substrate: glass, metal, polymerFoil: EVA or PVBFront cover: glass, polmer, varnish
Superstrate: glassFoil: EVA or PVBBack side cover: glass, polmer, metal
3 mm
0.5 - 1 mm0.5 - 3 µm
3 mm 3 mm
0.5 - 1 mm0.5 - 3 µm
3 mm
Substrate Superstrate
Principle of thin film cells
FraunhoferTechnology CenterSemiconductor Materials
Institute for Experimental PhysicsTU Bergakademie Freiberg
Thin film solar cells
Flexible CIS - cell
Today‘s thin film materials
Cadmium telluride CdTeKupfer-Indium/Gallium-Diselenide CIGSAmorphous Silicon a-Si:H
Application
FraunhoferTechnology CenterSemiconductor Materials
Institute for Experimental PhysicsTU Bergakademie Freiberg
Status thin film efficiencies
Module efficiency only about 60 - 80% of cell efficiency
FraunhoferTechnology CenterSemiconductor Materials
Institute for Experimental PhysicsTU Bergakademie Freiberg
Analyses of the cost reduction potential
From 1.5 to 1.0 €/kWp
Material and energyYield increaseReduction of glass fracture
EfficiencyFrom 8% to 12%
Production optimization
From 1.0 to 0.5 €/kWp
cheaper TCO and foilsnew substrate glassNew absorber material
EfficiencyFrom 20% to 40%
Production optimization
Normal cost reduction and efficiency increases are not suffcient
to reach the goals of the EU roadmap
Cost per Wp converges to fixed cost
Material and energy cost cannot be reduced arbitrarily
Efficiency has to be increased disproportionately
FraunhoferTechnology CenterSemiconductor Materials
Institute for Experimental PhysicsTU Bergakademie Freiberg
New generation thin film cells
Losses in the solar spectrum
More efficient use of the spectrum by multi-junction solar cells with different band gap
Tandem-junction efficiency (theoretical)> 45% (Si: 33%)
Triple-junction cell > 51% (WR 41,1%)
Four junction cell> 54%
Thin film technologies allow flexible formation of multi-junction cells
FraunhoferTechnology CenterSemiconductor Materials
Institute for Experimental PhysicsTU Bergakademie Freiberg
General development of photovoltaics
Crystalline silicon technology
Thin film technologies
Feedstock ressources
Summary
FraunhoferTechnology CenterSemiconductor Materials
Institute for Experimental PhysicsTU Bergakademie Freiberg
Comparison of material consumption for c-Si and thin films
Wafer technology Si - wafer thickness 150 µm
(mono- or multi-Si) Wafer size 0.01 m2 to 0.04 m2
3 kg silicon for 1 kWp solar power
Thin films deposition on substrate
(a-Si/µ-Si,tf-cSi,CdTe, CIS) 0.3 - 5 µm layer thickness
Substrate size 0.5 m2 to 1.43 m2
0.03 - 0.2 kg material for 1 kWp solar power
Cost advantage for electronic metals only, if prices are below 1 000 Euro/kg
FraunhoferTechnology CenterSemiconductor Materials
Institute for Experimental PhysicsTU Bergakademie Freiberg
SiliconMassive expansion of the crystalline technology requires separate feedstock
supply. Long term supply secured
CIGS, CdTe und GaInAs/GaInP/Ge
Feedstock shortage for InProblem with toxicity of Cd and As-compounds
Prices for electronic materialsare high because of small markets
Development of new solar cell concepts necessary
Technological development of the thin film technology in industrial scale still difficult
Summary