Fall 2006, Nov. 30 ELEC 5270-001/6270-001 Lecture 12 1 ELEC 5270-001/6270-001(Fall 2006) Low-Power...

Fall 2006, Nov. 30Fall 2006, Nov. 30 ELEC 5270-001/6270-001 Lecture 12ELEC 5270-001/6270-001 Lecture 12 11

ELEC 5270-001/6270-001(Fall ELEC 5270-001/6270-001(Fall 2006)2006)

Low-Power Design of Electronic CircuitsLow-Power Design of Electronic Circuits

Test PowerTest Power

Vishwani D. AgrawalVishwani D. AgrawalJames J. Danaher ProfessorJames J. Danaher Professor

Department of Electrical and Computer Department of Electrical and Computer EngineeringEngineering

Auburn University, Auburn, AL 36849Auburn University, Auburn, AL 36849http://www.eng.auburn.edu/~vagrawalhttp://www.eng.auburn.edu/~vagrawal

[email protected]@eng.auburn.edu

http://www.eng.auburn.edu/~vagrawal

mailto:[email protected]


Test Power ProblemTest Power Problem

A circuit is designed for certain function. Its A circuit is designed for certain function. Its design must allow the power consumption design must allow the power consumption necessary to execute that function.necessary to execute that function.

Power buses are laid out to carry the Power buses are laid out to carry the maximum current necessary for the function.maximum current necessary for the function.

Heat dissipation of package conforms to the Heat dissipation of package conforms to the average power consumption during the average power consumption during the intended function.intended function.


Testing Differs from Testing Differs from FunctionFunction

VLSI chip

system

Systeminputs

Systemoutputs

Functional inputs Functional outputs

Other chips


Basic Mode of TestingBasic Mode of Testing

VLSI chipTest vectors:

Pre-generated and stored in

ATE

DUT output for comparison with expected response stored in ATE

Automatic Test Equipment (ATE):Control processor, vector memory,timing generators, power module,

response comparator

PowerClock

Packaged or unpackaged device under test (DUT)


Functional Inputs vs. Test Functional Inputs vs. Test VectorsVectors

Functional inputs:Functional inputs: Functionally Functionally

meaningful signalsmeaningful signals Generated by circuitryGenerated by circuitry

Restricted set of Restricted set of inputsinputs

May have been May have been optimized to reduce optimized to reduce logic activity and logic activity and powerpower

Test vectors:Test vectors: Functionally irrelevant Functionally irrelevant

signalssignals Generated by software Generated by software

to test faultsto test faults Can be random or Can be random or

pseudorandompseudorandom May be optimized to May be optimized to

reduce test time; can reduce test time; can have high logic activityhave high logic activity

May use testability May use testability logic for test logic for test applicationapplication


An ExampleAn Example

VLSI chipBinary to decimal

converter

3-bit random vectors

8-bit1-hot

vectors

VLSI chip

system

VLSI chip in system operation

VLSI chip under test

High activity8-bit

test vectors from ATE


Reducing Comb. Test Power Reducing Comb. Test Power

1 1 0 0 01 0 1 0 01 0 1 0 11 0 1 1 1

V1 V2 V3

V4 V5

3 4

1

3 223

2

1

1

V1 V2 V3 V4 V5

10 input transitions

Traveling salesperson problem (TSP): Find the shortest distance closed path (or cycle) to visit all nodes exactly once.

V1 V3 V5 V4 V21 0 0 0 11 1 0 0 01 1 1 0 01 1 1 1 0

5 input transitions


Traveling Salesperson Traveling Salesperson ProblemProblem

A. V. Aho, J. E. Hopcroft anf J. D. A. V. Aho, J. E. Hopcroft anf J. D. Ullman, Ullman, Data Structures and Data Structures and AlgorithmsAlgorithms, Reading, Massachusetts: , Reading, Massachusetts: Addison-Wesley, 1983.Addison-Wesley, 1983.

