Fifty Years Fifty Years Fifty Years Fifty Years Fifty ... · Don Broton,Construction Technology...

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Transcript of Fifty Years Fifty Years Fifty Years Fifty Years Fifty ... · Don Broton,Construction Technology...

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50TH ANNUAL

DENVER X-RAY CONFERENCE™

SHERATON STEAMBOAT RESORT

STEAMBOAT SPRINGS, COLORADO U.S.A.

30 July – 3 August 2001

Program:This program is also available on the Denver X-ray Conferenceweb page at http://www.dxcicdd.com.The information contained inthis program is current as of the printing date. Changes will becommunicated at the conference.

Randolph Barton, Jr., DuPont Experimental Station, Wilmington, DE

Don Broton, Construction Technology Labs, Skokie, IL

Victor E. Buhrke, The Buhrke Company, Portola Valley, CA

John V. Gilfrich, Emeritus, SFA, Inc./NRL, Washington, DC

George J. Havrilla, co-Chair, Los Alamos National Laboratory, Los Alamos, NM

Ting C. Huang, Emeritus, IBM Almaden Research Center, San Jose, CA

Ron Jenkins, Chair, Emeritus, International Centre for Diffraction Data, Newtown Square, PA

James A. Kaduk, BP Amoco, Naperville, IL

Terry Maguire, Liaison, International Centre for Diffraction Data, Newtown Square, PA

I. Cev Noyan, IBM, Yorktown Heights, NY

Deane K. Smith, Emeritus, The Pennsylvania State University, University Park, PA

Robert L. Snyder, The Ohio State University, Columbus, OH

Mary Ann Zaitz, IBM Microelectronics, Hopewell Junction, NY

20012001 Denver X-ray Conference Organizing Committee

Future Conference Dates:

29 July – 2 August 2002: Adams Mark Hotel(formerly Antlers Doubletree Hotel)Colorado Springs, Colorado, U.S.A.

4–8 August 2003: Denver Marriott Tech Center HotelDenver, Colorado, U.S.A.

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Accommodations and Travel .............................................................................................................1

Registration Information ....................................................................................................................2

Exhibitor Information..........................................................................................................................3

Evening Technical Sessions and Social Functions ..........................................................................4

General Information............................................................................................................................4

Monday Workshops.............................................................................................................................5

Tuesday Workshops.............................................................................................................................8

Monday XRD Poster Session I .......................................................................................................11

Tuesday XRD Poster Session II ......................................................................................................15

Wednesday XRF Poster Session ....................................................................................................19

Thursday 50th Anniversary Poster Session ..................................................................................23

Wednesday Sessions, Including Plenary ........................................................................................24

Thursday Sessions..............................................................................................................................30

Friday Sessions....................................................................................................................................41

Summer Activities in Steamboat Springs......................................................................................47

Directions to Sheraton Steamboat Resort .................................................................................48

Hotel Layout .......................................................................................................................................49

Area Maps............................................................................................................................................50

Program-At-A-Glance.......................................................................................................................51

Travel Form .........................................................................................................................................53

Conference Registration Form.......................................................................................................55

20012001 Denver X-ray Conference ProgramTable of Contents

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The Denver X-ray Conference has selected Kitty Ward Travel, Inc. as the official travel agent for theconference. Kitty Ward Travel has negotiated special fares with United Airlines. A request for airtravel form is included on page 53 of this program. Please complete the form and fax to Kitty WardTravel at fax: 610-543-0786 or call 610-543-0680 or 800-752-3718. If you prefer to arrange your owntravel, you may still take advantage of the special airfares by referring to the Denver X-rayConference numbers when making your reservations.The numbers are as follows:

United Airlines Phone: 1-800-241-6522 DXC Reference Number: 557RD

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Accommodations and Travel

Travel Arrangements

Hotel Information Hotel Information Hotel Information Hotel Information Hotel Information Hotel Information

Reservations Reservations Reservations Reservations Reservations Reservations Reservations Reservations

Students Students Students Students Students Students Students Students Students Students Students Students

Travel Arrangements Travel Arrangements Travel Arrangements Travel Arrangements Travel Arrangements

T he 2001 Denver X-ray Conference (DXC) will be held 30 July – 3 Augustat the Sheraton Steamboat Resort, 2200 Village Inn Court, P.O. Box

774808, Steamboat Springs, CO 80477, U.S.A., phone: 1-800-848-8878 or dialdirect: 1-970-879-2220, fax: 1-970-879-7322.

Attendees are responsible for making their own reservations. Please identifyyourself as a Denver X-ray Conference attendee when booking your reser-

vation. Reservations should be made as soon as possible since there is a limitednumber of rooms available at the conference rate.The special conference rateof $105 per day (plus 10.6% tax), single or double occupancy, will only be applicable before 26 June 2001, subject to availability. Please note the hotel’scancellation policy: Cancellations made less than 72 hours prior to arrival aresubject to a one night’s cancellation fee. No shows, late arrivals and early depar-tures will be assessed the total payment for the full length of stay as originallybooked, unless room is resold.

A limited number of rooms are also available for students. Student roomsare $40 per bed, per day (plus 10.6% tax), two students per room. Please

contact the Conference Coordinator, Denise Flaherty ([email protected]), foran application to apply for student housing. No applications will be acceptedafter 26 June 2001.

Students

Hotel Information

Reservations

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On-site Registration:All on-site registrations will be conducted at the Convention Registration Desk, located in the Convention Center on theground floor of the Sheraton Steamboat Resort. See the hotel layout on page 49 of this program for the exact location.

Registration Times:Sunday, 29 July 4:00 p.m. – 7:00 p.m.

Monday, 30 July 8:00 a.m. – 3:00 p.m.

Tuesday, 31 July 8:00 a.m. – 3:00 p.m.

Wednesday, 1 August 8:00 a.m. – 2:00 p.m.

Thursday, 2 August 8:00 a.m. – 2:00 p.m.

Please Note: Attendees (even those pre-registered) should check in at the Convention Registration Desk for conferencematerials (name tags, Book of Abstracts, late announcements, etc.).

Cancellation Policy: All cancellations will be assessed a $25 processing fee. Cancellations must be submitted in writingto the Conference Coordinator. A full refund will be issued, less processing fee, if the cancellation is received at least twoweeks before the conference (Monday, 16 July 2001). No refunds will be issued for cancellations received after 16 July 2001.

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Registration Information

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AVOID LONG LINES!

SAVE MONEY!

PRE-REGISTER!

Conference Registration FeesAll attendees must register for the conference, including organizers, chairs, invited speakers, and instructors.

Discounted fees will be applied to registrations received before 10 July 2001. The reduced registration fee will only beapplied if registration form and payment are received on or before 10 July 2001. Attendees may pre-register by com-pleting the form on page 55 of this program and sending it to: Denise Flaherty, ICDD, 12 Campus Blvd., NewtownSquare, PA 19073-3273, U.S.A. � E-mail [email protected] � phone 610-325-9814 � fax 610-325-9823. Registrationchecks should be made payable to ICDD/DXC and enclosed with the registration forms.

By July 10th After July 10th

•Full week: exhibits, workshops, sessions† $300 $375

•Monday & Tuesday: exhibits, workshops† $250 $325

•Wednesday, Thursday & Friday: exhibits, sessions† $250 $325

•Session organizers, invited speakers & workshop instructors† $100 $100

•Students, unemployed X-ray people, and persons 65 and older: $50 $50exhibits, workshops, sessions

†Includes a copy of Volume 45 of Advances in X-ray Analysis on CD-ROM

Take advantage of this opportunity to include the following orders with your conference registration fee:

•Advances in X-ray Analysis, Cumulative Volumes 1–39 on CD-ROM: $350

•Advances in X-ray Analysis, Volume 40 on CD-ROM: $150

•Advances in X-ray Analysis, Volume 41 on CD-ROM: $150

•Advances in X-ray Analysis, Volume 42 on CD-ROM: $150

•Advances in X-ray Analysis, Volume 43 on CD-ROM: $150

•Powder Diffraction (Individual one year subscription for the year 2002):U.S. & Canada: Online: $60 Print: $60 Print & online: $70Outside U.S. & Canada: Online: $60 Print: $85 Print & online: $100

•Powder Diffraction (Institution one year subscription for the year 2002):Worldwide: Online: $90 Print: $105 Print & online: $120

Powder Diffraction is a quarterly journal that focuses on materials characterization employing X-ray powder diffraction techniquesand procedures. For more information, please call 1-516-576-2200.

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Exhibits will be located in the foyer, Mt. Werner and Storm Peak rooms on the ground floor of the hotel. A diagram of the exhibit locations will be available in the Book of Abstracts and on the DXC web page athttp://www.dxcicdd.com.

Exhibit Hours:

Monday 10:00 a.m. to 5:00 p.m.

Tuesday 10:00 a.m. to 5:00 p.m.

Wednesday 10:00 a.m. to 5:00 p.m.

Thursday 10:00 a.m. to 2:00 p.m.

Exhibitor Information

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AMPTEK, Inc.

ATPS, Inc.

Bede Scientific, Inc.

Blake Industries, Inc.

Bruker AXS, Inc.

Corporation Scientifique Claisse

Diffraction Technology

F.A.I.R. Corporation

Gresham Scientific Instruments

Herzog Automation Corp.

ICPH Chemical International - Socachim

INEL

International Centre for Diffraction Data (ICDD)

Jordan Valley AR, Inc.

Kratos Analytical, Inc.

LND, Inc.

Materials Data, Inc. (MDI)

MatIdent

MOXTEK, Inc.

Osmic, Inc.

Oxford Instruments

Philips Analytical

Photoelectron Corporation

Rigaku/MSC

Rocklabs Ltd.

SPEX CertiPrep, Inc.

Technos International

Thales Components Corporation

Thermo ARL

Thermo NORAN

X-ray Optical Systems, Inc.

X-ray Instrumentation, Assoc.

All exhibitors are invited to attend the

Exhibitors’ General Meeting

Wednesday, 1 August 2001, 6:00 – 6:30 p.m. in the Sunset Room

NOTE TO EXHIBITORS:The ceiling heights for the exhibit areas are as follows:

Foyer — 7'5" (to light fixtures)Mt. Werner and Storm Peak Room — 14'6"

Exhibitors Exhibitors Exhibitors Exhibitors Exhibitors Exhibitors Exhibitors Exhibitors Exhibitors

Exhibitors Exhibitors Exhibitors Exhibitors Exhibitors Exhibitors Exhibitors Exhibitors Exhibitors

Exhibitors as of 1 May 2001

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Spouses are welcome to attend all social functionsEvening Mixers and Poster Sessions will be held in the Sunshine Peak Room unless otherwise noted

Sun., 29 July 5:30 – 7:30 Welcoming ReceptionSponsored by Bede Scientific, SPEX CertiPrep and Claisse Scientifique

Mon., 30 July 6:30 – 8:30 XRD Poster Session I

Tues., 31 July 6:30 – 8:30 MDI and Rigaku/USA Reception & XRD Poster Session IISponsored by Materials Data, Inc. and Rigaku/USA

Wed., 1 August 6:30 – 8:30 Bruker AXS, Inc. Reception & XRF Poster SessionSponsored by Bruker AXS, Inc.

Thurs., 2 August 6:30 – 8:30 DXC 50th Anniversary Poster Session and receptionSponsored by the Denver X-ray ConferenceTo be held poolside in the Anniversary Tent

Spouses’ Coffee Hour:All spouses are invited to attend a complimentary coffee hour, sponsored by the Denver X-ray Conference.Coffee, tea and pastries will be served in the Daybreak Room from 9:30 to 10:30 a.m. on Monday throughWednesday. Information on local attractions and activities of interest will be provided.

General Information:

Poster Boards:The poster boards used during the evening poster sessions will be 4' x 6' boards. The traditional 4' x 8' boardswill not be used this year.

Employment Clearinghouse:We will have a separate bulletin board to announce employment opportunities. Prospective employers andemployees should bring announcements with them for posting.

Book of Abstracts:The DXC Book of Abstracts will be available at the Convention Registration Desk.

Time Capsule:Go down in history and make a contribution to the DXC time capsule. All creative contributions will be accepted.Twenty-five years from now, we will open it up for another walk down memory lane.

Evening Technical Sessionsand Social Functions

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Workshops, Monday a.m.XRD & XRF

W-1 AN IN-DEPTH LOOK AT CEMENT ANALYSIS (Twilight)Organizers & Instructors: D. Broton, Construction Technology Labs, Skokie, IL

J. Anzelmo, Bruker AXS, Inc., Madison, WIThis workshop will cover:1. Raw materials analysis (limestone, clay, gypsum, coal)2. Clinker & cement analysis, pressed vs. fused3. Free lime in cement and clinker4. QXRD for phase composition5. Reitveld vs. selective dissolution

XRDW-2 SMALL ANGLE SCATTERING (Rainbow)Organized by: J.D. Londono, DuPont Company – CRD, Wilmington, DE

Instructors: B. Crist, Northwestern University, Evanston, ILR.P. Hjelm, Los Alamos National Laboratory, Los Alamos, NMJ.S. Pedersen, University of Aarhus, Aarhus, Denmark

The purpose of the workshop is to attract new people to the field—particularly those that may be wonderingwhether this is a useful technique for their application. The format will be tutorial in nature. In addition, the work-shop aims to provide a sufficiently broad overview of the field so that experienced users will find it useful to identify new opportunities. It will be divided into three parts: 1) Instrumentation and resolution effects, 2) the infor-mation hidden in small-angle curves and how to extract it, and 3) the impact of small-angle in biology, materialsscience, metallurgy and polymer and colloid physics. We are lucky to have three very experienced instructors. Theyare also very different in their approach and experience, contributing to the broad focus of the workshop.

XRFW-3 AN INTRODUCTION TO X-RAY FLUORESCENCE (Sunshine Peak)Organizers & Instructors: R. Jenkins, Emeritus, International Centre for Diffraction Data, Newtown

Square, PAJ. Croke, Emeritus, Philips Analytical, Natick, MA

This workshop is intended for beginners and those fairly new to the field of X-ray fluorescence analysis. Wewill describe the principles behind the technique and describe the basics of X-ray spectra, and absorption effects.We will describe briefly the types of instrumentation used in the field and compare and contrast the features ofwavelength and energy dispersive spectrometers. The use of both techniques for qualitative analysis will be cov-ered. We will then briefly cover specimen preparation methods and then introduce the basic concepts behindquantitative analysis.

W-4 TOTAL REFLECTION (set-up procedures) (Buddy’s Run)Organized by: M.A. Zaitz, IBM Microelectronics, Hopewell Junction, NY

P. Wobrauschek, Atominstitut der Österreichischen Universitäten, Vienna, Austria

Instructors: M.A. Zaitz, IBM Microelectronics, Hopewell Junction, NYP. Wobrauschek, C. Streli, Atominstitut der Österreichischen Universitäten, Vienna, AustriaB. Holyñska, University of Mining and Metallurgy, Krakow, Poland

This workshop will cover the basics of total reflection X-ray fluorescence, as well as instrumentation, calibration,and applications.

