European Patent Citations - How to count and how to interpret them? Dietmar Harhoff...

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European Patent Citations - How to count and how to interpret them? Dietmar Harhoff Ludwig-Maximilian University Munich (INNO-tec) ZEW and CEPR and EPIP Karin Hoisl Ludwig-Maximilian University Munich (INNO-tec) and EPIP Colin Webb OECD
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Page 1: European Patent Citations - How to count and how to interpret them? Dietmar Harhoff Ludwig-Maximilian University Munich (INNO-tec) ZEW and CEPR and EPIP.

European Patent Citations -How to count and how

to interpret them?

Dietmar HarhoffLudwig-Maximilian University Munich (INNO-tec)ZEW and CEPR and EPIP

Karin HoislLudwig-Maximilian University Munich (INNO-tec)and EPIP

Colin WebbOECD

Page 2: European Patent Citations - How to count and how to interpret them? Dietmar Harhoff Ludwig-Maximilian University Munich (INNO-tec) ZEW and CEPR and EPIP.

21st EPIP Workshop – MilanoEuropean Patent Citations – How to count and how to interpret them?

Overview

Motivation Specificities of the EPO Search Process Raw Data How to ... Issues Results Still to Be Tackled Where to Get the Data? And when?

Page 3: European Patent Citations - How to count and how to interpret them? Dietmar Harhoff Ludwig-Maximilian University Munich (INNO-tec) ZEW and CEPR and EPIP.

31st EPIP Workshop – MilanoEuropean Patent Citations – How to count and how to interpret them?

Motivation Patent citations are widely used by economists (and

others) in empirical analysis. The NBER data have had a tremendous impact. They

represent a true pioneering effort with high social benefits. But European patent citations differ considerably from US

citations. Many issues have been left unresolved. Many pitfalls (as we painfully learned) – even suggesting

that the pioneering NBER data have problems which should be corrected in the second round using some of the insights described here.

Page 4: European Patent Citations - How to count and how to interpret them? Dietmar Harhoff Ludwig-Maximilian University Munich (INNO-tec) ZEW and CEPR and EPIP.

41st EPIP Workshop – MilanoEuropean Patent Citations – How to count and how to interpret them?

The Search Process follows the Guidelines for Examination in the European Patent Office.

Historically, the overall responsibility for search has been with the Directorate General for Searching in The Hague.

Under BEST (Bringing Examination and Search Together), the borderline between search and examination disappears.

Main objective: discovering prior art relevant for determining whether the invention meets the novelty and inventive step requirements.

The search is conducted in the basis of the claims.

Specificities of the EPO Search ProcessInstitutional Framework

Page 5: European Patent Citations - How to count and how to interpret them? Dietmar Harhoff Ludwig-Maximilian University Munich (INNO-tec) ZEW and CEPR and EPIP.

51st EPIP Workshop – MilanoEuropean Patent Citations – How to count and how to interpret them?

The Search will be terminated if the probability of discovering further relevant documents is

very low compared to the effort needed, or documents are discovered which doubtlessly demonstrate a

violation of patentability requirements.

The Search Report should only include the most important documents, one of several documents of equal importance, the earlier document of two equally important documents.

According to EPO philosophy a good search report contains all relevant information within a minimum number of citations (Michel/Bettels, 2001)

Specificities of the EPO Search ProcessTermination and Reporting

Page 6: European Patent Citations - How to count and how to interpret them? Dietmar Harhoff Ludwig-Maximilian University Munich (INNO-tec) ZEW and CEPR and EPIP.

61st EPIP Workshop – MilanoEuropean Patent Citations – How to count and how to interpret them?

Specificities of the EPO Search ProcessClassification of References

Xparticularly relevant documents when taken alone (implies: the claimed invention cannot be considered novel or cannot be considered to involve an inventive step)

Y particularly relevant if combined with another document of the same category

A documents defining the general state of the art

O documents referring to non-written disclosure

P intermediate documents (documents published between the date of filing and the priority date)

T

documents relating to theory or principle underlying the invention (documents which were published after the filing date and are not in conflict with the application, but were cited for a better understanding of the invention)

E potentially conflicting patent documents, published on or after the filing date of the underlying invention

D document already cited in the application

L document cited for other reasons (e.g., a document which may throw doubt on a priority claim)

Page 7: European Patent Citations - How to count and how to interpret them? Dietmar Harhoff Ludwig-Maximilian University Munich (INNO-tec) ZEW and CEPR and EPIP.