E. Horowitz and S. Sahni, E. Horowitz and S. Sahni, Fundamentals of Computer Fundamentals of Computer AlgorithmsAlgorithms, Computer Science Press, , Computer Science Press, 1984.1984.


Scan TestingScan Testing

Combinational logic

Scan flip- flops

Primary inputs

Primary outputs

Scan-inSI

Scan-outSO

Scan enableSE DFF

mu

x

SE

SI

D

D

D’

D’

SO1

0


Example: State MachineExample: State Machine

S5

S1

S4

S2

S3

Reduced power state encodingS1 = 000S2 = 011S3 = 001S4 = 010S5 = 100

State State transitiontransition

Comb. Input Comb. Input changeschanges

000 → 001000 → 001 11

000 → 100000 → 100 11

011 → 010011 → 010 11

001 → 011001 → 011 11

010 → 000010 → 000 11

100 → 010100 → 010 22

Functional transitions


Scan Testing of State Scan Testing of State MachineMachine

Combinational logic

FF=0

FF=0

FF=1

Primary inputs

Primary outputs

Scan-in010

Scan-out100

State State transitiontransition

Comb. Comb. Input Input

changeschanges

100 → 010100 → 010 22

010 → 101010 → 101 33

101 → 010101 → 010 33

Test transitions


Low Power Scan Flip-FlopLow Power Scan Flip-Flop

DFF

mu

x

SE

SI

DDFFm

ux

SE

SI

DSO

D’ D’

SO

Scan FF cell Low power scan FF cell

1

0


Built-In Self-Test (BIST)Built-In Self-Test (BIST)

Linear feedback shift register (LFSR)

Multiple input signature register (MISR)

Circuit under test (CUT)

Pseudo-random patterns

Circuit responses

BISTController

Clock

C. E. Stroud, A Designer’s Guide to Built-In Self-Test, Boston: KluwerAcademic Publishers, 2002.


Test Scheduling ExampleTest Scheduling ExampleR1 R2

M1 M2

R3 R4

A datapath


BIST Configuration 1: Test BIST Configuration 1: Test TimeTime

LFSR1 LFSR2

M1 M2

MISR1 MISR2

Test time

Te

st p

ow

er

T1: test for M1

T2: test for M2


BIST Configuration 2: Test BIST Configuration 2: Test PowerPower

R1 LFSR2

M1 M2

MISR1 MISR2Test time

Te

st p

ow

er

T1: test for M1T2: test for M2


Testing of MCM and SOCTesting of MCM and SOC Test resources: Typically registers and Test resources: Typically registers and

multiplexers that can be reconfigured as multiplexers that can be reconfigured as test pattern generators (e.g., LFSR) or as test pattern generators (e.g., LFSR) or as output response analyzers (e.g., MISR).output response analyzers (e.g., MISR).

Test resources (R1, . . .) and tests (T1, . . .) Test resources (R1, . . .) and tests (T1, . . .) are identified for the system to be tested.are identified for the system to be tested.

Each test is characterized for test time, Each test is characterized for test time, power dissipation and resources it power dissipation and resources it requires.requires.


Resource Allocation GraphResource Allocation Graph

T1 T2 T3 T4 T5 T6

R2R1 R3 R4 R5 R6 R7 R8 R9


Test Compatibility Graph Test Compatibility Graph (TCG)(TCG)T1

(2, 100)

T2(1,10)

T3(1, 10)

T4(1, 5)

T5(2, 10)

T6(1, 100)

Tests that form a clique can be performed concurrently.

Power Test time

Pmax = 4


Test Scheduling AlgorithmTest Scheduling Algorithm Identify all possible cliques in TCG:Identify all possible cliques in TCG:

C1 = {T1, T3, T5}C1 = {T1, T3, T5} C2 = {T1, T3, T4}C2 = {T1, T3, T4} C3 = {T1, T6}C3 = {T1, T6} C4 = {T2, T5}C4 = {T2, T5} C5 = {T2, T6}C5 = {T2, T6}

Break up clique sets into power Break up clique sets into power compatible sets (PCS), that satisfy the compatible sets (PCS), that satisfy the power constraint.power constraint.