WorkshopsMonday, 30 July – Tuesday, 31 July

a.m. workshops: 9:00 a.m. – 12:00 noon p.m. workshops: 2:00 p.m. – 5:00 p.m.

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XRD & XRF

W-5 X-RAY ABSORPTION SPECTROSCOPY: PUTTING IT TO WORKFOR MATERIALS CHARACTERIZATION (Rainbow)

Organized by: H.D. Rosenfeld, DuPont Experimental Station, Wilmington, DE

Instructors: H.D. Rosenfeld, DuPont Experimental Station, Wilmington, DEB. Ravel, U.S. Naval Research Laboratory, Washington, DCM. Newville, Argonne National Laboratory, Argonne, IL

X-ray absorption spectroscopy (XAS) analysis can often provide materials characterization where conven-tional diffraction analysis cannot. Such cases include samples with small coherent domain size, or low con-centration of the phase of interest in a multiphase sample, or both (as is often the case with catalysts). OftenXAS can differentiate phases with difficult to distinguish structure factors, such as Co3O4 and CoAl2O4. XAScan also yield information that diffraction analysis alone cannot, such as electronic structure or oxidation state.If you’ve been faced with these types of materials characterization problems, XAS might be just what you’relooking for. In this workshop, we will present practical examples that will show you explicitly how to put XASto work for you in your materials characterization problems, in language anyone experienced in X-ray dif-fraction can understand. Each example will show aspects of the following: Is XAS the right technique for thisproblem; How do I prepare my samples?; How do I collect good data?; How do I analyze my data to get theanswers I need? While we can’t make you an X-ray spectroscopy expert in two hours, we can give you enoughinformation to perform and analyze some simple, yet powerful, experiments. This workshop will provide youthe opportunity to add a very useful, complimentary technique to your materials characterization toolbox.

W-6 USE OF THE WEB AS A RESOURCE (Buddy’s Run)Organizer & Instructor: M. Kottenhahn, International Centre for Diffraction Data, Newtown Square, PA

This workshop will focus on concepts of mining the web for information using search engines, search indexes,and other resources. Getting 754,710 hits when you put “X-ray” into your search engine? Do you know how tofind items in the “Invisible Web”? Find out how to extract what you want and evaluate the found information.Learn search engine optimization strategies so your web site can be found easily. An overview of X-ray relatedweb sites will be presented.

XRF

W-7 MAINTENANCE AND CALIBRATION OF X-RAY FLUORESCENCESPECTROMETERS (Sunshine Peak)

Organized by: R. Jenkins, Emeritus, International Centre for Diffraction Data, Newtown Square, PAJ. Croke, Emeritus, Philips Analytical, Natick, MA

Instructors: S. Williams, J. Ombres, Philips Analytical, Natick, MAA. Sanborg, EDAX International, Mahwah, NJ

This workshop is intended for beginners and those fairly new to the field of X-ray fluorescence analysis. Wewill describe the need for careful maintenance of X-ray instruments with special emphasis on X-ray tubes,detectors, and specimen handling components. We will discuss the basic techniques of instrument calibra-tion and the maintenance of the integrity of a given calibration setup.

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Workshops, Monday p.m.

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Workshops, Monday p.m.

W-8 FUNDAMENTAL PARAMETERS (Twilight)Organized by: M. Mantler, Vienna University of Technology, Vienna, Austria

Instructors: M. Mantler, Vienna University of Technology, Vienna, AustriaB. Vrebos, Philips Analytical, Almelo, The NetherlandsW.T. Elam, University of Washington, Seattle, WA

This workshop will cover:1. Atomic (“fundamental”) parameters and tube spectra: definitions, sources (tables, available data files,

computed data and related algorithms), accuracy.2. Theoretical background: physical-mathematical models for primary and secondary excitation, Coster-

Kronig transitions, conventional equations and Monte-Carlo methods.3. Software issues: technical aspects, availability.4. Fundamental parameters and computed influence coefficients.5. Thin films, inhomogeneous specimens, light elements.6. Practical applications.

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XRD

W-9 INDUSTRIAL RIETVELD APPLICATIONS (Sunshine Peak)Organizers & Instructors: R.W. Morton, Phillips Petroleum Company, Bartlesville, OK,

[email protected]. Simon, DES Consulting, Broken Arrow, OK, [email protected]

The workshop will be a series of presentations about Rietveld refinement modeling applied to routine X-raydiffraction evaluations in industrial settings. Topics include instrument parameters, quantitative analysistechniques, phase filtering techniques, modeling amorphous components and QA/QC applications.Recipients are encouraged to send problems to the instructors by 31 May 2001 for possible inclusion in theworkshop.

W-10 TWO-DIMENSIONAL XRD (Twilight)Organized by: B.B. He, Bruker AXS, Inc., Madison, WI

T.N. Blanton, Eastman Kodak Company, Rochester, NY

Instructors: B.B. He, Bruker AXS, Inc., Madison, WIT.N. Blanton, Eastman Kodak Company, Rochester, NYU. Preckwinkel, Bruker AXS, Inc., Madison, WIG.A. Stephenson, Eli Lilly and Company, Lilly Research Lab, Indianapolis, IN

This workshop will cover the basic concept and recent progress in two-dimensional X-ray diffraction. Becauseof the unique nature of the data collected with a 2D detector, new concepts and approaches are necessary toconfigure the two-dimensional diffraction system and to understand and analyze two-dimensional diffractiondata for various applications, such as phase ID, texture, stress, crystallinity, and thin film analysis.

W-11 NEUTRON DIFFRACTION OF POLYMERS (Rainbow)Organized by: K.H. Gardner, DuPont Company – CRD, Willmington, DE

Instructors: T. Forsyth, Institut Laue Langevin, Grenoble, FranceP. Langan, Los Alamos National Laboratory, Los Alamos, NM

This workshop will present the opportunities for structural studies of polymer systems by neutron diffrac-tion. With the aid of relevant examples from biological and synthetic polymer systems, it will describe theunique complementarity that exists between X-ray and neutron methods. It will also describe the instrumen-tation that is available for neutron work as well as a number of major developments that are on the horizon.

Workshops,Tuesday a.m.

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Workshops,Tuesday a.m.

XRF

W-12 XRF SPECIMEN PREPARATION I (Buddy’s Run)Organized by: D. Broton, Construction Technology Labs, Skokie, IL

J. Anzelmo, Bruker AXS, Inc., Madison, WI

Instructors: D. Broton, Construction Technology Labs, Skokie, ILJ. Anzelmo, Bruker AXS, Inc., Madison, WIS. Nettles, Construction Technology Labs, Skokie, ILL. Creasey, TIMET, Morgantown, PAJ. Blanchette, Corporation Scientifique Claisse, Quebec, Canada

This workshop will cover:1. Sampling, crushing, grinding2. Preparing pressed powders3. Borate fusions4. Metals5. Advances in fusion technology6. Panel discussion (all speakers)

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Workshops Tuesday p.m.

XRD

W-13 MAINTENANCE, ALIGNMENT & STANDARDS (Sunshine Peak)Organized by: I.C. Noyan, IBM, Yorktown Heights, NY

C.C. Goldsmith, IBM Microelectronics, Hopewell Junction, NY

Instructors: R.D. England, Cummins Engine Company, Inc., Columbus, INT.R. Watkins, Oak Ridge National Laboratory, Oak Ridge, TNJ.P. Cline, National Institute of Standards & Technology, Gaithersburg, MD

This workshop is designed to teach experimenters about the alignment of modern diffractometers, the use ofstandards for verification of alignment, and tips on practical use. Specifically, we will be addressing the question of what one should check if one is using a “reportedly ready” machine for the first time and whatperiodic checks should be carried out to verify that the machine is in demonstrably top condition. We willalso discuss standards used for alignment, with particular emphasis on the suitability of particular standardsfor particular tasks.

W-14 HIGH RESOLUTION XRD (Twilight)Organized by: B.K. Tanner, University of Durham, Durham, United Kingdom

Instructors: B.K. Tanner, University of Durham, Durham, United KingdomM. Goorsky, University of California, Los Angeles, CA

The workshop will provide both a basic grounding in the techniques of high-resolution X-ray diffraction andtopography, and a perspective on the current state of application of the methods in an industrial context.Particular attention will be paid to the qualitative interpretation of data taken in the triple axis geometrywhere the X-ray scattering is mapped in reciprocal space.

XRF

W-15 XRF SPECIMEN PREPARATION II (Buddy’s Run)Organizers: D. Broton, Construction Technology Labs, Skokie, IL

J. Anzelmo, Bruker AXS, Inc., Madison, WI

Instructors: D. Broton, Construction Technology Labs, Skokie, ILJ. Anzelmo, Bruker AXS, Inc., Madison, WIS. Nettles, Construction Technology Labs, Skokie, ILL. Creasey, TIMET, Morgantown, PAJ. Blanchette, Corporation Scientifique Claisse, Quebec, Canada

Continuation of W-12.

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XRD Poster Session I, Monday, 30 July (Sunshine Peak)(6:30 p.m. – 8:30 p.m., authors present)

Chairs: D.E. Cox, Emeritus, Brookhaven National Laboratory, Upton, NYR.L. Snyder, The Ohio State University, Columbus, OH

Session chairs will select the two best papers for awards.

TheoryD-045 CALCULATION OF ATOMIC SCATTERING AND DEBYE-WALLER FACTORS: STEP

TOWARD ACCURATE ESTIMATION FOR X-RAY POLARIZABILITYA. Ulyanenkov, Bruker AXS, Karlsruhe, GermanyL.I. Komarov, I. Feranchuk, Belorussian State University, Minsk, Belarus

D-033 THE EFFECT OF POINT DEFECTS ON X-RAY DIFFRACTION LINE INTENSITIESS. Grigull, European Synchrotron Radiation Facility, Grenoble Cedex, France

SoftwareD-011 SNAP-1D: SOFTWARE FOR FULL-PROFILE POWDER DIFFRACTION PATTERN

MATCHING AND QUANTITATIVE ANALYSISG. Barr, C.J. Gilmore, J. Paisley, University of Glasgow, Glasgow, United Kingdom

D-012 AUTOMATED PROCESSING OF 2D POWDER DIFFRACTION DATAS. Vogel, Los Alamos National Laboratory, Los Alamos, NM and Christian Albrechts-Universität zu Kiel, Kiel, Germany

D-037 ESTIMATION OF ERRORS IN THE MEASUREMENT OF UNIT-CELL PARAMETERS:STATISTICAL UNCERTAINTIES OF PEAK POSITIONS OF POWDER DIFFRACTIONLINES DETERMINED BY INDIVIDUAL PROFILE FITTINGH. Toraya, Nagoya Institute of Technology, Tajimi, Japan

D-122 BAYESIAN/MAXIMUM ENTROPY ANALYSIS OF NANOPARTICLE-BROADENED LINEPROFILESN. Armstrong, National Institute of Standards & Technology, Gaithersburg, MD andUniversity of Technology, Sydney, AustraliaJ.P. Cline, National Institute of Standards & Technology, Gaithersburg, MDW. Kalceff, University of Technology, Sydney, Australia

D-144 FULL-PATTERN PROFILE ANALYSIS OF DIFFRACTION SCANS FROM SEMICRYSTALLINE POLYMERSD. Agnihotri, R. Ortega, D. Winter, AMIA Laboratories, Austin, TXN.S. Murthy, Honeywell Laboratories, Morristown, NJ

Instruments & StandardsD-008 NEW X-RAY DIFFRACTION STATION AT NIST-BOULDER

D. Balzar, D. Fitting, D. McColskey, N.C. Popa, R. Santoyo, T. Siewert, P. Spagnol,National Institute of Standards & Technology, Boulder, CO

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SessionsPoster Sessions: Monday, 30 July – Thursday, 2 AugustOral Sessions:Wednesday, 1 August – Friday, 3 August

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XRD Poster Session I, Monday, 30 July (Sunshine Peak)

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D-016 DEVELOPMENT OF MgO CERAMIC STANDARDS FOR X-RAY AND NEUTRONLINE BROADENING ASSESSMENTSS. Pratapa, B. O’Connor, Curtin University of Technology, Perth, Australia

D-054 A DIFFRACTOMETER FOR X-RAY DIFFRACTION STUDIES OF BOND COATSBENEATH THERMAL BARRIER COATINGSK. Vaidyanathan, D. Pease, E. Jordan, M. Gell, University of Connecticut, Storrs, CTH. Canistraro, University of Hartford, Hartford, CTT. Watkins, Oak Ridge National Laboratory, Oak Ridge, TN

D-084 CHARACTERIZATION OF MINIATURE LOW-POWER X-RAY TUBESA. Reyes-Mena, D.C. Turner, S. Voronov, S. Cornaby, P. Moody, MOXTEK, Inc.,Orem, UTL.V. Knight, Brigham Young University, Provo, UT

D-085 ASPECTS OF A SIMULTANEOUS XRD/XRF INSTRUMENT DESIGNP. Moody, A. Reyes-Mena, S. Cornaby, T. Grow, MOXTEK, Inc., Orem, UTA. Stradling, T. Hughes, L.V. Knight, Brigham Young University, Provo, UT

C-03 SIMULTANEOUS XRF/XRD WITH LOW-POWER X-RAY TUBESS. Cornaby, A. Reyes-Mena, P.W. Moody, T. Grow, MOXTEK, Inc., Orem, UTT. Hughes, A. Stradling, L.V. Knight, Brigham Young University, Provo, UT

D-146 EVALUATION OF SPECIMEN DISPLACEMENT ERRORS IN HIGH TEMPERATUREPOWDER DIFFRACTION FURNACESS.T. Misture, NYS College of Ceramics at Alfred University, Alfred, NYC.R. Hubbard, X.L. Wang, Oak Ridge National Laboratory, Oak Ridge, TN

D-153 RIETVELD REFINEMENT OF POWDER DATA FROM MULTILAYER AND POLYCAPILLARY OPTICSS.T. Misture, NYS College of Ceramics at Alfred University, Alfred, NY

In SituD-101 USE OF IN-SITU XRD TO DEVELOP CONDUCTING CERAMICS WITH THE

AURIVILLIUS CRYSTAL STRUCTURES. Speakman, M.S. Haluska, V.B. Modi, S.T. Misture, NYS College of Ceramics atAlfred University, Alfred, NY

D-100 IN-SITU XRD TO OPTIMIZE POWDER SYNTHESIS OF AURIVILLIUS PHASESM.S. Haluska, S. Speakman, S.T. Misture, NYS College of Ceramics at AlfredUniversity, Alfred, NY

D-052 STUDIES OF THERMAL EXPANSION OF CALCIUM ALUMINATES USING HIGHTEMPERATURE SYNCHROTRON X-RAY DIFFRACTIONY. Gao, B. Nyiri, General Electric Corporate Research & Development, Schenectady, NYJ.Y. Kim, J. Hanson, J.Z. Larese, Brookhaven National Laboratory, Upton, NY

