Europe SEMI Photovoltaic Committee Liaison Report

Updated October 18, 2011

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Committee Leadership

• Co-Chairs– Laszlo Fabry – Wacker Chemie– Hubert Aulich – PV Crystalox Solar

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EU Photovoltaic CommitteeC: Laszlo Fabry – Wacker Chemie

C: Hubert Aulich – PV Crystalox Solar

Int’ PV Analytical Test Method TF R. Hockett – Evans Analytical

PV Silicon Materials TFP. Wagner

PV Ribbon TFC. Prischmann – Ulbrich

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Meeting Information

•Last meeting– Oct 10-11, 2011

• DAS Facility, Dresden, Germany

•Next meeting– March 27-28, 2012

• PV Fab Managers Forum• Berlin, Germany• Check www.semi.org/standards for latest

update

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New SNARFs

5330 New Standard: Test Method for In-Line Measurement of Micro Cracks of PV Silicon Wafers by Infrared Imaging

5331 New Standard: Test Method for In-Line Measurement of Saw Marks on PV Silicon Wafers by a Light Sectioning Technique

5332 New Standard: Test Method for In-Line Measurement of Thickness and Thickness Variation of Silicon Wafers for PV Applications

5333 New Standard: Test Method for In-Line Measurement of Waviness on PV Silicon Wafers by a Light Sectioning Technique

5334 Revision of SEMI PV18-0811, Guide for Specifying a Photovoltaic Connector Ribbon

5335 Revision of SEMI PV19-0811, Guide for Testing Photovoltaic Connector Ribbon Characteristics

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Ballot Results Summary from Oct 11 meeting

• Doc. 5226, Line Items Revision to PV17-0611, Specification for Virgin Silicon Feedstock Materials for Photovoltaic Applications

– Approved and will be submitted for Audits and Reviews

Ballots for cycle 1-2012

• Doc. 5331, New Standard: Test Method for In-Line Measurement of Saw Marks on Pv Silicon Wafers by a Light Sectioning Technique

• Doc. 5332, New Standard: Test Method for In-Line Measurement of Thickness and Thickness Variation of Silicon Wafers for PV Applications

• Doc. 5334, Revision of SEMI PV18-0811, Guide for Specifying a Photovoltaic Connector Ribbon

• Doc. 5335, Revision of SEMI PV19-0811, Guide for Testing Photovoltaic Connector Ribbon Characteristics

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PV Silicon Materials TF (1)• Leader: Peter Wagner• Document 4805B, Specification For Virgin

Silicon Feedstock Materials For Photovoltaic Applications– Published as PV17-0611.

• Charter of TF was recently modified by adding:– Develop new standardized test methods for PV

Si Materials

PV Silicon Materials TF (2)

• New SNARFs:– Doc. 5330 New Standard: Test Method for In-Line

Measurement of Micro Cracks of PV Silicon Wafers by Infrared Imaging

– Doc. 5333 New Standard: Test Method for In-Line Measurement of Waviness on PV Silicon Wafers by a Light Sectioning Technique

• Ballots to be submitted in cycle 1-2012– Doc. 5331 New Standard: Test Method for In-Line

Measurement of Saw Marks on PV Silicon Wafers by a Light Sectioning Technique

– Doc. 5332 New Standard: Test Method for In-Line Measurement of Thickness and Thickness Variation of Silicon Wafers for PV Applications

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PV Ribbon TF

• Leader - Christian Prischmann/Ulbrich • Current Activities:

– Doc. 4800A, New Standard: Guide for Specifying a Photovoltaic Connector Ribbon• Published as PV18-0811

– Doc. 4801, New Standard: Guide for Testing Photovoltaic Connector Ribbon Characteristics• Published as PV19-0811

– Future work includes making minor revision to PV18 and PV19, and writing Ribbon Specification

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Crystalline Technology and Manufacturing (CTM) Group

• European group of eight crystalline solar cell manufacturers (Q-Cells, Deutsche Cell, Bosch Solar Energy, Schott Solar, Sovello, Sunways, SolarWatt and Solland) is working together within SEMI in a pre-competitive environment to address the technology challenges facing the photovoltaic industry, and recognizes the need for standards.

• The priority of the CTM Group will be the definition of the development processes for raw materials, cell technology and cell manufacturing.

• The CTM Group has established a crystalline solar cell technology roadmap up to the year 2020 – www.itrpv.net

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Questions?

• Contact – James Amano (jamano@semi.org)– Kevin Nguyen (knguyen@semi.org)– New SEMI Europe Staff

•Yan Guillou , SEMI Europe yguillou@semi.org