Test Scheduling Test Scheduling Algorithm . . .Algorithm . . .

PCS (Pmax = 4), tests within a set are PCS (Pmax = 4), tests within a set are ordered for decreasing test length:ordered for decreasing test length:

C1 = {T1, T3, T5} → (T1, T3), (T1, T5), (T3, T5)C1 = {T1, T3, T5} → (T1, T3), (T1, T5), (T3, T5) C2 = {T1, T3, T4} → (T1, T3, T4)C2 = {T1, T3, T4} → (T1, T3, T4) C3 = {T1, T6} → (T1, T6)C3 = {T1, T6} → (T1, T6) C4 = {T2, T5} → (T2, T5)C4 = {T2, T5} → (T2, T5) C5 = {T2, T6} → (T2, T6)C5 = {T2, T6} → (T2, T6)

Expand PCS into subsets of decreasing test Expand PCS into subsets of decreasing test lengths. Each subset is an independent test lengths. Each subset is an independent test session, consisting of tests that can be session, consisting of tests that can be concurrently applied.concurrently applied.

Select test sessions to cover all tests such Select test sessions to cover all tests such that the added time of selected sessions is that the added time of selected sessions is minimum.minimum.


TS Algorithm: Cover TableTS Algorithm: Cover TableTest sessionsTest sessions T1T1 T2T2 T3T3 T4T4 T5T5 T6T6 LengtLengt

hh

(T1, T3, T4)(T1, T3, T4) XX X X XX 100100

(T1, T5)(T1, T5) XX XX 100100

(T1, T6)(T1, T6) XX XX 100100

(T2, T6)(T2, T6) X X XX 100100

(T3, T5)(T3, T5) XX XX 1010

(T2, T5)(T2, T5) XX XX 1010

(T3, T4)(T3, T4) X X X X 1010

(T5)(T5) XX 1010

(T4)(T4) XX 55

Selected sessions are (T3,T4), (T2, T5) and (T1, T6). Test time = 120.


A System Example: ASIC Z*A System Example: ASIC Z*

RAM 2Time=61

Power=241

RAM 3Time=38

Power=213

ROM 1Time=102

Power=279

ROM 2Time=102

Power=279

RAM 1Time=69

Power=282

RAM 4Time=23

Power=96

Reg. fileTime = 10Power=95

Random logic 1, time=134, power=295

Random logic 2, time=160, power=352

*Y. Zorian, “A Distributed Control Scheme for Complex VLSI Devices,” Proc. VLSI Test Symp., April 1993, pp. 4-9.


Test Scheduling for ASIC ZTest Scheduling for ASIC Z1200

900

600

300

Po

we

r

Power limit = 900

0 100 200 300 400Test time 331

RAM 1

RAM 3

Random logic 2

Random logic 1

ROM 2

ROM 1

RAM 2

Reg. file

RAM 4

•R. M. Chou, K. K. Saluja and V. D. Agrawal, “Scheduling Tests for VLSI Systems under Power Constraints,” IEEE Trans. VLSI Systems, vol. 5, no. 2, pp. 175-185, June 1997.


ReferencesReferences

N. Nicolici and B. M. Al-Hashimi, N. Nicolici and B. M. Al-Hashimi, Power-Constrained Testing of VLSI Power-Constrained Testing of VLSI CircuitsCircuits, Boston: Kluwer Academic , Boston: Kluwer Academic Publishers, 2003.Publishers, 2003.

E. Larsson, E. Larsson, Introduction to Advanced Introduction to Advanced System-on-Chip Test Design and System-on-Chip Test Design and OptimizationOptimization, Springer 2005., Springer 2005.

Fall 2006, Nov. 30 ELEC 5270-001/6270-001 Lecture 12 1 ELEC 5270-001/6270-001(Fall 2006) Low-Power...

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