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D-065 THE ANALYSIS OF INCONEL 690 OXIDATION PRODUCTS AND MEASUREMENTOF THEIR GROWTH RATES AS A FUNCTION OF TEMPERATURE USING X-RAYDIFFRACTIONA.R. Jurgensen, D.M. Missimer, K.J. Imrich, M.E. Summer, Westinghouse SavannahRiver Site, Aiken, SC

D-120 THERMAL EXPANSION AND HYDRATION OF NaAlO2

R.A. Peascoe, C.R. Hubbard, J.R. Keiser, Oak Ridge National Laboratory, Oak Ridge, TNJ.P. Gorog, Weyerhaeuser Company, Tacoma, WA

D-128 HIGH TEMPERATURE X-RAY DIFFRACTION STUDY OF PHASE TRANSFORMATIONS IN SrZrO3

E.A. Payzant, B.C. Chakoumakos, Oak Ridge National Laboratory, Oak Ridge, TN

D-142 IN-SITU HIGH TEMPERATURE XRD ANALYSIS OF HTSC TAPESK. Pathak, M.B. Dickerson, K.H. Sandhage, R.L. Snyder, The Ohio State University,Columbus, OH

QuantitativeD-024 QUANTITATIVE ANALYSIS OF HYDROXYLAPATITE-ZIRCONIA BIOMATERIAL

USING THE RIETVELD METHODA.V.C. Andrade, UNESP - Instituto de Química de Araraquara, São Paulo, Brazil andDEFIS-CIPP-Universidade Estadual de Ponta Grossa, Paraná, BrazilJ. Caetano Zurita, D.A. Barbato, DEFIS-CIPP—Universidade Estadual de PontaGrossa, Paraná, BrazilC.O. Paiva-Santos, J.A. Varela, J.L. Amaral, R.D. Adati, UNESP—Instituto deQuímica de Araraquara, São Paulo, Brazil

D-050 IDENTIFICATION AND QUANTIFICATION OF A NOVEL FLY ASH COATING,STEKLITE, BY RIETVELD QUANTITATIVE X-RAY DIFFRACTIONT.D. Lorbiecke, R.M. Gonzalez, B.W. McIntyre, R.S. Winburn, Minot StateUniversity, Minot, NDJ.D. Cathcart, M. Brownfield, U.S. Geological Survey, Denver, CO

D-051 FACTORS INFLUENCING QUANTITATIVE RESULTS FOR COAL COMBUSTION BY-PRODUCTS USING THE RIETVELD METHODR.M. Gonzalez, T.D. Lorbiecke, B.W. McIntyre, R.S. Winborn, Minot StateUniversity, Minot, ND

Inorganic MaterialsD-023 X-RAY POWDER DIFFRACTION CHARACTERIZATION OF THE SEMICONDUCTING

COMPOUNDS Ag2FeSnS4 AND Ag2FeSn3S8

G. Delgado, J.M. Delgado, Laboratorio Nacional de Difracción de Rayos-X undUniversidad de Los Andes, Mérida, VenezuelaE. Quintero, R. Tovar, M. Quintero, Universidad de Los Andes, Mérida, Venezuela

XRD Poster Session I, Monday, 30 July (Sunshine Peak)

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XRD Poster Session I, Monday, 30 July (Sunshine Peak)

D-025 RIETVELD ANALYSIS OF PEROVSKITE AND PYROCHLORE Me DOPED PZN(Me=Ba or Ti)A.V.C. Andrade, UNESP—Instituto de Química de Araraquara, São Paulo, Brazil andDEFIS-CIPP—Universidade Estadual de Ponta Grossa, Parana, BrazilC.O. Paiva-Santos, M.A. Zaghete, J.A. Varela, UNESP—Instituto de Química deAraraquara, São Paulo, Brazil

D-034 RIETVELD REFINEMENT ANALYSIS OF EMD XRD POWDER PATTERNS AND ASTRUCTURAL INTERPRETATIOND.E. Simon, DES Consulting, Broken Arrow, OKT. Andersen, C.D. Elliott, Kerr McGee Chemical LLC, Oklahoma City, OK

D-060 USE OF AN ACCURATE STRUCTURE DATA FROM X-RAY POWDER DIFFRACTIONTO SIMULATE THE MAGNETIC PROPERTIES OF RARE EARTHSJ. Hölsä, University of Turku, Turku, Finland and ENSCP, CNRS, Paris, FranceM. Lahtinen, J. Valkonen, University of Jyväskylä, Jyväskylä, FinlandM. Lastusaari, J. Nittykoski, University of Turku, Turku, Finland and Graduate Schoolof Materials Research, Turku, FinlandP. Porcher, ENSCP, CNRS, Paris, FranceR.S. Puche, Ciudad Universitaria, Madrid, Spain

D-042 CRYSTAL STRUCTURE OF AgRSb2 (R=Pr, Nd, Gd, Dy, Ho, Er)L. Zeng, X. Xie, Guangxi University, Guangxi, P.R. of ChinaH.F. Franzen, Iowa State University, Ames, IA

D-093 X-RAY DIFFRACTOMETRY STUDIES ON 5-AMINOTETRAZOLE-Fe2O3-KNO3 SYSTEMD. Chandra, W.-M. Chien, University of Nevada, Reno, NVC.J. Rawn, Oak Ridge National Laboratory, Oak Ridge, TNA.K. Helmy, TRW Incorporated, Lockwood, NV

D-055 SOLID STATE PHASE TRANSITIONS OF NH4NO3-KNO3 BINARY SYSTEMW.-M. Chien, D. Chandra, J. Smith, University of Nevada, Reno, NVC.J. Rawn, Oak Ridge National Laboratory, Oak Ridge, TNA.K. Helmy, TRW Incorporated, Lockwood, NV

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6:30 p.m. – 8:30 p.m., authors presentThe XRD Poster Session II will be held in conjunction with the MDI and Rigaku/USA mixer.

Chairs: T.C. Huang, Emeritus, IBM Almaden Research Center, San Jose, CAP.K. Predecki, The University of Denver, Denver, CO

Session chairs will select the two best papers for awards.

IntermetallicsD-014 GRAZING INCIDENCE X-RAY DIFFRACTION STUDY OF LOW CARBON STEEL

CORROSION INDUCED BY CARBON DIOXIDES. Sembiring, B. O’Connor, A. van Riessen, R. De Marco, Curtin University ofTechnology, Perth, Australia

D-031 INFLUENCE OF RE-NITRIDING FOR THERMAL FATIGUE PROPERTIES ON NITRIDED HOT WORK DIE STEEL (H13)K. Yatsushiro, M. Sano, M. Hihara, Yamanashi Industrial Technology Center, Yamanashi,JapanM. Kuramoto, Polytechnic University, Kanagawa, Japan

D-053 HIGH TEMPERATURE X-RAY DIFFRACTION STUDIES DURING HYDRIDING OF Zr2FeJ. Smith, D. Chandra, University of Nevada, Reno, NVJ.R. Wermer, Los Alamos National Laboratory, Los Alamos, NME.A. Payzant, Oak Ridge National Laboratory, Oak Ridge, TN

D-071 TEXTURE AND PRESS FORMABILITY OF DUAL-PHASE STAINLESS STEEL SHEETT. Goto, T. Kondoh, Aichi Institute of Technology, Toyota, JapanT. Sasaki, Y. Hirose, Kanazawa University, Kanazawa, JapanH. Inoue, Osaka Pref. University, Osaka, Japan

D-072 FABRICATION OF Ti-Al SYSTEM INTERMETALLIC COMPOUND ON DUAL-PHASESTAINLESS STEEL BY SHS REACTIONT. Kondoh, T. Goto, Aichi Institute of Technology, Toyota, JapanH. Hirose, Kinjo College, Matto, JapanT. Murotani, T. Sasaki, Kanazawa University, Kanazawa, Japan

D-087 X-RAY STRESS MEASUREMENT FOR Ni-Al SYSTEM INTERMETALLIC COMPOUNDPREPARED BY SHS-METHODT. Murotani, J. He, T. Sasaki, Kanazawa Univeristy, Kanazawa, JapanH. Hirose, Kinjo University, Ishikawa, Japan

D-109 STRUCTURAL AND THERMAL EXPANSION OF Mo-Si COMPOUNDS: THEORY ANDEXPERIMENTT.R. Watkins, J.H. Schneibel, C.J. Rawn, C.L. Fu, Oak Ridge National Laboratory, OakRidge, TN

D-127 KINETICS OF PRECIPITATION IN MAGNESIUM-ALUMINUM ALLOYS FROM ANALYSIS OF HIGH TEMPERATURE X-RAY DIFFRACTION DATAE.A. Payzant, S.R. Agnew, Oak Ridge National Laboratory, Oak Ridge, TN

XRD Poster Session II,Tuesday, 31 July (Sunshine Peak)

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D-099 CHARACTERIZATION OF ULTRAFINE NANOSTRUCTURES BY X-RAY DIFFRACTIONN. Mattern, Institut für Festkörper - und Werkstofforschung Dresden, Dresden, Germany

Thin FilmsD-103 MEASUREMENT OF HYDROGEN IN BCN FILMS BY NUCLEAR REACTION

ANALYSISH. Yasui, Kanazawa University, Kanazawa, Japan and Industrial Research Institute ofIshikawa, Kanazawa, JapanY. Hirose, T. Sasaki, Kanazawa University, Kanazawa, JapanK. Awazu, Industrial Research Institute of Ishikawa, Kanazawa, JapanH. Naramoto, Atomic Energy Research Institute, Takasaki, Japan

D-038 X-RAY DIFFRACTION STUDY ON HIGHLY ORDERED MESOSTRUCTURED THINFILMST. Noma, H. Miyata, K. Takada, Canon Research Center, Kanagawa, JapanA. Iida, Photon Factory, Ibaraki, Japan

D-044 STRUCTURAL AND OPTICAL PROPERTIES OF IRIDIUM FILMS ANNEALED INAIRS. Kohli, C.D. Rithner, P.K. Dorhout, Colorado State University, Fort Collins, COD. Niles, Agilent Technologies, Fort Collins, CO

C-04 COMPLEMENTARY X-RAY ANALYSIS OF SPUTTERED MAGNETIC AND MICROELECTRONIC DEVICE RELATED FILM MATERIALSA.A. Tijerina, A.G. Ayala, S. Rios, C.J. Gutierrez, Southwest Texas State University,San Marcos, TX

D-091 THE RESIDUAL STRESS MEASUREMENT OF TiCN PVD FILMSS. Takago, Industrial Research Institute of Ishikawa, Ishikawa, JapanM. Gotoh, T. Sasaki, Y. Hirose, Kanazawa University, Kanazawa, Japan

Stress/StrainD-039 LOCAL STRESS MEASUREMENTS OF SINGLE CRYSTAL USING SYNCHROTRON

RADIATIONH. Suzuki, K. Akita, H. Misawa, Tokyo Metropolitan University, Tokyo, JapanY. Yoshioka, Musashi Institute of Technology, Tokyo, Japan

D-058 MICRO STRAIN IN HMX INVESTIGATED WITH POWDER X-RAY DIFFRACTIONAND CORRELATION WITH MECHANICAL SENSITIVITYM. Herrmann, W. Engel, Fraunhofer Institut für Chemische Technologie ICT, Pfinztal,GermanyH. Göbel, Kristallographische Analytik, München, Germany

XRD Poster Session II,Tuesday, 31 July (Sunshine Peak)

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XRD Poster Session II,Tuesday, 31 July (Sunshine Peak)

D-119 NEUTRON AND X-RAY DIFFRACTION RESIDUAL STRESS MAPPING IN A 2024-T3FRICTION STIR BUTT WELDM.A. Sutton, A.P. Reynolds, University of South Carolina, Columbia, SCD.-Q. Wang, T.M. Ely, C.R. Hubbard, Oak Ridge National Laboratory, Oak Ridge, TN

D-118 ANALYSIS OF RESIDUAL STRESSES IN BENT COMPOSITE TUBES AND WELDEDAIRPORT PANELS USING XRD AND FINITE ELEMENT METHODST. Ely, G. Sarma, C. Hubbard, J. Keiser, L. Hall, Oak Ridge National Laboratory, OakRidge, TN

D-106 DETERMINING RESIDUAL STRESSES USING �:� DIFFRACTOMETERS EQUIPPEDWITH HIGH RESOLUTION SOLID STATE DETECTORSH.W. King, S.H. Ferguson, S. Gursan, M. Yildiz, University of Victoria, Victoria, BC,Canada

D-104 CHANGE IN RESIDUAL STRESS OF CRACK-FREE Cr LAYERS DEPOSITED BYPULSE-CURRENT ELECTROLYSIS DUE TO HOLDING AT ROOM TEMPERATUREY. Kobayashi, J. Nagasawa, Tokico. Ltd., Kawasaki, JapanK. Watanabe, K. Nakamura, Atotech Japan K.K., Yokohama, JapanT. Sasaki, Y. Hirose, Kanazawa University, Kanazawa, Japan

D-096 X-RAY STRESS MEASUREMENT OF SURFACE THIN LAYER BY MEANS OFEVANESCENT WAVE WITH IN-PLANE DIFFRACTIONT. Sasaki, Y. Hirose, Kanazawa University, Kanazawa, JapanI. Tobita, K. Omote, Rigaku Corporation, Tokyo, Japan

D-088 MEASUREMENT OF SURFACE RESIDUAL STRESS OF SHOT-PEENED STAINLESSSTEELSS. Takahashi, T. Murotani, Y. Hirose, Kanazawa Univeristy, Kanazawa, JapanS. Takago, Industrial Research Insitute of Ishikawa, Ishikawa, Japan

D-089 THE RESIDUAL STRESS IN GROUND LAYER OF DUPLEX PHASE STAINLESS STEELH. Hirose, Kinjo Univeristy, Matto, JapanT. Sasaki, Kanazawa University, Kanazawa, JapanM. Saka, Tohoku University, Sendai, Japan

D-090 X-RAY FRACTOGRAPHY FOR Fe-Cr STEEL/TiN COMPOSITE MATERIAL USINGTHE MISFIT OF THE PLASTIC STRAINS. Takago, Industrial Research Institute of Ishikawa, Ishikawa, JapanT. Sasaki, Y. Hirose, Kanazawa University, Kanazawa, Japan

D-092 DEVELOPMENT OF MEASUREMENT TECHNIQUE FOR LATTICE SPACING ATSTRAIN FREE BY NEUTRON DIFFRACTION METHODT. Saito, T. Sasaki, Y. Hirose, Kanazawa University, Kanazawa, JapanN. Minakawa, Y. Morii, Japan Atomic Energy Research Institute, Ibaraki, Japan

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XRD Poster Session II,Tuesday, 31 July (Sunshine Peak)

D-094 X-RAY ANALYSIS OF RESIDUAL STRESS DISTRIBUTION IN WELD REGIONJ.T. Assis, V.I. Monin, Instituto Politécnico/UERJ, Rio de Janeiro, BrazilJ.R. Teodosio, T. Gurova, Universidade Federal do Rio de Janeiro, Rio de Janeiro, Brazil