71st EPIP Workshop – MilanoEuropean Patent Citations – How to count and how to interpret them?

Difference in interpretation between examiner and applicant citations

the examiner has to ensure the novelty and inventive step of the invention

the applicant cites work that is related but significantly different from his invention

the EPOLINE/REFI data also include references made by the applicant – all issues raised here apply to them, but we ignore them here unless the searcher/examiner has adopted them (D references)

The date of filing of the EP application is used as a reference date for the search

Referenced documents published between the priority date and the filing date may lead to negative citation lags, but they are not taken to threaten novelty.

Specificities of the EPO Search Process

Consequences for Citation Analysis (1/2)

Page 8: European Patent Citations - How to count and how to interpret them? Dietmar Harhoff Ludwig-Maximilian University Munich (INNO-tec) ZEW and CEPR and EPIP.

81st EPIP Workshop – MilanoEuropean Patent Citations – How to count and how to interpret them?

Referencing no more than what is absolutely necessary and obligation to favor early documents over later ones

other documents important for the economic analysis may not appear in the list of references

Examiners should preferably reference documents in the language of the application.

overestimation of the influence of the applicant’s home countryand possible distortion in citation counts (see below)

The search only identifies documents to which searchers/examiners have access

trivial, but important: documents not accessible in databases will not appear in the “paper trail”

Specificities of the EPO Search Process

Consequences for Citation Analysis (2/2)

Page 9: European Patent Citations - How to count and how to interpret them? Dietmar Harhoff Ludwig-Maximilian University Munich (INNO-tec) ZEW and CEPR and EPIP.

91st EPIP Workshop – MilanoEuropean Patent Citations – How to count and how to interpret them?

Raw Data OECD/EPO data (described in OECD Discussion

Paper Webb/Dernis/Harhoff/Hoisl) EPOLINE references (12/2004) – updated and

checked with REFI (07/2005) EPOLINE data on procedural aspects (search

dates) OPS/ESPACE data on other than WO/EP

documents

Page 10: European Patent Citations - How to count and how to interpret them? Dietmar Harhoff Ludwig-Maximilian University Munich (INNO-tec) ZEW and CEPR and EPIP.

101st EPIP Workshop – MilanoEuropean Patent Citations – How to count and how to interpret them?

How to ... issues 1 – how to deal with timing?

priority date

publication of patent document (grant in the U.S.)

search report published

date of publication of granted patent

publication of supplementary search report

“citing EP/WO patent”

18 mths“cited DE patent”

18 mths

“cited US patent”?

(with PCT equivalent)

Page 11: European Patent Citations - How to count and how to interpret them? Dietmar Harhoff Ludwig-Maximilian University Munich (INNO-tec) ZEW and CEPR and EPIP.

111st EPIP Workshop – MilanoEuropean Patent Citations – How to count and how to interpret them?

How to ... issues 1 – how to deal with timing?

What is our objective? time the “knowledge flow”? (date of the invention – date of the

referenced invention/patent becoming public) compute time between inventions/state of the art used to

characterize inventions? (date of invention = date of priority = date of publication – at least for European patents)

other? “wisest” solution might be to take differences between priority dates

How do we deal with references to different “incarnations” of the same application (about 19.200 cases)?

Example from the databasereferencing patent referenced patent publ. date appl. dateEP0106446A1 DE1947057B 19760318 19690917EP0056080A1 DE1947057A 19700326 19690917

Here: compute lag as difference between (earliest) publication date of referencing search report and (earliest) publication date of referenced document/incarnation

Note: this does not solve the problem with U.S. data (next step: take differences in (earliest) priority dates).

Page 12: European Patent Citations - How to count and how to interpret them? Dietmar Harhoff Ludwig-Maximilian University Munich (INNO-tec) ZEW and CEPR and EPIP.

121st EPIP Workshop – MilanoEuropean Patent Citations – How to count and how to interpret them?

How to ... issues 2 – where to get the data on non-EP/WO documents?

