Field Ion Microscopy

Presented byNishant Kumar Sony

16PH62R03

content

• Introduction• Essential instrumentation and design• Basic Principle• Advantages• Application

Introduction

• It is a type of microscope that can be used to image the arrangement of atoms at the surface of a sharp metal tip.

• First Field ion microscope (FIM) was invented by Müller in 1951.

• FIM, provides atomic-resolution imaging of the surface of a specimen.

• FIM is a projection type microscope.

Essential Instrumentation and Design

Basic principle• FIM is differ considerably from those other of

optical and electron microscopy.• Image is produce by the applying of high

voltage to the specimen with respect to the channel plate screen.

• Required field strength at the sample surface measure up to 50v/nm.

• Needle shape of specimen is prepared with average radius of curvature 10-100nm.

• The electric field at the apex of the specimen is of the order of 1010 V m–1.

Seeing Atom

Application

• Orientation• Radios of curvature• Shank angle• Image compression factor• Surface diffusion process

Refreances

• http://www.springer.com/978-1-4614-3435-1• E.W. M€uller, J. Appl. Phys. 27(5), 474–476

(1956)• E.W. M€uller, Phys. Rev. 102(3), 618–624

(1956)

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