MiscellaneousD-056 FIXED DEPTH DIRECTION TEXTURE ANALYSIS USING ENERGY DISPERSIVE

X-RAY DIFFRACTION METHODK. Hoshino, Rigaku Corporation, Tokyo, Japan

D-102 X-RAY REFLECTIVITY AND ATOMIC FORCE MICROSCOPY FOR CHARACTERIZATION OF COATINGS ON GLASSS.T. Misture, NYS College of Ceramics at Alfred University, Alfred, NY

D-135 FATIGUE CRACKS IN ALUMINUM SAMPLES STUDIED WITH X-RAY PHASE CONTRAST IMAGING AND WITH ABSORPTION MICROTOMOGRAPHYS.R. Stock, K. Ignatiev, Georgia Institute of Technology, Atlanta, GAG.R. Davies, J.C. Elliott, Queen Mary and Westfield College, London, United KingdomK. Fezzaa, W.-K. Lee, Argonne National Laboratory, Argonne, IL

D-136 SULFATE ATTACK OF PORTLAND CEMENTS.R. Stock, K. Ignatiev, A.P. Wilkinson, N. Naik, K.E. Kurtis, Georgia Institute ofTechnology, Atlanta, GA

D-137 MINERAL PHASE MICROSTRUCTURE IN TEETH OF THE SHORT SPINED SEA URCHIN (Lytechinus variegatus) STUDIED WITH X-RAY PHASE CONTRASTIMAGING AND WITH ABSORPTION MICROTOMOGRAPHYS.R. Stock, Georgia Institute of Technology, Atlanta, GAT. Dahl, J. Barss, A. Veiss, Northwestern University Medical School, Chicago, ILK. Fezzaa, W.-K. Lee, Argonne National Laboratory, Argonne, IL

D-149 THE LINUS PAULING FILE (LPF) PROJECTJ. Daams, Daams Crystal Structure Consultancy, Geldrop, The NetherlandsP. Villars, Materials Phases Data Systems, Vitznau, Switzerland

D-152 PHASE FRACTION OF BASE METAL OXIDES FOR ADSORBER CATALYSTSR.D. England, Cummins Engine Company, Columbus, INT.R. Watkins, Oak Ridge National Laboratory, Oak Ridge, TN

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6:30 p.m. – 8:30 p.m., authors presentThe XRF Poster Session will be held in conjunction with the Bruker AXS, Inc. mixer.

Chairs: J. Gilfrich, Emeritus, SFA, Inc./NRL, Washington, DCG. Havrilla, Los Alamos National Laboratory, Los Alamos, NM

Session chairs will select the three best papers for awards.

XRF InstrumentationF-01 DISCOVERY OF LIGHT EMISSION FROM XRF SOURCES

M.A. Padmanabha Rao, New Delhi, India

F-15 NANOSTAR: A IN SITU COMBINATION OF SMALL-ANGLE X-RAY SCATTERING(SAXS) AND X-RAY FLUORESCENCE (XRF)R. Görgl, K. Erlacher, Material Center Leoben GmbH, Leoben, Austria and ErichSchmid Institute, Austrian Academy of Sciences & University of Leoben, AustriaP. Doppler, Anton-Paar GmbH, Graz, AustriaH.F. Jakob, Bruker AXS GmbH, Karlsruhe, GermanyP. Fratzl, Erich Schmid Institute, Austrian Academy of Sciences & University of Leoben,AustriaP. Wobrauschek, C. Streli, Atominstitute of the Austrian Universities, Vienna, Austria

F-03 USABILITY OF PORTABLE X-RAY SPECTROMETERS FOR DISCRIMINATION OFVALENCE STATESI.A. Brytov, R.I. Plotnikov, B.D. Kalinin, Bourevestnik Research & ManufacturingCo., St. Petersburg, Russia

F-02 DEEP MULTILAYER GRATINGS WITH ADJUSTABLE BANDPASS FOR XRF SPECTROSCOPYV.V. Martynov, Yu. Platonov, Osmic, Inc., Troy, MI

F-58 OPTICS FOR ANGULAR FILTERING OF X-RAYS IN 2 DIMENSIONSJ. P. Nicolich, D.M. Gibson, X-ray Optical Systems, Inc., Albany, NY

F-16 A XRF METHOD BASED ON SELECTIVE EXCITATION AND INTEGRAL COUNTING OF THE SAMPLE EMISSION PHOTONR.F. Saavedra, Universidad de La Frontera, Temuco, Chile

F-55 A WINDOWLESS Si ANODE X-RAY TUBE FOR THE EFFICIENT EXCITATION OFLOW Z ELEMENTS ON Si WAFER SURFACES WITH TXRFC. Streli, P. Wobrauschek, K. Proksch, L. Fabry, Atominstitut der ÖsterreichischenUniversitäten, Vienna, AustriaS. Pahlke, Wacker Siltronic, Burghausen, Germany

XRF Poster Session,Wednesday, 1 August (Sunshine Peak)

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F-49 X-RAY FOCUSING CRYSTAL VON HAMOS SPECTROMETER WITH A CCD LINEARARRAY AS A DETECTORA. Antonov, I. Grigorieva, Y. Kasyanov, A. Shevelko, O. Yakushev, P.N. Lebedev,Physical Institute of the Russian Academy of Sciences, Moscow, RussiaL. Knight, Q. Wang, Brigham Young University, Provo, UT

F-45 NON-DESTRUCTIVE 3D STRUCTURAL STUDIES BY X-RAY MICROTOMOGRAPHYG.R. Davis, S.E.P. Dowker, P. Anderson, H.S. Wassif, University of London, London,United KingdomA. Boyde, University College, London, United KingdomS.R. Stock, Georgia Institute of Technology, Atlanta, GA

F-61 HIGH CONTRAST IMAGING WITH POLYCAPILLARY OPTICSC.A. MacDonald, W.M. Gibson, University of Albany, Albany, NY

F-24 QUANTITATIVE X-RAY FLUORESCENCE ANALYSIS AT THE ESRF ID18F MICROPROBEB. Vekemans, L. Vincze, A. Somogyi, L. Kempenaers, F. Adams, MiTAC, Universityof Antwerp, Wilrijk, BelgiumM. Drakopoulos, A. Snigirev, ID22 European Synchrotron Radiation Facility, GrenobleCedex, France

F-23 THE ID18F MICROPROBE ENDSTATION AT THE EUROPEAN SYNCHROTRONRADIATION FACILITY (ESRF)A. Somogyi, L. Vincze, B. Vekemans, F. Adams, University of Antwerp, Antwerp, BelgiumM. Drakopoulos, M. Kocsis, A. Snigirev, European Synchrotron Radiation Facility,Grenoble Cedex, France

F-10 PRODUCTION OF HIGH ENERGY X-RAY MICRO-BEAM AND AN EXAMPLE OFMICRO-X-RAY FLUORESCENCE APPLICATION AT SPring-8 UNDULATOR BEAMLINEN. Kamijo, SPring-8, Hyogo, Japan and Kansai Medical University, Osaka, JapanY. Suzuki, M. Awaji, A. Takeuchi, H. Takano, SPring-8, Hyogo, JapanT. Ninomiya, Forensic Science Laboratory of Hyogo Prefecture Plolice, Koube, JapanS. Tamura, Osaka National Research Institute, Osaka, Japan

XRF ApplicationF-62 ANALYSIS OF SODIUM AND SULFUR IN A PORTLAND CEMENT BY XRF WITH

FUSED BEADS ON AN AUTOMATIC GAS FUSION MACHINEM. Davidts, I.C.P.H. Chemical International, Philadelphia, PA

F-31 QUANTITATIVE EVALUATION OF Ni CONCENTRATION ON AMORPHOUS Si ATTHE PPB LEVEL USING MICROSAMPLE X-RAY ANALYSISH.J. Kwon, K.H. Park, J.S. Lee, LG Electronics Institute of Technology, Seoul, KoreaB. Kim, LG. Philips LCD Research Center, Anyang, KoreaH.R. Yun, G. Lee, Alpha Science Corp., Seoul, KoreaJ.R. Bogert, D. Leland, Thermo NORAN, Middleton, WI

XRF Poster Session,Wednesday, 1 August (Sunshine Peak)

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XRF Poster Session,Wednesday, 1 August (Sunshine Peak)

F-05 APPLICATION OF X-RAY SPECTROMETRY FOR ANALYSIS OF WASTE WATERL.P. Eksperiandova, A.B. Blank, Y.N. Makarovskaya, Institute for Single Crystals,National Academy of Sciences of Ukraine, Kharkov, Ukraine

F-33 CHEMICAL INFORMATION FROM X-RAY EMISSION SPECTRAW.T. Elam, University of Washington Engineered Biomaterials Center, Seattle, WAJ.R. Sieber, National Institute of Standards and Technology, Gaithersburg, MDA.L. Ankudinov, J.J. Rehr, University of Washington, Seattle, WA

F-44 QUANTIFICATION OF CADMIUM, MERCURY AND LEAD IN AQUEOUS SAMPLEBY ENERGY K X-RAY FLUORESCENCE SPECTROSCOPYP. Suwanathada, T.A. DeVol, Clemson University, Anderson, SC

F-47 TRACE ELEMENT ANALYSIS OF Nb AND RARE EARTH ELEMENTS IN METALALLOYS: COMPARISON OF Sr-TXRF WITH Sr-XRF ON THIN FILMS (AP1™)G. Pepponi, P. Wobrauschek, C. Streli, C. Jokubonis, Atominstitut der Österreichischen Universitäten, Vienna, AustriaF. Hegedüs, P. Winkler, EPFL-CRPP, Villigen PSI, SwitzerlandG. Falkenberg, HASYLAB, DESY, Hamburg, Germany

F-26 FUNDAMENTAL PARAMETERS ALGORITHM FOR SEICXRF METHOD APPLIEDTO BINARY AND TERNARY SAMPLESM. García, R. Figueroa, R. Rivera, La Frontera University, Temuco, Chile

F-51 BACKGROUND SUBTRACTION FOR TRACE-ELEMENT ANALYSIS—ANALYTICALCOMPARISON OF METHODSR.A. Couture, Washington University, St. Louis, MO

F-57 QUANTITATIVE CHARACTERIZATION OF ELECTROSORPTION OF Cr SPECIESON POLYCRYSTALLINE GOLD WITH X-RAY SPECTROMETRYI. Szalóki, University of Debrecen, Debrecen, HungaryK. Varga, University of Veszprém, Veszprém, HungaryR. van Grieken, University of Antwerp, Antwerp, Belgium

F-36 THE LINE OVERLAP CORRECTION BY THEORETICAL INTENSITYJ.E. Martin, A. Martin, Rigaku/MSC, The Woodlands, TXY. Yamada, N. Kawahara, Y. Kataoka, H. Kohno, Rigaku Industrial Corporation,Osaka, Japan

F-56 TXRF-XANES TRACE ANALYSIS OF ORGANIC AND LOW Z COMPOUNDS ON SiWAFER SURFACES EXCITED BY MONOCHROMATISED UNDULATOR RADIATIONG. Pepponi, Atominstitut der Österreichischen Universitäten, Vienna, AustriaB. Beckhoff, G. Ulm, R. Fliegauf, J. Weser, Physikalisch-Technische Bundesanstalt,Berlin, GermanyT. Ehmann, Wacker Siltronic AG, Burghausen, Germany

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XRF Poster Session,Wednesday, 1 August (Sunshine Peak)

F-07 RAPID WHOLE-SURFACE ANALYSIS OF SEMICONDUCTORS BY THE USE OF TXRFY. Mori, K. Uemura, Nippon Steel Corporation, Yamaguchi, JapanY. Iizuka, The University of Tokyo, Tokyo, Japan

F-59 MONITORING OF PHOSPHOROUS LEVELS IN VARIOUS PROCESS STEPS BY TXRFIN SEMICONDUCTOR MANUFACTURINGA.R. Ghatak-Roy, D. Kulik, M. McBride, T. Z. Hossain, Advanced Micro Devices,Inc., Austin, TX

F-20 QUANTITATIVE ANALYSIS OF LOW-Z ELEMENTS IN TOTAL REFLECTION X-RAYFLUORESCENCE SPECTROSCOPYM. Doi, M. Yamagami, T. Shoji, T. Yamada, Rigaku Corporation, Osaka, Japan

F-63 TXRF TO MONITOR FOR HIGH K DIELECTRIC MATERIAL CONTAMINATION INA SEMICONDUCTOR FABC. Sparks, International SEMATECH, Austin, TX

F-41 INVESTIGATION OF THE INFLUENCE OF PARTICLE SIZE ON THE QUANTITATIVE ANALYSIS OF GLASSES BY ENERGY-DISPERSIVE MICRO X-RAY FLUORESCENCE SPECTROMETRYT.C. Roedel, H. Bronk, Technical University of Berlin, GermanyM. Haschke, Röntgenanalytik Messtechnik GmbH, Taunusstein, Germany

F-46 APPLICATIONS OF PCFPW FUNDAMENTAL PARAMETERS SOFTWARE IN CORPORATE R&D AND QUALITY CONTROL ANALYTICAL LABORATORIESL. Brehm, M. Buchmann, B. Haskins, Dow Analytical Sciences, Midland, MID. Burns, S. Chaudhary, Dow Analytical Sciences, Freeport, TXK. Dunker, Dow Automotive, Auburn Hills, MI

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Denver X-ray Conference 50th Anniversary Poster Session

A prize will be given to the best poster.

A-01 FROM ABATTOIR TO THE LONDON STOCK MARKETB. Tanner, N. Loxley, K. Bowen, N. Price, D. Hall, C. Honeybourne, Bede plc,Bowburn South Industrial Estate, Durham, United Kingdom

A-02 ADVANCE IN STRESS ANALYSIS TAKING ACCOUNT OF STRESS GRADIENTY. Yoshioka, Musashi Institute of Technology, Tokyo, JapanK. Akita, H. Suzuki, Tokyo Metropolitan University, Tokyo, Japan

A-03 A QUARTER OF CENTURY OF ROUND ROBIN TESTS ON XRDG. Berti, M. D’Acunto, University of Pisa, Pisa, ItalyF. De Marco, Diffraction Measurement and Testing Centre, Pisa, Italy

A-04 A HISTORICAL REVIEW OF RETAINED AUSTENITE AND ITS MEASUREMENTSBY X-RAY DIFFRACTIONW.N. Weins, University of Nebraska, Lincoln, NE

A-05 HIGHLIGHT PAPERS FROM THE XRF PROGRAMJ. Gilfrich, Emeritus, SFA, Inc./NRL, Washington, DCR. Jenkins, Emeritus, International Centre for Diffraction Data, Newtown Square, PA

A-06 HIGHLIGHT PAPERS FROM THE XRD PROGRAM R. Jenkins, Emeritus, International Centre for Diffraction Data, Newtown Square, PA

A-07 THE DENVER WORKSHOPSThe ICDD and the DXC Organizing Committee

A-08 ORGANIZATION OF THE DENVER MEETINGSThe ICDD and the DXC Organizing Committee

A-09 MILESTONES IN THE DEVELOPMENT OF THE DENVER CONFERENCEThe ICDD and the DXC Organizing Committee

A-10 THE POWDER MENR. Jenkins, Emeritus, International Centre for Diffraction Data, Newtown Square, PA

A-11 THE PROCEEDINGS OF THE DENVER CONFERENCEThe ICDD and the DXC Organizing Committee

A-12 VOLUNTEERS FOR THE RUNNING OF THE DENVER CONFERENCEThe ICDD and the DXC Organizing Committee

A-13 THE ORGANIZING COMMITTEE, THEN AND NOWThe ICDD and the DXC Organizing Committee

A-14 SPECIAL PEOPLE AT THE DENVER X-RAY CONFERENCEThe ICDD and the DXC Organizing Committee

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A special area will be reserved at the Sheraton Steamboat Resort for a 50th Anniversary Poster Session.The poster session will be held Thursday evening of conference week, during the DXC-sponsoredanniversary celebration, to be held poolside in the Anniversary Tent.