What do we need (ideally)? (earliest) priority date, priority identification application date publication date applicant name (for later: identify “self-referencing”)

3,715,484 unique non-EP/WO entries drawn from OPS server, representing 6,623,877 references

data for 2,223,435 EP/WO entries known from EPO data still missing: 767,122 documents full information for 8,130,010 references for which we can

compute correct citation lags

Page 13: European Patent Citations - How to count and how to interpret them? Dietmar Harhoff Ludwig-Maximilian University Munich (INNO-tec) ZEW and CEPR and EPIP.

131st EPIP Workshop – MilanoEuropean Patent Citations – How to count and how to interpret them?

How to ... issues 2 – where to get the data on non-EP/WO documents?

cutting down data WO publications which do not enter the regional phase at the

EPO are excluded 6,740,846 entries remaining

• international (WO) search reports (n=2,416,318)• EP search reports (n=4,324,528) – some of them supplementary

search reports for WO applications referenced patents

• 1,228,165 EP documents (usually used for analysis)• 559,423 WO documents (sometimes included)• 4,953,258 other documents (lost in most studies)

• US: 2,423,267 – JP: 650,334 – DE: 834,617 – FR: 448,599 – GB: 417,864

• for 4,357,543 we obtained procedural and applicant data from OPS

• meaning: we can compute citation lags (and other information) for 6,198,413 (91.96%) of 6,740,846 references

comparison of citation lagswith and w/o “complete” data

Page 14: European Patent Citations - How to count and how to interpret them? Dietmar Harhoff Ludwig-Maximilian University Munich (INNO-tec) ZEW and CEPR and EPIP.

141st EPIP Workshop – MilanoEuropean Patent Citations – How to count and how to interpret them?

How to ... issues 3 – how to count references and citations?

What do we want to compute? counts of a particular incarnation of a document count of a particular invention (and the associated property

right) being named as relevant prior art Clearly, it is the second objective. HHW’s Rule of Counting Citations

A reference to an X-system document should be taken as a valid citation count of a particular Z-system patent if the X-system document is an equivalent of the Z-system patent.

many issues with equivalents (e.g. multiple equivalents -see paper)

data on equivalents obtained from OPS/ESPACE

comparison of citation count distribution with and without corrections

Page 15: European Patent Citations - How to count and how to interpret them? Dietmar Harhoff Ludwig-Maximilian University Munich (INNO-tec) ZEW and CEPR and EPIP.

151st EPIP Workshop – MilanoEuropean Patent Citations – How to count and how to interpret them?

total: 1,149,955 NPL references (after taking out references to “Patent Abstracts of Japan” which are implicitly patent literature references)

“highest” EP publication number included: EP1589793 59,433 references not from examiner/searcher (dropped) 239,135 references from WO documents which do not enter

the regional phase at the EPO (dropped) remaining: 851,387 NPL references

• 525,664 references from EP search reports• 383,247 from international (WO) search reports

on average: 31.3% X refs, 17.1% Y refs, 45.6% A refs, 6.0% other refs and 8.8% D refs

How to ... issues 4 – how to deal with the NPL references?

structure of NPL reference types over time

Page 16: European Patent Citations - How to count and how to interpret them? Dietmar Harhoff Ludwig-Maximilian University Munich (INNO-tec) ZEW and CEPR and EPIP.

161st EPIP Workshop – MilanoEuropean Patent Citations – How to count and how to interpret them?

How to ... issues 5 – how to get the date information?

highest publication number EP1474833, data for 1,452,041 documents (currently about 100,000 documents fewer than we have citation data for)

last 2005 date: June 7, 2005 dates of priority, application, publication, publication of

search reports (international, supplementary, EP), grant etc.

matched with citations data to compute lags (by year)

Page 17: European Patent Citations - How to count and how to interpret them? Dietmar Harhoff Ludwig-Maximilian University Munich (INNO-tec) ZEW and CEPR and EPIP.

171st EPIP Workshop – MilanoEuropean Patent Citations – How to count and how to interpret them?

0.0

5.1

.15

.2D

en

sity

0 5 10 15 20 25Citation Lag (Years)

Citation Lags With and without corrections

lower quartile 2.28 yrs

median 4.03 yrs

mean 5.03 yrs

upper quartile 6.93 yrs

Source: Harhoff/Hoisl/Webb (2004) – authors’ computations based on EPO/OECD citation database.

