Francesco Carobolante Vice President Engineering Qualcomm...

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Qualcomm Technologies, Incorporated. All Rights Reserved. Power Supply on Chip: from R&D to commercial products PwrSoC 2014 Plenary Session Francesco Carobolante Vice President Engineering Qualcomm Technologies, Inc.

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Page 1: Francesco Carobolante Vice President Engineering Qualcomm ...pwrsocevents.com/wp-content/uploads/2014...Challenges and opportunities Contributors: − J. Doyle − M. Erturk − J.

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Power Supply on Chip: from R&D to commercial products

PwrSoC 2014 Plenary Session

Francesco Carobolante

Vice President Engineering

Qualcomm Technologies, Inc.

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Applications driving Power Integration

Why Power Supply on Chip is inevitable

System constraints and Technology trajectory

Challenges and opportunities

Contributors:

− J. Doyle

− M. Erturk

− J. Duncan

Agenda Where are we in the technology cycle?

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VR Technology Landscape Size ~ TAM, Arrows indicate trends (their size represents effort and investment)

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Power Supply on Chip is already a high volume product! So, what is next?

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Energy harvesting and Internet of Things (IoT)

− Compact, low power, heterogeneous integration

High Performance Computing

− Performance and efficiency constraints

Mobile devices

− Limited space, highest performance, efficiency

Applications driving Power Integration

87% Of Connected Devices Sales By 2017 Will Be Tablets And Smartphones

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Thinner, smaller, more “stuff” in the same volume…

yet area occupied by power management is NOT a

key driver (although it is the most “visible” benefit)

Efficiency is job #1, due to battery limitations (total

energy available) as well as thermal budget (max

dissipation).

From power management to energy management:

tens to hundreds of power domains, each optimized.

The key F.O.M. is 𝑉𝑖𝐼𝑖𝑑𝑡𝑁𝑖=0

Motivations

pJ/op = 10,000x in 40 years

A. Chandrakasan, MIT

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Thermal envelope is the limiting factor to processors’ performance, especially in the

upcoming “wireless docking” use case.

Your mobile device is… your PC And it has to service your every need – all day long

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Your digital assistant

Your health advisor – 24/7

Your data: in the cloud or in

your personal cloud?

Your mobile device is… your Digital Persona – and a lot more! Integration of every possible sensor, radio link, DSP…

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Size matters!

− A conductor parasitic elements (L, R) are

proportional to length and increase as cross-section

is reduced

− Their impact is dramatically affected by operating

frequency (skin effect, proximity effects, Eddy

currents and EMI mitigations become dominant)

…it will only get worse! Wearables are an even bigger challenge

Why did I say it was inevitable?

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Power Delivery Network (PDN)

Die

VRM

Bulk

caps

TSC

DSC

Motherboard

Package

Package caps are the first to respond

MB caps are the second to respond

Bulk caps come third

The VRM is the last to respond BSC

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PC Boards are often skinny and long, making it difficult

to optimize routing

As performance of processors continue to increase,

current increases and voltage decreases. The

impedance of the PDN must decrease in order to keep

the same performance

Power Delivery Network (PDN) requirements If all that happened were “half the voltage and twice the current”…

Current

Voltage

…we would need to make

the impedance ¼ !

But…

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Vt is not scaling with supply voltage reductions. As a result,

while at 45nm a 10% supply margin caused approx. 10%

reduction in peak operating frequency (vs. an ideal supply),

the same voltage margin may cause about 20% reduction

in peak operating frequency at 28nm and 32% at 22nm

Furthermore, due to

the size shrinkage of

transistors, power

density increases

with any new

process generation.

It gets worse: Voltage sensitivity of the silicon process increases

0%

5%

10%

15%

20%

25%

30%

35%

40%

45%

0

2

4

6

8

10

12

14

16

18

20

65nm 45nmLP

28nmLP

28nmHPm

20nm

Power Management requirements

Power Density(100's mW/mm^2)

Max Total CoreCurrent (A)

Voltage Sensitivity(%) ITRS

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0%

10%

20%

30%

40%

50%

60%

70%

80%

90%

100%

65nm 45nm LP 28nm LP 28nm HPm 20nm

Processors Power dissipation

Due to PDNvoltage margin

Due to PMICvoltage margin

Base-line(ideal supply)

0.00

5.00

10.00

15.00

20.00

25.00

30.00

65nm 45nm LP 28nm LP 28nm HPm 20nm

Power dissipation in processors (W)

Due to PDNvoltage margin

Due to PMICvoltage margin

Base-line(ideal supply)

Inefficiency grows due to lower load impedance and fast transients Gains achievable from Power Management “outside” the package are limited

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Which DC-DC Converter architecture?

Which Control scheme?

Which Process technology?

Which Passive Components?

Which Package solution?

Key technologies So many choices, so little time

Charge

Pump

LDO

Buck

GaN

SOI

CZT -

NixFey

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LDO – can be very fast in deep sub-micron!