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FIFTY YEARS OF THE DENVER X-RAY CONFERENCE8:30 a.m. – 12:30 p.m.

Organized by: R. Jenkins, Emeritus, International Centre for Diffraction Data, Newtown Square, PAJ.V. Gilfrich, Emeritus, SFA, Inc./NRL, Washington, DC

8:30 Welcoming RemarksRon Jenkins, Chairman, Denver X-ray Conference, Emeritus, International Centre for

Diffraction Data, Newtown Square, PA

Presentation of Awards� 2001 Barrett Award to David E. Cox, Emeritus, Brookhaven National Laboratory,

Upton, NYpresented by: P.K. Predecki, The University of Denver, Denver, CO

� 2001 Jenkins Award to Ron Jenkins, Emeritus, International Centre for DiffractionData, Newtown Square, PA

presented by: R.L. Snyder, The Ohio State University, Columbus, OH

� Announcement of the 2001 Jerome B. Cohen Student Awardpresented by: I. Cev Noyan, IBM, Yorktown Heights, NY

� Announcement of the 2001 Hanawalt Awardpresented by: C.R. Hubbard, Oak Ridge National Laboratories, Oak Ridge, TN

� 2001 Distinguished Fellows Award to Ron Jenkins, Emeritus, International Centre forDiffraction Data, Newtown Square, PA

presented by: Julian Messick, International Centre for Diffraction Data, NewtownSquare, PA

Plenary Session RemarksR. Jenkins, Emeritus, International Centre for Diffraction Data, Newtown Square, PAJ.V. Gilfrich, Emeritus, SFA, Inc./NRL, Washington, DC

The following are the invited papers to be presented during theplenary session:

9:00 P–1 THE VERY EARLY YEARS OF THE DENVER X-RAY CONFERENCEW. Mueller, Colorado School of Mines, Golden, CO

9:20 P–2 THE DENVER X-RAY CONFERENCE: 1966-1979J.B. Newkirk, Colorado Sports Equipment, Inc., Evergreen, CO

9:40 P–3 THE CHANGING YEARSC. Ruud, The Pennsylvania State University, University Park, PAP.K. Predecki, The University of Denver, Denver, CO

Plenary SessionWednesday, 1 August

(Steamboat Grand Hotel)

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10:20 Break

10:50 P–4 THE MODERN DENVER CONFERENCER. Jenkins, Emeritus, International Centre for Diffraction Data, Newtown Square, PA

11:10 NAMES BEHIND THE DENVER AWARDS: L.S. BIRKS, C.S. BARRETT, H.F.McMURDIE AND J.B. COHENJ.V. Gilfrich, Emeritus, SFA, Inc./NRL, Washington, DCD. Chandra, University of Nevada, Reno, NVR.L. Snyder, The Ohio State University, Columbus, OHI. Cev Noyan, IBM, Yorktown Heights, NY

11:50 HANAWALT AWARD LECTURE

Plenary Session(continued)

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1:30 F-37 BENCHTOP SEQUENTIAL WDX SPECTROMETER –ZSXmini–J.E. Martin, Rigaku/MSC, The Woodlands, TXH. Inoue, T. Moriyama, S. Kojima, K. Toda, Rigaku Industrial Corporation,Osaka, Japan

1:50 D-040 THE INNOVATION OF IN-LABORATORY XAFS APPARATUST. Taguchi, J. Harada, Rigaku Corporation, Tokyo, JapanT. Kazuyuki, S. Kohzo, Rigaku Corporation, Miyagi, Japan

2:10 D-114 D4 ENDEAVOR - THE NEW PARTNER FOR X-RAY DIFFRACTION ANALYSISL. Bruegemann, Bruker AXS GmbH, Karlsruhe, Germany

2:30 D-059 DHS 900 DOMED HOT STAGE - HEATING ATTACHMENT FOR FOUR-CIRCLEGONIOMETERSR. Resel, E. Tamas, Graz University of Technology, AustriaJ. Keckes, University Leoben, AustriaP. Hofbauer, Anton Paar GmbH, Graz, Austria

2:50 D-057 A HIGH PERFORMANCE COLLIMATOR FOR SMALL ANGLE X-RAY SCATTERINGUSING A MONOCAPILLARY WITH A PARABOLOIDAL PROFILER.A. Clapp, Diffraction Technology, Pty. Ltd., Canberra, Australia

3:10 BREAK

3:40 D-079 X-RAY OPTICS FOR TWO-DIMENSIONAL DIFFRACTIONB.B. He, U. Preckwinkel, Bruker AXS, Inc., Madison, WI

4:00 C-05 RAPID X-RAY REFLECTOMETRY USING DOUBLY CURVED CRYSTALSZ.W. Chen, X-ray Optical Systems, Inc., Albany, NY

4:20 D-105 THE X’CELERATOR: THE REVOLUTION IN POWDER DIFFRACTOMETRYT. Bor, M. Fransen, J. Vasterink, K. Brandt, R. Verbruggen, PhilipsAnalytical, Almelo, The Netherlands

4:40 D-095 DATA PROCESSING AND STRESS MEASUREMENTS BY NEW PORTABLE DIFFRACTOMETERJ.T. Assis, V.I. Monin, F.R. Pereira, P.S. Souza, Instituto Politécnico/UERJ, Riode Janeiro, BrazilT. Gurova, Universidade Federal do Rio de Janeiro, Rio de Janeiro, Brazil

Session,Wednesday p.m. (Buddy’s Run)

Session C-1 NEW DEVELOPMENTS IN XRD & XRF INSTRUMENTATION (Commercial)

Organized by: V.E. Buhrke, The Buhrke Company, Portola Valley, CA

XRD & XRF

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1:50 OPENING REMARKSS.R. Stock, Georgia Institute of Technology, Atlanta, GA

2:00 D-141 THE DEVELOPMENT OF THE X-RAY RIETVELD METHOD – InvitedR.A. Young, Georgia Institute of Technology, Atlanta, GAR.L. Snyder, The Ohio State University, Columbus, OH

2:30 D-069 APATITE STRUCTURES – InvitedJ.C. Elliott, R.M. Wilson, S.E.P. Dowker, University of London, London, UnitedKingdom

3:00 D-113 X-RAY MICROTOMOGRAPHY OF NEONATAL MOUSE BONES.R. Stock, Georgia Institute of Technology, Atlanta, GAK. Igarashi, P.H. Stern, Northwestern University Medical School, Chicago, IL

3:20 BREAK

3:40 D-030 RIETVELD REFINEMENT OF LiCoO2-TYPE LAYERED STRUCTURES: SEMI-QUANTITATIVE ANALYSIS OF Li CONTENTSM.A. Rodriguez, D. Ingersoll, D.H. Doughty, Sandia National Laboratories,Albuquerque, NM

4:00 D-130 APPLICATION OF THE RIETVELD METHOD TO DETERMINE THE STRUCTUREOF BULK METALLIC GLASSESD. Dragoi, E. Ustundag, California Institue of Technology, Pasadena, CAI. Halevy, Negev Nuclear Research Center, Beer-Sheva, IsraelM.S. Somayazulu, J. Hu, Geophysical Laboratory of Carnegie Institution ofWashington, Washington, DC

4:20 D-009 IMPROVED MODELING OF RESIDUAL STRAIN/STRESS AND CRYSTALLITE-SIZE DISTRIBUTION IN RIETVELD REFINEMENTD. Balzar, N.C. Popa, National Institute of Standards & Technology, Boulder, CO

4:40 D-015 IMPROVING THE ACCURACY OF RIETVELD-DERIVED LATTICE PARAMETERSBY AN ORDER OF MAGNITUDEB. O’Connor, S. Pratapa, Curtin University of Technology, Perth, Australia

Session,Wednesday p.m. (Sunshine Peak)

Session D-1 R.A. YOUNG RIETVELD ANALYSISOrganized by: S.R. Stock, Georgia Institute of Technology, Atlanta, GA

R.L. Snyder, The Ohio State University, Columbus, OH

XRD

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2:00 D-063 SEARCHING FOR NEW POLYMORPHS BY PARALLEL CRYSTALLIZATION ANDHIGH-THROUGHPUT X-RAY DIFFRACTION SCREENING – InvitedC.W. Lehmann, MPI fuer Kohlenforschung, Muelheim, Germany

2:30 D-078 RAPID XRD SCREENING FOR COMBINATORIAL CHEMISTRY ON THE MILLISECOND TIME SCALEJ.B. Litteer, U. Preckwinkel, B. Nechkash, B.B. He, K. Smith, Bruker AXS,Inc., Madison, WI

2:50 D-115 USE OF GLANCING ANGLE XRD TO EVALUATE PHASE TRANSITIONS OCCURRING DURING DISSOLUTIONS. Debnath, R. Suryanarayanan, University of Minnesota, Minneapolis, MNP.K. Predecki, University of Denver, Denver, CO

3:10 BREAK

3:30 D-036 INVESTIGATION OF THE STRUCTURAL STABILITY OF MAGNESIUMSTEARATE BY TEMPERATURE AND HUMIDITY CONTROLLED X-RAY DIFFRACTIOND. Beckers, S. Prugovecki, Philips Analytical, Almelo, The NetherlandsE. Mestrovic, University of Zagreb, Croatia

3:50 D-010 STRUCTURE SOLUTION FROM POWDER DIFFRACTION — EXPERIENCE ANDFUTURE DEVELOPMENTSS.J. Maginn, J.C. Cole, R. Taylor, W.D. Samuel Motherwell, J. Luo,Cambridge Crystallographic Data Centre, Cambridge, United KingdomW.I.F. David, K. Shankland, CLRC Rutherford Appleton Laboratory, Oxon, UKH. Nowell, University of Cambridge, Cambridge, United KingdomP.J. Cox, Robert Gordon University, Aberdeen, United Kingdom

4:10 D-098 STRUCTURE DETERMINATION OF [(�4-cod)Pt(N3)2)] FROM X-RAY POWDER DIFFRACTION DATAF. Stowasser, Bruker AXS GmbH, Karlsruhe, GermanyN. Oberbeckmann, M. Winter, K. Merz, R.A. Fischer, Ruhr-UniversitaetBochum, Germany

4:30 D-007 RECENT ADVANCES IN STRUCTURE SOLUTION FROM POWDER DIFFRACTIONDATAC. Liang, Molecular Simulations, Inc., San Diego, CAM.A. Neumann, F.J.J. Leusen, G.E. Engel, S. Wilke, C. Conesa-Moratilla,Molecular Simulations, Ltd., Cambridge, United Kingdom

4:50 D-139 INVESTIGATIONS OF SAMPLES UNDER DIFFERENT TEMPERATURE ANDHUMIDITY CONDITIONSL. Bruegemann, S. Haaga, F. Stowasser, Bruker AXS, Karlsruhe, GermanyH. Leitz, mri, Karlsruhe, GermanyU. Brotzeller, ANSYCO, Karlsruhe, Germany

Session,Wednesday p.m. (Rainbow)

Session D-2 Pharmaceuticals & CombinatorialOrganized by: C. Kidd, Glaxo Wellcome, Research Triangle Park, NC

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XRD

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1:55 OPENING REMARKSJ.V. Gilfrich, Emeritus, SFA, Inc./NRL, Washington, DC

2:10 AN OVERVIEW OF THE APPLICATION OF FUNDAMENTAL PARAMETERS INXRF – InvitedB. Vrebos, Philips Analytical, Almelo, The Netherlands

2:40 F-40 A VERSATILE XRF SOFTWARE IN THE TRACKS OF JOHN CRISSF. Claisse, Corporation Scientifique Claisse, Inc., Quebec, Canada

3:00 F-25 ACCURACY AND TRACEABILITY IN X-RAY FLUORESCENCE MEASUREMENTSV. Roessiger, Helmut Fischer GmbH & Co., Sindelfingen, GermanyM. Haller, Fischer Technology, Inc., Windsor, CT

3:20 BREAK

3:50 F-04 MATRIX-INDEPENDENT XRF METHODS FOR CERTIFICATION OF STANDARDREFERENCE MATERIALS – InvitedJ.R. Sieber, National Institute of Standards & Technology, Gaithersburg, MD

4:20 F-38 FUNDAMENTAL PARAMETER METHOD FOR LOW ENERGY REGION INCLUDING CASCADE EFFECT AND PHOTOELECTRON EXCITATIONN. Kawahara, T. Shoji, T. Yamada, Y. Kataoka, Rigaku Corporation, Osaka,JapanB. Beckhoff, G. Ulm, Physikalisch-Technische Bundesanstalt, Berlin, GermanyM. Mantler, Technische Universität Wien, Wien, Austria

4:40 F-32 QUANTIFICATION OF GALLIUM IN DRIED RESIDUE SAMPLES BY XRF: ANIMPROVED SAMPLE PREPARATION METHOD FOR ANALYZING PLUTONIUMMETALC.G. Worley, Los Alamos National Laboratory, Los Alamos, NM

Session,Wednesday p.m. (Twilight)

Session F-1 John Criss Commemorative Session: Quantitative XRFOrganized by: R. van Grieken, University of Antwerp, Antwerp, Belgium

co-Chair: J.V. Gilfrich, Emeritus, SFA, Inc./NRL, Washington, DC

XRF

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8:00 D-150 MATERIALS CHARACTERIZATION BY MICROFOCUSSED HIGH ENERGY X-RAYS – InvitedU. Lienert, Argonne National Laboratory, Argonne, IL

8:30 D-131 INVESTIGATION OF LOAD-TRANSFER IN Ta-REINFORCED BULK METALLICGLASSES USING HIGH-ENERGY X-RAY DIFFRACTIOND.K. Balch, D.C. Dunand, Northwestern University, Evanston, ILE. Ustundag, S.Y. Lee, California Institute of Technology, Pasadena, CA