Page 18: European Patent Citations - How to count and how to interpret them? Dietmar Harhoff Ludwig-Maximilian University Munich (INNO-tec) ZEW and CEPR and EPIP.

181st EPIP Workshop – MilanoEuropean Patent Citations – How to count and how to interpret them?

Citation LagsWith and w/o use of references to non-EP/no-WO documents

per- lags of EP/WO centile to EP/WO only

1% 0.3 yrs

5% 1.0 yrs

10% 1.5 yrs

25% 2.3 yrs

50% 4.0 yrs

75% 7.0 yrs

90% 10.6 yrs

95% 13.0 yrs

99% 17.5 yrs

max 25.7 yrs

N 1,438,670

lags of EP/WO to non-EP/non-WO

0.7 yrs

1.6 yrs

2.1 yrs

3.8 yrs

8.7 yrs

17.8 yrs

29.7 yrs

41.2 yrs

64.7 yrs

132.0 yrs

4,203,811

all citation lags

0.6 yrs

1.5 yrs

1.9 yrs

3.2 yrs

6.8 yrs

14.3 yrs

25.8 yrs

35.9 yrs

61.8 yrs

132.0 yrs

5,642,481

Page 19: European Patent Citations - How to count and how to interpret them? Dietmar Harhoff Ludwig-Maximilian University Munich (INNO-tec) ZEW and CEPR and EPIP.

191st EPIP Workshop – MilanoEuropean Patent Citations – How to count and how to interpret them?

Citation LagsWith and w/o use of references to non-EP/no-WO documents

0.1

.20

.1.2

0 20 40 60

0

1

Den

sity

citlagGraphs by Citation lags for EP/WO only

Page 20: European Patent Citations - How to count and how to interpret them? Dietmar Harhoff Ludwig-Maximilian University Munich (INNO-tec) ZEW and CEPR and EPIP.

201st EPIP Workshop – MilanoEuropean Patent Citations – How to count and how to interpret them?

Citation Lagsmore details

among the oldest prior art referenced WO1997034383 references US285345A (publication

date 18.9.1883) as a Y reference. WO2001058249 references DE45870C (publication date

12.1.1889) as an A reference. EP1408383A1 references CH1473A (publication date

31.5.1890) as an X reference. reference type and citation lag

X: p25=3.13, p50=6.39, p75=13.48 Y: p25=2.72, p50=5.98, p75=13.60 A: p25=3.51, p50=7.33, p75=15.05

Page 21: European Patent Citations - How to count and how to interpret them? Dietmar Harhoff Ludwig-Maximilian University Munich (INNO-tec) ZEW and CEPR and EPIP.

211st EPIP Workshop – MilanoEuropean Patent Citations – How to count and how to interpret them?

Non-Patent LiteratureClassification of referenced NPL sources over time

NPL Reference Classifications

0%

10%

20%

30%

40%

50%

60%

70%

80%

90%

100%

1977

1978

1979

1980

1981

1982

1983

1984

1985

1986

1987

1988

1989

1990

1991

1992

1993

1994

1995

1996

1997

1998

1999

2000

2001

2002

Priority Year

Sh

are

X-type NPL references Y-type NPL references A-type NPL referencs Other NPL references

N= 785,383

Page 22: European Patent Citations - How to count and how to interpret them? Dietmar Harhoff Ludwig-Maximilian University Munich (INNO-tec) ZEW and CEPR and EPIP.

221st EPIP Workshop – MilanoEuropean Patent Citations – How to count and how to interpret them?

Non-Patent LiteratureClassification of referenced NPL sources over time

NPL Reference Classifications - USPTO as ISA

0%

10%

20%

30%

40%

50%

60%

70%

80%

90%

100%

1983 1984 1985 1986 1987 1988 1989 1990 1991 1992 1993 1994 1995 1996 1997 1998 1999 2000 2001

Priority Year

Sh

are

X-type NPL references Y-type NPL references A-type NPL referencs Other NPL references

N= 105,506

Page 23: European Patent Citations - How to count and how to interpret them? Dietmar Harhoff Ludwig-Maximilian University Munich (INNO-tec) ZEW and CEPR and EPIP.