Switch-Capacitor Charge Pump has higher energy density, but 12% output voltage

granularity requires 16 switches in series good for low power, cell-level embedded power

management, or for coarse supply regulation

Buck: in order to integrate and reduce

inductor size, voltage has to go down.

Q in high frequency inductors is ~10’s,

while capacitors can have 10x or higher Q

Combination of capacitors and inductors

may achieve the appropriate compromise

Fine-grain power management – a

combination of all of the above techniques!

Which DC-DC Converter architecture?

Aleksandar Radic et al., “High-Power Density Hybrid Converter Topologies for

Low-Power Dc-Dc SMPS”, 2014 International Power Electronics Conference

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Performance of an LDO in 20nm Output Voltage: 0.9V – Load: 2 Amp

𝑃𝑜𝑤𝑒𝑟 𝐸𝑓𝑓𝑖𝑐𝑖𝑒𝑛𝑐𝑦 ≡𝑉𝑜𝑢𝑡×𝐼𝑙𝑜𝑎𝑑

𝑉𝑒𝑥𝑡×(𝐼𝑙𝑜𝑎𝑑+𝐼𝑞𝑢𝑖𝑒𝑠𝑐𝑒𝑛𝑡).

-42.00%

-28.30%

-18.91%

-12.77% -8.88%

-5.86% -3.50%

0.00% 0.92% 1.31% 1.64% 4.87%

1.99%

-50.00%

-40.00%

-30.00%

-20.00%

-10.00%

0.00%

10.00%

0

0.1

0.2

0.3

0.4

0.5

0.6

0.7

0.8

0.9

1

920 930 940 950 960 970 980 1000 1020 1040 1060 1080 1100

Ac

cu

rac

y (

%)

Vdd_ext (mV)

Line Regulation (LOAD Current = 1.5 A, )

Line Accuracy %

Vout (mV)

(𝑉𝑜𝑢𝑡_𝑒𝑥𝑡−𝑉𝑜𝑢𝑡@1.2𝑉 𝑖𝑛𝑝𝑢𝑡)

𝑉𝑜𝑢𝑡@1.2𝑉 𝑖𝑛𝑝𝑢𝑡× 100 %.

-1.00%

-0.80%

-0.60%

-0.40%

-0.20%

0.00%

0.20%

0.40%

0.60%

0.80%

Lo

ad

Re

gu

lati

on

Ac

cu

rac

y (

%)

Load Current (mA)

Load Regulation (7 Parts, Vdd_ext = 1.2V)

U79, 1.2V Vdd_extU78, 1.2V Vdd_extU75, 1.2V Vdd_extU73, 1.2V Vdd_extU70, 1.2V Vdd_ext

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Control loop is no longer the limiting factor Both Analog and Digital solutions can provide proximate time-optimal response

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Semiconductor processes and components:

− Silicon remains the workhorse, but traditional Silicon is no longer yielding

significant performance gains

− Improvements are required in the next decade (SOI), GaN (GaN on Si)

Which Process technology?

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Passive Components evolutions Capacitors have higher energy density, but inductors are catching up

0

2

4

6

8

10

12

14

2012 2014 2016 2018

Power Density* (watt/mm2)

Inductor

Capacitor

* Achievable in production process for >1W applications

Log scale!

Capacitance density continues to make progress thanks

to multi-layer insulators and trench technology

100+ MHz Buck converters can be implemented with air

core, but in the long term magnetics win

Ideal magnetic material has highest Bsat and

resistivity with sufficiently low coercivity. BSAT

Rho

µr

CFA

CZT Ni45

Fe55

Ni80

Fe20

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Lateral current flow exacerbates L

Vertical current flow pushes 3-D integration

− Passives on silicon:

− Cost = Die * (1+Δarea) * (1+Δmasks)

− Multi-die:

− Passives on top lots of vias (area) on processor

− Passives below Lots of vias on interposer for I/Os

The biggest challenge: integration. Those d*#@n parasitics! Integration is required because of physical dimensions’ impact on performance

Source: Samsung I meant… the biggest challenge is cost

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DVFS benefits are well understood, but not easy to implement effectively

VR integration yields many benefits

− Voltage regulators can have multiple modes of operation, optimized for efficiency in different load ranges

− Accurate auto-detection of load current is still “expensive”

− Low-power modes may have significantly reduced transient performance which cripples auto-detection

− However, power consumption of many loads is easily characterizable (modem, analog, dedicated DSP, etc.)

− Fast and cheap same-die communication with

regulators allows for dynamic optimization of a

large number of individual voltage domains

− Prediction is very difficult on standard processors,

but many dedicated functions are “predictable”

Fine-Grained Power Control

Power aware system architectures: the load knows “best” what it needs. A. Prodic, University of Toronto, 2009

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From Power Management to Energy Management

Integration of Computing and Power Management

− Control of dI/dt

− Power profiles and Prediction of energy demand

− Power-aware HW/SW implementation of system (VR + Processor)

Process: GaN on Si?

Integrated passives (FoM is looking good)

3-D integration – at low cost!

Tools

− Multi-physics co-simulation of power and thermals

− Measurements of fast transient loads

Conclusions

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