8:50 D-132 DAMAGE EVOLUTION IN TiSiC UNIDIRECTIONAL FIBER COMPOSITESG.A. Swift, J.C. Hanan, E. Ustundag, B. Clausen, California Institute ofTechnology, Pasadena, CAI.J. Beyerlein, Los Alamos National Laboratory, Los Alamos, NMJ. Almer, U. Lienert, D. Haeffner, Argonne National Laboratory, Argonne, IL

9:10 D-086 NOVEL X-RAY DIFFRACTION TECHNIQUE FOR STRAIN MEASUREMENTSUSING AREA DETECTOR – InvitedY.S. Chu, D.C. Mancini, F. de Carlo, J.D. Almer, D.R. Haeffner, ArgonneNational Laboratory, Argonne, IL

9:40 D-117 CHARACTERIZATION OF NANOMETER LAYERED STRUCTURES USING MULTIPLE WAVELENGTH X-RAY REFLECTIVITY AND SIMULATED ANNEALING DATA ANALYSISE. Ziegler, C. Ferrero, C. Chapron, C. Morawe, European SynchrotronRadiation Facility, Grenoble, France

10:00 D-123 IN SITU HIGH-TEMPERATURE STUDY OF SILVER BEHENATE REDUCTION TOSILVER METAL USING SYNCHROTRON RADIATIONT. Blanton, M. Lelental, Eastman Kodak Company, Rochester, NYS. Zdzieszynski, S.T. Misture, NYS College of Ceramics at Alfred University,Alfred, NY

10:20 BREAK

10:40 D-062 THE ELECTRON DENSITY DISTRIBUTION OF Ti AND O OCTAHEDORON INPEROVSKITE TYPE OXIDE CRYSTALS ANALYSED BY MAXIMUM ENTROPYMETHODJ. Harada, Rigaku Corporation, Tokyo, JapanM. Sakata, A. Yoshida, E. Nishibori, M. Takata, Nagoya University, Nagoya, JapanY. Akishige, Shimane University, Matsue, JapanY. Kuroiwa, Okayama University, Okayama, Japan

Session,Thursday a.m. (Sunshine Peak)

Session C-2 Synchrotron Applications Organized by: A.T. Macrander, Argonne National Laboratory, Argonne, IL

XRD & XRF

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11:00 D-006 VARIABLE ENERGY X-RAY REFLECTIVITY AND REFLECTION ABSORPTIONFINE STRUCTUREB.K. Tanner, T.P.A. Hase, B.D. Fulthorpe, University of Durham, Durham,United KingdomG.M. Luo, Z.H. Mai, Chinese Academy of Sciences, Beijing, ChinaC.H. Marrows, B.J. Hickey, University of Leeds, Leeds, United Kingdom

11:20 F-11 SYNCHROTRON RADIATION XRF MICROPROBE STUDY OF HUMAN BONETUMOR AND HUMAN FEMORAL HEAD SLICESY. Huang, W. He, Beijing Synchrotron Radiation Facility, Beijing, ChinaY. Zhang, Shanghai Institute of Nuclear Research, Shanghai, ChinaJ. Lu, 306 Hospital of the People’s Liberation Army of China, Beijing, ChinaW. Liao, Shanghai No. 9 People’s Hospital, Shanghai, China

11:40 F-29 LOW-ENERGY X-RAY FLUORESCENCE ANALYSIS BASED ON HIGH-RESOLUTION SUPERCONDUCTING TUNNEL JUNCTION DETECTORSB. Beckhoff, R. Fliegauf, G. Ulm, Physikalisch-Technische Bundesanstalt,Berlin, Germany

12:00 F-35 SYNCHROTRON RADIATION INDUCED �-X-RAY FLUORESCENCE ANDABSORPTION SPECTROSCOPY ON MUNICIPAL SOLID WASTE FLY ASHESM.C. Camerani, B.M. Steenari, O. Lindqvist, Chalmers University ofTechnology, Göteborg, SwedenA. Somogyi, University of Antwerp, Antwerp, BelgiumA. Simionovici, S. Ansell, European Synchrotron Radiation Facility, Grenoble,France

Session,Thursday a.m. (Sunshine Peak)

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8:00 D-003 NON-TRADITIONAL POWDER CRYSTALLOGRAPHY IN THE PETROCHEMICALINDUSTRY – InvitedJ.A. Kaduk, BP Amoco Chemicals, Naperville, IL

8:30 D-077 RIETVELD MODELING OF ETA AND GAMMA ALUMINAR.W. Morton, J.F. Geibel, J.J. Gislason, R.L. Heald, D.E. Lauffer, M.Sardashti, Phillips Petroleum Company - Corporate Technology, Bartlesville, OKD.E. Simon, DES Consulting, Broken Arrow, OK

8:50 D-067 SURFACE AREA DETERMINATION OF INTERSTRATIFIED HYLLOSILICATES INATHABASCA OIL SANDS FROM SYNCHROTRON X-RAY SCATTERING DOMAINSIZEO.E. Omotoso, R.J. Mikula, Natural Resources Canada, Devon AB, CanadaP.W. Stephens, SUNY, Stony Brook, NY

9:10 D-066 CALIBRATION MONITORING OF DIFFRACTOMETERSG. Berti, M. D’Acunto, University of Pisa, Pisa, Italy

9:30 D-143 X-RAY DIFFRACTION IN THE MICROELECTRONICS INDUSTRY – InvitedC.C. Goldsmith, P. De Haven, T.L. Nunes (retired), IBM Microelectronics,Hopewell Junction, NYI.C. Noyan, IBM, Yorktown Heights, NY

10:00 BREAK

10:30 D-073 X-RAY DIFFRACTION IN ALUMINIUM INDUSTRYK.V. Krishnan, Jawaharlal Nehru Aluminium Research Development & DesignCentre, Nagpur, India

10:50 D-070 ONLINE AND REAL-TIME QUANTIFICATION OF CEMENT CLINKERS USING XRDA. Kern, R. Schmidt, Bruker AXS GmbH, Karlsruhe, Germany

11:10 D-125 X-RAY DIFFRACTION AS A PROCESS CONTROL TOOL IN SUPERCONDUCTORAPPLICATIONSK.J. Kozaczek, R.I. Martin, D.S. Kurtz, P.R. Moran, S.P. O’Leary, Hypernex,Inc., State College, PA

11:30 D-022 DETERMINATION OF EMITTER PARAMETERS IN GaInP/GaAs HETEROJUNCTIONBIPOLAR TRANSISTORS BY X-RAY DIFFRACTIONA. Shen, E. Griswold, G. Hillier, L. Dang, D. Clark, I. Calder, HighPerformance Optical Component Solutions, Nortel Networks, Ontario, Canada

Session,Thursday a.m. (Buddy’s Run)

Session D-3 Industrial Applications – XRDOrganized by: F. Chung, Consultant, The Marson Corporation, Boston, MA

XRD

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8:00 D-081 ELECTRON DIFFRACTION CHARACTERIZATION OF NASCENT CONDENSATION POLYMERS – InvitedP.H. Geil, University of Illinois at Urbana-Champaign, Urbana, IL

8:30 D-021 EMERGENCE OF POLYMER PROPERTIES IN POLY-DISPERSE CHAIN ASSEMBLIES — THE STRUCTURAL DISTINCTION BETWEEN LOW MOLECULAR WEIGHT LINEAR POLYETHYLENE AND PETROLEUM WAXES REVEALED BY ELECTRON CRYSTALLOGRAPHY – InvitedD.L. Dorset, ExxonMobil Research & Engineering Company, Annandale, NJ

9:00 D-019 LOW DOSE HIGH RESOLUTION ELECTRON MICROSCOPY (HREM) OFPOLY(METAPHENYLENE ISOPHTHALAMIDE) (MPDI) TWISTED CRYSTALSD.C. Martin, The University of Michigan, Ann Arbor, MID.P. Lawrence, Flint Ink, Ann Arbor, MIC. Kübel, Philips Research Laboratories, Eindhoven, The Netherlands

9:20 D-068 THE STRUCTURE OF POLY(SILYLENEMETHYLENE)SS.-Y. Park, B.L. Farmer, Air Force Research Laboratory, Wright-Patterson AirForce Base, OHT. Zhang, L.V. Interrante, Rensselaer Polytechnic Institute, Troy, NY

9:40 D-138 DNA-LINKED NANOPARTICLE MATERIALS: OPTICAL, ELECTRICAL, ANDSTRUCTURAL PROPERTIESA.A. Lazarides, Northwestern University, Evanston, IL

10:00 BREAK

10:30 D-126 DOUBLE-TWISTED HELICAL LAMELLAR CRYSTALS IN A SYNTHETIC MAIN-CHAIN CHIRAL POLYESTER DETERMINED USING DIFFRACTION METHODS – InvitedS.Z.D. Cheng, C.Y. Li, S. Jin, University of Akron, Akron, OH

11:00 D-041 NEUTRON AND SYNCHROTRON X-RAY FIBER DIFFRACTION STUDIES OFCELLULOSE POLYMORPHSY. Nishiyama, The University of Tokyo, Tokyo, JapanP. Langan, Los Alamos National Laboratory, Los Alamos, NMH. Chanzy, CNRS, Grenoble, France

Session,Thursday a.m. (Twilight)

Session D-4 Polymer Structure I: Multi Probe StudiesOrganized by: K.H. Gardner, DuPont Company – CRD, Willmington, DE

co-Chair: N.S. Murthy, Honeywell Laboratories, Morristown, NJ

XRD

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Session,Thursday a.m. (Twilight)

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11:20 D-147 X-RAY AND NEUTRON FIBRE DIFFRACTION IN THE CHARACTERISATION OFBIOLOGICAL & INDUSTRIAL POLYMERSV.T. Forsyth, I. Parrot, Institute Laue Langevin, Grenoble, France and KeeleUniversity, Staffordshire, United KingdomK.H. Gardner, DuPont CR & D, Wilmington, DEC. Martin, Keele University, Staffordshire, United Kingdom

11:40 D-110 EXCLUDED VOLUME INTERACTIONS BETWEEN CORONAL CHAINS IN BLOCKCOPOLYMER MICELLES: A SANS AND SIMULATION STUDYJ.S. Pedersen, University of Aarhus, Aarhus C, DenmarkC. Svaneborg, M.C. Gerstenberg, K. Almdal, Risø National Laboratory,Roskilde, DenmarkI.W. Hamley, University of Leeds, Leeds, EnglandR.N. Young, University of Sheffield, Sheffield, England

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8:00 F-64 POLY-CAPILLARY BASED MICRO-XRF AND MICRO-XANES BY MEANS OFCONVENTIONAL AND SYNCHROTRON RADIATION – InvitedK. Janssens, University of Antwerp (UIA), Antwerp, Belgium

8:30 POLYCAPILLARY OPTICS: AN ENABLING TECHNOLOGY FOR NEW APPLICATIONS – InvitedD. Gibson, X-ray Optical Systems, Albany, NY

9:00 F-14 DUAL-CAPILLARY OPTIC MXRFG.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NMN. Gao, X-ray Optical Systems, Albany, NY

9:20 F-19 POLYCAPILLARY OPTICS AND X-RAY ANALYTICAL TECHNIQUESY. Yan, X-ray Optical Systems, Inc., Albany, NY and Beijing Normal University,Beijing, P.R. ChinaW.M. Gibson, X-ray Optical Systems, Inc., Albany, NY and University at Albany,SUNY, NY

9:40 F-09 X-RAY FLUORESCENCE MICROANALYSIS OF BIOMEDICAL AND ENVIRON-MENTAL SAMPLES – InvitedM. Lankosz, M. Boruchowska, J. Ostachowicz, University of Mining &Metallurgy, Kraków, Poland

10:10 F-52 MICRO X-RAY FLUORESCENCE SPECTROSCOPY FOR QUALITY CONTROL OFLAYERED MATERIALA. Wittkopp, F. Ferrandino, NeXray, Ronkonkoma, NY

10:30 BREAK

10:50 F-39 A COMPACT, POLYCAPILLARY-BASED MICRO X-RAY FLUORESCENCE ANALYSIS SYSTEMN. Gao, I. Ponomarev, D. Gibson, X-ray Optical Systems, Inc., Albany, NY

11:10 F-43 NON-DESTRUCTIVE ANALYSIS OF COMPLEX LAYER STRUCTURES USINGMICRO X-RAY FLUORESCENCEB. Scruggs, EDAX, Inc., Mahwah, NJM. Haschke, A. Wittkopp, Röntgenanalytik Messtechnik GmbH, Taunusstein,Germany

11:30 F-53 X-RAY MICROBEAM FOR CHARACTERIZATION OF COMBINATORIAL THIN FILMSW. Chang, J. Kerner, E. Franco, ARACOR, Sunnyvale, CAX.D. Xiang, Y.Q. Li, Intematix Corporation, Moraga, CA

Session,Thursday a.m. (Rainbow)

Session F-2 Capillary OpticsOrganized by: G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM

XRF

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2:00 F-60 STEM/SEM X-RAY SPECTRUM IMAGES: FINDING THE NEEDLE IN THEHAYSTACK – InvitedP.G. Kotula, M.R. Keenan, Sandia National Laboratories, Albuquerque, NM

2:30 D-020 A REVIEW OF CONVERGENT-BEAM ELECTRON DIFFRACTION (CBED) – InvitedA. Eades, Lehigh University, Bethlehem, PA

3:00 D-116 ELECTRON BACKSCATTER DIFFRACTION – InvitedA.J. Schwartz, Lawrence Livermore National Laboratory, Livermore, CAJ.R. Michael, Sandia National Laboratories, Albuquerque, NM

3:30 BREAK

4:00 D-064 PRACTICAL DESIGN CONSIDERATIONS OF EBSD SYSTEMSP.P. Camus, D.B. Rohde, Thermo NORAN, Middleton, WI

4:20 D-048 EBSD CAMERA CALIBRATION: THE MOVING SCREEN TECHNIQUE REVISITEDD.A. Carpenter, G.D. Richardson, L.R. Mooney, Y-12 National SecurityComplex, Oak Ridge, Tennessee

4:40 D-075 MICRODIFFRACTION ANALYSIS OF FIBROUS TALC: ASBESTOS IN CRAYONSJ.R. Verkouteren, National Institute of Standards & Technology, Gaithersburg, MDA.G. Wylie, University of Maryland, College Park, MD

Session,Thursday p.m. (Sunshine Peak)

Session C-3 Electron BeamOrganized by: R. Goehner, Sandia National Laboratories, Albuquerque, NM

XRD & XRF

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2:00 D-018 MINIATURIZATION OF X-RAY STRESS ANALYZERT. Goto, Y. Gong, Fukui University of Technology, Nara, Japan

2:20 D-029 STRAIN AND STRESS CHARACTERISATION IN THIN FILMS AND SANDWICHSTRUCTURES AT ELEVATED TEMPERATURESJ. Keckes, University of Leoben, Leoben, Austria