231st EPIP Workshop – MilanoEuropean Patent Citations – How to count and how to interpret them?

Non-Patent LiteratureClassification of referenced NPL sources over time

N=282,889NPL Reference Classifications - All ISAs but USPTO

0%

20%

40%

60%

80%

100%

1983 1984 1985 1986 1987 1988 1989 1990 1991 1992 1993 1994 1995 1996 1997 1998 1999 2000 2001 2002

Priority Year

Sh

are

X-type NPL references Y-type NPL references A-type NPL referencs Other NPL references

Page 24: European Patent Citations - How to count and how to interpret them? Dietmar Harhoff Ludwig-Maximilian University Munich (INNO-tec) ZEW and CEPR and EPIP.

241st EPIP Workshop – MilanoEuropean Patent Citations – How to count and how to interpret them?

Patent Literature Data Classification of Patent Literature References – Raw Data

0%10%20%30%40%50%60%70%80%90%

100%

     1

978

     1

980

     1

982

     1

984

     1

986

     1

988

     1

990

     1

992

     1

994

     1

996

     1

998

     2

000

DE EP FR GB JP OT US WO

34.7%

21.2%

Page 25: European Patent Citations - How to count and how to interpret them? Dietmar Harhoff Ludwig-Maximilian University Munich (INNO-tec) ZEW and CEPR and EPIP.

251st EPIP Workshop – MilanoEuropean Patent Citations – How to count and how to interpret them?

Patent Literature DataClassification of Patent Literature References – (Partial) HHW Rule

0%10%20%30%40%50%60%70%80%90%

100%

     1

978

     1

980

     1

982

     1

984

     1

986

     1

988

     1

990

     1

992

     1

994

     1

996

     1

998

     2

000

DE EP FR GB JP OT US WO

29.0%

38.2%

Page 26: European Patent Citations - How to count and how to interpret them? Dietmar Harhoff Ludwig-Maximilian University Munich (INNO-tec) ZEW and CEPR and EPIP.

261st EPIP Workshop – MilanoEuropean Patent Citations – How to count and how to interpret them?

Patent Literature DataSource of EP Patent References – Overall Comparison

DE EP FR GB JP OT US WO

13.7 19.0 8.2 7.3 8.8 3.1 33.9 6.0

13.2 28.8 8.2 7.3 8.2 3.1 29.9 1.3

Source of Reference

without

with

(partial) correction for equivalents

After (partially) correcting for equivalents, the share of within-EP referencing increases from 19.0% to 28.8% of all patent references

Page 27: European Patent Citations - How to count and how to interpret them? Dietmar Harhoff Ludwig-Maximilian University Munich (INNO-tec) ZEW and CEPR and EPIP.

271st EPIP Workshop – MilanoEuropean Patent Citations – How to count and how to interpret them?

Patent Literature DataAssessing the Quality of Incoming Applications

Pate

nt

Quanti

y a

nd P

ate

nt

Qualit

y in E

uro

pe,

fort

hco

min

g in:

Bri

an K

ahin

and D

om

inque F

ora

y (

eds.

), A

dvanci

ng

Know

ledge a

nd t

he K

now

ledge E

conom

y,

MIT

Pre

ss (

20

06

).

Average Share of X-Type References

0

5

10

15

20

25

30

1980 1982 1984 1986 1988 1990 1992 1994 1996 1998 2000

Application Year

Sh

are

(%

)

US-Priority JP-Priority DE-Priority

Page 28: European Patent Citations - How to count and how to interpret them? Dietmar Harhoff Ludwig-Maximilian University Munich (INNO-tec) ZEW and CEPR and EPIP.

281st EPIP Workshop – MilanoEuropean Patent Citations – How to count and how to interpret them?

