Fault-Tolerant Techniques and Nanoelectronic Devices
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Transcript of Fault-Tolerant Techniques and Nanoelectronic Devices
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Fault-Tolerant Fault-Tolerant Techniques and Techniques and
Nanoelectronic DevicesNanoelectronic Devices
Andy HillAndy Hill
CH E 5480 995CH E 5480 995
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AbstractAbstract
Proposed nanocomputers offer Proposed nanocomputers offer faster, more powerful computingfaster, more powerful computing
Problems expectedProblems expected– High manufacturing defect rateHigh manufacturing defect rate– Transient errorsTransient errors
Two possible solutionsTwo possible solutions– Increase manufacturing efficiencyIncrease manufacturing efficiency– Increase device’s capacity for defectsIncrease device’s capacity for defects
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Abstract (cont’d)Abstract (cont’d)
Most nanoelectronic device research Most nanoelectronic device research today is devoted to reducing the size today is devoted to reducing the size of devicesof devices
Fault-tolerant technique research Fault-tolerant technique research shows that the reconfiguration shows that the reconfiguration method is:method is:– Can handle the highest defect rateCan handle the highest defect rate– Cannot handle the current defect rateCannot handle the current defect rate– May be impracticalMay be impractical
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IntroductionIntroduction
First computer invented had one First computer invented had one function – to solve linear equationsfunction – to solve linear equations
Always a push to be faster, more Always a push to be faster, more powerfulpowerful
Other technologies would aid Other technologies would aid tremendously from more powerful tremendously from more powerful computers computers – MilitaryMilitary– Artificial IntelligenceArtificial Intelligence– Medical / BiologicalMedical / Biological
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Literature ReviewLiterature Review
Fault-tolerant techniques have been Fault-tolerant techniques have been studied for over half a centurystudied for over half a century
Research focused on application of Research focused on application of technique technique
Current research focused on Current research focused on techniques for chips with 10techniques for chips with 1012 12 devices devices in 1 square cmin 1 square cm
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Lit Review (cont’d)Lit Review (cont’d)
Nanoelectronic device research Nanoelectronic device research mainly focused on producing mainly focused on producing molecular scale devicesmolecular scale devices
Limited research on the production of Limited research on the production of those devicesthose devices
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Theoretical BackgroundTheoretical Background
Main fault-tolerant techniquesMain fault-tolerant techniques– Redundancy (RMR, CTMR)Redundancy (RMR, CTMR)– NAND multiplexingNAND multiplexing– ReconfigurationReconfiguration
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RedundancyRedundancy
R-fold (RMR) redundancy (R-fold (RMR) redundancy (leftleft) is a function of cascaded triple ) is a function of cascaded triple (CTMR) redundancy ((CTMR) redundancy (rightright))
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Multiplexing / ReconfigMultiplexing / Reconfig
NAND multiplexingNAND multiplexing– Complex system utilizing majority gates Complex system utilizing majority gates
and NAND logicand NAND logic– Adaptive to decreasing manufacturing Adaptive to decreasing manufacturing
effficiencyeffficiency ReconfigurationReconfiguration
– Units not working are detectedUnits not working are detected– Cluster reconfigured accordinglyCluster reconfigured accordingly
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Current ResearchCurrent Research
Research comparing techniques Research comparing techniques shows reconfiguration can adapt to shows reconfiguration can adapt to highest defect rates, but may be highest defect rates, but may be impracticalimpractical [1]
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Current research (cont’d)Current research (cont’d)
Nanoelectronic devices being Nanoelectronic devices being researched are 100 to 1000 times researched are 100 to 1000 times smaller than current devicessmaller than current devices
[2]
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Future DirectionsFuture Directions
Continue research of techniques Continue research of techniques specific to nano-scaled devicesspecific to nano-scaled devices– Determine practicality of reconfigurationDetermine practicality of reconfiguration
Continue research developing Continue research developing nanoelectronic devicesnanoelectronic devices
Research the efficiency of mass Research the efficiency of mass producing devicesproducing devices
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ReferencesReferences
[1] - K Nikolic, A Sadek and M Forshaw [1] - K Nikolic, A Sadek and M Forshaw 2002 Fault-tolerant techniques for 2002 Fault-tolerant techniques for nanocomputersnanocomputers NanotechnologyNanotechnology 1313 357-362 357-362
[2] - Goldhaber-Gordon D. [2] - Goldhaber-Gordon D. et al.et al. 1997 1997 Overview of Nanoelectronic Devices Overview of Nanoelectronic Devices Proceedings of the IEEE Proceedings of the IEEE 8585 (4) (4)