2:40 D-027 SELFCONSISTENT DETERMINATION OF THE X-RAY ELASTIC CONSTANTS OFPOLYCRYSTALLINE MATERIALS FOR ARBITRARY CRYSTAL SYMMETRYN. Koch, H. Wern, HTW des Saarlandes, Saarbrücken, Germany

3:00 D-112 MICRO-STRAIN IN Y0.5R0.5Ba2Cu3O7-x (R=Yb, Tm, Er, Ho, Dy, Gd, Eu, Sm, AND Nd)

E.J. Peterson, W.L. Hults, M. Simpson, J.L. Smith, Los Alamos NationalLaboratory, Los Alamos, NM

3:20 BREAK

3:40 D-129 STRAIN EVOLUTION AFTER FIBER FAILURE IN SINGLE FIBER METALMATRIX COMPOSITESJ.C. Hanan, E. Ustundag, G.A. Swift, B. Clausen, California Institute ofTechnology, Pasadena, CAI.J. Beyerlein, D.W. Brown, M.A.M. Bourke, Los Alamos National Laboratory,Los Alamos, NM

4:00 D-083 MEASUREMENT OF RESIDUAL STRESSES IN FIBER REINFORCED COMPOSITES BASED ON X-RAY DIFFRACTIONB. Benedikt, P.K. Predecki, L. Kumosa, M. Kumosa, University of Denver,Denver, CO

4:20 D-004 COMPACT X-RAY DIFFRACTION TECHNIQUEA. Mozelev, Small Scale Research & Production Company RADICAL,Friedrichsdorf, Germany

Session,Thursday p.m. (Rainbow)

Session D-5 Stress Analysis IOrganized by: C.C. Goldsmith, IBM Microelectronics, Hopewell Junction, NY

co-Chair: T. Sasaki, Kanazawa University, Kanazawa, Japan

XRD

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1:30 D-002 RECENT WORK ON STRAIN-INDUCED CRYSTALLIZATION – InvitedJ. Kornfield, California Institute of Technology, Pasadena, CA

2:00 D-124 X-RAY SCATTERING STUDIES OF THE EARLY STAGES OF CRYSTALLIZATIONIN POLYMER FIBERS – InvitedJ.M. Schultz, University of Delaware, Newark, DE

2:30 D-108 SAXS STUDIES OF POLYMER MELTINGB. Crist, Northwestern University, Evanston, IL

2:50 D-061 UNFOLDING OF ULTRA-LONG ALKANES BY X-RAY DIFFRACTIONA.E. Terry, European Synchrotron Radiation Facility, Grenoble, FranceJ.K. Hobbs, T.L. Phillips, University of Bristol, Bristol, United Kingdom

3:10 D-107 IN-SITU SAXS ON A PERFLUOROSULFONATE IONOMERJ.D. Londono, S. Mazur, R.V. Davidson, E.I. DuPont De Nemours, DuPontCR&D, Wilmington, DE

3:30 BREAK

3:50 D-140 APPLICATION OF SYNCHROTRON RADIATION IN THE STUDIES OF UNIAXIALAND BIAXIAL DEFORMATION OF POLYMERS – InvitedA. Mahendrasingam, C. Martin, S. Bingham, A.K. Wright, D.J. Blundell, W.Fuller, Keele University, Staffordshire, United Kingdom

4:20 D-121 FULL-PATTERN PARAMETERIZATION OF 2-D SMALL-ANGLE SCATTERINGDATA FROM ORIENTED POLYMERS AND SIGNIFICANCE OF THESE PARAMETERS – InvitedN.S. Murthy, Honeywell Laboratories, Morristown, NJD.T. Grubb, Cornell University, Ithaca, NY

4:50 D-047 CHARACTERIZATION OF CRYSTALLINITY IN POLYPROPYLENE BY WIDEANGLE X-RAY DIFFRACTIONJ.H. Butler, ExxonMobil Chemical Company, Baytown, TXD.J. Winter, R.B. Ortega, AMIA Laboratories, The Woodlands, TX

Session,Thursday p.m. (Twilight)

Session D-6 Polymer Structure II & III: IN SITU STRUCTUREDEVELOPMENT/2D WAXS AND SAXS DATA ANALYSIS

Organized by: R. Barton, Jr., DuPont Experimental Station, Wilmington, DE

co-Chair: J.D. Londono, DuPont Company – CRD, Wilmington, DE

XRD

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5:10 D-035 TEXTURE EVOLUTION IN ETHYLENE-OCTANE COPOLYMER DURING UNIAXIAL TENSIOND. Li, H. Garmestani, FAMU-FSU College of Engineering, Tallahassee, FL

5:30 D-134 THREE-DIMENSIONAL MICROSTRUCTURE BY SAS AND WAD USING TEMPERATURE-INDUCED CONTRAST VARIATIONJ.D.Barnes, JDB Science, Chevy Chase, MDR. Kolb, Exxon-Mobil Corp.W. Bras, Dubble ESRF

Session,Thursday p.m. (Twilight)

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Session,Thursday p.m. (Buddy’s Run)

Session F-3 TXRFOrganized by: M.A. Zaitz, IBM Microelectronics, Hopewell Junction, NY

1:40 F-28 TXRF ANALYSIS OF LOW Z ELEMENTS ON SILICON WAFER SURFACES EXCITED BY MONOCHROMATIZED UNDULATOR RADIATIONB. Beckhoff, R. Fliegauf, G. Ulm, J. Weser, Physikalisch-TechnischeBundesanstalt, Berlin, GermanyG. Pepponi, C. Streli, P. Wobrauschek, Atominstitut der ÖsterreichischenUniversitäten, Wien, AustriaL. Fabry, S. Pahlke, Wacker Siltronic AG, Burghausen, Germany

2:00 F-50 SYNCHROTRON RADIATION TXRF: NEW RESULTSP. Pianetta, K. Baur, S. Brennan, A. Singh, Stanford Synchrotron RadiationLaboratory, Stanford, CA

2:20 F-08 TXRF FOR SEMICONDUCTOR APPLICATIONS – InvitedY. Mori, Nippon Steel Corporation, Yamaguchi, Japan

2:50 F-22 TOTAL REFLECTION X-RAY FLUORESCENCE FOR ENVIRONMENTAL SAMPLES – InvitedM. Schmeling, Loyola University Chicago, Chicago, IL

3:20 BREAK

3:40 F-48 FOCUSED BEAM TOTAL REFLECTION X-RAY FLUORESCENCE ANALYSISUSING DOUBLY CURVED CRYSTAL OPTICSZ.W. Chen, X-ray Optical Systems, Inc., Albany, NY

4:00 F-12 STUDY OF THE DIFFUSING BEHAVIOR OF MoO3 and ZnO ON OXIDE THINFILMS BY SYNCHROTRON RADIATION TXRFY. Huang, W. He, Beijing Synchrotron Radiation Facility, Beijing, ChinaW. Xu, J. Xu, N. Wu, J. Yan, Y. Xie, Institute of Physical Chemistry, PekingUniversity, Beijing, ChinaY. Zhu, Analysis Center, Tsinghua University, Beijing, China

4:20 F-17 INVESTIGATION OF ADSORBED MERCURY DISTRIBUTION IN SILVER COATEDFILTERS BY X-RAY FLUORESCENCE METHODSS. Kurunczi, Sz. Török, KFKI - Atomic Energy Research Institute, Budapest, HungaryJ.W. Beal, Fairfield University, Fairfield, CT

4:40 C-1 PHYSICS AND PRACTICAL USING OF A PLANAR X-RAY WAVEGUIDEV.K. Egorov, IPMT RAS, Chernogolovka, Moscow Dist., RussiaE.V. Egorov, MEPhI, Moscow, Russia

XRF

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8:00 D-151 DESKTOP X-RAY TOMOGRAPHY: INSTRUMENTATION AND APPLICATIONS – InvitedD. Van Dyck, University of Antwerp, Antwerp, Belgium

8:30 F-34 POLYCAPILLARY OPTICS BASED NEUTRON FOCUSING FOR SMALL SAMPLENEUTRON CRYSTALLOGRAPHYW.M. Gibson, R. Youngman, X-ray Optical Systems, Inc., Albany, NYH.H. Chen-Mayer, D.F.R. Mildner, H.J. Prask, T. Gnäupel-Herold, NationalInstitute of Standards & Technology, Gaithersburg, MDA.J. Schultz, M.E. Miller, R. Vitt, Argonne National Laboratory, Argonne, IL

8:50 D-133 INVESTIGATION OF FIBER/MATRIX INTERFACES USING X-RAY MICROTOPOGRAPHYJ.C. Hanan, E. Ustundag, C.C. Aydiner, G.A. Swift, California Institute ofTechnology, Pasadena, CAS.K. Kaldor, I.C. Noyan, T.J. Watson Research Center, Yorktown Heights, NY

9:10 F-30 COMPARISON OF STANDARDS OF PERFORMANCE FOR MONOLITHIC POLYCAPILLARY FOCUSING OPTICSS. Formica, X-ray Optical Systems, Inc., Albany, NY and University at Albany,Albany, NYD. Gibson, X-ray Optical Systems, Inc., Albany, NYS.M. Lee, University at Albany, Albany, NY

9:30 C-02 MONOCHROMATIC MICRO X-RAY BEAM USING DOUBLY CURVED CRYSTALOPTICSZ.W. Chen, X-ray Optical Systems, Inc., Albany, NY

9:50 D-028 PREDICTING FATIGUE FAILURE USING TWO DIMENSIONAL X-RAY DETECTORSM.O. Eatough, R.G. Tissot, R.P. Goehner, Sandia National Labs, Albuquerque, NM

10:10 BREAK

10:30 F-13 QUANTITATIVE ANALYSIS USING MICRO X-RAY FLUORESCENCE – InvitedG.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM

11:00 D-111 MONOCAPILLARY SYSTEMS FOR QUANTITATIVE LAB MICRODIFFRACTION –InvitedD.X. Balaic, Australian X-ray Capillary Optics Pty. Ltd., Parkville, Australia

11:30 C-06 FOCUSING OF HARD X-RAY RADIATION BY FRESNEL MODIFIED ZONE PLATESV.V. Aristov, A.A. Isoyan, A.V. Kuyumchyan, E.V. Shulakov, M.V. Grigor’ev,Russian Academy of Science, Moscow District, Russia

Session, Friday a.m. (Buddy’s Run)

Session C-4 Microbeam AnalysisOrganized by: K. Janssens, University of Antwerp (UIA), Antwerp, Belgium

XRD & XRF

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8:20 D-074 A STUDY OF TWINNING EVOLUTION IN ZIRCONIUM BY NEUTRON DIFFRACTION AND POLYCRYSTALLINE MODELINGP. Rangaswamy, D.W. Brown, G.C. Kaschner, C. Tome, M.A.M. Bourke,M.G. Stout, Los Alamos National Laboratory, Los Alamos, NM

8:40 D-097 UNIAXIAL TENSILE DEFORMATION OF URANIUM 6 WEIGHT PERCENT NIOBIUM; A NEUTRON DIFFRACTION STUDY OF DEFORMATION TWINNINGD.W. Brown, M.A.M. Bourke, P.S. Dunn, R.D. Field, M.G. Stout, D.J.Thoma, Los Alamos National Laboratory, Los Alamos, NM

9:00 D-001 THE USE OF XRD RESIDUAL STRESS DETERMINATION TECHNIQUE FORHYDROGEN EMBRITTLEMENT DETECTION ON HIGH-STRENGTH STEEL AND SHOT-PEENING TREATMENTS EVALUATION ON Ti-6Al-4V ALLOYR. Capriotti, M. Colavita, F. De Paolis, Italian Air Force, Pratica di Mare (RM), Italy

9:20 D-082 STRAIN AND TEXTURE MEASUREMENTS USING HIGH-ENERGY X-RAYSJ. Almer, U. Lienert, D. Haeffner, Argonne National Laboratory, Argonne, ILM. Oden, Linkoping University, Linkoping, Sweden

9:40 BREAK

10:00 D-032 ANALYSIS OF STEEP STRESS GRADIENT BY USING SYNCHROTRON RADIATIONK. Akita, H. Suzuki, Tokyo Metropolitan University, Tokyo, JapanY. Yoshioka, Musashi Institute of Technology, Tokyo, Japan

10:20 D-026 A NEW REGULARIZATION METHOD TO DETERMINE STRAINS/STRESS DEPTHPROFILES FROM DIFFRACTION EXPERIMENTSH. Wern, P. Klein, G. Marchand, HTW des Saarlandes, Saarbrücken, Germany

10:40 D-145 BENDING TECHNIQUES FOR X-RAY ELASTIC CONSTANTS DETERMINATION –InvitedI.C. Noyan, IBM, Yorktown Heights, NYS.K. Kaldor, Columbia University, New York, NY

Session, Friday a.m. (Rainbow)

Session D-7 Stress Analysis IIOrganized by: C.C. Goldsmith, IBM Microelectronics, Hopewell Junction, NY

co-Chair: T. Sasaki, Kanazawa University, Kanazawa, Japan

XRD

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8:00 D-155 X-RAY PHASE CONTRAST IMAGING – InvitedW.-K. Lee, Argonne National Laboratory, Argonne, IL

8:30 D-154 X-RAY OPTICS FOR A 3-D X-RAY CRYSTAL MICROSCOPE: SUBMICRON POLY-CHROMATIC DIFFRACTION FROM POLYCRYSTALLINE MATERIALS – InvitedG. Ice, Oak Ridge National Laboratory, Oak Ridge, TN

9:00 D-076 DEVELOPMENT OF INTERFEROMETRIC X-RAY IMAGING AT THE ADVANCEDPHOTON SOURCEK. Fezzaa, W.-K. Lee, Argonne National Laboratory, Argonne, IL

9:20 D-049 SAGITTAL FOCUSING OF HIGH-ENERGY X-RAYS – InvitedZ. Zhong, D.P. Siddons, C.C. Kao, J.B. Hastings, NSLS, Brookhaven NationalLaboratory, Upton, NYN. Zhong, Medical Dept., Brookhaven National Laboratory, Upton, NY

9:50 D-017 COLLIMATING AND FOCUSING POLYCAPILLARY OPTICS FOR POWDER DIFFRACTIONH. Huang, C.A. MacDonald, University at Albany, Albany, NYW.M. Gibson, I. Ponomarev, X-ray Optical Systems, Inc., Albany, NYJ. Chik, A. Parsegian, National Institutes of Health, Bethesda, MD

10:10 BREAK

10:30 D-080 XRD CHARACTERIZATION AND MODELLING OF EPITAXIAL PEROVSKITEPb(ZrxTil-x)O3 FILMS GROWN UNDER HYDROTHERMAL CONDITIONS

K. Mikulka-Bolen, T. Ryan, Emcore, Inc., Somerset, NJM. Oledzka, W. Suchanek, V. Kogan, Philips Analytical, Almelo, NetherlandsW. Mayo, R. Riman, Ceramare Corp., Highland Park, NJ