Patent Literature DataComparing citation counts – with and w/o corrections

per- EP to EP onlycentile

1% 0.3 yrs

5% 1.0 yrs

10% 1.5 yrs

25% 2.3 yrs

50% 4.0 yrs

75% 7.0 yrs

90% 10.6 yrs

95% 13.0 yrs

99% 17.5 yrs

max 25.7 yrs

N 1,438,670

EP/WO to EP/WO

0.7 yrs

1.6 yrs

2.1 yrs

3.8 yrs

8.7 yrs

17.8 yrs

29.7 yrs

41.2 yrs

64.7 yrs

132.0 yrs

4,203,811

with partial HHW rule

0.6 yrs

1.5 yrs

1.9 yrs

3.2 yrs

6.8 yrs

14.3 yrs

25.8 yrs

35.9 yrs

61.8 yrs

132.0 yrs

5,642,481

Page 29: European Patent Citations - How to count and how to interpret them? Dietmar Harhoff Ludwig-Maximilian University Munich (INNO-tec) ZEW and CEPR and EPIP.

291st EPIP Workshop – MilanoEuropean Patent Citations – How to count and how to interpret them?

Still to be tackled“self-citations” and “self-references”

misnomer to start with – term applies only for applicant-initiated references

For determining whether the reference points to prior art were generated by the applicant itself (“self-reference”), we have to get the name of the applicant of the referenced document.

Similar for measures of “originality” – we need to get the IPC codes of the referencing and the referenced document.

We have downloaded them – and are in the process of computing the information.

Page 30: European Patent Citations - How to count and how to interpret them? Dietmar Harhoff Ludwig-Maximilian University Munich (INNO-tec) ZEW and CEPR and EPIP.

301st EPIP Workshop – MilanoEuropean Patent Citations – How to count and how to interpret them?

complete citation data up to 2001 from Colin Webb at OECD - these data do not have the citations lags for non-EP/WO references

extended dataset with citations up to November 2004 from Dietmar Harhoff at INNO-tec

new data with references till mid-2005 soon (to be done by April 15 or never)

to be published on the SING site at CEPR (http://wiki.cepr.org/sing/) – note:

there is a WIKI which allows for comments etc. the INNO-tec site (http://www.inno-tec.de)

Where to get the data? And when?

Page 31: European Patent Citations - How to count and how to interpret them? Dietmar Harhoff Ludwig-Maximilian University Munich (INNO-tec) ZEW and CEPR and EPIP.

311st EPIP Workshop – MilanoEuropean Patent Citations – How to count and how to interpret them?

Interpreting Citation Indicators

Assessing the Quality of Incoming Applications Patent Characteristics by Applicant Type Citations in Value Equations Citations in Opposition Likelihood Equations Citations in Examination Duration Equations

Page 32: European Patent Citations - How to count and how to interpret them? Dietmar Harhoff Ludwig-Maximilian University Munich (INNO-tec) ZEW and CEPR and EPIP.

321st EPIP Workshop – MilanoEuropean Patent Citations – How to count and how to interpret them?

Interpreting Citation Indicators Citation Statistics by Type of Patent Holder

Variable Independent Inventor(N=39,071)

University

(N=5,434)

Corporate

(N=550,144)

references 4.88 3.58 4.15

X-references 0.68 0.73 0.56

self-references 0.04 0.05 0.14

NPL references 0.36 2.37 0.73

citations 1.30 2.73 1.81

X-citations 0.10 0.39 0.17

self-citations 0.03 0.05 0.13

2nd order citations 3.83 11.50 6.85

claims 9.3 10.9 7.3

grant lag 4.2 yrs 5.5 yrs 4.3 yrs

Source: Harhoff/Hoisl/Webb (2005) – authors’ computations based on EPO/OECD citation database.

Page 33: European Patent Citations - How to count and how to interpret them? Dietmar Harhoff Ludwig-Maximilian University Munich (INNO-tec) ZEW and CEPR and EPIP.

331st EPIP Workshop – MilanoEuropean Patent Citations – How to count and how to interpret them?

Sourc

e:

Harh

off

/Hois

l/W

ebb (

20

05

) –

marg

inal eff

ect

s (t

-st

ats

) auth

ors

’ co

mputa

tions

base

d o

n E

PO

/OEC

D c

itati

on

data

base

.

Variable patent value - German PATVAL study

(ordered probit, N=3,350)

references n.s.

X-share n.s.

Y-share n.s.

share self references n.s.

citations 0.0482 (3.74)

X-share n.s.

Y-share n.s.

share self citations n.s.

2nd order citations 0.0044 (2.52)

NPL references n.s.

control variables technical field, year dummies, add. variables

pseudo-R-squared 0.0062

Interpreting Citation IndicatorsCitation Indicators in Value Equations

Page 34: European Patent Citations - How to count and how to interpret them? Dietmar Harhoff Ludwig-Maximilian University Munich (INNO-tec) ZEW and CEPR and EPIP.

341st EPIP Workshop – MilanoEuropean Patent Citations – How to count and how to interpret them?

Variable opposition incidence (binary probit)

N=594,647

revocation incidence (binary probit)

N=27,530

references 0.0004 (3.5) n.s.

X-share 0.0270 (22.9) 0.0411 (3.5)

Y-share 0.0088 (6.8) n.s.

share self references -0.0394 (14.4) n.s.

citations 0.0070 (60.9) -0.0066 (7.3)

X-share 0.0137 (8.7) n.s.

Y-share 0.0125 (6.5) n.s.

share self citations -0.0128 (6.6) -0.0463 (2.4)

2nd order citations 0.0003 (16.0) n.s.

NPL references -0.0009 (3.3) n.s.

control variables technical field, year dummies, add. variables

dto. plus additional variables

pseudo-R-squared 0.0693 0.0269Sourc

e:

Harh

off

/Hois

l/W

ebb (

20

05

) –

marg

inal eff

ect

s (t

-sta

ts)

auth

ors

’ co

mputa

tions

base

d o

n E

PO

/OEC

D c

itati

on d

ata

base

.

Interpreting Citation IndicatorsCitation Indicators in Opposition Equations

Page 35: European Patent Citations - How to count and how to interpret them? Dietmar Harhoff Ludwig-Maximilian University Munich (INNO-tec) ZEW and CEPR and EPIP.

351st EPIP Workshop – MilanoEuropean Patent Citations – How to count and how to interpret them?

Variable POOLED OUTCOME

GRANT GRANT REFUSAL

references DELAY DELAY n.s. DELAY

X-share DELAY DELAY ACCEL. DELAY

GENERALITY DELAY n.s. DELAY n.s.

ORIGINALITY DELAY DELAY DELAY DELAY

citations DELAY ACCEL. DELAY DELAY

NPL references DELAY DELAY DELAY DELAY

control variables claims, designated countries, workload at EPO, prediction error, PCT

Sourc

e:

Harh

off

/Wagner

(20

05

) -

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Interpreting Citation IndicatorsCitation Indicators in Process Duration Equations

Results from competing-risk proportional hazard models, N=215,259

Page 36: European Patent Citations - How to count and how to interpret them? Dietmar Harhoff Ludwig-Maximilian University Munich (INNO-tec) ZEW and CEPR and EPIP.

361st EPIP Workshop – MilanoEuropean Patent Citations – How to count and how to interpret them?

value equation only citation counts matter, composition not relevant 2nd order citations appear to be relevant

opposition incidence equation not number, but composition of references matters considerably number of citations proxies for value X-citations indicate anticipated interaction between opponents 2nd-order citations have some predictive power self-citations and references have a strong negative effect on

opposition incidence – appear to indicate idiosyncratic research paths

Summary of Results (1/2)

Page 37: European Patent Citations - How to count and how to interpret them? Dietmar Harhoff Ludwig-Maximilian University Munich (INNO-tec) ZEW and CEPR and EPIP.

371st EPIP Workshop – MilanoEuropean Patent Citations – How to count and how to interpret them?

revocation incidence equation weak predictive power (as should be!) residual information still in X-references and 1st-order citations

duration equations heterogeneous effects on different outcomes – pointing to

endogeneous applicant behavior examinination of X-classified references apparently more time-

consuming signal of search report to applicant

Summary of Results (2/2)

Page 38: European Patent Citations - How to count and how to interpret them? Dietmar Harhoff Ludwig-Maximilian University Munich (INNO-tec) ZEW and CEPR and EPIP.

381st EPIP Workshop – MilanoEuropean Patent Citations – How to count and how to interpret them?

Results for 2nd-order citations warrant attention (and more experimentation). Currently in development: second-order references.

Results for self-referencing surprisingly strong – should be extended using a complete coding of patent holders (for non-EP references).

Still far cry from a structural model of value, legal robustness and other latent variables – but some progress.

Inclusion of more refined NPL indicators to commence shortly.

Caveats and More Plans