10:50 D-013 HIGH RESOLUTION POWDER DIFFRACTOMETER INSTALLED ON SPring-8 –InvitedM. Takata, E. Nishibori, K. Kato, M. Sakata, Nagoya University, Nagoya, JapanY. Kubota, Osaka Women’s University, Osaka, JapanY. Kuroiwa, Okayama University, Okayama, Japan

Session, Friday a.m. (Twilight)

Session D-8 General Optics & High Resolution XRDOrganized by C.-C. Kao, Brookhaven National Laboratory, NSLS, Upton, NY

D. Haeffner, Argonne National Laboratory, Argonne, ILJ. Harada, Rigaku Corporation, Tokyo, Japan

co-Chair: T.C. Huang, Emeritus, IBM Almaden Research Center, San Jose, CA

XRD

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11:20 D-005 HIGH-RESOLUTION PARALLEL-BEAM POWDER DIFFRACTION MEASUREMENTOF SUB-SURFACE DAMAGE BELOW POLISHED SURFACES OF CERAMICSB.K. Tanner, T.P.A. Hase, University of Durham, Durham, United KingdomH.Z. Wu, University of Oxford, Oxford, United Kingdom

11:40 D-043 X-RAY DIFFRACTION STUDIES OF HETEROEPITAXIAL GROWTH OF RAREEARTH FLUORIDE FILMSK. Inaba, J. Harada, K. Omote, Rigaku Corporation, Tokyo, JapanJ.M. Ko, A. Yoshikawa, Tohoku University, Sendai, Japan

12:00 D-046 DIFFUSE X-RAY SCATTERING FROM GaAs/AlAs SUPERLATTICES: NEW THEORETICAL APPROACH FOR DATA INTERPRETATIONA. Ulyanenkov, H. Ress, Bruker AXS, Karlsruhe, GermanyI. Feranchuk, A. Minkevich, Belorussian State University, Minsk, BelarusJ. Grenzer, Potsdam University, Potsdam, Germany

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8:00 C-07 XRF AND XRD APPLICATIONS IN IRON AND STEEL INDUSTRY – InvitedR. Yellepeddi, ARL SA, Ecublens, Switzerland

8:30 HIGH FREQUENCY ON-LINE XRF ANALYSIS FOR RAW FEED CONTROL INCEMENT PLANTS – InvitedJ. Kemmerer, FLS Automation, Hunt Valley, MD

9:00 F-54 Sr-XRF INVESTIGATION OF HUMAN BONEP. Wobrauschek, G. Pepponi, C. Streli, C. Jokubonis, Atominstitut der Österreichischen Universitäten, Vienna, AustriaG. Falkenberg, HASYLAB, DESY, Hamburg, GermanyW. Osterode, Universitätsklinik für Innere Medizin IV, Vienna, Austria

9:20 F-18 XRF ANALYSIS OF AUTOMOTIVE CATALYSTS BY FLUX/FUSIONA.R. Drews, Ford Research Laboratories, Dearborn, MI

9:40 F-27 COMPOSITION MEASUREMENTS OF SnPb SOLDER BUMP ON C4 FLIP CHIPINTERCONNECTION FOR SEMICONDUCTOR PACKAGE INDUSTRYT. He, CMI International Corporation, Elk Grove Village, IL

10:00 BREAK

10:20 F-21 ANALYSIS OF LEAD IN CANDLE PARTICULATE EMISSIONS BY XRF USINGUNIQUANT 4S.J. Wasson, Z. Guo, U.S. EPA, Research Triangle Park, NC

10:40 F-06 A SAFE, QUICK AND RELIABLE FUSION METHOD FOR SILICON AND FERROSILICONJ. Blanchette, Corporation Scientifique Claisse, Inc., Sainte-Foy (Québec), Canada

11:00 F-42 USE OF MICRO-BEAM X-RAY FLUORESCENCE AS AN EFFECTIVE ANALYTICAL TOOL FOR COMBINATORIAL CHEMISTRYM. Haschke, Röntgenanalytik Messtechnik GmbH, Taunusstein, GermanyJ. Klein, U. Vietze, W. Stichert, HTE GmbH, Heidelberg, Germany

Session, Friday a.m. (Sunshine Peak)

Session F-4 Industrial Applications — XRFOrganized by: D. Broton, Construction Technology Labs, Skokie, IL

XRF

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Summer Activities in Steamboat Springs*

Steamboat Springs Pro Rodeo Series: PRCA-sanctioned, award-winning rodeo; downtown.

River Tubing: Includes shuttle; available on the Yampa River from Rotary Park to downtown.

Whitewater Rafting: Half day and full day trips available, including lunch and transportation.

Strings in the Mountains Concert Series: Early July through August; adjacent to the hotel featuringrenowned international musicians.

Mountain Bike Trails: At the Steamboat Ski Area; can be accessed from the Sheraton.

Kids’ Adventure Club: All day supervised activities for children 4–12; includes lunch.

Golf—Sheraton’s Robert Trent Jones II: 18-hole championship mountain course.

Golf—Haymaker Golf Course: Links style municipal course.

Horseback Riding: 1 hour, 2 hour, half and full day trips at several locations.

Stream and Lake Fishing: At Steamboat Lake or Stagecoach Reservoir.

Miniature Golf: Available downtown and next to the Chamber building.

Hot Air Balloon Rides: A scenic adventure above the Yampa Valley.

Bicycle Rentals and Tours: Available on the mountain or downtown.

Fish Creek Falls: One of Steamboat’s most popular attractions!

Hiking: Inquire about the area’s expansion hiking trail system.

Trail Steak Dinner Rides: Several scenic locations available.

Nature Walks: Walking maps available for self-guided tours.

Gondola Rides: On the Silver Bullet high-speed gondola.

Floating River Fishing: On the Elk or Yampa Rivers.

Bowling: The Snowbowl, located west of Steamboat.

Kayaking: On the Yampa River’s kayak course.

Rock Climbing: Half day outing available.

Most activities may be booked with Sheraton’s Concierge Staff,located in hotel lobby, Ext. 1005.

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*Reprinted with permission from Sheraton Steamboat Resort, Steamboat Springs, CO.

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Directions to Sheraton Steamboat Resort*

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*Reprinted with permission from Sheraton Steamboat Resort, Steamboat Springs, CO.

Driving from Denver International AirportThe opportunity to drive to Steamboat Springs may be a high point of your Coloradoadventure. You’ll see wildlife, blue skies, beautiful mountain scenery and wide open ranchlands. It is an easy drive from Denver, but it will take you worlds away!

Steamboat is just 169 miles from Denver International Airport (DIA), or a pleasant 3.5hour drive. From Denver, head west on I-70 through the Eisenhower Tunnel. En route,you’ll pass historic Georgetown, with its numerous antique shops and a viewing area ofRocky Mountain bighorn sheep. On the western side of the Eisenhower Tower, exit onColorado 9 at Silverthorn. Here you’ll find factory outlet shops from Liz Claiborne to Levi!

From Silverthorn, head north on Colorado 9 along the Blue River, 40 minutes toKremmling, the hunting capital of Northwest Colorado.

Turn left onto US Highway 40 toward Steamboat, just 53 miles west. En route, you’ll passthrough the Rockies’ high plains and grazing lands before you begin a gradual ascent tothe famed Rabbit Ears Pass. Be sure to look for the “Ears” rock formation.

Upon decending the pass, you’ll see Lake Catamount on your left, next to the popularStagecoach Resevoir State Park. You’ll also be able to view the Flat Tops Wilderness Areaand part of the Gore Range, that surrounds Vail, in the distance. The Yampa Valley willunfold before you, and as the legend goes, you will then be captivated and always want toreturn! The highway leads right to the Mt. Werner exit, which takes you to the SheratonSteamboat Resort. Follow Mt. Werner Road north to Mt. Werner Circle; look for theSheraton Steamboat Resort.

Driving from Yampa Valley Regional Airport in HaydenYampa Valley Regional Airport (HDN) in Hayden is located 22 miles west of Steamboaton US Highway 40. Driving to Steamboat, follow US Highway 40 east to the Mt. Wernerexit, turn north on Mt. Werner Road to Mt. Werner Circle and the Sheraton SteamboatResort.

Ground TransportationAnother option from either Yampa Valley Regional Airport (HDN) in Hayden or DenverInternational Airport (DIA) is to book a shuttle. This is a nice option for those who sim-ply want to sit back and enjoy the scenery, and leave all the driving to someone else!Alpine Taxi out of Steamboat, offers this service from both DIA and the Yampa ValleyRegional Airport. 800-343-RIDE

Once in Steamboat, the city offers complimentary scheduled shuttle service throughoutthe town and ski area.

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Sheraton Steamboat Resort*Hotel Layout

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Area Maps*

*Reprinted with permission from Sheraton Steamboat Resort, Steamboat Springs, CO.

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Program-At-A-Glance

30 July – 3 August 2001

Sun. eve.: 5:30-7:30 Welcoming Reception Sponsored by: Bede Scientific, SPEX CertiPrep & Claisse Scientifique (SP)

Mon. eve.: 6:30-8:30 XRD Poster Session I (Cox, Snyder) (SP)

Day & Time XRD & XRF XRD XRF

MON. am:

Workshops

W-1 Cement Analysis(Broton/Anzelmo) (TWI)

W-2 Small Angle Scattering(Londono) (RB)

W-3 Intro to XRF(Jenkins/Croke) (SP)W-4 Total Reflection(Zaitz/Wobrauschek) (BR)

MON. pm:

Workshops

W-5 Absorption Analysis(Rosenfeld) (RB)W-6 Use of the Web as aResource(Kottenhahn) (BR)

W-7 Maintenance and Calibration of X-rayFluorescence Spectrometers(Croke/Jenkins) (SP)W-8 Fundamental Parameters(Mantler) (TW)

TUE. am:

Workshops

W-9 Industrial Rietveld Applications(Morton/Simon) (SP)W-10 Two-Dimensional XRD(Blanton/He) (TW)W-11 Neutron Diffraction of Polymers(Gardner) (RB)

W-12 Specimen Preparation I(Broton/Anzelmo) (BR)

Tue. eve.: 6:30-8:30 MDI and Rigaku/USA Reception and XRD Poster Session II (Huang, Predecki). Sponsored by: MDI and Rigaku/USA (SP)

Wed. am: 8:30-12:30 Plenary Session: “Fifty Years of the Denver X-ray Conference” (Jenkins/Gilfrich) (SGH)

Thurs. eve: 50th Anniversary Poster Session and Reception. Sponsored by the Denver X-ray Conference (Poolside/Anniversary Tent)

WED. pm:

Sessions

C-1 New Developments inXRD & XRF Instrumentation(Commercial)(Buhrke) (BR)

D-1 R.A. Young Rietveld Analysis(Stock/Snyder) (SP)D-2 Pharmaceuticals & Combinatorial(Kidd) (RB)

F-1 John Criss Commemorative Session:Quantitative XRF(van Grieken/Gilfrich) (TW)

THURS. am:

Sessions

C-2 Synchrotron Applications(Macrander) (SP)

D-3 Industrial Applications – XRD(Chung) (BR)D-4 Polymers I: Multi-Probe Studies(Gardner/Murthy) (TW)

F-2 Capillary Optics(Havrilla) (RB)

THURS. pm:

Sessions

C-3 Electron Beam(Goehner) (SP)

D-5 Stress Analysis I(Goldsmith/Sasaki) (RB)D-6 Polymers II: 2DWAXS & SAXS DataAnalysis/In Situ Struc. Dev.(Barton/Londono) (TW)

F-3 TXRF(Zaitz) (BR)

FRI. am:

Sessions

C-4 Microbeam Analysis(Janssens) (BR)

D-7 Stress Analysis II(Goldsmith/Sasaki) (RB)D-8 General Optics & High Resolution(Kao/Haeffner/Harada/Huang) (TW)

F-4 Industrial Applications – XRF(Broton) (SP)

TUE. pm:

Workshops

W-13 Maintenance, Alignment & Standards(Noyan) (SP)W-14 High Resolution XRD(Tanner) (TW)

W-15 Specimen Preparation II(Broton/Anzelmo) (BR)

Meeting Rooms: BR= Buddy’s Run, RB= Rainbow, SP= Sunshine Peak, TWI= Twilight,SGH= Steamboat Grand Hotel

Any changes to the program will be reflected in the Book of Abstracts and on the DenverX-ray Conference web page: http://www.dxcicdd.com.

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Wed. eve: 6:30 – 8:30 Bruker AXS, Inc. Reception and XRF Poster Session (Gilfrich/Havrilla). Sponsored by: Bruker AXS, Inc. (SP)

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2001 Denver X-ray Conference Registration FormSheraton Steamboat Resort, Steamboat Springs, Colorado, U.S.A.

30 July – 3 August 2001Please circle the workshops that you plan to attend:

W-1 W-2 W-3 W-4 W-5 W-6 W-7 W-8 W-9 W-10 W-11 W-12 W-13 W-14 W-15

The reduced registration fee will only be applied if registration form and payment are received on or before 10 July 2001.

Registration Fees: by July 10 after July 10

Full week: exhibits, workshops, sessions† $300 $375

Monday & Tuesday: exhibits, workshops† $250 $325

Wed., Thurs. & Friday: exhibits, sessions† $250 $325

Session organizers, invited speakers and workshop instructors† $100 $100

Students, unemployed X-ray people, and persons 65 $50 $50and older‡: full week – exhibits, workshops, sessions

†Includes a copy of Volume 45 of Advances in X-ray Analysis on CD-ROM‡Students and those unemployed must have their status confirmed by phone or letter to the Conference Coordinator (see information at bottom of

page). Students registering at the conference are required to show I.D.

Advances in X-ray Analysis, Cumulative Volumes 1–39 on CD-ROM: $350

Advances in X-ray Analysis, Volume 40 on CD-ROM: $150

Advances in X-ray Analysis, Volume 41 on CD-ROM: $150

Advances in X-ray Analysis, Volume 42 on CD-ROM: $150

Advances in X-ray Analysis, Volume 43 on CD-ROM: $150

Powder Diffraction✰–Individual one year subscription for the year 2002 (Choose one):U.S. & Canada: Online: $60 Print: $60 Print & online: $70Outside U.S. & Canada: Online: $60 Print: $85 Print & online: $100Powder Diffraction✰–Institutional one year subscription for the year 2002 (Choose one):Worldwide: Online: $90 Print: $105 Print & online: $120

✰See further information regarding Powder Diffraction on page 2 of this program

Please print clearly to avoid errors on name tags and registration list.

Name

Organization

Address

City State Zip Country

Phone Fax E-mail

Payment:Total Amount Due:

❑ Check enclosed for made payable to ICDD/DXC

❑ Charge my: ❑ Visa ❑ Mastercard ❑ American Express

Card number Expiration date

Signature

Send registration form and payment to: ICDD, Denise Flaherty, Conference Coordinator, 12 Campus Boulevard,Newtown Square, PA 19073-3273, U.S.A. � E-mail [email protected] � phone 610-325-9814 � fax 610-325-9823

Return by 10 July 2001

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